JP2509303Y2 - Light section microscope - Google Patents
Light section microscopeInfo
- Publication number
- JP2509303Y2 JP2509303Y2 JP4114892U JP4114892U JP2509303Y2 JP 2509303 Y2 JP2509303 Y2 JP 2509303Y2 JP 4114892 U JP4114892 U JP 4114892U JP 4114892 U JP4114892 U JP 4114892U JP 2509303 Y2 JP2509303 Y2 JP 2509303Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical system
- inverted
- image
- measurement surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Description
【0001】[0001]
【産業上の利用分野】本考案は、測定物の測定面に斜め
方向からスリット光(光学的な細い光線)を投射するこ
とによって、上記測定面の表面にならった形状を呈す
る、恰も測定面を切断したかのような光切断像を得て、
これにより測定面の微小な凹凸、段差の深さ高さを測定
するようにした、光切断顕微鏡に関する。BACKGROUND OF THE INVENTION The present invention is designed to project a slit light (optical thin light beam) obliquely onto a measurement surface of an object to be measured so that the surface has a shape similar to that of the above-mentioned surface. I got a light section image as if I cut the
The present invention relates to a light-sectioning microscope for measuring minute irregularities on a measurement surface and depths of steps.
【0002】[0002]
【従来の技術】従来、図7に示すようなスリット光1の
投光用光学系と図9に示すような反転しない光切断像3
の観測用光学系とを、これ等両系の対物レンズの光軸が
測定面7上において交叉する状態で備えた、図8の基本
図に示すような光切断顕微鏡は知られている。(実公平
3−36882号公報、特公昭53ー23094号公報
及び特公昭53ー23095号公報参照)2. Description of the Related Art Conventionally, an optical system for projecting slit light 1 as shown in FIG. 7 and a non-inverted light section image 3 as shown in FIG.
An optical cutting microscope as shown in the basic diagram of FIG. 8 is known, which is provided with the observation optical system described above in a state where the optical axes of the objective lenses of these systems intersect on the measurement surface 7. (See Japanese Utility Model Publication No. 3-36882, Japanese Patent Publication No. 53-23094 and Japanese Patent Publication No. 53-23095)
【0003】[0003]
【考案が解決しようとする課題】上記従来の技術におい
て述べた光切断顕微鏡は、反転しない光切断像8だけを
得て測定面の微小な凹凸、段差の深さ高さを測定するも
のであるため、極めて低い高さの段差の観測・測定を行
う等の場合には対物レンズの倍率を高めて、限られた小
さい視野の中でなすようにしていた。The light-sectioning microscope described in the above-mentioned prior art is intended to measure only the light-sectioning image 8 which is not inverted and to measure the minute unevenness of the measurement surface and the depth height of the step. Therefore, when observing or measuring a step having an extremely low height, the magnification of the objective lens is increased so that the step is performed within a limited small field of view.
【0004】本考案は、対物レンズの倍率や視野の広さ
を変えずにヨコを2倍に拡大して観測・測定をなし得る
ように工夫した新規の光切断顕微鏡を提供することを目
的とする。An object of the present invention is to provide a novel light-sectioning microscope which is devised so that a horizontal image can be magnified twice and observation / measurement can be performed without changing the magnification of the objective lens or the width of the visual field. To do.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
に本発明に係る光切断顕微鏡は、測定物の測定面に斜め
方向からスリット光を投射することによって、上記測定
面の表面にならった形状を呈する反転しない光切断像を
得て、これにより測定面の微小な凹凸、段差等の深さ高
さを測定する光切断顕微鏡において、反転した光切断像
を得る光学系と、反転しない光切断像と反転した光切断
像とを隣接したヨコ並びの状態とする光学系とをもつも
のである。In order to achieve the above object, the light-sectioning microscope according to the present invention follows the surface of the measurement surface by projecting slit light obliquely onto the measurement surface of the measurement object. In a light-sectioning microscope that obtains a non-inverted light-section image that exhibits a shape and measures the depth and height of minute irregularities and steps on the measurement surface, the optical system that obtains the inverted light-section image and the non-inverted light And an optical system for setting the cut image and the inverted light cut image in a laterally adjacent state.
【0006】[0006]
【作用】本考案は上記のような構成であるので、図5お
よび図6に示すような反転しない光切断像3と反転した
光切断像9とを隣接したヨコ並びの状態(ヨコ2倍に拡
大した状態)でもつ視野を得ることができる。この隣接
したヨコ並びの像は光学装置全体の上下微動により左右
に動かして測定基準線10に合せる。Since the present invention is constructed as described above, the non-inverted light-section image 3 and the inverted light-section image 9 as shown in FIGS. 5 and 6 are arranged side by side (double the width). It is possible to obtain the field of view in the enlarged state). The adjacent horizontal images are moved to the left and right by the fine vertical movement of the entire optical device to be aligned with the measurement reference line 10.
【0007】[0007]
【考案の効果】本考案に係わる光切断顕微鏡は、対物レ
ンズの倍率や視野の広さを変えずにヨコを2倍に拡大し
て観測・測定をなし得るものであって、極めて低い・浅
い凹凸や段差の観測・測定に好都合なものであり、正確
度の高い計測に有利である。[Effects of the Invention] The light-sectioning microscope according to the present invention is capable of observing and measuring by enlarging the horizontal by 2 times without changing the magnification of the objective lens and the width of the field of view. It is extremely low and shallow. It is convenient for observing and measuring irregularities and steps, and is advantageous for highly accurate measurement.
【0008】[0008]
【実施例】図に示す実施例は、スリット光1の投光用光
学系2と反転しない光切断像3および後述する反転した
光切断像9の観測用光学系4とをこれ等両系2、4の対
物レンズ5、6の光軸が測定面7の上において交叉する
状態で備えた光切断顕微鏡本体8を構成し、上記観測用
光学系4に、反転した光切断像9を得る機能および反転
しない光切断像3と反転した光切断像9とを隣接したヨ
コ並びの状態とする機能をもつ補助光学系11を装入し
たものである。In the embodiment shown in the drawings, an optical system 2 for projecting slit light 1 and an optical system 4 for observing a light section image 3 which is not inverted and an inverted light section image 9 which will be described later are provided in both systems 2. A function of forming a light-sectioning microscope body 8 provided such that the optical axes of the objective lenses 5 and 6 of 4 intersect on the measurement surface 7 and obtaining an inverted light-sectioning image 9 on the observation optical system 4. Further, the auxiliary optical system 11 having the function of bringing the non-inverted light section image 3 and the reversed light section image 9 into the adjacent horizontal alignment state is installed.
【0009】尚、図2〜図4はそれぞれ上記補助光学系
を示すものであり、反転しない光切断像3の光軸12、
反転した光切断像9の光軸13をもち、プリズムおよび
ハーフミラー等で構成されている。2 to 4 show the above-mentioned auxiliary optical system, respectively, and show the optical axis 12 of the non-inverted light-section image 3,
It has an optical axis 13 of the inverted light section image 9 and is composed of a prism and a half mirror.
【0010】また、図中符号15は接眼レンズ、16は
ランプ、17はスリット板、18は測定物、19は視野
を示すものである。In the figure, reference numeral 15 is an eyepiece lens, 16 is a lamp, 17 is a slit plate, 18 is an object to be measured, and 19 is a visual field.
【図1】本考案実施例の基本図である。FIG. 1 is a basic diagram of an embodiment of the present invention.
【図2】補助光学系の構成図である。FIG. 2 is a configuration diagram of an auxiliary optical system.
【図3】別の補助光学系の構成図である。FIG. 3 is a configuration diagram of another auxiliary optical system.
【図4】更に別の補助光学系の構成図である。FIG. 4 is a configuration diagram of still another auxiliary optical system.
【図5】本考案実施例の視野図である。FIG. 5 is a perspective view of an embodiment of the present invention.
【図6】同じく、別の補助光学系による視野図である。FIG. 6 is a field diagram of another auxiliary optical system.
【図7】スリット光の当たり方を示す説明図である。FIG. 7 is an explanatory diagram showing how slit light strikes.
【図8】従来の基本図である。FIG. 8 is a conventional basic diagram.
【図9】従来例の視野図である。FIG. 9 is a view of a conventional example.
1 スリット光 2 投光用光学系 3 反転しない光切断像 4 観測用光学系 5 対物レンズ 6 対物レンズ 7 測定面 8 顕微鏡本体 9 反転した光切断像 10 測定基準線 11 補助光学系 12 光軸 13 光軸 15 接眼レンズ 16 ランプ 17 スリット板 18 測定物 19 視野 1 Slit light 2 Optical system for projecting light 3 Non-inverted light section image 4 Observation optical system 5 Objective lens 6 Objective lens 7 Measurement surface 8 Microscope body 9 Inverted light section image 10 Measurement reference line 11 Auxiliary optical system 12 Optical axis 13 Optical axis 15 Eyepiece 16 Lamp 17 Slit plate 18 Measured object 19 Field of view
Claims (1)
光を投射することによって、上記測定面の表面にならっ
た形状を呈する反転しない光切断像を得て、これにより
測定面の微小な凹凸、段差等の深さ高さを測定する光切
断顕微鏡において、反転した光切断像を得る光学系と、
反転しない光切断像と反転した光切断像とを隣接したヨ
コ並びの状態とする光学系とをもつことを特徴とする光
切断顕微鏡。1. A non-inverted light-section image having a shape conforming to the surface of the measurement surface is obtained by projecting slit light obliquely onto the measurement surface of the object to be measured, whereby minute irregularities on the measurement surface are obtained. , An optical system for obtaining an inverted light-section image in a light-section microscope for measuring depth heights such as steps,
A light-sectioning microscope having an optical system in which a non-inverted light-sectioned image and an inverted light-sectioned image are arranged in a horizontal row adjacent to each other.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4114892U JP2509303Y2 (en) | 1992-05-22 | 1992-05-22 | Light section microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4114892U JP2509303Y2 (en) | 1992-05-22 | 1992-05-22 | Light section microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0592620U JPH0592620U (en) | 1993-12-17 |
JP2509303Y2 true JP2509303Y2 (en) | 1996-09-04 |
Family
ID=12600339
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4114892U Expired - Lifetime JP2509303Y2 (en) | 1992-05-22 | 1992-05-22 | Light section microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2509303Y2 (en) |
-
1992
- 1992-05-22 JP JP4114892U patent/JP2509303Y2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0592620U (en) | 1993-12-17 |
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