JP2024097546A - System and operation history management method - Google Patents

Abstract

To allow for managing an operation history of an electronic device or the like by using state data with less communication volume.SOLUTION: A memory resource of an edge-side processor system stores therein threshold value information and an operation history generation program. When an operation environment of an electronic device exceeds a threshold value, a processor of the edge-side processor system transmits operation history information including a threshold value ID to a server-side processor system. A memory resource of the server-side processor system stores therein a cumulative failure rate calculation program and an operation history management program. A processor of the server-side processor system calculates a cumulative failure rate based on a cumulative operation time under respective operation environments relative to a total operation time of the electronic device with respect to each threshold value section corresponding to the threshold value ID, estimates a remaining life on the basis of the cumulative failure rate, and generates operation history management information including the remaining life and a cumulative operation time under a stress environment.SELECTED DRAWING: Figure 4

Description

The present invention relates to a system and an operation history management method.

In the field of technology that handles electronic devices, the expansion of secondary use and reuse of electronic devices (components) is expected to lead to resource optimization in order to realize a circular economy. In recent years, electronic devices and the electronic components installed in electronic devices have been modularized to improve maintainability and support during performance lifespans (performance deficiencies, low power consumption), and replacement services on a module basis are being developed.

For these reasons, it is expected that electronic devices and electronic components will increasingly be reused as maintenance parts or used secondary in other devices in the future. For this reason, it is considered important to understand and manage the operating history of electronic devices, etc., including the environmental impact (stress impact) they have had throughout their life cycle, from the perspective of product performance and lifespan, and to share this information between businesses.

On the other hand, in open industrial systems where new value is created by connecting a huge number of edge devices owned by multiple businesses and the data from each device, there is an issue that if you try to constantly collect device status data and sensor data in real time to understand and manage the operating history of the electronic devices being managed, the amount of data and communication costs will be enormous.

Patent Document 1 discloses a technology for obtaining status data output from a device and calculating the cumulative failure rate of a specified part. Specifically, Patent Document 1 states that "the inventory management system includes a plurality of devices, an information management device to which the plurality of devices are connected, and an information processing device. The information processing device calculates the sum of cumulative failure rates, which is a value obtained by adding up the cumulative failure rate at a certain point in time, taking into account acceleration due to driving conditions, for all specified parts of the same specifications used in the plurality of devices, to the standard cumulative failure rate under standard driving conditions for each specified part of the same specifications used in the plurality of devices, and derives the appropriate inventory number of the specified parts based on the calculated sum of cumulative failure rates."

JP 2018-142256 A

In the system described in Patent Document 1, data indicating the operating status is acquired from the device, and the number of parts to be stocked is determined based on the cumulative failure rate calculated using the acquired data. However, the system in this document is designed to acquire status data from devices inside a factory, which is a closed environment. As a result, the system in Patent Document 1 does not take into consideration the issue of huge data volumes and communication costs when collecting device status data.

The present invention was made in consideration of the above problems, and aims to manage the operation history of electronic devices and the like using status data with reduced communication traffic.

The present application includes multiple means for solving at least a part of the above-mentioned problems, examples of which are as follows: A system according to one aspect of the present invention for solving the above-mentioned problems comprises an edge-side processor system including a processor and memory resources mounted on an edge device, and a server-side processor system including a processor and memory resources mounted on a server computer and capable of communicating with the edge-side processor system, wherein the memory resource of the edge-side processor system stores at least threshold value information in which threshold values corresponding to predetermined degradation factors that shorten the time until failure of an electronic device or electronic component are registered, and an operation history generation program, and by executing the operation history generation program, the processor of the edge-side processor system: when the operating environment of the electronic device or electronic component exceeds the threshold value, generates operation history information including a threshold value ID that identifies the threshold value, and stores the generated operation history information to the server-side processor system, the memory resource of the server-side processor system stores at least a cumulative failure rate calculation program and an operation history management program, and by executing the cumulative failure rate calculation program, the processor of the server-side processor system: calculates the cumulative operation time under each operation environment relative to the total operation time of the electronic device or electronic component for each threshold category corresponding to the threshold ID, calculates the cumulative failure rate of the electronic device or electronic component based on the cumulative operation time, estimates the remaining life of the electronic device or electronic component based on the cumulative failure rate and product life, and by executing the operation history management program, the processor of the server-side processor system: generates operation history management information including the remaining life and the cumulative operation time under at least a stress environment of the operation environment.

According to the present invention, it is possible to manage the operation history of electronic devices and the like using status data with reduced communication traffic.

FIG. 1 is a diagram illustrating an example of a schematic configuration of an edge-side processor system. FIG. 11 is a diagram illustrating an example of threshold information. FIG. 1 is a diagram illustrating an example of a schematic configuration of a server-side processor system. FIG. 2 is a diagram showing an example of an outline of the processing of the system. FIG. 11 is a flow diagram illustrating an example of a process for generating operation history information. Fig. 6(a) is a diagram showing an example of operation history information, and Fig. 6(b) is a diagram showing an example of a transmission history of operation history information. 1 is a diagram illustrating an example of a relationship between an event occurrence timing and a change in an operating environment. FIG. 11 is a flow diagram illustrating an example of a process for generating operation history management information. 11 is a diagram showing an example of specific calculation contents in a generation process of operation history management information. FIG. Fig. 10(a) is a graph showing an estimation of remaining life within the product life, and Fig. 10(b) is a graph showing an estimation of remaining life after the product life. FIG. 2 is a diagram showing an example of operation history management information. FIG. 11 is a diagram showing an example of a transmission history of operation history information according to the second embodiment. 13A and 13B are diagrams showing an example of the relationship between the event occurrence timing and the change in the operating environment when the deterioration factor is temperature and vibration, respectively. 13 is a diagram showing an example of specific calculation contents of a cumulative failure rate in the generation process of operation history management information according to the second embodiment. FIG. FIG. 13 is a diagram showing an example of an outline of a feature value calculation process. FIG. 1 is a diagram showing an example of a service form for fleet operators and used car dealers. FIG. 13 is a diagram showing an example of a service form for reuse/secondary use vendors. FIG. 13 is a diagram showing an example of a service format for manufacturing companies (OEMs) and reuse/secondary use vendors.

Each embodiment of the present invention will be described below with reference to the drawings.

<System Overview>
This system is composed of a processor system of a server computer (hereinafter sometimes referred to as a "server-side processor system") and a processor system (hereinafter sometimes referred to as an "edge-side processor system") of an edge device (e.g., a mobile object such as an automobile or train, a home appliance, or a medical device) equipped with electronic devices and electronic components. The server-side processor system and the edge-side processor system are connected to each other so as to be able to communicate with each other via a predetermined communication network (e.g., the Internet, a LAN (Local Area Network), or a WAN (Wide Area Network)).

This system will be used to understand and manage the operating history of electronic devices and electronic components installed in edge devices, including the environmental impacts, such as how long these devices have been operating in standard and stressed environments.

Specifically, the system calculates the cumulative failure rate of electronic devices, etc., based on the cumulative operating time in each environment, such as a normal environment or a stress environment. The system also calculates the remaining life of electronic devices, etc., based on the calculated cumulative failure rate and product life, and generates operation history management information that registers the operating time and remaining life in each environment.

More specifically, the edge-side processor system detects the operating environment of the electronic device, etc. (e.g., the temperature of the electronic device or the surrounding area of the electronic device, etc.) based on sensor information (sensor value indicating temperature) acquired from a sensor (e.g., a temperature sensor) connected to the electronic device, etc. Furthermore, when the operating environment of the electronic device crosses (exceeds) a predetermined threshold, i.e., when the threshold classification corresponding to the operating environment changes, the edge-side processor system generates operation history information including information on the threshold classification after the change and transmits it to the server-side processor system.

The server-side processor system also calculates the ratio of cumulative operating time for each operating environment (for each threshold classification) to the total operating time of the electronic devices, etc. based on the acquired operating history information, and uses this to calculate the cumulative failure rate of the electronic devices, etc.

The server-side processor system also calculates the remaining lifespan of electronic devices, etc. based on a comparison between the product lifespan and the cumulative failure rate. The server-side processor system also generates operation history management information that associates and registers the cumulative operation time in the standard environment and the stress environment with the remaining lifespan.

The system also generates feature values using the operation history management information fed back to the edge-side processor system and the latest operation history information, and detects tampering with the operation history management information in the edge-side processor system based on a comparison between the feature values calculated in the edge-side processor system and the feature values calculated in the server-side processor system.

This system makes it possible to manage the operation history of electronic devices and the like using status data with reduced communication traffic. In particular, the operation history information sent from the edge-side processor system to the server-side processor system is simplified by using threshold classifications to represent the operating environment of the electronic devices and the like, reducing the amount of data. In addition, the operation history information is sent to the server-side processor system only when it is generated, reducing the number of communications. Therefore, this system can contribute to reducing the amount of communication traffic between edge devices and server computers and the associated communication costs.

In addition, because this system can detect tampering with operation history, it can help prevent tampering with operation history that can occur when the owner of an edge device equipped with electronic equipment changes, for example, during secondary use or reuse.

The following describes in detail the configurations and processes of the edge-side processor system and the server-side processor system. Note that the edge device on which the edge-side processor system is mounted is not particularly limited, but the following description will be given using an automobile as an example.

<Configuration of edge-side processor system 100>
1 is a diagram showing an example of a schematic configuration of an edge-side processor system 100. The edge-side processor system 100 is a processor system that transmits various information (including operation history information) to an external device 10 (including a server-side processor system) based on information communication with the external device 10.

<<External Device 10 (including Server Side Processor System)>>
The external device 10 when viewed from the edge-side processor system 100 includes a server-side processor system. The external device 10 collects information used in processing executed in the edge-side processor system 100 and transmits the information to the processor system 100. The external device 10 also acquires information transmitted from the edge-side processor system 100 and executes various processes using the information.

<<Details of the Edge Side Processor System 100>>
The edge-side processor system 100 executes various processes, such as generating operation history information, by the processor 20 reading various programs and information stored in the memory resource 30.

The edge-side processor system 100 is implemented, for example, in an electronic device such as an ECU (Electronic Control Unit) or a chip (electronic component) built into the ECU. In other words, the edge-side processor system 100 is incorporated into an electronic device or electronic component, and uses resources such as the processor and memory of these electronic devices as its own processor 20 and memory resource 30.

The location where the edge-side processor system 100 is implemented is not particularly limited. For example, the edge-side processor system 100 may be implemented in another ECU, an internal chip of the other ECU, a unit (including, for example, a communication unit), or a device that can acquire information output from various electronic devices, electronic components, and sensors (e.g., a temperature sensor) mounted on the edge device and transmit operation history information generated by itself to the server-side processor system.

Alternatively, the edge-side processor system 100 may be realized as a processor system having independent processors and memory resources within an edge device, rather than being implemented in an electronic device, etc. The following describes an example in which the edge-side processor system 100 is implemented in an ECU (electronic device).

As shown in the figure, the edge-side processor system 100 has a processor 20, a memory resource 30, and an NI (Network Interface Device) 40. Note that the edge-side processor system 100 may also have a UI (User Interface Device) like the server-side processor system.

The processor 20 is an arithmetic device that reads various programs stored in the memory resource 30 and executes the processing corresponding to each program. Examples of the processor 20 include a microprocessor, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), an FPGA (Field Programmable Gate Array), or other semiconductor devices capable of performing calculations.

The memory resource 30 is a storage device that stores various information. Specifically, the memory resource 30 is a non-volatile or volatile storage medium such as a RAM (Random Access Memory) or a ROM (Read Only Memory). Note that the memory resource 30 may be a rewritable storage medium such as a flash memory, a hard disk, or an SSD (Solid State Drive), or a USB (Universal Serial Bus) memory, a memory card, or a hard disk.

The NI 40 is a communication device that communicates information with the external device 10. The NI 40 communicates information with the external device 10 via a specific communication network N. The NI 40 also communicates information with various sensors 60. The NI 40 also communicates information with a GPS (Global Positioning System) receiving device 80, for example, via a CAN (Controller Area Network) 70.

In addition, if the edge device has a communication unit, the NI 40 communicates information with the external device 10 via the communication unit. Unless otherwise specified below, it is assumed that information communication between the edge-side processor system 100 and the external device 10 is performed via the NI 40.

Furthermore, each configuration, function, processing means, etc. of the edge-side processor system 100 may be realized in part or in whole by hardware, for example by designing it as an integrated circuit. Furthermore, the edge-side processor system 100 may realize each function in part or in whole by software, or by a combination of software and hardware. Furthermore, the edge-side processor system 100 may use hardware having fixed circuits, or may use hardware having at least some of the circuits that are changeable.

In addition, when the edge-side processor system 100 has a UI 51, the system can be realized by having a user (operator) execute some or all of the functions and processes realized by each program. Note that the edge-side processor system 100 may entrust output processing to the user and some of the input processing from the user to a processor system outside the system (called an external processor system) such as a smartphone or tablet instead of the processor system itself. In such a case, the edge-side processor system 100 (or its processor 20, program) may do the following to execute each process or other parts of the program.

Instead of outputting to the user using UI 51, data required for outputting to the user is sent to the external processor system via NI 40. Examples of such data include the data to be output itself, and data for generating output data in another processor system, but it may also be a program or web data that describes the process of performing user output in the external processor system.

In addition, the edge-side processor system 100 receives data indicating a user input or operation from an external processor system via the NI 40, instead of receiving an input or operation from the user using the UI 51. From another perspective, the meaning of outputting data to a user may include the edge-side processor system 100 itself outputting the data, as well as having another entity other than the processor system 100 output the data (assisting the data). In addition, the meaning of receiving an input or operation from a user may include the edge-side processor system 100 indirectly receiving the data, as well as directly outputting or receiving the data from the edge-side processor system 100 to the user.

The database and various information within the memory resource 30 described below may be a data structure other than a database or a file, etc., as long as it is an area capable of storing data. One program may also perform the functions of multiple programs, or vice versa. In other words, one or more programs may perform the processing of each program shown in the figure.

The program executed by the edge-side processor system 100 may be stored in a non-volatile storage medium that can be read by the processor system 100. The program stored in the non-volatile storage medium may be read directly by the edge-side processor system 100, or a processor system for program distribution may read the program from the medium and then transmit (distribute) the program from the processor system for program distribution to the edge-side processor system 100. An example of the non-volatile storage medium is the non-volatile memory described as the memory resource 30, but other optical disk media may also be used.

<<Threshold Information 110>>
The threshold information 110 is information in which thresholds for classifying the operating environment of an electronic device are registered. Specifically, the threshold information 110 includes information such as a threshold and a polarity indicating a direction of change in the operating environment relative to the threshold. More specifically, the threshold information 110 has a plurality of records in which a threshold ID, a parameter, a threshold, and a polarity are associated with each other.

The threshold information 110 includes types corresponding to each of the predetermined degradation factors (e.g., temperature, vibration, etc.) that shorten the time until an electronic device breaks down. In the following, an example will be described in which the degradation factor is temperature.

Figure 2 shows an example of threshold information 110. The threshold ID is identification information indicating a threshold division specified by a threshold and a polarity, and is also information specifying the operating environment of the electronic device. In other words, the operating environment of the electronic device is specified by the threshold ID. The parameter is information indicating the deterioration factor, and in this example, "Tmp" indicating temperature is registered.

The thresholds indicate boundary values that distinguish each operating environment. In this example, the temperature inside the ECU corresponds to each threshold. The polarity is information that indicates the direction of change in the operating environment relative to the threshold. For example, "L→H" indicates that the operating environment has changed from Low (below the threshold) to High (above the threshold) relative to a certain threshold, and "H→L" indicates the opposite.

Here, taking as an example a record associated with threshold ID "000", this record indicates that the operating environment of the electronic device has changed from less than 150°C to 150°C or higher.

The threshold information 110 also registers a threshold ID (threshold ID "200" or "201") indicating that the power supply of the edge device (automobile) on which the electronic device is mounted has changed from OFF to ON or from ON to OFF. The parameter "IGN" (Ignition) indicates the power supply of the edge device.

In addition, in the electronic device (ECU) of this example, the operating environment corresponding to threshold IDs "006" to "009" corresponds to a standard environment, while the operating environments corresponding to threshold IDs "005" to "000" indicating a higher temperature range and threshold IDs "010" to "011" indicating a lower temperature range correspond to a stress environment.

Note that the threshold information 110 is not limited to such a data structure, but may include at least information regarding the threshold category, threshold, and polarity.

<<Device configuration information 120>>
The device configuration information 120 is information about the configuration of electronic devices and the like mounted on the edge device. Specifically, the device configuration information 120 includes information for identifying the electronic devices mounted on the edge device (e.g. Various information related to electronic devices, such as the vehicle ID and vehicle identification number ( VIN (Vehicle Identification Number) may also be included.

<<Characteristic Value Information 130>>
The characteristic value information 130 is, for example, a characteristic value generated by using the operation history management information and the operation history information by a stream cipher or a one-way hash function. Details of the process related to the characteristic value will be described later in the third embodiment.

<<Operation History Generation Program 210>>
The operation history generation program 210 performs a process of generating operation history information. Specifically, the operation history generation program 210 acquires sensor information (sensor value indicating temperature) from a temperature sensor, and uses the threshold information 110 to compare the latest sensor value with the previous sensor value to determine whether the operation environment of the electronic device has exceeded the threshold. Furthermore, when the operation history generation program 210 determines that the operation environment has exceeded the threshold, it generates operation history information including a threshold ID corresponding to the changed operation environment, and transmits the information to the server-side processor system.

In addition, when the operation history generation program 210 acquires sensor information (sensor value indicating that the ignition has changed from OFF to ON or from ON to OFF) from a sensor that detects the ON/OFF state of the automobile ignition, it also generates operation history information including the corresponding threshold ID and transmits it to the server-side processor system. Details of the operation history information generation process will be described later.

<<Feature Value Calculation Program 220>>
The characteristic value calculation program 220 calculates the characteristic value using the operation history information. Specifically, the characteristic value calculation program 220 calculates the characteristic value using the operation history management information and the operation history information by a stream cipher or a one-way hash function. Furthermore, the characteristic value calculation program 220 stores the calculated characteristic value in the memory resource 30 and transmits the calculated characteristic value to the server-side processor system. Details of the characteristic value calculation process will be described later in the third embodiment.

<<Position information output program 230>>
The position information output program 230 outputs the position information of the edge device. Specifically, the position information output program 230 identifies the current position of the vehicle using information output from the GPS receiver 80, for example, and transmits the current position to the server-side processor system. Details of this process will be described later in the fourth embodiment.

The above describes an example of the configuration of the edge-side processor system 100.

<Configuration of Server Side Processor System 300>
3 is a diagram showing an example of a schematic configuration of a server-side processor system 300. The server-side processor system 300 is a server device that provides various services (including cloud services) to an external device 11 (including the edge-side processor system 100 in this embodiment) based on information communication with the external device 11.

<<External Device 11 (including Edge Side Processor System 100)>>
The external device 11 when viewed from the server-side processor system 300 includes the edge-side processor system 100. The external device 11 transmits information used in processing executed in the server-side processor system 300 to the server-side processor system 300. The external device 11 also acquires information output from the server-side processor system 300 and executes various processes using the information.

<<Details of the Server Side Processor System 300>>
The server-side processor system 300 executes processes such as generating operation history management information by the processor 21 reading various programs and information stored in the memory resource 301 .

The server-side processor system 300 is, for example, a server computer, a cloud server, or a computer such as a personal computer, a tablet terminal, or a smartphone, and is a system that includes at least one of these computers.

As shown in the figure, the server-side processor system 300 has a processor 21, a memory resource 31, an NI 41, and a UI 51.

The processor 21, memory resource 31, and NI 41 are the same as those in the edge-side processor system 100, and therefore detailed description will be omitted. The UI 51 is an input device that inputs user (operator) instructions to the server-side processor system 300, and an output device that outputs information generated by the server-side processor system 300. Examples of input devices include pointing devices such as a keyboard, a touch panel, and a mouse, and a voice input device such as a microphone.

In addition, output devices include, for example, displays, printers, and voice synthesizers. Unless otherwise specified below, user operations on the server-side processor system 300 (for example, inputting and outputting information, and issuing instructions to execute processing, etc.) are assumed to be performed via the UI 51.

Furthermore, each configuration, function, processing means, etc. of the server-side processor system 300 may be realized in part or in whole by hardware, for example by designing it as an integrated circuit. Furthermore, the server-side processor system 300 may realize each function in part or in whole by software, or by a combination of software and hardware. Furthermore, the server-side processor system 300 may use hardware having fixed circuits, or may use hardware having at least some of the circuits that are changeable.

The server-side processor system 300 can also be realized by a user (operator) implementing some or all of the functions and processes realized by each program.

The database and various information in the memory resource 31 described below may be a data structure other than a database or a file, etc., as long as it is an area capable of storing data. Also, one program may perform the functions of multiple programs, or vice versa. In other words, one or more programs may perform the processing of each program shown in the figure.

The program executed by the server-side processor system 300 may be stored in a non-volatile storage medium that can be read by the processor system 300. The program stored in the non-volatile storage medium may be read directly by the server-side processor system 300, or the program distribution processor system may read the program from the medium and then transmit (distribute) the program to the server-side processor system 300. An example of the non-volatile storage medium is the non-volatile memory described as the memory resource 30, but other optical disk media may also be used.

<<Threshold DB 310>>
The threshold DB (database) 310 is a database that stores threshold information (threshold information 110) corresponding to various degradation factors that shorten the time until an electronic device breaks down. Note that the data structure of the threshold information 110 stored in the database 310 is the same as that of the threshold information 110 shown in FIG. 2, so a detailed description thereof will be omitted.

Note that there are various types of degradation factors other than temperature, such as vibration and current. For example, when the degradation factor is vibration, the threshold information 110 is information in which the threshold values are vibration frequencies, and the aforementioned parameters have registered information indicating vibration (for example, "Acc"). When the degradation factor is current, the threshold information 110 is information in which the threshold values are current values, and the aforementioned parameters have registered information indicating current (for example, "I").

<<Acceleration factor DB320>>
The acceleration coefficient DB (database) 320 is a database that stores acceleration coefficients that affect the deterioration speed of electronic devices depending on their operating conditions. The acceleration coefficients take different values depending on the operating environments (temperature conditions and vibration conditions) of the electronic devices. Therefore, the acceleration coefficient DB 320 stores each threshold category of the electronic device in association with the corresponding acceleration coefficient.

<<Failure rate DB330>>
The failure rate DB (database) 330 is a database that stores the failure rate (reference failure rate) of electronic devices. The failure rate is the frequency at which an electronic device breaks down, and is expressed as the number of failures per unit time. The failure rate DB 330 stores a failure rate corresponding to each electronic device.

<<Equipment configuration DB>>
The device configuration database (DB) 340 is a database that stores configuration information (device configuration information 120) of the electronic devices mounted on each edge device. The device configuration information 120 is stored in the edge processor system 100. Since this is the same as the device configuration information 120 stored in the memory resource 30, a detailed description thereof will be omitted.

<<Operation History Management DB 350>>
The operation history management DB (database) 350 is a database that stores operation history management information. In addition, the operation history management information registers the operation time and remaining life of the electronic device in each environment, such as a standard environment and a stress environment. The operation history management information will be described in detail later.

<<Characteristic value management DB 360>>
The characteristic value management DB (database) 360 is a database that stores characteristic values calculated by the server-side processor system 300 and the edge-side processor system 100. Details of the processing related to the characteristic values will be described later in a third embodiment.

<<Temperature profile DB370>>
The temperature profile DB (Database) 370 is a database that stores temperature profiles. The temperature profile includes, for example, temperature transitions of electronic devices according to the weather and operating conditions at the time of operation in the area where the edge device was operating. Details of the process using the temperature profile will be described later in the fourth embodiment.

<<Cumulative Failure Rate Calculation Program 410>>
The cumulative failure rate calculation program 410 calculates the cumulative failure rate of the electronic device using the operation history information. The details of the calculation process of the cumulative failure rate will be described later.

<<Operation History Management Program 420>>
The operation history management program 420 executes a generation process for operation history management information to generate operation history management information. Specifically, the operation history management program 420 generates operation history management information including the cumulative operation time and remaining life span in each of the standard environment and the stress environment. The details of the generation process for operation history management information will be described later.

<<Characteristic Value Comparison Program 430>>
The characteristic value comparison program 430 compares the characteristic values calculated by the edge-side processor system 100 with the characteristic values calculated by the server-side processor system 300, and detects any tampering with the operation history. Details of the comparison process of the characteristic values will be described later in the third embodiment.

The above describes an example of the configuration of the server-side processor system 300.

First Embodiment
A first embodiment of the present system will be described below.

<Outline of processing by this system>
FIG. 4 is a diagram showing an example of an outline of the processing of this system.

As shown in the figure, the edge-side processor system 100 acquires sensor information (sensor value indicating temperature) from the temperature sensor, and determines whether the operating environment of the electronic device has exceeded a threshold value based on a comparison between the latest sensor value and the previous sensor value. Furthermore, if the edge-side processor system 100 determines that the operating environment has exceeded a threshold value, it generates operation history information including a corresponding threshold ID and transmits it to the server-side processor system 300.

In addition, when the edge-side processor system 100 acquires sensor information (sensor value indicating that the ignition has changed from OFF to ON or from ON to OFF) from a sensor that detects the ON/OFF state of the automobile ignition, it also generates operation history information including the corresponding threshold ID and transmits it to the server-side processor system 300.

The server-side processor system 300 also calculates the cumulative failure rate of the electronic device using the acquired operation history information, the threshold information 110 of the corresponding degradation factor in the threshold DB 310, the failure rate of the corresponding electronic device in the failure rate DB 330, and the corresponding acceleration coefficient in the acceleration coefficient DB 320.

The server-side processor system 300 also calculates the remaining life of the electronic device using the calculated cumulative failure rate and the product life of the corresponding electronic device in the device configuration DB 340. The server-side processor system 300 also generates operation history management information including the cumulative operation time and remaining life in each of the standard environment and the stress environment, and stores it in the operation history management DB 350.

The above explains an overview of the processing performed by this system.

<Details of the processing of the edge-side processor system 100>
5 is a flow diagram showing an example of a process for generating operation history information. This process is started, for example, when the edge processor system 100 is started.

When processing starts, the operation history generation program 210 determines whether sensor information has been acquired (step S001). If it is determined that sensor information has not been acquired (No in step S001), the operation history generation program 210 performs the processing of step S001 again. On the other hand, if it is determined that sensor information has been acquired (Yes in step S001), the operation history generation program 210 transitions to step S002.

In step S002, the operation history generation program 210 determines whether the acquired sensor information is sensor information related to the power supply of the edge device. Specifically, the operation history generation program 210 determines whether the acquired sensor information is sensor information indicating that the ignition of the automobile has changed from an OFF state to an ON state or from an ON state to an OFF state.

If it is determined that the sensor information is related to the power supply of the edge device (Yes in step S002), the operation history generation program 210 transitions to step S004. On the other hand, if it is determined that the sensor information is not related to the power supply of the edge device (No in step S002), the operation history generation program 210 transitions to step S003. Note that if the acquired sensor information is not related to the power supply of the edge device, the operation history generation program 210 assumes that it has acquired sensor information (sensor value indicating temperature) from a temperature sensor that detects the temperature inside the electronic device (ECU).

In step S003, the operation history generation program 210 determines whether the operating environment has exceeded a threshold value. Specifically, the operation history generation program 210 uses the threshold value information 110 and the sensor information (sensor value indicating temperature) acquired from the temperature sensor to determine whether the operating environment of the electronic device has exceeded any of the threshold values based on a comparison between the latest sensor value and the previous sensor value.

If it is determined that the operating environment does not exceed the threshold value (No in step S003), the operation history generation program 210 returns the process to step S001. On the other hand, if it is determined that the operating environment has exceeded the threshold value (Yes in step S003), the operation history generation program 210 transitions the process to step S004.

In step S004, the operation history generation program 210 generates operation history information. Specifically, the operation history generation program 210 uses the device configuration information 120 and the threshold information 110 to identify the vehicle ID, device ID, and threshold ID of the automobile. The operation history generation program 210 also generates operation history information that associates the date and time when the sensor information was acquired with the identified vehicle ID, device ID, and threshold ID, and event identification information.

Figure 6 (a) is a diagram showing an example of operation history information. As shown in the figure, the operation history information has a simplified configuration in which event identification information (Tn) is associated with the date and time when the sensor information was acquired, the vehicle ID of the automobile, the device ID of the ECU, and the threshold ID.

Next, the operation history generation program 210 transmits the generated operation history information to the server-side processor system 300 (step S005). The operation history generation program 210 also returns the process to step S001, and repeats the processes of steps S001 to S005.

In this way, the operation history generation program 210 continues to send operation history information to the server-side processor system 300 each time the temperature of the electronic device exceeds the threshold value after the edge device is turned on until it is turned off.

Figure 6 (b) is a diagram showing an example of a transmission history of operation history information. The illustrated transmission history shows that operation history information for events T1 to T6 was transmitted to the server-side processor system 300 between event T0, when the electronic device was powered ON, and event T7, when the electronic device was powered OFF.

Figure 7 is a diagram showing an example of the relationship between the timing of an event occurrence and changes in the operating environment. In the illustrated example, the horizontal axis indicates time, and the vertical axis indicates the temperature inside the electronic device (ECU). Each horizontal dashed line indicates a temperature threshold. Each of the regions D0 to D5 divided by each threshold corresponds to a threshold division. For example, the threshold division D3 indicated by the region divided by the thresholds of 85°C and 105°C corresponds to the threshold ID "005" or "006" depending on the direction of change in the operating environment. In other words, one threshold division may be specified by multiple threshold IDs. The same can be said for other threshold divisions. Note that information specifying each threshold division may be stored in memory resource 30, for example, in association with the corresponding threshold ID.

As shown in the figure, events T0 and T7 indicate when the power of the edge device is turned on and off. Event T1 indicates when the operating environment changes from below 85°C to above 85°C, based on 85°C, which is one of the threshold values. The threshold category in this case corresponds to D3.

Similarly, event T2 indicates when the operating environment changes from below 105°C to above 105°C, based on 105°C, which is one of the threshold values. The corresponding threshold category in this case is D4. Event T3 indicates when the operating environment changes from above 105°C to below 105°C, based on 105°C, which is one of the threshold values. The corresponding threshold category in this case is D3.

Event T4 indicates when the operating environment changes from 85°C or higher to less than 85°C, based on 85°C, which is one of the threshold values. In this case, the corresponding threshold category is D2. Event T5 indicates when the operating environment changes from 20°C or higher to less than 20°C, based on 20°C, which is one of the threshold values. In this case, the corresponding threshold category is D1. Event T6 indicates when the operating environment changes from less than 20°C to 20°C or higher, based on 20°C, which is one of the threshold values. In this case, the corresponding threshold category is D2.

As shown in the threshold information 110 in FIG. 2, the electronic device (ECU) in this example operates in a stressful environment between events T2 and T3 and between events T5 and T6, and operates in a standard environment between the other events.

Note that π0 to π4 indicate acceleration coefficients for temperature effects, and each acceleration coefficient corresponds to a specific threshold classification. For example, acceleration coefficient π3 corresponds to threshold classification D4. For example, acceleration coefficient π2 corresponds to both threshold classifications D3 and D2.

The above describes the details of the processing of the edge-side processor system 100.

<Details of Processing by Server Side Processor System 300>
8 is a flow diagram showing an example of a process for generating operation history management information. This process is started, for example, when operation history information indicating that an edge device has been powered on is obtained.

Figure 9 shows an example of the specific calculation content in the generation process of the operation history management information. The generation process of the operation history management information will be described in detail below with reference to Figures 8 and 9.

When processing starts, the cumulative failure rate calculation program 410 determines whether new operation history information has been acquired (step S010). If it is determined that the information has not been acquired (No in step S010), the cumulative failure rate calculation program 410 performs the processing of step S010 again. On the other hand, if it is determined that the information has been acquired (Yes in step S010), the cumulative failure rate calculation program 410 transitions to step S011.

In step S011, the cumulative failure rate calculation program 410 calculates the operating time of the corresponding threshold category. Specifically, the cumulative failure rate calculation program 410 identifies a corresponding predetermined threshold category based on a threshold ID included in the operation history information. In addition, the cumulative failure rate calculation program 410 uses the latest operation history information and the previously acquired operation history information to calculate the operating time of the identified threshold category based on the difference in event occurrence time.

More specifically, in this example, the operating time t0 of threshold category D2 is calculated by T1-T0. Similarly, the operating times t1, t2, and t3 of threshold categories D3 and D4 are calculated by T2-T1, T3-T2, and T4-T3, respectively.

Next, the cumulative failure rate calculation program 410 calculates the cumulative operating time and the total operating time for each threshold category (step S012). Note that when there are multiple operating times, such as threshold category D3 (t1 and t3 in the illustrated example), the sum of these operating times becomes the operating time for that threshold category.

The total operating time Tall is calculated by adding up the operating times tn up to that point, such as t0, t1, t2, and t3.

Next, the cumulative failure rate calculation program 410 calculates the ratio of the cumulative operation time of the threshold division to the total operation time (hereinafter, sometimes referred to as the "individual operation time ratio") for each threshold division (step S013). Specifically, the cumulative failure rate calculation program 410 calculates the ratio TR0 of the cumulative operation time of the threshold division D0 to the total operation time using the formula: cumulative operation time TD0 of D0 / total operation time Tall.

Similarly, the cumulative failure rate calculation program 410 calculates the ratios TR1 to TR4 of the cumulative operation times of threshold categories D1 to D4 to the total operation time using the formula: cumulative operation times TD1 to TD4 for each of D1 to D4 / total operation time Tall.

Next, the cumulative failure rate calculation program 410 calculates the cumulative failure rate based on the percentage of cumulative operation time for each threshold category (step S014). Specifically, the cumulative failure rate calculation program 410 calculates the cumulative failure rate λunit of the electronic device based on the multiplication of the sum of values multiplied by the acceleration coefficient corresponding to each individual operation time percentage and the failure rate λref of the electronic device. The failure rate λref is the failure rate of the electronic device stored in the failure rate DB 330.

Next, the cumulative failure rate calculation program 410 estimates (calculates) the remaining life of the electronic device (step S015). Specifically, the cumulative failure rate calculation program 410 identifies the product life of the corresponding electronic device from, for example, the device configuration DB 340, and calculates the remaining life of the electronic device based on a comparison with the cumulative failure rate.

Figure 10(a) is a graph showing an estimated remaining life within the product's lifespan. Figure 10(b) is a graph showing an estimated remaining lifespan after the product's lifespan. Here, the horizontal axis of Figures 10(a) and (b) shows the operating time of the electronic device, and the vertical axis shows the cumulative failure rate calculated in step S014. In this example, the product lifespan under standard use is assumed to be 10 years, and it is shown that after 10 years the cumulative failure rate will reach the upper limit of the failure rate λlimit.

In the example of FIG. 10(a), the cumulative failure rate is lower with respect to the operating time than in standard use, indicating that the operating time in a stressful environment was short. In this case, the electronic device is estimated to have a remaining life of the operating time indicated by dashed line N. The dashed line N, which indicates the increasing trend of the cumulative failure rate during the remaining life period, may be set to have the same slope as line P, which indicates the increasing trend of the cumulative failure rate expected in standard use.

In the example of FIG. 10(b), although the operating time exceeds the product lifespan, as in the case of FIG. 10(a), the cumulative failure rate is lower relative to the operating time compared to standard use, indicating that the operating time in a stressful environment is short. In this case, the electronic device is estimated to have a remaining lifespan of the operating time indicated by dashed line M. Also, like dashed line N, dashed line M is set to have the same slope as line Q, which indicates the increasing trend in the cumulative failure rate expected in standard use.

Next, the operation history management program 420 generates operation history management information (step S016). Specifically, the operation history management program 420 generates operation history management information including the vehicle ID of the automobile, which is the edge device, the device ID of the target electronic device, the operation time in each of the standard environment and the stress environment, and the remaining lifespan.

Figure 11 is a diagram showing an example of operation history management information. The operation history management program 420 identifies, for example, a vehicle ID and an equipment ID from the operation history information. The operation history management program 420 also calculates the cumulative operation times in the standard environment and the stress environment based on the threshold information 110 and the cumulative operation times for each threshold category calculated in step S012. The operation history management program 420 also generates (updates) operation history management information including the vehicle ID, equipment ID, cumulative operation time in the standard environment, cumulative operation time in the stress environment, and the remaining life estimated in step S015.

Furthermore, after performing the processing of step S016, the operation history management program 420 returns the processing to step S010 again.

In addition, when an edge device is turned on after being turned off, the operating time, cumulative operating time, and total operating time for each threshold category up to that point are carried over, and the operating time after the power was turned on are added based on these times.

The above describes the details of the processing of the server-side processor system 300.

This system makes it possible to manage the operation history of electronic devices and the like using status data with reduced communication traffic. In particular, the operation history information sent from the edge-side processor system to the server-side processor system is simplified by using threshold classifications to represent the operating environment of the electronic devices and the like, reducing the amount of data. In addition, the operation history information is sent to the server-side processor system only when it is generated, reducing the number of communications. Therefore, this system can contribute to reducing the amount of communication traffic between edge devices and server computers and the associated communication costs.

In addition, this system makes it possible to manage information such as how long electronic devices have been operating in standard and stressful environments, as well as their remaining lifespan.

Second Embodiment
Next, a second embodiment of the present system will be described. The present system according to the second embodiment calculates the remaining life of an electronic device based on a cumulative failure rate calculated taking into account a plurality of degradation factors. Specifically, in the second embodiment, the calculation of the cumulative failure rate and the remaining life when the degradation factors are temperature and vibration will be described. Note that the following mainly describes the points that are different from the first embodiment, and detailed descriptions of the same configurations and processes will be omitted.

Figure 12 is a diagram showing an example of a transmission history of operation history information according to this embodiment. The illustrated transmission history shows that operation history information for events T1 to T11 was transmitted to the server-side processor system 300 between event Ts, when the power of the electronic device was turned ON, and event Te, when the power was turned OFF. Note that TT indicates an event where the deterioration cause is temperature, and AT indicates an event where the deterioration cause is vibration.

Figure 13(a) is a diagram showing an example of the relationship between the event occurrence timing and the change in the operating environment when the deterioration factor is temperature. Figure 13(b) is a diagram showing an example of the relationship between the event occurrence timing and the change in the operating environment when the deterioration factor is vibration.

In these figures, the threshold divisions when the degradation factor is temperature are indicated as TD0 to TD5, and the threshold divisions when the degradation factor is vibration are indicated as AD0 to AD5. Additionally, the acceleration coefficients for temperature effects are indicated as Tπ0 to Tπ4, and the acceleration coefficients for vibration effects are indicated as Aπ0 to Aπ4.

When calculating the cumulative failure rate of an electronic device taking into account multiple degradation factors, the cumulative failure rate calculation program 410 performs steps S011 to S014 for each degradation factor.

Figure 14 shows an example of the specific calculation contents of the cumulative failure rate in the generation process of the operation history management information. Steps S011 to S014 shown in the figure correspond to the step numbers in the generation process of the operation history management information described above.

As shown in the figure, the cumulative failure rate calculation program 410 calculates the individual operating time ratios separately for the cases where the degradation factor is temperature and the cases where the degradation factor is vibration.

In addition, in step S014, the cumulative failure rate calculation program 410 calculates the cumulative failure rate λunit of the electronic device by multiplying the sum of the values obtained by multiplying the acceleration coefficients corresponding to the individual operating time ratios when the degradation factor is temperature and the sum of the values obtained by multiplying the acceleration coefficients corresponding to the individual operating time ratios when the degradation factor is vibration by the failure rate λref of the electronic device.

In step S015, the cumulative failure rate calculation program 410 estimates the remaining life of the electronic device based on the cumulative failure rate. In step S016, the cumulative failure rate calculation program 410 generates operation history management information including the estimated remaining life, the cumulative operation time in a standard environment, and the cumulative operation time in a stress environment.

The degradation factors are not limited to temperature and vibration, and there are other degradation factors such as current, for example. However, even when calculating the cumulative failure rate and remaining life taking into account three or more degradation factors, the cumulative failure rate and remaining life can be calculated by performing calculations in the same manner as in this embodiment.

The above describes the second embodiment of this system.

This system can estimate the remaining lifespan of electronic devices by taking into account multiple degradation factors. As a result, this system can estimate the remaining lifespan of electronic devices with greater accuracy and generate and manage highly reliable operation history management information.

Third Embodiment
Next, a third embodiment of the present system will be described. The present system according to the third embodiment detects tampering of operation history based on feature values calculated by the edge-side processor system 100 and the server-side processor system 300 using operation history management information and operation history information. In the following, differences from the first and second embodiments will be mainly described, and detailed descriptions of the same configurations and processes will be omitted.

<<Feature value calculation process>>
<<<<Processing of Edge Side Processor System 100>>>
15 is a diagram showing an outline example of the characteristic value calculation process. As shown in the figure, the characteristic value calculation program 220 of the edge-side processor system 100 acquires feedback of operation history management information targeted at its own edge device from the server-side processor system 300 (1). In addition, the characteristic value calculation program 220 acquires the latest operation history information generated by the operation history generation program 210. In addition, the characteristic value calculation program 220 calculates the characteristic value using the operation history management information and the operation history information (2). Note that, for example, a stream cipher (e.g., LFSR: Linear Feedback Shift Register) or a one-way hash function (e.g., an algorithm such as SHA512) may be used as a method for calculating the characteristic value.

The feature value calculation process by the edge-side processor system 100 may be executed, for example, when the latest operation history information is acquired after feedback of operation history management information is received from the server-side processor system 300. The feedback of operation history management information may be executed periodically (for example, when the edge-side processor system 100 is started, at a specified time, every few hours, or every few days, etc.).

The calculated latest characteristic value A includes both a characteristic value calculated using the operation history management information and the latest operation history information, and a characteristic value calculated from a value obtained by combining the latest operation history information with the characteristic value calculated in the previous characteristic value calculation process.

The characteristic value calculation program 220 also stores the latest calculated characteristic value A in the memory resource 30 (3) and transmits the characteristic value A together with the latest operation history information to the server-side processor system 300.

The latest characteristic value is stored in the memory resource 30, but characteristic values from multiple times may also be stored.

The above describes the feature value calculation process performed by the edge-side processor system 100.

<<<<Processing of Server Side Processor System 300>>>
Next, the feature value comparison program 430 of the server-side processor system 300 uses the latest operation history information acquired from the edge-side processor system 100 and the operation history management information fed back to the edge-side processor system 100 to calculate a feature value A' by the same method (algorithm) as the method used by the feature value calculation program 220 of the edge-side processor system 100 to calculate the feature value (5). Note that the calculated feature value A' includes a type of feature value corresponding to the feature value included in the feature value A.

Next, the characteristic value comparison program 430 stores the calculated latest characteristic value A' in the memory resource 30 (6) and compares the characteristic value A with the characteristic value A' (7). Furthermore, if the characteristic value A and the characteristic value A' indicate different values, the characteristic value comparison program 430 detects that the operation history management information fed back to the edge-side processor system 100 has been tampered with (8).

The above describes the third embodiment of this system.

If this system detects tampering, various measures can be taken, such as removing the edge device from the list of devices that are subject to operation history management or suggesting to the user of the edge device that they be replaced.

In particular, when an electronic device is replaced with another edge device during reuse or secondary use, the management source of that edge device changes. Falsification of operation history often occurs at the timing of such electronic device replacement. In particular, falsification of operation history is often done for the purpose of appealing that the electronic device being reused or secondary used has a sufficient remaining lifespan. By detecting falsification of operation history, this system can provide benefits to the user, for example, by notifying the user of the reused or secondary use product that tampering has occurred or by suggesting a replacement of the electronic device.

<Fourth embodiment>
Next, a fourth embodiment of the present system will be described. In the case of an environment or specifications in which operation history information cannot be obtained from the edge processor system 100, the present system according to the fourth embodiment estimates the operating environment of the electronic device using meteorological information and a temperature profile, and calculates the remaining life. Note that the following description will focus on the differences from the first to third embodiments, and detailed descriptions of the same configurations and processes will be omitted.

<<Calculation of remaining life using temperature profile>>

First, the location information output program 230 of the edge-side processor system 100 uses the output information from the GPS receiver 80 to periodically (e.g., every few minutes or every few hours) calculate location information that identifies the current location of the edge device, and transmits it to the server-side processor system 300.

The cumulative failure rate calculation program 410 of the server-side processor system 300 acquires weather information for the relevant area from a specified weather information distribution service based on the location information acquired from the edge-side processor system 100. In addition, the cumulative failure rate calculation program 410 uses a temperature profile to identify the change in the temperature environment of the electronic devices corresponding to the weather conditions, such as the weather, in the acquired relevant area.

As a result, the cumulative failure rate calculation program 410 can estimate the temperature transition of an electronic device, for example, as shown in FIG. 7. In other words, the cumulative failure rate calculation program 410 can estimate information that is the same as the operation history information regarding temperature.

In addition, the cumulative failure rate calculation program 410 calculates the cumulative failure rate and remaining life of the electronic device by executing the generation process of the operation history management information described above based on the estimated temperature transition.

The fourth embodiment of this system has been described above.

According to this system, even if operation history information cannot be obtained from the edge processor system 100, information equivalent to the operation history information can be estimated based on meteorological information and a temperature profile. As a result, even if operation history information cannot be obtained, this system can estimate the cumulative failure rate and remaining life of electronic devices.

<Service form of this system>
16 to 18 are diagrams showing examples of service forms to which this system is applied.

Figure 16 shows an example of a service format for fleet operators and used car dealers. The operation history management system shown in the figure corresponds to this system. This system is owned, managed, and operated by the edge device manufacturer (in the example shown, this is referred to as OEM: Original Equipment Manufacturer) or a data management company.

In this service, data management businesses etc. provide fleet operators (businesses that own and manage a large number of edge devices) and used car dealers with the operation history of electronic devices (operation history management information including remaining lifespan and operating time under stressful environments) for a fee. This allows data management businesses etc. to earn income from the usage fees for the service.

Data management businesses, etc. can also benefit from being able to contribute to environmental goals (such as reducing CO2 emissions) by helping to reduce the disposal of electronic devices that have not yet reached the end of their product life by understanding the operating and reuse status. Data management businesses can also benefit from improved corporate brand image based on their contributions to society.

Fleet operator A can also benefit from improved utilization rates of edge devices as a result of long-term use of electronic devices.

In addition, when purchasing a car from fleet operator A, the used car dealer can benefit by being able to confirm the appropriateness of the purchase price based on an understanding of the operating history. In addition, the used car dealer can understand the product lifespan of the electronic devices installed in the target vehicle and the operating time under stressful conditions based on the operating history, so that electronic devices that are likely to break down can be replaced before the sale. This allows the used car dealer to benefit from improved credibility with the users to whom the car is sold and with fleet operator B.

Furthermore, Fleet Operator B, who purchases a car from a used car dealer, can obtain the benefit of being able to confirm the appropriateness of the purchase price based on an understanding of the operating history.Furthermore, Fleet Operator B can obtain the benefit of improved operating rates of edge devices as electronic devices are used for a long period of time.

In this way, this system can provide many benefits to stakeholders such as data management companies, fleet operators, and used car dealers.

Figure 17 shows an example of a service format for reuse/secondary use vendors. In this service, the data management business provides the operation history of electronic devices (operation history management information including remaining life span and operation time under stressful conditions) to reuse/secondary use vendors, dealers, and maintenance companies for a fee. This allows the data management business to benefit from income from the usage fees for the service.

In addition, reuse and secondary use vendors can benefit from being able to set optimal sales prices and warranty periods according to the operating history. In addition, reuse and secondary use vendors can benefit from being able to check the appropriateness of the purchase price when purchasing electronic devices from dealers and repair companies based on an understanding of the operating history.

Dealers and repair shops can also benefit by being able to set optimal sales prices based on operating history. Used car dealers and other product vendors can also benefit by being able to reduce the cost of procuring parts from reuse and secondary use vendors.

In this way, this system can provide many benefits to stakeholders such as data management businesses, reuse and secondary use vendors, dealers and maintenance companies, used car dealers, and other product vendors.

Figure 18 shows an example of a service format for manufacturing companies (OEMs) and reuse/secondary use vendors. In this service, the data management business provides a service of providing the operation history of electronic devices (operation history management information including remaining life span and operation time under stressful environments) to reuse/secondary use vendors, dealers/maintenance companies, manufacturing companies (OEMs), and users (businesses) for a fee. This allows the data management business to benefit from income from usage fees for the service.

In addition, by understanding the operating history, reuse/secondary use vendors can gain the advantage of being able to confirm the appropriateness of the purchase price of used electronic devices (including electronic components) from dealers and repair companies. In addition, reuse/secondary use vendors can gain the advantage of being able to set the optimal sales price and warranty period according to the operating history. In addition, reuse/secondary use vendors can gain the advantage of being able to reduce the labor required for sorting and ranking the used electronic devices (including electronic components) that they purchase based on an understanding of the operating history.

In addition, dealers and repair companies can benefit from being able to set optimal sales prices based on the operating history. In addition, users (businesses) can benefit from being able to own high-quality reused vehicles based on an understanding of the operating history. In addition, users (businesses) can benefit from being able to reduce purchasing costs based on an understanding of the operating history.

Furthermore, the manufacturing company (OEM) can gain the advantage of being able to check the quality of the reused products based on an understanding of the operating history. The manufacturing company can also gain the advantage of being able to guarantee the quality of vehicles that use reused products. The manufacturing company can also gain the advantage of shorter delivery times and a stable supply.

In this way, this system can provide many benefits to stakeholders such as data management businesses, reuse and secondary use vendors, dealers and maintenance companies, manufacturers (OEMs), and users (businesses).

The above explains the service model of this system.

The computers related to the edge-side processor system 100 and the server-side processor system 300 may function as a program distribution server that distributes at least the programs in the memory resource 30 (31) to other computers so that the programs can be executed on the other computers.

The present invention is not limited to the above-described embodiments and modifications, but includes various modifications within the scope of the same technical idea. For example, the above-described embodiments have been described in detail to clearly explain the present invention, and are not necessarily limited to those having all of the configurations described. It is also possible to replace part of the configuration of one embodiment with the configuration of another embodiment, and it is also possible to add the configuration of another embodiment to the configuration of one embodiment. It is also possible to add, delete, or replace part of the configuration of each embodiment with other configurations.

In addition, in the above explanation, the control lines and information lines are those that are considered necessary for the explanation, and do not necessarily show all the control lines and information lines in the product. In reality, it can be considered that almost all components are interconnected.

100: Edge-side processor system, 20: Processor, 30: Memory resource, 40: NI (Network Interface Device), 60: Various sensors, 70: CAN, 80: GPS receiver, 110: Threshold information, 120: Equipment configuration information, 130: Feature value information, 210: Operation history generation program, 220: Feature value calculation program, 230: Location information output program, 300: Server-side processor system, 21: Processor, 31: Memory Resources, 41... NI (Network Interface Device), 51... UI (User Interface Device), 310... Threshold DB, 320... Acceleration Coefficient DB, 330... Failure Rate DB, 340... Equipment Configuration DB, 350... Operation History Management DB, 360... Feature Value Management DB, 370... Temperature Profile DB, 410... Cumulative Failure Rate Calculation Program, 420... Operation History Management Program, 430... Feature Value Comparison Program, 10 (11)... External Device, N... Communication Network

Claims (14)

An edge-side processor system including a processor and a memory resource, the edge-side processor system being mounted on an edge device;
A system including a server-side processor system that is capable of communicating with the edge-side processor system and is mounted on a server computer and includes a processor and a memory resource,
The memory resource of the edge processor system stores at least threshold value information in which threshold values corresponding to predetermined deterioration factors that shorten the time until failure of an electronic device or electronic component are registered, and an operation history generation program;
By executing the operation history generation program, the processor of the edge-side processor system:
When the operating environment of the electronic device or electronic component exceeds the threshold, generating operation history information including a threshold ID for identifying the threshold;
Transmitting the generated operation history information to the server-side processor system;
the memory resource of the server-side processor system stores at least a cumulative failure rate calculation program and an operation history management program;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
calculating a cumulative operating time of the electronic device or electronic component under each operating environment with respect to a total operating time of the electronic device or electronic component for each threshold category corresponding to the threshold ID;
Calculating a cumulative failure rate of the electronic device or electronic component based on the cumulative operating time;
estimating a remaining life of the electronic device or electronic component based on the cumulative failure rate and the product life;
By executing the operation history management program, the processor of the server-side processor system:
A system that generates operation history management information including the remaining lifespan and the accumulated operation time under at least a stress environment among the operating environments. 2. The system of claim 1,
The threshold information includes at least
A system comprising a threshold value corresponding to the deterioration factor, and a threshold ID indicating the operating environment of the electronic device or electronic component classified according to the threshold value. 3. The system of claim 2,
A system characterized in that the threshold ID is associated with a standard environment and a stress environment as the type of operating environment corresponding to the threshold category. 2. The system of claim 1,
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
Calculating a ratio of the cumulative operation time in the operation environment to a total operation time of the electronic device or electronic component for each threshold category;
A system characterized by calculating the cumulative failure rate by multiplying the sum of values obtained by multiplying each of the percentages of cumulative operating time under each operating environment calculated for each threshold category by an acceleration coefficient of the deterioration factor corresponding to the threshold category, and multiplying the sum by a reference failure rate of the electronic device or electronic component. 5. The system of claim 4,
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
A system for estimating the remaining life based on a comparison of the cumulative failure rate of the electronic device or electronic component with an upper limit of the cumulative failure rate corresponding to the product life. 2. The system of claim 1,
the memory resource of the server-side processor system further stores the threshold information corresponding to each of the plurality of degradation factors;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
calculating the cumulative operating time for each of the deterioration factors using the threshold information corresponding to each of the deterioration factors;
calculating the cumulative failure rate of the electronic device or electronic component based on the sum of the cumulative operating time for each of the deterioration factors;
A system for estimating a remaining life of the electronic device or electronic component based on the cumulative failure rate and the product life. 7. The system of claim 6,
The system, wherein the plurality of degradation factors include at least temperature, vibration, and current. 2. The system of claim 1,
The memory resource of the edge-side processor system further stores a feature value calculation program;
By executing the feature value calculation program, the processor of the edge-side processor system:
Calculating a feature value using the operation history management information fed back from the server-side processor system and the operation history information;
Transmitting the calculated characteristic value and the operation history information to the server-side processor system;
The memory resource of the server-side processor system further stores a feature value comparison program;
By executing the feature value calculation program, the processor of the server-side processor system:
Calculating a feature value using the operation history management information fed back to the edge-side processor system and the operation history information;
A system characterized by detecting tampering with the operation history management information in the edge-side processor system by comparing the calculated characteristic value with the characteristic value calculated in the edge-side processor system. 9. The system of claim 8,
The characteristic values include:
The system includes a feature value calculated using the operation history management information and the operation history information, and a feature value calculated from a value obtained by combining the operation history information with the feature value calculated in a previous process. 2. The system of claim 1,
The memory resource of the edge side processor system further stores a position information output program;
By executing the position information output program, the processor of the edge side processor system:
transmitting location information of an edge device on which the edge-side processor system is mounted to the server-side processor system;
The memory resource of the server-side processor system further stores temperature profile information including a profile condition related to weather in a region where the edge device was operating and a temperature transition of the electronic device measured under the profile condition;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
estimating a temperature transition of a temperature environment of the electronic device or electronic component based on a correspondence relationship between the weather in a region corresponding to the location information of the edge device and the temperature transition;
A system for estimating the cumulative failure rate and the remaining life of the electronic device or electronic component based on the temperature transition. An edge-side processor system including a processor and a memory resource, the edge-side processor system being mounted on an edge device;
A system including a server-side processor system capable of communicating with the edge-side processor system and including a processor and a memory resource, the server-side processor system being mounted on a server computer, comprising:
The memory resource of the edge processor system performs a step of storing at least threshold value information in which threshold values corresponding to predetermined deterioration factors that shorten the time until failure of an electronic device or electronic component are registered, and an operation history generating program;
By executing the operation history generation program, the processor of the edge-side processor system:
generating operation history information including a threshold ID for identifying a threshold value when the operating environment of the electronic device or electronic component exceeds the threshold value;
transmitting the generated operation history information to the server-side processor system;
The memory resource of the server-side processor system performs a step of storing at least a cumulative failure rate calculation program and an operation history management program;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
calculating an accumulated operating time of the electronic device or electronic component under each operating environment with respect to a total operating time of the electronic device or electronic component for each threshold category corresponding to the threshold ID;
calculating a cumulative failure rate of the electronic device or electronic component based on the cumulative operating time;
and estimating a remaining life of the electronic device or electronic component based on the cumulative failure rate and the product life.
By executing the operation history management program, the processor of the server-side processor system:
An operation history management method, comprising the step of generating operation history management information including the remaining life and the accumulated operation time under at least a stress environment among the operating environments. The operation history management method according to claim 11,
The memory resource of the server-side processor system further performs a step of storing the threshold information corresponding to each of the plurality of deterioration factors;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
calculating the cumulative operating time for each of the deterioration factors by using the threshold information corresponding to each of the deterioration factors;
calculating the cumulative failure rate of the electronic device or electronic component based on the sum of the cumulative operating time for each of the deterioration factors;
and estimating a remaining life of the electronic device or electronic component based on the cumulative failure rate and the product life. The operation history management method according to claim 11,
The memory resource of the edge-side processor system further performs a step of storing a feature value calculation program;
By executing the feature value calculation program, the processor of the edge-side processor system:
calculating a feature value using the operation history management information fed back from the server-side processor system and the operation history information;
transmitting the calculated characteristic value and the operation history information to the server-side processor system;
The memory resource of the server-side processor system further performs a step of storing a feature value comparison program;
By executing the feature value calculation program, the processor of the server-side processor system:
calculating a feature value using the operation history management information fed back to the edge-side processor system and the operation history information;
and detecting tampering with the operation history management information in the edge-side processor system by comparing the calculated characteristic value with the characteristic value calculated in the edge-side processor system. The operation history management method according to claim 11,
The memory resource of the edge side processor system further performs a step of storing a position information output program;
By executing the position information output program, the processor of the edge side processor system:
transmitting location information of an edge device on which the edge-side processor system is mounted to the server-side processor system;
The memory resource of the server-side processor system further performs a step of storing temperature profile information including a profile condition related to weather at the time of operation in the area where the edge device was operating and a temperature transition of the electronic device measured under the profile condition;
By executing the cumulative failure rate calculation program, the processor of the server-side processor system:
estimating a temperature transition of a temperature environment of the electronic device or electronic component based on a correspondence relationship between the weather in a region corresponding to the location information of the edge device and the temperature transition;
and estimating the cumulative failure rate and the remaining life of the electronic device or electronic component based on the temperature transition.

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