JP2025512394A - 作業表面の修復後検査のためのシステム及び方法 - Google Patents
作業表面の修復後検査のためのシステム及び方法 Download PDFInfo
- Publication number
- JP2025512394A JP2025512394A JP2024560386A JP2024560386A JP2025512394A JP 2025512394 A JP2025512394 A JP 2025512394A JP 2024560386 A JP2024560386 A JP 2024560386A JP 2024560386 A JP2024560386 A JP 2024560386A JP 2025512394 A JP2025512394 A JP 2025512394A
- Authority
- JP
- Japan
- Prior art keywords
- image
- imaging
- imaging system
- terrain
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
- B25J11/005—Manipulators for mechanical processing tasks
- B25J11/0065—Polishing or grinding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/579—Depth or shape recovery from multiple images from motion
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/695—Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
- G01N2021/9518—Objects of complex shape, e.g. examined with use of a surface follower device using a surface follower, e.g. robot
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Theoretical Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Mechanical Engineering (AREA)
- Robotics (AREA)
- Quality & Reliability (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202263363056P | 2022-04-15 | 2022-04-15 | |
| US63/363,056 | 2022-04-15 | ||
| PCT/IB2023/053800 WO2023199266A1 (en) | 2022-04-15 | 2023-04-13 | Systems and methods for post-repair inspection of a worksurface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2025512394A true JP2025512394A (ja) | 2025-04-17 |
| JP2025512394A5 JP2025512394A5 (enExample) | 2026-04-15 |
Family
ID=86386908
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024560386A Pending JP2025512394A (ja) | 2022-04-15 | 2023-04-13 | 作業表面の修復後検査のためのシステム及び方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250259290A1 (enExample) |
| EP (1) | EP4508419A1 (enExample) |
| JP (1) | JP2025512394A (enExample) |
| WO (1) | WO2023199266A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250326133A1 (en) * | 2024-04-18 | 2025-10-23 | Ford Global Technologies, Llc | Systems and methods for a cleaning process of targeted surfaces |
| CN120862475B (zh) * | 2025-09-28 | 2025-12-05 | 内蒙古工业大学 | 一种智能化风电塔筒外壁打磨系统及方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4989984A (en) * | 1989-11-08 | 1991-02-05 | Environmental Research Institute Of Michigan | System for measuring optical characteristics of curved surfaces |
| US5477268A (en) * | 1991-08-08 | 1995-12-19 | Mazda Motor Corporation | Method of and apparatus for finishing a surface of workpiece |
| US6714831B2 (en) * | 2002-01-24 | 2004-03-30 | Ford Motor Company | Paint defect automated seek and repair assembly and method |
| JP4719284B2 (ja) * | 2008-10-10 | 2011-07-06 | トヨタ自動車株式会社 | 表面検査装置 |
| US20190238796A1 (en) * | 2017-05-11 | 2019-08-01 | Jacob Nathaniel Allen | Object Inspection System And Method For Inspecting An Object |
| US20210323167A1 (en) * | 2018-08-27 | 2021-10-21 | 3M Innovative Properties Company | Learning framework for robotic paint repair |
| WO2021105865A1 (en) * | 2019-11-27 | 2021-06-03 | 3M Innovative Properties Company | Robotic repair control systems and methods |
| IT202000004786A1 (it) * | 2020-03-06 | 2021-09-06 | Geico Spa | Testa di scansione per la rilevazione di difetti su superfici e stazione di rilevazione con tale testa |
-
2023
- 2023-04-13 EP EP23724384.5A patent/EP4508419A1/en active Pending
- 2023-04-13 JP JP2024560386A patent/JP2025512394A/ja active Pending
- 2023-04-13 WO PCT/IB2023/053800 patent/WO2023199266A1/en not_active Ceased
- 2023-04-13 US US18/856,804 patent/US20250259290A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023199266A1 (en) | 2023-10-19 |
| EP4508419A1 (en) | 2025-02-19 |
| US20250259290A1 (en) | 2025-08-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20260407 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260407 |