JP2504637B2 - Cream solder arrangement status identification device - Google Patents

Cream solder arrangement status identification device

Info

Publication number
JP2504637B2
JP2504637B2 JP3150456A JP15045691A JP2504637B2 JP 2504637 B2 JP2504637 B2 JP 2504637B2 JP 3150456 A JP3150456 A JP 3150456A JP 15045691 A JP15045691 A JP 15045691A JP 2504637 B2 JP2504637 B2 JP 2504637B2
Authority
JP
Japan
Prior art keywords
light
reflected light
incident angle
cream solder
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3150456A
Other languages
Japanese (ja)
Other versions
JPH055708A (en
Inventor
幸男 原田
進 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP3150456A priority Critical patent/JP2504637B2/en
Publication of JPH055708A publication Critical patent/JPH055708A/en
Application granted granted Critical
Publication of JP2504637B2 publication Critical patent/JP2504637B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、上面にクリームハンダ
を配設された基板面の高さに近い低い位置からの光照
射、即ち基板に対して大入射角の光を照射したときの反
射光の明暗に基づいて基板上のクリームハンダの配設状
況を識別するクリームハンダ配設状況識別方法及び識別
装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention irradiates light from a low position close to the height of the surface of a substrate having a cream solder disposed on the upper surface thereof, that is, irradiates light with a large incident angle to the substrate. The present invention relates to a cream solder arrangement status identification method and an identification apparatus for identifying the arrangement status of cream solder on a substrate based on the brightness of reflected light.

【0002】[0002]

【従来の技術】従来より、プリント基板上に粒状のクリ
ームハンダを配設し、これを次工程へ搬送して部品の接
合等を行うに当り、クリームハンダが基板上に正しく配
設されているか否かを識別する必要があった。
2. Description of the Related Art Conventionally, when a granular cream solder is arranged on a printed circuit board and conveyed to the next step to join parts, etc., is the cream solder properly arranged on the circuit board? It was necessary to identify whether or not.

【0003】このため、図6に示す様に、クリームハン
ダ101が配設された基板103の上方に設置されたカ
メラ105と、基板103に対して大入射角の光を照射
する様に低い位置に配設された光源107と、カメラ1
05からの画像情報に基づいてクリームハンダの配設状
況を二値化する演算装置109とからなるクリームハン
配設状況識別装置100が知られている。
For this reason, as shown in FIG. 6, the camera 105 installed above the substrate 103 on which the cream solder 101 is disposed, and the low position so that the substrate 103 is irradiated with light having a large incident angle. Light source 107 disposed in the
Cream Han consisting arithmetic unit 109 for binarizing the arrangement status of the cream solder on the basis of the image information from the 05
A device arrangement status identification device 100 is known.

【0004】この光源107からの光照射によれば、ク
リームハンダ101からの反射光はいわゆる乱反射の状
態となるのに対し、基板103からの反射光は基板面に
沿う大きい出射角のものとなる。この結果、カメラ10
5には、クリームハンダ101の配設された部分が明る
く、基板103の露出した部分は暗い画像が捉えられ
る。演算装置109では、こうしてカメラ105にて捉
えられた画像をさらに二値化して明暗の状況を明瞭化す
る。この二値化の結果に基づいて、予定した様なクリー
ムハンダ配設状況となっているか否か等が判断できる。
By the light irradiation from the light source 107, the reflected light from the cream solder 101 is in a so-called irregular reflection state, while the reflected light from the substrate 103 has a large emission angle along the substrate surface. . As a result, the camera 10
In FIG. 5, a portion where the cream solder 101 is arranged is bright, and an exposed portion of the substrate 103 is dark. The arithmetic device 109 further binarizes the image captured by the camera 105 in this way to clarify the bright and dark conditions. On the basis of this two value of the result, Cree, such as the planned
It is possible to judge whether or not the situation is such that the solder is installed.

【0005】[0005]

【発明が解決しようとする課題】しかし、この手法は基
板103が平滑であることを前提としているため、その
面粗の状態によっては基板103も乱反射を起こしてし
まい、境界線を正しく把握することができないという問
題があった。
However, since this method is premised on that the substrate 103 is smooth, the substrate 103 will also cause diffused reflection depending on the state of the surface roughness, and the boundary line must be correctly grasped. There was a problem that I could not do it.

【0006】また、面粗に限らず、基板103の表面に
酸化防止用のプリフラックスの皮膜が形成されていた
り、材質が変更されることによって、基板103の反射
率が変わってしまうことや、クリームハンダ101の種
類によってもクリームハンダ101の反射率が変わって
しまうなどといったことがあるため、クリームハンダ
01からの反射光と基板103からの反射光との明暗が
接近してしまう場合がある。このため、材質その他の条
件により正しい二値化情報が得られない場合があるとい
う問題があった。
In addition to the surface roughness, the reflectance of the substrate 103 may be changed by forming a pre-flux film for preventing oxidation on the surface of the substrate 103 or changing the material. Since the reflectance of the cream solder 101 may change depending on the type of the cream solder 101, the cream solder 1
The reflected light from 01 and the reflected light from the substrate 103 may come close to each other in brightness. Therefore, there is a problem that correct binarization information may not be obtained depending on the material and other conditions.

【0007】一方、光源107を極めて低い位置に配設
して、基板に対する入射角を「90度」に近くすれば、
基板103からの反射光がカメラ105に捉えられなく
なってクリームハンダ101の輪郭が明瞭に捉えられる
様になり、上述の問題に対処することができる。しか
し、この場合には、中央にクリームハンダ101が配設
されないいわゆる「中べこ」を識別できなくなるという
問題があった。
On the other hand, if the light source 107 is arranged at an extremely low position and the incident angle with respect to the substrate is close to "90 degrees",
The reflected light from the substrate 103 is no longer captured by the camera 105, so that the outline of the cream solder 101 can be captured clearly, and the above-described problem can be addressed. However, in this case, there is a problem in that it is impossible to identify a so-called "mushroom" in which the cream solder 101 is not arranged in the center.

【0008】そこで、基板の面粗や材質、クリームハン
の材質に影響されることなく基板上でのクリームハン
の配設状況を正しく識別することができ、かつ新たな
識別不良の問題を発生させないクリームハンダ配設状況
識別装置を提供することを目的として本発明を完成し
た。
Therefore, the surface roughness and material of the substrate, cream han
Cream Han on the substrate without being influenced by the material of da
You can correctly identify the arrangement status of da, and does not generate a new identification problem of defective solder paste disposed Availability
The present invention has been completed for the purpose of providing an identification device .

【0009】[0009]

【課題を解決するための手段及び作用】かかる目的を達
成するためなされた本発明のクリームハンダ配置状況識
別装置は、基板に対して大入射角となる方向から光を照
射する大入射角光照射手段と、基板の上方に配設された
反射光検出手段と、該反射光検出手段が、前記大入射角
光照射手段からの光照射により検出した反射光の明暗の
情報を読み込む大入射角反射光読込手段と、該大入射角
反射光読込手段が読み込んだ反射光の明暗の情報に基づ
き、基板上のクリームハンダの配設状況を判断する配設
状況判断手段とを備えたクリームハンダ配設状況識別装
置において、基板に対して小入射角となる方向から光を
照射する小入射角光照射手段と、前記反射光検出手段
が、前記小入射角光照射手段からの光照射により検出し
た反射光の明暗の情報を読み込む小入射角反射光読込手
段と、該小入射角反射光読込手段の読み込んだ反射光の
明暗の情報により、前記大入射角反射光読込手段が読み
込んだ反射光の明暗の情報を補正し、その明暗の境界線
を明瞭化して前記配設状況判断手段に与える明暗明瞭化
手段とを備え、前記明暗明瞭化手段は、大入射角反射光
又は小入射角反射光の一 方の明暗の情報を反転し、他方
の明暗の情報と重ね重ね合わせることにより前記境界線
の明瞭化を行うことを特徴とする
DISCLOSURE OF THE INVENTION Means and Actions for Solving the Problems The knowledge of the arrangement condition of the cream solder of the present invention, which is made in order to achieve the above object
Another device illuminates light from a direction with a large incident angle with respect to the substrate.
A large-incidence-angle light irradiating means for irradiating, and arranged above the substrate.
The reflected light detecting means and the reflected light detecting means
The brightness of the reflected light detected by the light irradiation from the light irradiation means
Large incident angle reflected light reading means for reading information, and the large incident angle
Based on the information on the brightness of the reflected light read by the reflected light reading means.
When deciding the status of cream solder on the board
Situation identification device for allocating cream solder with situation determining means
Light from a direction that has a small angle of incidence with respect to the substrate.
Small incident angle light irradiating means for irradiating, and the reflected light detecting means
Is detected by light irradiation from the small incident angle light irradiation means.
Small incident angle reflected light reader that reads information about the brightness of reflected light
And the reflected light read by the small incident angle reflected light reading means.
The light and dark information is read by the large incident angle reflected light reading means.
Corrects the information on the light and darkness of the reflected light that has been included, and the boundary line between the light and darkness
Clarification of light and darkness to be given to the arrangement determination means
Means for clarifying the brightness and darkness,
Or inverts the brightness information of the hand of a small incident angle the reflected light, the other
The boundary line is obtained by superimposing the light and dark information of
The feature is to clarify .

【0010】本発明のクリームハンダ識別装置におい
て、大入射角の光照射により得られる反射光の明暗の情
とは、従来の識別方法により得られていたのと同じ明
暗の情報をいう。即ち、クリームハンダの乱反射に基づ
き、クリームハンダ配設部分が明るいが、基板露出部分
は暗く表れた情報である。一方、小入射角の光照射によ
り得られた反射光の明暗の情報は、基板露出部分からは
全面反射として得られ、クリームハンダの配設部分から
は乱反射として得られる反射光の明暗であって、大入射
角の光照射の場合とは異なって、基板露出部分が明る
く、クリームハンダ配設部分が暗く表れた情報である。
従って、前者に対して後者の情報を加味した補正を行え
ば、前者におけるクリームハンダの配設位置をより明瞭
化することができるのである。
In the cream solder identifying apparatus of the present invention, the information on the brightness of the reflected light obtained by the irradiation of light with a large incident angle is shown.
The information is the same light and dark information as obtained by the conventional identification method. That is, based on the diffuse reflection of the cream solder, although light cream solder arranged partial, substrate exposed portion is dark manifestation information. On the other hand, the information on the brightness of the reflected light obtained by irradiating the light with a small incident angle is obtained as the total reflection from the exposed portion of the substrate and the light and darkness of the reflected light obtained as the diffuse reflection from the portion where the cream solder is arranged. Unlike the case of light irradiation with a large incident angle, the exposed portion of the substrate is bright and the portion where the cream solder is arranged appears dark.
Therefore, if the former is corrected by adding the latter information, the arrangement position of the cream solder in the former can be made clearer.

【0011】本発明の採用した明暗明瞭化手段によれ
ば、大入射角の光照射により得られた反射光の明の部分
がより強調され、その暗の部分との境界が明瞭化される
のである。なお、大入射角光照射手段と小入射角光照射
手段とを別々に備えてもよいし、一つの光照射手段を上
下に移動させることで実現してもよい
According to the bright and dark clarification means adopted by the present invention
For example, the bright part of the reflected light obtained by irradiating light with a large incident angle is emphasized more and the boundary with the dark part is clarified. The large incidence angle light irradiation means and the small incidence angle light irradiation means may be separately provided, or may be realized by moving one light irradiation means up and down .

【0012】[0012]

実施例】次に、本発明を一層明らかにするために、好
適な実施例を説明する。実施例としてのクリームハンダ
配設状況識別装置は、基板に対してクリームハンダを配
設する工程から次工程への基板搬送路の途中に設けられ
る。
EXAMPLES Next, in order to clarify the present invention more, illustrating the preferred embodiments. The cream solder arrangement status identification device as an example is provided in the middle of the board conveying path from the step of arranging the cream solder to the board to the next step.

【0013】クリームハンダ配設状況識別装置1は、図
1に示す様に、上面にクリームハンダ3を載置された基
板5の上方に配設されたカメラ7と、基板5に対して大
入射角の光を照射する様に低い位置に配設されたリング
状の蛍光灯からなる大入射角光源9と、カメラ7のすぐ
横に配設された光ファイバを介して基板に略鉛直方向か
ら光を照射する小入射角光源11と、カメラ7からの画
像情報を読み込んで各種制御処理を実行する演算装置1
3とを備えている。
As shown in FIG. 1, the cream solder arrangement status identification device 1 has a camera 7 arranged above a substrate 5 on which the cream solder 3 is placed, and a large incidence on the substrate 5. From a substantially vertical direction to the substrate through a large incident angle light source 9 composed of a ring-shaped fluorescent lamp arranged at a low position so as to irradiate a corner light, and an optical fiber arranged immediately beside the camera 7. A small incident angle light source 11 that emits light and an arithmetic unit 1 that reads image information from the camera 7 and executes various control processes
3 is provided.

【0014】演算装置13は、図2に示す様に、CP
U,ROM,RAM等を備えたいわゆるコンピュータで
あり、カメラ7だけではなく各光源9,11とも接続さ
れ、その点灯・消灯の制御指令を実行すると共に、コン
ベア15等の周辺機器とも接続されて各種制御処理を行
う様に構成されている。
As shown in FIG. 2, the arithmetic unit 13 has a CP
This is a so-called computer equipped with U, ROM, RAM, etc., and is connected not only to the camera 7 but also to the respective light sources 9 and 11 to execute control commands for turning on / off the light source, and also connected to peripheral devices such as the conveyor 15. It is configured to perform various control processes.

【0015】演算装置13は、図3で示す手順により、
クリームハンダ配設状況識別処理を行っている。まず、
コンベア15を停止し(S1)、小入射角光源11を点
灯する(S2)。続いてこのときカメラ7にて撮像され
る反射光の画像を読み込み(S3)、反射光の明暗の情
報Bに変換する(S4)。図4に示す様に、基板5の露
出部分が「ハイレベル」でクリームハンダの配設部分が
「ロウレベル」となる情報に二値化するのである。
The arithmetic unit 13 executes the procedure shown in FIG.
Cream solder arrangement status identification processing is performed. First,
The conveyor 15 is stopped (S1), and the small incident angle light source 11 is turned on (S2). Subsequently, at this time, the image of the reflected light imaged by the camera 7 is read (S3) and converted into information B of the brightness of the reflected light (S4). As shown in FIG. 4, the exposed portion of the substrate 5 is binarized into the information in which the exposed portion of the substrate 5 is "high level" and the portion where the cream solder is arranged is "low level".

【0016】その後、小入射角光源11を消灯し(S
5)、代わりに大入射角光源9を点灯し(S6)、この
ときカメラ7にて撮像される反射光の画像を読み込み
(S7)、これを反射光の明暗の情報Aに変換する(S
8)。今度は先ほどとは逆に、クリームハンダの配設部
分が「ハイレベル」で基板5の露出部分が「ロウレベ
ル」となる情報に二値化される。
Thereafter, the small incident angle light source 11 is turned off (S
5) Instead, the large incident angle light source 9 is turned on (S6), the image of the reflected light captured by the camera 7 at this time is read (S7), and this is converted into the information A of the brightness of the reflected light (S).
8). Contrary to the previous case, the binarized information is such that the portion where the cream solder is arranged is “high level” and the exposed portion of the substrate 5 is “low level”.

【0017】続いて、S4の処理で求めた小入射角光源
11点灯時の反射光の明暗情報Bを反転し(S9)、こ
れをS8の処理で求めた大入射角光源9を点灯した時の
反射光の明暗情報Aと重ね合わせる(S10)。そし
て、両者が互いに重なり合った部分をクリームハンダ
設部分として識別する(S11)。
Subsequently, when the small incident angle light source 11 obtained in the process of S4 is turned on, the brightness information B of the reflected light is inverted (S9), and when the large incident angle light source 9 obtained in the process of S8 is turned on. It is superposed on the brightness information A of the reflected light (S10). Then, the portion where both of them overlap each other is identified as the cream solder disposition portion (S11).

【0018】その後は大入射角光源9を消灯すると共に
(S12)、S11の処理による識別結果と予め記憶し
ていた情報とを比較してクリームハンダ配設状況の良/
不良を判断し(S13)、コンベア15を駆動し(S1
4)、次の基板に対して同様の処理を繰り返す。
After that, the large incident angle light source 9 is turned off (S12), and the discrimination result by the processing of S11 is compared with the previously stored information to determine whether the cream solder is installed or not.
A defect is judged (S13), and the conveyor 15 is driven (S1
4) Then, the same process is repeated for the next substrate.

【0019】この実施例によれば、図4に示した様に、
クリームハンダ配設部分をより強調することができ、境
界線が明瞭化される。従来例による場合には、基板の露
出部分からもかなりの明るさの光が反射光として得られ
るため、境界が明瞭でない。また、図5に示す様に、大
入射角光源9の配設位置を高くすることができ、基板中
央にクリームハンダが配設されていない「中べこ」の状
態をも良好に識別することができる。一方、従来例によ
れば、識別性能の向上のためには光源107を低くしな
けらばならず、「中べこ」が発見できなくなってしま
う。
According to this embodiment, as shown in FIG.
The portion where the cream solder is arranged can be more emphasized and the boundary line can be made clear. In the case of the conventional example, since the light of considerable brightness is obtained as reflected light from the exposed portion of the substrate, the boundary is not clear. Further, as shown in FIG. 5, the position where the large incident angle light source 9 is arranged can be increased, and the "middle-between" state in which the cream solder is not arranged in the center of the substrate can be properly identified. You can On the other hand, according to the conventional example, in order to improve the identification performance, the light source 107 has to be lowered, so that the "middle ridge" cannot be found.

【0020】以上本発明の実施例を説明したが、本発明
はこれら実施例に限定されるものではなく、その要旨を
逸脱しない範囲内で種々なる態様にて実現することがで
きることはいうまでもないまた、光源を一つにして上
下に高さを移動させる移動機構を備え、大入射角位置と
小入射角位置とを選択できる様にしてもよい。
Although the embodiments of the present invention have been described above, it goes without saying that the present invention is not limited to these embodiments and can be implemented in various modes without departing from the scope of the invention. Not . Also, a moving mechanism that moves the height up and down with one light source may be provided so that the large incident angle position and the small incident angle position can be selected.

【0021】加えて、光源の種類も実施例のものに限定
されない。
In addition, the type of light source is not limited to that of the embodiment.

【0022】[0022]

【発明の効果】以上説明した様に、本発明のクリームハ
ンダ配設状況識別装置によれば、基板の面粗や材質、
リームハンダの材質に影響されることなく基板上での
リームハンダの1つ1つの配設の輪郭を正しく識別する
ことができ、かつ新たな識別不良の問題を発生させな
As described above, the cream of the present invention is used.
According to the apparatus for identifying the arrangement of the binder , the surface roughness, material, and
The crack on the board is not affected by the material of the ream solder .
The contour of each arrangement of the ream solder can be correctly identified, and a new problem of misidentification does not occur .

【図面の簡単な説明】[Brief description of drawings]

【図1】 実施例のクリームハンダ配設状況識別装置の
概略構成図である。
FIG. 1 is a schematic configuration diagram of a cream solder arrangement status identification device according to an embodiment.

【図2】 その演算装置と機器との関係を表した概略構
成図である。
FIG. 2 is a schematic configuration diagram showing a relationship between the arithmetic unit and equipment.

【図3】 実施例におけるクリームハンダ配設状況識別
処理のフローチャートである。
FIG. 3 is a flowchart of cream solder arrangement status identification processing in the embodiment.

【図4】 実施例による識別状況を従来例と比較して表
したの模式図である。
FIG. 4 is a schematic diagram showing an identification situation according to an embodiment in comparison with a conventional example.

【図5】 実施例による識別状況を従来例と比較して表
したの模式図である。
FIG. 5 is a schematic diagram showing an identification situation according to an embodiment in comparison with a conventional example.

【図6】 従来例のクリームハンダ配設状況識別装置の
概略構成図である。
FIG. 6 is a schematic configuration diagram of a conventional cream solder arrangement status identification device.

【符号の説明】[Explanation of symbols]

1・・・クリームハンダ配設状況識別装置、3・・・ク
リームハンダ、5・・・基板、7・・・カメラ、9・・
・大入射角光源9、11・・・小入射角光源、13・・
・演算装置、15・・・コンベア。
1 ... Cream solder arrangement status identification device, 3 ... Cream solder, 5 ... Board, 7 ... Camera, 9 ...
.Large incident angle light sources 9, 11 ... Small incident angle light sources, 13 ...
・ Calculator, 15 ... Conveyor.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 クリームハンダが所定位置に配設された
基板に対してクリームハンダの散乱反射光を得るため
入射角となる方向から光を照射する大入射角光照射手段
と、 基板の上方に配設された反射光検出手段と、 該反射光検出手段が、前記大入射角光照射手段からの光
照射により検出した反射光の明暗の情報を読み込む大入
射角反射光読込手段と、 該大入射角反射光読込手段が読み込んだ反射光の明暗の
情報に基づき、基板上のクリームハンダの配設状況を判
断する配設状況判断手段と を備えたクリームハンダ配設状況識別装置において、 基板に対して小入射角となる方向から光を照射する小入
射角光照射手段と、 前記反射光検出手段が、前記小入射角光照射手段からの
光照射により検出した反射光の明暗の情報を読み込む小
入射角反射光読込手段と、 該小入射角反射光読込手段の読み込んだ反射光の明暗の
情報により、前記大入射角反射光読込手段が読み込んだ
反射光の明暗の情報を補正し、その明暗の境界線を明瞭
化して前記配設状況判断手段に与える明暗明瞭化手段と を備え、 前記明暗明瞭化手段は、大入射角反射光又は小入射角反
射光の一方の明暗の情報を反転し、他方の明暗の情報と
重ね重ね合わせることにより前記境界線の明瞭化を行う
ことを特徴とするクリームハンダ 配設状況識別装置。
1. A large-incidence-angle light irradiating means for irradiating a substrate, on which cream solder is arranged at a predetermined position, with light from a direction having a large incident angle in order to obtain scattered reflected light of the cream solder. A reflected light detecting means arranged above the substrate, and a large incident angle reflected light reading means for reading the information on the brightness of the reflected light detected by the light irradiation from the large incident angle light irradiating means by the reflected light detecting means. means and, based on the brightness information of the large angle of incidence reflected light reading means read the reflected light, cream solder arrangement situation identifying that a disposition state determining means for determining the arrangement status of the cream solder on the substrate In the apparatus, a small incident angle light irradiating means for irradiating the substrate with light from a direction having a small incident angle, and a reflected light detected by the reflected light detecting means by the light irradiation from the small incident angle light irradiating means. Small incidence that reads information about light and dark The reflected light reading means and the light / dark information of the reflected light read by the small incident angle reflected light reading means corrects the light / dark information of the reflected light read by the large incident angle reflected light reading means, and a boundary between the light and dark e Bei a dark clarity means to clarify the lines given to the arrangement state determining means, said dark clarity means large incident angle the reflected light or small incident angle reaction
The light and dark information of one of the incident light is inverted, and the light and dark information of the other is inverted.
Clarify the boundary line by overlapping
A device for identifying the state of arrangement of cream solder, characterized in that
JP3150456A 1991-06-21 1991-06-21 Cream solder arrangement status identification device Expired - Lifetime JP2504637B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3150456A JP2504637B2 (en) 1991-06-21 1991-06-21 Cream solder arrangement status identification device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3150456A JP2504637B2 (en) 1991-06-21 1991-06-21 Cream solder arrangement status identification device

Publications (2)

Publication Number Publication Date
JPH055708A JPH055708A (en) 1993-01-14
JP2504637B2 true JP2504637B2 (en) 1996-06-05

Family

ID=15497327

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3150456A Expired - Lifetime JP2504637B2 (en) 1991-06-21 1991-06-21 Cream solder arrangement status identification device

Country Status (1)

Country Link
JP (1) JP2504637B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012124399A (en) * 2010-12-10 2012-06-28 Panasonic Corp Screen printer and solder inspection method in screen printer

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2775411B2 (en) * 1995-07-25 1998-07-16 名古屋電機工業株式会社 Lighting equipment for printed wiring board inspection equipment
KR100281881B1 (en) 1998-07-01 2001-02-15 윤종용 cream solder inspection apparatus and the method thereof
JP5740595B2 (en) * 2010-12-01 2015-06-24 シーシーエス株式会社 Outline detection method and outline detection apparatus
JP5820424B2 (en) * 2013-04-16 2015-11-24 Ckd株式会社 Solder printing inspection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0660810B2 (en) * 1987-10-29 1994-08-10 日本電装株式会社 Solder image processing device on ceramic substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012124399A (en) * 2010-12-10 2012-06-28 Panasonic Corp Screen printer and solder inspection method in screen printer

Also Published As

Publication number Publication date
JPH055708A (en) 1993-01-14

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