JP2511670B2 - Magnetic shield - Google Patents

Magnetic shield

Info

Publication number
JP2511670B2
JP2511670B2 JP8100187A JP8100187A JP2511670B2 JP 2511670 B2 JP2511670 B2 JP 2511670B2 JP 8100187 A JP8100187 A JP 8100187A JP 8100187 A JP8100187 A JP 8100187A JP 2511670 B2 JP2511670 B2 JP 2511670B2
Authority
JP
Japan
Prior art keywords
magnetic shield
shield cover
current
support substrate
magnetically shielded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8100187A
Other languages
Japanese (ja)
Other versions
JPS63247689A (en
Inventor
猛順 柴田
茂 田中
清 水橋
清 柴沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Atomic Energy Agency
Original Assignee
Japan Atomic Energy Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Atomic Energy Research Institute filed Critical Japan Atomic Energy Research Institute
Priority to JP8100187A priority Critical patent/JP2511670B2/en
Publication of JPS63247689A publication Critical patent/JPS63247689A/en
Application granted granted Critical
Publication of JP2511670B2 publication Critical patent/JP2511670B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は磁気シールドされた測定子に関する。詳しく
は、本発明は、電離真空計、光電管、電子増倍管、四重
極質量分析計などの電子、又はイオンの運動を利用した
測定子で、核融合装置のような外部磁場の存在する場所
で使用するために磁気シールドされた測定子に関する。
TECHNICAL FIELD The present invention relates to a magnetically shielded probe. Specifically, the present invention is a probe using the motion of electrons or ions, such as an ionization vacuum gauge, a phototube, an electron multiplier, and a quadrupole mass spectrometer, in the presence of an external magnetic field such as a fusion device. A magnetically shielded stylus for use in a location.

(従来の技術) 電子、又はイオンの運動を利用した測定子が電離真空
計である場合について説明する。従来のものを第1図に
示す。
(Prior Art) A case will be described in which the probe utilizing the motion of electrons or ions is an ionization vacuum gauge. The conventional one is shown in FIG.

第1図において、真空容器壁1の内部の真空度を測定
するために、電離真空計測定子2が計測用ポート3に取
り付けられている。電離真空計測定子2、フィラメン
ト、グリッド、コレクター等の電極4、電極取付用の電
流導入端子5、電流導入端子5をセラミック等の電気絶
縁物6を介して支持する電流導入端子支持基板7から成
る。
In FIG. 1, in order to measure the degree of vacuum inside the vacuum vessel wall 1, an ionization vacuum gauge probe 2 is attached to the measurement port 3. An ionization vacuum gauge probe 2, an electrode 4 such as a filament, a grid, and a collector, a current introduction terminal 5 for electrode attachment, and a current introduction terminal support substrate 7 that supports the current introduction terminal 5 via an electrical insulator 6 such as ceramic. .

電離真空計測定子2及び計測用ポート3の外側に磁気
シールドカバー8が置かれる。磁気シールドカバー8が
置かれる理由は次の通りである。
A magnetic shield cover 8 is placed outside the ionization vacuum gauge probe 2 and the measurement port 3. The reason why the magnetic shield cover 8 is placed is as follows.

計測用ポート3及び電流導入端子支持基板7は真空部
と接する部分があるため放出ガスの小さいステンレス鋼
が用いられる。磁気シールドカバー8がないと、ステン
レス鋼は非磁性体であるので、外部磁場が印加される
と、電極4の部分にも磁場が印加される。この磁場によ
り、電極4の近傍での電子とイオンの軌道が変化するの
で、電離真空計測定子2の感度が変化してしまう。電磁
軟鉄などの磁性体で作られた磁気シールドカバー8が磁
気シールドすれば、外部磁場が印加されても、電極4の
近傍の磁場は小さく、電子とイオンの軌道も磁場印加前
とほとんど変化せず、感度もへんかしない。
Since the measurement port 3 and the current introduction terminal support substrate 7 have a portion in contact with the vacuum portion, stainless steel that emits a small amount of gas is used. Without the magnetic shield cover 8, stainless steel is a non-magnetic material, so that when an external magnetic field is applied, the magnetic field is also applied to the electrode 4 portion. This magnetic field changes the trajectories of electrons and ions in the vicinity of the electrode 4, so that the sensitivity of the ionization vacuum gauge probe 2 changes. If the magnetic shield cover 8 made of a magnetic material such as electromagnetic soft iron magnetically shields, even if an external magnetic field is applied, the magnetic field in the vicinity of the electrode 4 is small, and the trajectories of electrons and ions are almost unchanged from before the magnetic field was applied. And the sensitivity is not compromised.

(発明が解決しようとする問題点) しかしながら、電流導入端子5にコードを接続するた
め、磁気シールドカバー8にはコード接続用の孔9が必
要である。十分なシールド係数を得るためには、コード
接続用の孔9は出来るだけ小さくしなければならない。
このため、コード接続用の孔9を通して電流導入端子5
とコードを接続する作業は容易ではない。電離真空計測
定子2が破損して交換する場合も、磁気シールドカバー
8の全体を取り外す必要があった。
(Problems to be Solved by the Invention) However, since the cord is connected to the current introducing terminal 5, the magnetic shield cover 8 needs the hole 9 for connecting the cord. In order to obtain a sufficient shield coefficient, the hole 9 for connecting the cord must be made as small as possible.
Therefore, the current introduction terminal 5 is passed through the hole 9 for connecting the cord.
The task of connecting the cords with the is not easy. Even when the ionization vacuum gauge probe 2 is damaged and needs to be replaced, the entire magnetic shield cover 8 must be removed.

また磁気シールドカバー8の外径は電流導端子支持基
板7の外径より大きくなる。このために磁気シールドす
るべき空間が大きくなり、従って磁気シールドカバー8
が大きくなるだけでなく、その厚さも厚くなってしまう
ことになる。
The outer diameter of the magnetic shield cover 8 is larger than the outer diameter of the current conducting terminal supporting board 7. For this reason, the space to be magnetically shielded becomes large, and therefore the magnetic shield cover 8
Not only becomes larger, but its thickness also becomes thicker.

(問題点を解決するための手段) 本発明は、上記の問題点を無くすために発明されたも
ので、電流導入端子支持基板7に電磁軟鉄などの磁気シ
ールド材を用い、かつ磁気シールドカバー8を計測ポー
ト3の周囲に配置して、電流導入端子支持基板7と磁気
シールドカバー8を接続したものである。
(Means for Solving Problems) The present invention has been invented in order to eliminate the above problems, in which a magnetic shield material such as electromagnetic soft iron is used for the current introduction terminal support substrate 7, and the magnetic shield cover 8 is used. Is arranged around the measurement port 3 and the current introduction terminal support substrate 7 and the magnetic shield cover 8 are connected.

(作用) 本発明により、。電流導入端子支持基板7も磁気シー
ルドの一部となり、磁気シールドカバー8を電流導入端
子支持基板7の外側に置く必要がなくなり、コード接続
作業、測定子交換作業が容易になるばかりでなく、磁気
シールドの寸法も小さくすることができる。
(Operation) According to the present invention ,. The current introducing terminal support substrate 7 also becomes a part of the magnetic shield, and it is not necessary to place the magnetic shield cover 8 on the outside of the current introducing terminal support substrate 7, so that not only the cord connection work and the probe replacement work become easy, but also the magnetic shield The size of the shield can also be reduced.

(実施例) 本発明の一具体例を第2図によって説明する。(Example) A specific example of the present invention will be described with reference to FIG.

電流導入端子支持基板7は電磁軟鉄などの磁気シール
ド材で作る。計測用ポート3は従来と同様に、ステンレ
ス鋼で作るが、計測用ポート3の周囲に磁気シールドカ
バー8を溶接、又はボルトで固定し(図では溶接の場合
が示されている)、電流導入端子支持基板7と磁気シー
ルドカバー8をボルト11で接続する。外部磁場が印加さ
れても、電流導入端子支持基板7及び磁気シールドカバ
ー8が磁気シールド材であるので、電極4の近傍に磁場
は小さく、電子とイオンの軌道は磁場印加前とほとんど
変化せず、感度も変化しない。
The current introduction terminal support substrate 7 is made of a magnetic shield material such as electromagnetic soft iron. The measurement port 3 is made of stainless steel as in the conventional case, but the magnetic shield cover 8 is welded around the measurement port 3 or fixed with bolts (the case of welding is shown in the figure) to introduce the current. The terminal support substrate 7 and the magnetic shield cover 8 are connected with bolts 11. Even if an external magnetic field is applied, since the current introducing terminal support substrate 7 and the magnetic shield cover 8 are magnetic shield materials, the magnetic field is small in the vicinity of the electrode 4, and the trajectories of electrons and ions hardly change from those before application of the magnetic field. , Sensitivity does not change.

この実施例では、電流導入端子支持基板7の外側に
は、磁気シールドカバー8の必要がなく、電流導入端子
5とコードの接続は、従来の例のように、コード接続用
の孔9を通す必要がなく、接続作業が非常に容易とな
る。
In this embodiment, it is not necessary to provide the magnetic shield cover 8 on the outside of the current introducing terminal support substrate 7, and the current introducing terminal 5 and the cord are connected through the cord connecting hole 9 as in the conventional example. There is no need, and connection work becomes very easy.

電離真空計測定子2が破損して交換するような場合に
も、電流導入端子支持基板7を計測用ポート3と磁気シ
ールドカバー8から取り外せば、交換が可能となり、従
来の例のように、電離真空計測定子2の外側にある磁気
シールドカバー8全体を取り外す必要がなくなり、交換
作業も容易となる。
Even when the ionization vacuum gauge probe 2 is damaged and needs to be replaced, the current introduction terminal support substrate 7 can be replaced by removing it from the measurement port 3 and the magnetic shield cover 8, and the ionization vacuum gauge probe 2 can be replaced as in the conventional example. It is not necessary to remove the entire magnetic shield cover 8 outside the vacuum gauge probe 2, and replacement work is facilitated.

この実施例では、磁気シールドカバー8の外径は、電
流導入端子支持基板7の外径に等しいか、それ以下にす
ることができる。磁気シールドカバー8の外径は、電流
導入端子支持基板7の外径より必ず大きくなった従来の
例に比較して、磁気シールドを小さくすることができ
る。なお、電流導入端子支持基板7で真空部と接する部
分については、メッキ等の表面処理を行うことにより放
出ガスを十分少なくすることができる。
In this embodiment, the outer diameter of the magnetic shield cover 8 can be equal to or less than the outer diameter of the current introduction terminal supporting board 7. The outer diameter of the magnetic shield cover 8 can be smaller than that of the conventional example in which the outer diameter of the current introduction terminal supporting substrate 7 is always larger. In addition, the released gas can be sufficiently reduced by subjecting the portion of the current introducing terminal support substrate 7 that is in contact with the vacuum portion to a surface treatment such as plating.

他の具体例を第3図について説明する。 Another specific example will be described with reference to FIG.

磁気シールドカバー8が計測用ポート3の周囲で回転
可能で、磁気シールドカバー8と電流導入端子支持基板
7とを計測用ポートつば13をはさみ込んでボルトにより
接続し、計測用ポートつば13と電流導入端子支持基板7
の間にゴム製のOリング等の真空シール材10を入れる。
The magnetic shield cover 8 is rotatable around the measurement port 3, and the magnetic shield cover 8 and the current introduction terminal supporting board 7 are connected by bolts with the measurement port collar 13 sandwiched therebetween. Introduction terminal support substrate 7
A vacuum sealing material 10 such as a rubber O-ring is inserted between them.

第2図の実施例では、計測用ポート3と磁気シールド
カバー8を溶接、又はボルトにより接続する必要があっ
たが、この実施例では、計測用ポート3と磁気シールド
カバー8を接続する必要はなく、磁気シールドカバー8
と電流導入端子支持基板7をボルトで接続すれば、計測
用ポート3に、電離真空計測定子2及び磁気シールドカ
バー8が支持され、真空シール材10も計測用ポートつば
1と電流導入端子支持基板7の間にはさみ込まれるの
で、磁気シールドされた測定子の組立が容易となる。
In the embodiment of FIG. 2, it was necessary to connect the measurement port 3 and the magnetic shield cover 8 by welding or bolts, but in this embodiment, it is not necessary to connect the measurement port 3 and the magnetic shield cover 8. No, magnetic shield cover 8
And the current introduction terminal support substrate 7 are connected with a bolt, the ionization vacuum gauge probe 2 and the magnetic shield cover 8 are supported by the measurement port 3, and the vacuum sealing material 10 is also the measurement port collar 1 and the current introduction terminal support substrate. Since it is sandwiched between 7, it is easy to assemble the magnetically shielded probe head.

磁気シールド一層のみでは必要な磁気シールド係数が
得られない場合は、第4図に示されるように、計測用ポ
ート3と磁気シールドカバー8の間に、磁気シールド内
層14を入れれば、大きい磁気シールド係数をえることが
できる。
If the required magnetic shield coefficient cannot be obtained with only one magnetic shield layer, a large magnetic shield can be obtained by inserting the magnetic shield inner layer 14 between the measurement port 3 and the magnetic shield cover 8 as shown in FIG. The coefficient can be obtained.

以上の実施例では、測定子が電離真空計の場合につい
て述べたが、光電管、電子倍増管、四重極質量分析計等
の電子、又はイオンの運動を利用している磁気シールド
された測定子についても同様である。
In the above examples, the case where the probe is an ionization vacuum gauge is described, but the photo shield, the electron multiplier, the electron such as the quadrupole mass spectrometer, or the magnetic shield probe that uses the motion of ions. Is also the same.

(発明の効果) 以上のごとく、本発明の磁気シールドされた測定子
を、核融合装置のような磁場のある空間で使用する場
合、コード接続作業、測定子交換作業が、従来のものに
比べて、容易になるだけでなく、磁気シールドの大きさ
も小さくすることができる。
(Effects of the Invention) As described above, when the magnetically shielded probe of the present invention is used in a space with a magnetic field such as a nuclear fusion device, cord connection work and probe exchange work are In addition to being easy, the size of the magnetic shield can be reduced.

【図面の簡単な説明】[Brief description of drawings]

第1図は従来の磁気シールドされた電離真空計測定子の
説明図である。 第2〜4図は、いずれも本発明の実施例の説明図であ
る。 図において、 1……真空容器壁;2……電離真空計測定子;3……計測用
ポート;4……電極;5……電流導入端子;6……電気絶縁
物;7……電流導入端子支持基板;8……磁気シールドカバ
ー;9……コード接続用の孔;10……真空シール材;11……
固定ボルト;12……溶接部;13……計測用ポートつば;14
……磁気シールド内層。 なお、点線部は非磁性体、斜線部は磁性体を示す。
FIG. 1 is an explanatory view of a conventional magnetically shielded ionization vacuum gauge probe. 2 to 4 are all explanatory views of an embodiment of the present invention. In the figure, 1 ... Vacuum container wall; 2 ... Ionization vacuum gauge probe; 3 ... Measuring port; 4 ... Electrode; 5 ... Current introducing terminal; 6 ... Electrical insulator; 7 ... Current introducing terminal Support substrate; 8 ...... Magnetic shield cover; 9 ...... Cord connection hole; 10 ...... Vacuum seal material; 11 ......
Fixing bolt; 12 ... Welded part; 13 ... Measuring port collar; 14
The inner layer of the magnetic shield. The dotted line shows a non-magnetic material and the shaded area shows a magnetic material.

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電極、電流導入端子、電流導入端子支持基
板、これらを支持する計測用ポート、磁気シールドカバ
ーから成る磁気シールドされた測定子において、電流導
入端子支持基板を磁気シールド材で構成し、かつ磁気シ
ールドカバーを計測用ポートの周囲に配置し、電流導入
端子支持基板と磁気シールドカバーを接続したことを特
徴とする磁気シールドされた測定子。
1. In a magnetically shielded probe comprising an electrode, a current introducing terminal, a current introducing terminal supporting substrate, a measuring port supporting these, and a magnetic shield cover, the current introducing terminal supporting substrate is composed of a magnetic shield material. The magnetic shield cover is arranged around the measurement port, and the current introduction terminal support substrate and the magnetic shield cover are connected to each other.
【請求項2】磁気シールドカバーが計測用ポートの周囲
で回転可能で、磁気シールドカバーと電流導入端子支持
基板とを計測用ポートつばをはさみ込んで接続し、計測
用ポートつばと電流導入端子支持基板の間に真空シール
材を入れたことを特徴とする特許請求の範囲第1項に記
載の磁気シールドされた測定子。
2. A magnetic shield cover is rotatable around the measuring port, and the magnetic shield cover and the current introducing terminal support substrate are connected by sandwiching the measuring port collar, and the measuring port collar and the current introducing terminal are supported. The magnetically shielded probe according to claim 1, wherein a vacuum sealing material is inserted between the substrates.
【請求項3】磁気シールドカバーと計測用ポートの間に
磁気シールド内層を挿入したことを特徴とする特許請求
の範囲第1項に記載の磁気シールドされた測定子。
3. The magnetically shielded probe according to claim 1, wherein an inner layer of the magnetic shield is inserted between the magnetic shield cover and the measurement port.
【請求項4】測定子が電離真空計、光電管、電子増倍
管、四重極質量分析計である特許請求の範囲第1項に記
載の磁気シールドされた測定子。
4. The magnetically shielded probe according to claim 1, wherein the probe is an ionization vacuum gauge, a phototube, an electron multiplier, or a quadrupole mass spectrometer.
JP8100187A 1987-04-03 1987-04-03 Magnetic shield Expired - Lifetime JP2511670B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8100187A JP2511670B2 (en) 1987-04-03 1987-04-03 Magnetic shield

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8100187A JP2511670B2 (en) 1987-04-03 1987-04-03 Magnetic shield

Publications (2)

Publication Number Publication Date
JPS63247689A JPS63247689A (en) 1988-10-14
JP2511670B2 true JP2511670B2 (en) 1996-07-03

Family

ID=13734268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8100187A Expired - Lifetime JP2511670B2 (en) 1987-04-03 1987-04-03 Magnetic shield

Country Status (1)

Country Link
JP (1) JP2511670B2 (en)

Also Published As

Publication number Publication date
JPS63247689A (en) 1988-10-14

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