JP2500601B2 - p-type II-VI semiconductor - Google Patents
p-type II-VI semiconductorInfo
- Publication number
- JP2500601B2 JP2500601B2 JP13202093A JP13202093A JP2500601B2 JP 2500601 B2 JP2500601 B2 JP 2500601B2 JP 13202093 A JP13202093 A JP 13202093A JP 13202093 A JP13202093 A JP 13202093A JP 2500601 B2 JP2500601 B2 JP 2500601B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- semiconductor
- type
- acceptor
- added
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Description
【0001】[0001]
【産業上の利用分野】本発明は、青色半導体レーザなど
に用いられる禁制帯幅の大きいp形II−VI化合物半導体
に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a p-type II-VI compound semiconductor having a large forbidden band used for a blue semiconductor laser or the like.
【0002】[0002]
【従来の技術】SまたはSeを含むII−VI族化合物半導
体は禁制帯幅が大きく、青色半導体レーザなどに用いら
れている。この材料系ではp形伝導を得るのが難しいた
め、ZnTeとZnSeからなる超格子を作製し、Zn
Te層のみにアクセプタを添加する方法が試みられてい
る(特開平3−270278号公報)。2. Description of the Related Art II-VI group compound semiconductors containing S or Se have a large forbidden band and are used for blue semiconductor lasers and the like. Since it is difficult to obtain p-type conduction in this material system, a superlattice made of ZnTe and ZnSe was prepared and
A method of adding an acceptor only to the Te layer has been attempted (Japanese Patent Laid-Open No. 3-270278).
【0003】[0003]
【発明が解決しようとする課題】しかしながら、従来の
ようなZnTe層へのアクセプタの添加ではアクセプタ
濃度を1×1018cm-3以上にすることができず、また
非常に大きな歪が入った超格子であるため、結晶性が悪
いという問題を有していた。However, the addition of an acceptor to the ZnTe layer as in the prior art cannot raise the acceptor concentration to 1 × 10 18 cm −3 or more, and the ultra-strain with a very large strain is introduced. Since it is a lattice, it has a problem of poor crystallinity.
【0004】本発明の目的は、このような問題点を解決
したp形II−VI半導体を提供することにある。An object of the present invention is to provide a p-type II-VI semiconductor which solves the above problems.
【0005】[0005]
【課題を解決するための手段】本発明は、イオウ(S)
またはセレン(Se)を含むII−VI族化合物半導体にお
いて、アクセプタを単原子層状に添加したデルタドーピ
ング層を有し、前記デルタドーピング層の第1または第
2隣接原子であるVI族原子平面の少なくとも一方に、1
%以上のテルル(Te)を含むTe添加層を有し、前記
デルタドーピング層と前記Te添加層とを単数または複
数有することを特徴とする。The present invention is based on sulfur (S)
Alternatively, in a II-VI group compound semiconductor containing selenium (Se), a delta doping layer in which acceptors are added in a monoatomic layer shape, and at least a group VI atomic plane that is a first or second adjacent atom of the delta doping layer On the other hand, 1
% Of tellurium (Te), and a single or a plurality of the delta doping layer and the Te addition layer.
【0006】[0006]
【作用】ZnSe,ZnS半導体では2×1018cm-3
以上にアクセプタを添加することができず、アクセプタ
準位も120meVと深いため室温での正孔濃度を5×
1017cm-3以上にすることはできない。アクセプタを
デルタドーピングし、それに隣接するVI族原子平面にT
eを添加すると、アクセプタ原子に隣接するVI族原子の
一部がTe原子となる。Te原子にはアクセプタの添加
濃度を高める働きと、アクセプタ準位を浅くする働きと
があるため、隣接原子の一部がTeになることにより、
高濃度ドーピングが実現でき、アクセプタ準位が浅くな
る。アクセプタの添加がデルタドーピングであるため、
平面状にアクセプタが配列されており、Teを平面状に
添加するだけで、Teがアクセプタ不純物に隣接する確
率を高くすることができる。Function: 2 × 10 18 cm −3 for ZnSe and ZnS semiconductors
Since no acceptor can be added and the acceptor level is deep at 120 meV, the hole concentration at room temperature is 5 ×.
It cannot be more than 10 17 cm -3 . Delta-doping the acceptor, and T on the group VI atomic plane adjacent to it
When e is added, part of Group VI atoms adjacent to the acceptor atom becomes Te atom. Since the Te atom has a function of increasing the concentration of the added acceptor and a function of shallowing the acceptor level, a part of the adjacent atoms becomes Te,
High-concentration doping can be realized, and the acceptor level becomes shallow. Since the addition of acceptor is delta doping,
The acceptors are arranged in a plane, and the probability of Te being adjacent to the acceptor impurity can be increased by simply adding Te in a plane.
【0007】[0007]
【実施例】図1は本発明の実施例を示す結晶構造の模式
図である。EXAMPLE FIG. 1 is a schematic view of a crystal structure showing an example of the present invention.
【0008】p形GaAs基板上に分子線エピタキシー
法により成長した。窒素(N)を1×1017cm-3添加
したZnSe層1(厚さ2nm)と、ZnTe0.5 Se
0.51原子層からなるTe添加層2と、Nを2×1019
cm-3添加した1原子層のZnSeからなるデルタドー
ピング層3とを30周期有したp形ZnSe半導体を得
た。このp形ZnSe半導体層の正孔濃度は3×1018
cm-3と非常に高く、半導体レーザのp形クラッド層に
用いて抵抗を半分に下げることができた。It was grown on a p-type GaAs substrate by the molecular beam epitaxy method. ZnSe layer 1 (thickness 2 nm) to which nitrogen (N) was added at 1 × 10 17 cm −3 and ZnTe 0.5 Se
0.5 1 atomic layer of Te-added layer 2 and N of 2 × 10 19
A p-type ZnSe semiconductor having 30 cycles of the delta doping layer 3 made of 1 atomic layer of ZnSe added with cm −3 was obtained. The hole concentration of this p-type ZnSe semiconductor layer is 3 × 10 18.
It was very high at cm −3, and the resistance could be reduced to half by using it for the p-type cladding layer of the semiconductor laser.
【0009】従来のN添加ZnSe層の正孔濃度は5×
1017cm-3以下であるが、本実施例では、Te添加層
2とデルタドーピング層3が隣接していて、デルタドー
ピング層3中のNの第2隣接原子の一部がTeとなるた
め、Nの添加量が2×1019cm-3と増加し、アクセプ
タ準位も80meVと浅くなり、正孔濃度が大幅に増加
した。これはSeに比べTeを含むII−VI化合物半導体
の方が添加しやすく、なおかつアクセプタ準位が浅いた
めである。また、正孔に対するポテンシャルはデルタド
ーピング層3に比べ、Te添加層2の方が低いため、デ
ルタドーピング層3中のNアクセプタからTe添加層2
へと正孔が移動し、平均的なアクセプタ準位が下がる。The hole concentration of the conventional N-doped ZnSe layer is 5 ×
Although it is 10 17 cm −3 or less, in the present embodiment, the Te-doped layer 2 and the delta-doping layer 3 are adjacent to each other, and part of the second adjacent atoms of N in the delta-doping layer 3 become Te. , N was increased to 2 × 10 19 cm −3 , the acceptor level was also reduced to 80 meV, and the hole concentration was significantly increased. This is because the II-VI compound semiconductor containing Te is easier to add than Se and the acceptor level is shallow. In addition, the potential for holes is lower in the Te-added layer 2 than in the delta-doped layer 3, so that the Te-added layer 2 is transferred from the N acceptor in the delta-doped layer 3.
The holes move to and the average acceptor level is lowered.
【0010】上述の実施例では、半導体材料としてZn
Seを、p形不純物としてNを用いたが、これに限ら
ず、ZnSやZnCdSSeなどの他の半導体材料や、
Li,Asなどの他のp形不純物を用いてもよい。In the above embodiment, Zn was used as the semiconductor material.
Although Se is used as N as the p-type impurity, the present invention is not limited to this, and other semiconductor materials such as ZnS and ZnCdSSe, and
Other p-type impurities such as Li and As may be used.
【0011】[0011]
【発明の効果】以上説明したように、本発明により正孔
濃度の高いII−VI半導体層が可能となり、青色半導体レ
ーザなどのデバイスが実現できる。As described above, according to the present invention, a II-VI semiconductor layer having a high hole concentration can be obtained, and a device such as a blue semiconductor laser can be realized.
【図1】図1は本発明の実施例を示す模式図である。FIG. 1 is a schematic view showing an embodiment of the present invention.
1 ZnSe層 2 Te添加層 3 デルタドーピング層 1 ZnSe layer 2 Te addition layer 3 Delta doping layer
Claims (3)
II−VI族化合物半導体において、 アクセプタを単原子層状に添加したデルタドーピング層
を有し、前記デルタドーピング層の第1または第2隣接
原子であるVI族原子平面の少なくとも一方に、テルル
(Te)添加層を有し、前記デルタドーピング層と前記
Te添加層とを単数または複数有することを特徴とする
p形II−VI半導体。1. Containing sulfur (S) or selenium (Se)
The II-VI group compound semiconductor has a delta doping layer to which an acceptor is added in the form of a monoatomic layer, and tellurium (Te) is present on at least one of the group VI atomic planes that are the first or second adjacent atoms of the delta doping layer. A p-type II-VI semiconductor having an additive layer and having one or more of the delta doping layer and the Te additive layer.
ことを特徴とする請求項1記載のp形II−VI半導体。2. The p-type II-VI semiconductor according to claim 1, wherein the Te-doped layer contains 1% or more of Te.
添加した1原子層のZnSeであり、前記Te添加層
は、ZnTeSe層であることを特徴とする請求項1ま
たは2記載のp形II−VI半導体。3. The p-type according to claim 1, wherein the delta doping layer is one atomic layer of ZnSe added with nitrogen (N), and the Te addition layer is a ZnTeSe layer. II-VI semiconductor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13202093A JP2500601B2 (en) | 1993-06-02 | 1993-06-02 | p-type II-VI semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13202093A JP2500601B2 (en) | 1993-06-02 | 1993-06-02 | p-type II-VI semiconductor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06342937A JPH06342937A (en) | 1994-12-13 |
JP2500601B2 true JP2500601B2 (en) | 1996-05-29 |
Family
ID=15071647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13202093A Expired - Fee Related JP2500601B2 (en) | 1993-06-02 | 1993-06-02 | p-type II-VI semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2500601B2 (en) |
-
1993
- 1993-06-02 JP JP13202093A patent/JP2500601B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH06342937A (en) | 1994-12-13 |
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