JP2024513539A - Test equipment and electronic equipment - Google Patents

Abstract

A test device and electronic device are provided. The test device includes a control module (10), a test module (20), and at least one display driving chip (30) under test, the control module (10) is used for outputting at least one test control signal to control the test module (20) to test the decoding function of the at least one display driving chip (30) under test, the test module (20) is used for obtaining display data under test, corresponding decompression parameters and preset check code when the test control signal is valid, sending the display data under test and corresponding decompression parameters to the display driving chip (30) under test to obtain a target check code output from the display driving chip (30) under test, and comparing the target check code with the preset check code to obtain a test result of the display driving chip (30) under test. The test device can test the decoding function of the display driving chip (30) to determine whether the decoding function of the display driving chip (30) is normal, and the test cost is low, the test time is short, and the test efficiency is high. [Selected Figure] FIG.

Description

TECHNICAL FIELD The present disclosure relates to the field of display technology, and particularly to test equipment and electronic equipment.

In related technology, when correcting display data, an application processor (AP) needs to simultaneously output a display stream compression (ex: VESA DSC display stream compression) image and its check code. The receiver generates a check code from the received compressed image and compares it with the received check code to determine whether the final image data is correct. However, when it is determined that the image data is incorrect, the related technology cannot identify whether the cause of the error in the image data is in the application processor or in the decoder of the driving chip.

According to one aspect of the present disclosure, a test apparatus includes a control module, a test module, and at least one display driving chip to be tested;
The control module is used to output at least one test control signal to control a test of the decoding function of at least one display driving chip to be tested by the test module,
The display driving chip to be tested is connected to the control module and the test module, expands the received compressed display data and decompression parameters to obtain decompressed display data, and obtains a check code based on the decompressed display data. It is especially used,
the test module is connected to the control module;
If the test control signal is valid, obtaining the display data of the test object, the corresponding decompression parameters and the preset check code;
transmitting the display data and corresponding decompression parameters of the test object to the test object display driving chip to obtain a target check code output from the test object display driving chip;
A test device is provided which is used to compare the target test code with the preset test code to obtain a test result of the display driving chip to be tested.

In one possible embodiment, the test module includes a test unit, a storage unit, a comparison unit,
The test unit is connected to the storage unit and the comparison unit, and obtains the display data of the test object, the corresponding decompression parameters and the preset check code from the storage unit, and the test code obtained from the storage unit. used for transmitting display data to be tested and corresponding decompression parameters to the display driving chip to be tested, and transmitting the preset check code to the comparison unit;
The comparison unit acquires the target test code and the preset test code output from the display driving chip to be tested, obtains a test result based on the target test code and the preset test code, and calculates the test result. is used to transmit the information to the control module and the display driving chip to be tested.

In one possible embodiment, said storage unit comprises a first storage unit for storing display data of said test object, a second storage unit for storing corresponding decompression parameters, and said preset check code. and a third storage unit for storing.

In one possible embodiment, the control module further comprises:
If the target test code is the same as the preset test code, it is determined that the test result indicates that the decoding function of the display driving chip to be tested is normal;
If the target test code is different from the preset test code, the test result is used to determine that the decoding function of the display driving chip to be tested is abnormal.

In one possible embodiment, the display driving chip is connected to a display panel;
The control module further transmits the compressed display data to the display drive chip to be tested when the test result indicates that the decoding function of the display drive chip to be tested is normal. used for
The display drive chip to be tested further expands the compressed display data when the test result indicates that the decoding function of the display drive chip to be tested is normal. The drive signal is used to generate a drive signal based on the displayed display data and control the display of the display panel.

In one possible embodiment, the display driving chip is connected to a display panel;
The control module further transmits uncompressed display data to the display drive chip to be tested if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. It is especially used,
The display drive chip to be tested is further configured to generate a drive signal based on the uncompressed display data if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. It is used to generate and control the display of the display panel.

In one possible embodiment, the control module is further used to stop outputting display data to the display driving chip under test if the test control signal is valid.

In one possible embodiment, the display panel comprises one or more of a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diode display panel, a mini light emitting diode display panel and a micro light emitting diode display panel.

According to one aspect of the present disclosure, an electronic device including the test device is provided.

In one possible embodiment, the electronic device includes a display, a smartphone, or a mobile device.

When the test module according to the embodiment of the present disclosure receives the test control signal transmitted from the control module, the test module obtains the display data of the test object, the corresponding decompression parameters, and the preset check code, and acquires the display data of the test object. and a corresponding decompression parameter to the display driving chip under test, whereby the display driving chip under test decompresses the received display data under test and the corresponding decompression parameter to obtain decompressed display data. A target test code is obtained based on the expanded display data, and the target test code is compared with the preset test code to obtain a test result of the display driving chip to be tested. In this way, the decoding function of the display driving chip can be tested to determine whether the decoding function of the display driving chip is normal or not, and if there is an error in the received display data, the encoder of the control module can It is possible to distinguish whether there is a problem or a problem with the decoder of the display driving chip, and the test cost is low, the test time is short, and the test efficiency is high.

It is to be understood that the foregoing general description and the following detailed description are exemplary and interpretive only and are not intended to limit the present disclosure. Other features and aspects of the present disclosure will become apparent from the following detailed description of exemplary embodiments with reference to the drawings.

Here, the drawings incorporated as part of this specification illustrate embodiments compatible with the present disclosure, and are used together with the specification to explain the technical means of the present disclosure.
1 shows a block diagram of a test device according to an embodiment of the present disclosure. FIG. 1 shows a block diagram of a test device according to an embodiment of the present disclosure. FIG. 1 shows a block diagram of an electronic device according to an embodiment of the present disclosure. FIG.

Various exemplary embodiments, features, and aspects of the present disclosure are described in detail below with reference to the drawings. In the drawings, the same reference numerals indicate elements having the same or similar function. Although the drawings depict various aspects of the embodiments, the drawings are not necessarily to scale unless otherwise noted.

In the description of this disclosure, it should be understood that "length", "width", "top", "bottom", "front", "back", "left", "right", "vertical", " The orientation or positional relationship expressed by terms such as "horizontal", "top", "bottom", "inside", "outside", etc. is based on the orientation or positional relationship shown in the drawings, and is consistent with the description of the present disclosure. are shown only to facilitate explanation and simplify explanation, and do not imply that the devices or elements they represent necessarily have a particular orientation or must be constructed and operated in a particular orientation. or, therefore, should not be construed as limiting the present disclosure.

It should be noted that the terms "first" and "secondary" are used for descriptive purposes only and do not indicate or imply relative importance or the number of technical features represented by them. It should not be understood as implied. Thereby, a feature defined by "first" or "second" may explicitly or implicitly include one or more such features. In the description of this disclosure, "plurality" means two or more unless there is a specific limitation.

In this disclosure, terms such as "attachment," "coupling," "connection," "fixation," etc. should be understood broadly, unless otherwise expressly specified and limited. For example, it may be a fixed connection, a removable connection or an integral part. The connection may be mechanical or electrical. The connection may be made directly or indirectly through an intermediate medium, or may be an internal communication between two elements or an interaction relationship between the two elements. Those skilled in the art can understand the specific meanings of the above terms in this disclosure depending on the specific situation.

The term "exemplary" as used herein means "serving as an example, embodiment, or descriptive." Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or superior to other embodiments.

In this specification, the term "and/or" is used only to describe a related relationship, and indicates that three relationships can exist. For example, A and/or B can indicate three cases: only A exists, A and B exist simultaneously, and only B exists. Moreover, in this specification, the term "at least one" indicates any one of a plurality or any combination of at least two of a plurality. For example, "containing at least one of A, B, and C" can indicate that any one or more elements selected from the set consisting of A, B, and C are included.

In addition, many specific details are set forth in the following specific embodiments to better explain the present disclosure. It should be understood by those skilled in the art that the present disclosure may equally be practiced without some specific details. In some instances, methods, means, elements, and circuits that are well known to those skilled in the art have not been described in detail in order to obscure the subject matter of the present disclosure.

Referring to FIG. 1, FIG. 1 shows a block diagram of a test apparatus according to one embodiment of the present disclosure.

As shown in FIG. 1, the apparatus includes a control module 10, a test module 20, and at least one display driving chip 30 to be tested.

Here, the control module 10 is used to output at least one test control signal to control the test module 20 to test the decoding function of at least one display driving chip 30 to be tested.

The display driving chip 30 to be tested is connected to the control module 10 and the test module 20, expands the received compressed display data and expansion parameters to obtain expanded display data, and performs inspection based on the expanded display data. Used to obtain the code.

The test module 20 is connected to the control module 10,
If the test control signal is valid, obtaining the display data of the test object, the corresponding decompression parameters and the preset check code;
transmitting the display data of the test object and the corresponding decompression parameters to the display driving chip 30 of the test object to obtain a target check code output from the display driving chip 30 of the test object;
The target test code is compared with the preset test code to obtain a test result of the display driving chip 30 to be tested.

When the test module according to the embodiment of the present disclosure receives the test control signal transmitted from the control module, the test module obtains the display data of the test object, the corresponding decompression parameters, and the preset check code, and acquires the display data of the test object. and a corresponding decompression parameter to the display driving chip under test, whereby the display driving chip under test decompresses the received display data under test and the corresponding decompression parameter to obtain decompressed display data. A target test code is obtained based on the expanded display data, and the target test code is compared with the preset test code to obtain a test result of the display driving chip to be tested. In this way, the decoding function of the display driving chip can be tested to determine whether the decoding function of the display driving chip is normal or not, and if there is an error in the received display data, the encoder of the control module can It is possible to distinguish whether there is a problem or a problem with the decoder of the display driving chip, and the test cost is low, the test time is short, and the test efficiency is high.

A test module according to embodiments of the present disclosure may be provided on a display driving chip. Thereby, the display driving chip can perform self-detection and determine by itself whether the decoding function is normal or not, and if it is identified that there is an error in the received display data, the control module (e.g. It is possible to distinguish whether there is a problem with the encoding function of the application processor (AP), or whether there is a problem with its own decoding function.

In the embodiments of the present disclosure, the specific type of display driving chip 30 is not limited, and those skilled in the art can appropriately select it depending on the type of display panel to be driven. In one example, the display panel may include any one or more of a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diode display panel, a mini light emitting diode display panel, a micro light emitting diode display panel, and the like.

In one example, control module 10 may include a processing module, including, but not limited to, a separate processor, or discrete components, or a combination of processors and discrete components. The processor may include a controller capable of executing instructions in an electronic device. The processor may be implemented in any suitable manner, for example, one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices. (PLD), field programmable gate array (FPGA), controller, microcontroller, microprocessor, or other electronic components. Inside the processor, the executable instructions may be executed by hardware circuits such as logic gates, switches, application specific integrated circuits (ASICs), programmable logic controllers, and embedded microcontrollers. .

In one example, the control module 10 may include an application processor AP and a timing controller, and the application processor AP may include an encoder for compression encoding display data, such as compressed display data or uncompressed display data. Send the data to the display driving chip via the timing controller.

Referring to FIG. 2, FIG. 2 shows a block diagram of a test apparatus according to one embodiment of the present disclosure.

In one possible embodiment, as shown in FIG. 2, the test module 20 includes a test unit 210, a storage unit 220 and a comparison unit 230.

The test unit 210 is connected to the storage unit 220 and the comparison unit 230, obtains the display data of the test object, the corresponding decompression parameters and the preset check code from the storage unit 220, and stores the test code in the storage unit 220. It is used to transmit the display data of the test object and the corresponding decompression parameters obtained from the test object to the display driving chip 30 of the test object, and to send the preset check code to the comparison unit 230.

The comparison unit 230 acquires the target test code and the preset test code output from the display driving chip 30 to be tested, obtains a test result based on the target test code and the preset test code, and obtains the test result based on the target test code and the preset test code. It is used to transmit the test results to the control module 10 and the display driving chip 30 to be tested.

In one example, the target check code may be a check code obtained by performing at least one type of operation on image data in which at least one frame has been decompressed.

In one example, the storage unit includes a computer-readable storage medium, which may be a tangible device capable of holding and storing instructions for use in an instruction-execution device. The computer readable storage medium may be, for example, but not limited to, electrical storage, magnetic storage, optical storage, electromagnetic storage, semiconductor storage, or any suitable combination of the above. More specific examples (non-exhaustive list) of computer readable storage media include portable computer disks, hard disks, random access memory (RAM), read only memory (ROM), erasable programmable read only memory (EPROM). or flash memory), static random access memory (SRAM), programmable read-only memory (PROM), portable compact disk read-only memory (CD-ROM), digital versatile disk (DVD), memory stick, floppy disk, e.g. mechanical encoding devices such as punched cards or protruding structures in slots in which are stored, and any suitable combinations of the foregoing. A computer-readable storage medium as used herein refers to the instantaneous signal itself, e.g. radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagated through waveguides or other transmission media (e.g. fiber optic cables). (pulsed light passing through) or electrical signals transmitted over electrical wires.

The display data to be tested according to the embodiment of the present disclosure may be display data of an image in which one frame is compressed, or may be display data of an image in which a plurality of frames are compressed. Accordingly, the decompression parameters may be decompression parameters for one frame corresponding to the display data of the compressed image, or multiple decompression parameters corresponding to the display data of the compressed image for multiple frames. There may be. Here, the plurality of decompression parameters are the picture parameter set settings of VESA (Video Electronics Standards Association) and DSC (Display Stream Compression) standards. :PPS) may be used. .

The check code according to the embodiment of the present disclosure is a check code for parity check, a check code for BCC exclusive OR check method (block check character, block check code), and a check code for LRC longitudinal redundancy check. ), a check code of a cyclic redundancy check (CRC), a check code of a digest algorithm such as MD5, SHA, or MAC, or a check code of other types of check methods, and the present disclosure The embodiments are not limited to this.

In the embodiments of the present disclosure, the specific implementation form of obtaining a check code using decompressed display data is not limited, and a person skilled in the art can realize it with reference to related technologies. .

In one example, the preset test code stored in the storage unit may be an ideal test code for the display data under test, or referred to as a standard test code.

In one possible embodiment, as shown in FIG. 2, the storage unit 220 includes a first storage unit 2210 for storing the display data of the test object and a second storage unit 2210 for storing the corresponding decompression parameters. a storage unit 2220 and a third storage unit 2230 for storing the preset check code, and the display data to be tested stored in the first storage unit 2210 is such that at least one frame is compressed. Contains display data for the image.

In one possible embodiment, the control module 10 further comprises:
If the target test code is the same as the preset test code, it is determined that the test result indicates that the decoding function of the display driving chip 30 to be tested is normal;
If the target test code is different from the preset test code, the test result may be used to determine that the decoding function of the display driving chip 30 to be tested is abnormal.

In one possible embodiment, the display driving chip is connected to a display panel 40;
If the test result indicates that the decoding function of the display drive chip 30 to be tested is normal, the control module 10 further transmits the compressed display data to the display drive chip 30 to be tested. used for sending,
The display drive chip 30 to be tested further expands the compressed display data when the test result indicates that the decoding function of the display drive chip 30 to be tested is normal; A drive signal is generated based on the expanded display data and used to control the display of the display panel.

In one example, if the decoding function of the display drive chip 30 to be tested is normal, the control module 10 may transmit the compression-encoded display data to the display drive chip 30 to be tested. In such a case, the decoder of the display drive chip 30 under test decodes and expands the received compressed display data, obtains the expanded display data, and adjusts the drive voltage based on the expanded display data. It is possible to generate and control the display panel.

In one possible embodiment, as shown in FIG. 2, the display driving chip is connected to a display panel 40;
Further, if the test result indicates that the decoding function of the display drive chip 30 to be tested is abnormal, the control module 10 transmits the uncompressed display data to the display drive chip 30 to be tested. It is used to send to
The display drive chip 30 to be tested is further configured to drive based on the uncompressed display data if the test result indicates that the decoding function of the display drive chip 30 to be tested is abnormal. It is used to generate signals and control the display panel.

In one example, if the decoding function of the display drive chip 30 to be tested is abnormal, the control module 10 transfers compressed encoded display data to the display drive chip 30 to be tested, in order to realize accurate driving of the display panel. At this time, the control module 10 transmits display data that has not been compressed and encoded to the display driving chip 30 to be tested. In such a case, the display drive chip 30 to be tested directly generates a drive voltage based on the received display data to control the display panel.

In one possible embodiment, the control module 10 is further used to stop the output of display data to the display drive chip 30 under test if the test control signal is valid.

According to one aspect of the present disclosure, an electronic device including the test device is provided.

In one possible embodiment, the electronic device includes a display, a smartphone, or a mobile device.

In one possible embodiment, the display panel comprises one or more of a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diode display panel, a mini light emitting diode display panel and a micro light emitting diode display panel.

Note that the test module according to the embodiment of the present disclosure may be provided in a display driving chip, and can perform a test operation when driving the display panel to determine whether the decoder is operating normally. .

Based on the self-verification function of the display driving chip according to the embodiments of the present disclosure, those skilled in the art can improve the yield rate of the decoding function (decompression function) of the display driving chip without combining the application processor and redundant test patterns. can be easily tested, significantly reducing test time and costs.

A test device according to an embodiment of the present disclosure can be applied to an electronic device, and the electronic device may be provided as a terminal, a server, or another type of device.

Referring to FIG. 3, FIG. 3 shows a block diagram of an electronic device according to one embodiment of the present disclosure.

For example, electronic device 800 may be a mobile phone, computer, digital broadcast terminal, message sending and receiving device, game console, tablet device, medical device, fitness device, personal digital assistant, or other terminal.

Referring to FIG. 3, electronic device 800 includes processing module 802, memory 804, power supply module 806, multimedia module 808, audio module 810, input/output (I/O) interface 812, sensor module 814, and communication module 816. may include one or more of the modules.

Processing module 802 generally controls the overall operation of electronic device 800, such as operations related to display, telephone calls, data communications, camera operations, and recording operations. Processing module 802 may include one or more processors 820 for executing instructions to complete all or some steps of the method. Note that processing module 802 may include one or more modules for interaction between processing module 802 and other modules. For example, processing module 802 may include a multimedia module for interaction between multimedia module 808 and processing module 802.

Memory 804 is configured to store various types of data to support operation on electronic device 800. Examples of these data include instructions for any application programs or methods running on electronic device 800, contact data, phone book data, messages, pictures, videos, etc. Memory 804 can be static random access memory (SRAM), electrically erasable programmable read only memory (EEPROM), erasable programmable read only memory (EPROM), programmable read only memory (PROM), read only memory (ROM), magnetic It can be implemented by any type of volatile or non-volatile storage, such as memory, flash memory, magnetic disks, or optical disks, or combinations thereof.

Power module 806 provides power to various modules of electronic device 800. Power supply module 806 may include a power management system, one or more power supplies, and other modules associated with generating, managing, and distributing power for electronic device 800.

Multimedia module 808 includes a screen that provides an output interface between the electronic device 800 and a user. In some examples, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from a user. A touch panel includes one or more touch sensors to detect touches, slides, and gestures on the touch panel. The touch sensor may detect not only the boundaries of a touch or slide motion, but also the duration and pressure associated with the touch or slide motion. In some examples, multimedia module 808 includes one front camera and/or a back camera. When the electronic device 800 is in an operating mode, such as a photo mode or a video mode, the front camera and/or the back camera can receive external multimedia data. Each front and back camera may have a fixed optical lens system or a focal length and optical zoom capability.

Audio module 810 is configured to output and/or input audio signals. For example, audio module 810 includes a microphone (MIC) configured to receive external audio signals when electronic device 800 enters an operating mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals may be further stored in memory 804 or transmitted via communication module 816. In some embodiments, audio module 810 further includes a speaker for outputting audio signals.

I/O interface 812 provides an interface between processing module 802 and peripheral interface modules such as keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to, a home button, a volume button, a start button, and a lock button.

Sensor module 814 includes one or more sensors to provide state assessment in various aspects of electronic device 800 . For example, the sensor module 814 can detect the on/off state of the electronic device 800, the relative positioning of modules, such as a display and a keypad, of the electronic device 800. The sensor module 814 further detects a change in the position of the electronic device 800 or a module of the electronic device 800, the presence or absence of contact between the user and the electronic device 800, the orientation or acceleration/deceleration of the electronic device 800, and a change in the temperature of the electronic device 800. It is possible. Sensor module 814 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. Sensor module 814 may further include an optical sensor for use in imaging applications, such as a complementary metal oxide semiconductor (CMOS) or charge coupled device (CCD) image sensor. In some examples, the sensor module 814 may further include an acceleration sensor, a gyro sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

Communication module 816 is configured to provide wired or wireless communication between electronic device 800 and other devices. The electronic device 800 is capable of accessing a wireless network based on a communication standard, such as a wireless network (WIFI), a second generation mobile communication technology (2G) or a third generation mobile communication technology (3G), or a combination thereof. be. In one exemplary embodiment, communication module 816 receives broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication module 816 further includes a near field communication (NFC) module to facilitate near field communication. For example, the NFC module can be implemented by Radio Frequency Identification (RFID) technology, Infrared Data Association (IrDA) technology, Ultra Wide Band (UWB) technology, Bluetooth® (BT) technology, and other technologies.

In an exemplary embodiment, electronic device 800 includes one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable It can be implemented by a logic device (PLD), field programmable gate array (FPGA), controller, microcontroller, microprocessor, or other electronic device.

The exemplary embodiment further provides a non-volatile computer readable storage medium, such as memory 804, containing computer program instructions executable by processor 820 of electronic device 800 to perform the methods described above.

Although embodiments of the present disclosure have been described, the above description is illustrative only and is not exhaustive or limited to the disclosed embodiments. Various modifications and changes will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology chosen in this specification may be used to better interpret the principles, practical applications, or improvements to the art of each embodiment, or to enable others skilled in the art to understand each embodiment presented herein. It is for the purpose of

Although embodiments of the present disclosure have been described, the above description is illustrative only and is not exhaustive or limited to the disclosed embodiments. Various modifications and changes will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology chosen in this specification may be used to better interpret the principles, practical applications, or improvements to the art of each embodiment, or to enable others skilled in the art to understand each embodiment presented herein. It is for the purpose of Some aspects of the invention are described below.
[Aspect 1]
A test device,
including a control module, a test module, and at least one display driving chip to be tested;
The control module is used to output at least one test control signal to control a test of the decoding function of at least one display driving chip to be tested by the test module,
The display driving chip to be tested is connected to the control module and the test module, expands the received compressed display data and decompression parameters to obtain decompressed display data, and obtains a check code based on the decompressed display data. It is especially used,
the test module is connected to the control module;
If the test control signal is valid, obtaining the display data of the test object, the corresponding decompression parameters and the preset check code;
transmitting the display data and corresponding decompression parameters of the test object to the test object display driving chip to obtain a target check code output from the test object display driving chip;
A test device characterized in that it is used to compare the target test code with the preset test code to obtain a test result of the display drive chip to be tested.
[Aspect 2]
The test module includes a test unit, a storage unit, and a comparison unit,
The test unit is connected to the storage unit and the comparison unit, and obtains the display data of the test object, the corresponding decompression parameters and the preset check code from the storage unit, and the test code obtained from the storage unit. used for transmitting display data to be tested and corresponding decompression parameters to the display driving chip to be tested, and transmitting the preset check code to the comparison unit;
The comparison unit acquires the target test code and the preset test code output from the display driving chip to be tested, obtains a test result based on the target test code and the preset test code, and calculates the test result. The test device according to aspect 1, wherein the test device is used to transmit the information to the control module and the display drive chip to be tested.
[Aspect 3]
The storage unit includes a first storage unit for storing display data of the test object, a second storage unit for storing corresponding decompression parameters, and a third storage unit for storing the preset check code. The test device according to aspect 2, further comprising a storage unit.
[Aspect 4]
The control module further includes:
If the target test code is the same as the preset test code, it is determined that the test result indicates that the decoding function of the display driving chip to be tested is normal;
Aspect 1, wherein when the target test code is different from the preset test code, the test result is used to determine that the decoding function of the display drive chip to be tested is abnormal. or the test device described in 2.
[Aspect 5]
The display driving chip is connected to a display panel,
The control module further transmits the compressed display data to the display drive chip to be tested when the test result indicates that the decoding function of the display drive chip to be tested is normal. used for
The display drive chip to be tested further expands the compressed display data when the test result indicates that the decoding function of the display drive chip to be tested is normal. The test device according to aspect 4, wherein the test device is used to control the display of a display panel by generating a drive signal based on the display data obtained.
[Aspect 6]
The display driving chip is connected to a display panel,
The control module further transmits uncompressed display data to the display drive chip to be tested if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. It is especially used,
The display drive chip to be tested is further configured to generate a drive signal based on the uncompressed display data if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. The test device according to aspect 4, wherein the test device is used to generate data and control the display of a display panel.
[Aspect 7]
The test apparatus according to aspect 1, wherein the control module is further used to stop outputting display data to the display drive chip to be tested when the test control signal is valid.
[Aspect 8]
Aspect 5, wherein the display panel includes one or more of a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diode display panel, a mini light emitting diode display panel, and a micro light emitting diode display panel. Test equipment as described.
[Aspect 9]
An electronic device comprising the test device according to any one of aspects 1 to 8.
[Aspect 10]
The electronic device according to aspect 9, wherein the electronic device includes a display, a smartphone, or a mobile device.

Claims (10)

A test device,
including a control module, a test module, and at least one display driving chip to be tested;
The control module is used to output at least one test control signal to control a test of the decoding function of at least one display driving chip to be tested by the test module,
The display driving chip to be tested is connected to the control module and the test module, expands the received compressed display data and decompression parameters to obtain decompressed display data, and obtains a check code based on the decompressed display data. It is especially used,
the test module is connected to the control module;
If the test control signal is valid, obtaining the display data of the test object, the corresponding decompression parameters and the preset check code;
transmitting the display data and corresponding decompression parameters of the test object to the test object display driving chip to obtain a target check code output from the test object display driving chip;
A test device characterized in that it is used to compare the target test code with the preset test code to obtain a test result of the display drive chip to be tested. The test module includes a test unit, a storage unit, and a comparison unit,
The test unit is connected to the storage unit and the comparison unit, and obtains the display data of the test object, the corresponding decompression parameters and the preset check code from the storage unit, and the test code obtained from the storage unit. used for transmitting display data to be tested and corresponding decompression parameters to the display driving chip to be tested, and transmitting the preset check code to the comparison unit;
The comparison unit acquires the target test code and the preset test code output from the display driving chip to be tested, obtains a test result based on the target test code and the preset test code, and calculates the test result. 2. The test device according to claim 1, wherein the test device is used for transmitting the information to the control module and the display drive chip to be tested. The storage unit includes a first storage unit for storing display data of the test object, a second storage unit for storing corresponding decompression parameters, and a third storage unit for storing the preset check code. 3. The test device according to claim 2, further comprising a storage unit. The control module further includes:
If the target test code is the same as the preset test code, it is determined that the test result indicates that the decoding function of the display driving chip to be tested is normal;
If the target test code is different from the preset test code, the test result is used to determine that the decoding function of the display drive chip to be tested is abnormal. 2. The test device according to 1 or 2. The display driving chip is connected to a display panel,
The control module further transmits the compressed display data to the display drive chip to be tested when the test result indicates that the decoding function of the display drive chip to be tested is normal. used for
The display drive chip to be tested further expands the compressed display data when the test result indicates that the decoding function of the display drive chip to be tested is normal. 5. The test device according to claim 4, wherein the test device is used to control the display of a display panel by generating a drive signal based on the display data obtained. The display driving chip is connected to a display panel,
The control module further transmits uncompressed display data to the display drive chip to be tested if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. It is especially used,
The display drive chip to be tested is further configured to generate a drive signal based on the uncompressed display data if the test result indicates that the decoding function of the display drive chip to be tested is abnormal. 5. The test device according to claim 4, wherein the test device is used to generate data and control display on a display panel. The test apparatus according to claim 1, wherein the control module is further used to stop outputting display data to the display drive chip to be tested when the test control signal is valid. . 5. The display panel includes one or more of a liquid crystal display panel, an organic light emitting diode display panel, a quantum dot light emitting diode display panel, a mini light emitting diode display panel, and a micro light emitting diode display panel. Test equipment as described in . An electronic device comprising the test device according to claim 1. The electronic device according to claim 9, wherein the electronic device includes a display, a smartphone, or a mobile device.