JP2023075999A - Sample testing device - Google Patents

Abstract

To provide a highly versatile sample testing device which is easy to maintain.SOLUTION: A sample testing device 1 of the present invention comprises a conveying mechanism unit 2 for a sample to be mounted, and a device body 1H accommodating the conveying mechanism unit 2, where the conveying mechanism unit 2 is configured to be removably inserted into the device body 1H.SELECTED DRAWING: Figure 1B

Description

The present invention relates to a specimen testing apparatus.

2. Description of the Related Art Sample testing apparatuses are used as means for automating pretreatment, inspection, and post-processing of sample testing. In the pretreatment step, a capping device, a pipetting device, a centrifugal separation device, etc. are used, and in the posttreatment step, a capping device, a refrigerated storage device, etc., are used as sample testing devices.
FIG. 21A shows a centrifugal separation device as an example of the sample testing device K10. FIG. 21B is a diagram showing a state in which the exterior cover 100 is removed from FIG. 21A for convenience of explanation. As shown in FIG. 21B, the operation mechanism section of the centrifugal separator (K10) is composed of a transport mechanism section 102, a centrifuge 103, and a transfer mechanism section 104. As shown in FIG. The centrifuge (K10) has a manipulator 105 attached to a transfer mechanism 104 for gripping a test tube containing a sample.

Since JIS C 1010-1 is applied to the specimen testing apparatus K10, a protective barrier or cover that can be removed only with a tool may be required as a protective measure against mechanical hazards to body parts. As shown in FIG. 21A, the centrifugal separator (K10) has a full-cover structure in which the entire operation mechanism (102, 103, 104) is covered with an exterior cover 100. As shown in FIG. Of the exterior cover 100, only the front door 101a and the rear door 102b can be opened and closed by the user, and an interlock is provided to stop the operation of the transfer mechanism section 104 when opened. The opening 106 is a rack delivery port to an adjacent device when a plurality of sample testing devices K10 are connected, and is blocked by the adjacent device.
While the full-cover structure reduces the risk of mechanical hazards, there is a problem that the visibility and accessibility of the mechanical parts (102, 103, 104) are reduced, making maintenance difficult.

JP 2010-145112 A WO2019/003789

FIG. 22 shows a perspective view of maintenance work for the conventional sample testing apparatus K10.
When the specimen testing apparatus K10 has a full-cover structure, the worker p1 leans over the inside of the apparatus to perform the maintenance work.
Therefore, in the current structure, it is difficult for the worker p1 to visually recognize and access the maintenance location, resulting in poor workability. Therefore, depending on the maintenance location, the worker p1 removes the parts such as the exterior cover before performing the work.

In Patent Literature 1, improvement in maintainability is attempted by adopting a structure in which an exterior cover, parts, and the like are easily removed. Therefore, the difficulty of maintenance work has not been fundamentally eliminated.
Patent Document 2 describes a method for coping with different rack types. However, there is no description about facilitation of maintenance work.

SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a specimen testing apparatus that facilitates maintenance work and has high versatility.

In order to solve the above-described problems, a sample testing apparatus of the present invention includes a transport mechanism section on which a sample is mounted, and an apparatus body in which the transport mechanism section is accommodated. It is configured so that it can be put in and taken out.

According to the present invention, it is possible to provide a sample testing apparatus that facilitates maintenance work and has high versatility.

1 is a perspective view of a sample testing apparatus according to an embodiment of the present invention; FIG. FIG. 2 is a perspective view of the sample testing apparatus according to the embodiment of the present invention during maintenance work; The perspective view which looked at the conveyance mechanism part from the front downward direction. FIG. 3 is an enlarged view of the pin caster mounting bracket, the caster, and the positioning pin guide as viewed in the I direction of FIG. 2; II direction arrow directional view of FIG. 3A. III direction arrow directional view of FIG. 3A. IV direction arrow directional view of FIG. 3B. FIG. 4 is a perspective view of the frame inside the opening of the apparatus main body of the specimen testing apparatus as seen from the front right. The front view including the partial cross section of a 1st and 2nd positioning pin. FIG. 2 is a top view of first and second positioning pins; The top view of a caster guide. FIG. 6A is a view in the direction of arrow V in FIG. 6A. FIG. 2 is a front view of a main part of a state in which a transport mechanism is positioned and housed in an apparatus main body of a specimen testing apparatus; The figure which shows five racks in which five test tubes containing the sample are mounted. FIG. 4 is a top view showing a transport mechanism unit that supports five racks; FIG. 10 shows a 10-rack on which 10 test tubes containing samples are placed. The figure which shows the conveyance mechanism part corresponding to 10 racks. FIG. 4 is a cross-sectional top view showing a state in which a five-rack transport mechanism is housed inside the sample testing apparatus. FIG. 4 is a cross-sectional top view showing a state in which a transport mechanism for ten racks is accommodated inside the sample testing apparatus. FIG. 4 is a schematic diagram of an example using a plurality of transport mechanism units in the sample testing apparatus of the embodiment; FIG. 4 is a schematic front view of a state in which a five-rack transport mechanism begins to enter from an opening on the right side of the sample testing apparatus; FIG. 4 is a schematic top rear arrow view of a state in which a five-rack transport mechanism begins to enter from an opening on the right side of the sample testing apparatus. FIG. 4 is a schematic front view of a transport mechanism inserted through an opening on the right side of the sample testing apparatus; FIG. 4 is a schematic perspective view of the surroundings of the positioning pin guide at the rear of the transport mechanism section inserted through the opening of the sample testing apparatus, viewed obliquely from the upper left front. FIG. 4 is an enlarged schematic oblique view of a state in which a U-shaped cutout portion of a positioning pin guide of a transport mechanism unit placed in a sample testing apparatus abuts on a positioning pin on a frame, as viewed obliquely from the upper left front. FIG. 4 is an enlarged schematic oblique view of the transport mechanism, which is placed in the sample testing apparatus and is viewed obliquely from the upper left front, with the U-shaped notch of the positioning pin guy of the transport mechanism in contact with the positioning pin on the frame. The figure which shows the perspective view of the sample testing apparatus of a modification. The figure which shows the slide rail used for the conveyance mechanism part of a modification. The figure which shows the slide rail used for the conveyance mechanism part of a modification. FIG. 10 is a diagram showing an LM guide used in a transport mechanism section of a modified example; FIG. 11 is a perspective view of a sample testing apparatus of another example of a modified example; FIG. 2 is a perspective view of a conventional specimen testing apparatus with a full-cover structure. The figure which shows the state which removed the exterior cover from the sample testing apparatus. FIG. 11 is a perspective view of maintenance work for a conventional sample testing apparatus;

BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings as appropriate.
FIG. 1A shows a perspective view of a sample testing apparatus 1 according to an embodiment of the present invention.
FIG. 1B shows a perspective view of the sample testing apparatus 1 according to the embodiment of the present invention during maintenance work.

FIG. 2 shows a perspective view of the transport mechanism section 2 as seen from the lower right front side.
A sample testing apparatus 1 of the embodiment includes an apparatus main body 1H and a transport mechanism section 2 .
The sample testing apparatus 1 has a structure in which the transport mechanism section 2 is positioned and accommodated inside the apparatus main body 1H.
The transport mechanism section 2 is configured such that the mechanism sections are densely packed. The transport mechanism unit 2 is a mechanism that transports and buffers a plurality of sample containers (test tubes) in rack units.

As shown in FIG. 1B, the specimen testing apparatus 1 has an outer shell formed by a housing 3 and an exterior cover 4. A right side plate 3s of the housing 3 has an opening 3s1 for inserting and removing the transport mechanism section 2. is open. The opening 3s1 also serves as a delivery opening for the rack to the adjacent device (1) when the sample testing devices 1 are connected. Since the opening 3s1 is closed by the adjacent device (1), the function as a full cover structure is maintained.

As shown in FIG. 2, a pair of casters 4a and 4b as moving means are installed on the lower left side of the transport mechanism 2 so as to protrude downward. The casters 4a and 4b rotate so that the transport mechanism 2 can move smoothly in the horizontal direction. The casters 4 a and 4 b roll when the transport mechanism section 2 is taken in and out of the specimen testing apparatus 1 .
When performing maintenance on the transport mechanism section 2, an operator pulls out the transport mechanism section 2 from the opening 3s1 of the housing 3 (arrow α11 in FIG. 1).

When the maintenance is finished, the worker pushes the transport mechanism 2 from the opening 3s1 onto the frame 1f inside the sample testing apparatus 1, as indicated by the arrow α12 in FIG. are moved to a predetermined position by the casters 4a and 4b (see FIG. 2).

A positioning pin guide 5 as a positioning guide is provided at the left end portion between the casters 4a and 4b on the lower surface of the transport mechanism portion 2 shown in FIG. The positioning pin guide 5 is for performing predetermined positioning of the transport mechanism section 2 in the sample testing apparatus 1 .

<Casters 4a, 4b>
FIG. 3A shows an enlarged view of the mounting bracket 16, the casters 4a and 4b, and the positioning pin guide 5 as viewed in the I direction of FIG. In FIG. 3B, the II direction arrow directional view of FIG. 3A is shown. FIG. 3C shows a view in the direction of arrow III in FIG. 3A. FIG. 3D shows a view in the direction of arrow IV in FIG. 3B.
Casters 4 a and 4 b and positioning pin guide 5 are fixed to mounting bracket 16 .

The caster 4a is rotatably attached to the caster bracket 4a1. The caster bracket 4a1 is screwed n1 to the mounting bracket 16. As shown in FIG.
The caster 4b is rotatably attached to the caster bracket 4b1. The caster bracket 4b1 is screwed n1 to the mounting bracket 16. The positioning pin guide 5 is a sheet metal part. The positioning pin guide 5 is formed by continuously forming a mounting plate portion 5a, a positioning plate portion 5b, and a mounting plate portion 5a. The positioning pin guide 5 is fixed to the mounting bracket 6 by welding 5y.

As shown in FIGS. 3B and 3C, the positioning plate portion 5b is fitted with a positioning pin 7 (see FIG. 4) or a positioning pin 8 (see FIG. 4) extending in the vertical direction described later. It is formed one step lower than the plate portion 5a. The positioning plate portion 5b includes a U-shaped notch portion 5b1 into which a positioning pin 7 (see FIG. 4) or a positioning pin 8 (see FIG. 4) described later, and a positioning pin 7 or a positioning pin 8 (see FIG. 4). ) and a guide notch portion 5b2 for guiding ). The guide cutout portion 5b2 is formed in a substantially V-shaped cutout that widens toward the outside in order to guide the positioning pin 7 to the U-shaped cutout portion 5b1. In other words, the guide cutout portion 5b2 is formed in a shape that narrows toward the U-shaped cutout portion 5b1.

<First Positioning Pin 7 and Second Positioning Pin 8>
FIG. 4 shows a perspective view of the frame 1f in the opening 3s1 of the apparatus main body 1H of the specimen testing apparatus 1 as viewed from the front right. Note that FIG. 4 shows the apparatus body 1H with the housing 3 removed. In FIG. 4, it is assumed that the first positioning pin 7 is used, and the second positioning pin 8 is indicated by a chain double-dashed line.
A pair of caster guides 6, a first positioning pin 7, and a second positioning pin 8 are provided on the frame 1f.

The first positioning pin 7 is a member for positioning the transport mechanism section 2 at a first predetermined position within the sample testing apparatus 1 (see FIG. 1).
The second positioning pin 8 is a member for positioning another transport mechanism section 2 having a different shape from the transport mechanism section 2 in the sample testing apparatus 1 (see FIG. 1). It should be noted that it is also possible to position another transport mechanism 2 with the first positioning pin 7 depending on the shape in which the transport mechanism 2 is accommodated in the apparatus main body 1H. Alternatively, it is also possible to position another transport mechanism portion 2 with the first positioning pin 7 by forming the transport mechanism portion 2 into substantially the same shape as the transport mechanism portion 2 .

FIG. 5A shows a front view including a partial cross section of the first and second positioning pins 7 and 8. As shown in FIG. FIG. 5B shows a top view of the first and second positioning pins 7 and 8. As shown in FIG.
The first positioning pin 7 has a disk-shaped flange portion 7a and a cylindrical positioning portion 7b. The first positioning pin 7 has a female thread n3 threaded from below in the central portion thereof. Similarly, the second positioning pin 8 has a disk-shaped flange portion 8a and a cylindrical positioning portion 8b. The second positioning pin 8 has a female thread n3 threaded from below in the central portion thereof.

Drill holes are provided at positions of the first positioning pin 7 and the second positioning pin 8 of the frame 1f. Then, a male screw is inserted from the bottom surface of the frame 1f and coupled with the female screw n3 of the first positioning pin 7 or the female screw n3 of the second positioning pin 8. As shown in FIG.
Thus, either the first positioning pin 7 or the second positioning pin 8 is fixed to the frame 1f according to the transport mechanism section 2 used.

<Caster guide 6>
6A shows a top view of the caster guide 6, and FIG. 6B shows a view of FIG. 6A viewed from the direction of arrow V. As shown in FIG.
The frame 1f is provided with rectangular mounting holes 1f1 and 1f2 (see FIG. 4) for mounting the pair of caster guides 6, respectively.

As shown in FIG. 6B, the caster guide 6 has a first attachment portion 6a, an entry/exit slope 6b, a horizontal guide 6c positioned substantially horizontally below, a clearance slope 6d, and a second attachment portion 6e.
The first attachment portion 6a and the second attachment portion 6e have a substantially horizontal shape extending in the left-right direction. The first attachment portion 6a and the second attachment portion 6e are arranged substantially horizontally. The first attachment portion 6a and the second attachment portion 6e serve to fix the caster guide 6 to the frame 1f. The first attachment portion 6a and the second attachment portion 6e are provided with insertion holes 6a1 and 6e1, respectively, through which rivets to be fixed to the frame 1f are inserted.

As a result, the caster guide 6 is fixed below the frame 1f inside the specimen testing apparatus 1 by fixing the first attachment portion 6a and the second attachment portion 6e with rivets from below the frame 1f inside the specimen testing apparatus 1 ( See Figure 4).
The entry/exit slope 6b is inclined downward from the right side to the left side and guides the casters 4a and 4b.
The horizontal guide 6c is positioned substantially horizontally downward.

The allowance slope 6d is inclined upward from the right side to the left side, and guides the casters 4a and 4b to return to the horizontal guide 6c.
Due to the presence of the caster guide 6, the casters 4a and 4b can be arranged at predetermined positions of the apparatus main body 1H. Further, the transport mechanism section 2 can be arranged at a predetermined height inside the sample testing apparatus 1 by positioning the horizontal guide 6c downward.
A structure in which the ground planes 2t1, 2t2, 2t3 on the bottom surface 2t (see FIG. 2) of the transport mechanism 2 and the main body side ground planes 1fa, 1fb, 1fc on the top surface 1f1 (see FIG. 4) of the frame 1f are aligned. I have to. Thereby, the horizontality of the transport mechanism section 2 is ensured.
The body-side ground contact surface 1fa is installed on the bent portion 3s2 of the right side plate 3s. The body-side contact surfaces 1fb and 1fc are formed by riveting sheet metal to the upper surface of the frame 1f.

<Storage of Transport Mechanism Section 2>
FIG. 7 shows a front view of essential parts in a state in which the transport mechanism section 2 is positioned and housed in the device main body 1H of the sample testing device 1.
An outline of housing the transport mechanism section 2 having the above-described structure in the apparatus main body 1H will be described.
For example, the operator inserts the removed transport mechanism 2 into the opening 3s1 on the right side of the apparatus main body 1H, as indicated by an arrow α12 in FIGS. As a result, the transport mechanism 2 descends as the casters 4a and 4b of the transport mechanism 2 roll on the entrance/exit slope 6b of the caster guide 6, as indicated by an arrow α13 in FIG. When the casters 4a and 4b of the transport mechanism 2 reach the horizontal guide 6c of the caster guide 6, the positioning pin guide 5 fixed to the lower surface of the transport mechanism 2 moves to the first positioning pin 7 erected on the frame 1f. Or it engages with the second positioning pin 8 . As a result, the transport mechanism section 2 is positioned at a predetermined position within the device main body 1H of the sample testing device 1 .
At this time, the dimension s1 from the ground contact surfaces 2t1, 2t2, and 2t3 (see FIG. 2) of the transport mechanism 2 to the lower ends of the casters 4a and 4b is adjusted from the main body side contact surfaces 1fa, 1fb, and 1fc of the frame 1f to the caster guide 6. By making the distance s2 shorter than the dimension s2 to the horizontal guide 6c (s1<s2), the contact surfaces 2t1, 2t2, and 2t3 of the bottom surface 2t of the transport mechanism section 2 and the body-side contact surfaces 1fa, 1fb, and 1fc of the upper surface 1f3 of the frame 1f. can meet with In other words, the transport mechanism section 2 can be set at a predetermined height within the sample testing apparatus 1 .

<Various Transport Mechanisms 2>
FIG. 8A shows a 5-rack 11a on which 5 test tubes containing samples are placed, and FIG. 8B shows a transport mechanism section 2A for transporting the 5-rack 11a.

FIG. 9A shows a 10-rack 11b on which 10 test tubes containing samples are placed, and FIG. 9B shows a transport mechanism section 2B that transports the 10-rack 11b.
The transport mechanism section 2 includes various types of transport mechanism sections 2 .
For example, there is a transport mechanism section 2A (see FIG. 8B) for transporting the five racks 11a on which the five test tubes 10 containing samples shown in FIG. 8A are placed.
There is also a transport mechanism section 2B (see FIG. 9B) for transporting the ten racks 11b on which the ten test tubes 10 containing samples shown in FIG. 9A are placed. The transport mechanism portion 2A for the 5-rack 11a and the transport mechanism portion 2B for the 10-rack 11b have different outer shapes. big. For example, the lateral dimension of the transport mechanism section 2A for the 5-rack 11a shown in FIG. 10A is approximately 674 mm, and the lateral dimension of the transport mechanism section 2B for the 10-rack 11b shown in FIG. 10B is approximately 599 mm.

Therefore, an attempt was made to position the transport mechanism unit 2A for the 5-rack 11a and the transport mechanism unit 2B for the 10-rack 11b having different outer shapes in the sample testing apparatus 1 with one positioning pin (7 or 8). In this case, the transport mechanism section 2A for the 5-rack 11a having a large outer shape may protrude outside the sample testing apparatus 1. FIG.
Therefore, the first positioning pin 7 of the transport mechanism section 2A for the 5-rack 11a is arranged at the back so that the transport mechanism section 2A can be completely accommodated inside the sample testing apparatus 1 (see FIG. 10A).

FIG. 10A shows a cross-sectional top view of the state in which the transport mechanism section 2A for the five-rack 11a is accommodated inside the sample testing apparatus 1. As shown in FIG.
FIG. 10B shows a cross-sectional top view of a state in which the transport mechanism section 2B for the 10-rack 11b is housed inside the sample testing apparatus 1. As shown in FIG.

As shown in FIG. 4, the second positioning pin 8 for the 10-rack transport mechanism 2B is located on the front side (right side) of the first positioning pin 7. As shown in FIG. On the other hand, since the transport mechanism section 2B for the 10-rack 11b is smaller than the transport mechanism section 2A for the 5-rack 11a, it can be completely accommodated inside the sample testing apparatus 1 without protruding outside (Fig. 10B).

FIG. 11 shows a schematic diagram of an example in which a plurality of transport mechanism units 2A and 2B are used in the sample testing apparatus 1 of the embodiment.
With the configuration of the sample testing apparatus 1 described above, as shown in FIG. Transport mechanism units 2 of different types can be used.
In other words, by sharing the housing 3 of the sample testing apparatus 1 shown in FIG. 1A, it is possible to support various racks such as the 5-line rack 11a and the 10-line rack 11b.

Further, as described above, by making the transfer mechanism parts 2A and 2B of the 5-rack and 10-rack substantially the same shape, the same positioning pins (7, 8) can be used for positioning.
Therefore, the housing 3 other than the transport mechanism section 2 can be shared, and the effect of mass production is great. In addition, design man-hours can be reduced.

<Putting/unloading transport mechanism unit 2 with respect to sample testing apparatus 1>
In order to take out the transport mechanism part 2 from the sample testing apparatus 1 shown in FIG. 1A for maintenance of the transport mechanism part 2, the operator holds the upper base plate 2m of the transport mechanism part 2 and moves the arrow α11 in FIG. 1B. 2, the transport mechanism section 2 is pulled out from the opening 3s1 on the right side surface of the housing 3 of the sample testing apparatus 1. As shown in FIG.
Next, the process of housing the transport mechanism section 2 in the sample testing apparatus 1 will be described by taking the transport mechanism section 2A for the 5-rack 11a as an example.

After maintenance, in order to store the removed transport mechanism section 2 inside the sample testing apparatus 1, the left portion 2h of the transport mechanism section 2 is moved from the housing 3 of the sample testing apparatus 1 as indicated by the arrow α12 in FIG. 1B. It is inserted into the opening 3s1 on the right side.

FIG. 12 shows a schematic front view of a state where the transport mechanism section 2A for the 5-rack 11a begins to enter from the opening 3s1 on the right side of the sample testing apparatus 1. As shown in FIG. FIG. 13 shows a schematic left front top arrow view of a state where the transport mechanism section 2A for the five-rack 11a begins to enter from the opening 3s1 on the right side surface of the sample testing apparatus 1. As shown in FIG.
Then, the casters 4a and 4b of the transport mechanism section 2A roll on the frame 1f inside the sample testing apparatus 1 (arrow β11 in FIG. 12), and the transport mechanism section 2A advances into the sample testing apparatus 1 ( Arrow α12 in FIGS. 12 and 13).

FIG. 14 shows a schematic front view of the transport mechanism section 2A inserted through the opening 3s1 on the right side of the sample testing apparatus 1. As shown in FIG.
As the conveying mechanism 2A advances, the casters 4a and 4b are housed in the caster guides 6 of the apparatus main body 1H, as shown in FIG.

FIG. 15 shows a schematic perspective view of the surroundings of the positioning pin guide 5 in the rear portion of the transport mechanism section 2A inserted through the opening 3s1 of the sample testing apparatus 1, as seen obliquely from the left front upper side.
Then, the positioning pin guide 5 (see FIG. 2) at the rear lower portion of the transport mechanism section 2 is fitted with the positioning pin 7 (see FIG. 4) on the frame 1f inside the sample testing apparatus 1 (arrow α13 in FIG. 15). .

FIG. 16 is a schematic diagram showing a state in which the U-shaped notch portion 5b1 of the positioning pin guide 5 of the transport mechanism portion 2A placed in the sample testing apparatus 1 is in contact with the positioning pin 7 on the frame 1f, viewed obliquely from the front left upper side. Fig. 3 shows a perspective enlarged view;

In FIG. 17, the transportation mechanism 2A placed in the sample testing apparatus 1 is obliquely forward left in a state where the U-shaped notch 5b1 of the positioning pin guide 5 of the transportation mechanism 2A is in contact with the positioning pin 7 on the frame 1f. Fig. 2 shows a schematic perspective enlarged view from above;

As shown in FIGS. 16 and 17, the U-shaped cutout portion 5b1 (see FIG. 3B) of the positioning pin guide 5 (see FIG. 2) at the rear lower portion of the transport mechanism portion 2A is aligned with the sample testing apparatus 1 shown in FIG. abuts on the positioning pin 7 on the frame 1f inside the .
As a result, the transport mechanism section 2A is positioned at the predetermined position of the sample testing apparatus 1. As shown in FIG.
According to the configuration of the sample testing apparatus 1 described above, the transport mechanism section 2 can be taken in and out from the opening 3s1 on the side surface of the housing 3 of the exterior of the sample testing apparatus 1. FIG.

Since the transport mechanism section 2 can be drawn out of the apparatus main body 1H, the visibility of the transport mechanism section 2 or accessibility to the transport mechanism section 2 is improved. Therefore, the maintainability of the transport mechanism section 2 is improved. Therefore, working time can be shortened.
Since the transport mechanism section 2 can be pulled out, the transport mechanism section 2 may be prepared in advance as maintenance stock and replaced with the one to be maintained.
Further, positioning accuracy can be improved by using the positioning pins (7, 8) and the positioning pin guide 5 (see FIG. 2). Therefore, the position reproducibility is high when the transport mechanism section 2 is remounted.
Therefore, by minimizing the positional deviation before the transport mechanism 2 is pulled out and when the transport mechanism 2 is remounted, the time required for re-registering the position coordinates for gripping the test tube 10 with the manipulator is reduced. can.

<<Modification>>
FIG. 18 shows a perspective view of a sample testing apparatus 21 of a modified example.
FIG. 19A shows a state in which the slide rails 23 used in the transport mechanism section 22 of the modified example are extended. FIG. 19B shows a state in which the slide rails 23 used in the transport mechanism section 22 of the modified example are contracted.

FIG. 20A shows the LM guide 24 used in the transport mechanism section 25 of the modified example.
FIG. 20B shows a perspective view of a specimen testing apparatus 21A of another example of a modification.
In sample testing apparatuses 21 and 21A of modified examples shown in FIGS. 18 and 20B, transport mechanism units 22 and 25 can be moved in and out of apparatus main bodies 21H and 21H1 by means of slide rails 23 and LM guides 24, respectively.

As shown in FIG. 18, the sample testing apparatus 21 of the modification includes an apparatus main body 21H and a transport mechanism section 22. As shown in FIG.
The slide rail 23 shown in FIGS. 19A and 19B has an outer rail 23a, a first inner rail 23b and a second inner rail 23c. The outer rail 23a, the first inner rail 23b, and the second inner rail 23c move relative to each other in the extending direction via rollers or balls and retainers to expand and contract.
As shown in FIG. 18, an outer rail 23a is attached to the frame 21f of the apparatus main body 21H. A second inner rail 23 c is attached to the lower surface of the transport mechanism section 22 .

By extending and retracting the slide rail 23 as shown in FIGS. 19A and 19B, the transfer mechanism section 22 can be moved in and out of the apparatus main body 21H via the slide rail 23. FIG.

An LM guide (Linear Motion Guide) 24 shown in FIG. 20A has a rail 24a and a block 24b. The rails 24a and blocks 24b move relative to each other in the extending direction of the rails 25a via balls and retainers.
A drawer plate 26 is slidably attached via an LM guide 24 to a frame 21f1 of an apparatus main body 21H1 of another example shown in FIG. 20B. A rail 24 a is attached to the drawer plate 26 . A block 24 b is attached to the lower surface of the transport mechanism section 25 .
With this configuration, the transport mechanism section 25 can be moved in and out of the apparatus main body 21H1 via the drawer plate 26 and the LM guide 24. As shown in FIG.

Even in the case of the modified example, the same effects as those of the embodiment can be obtained.
Also in the modified example, it is preferable to set the height of the transport mechanism units 22 and 25 in the sample testing apparatuses 21 and 21A to a predetermined height.

<<other embodiments>>
1. The present invention is not limited to the configurations of the above-described embodiments and modifications, and various modifications and specific forms are possible within the scope of the attached claims.

1, 21 Sample testing device 1f frame (mechanism mounting part)
1H device body 11a 5 rack (rack)
11b 10 rack (rack)
2, 2A, 2B transport mechanism part 4a, 4b caster (moving means)
5 Positioning pin guide (positioning guide)
6 caster guide (guide means)
6c Horizontal guide (caster holder)
7, 8 positioning pins 23 slide rails 23a, 24a outer rails (guide means) 23b, 24b inner rails (moving means) on the lower surface of the transport mechanism 22
25 LM guide 25a rail (guide means)
25b block (means of transportation)

Claims (7)

a transport mechanism unit on which the specimen is mounted;
a device main body in which the transport mechanism is accommodated,
A sample testing apparatus, wherein the transport mechanism section is configured to be removable from the apparatus main body. In the specimen testing apparatus according to claim 1,
the mechanism mounting portion of the apparatus main body has guide means,
The specimen testing apparatus, wherein the transport mechanism section has a moving means guided by the guide means. In the specimen testing apparatus according to claim 1,
The mechanism mounting portion of the device main body has a caster guide,
The transport mechanism has casters guided by the caster guides,
The caster guide has a caster holding portion recessed downward,
The transport mechanism section
A sample testing apparatus, wherein the casters are positioned at a predetermined height when the casters are positioned in the caster holding section. In the specimen testing apparatus according to claim 1,
The mechanism mounting portion of the device main body has a positioning pin,
The specimen testing apparatus, wherein the transport mechanism section has a positioning guide that is positioned by the positioning pin. In the specimen testing apparatus according to claim 1,
A sample testing apparatus, wherein a plurality of different transport mechanism units are used for the apparatus main body. In the specimen testing apparatus according to claim 1,
A plurality of different transport mechanism units are used for the apparatus main body,
the mechanism mounting portion of the device main body has a positioning pin for positioning the transport mechanism portion at a predetermined position of the device main body;
each of the plurality of different transport mechanism units has a positioning guide positioned by the positioning pin;
A sample testing apparatus, wherein the plurality of different transport mechanism units are positioned by one positioning pin using respective positioning guides. In the specimen testing apparatus according to claim 1,
Equipped with a slide rail or LM guide,
A specimen testing apparatus, wherein the transport mechanism section is configured to be able to be taken in and out of the apparatus main body using the slide rail or the LM guide.

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