JP2023060520A - Base board outline detecting device and base board conveying apparatus using the same - Google Patents

Abstract

To accurately detect an outline of a base board.SOLUTION: A base board outline detecting device 10 comprises: an adsorption head 3 provided with an adsorption pad 2 for adsorbing a base board 1; a wavelength conversion sheet 4 for converting light having a specific wavelength into light having a wavelength other than the specific one that is provided on a surface, facing the base board, of the adsorption head; illumination devices 5 radiating the light having the specific wavelength; a lens filter 6 transmitting only the light having the other wavelength reflected by the wavelength conversion sheet; an imaging device 7 imaging the light transmitted through the lens filter; and an image processing device 8 that subjects an image taken by the imaging device to image processing to detect an outline of the base board.SELECTED DRAWING: Figure 1

Description

TECHNICAL FIELD The present invention relates to a substrate contour detecting device for detecting the contour of a board such as a printed wiring board having a plated portion on its surface, and a board conveying apparatus using the same.

For example, when the back surface of a board such as a printed wiring board having a plated portion on the surface is held by suction with a suction head of a robot, and the board is transported and inserted into a predetermined position on a tray, the position of the board and the tray may vary. It is common to use image processing in combination. Therefore, it is necessary to accurately detect the outer shape of the substrate.

FIG. 5 is a diagram for explaining an example of a conventional board outline detection method. In the example shown in FIG. 5, 51 is a substrate to be transported, 52 is a suction head of a robot, 53 is a suction pad provided on the suction head 52 for suctioning the substrate 51, and 54-1 and 54-2 are substrates 51. 55 is a camera for capturing an image of the outer shape of the substrate 51; and 56 is an image processing device for processing the image captured by the camera 55. FIG.

In the example shown in FIG. 5, if the suction head 52 is provided with an illumination device and the backlight of the substrate 51 can be used, the outer shape of the substrate 51 can be accurately detected. However, it is difficult to provide the suction head 52 with a lighting device. Therefore, as shown in FIG. 5, the light emitted from the illumination devices 54-1 and 54-2 is reflected by the surface 51a of the substrate 51, the reflected light is captured by the camera 55, and the captured image is subjected to image processing. Image processing is performed by a device 56 to detect the outer shape of the substrate 51 (see, for example, Patent Document 1).

Japanese Patent Application Laid-Open No. 2001-358500

In the example shown in FIG. 5, if the surface of the substrate 51 has a plated portion or the like on the surface of the substrate 51, the image obtained by the camera 55 is unstable and the reflected light from the plated portion is unstable. Therefore, as shown in FIG. 6, halation exists in the plated portion of the image. As a result, when the image in which the halation exists is image-processed and binarized, as shown in FIG. 7, there is a problem that the outer shape (rectangle) of the substrate cannot be detected correctly.

A substrate outline detection apparatus according to the present invention includes a suction head having a suction pad for suctioning a substrate, and a surface of the suction head facing the substrate, which converts light of a specific wavelength into light of another wavelength. a wavelength conversion sheet for conversion, a lighting device for irradiating light of the specific wavelength, a lens filter for transmitting only the light of the other wavelength reflected by the wavelength conversion sheet, and a lens filter transmitted through the An imaging device that captures light, and an image processing device that processes an image captured by the imaging device and detects the outer shape of the substrate.

Further, a substrate transfer apparatus according to the present invention is a substrate transfer apparatus using the substrate outer shape detection device described above, wherein the substrate is held by the suction head based on the outer shape of the substrate detected by the substrate outer shape detection device. The substrate is transported and inserted into a predetermined position of the tray.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a diagram for explaining the configuration of a circuit board outline detection device according to an embodiment of the present invention; FIG. 4 is a diagram for explaining an example of an image incident on a lens filter in the board outline detection apparatus of the present invention; FIG. 4 is a diagram for explaining an example of a captured image captured by a camera in the circuit board outline detection apparatus of the present invention; It is a figure for demonstrating an example of the image which image-processed the captured image in the external shape detection apparatus of the board|substrate of this invention. FIG. 2 is a diagram for explaining the configuration of an example of a conventional circuit board outline detection device; FIG. 10 is a diagram for explaining an example of a captured image captured by a camera in a conventional circuit board outline detection device; FIG. 10 is a diagram for explaining an example of an image obtained by performing image processing on a captured image in a conventional board outline detection device;

FIG. 1 is a diagram for explaining the configuration of a board outline detection apparatus according to an embodiment of the present invention. In one embodiment shown in FIG. 1, a substrate outline detection device 10 includes a suction head 3 having a suction pad 2 for sucking a substrate 1, and a specific surface 3a provided on a surface 3a of the suction head 3 facing the substrate 1. A wavelength conversion sheet 4 for converting light of a wavelength into light of another wavelength, illumination devices 5-1 and 5-2 for irradiating light of a specific wavelength, and other wavelengths reflected by the wavelength conversion sheet 4. a lens filter 6 that transmits only the light of the lens, an imaging device 7 that captures the light transmitted through the lens filter 6, and an image processing device 8 that processes the image captured by the imaging device 7 and detects the outer shape of the substrate 1. and has.

In one embodiment of the present invention shown in FIG. 1, the substrate 1 is, for example, a printed wiring board in the final form before shipment, which is arranged at a predetermined position on a tray to be shipped. A suction head 3 having a suction pad 2 is provided, for example, at the tip of an arm of an industrial robot. The suction pad 2 is for holding the substrate 1 by suction, and for example, a vacuum suction pad can be used. A normal camera or the like can be used as the imaging device 7 . As the image processing device 8, a commercially available image processing device can be used.

In one embodiment shown in FIG. 1, the features of the substrate contour detection apparatus of the present invention are: a wavelength conversion sheet 4 for converting light of a specific wavelength into light of another wavelength; The point is that the lens filter 6 that transmits only the light of other wavelengths reflected by the illumination device 5 and the wavelength conversion sheet 4 is used. The use and principle of the wavelength conversion sheet 4, the illumination devices 5-1, 5-2 and the lens filter 6 are known in the prior art. However, there is no case of applying these principles to a circuit board outline detection device or the like.

In one embodiment shown in FIG. 1, the wavelength conversion sheet 4 has a function of converting incident light of a specific wavelength into light of another wavelength and emitting the light as reflected light. For example, a wavelength conversion sheet having a function of converting blue light (wavelength: 430-490 nm) into red light (wavelength: 640-770 nm) can be used. The illumination devices 5-1 and 5-2 emit light of specific wavelengths. For example, a blue LED bar illumination that emits blue light (wavelength: 430-490 nm) can be used. The lens filter 6 has a function of transmitting only the reflected light of other wavelengths reflected by the wavelength conversion sheet 4 . For example, a lens filter 6 that transmits only red wavelength light (wavelength: 640-770 nm) and cuts blue wavelength light (wavelength: 430-490 nm) can be used.

According to the board outline detection apparatus of the present invention configured as described above, when light of a specific wavelength is blue light and light of another wavelength converted by the wavelength conversion sheet 4 is red light, first, The wavelength conversion sheet 4 and the substrate 1 are irradiated with blue light B from the illumination devices 5-1 and 5-2. The blue light B incident on the wavelength conversion sheet 4 is reflected by the wavelength conversion sheet 4 , passes through the substrate 1 as red reflected light R, and enters the lens filter 6 . On the other hand, the blue light B incident on the substrate 1 is reflected by the substrate 1 and enters the lens filter 6 as blue reflected light B. FIG. As a result, as shown in FIG. 2, the light incident on the lens filter 6 is composed of blue light indicating the portion of the substrate 1 (wiring including the plated portion, etc.) and red light indicating the outer portion of the substrate 1. be done. Here, since the lens filter 6 transmits only red light, the image captured by the imaging device 7 after passing through the lens filter 6 is black as shown in FIG. , the outer portion of the substrate 1 becomes red. Even if there is a plated portion on the surface of the substrate 1, that portion will also be black. After that, for example, a 256-gradation digital image captured by the imaging device 7 is binarized by the image processing device 8 by determining a threshold value of the gradation (an intermediate value between black and red). Then, as shown in FIG. 4, the outer shape of the substrate 1 can be detected.

According to the substrate outline detection apparatus of the present invention, the outline of the substrate 1 can be detected only by the reflected light (backlight) from the back side of the substrate 1, so that the outline of the substrate 1 can be detected with high accuracy. It becomes possible.

A preferred embodiment of the board contour detection apparatus of the present invention is as follows. First, light of a particular wavelength may be blue light and light of other wavelengths may be red light. This is based on the configurations of the wavelength conversion sheet 4 and the lens filter 6 used in the actual device. Of course, the color of light of a specific wavelength and the color of light of other wavelengths after conversion are not limited to the above configuration, and the present invention can be achieved with different colors.

Also, the substrate may be a printed wiring board having a plated portion. This is because the conventional board contour detection device cannot accurately detect the contour of a printed wiring board having a plated portion, and the board contour detection device of the present invention can be effectively used.

Here, the following cases can be considered as examples of the influence on the reflected light due to the difference in the shape of the substrate:
1) Differences in color due to differences in the type of resist on the substrate surface;
2) halation due to the type of plating on the substrate surface (e.g., gold, nickel, copper, etc.);
3) When there are mounted parts on the board surface, reflected light due to the type and shape of the parts;
The present invention can deal with differences in surface conditions of all types of substrates that affect reflected light.

Furthermore, although the shape of the substrate is a quadrangle in the above-described embodiment, it is not limited to this. It can correspond to all possible shapes.

Furthermore, a plurality of lighting devices may be used, and the plurality of lighting devices may be arranged at equal intervals around the substrate. As shown in FIG. 1, equidistant spacing means 180° spacing around the substrate for two lighting devices 5-1 and 5-2, and 180° spacing around the substrate for three lighting devices. at 120° intervals around the substrate, and four lighting devices at 90° intervals around the substrate. This is because, in the board outline detection apparatus of the present invention, the light from the illumination device that irradiates the wavelength conversion sheet becomes more uniform, and the accuracy of outline detection can be further improved. As for the illumination devices, it is also effective to apply ring-shaped illumination instead of arranging a plurality of illumination devices at regular intervals as described above.

Furthermore, the lighting device may be a bar lighting. This makes the light from the lighting devices (in the case of a plurality of lighting devices, the light from each lighting device) irradiated to the wavelength conversion sheet more uniform in the substrate contour detection device of the present invention, thereby further improving the precision of contour detection. because it can

The substrate outline detection apparatus according to the present invention can be effectively applied when high-precision alignment (±0.03 mm as an example) is required for all objects to be transported by a suction jig. can.

Further, in the substrate transfer apparatus according to the present invention, the above-described substrate outer shape detection device is used, and the substrate held by the suction head is transferred to a predetermined position on the tray based on the outer shape of the substrate detected by the substrate outer shape detection device. to insert. In the substrate transfer apparatus according to the present invention, the substrate to be transferred can be transferred and inserted into the predetermined position of the tray in a state in which the outer shape of the substrate to be transferred is accurately determined, so that the substrate can be transferred with high accuracy. .

1 Substrate 2 Suction Pad 3 Suction Head 3a Surface 4 Wavelength Conversion Sheet 5-1, 5-2 Lighting Device 6 Lens Filter 7 Imaging Device 8 Image Processing Device 10 Substrate Outline Detecting Device

Claims (6)

a suction head provided with a suction pad for sucking the substrate;
a wavelength conversion sheet for converting light of a specific wavelength into light of another wavelength, provided on a surface of the suction head facing the substrate;
a lighting device that emits light of the specific wavelength;
a lens filter that transmits only the light of the other wavelength reflected by the wavelength conversion sheet;
an imaging device that captures light transmitted through the lens filter;
an image processing device that processes an image captured by the imaging device to detect the outer shape of the substrate;
A circuit board outline detection device comprising: 2. The substrate outline detection apparatus according to claim 1, wherein the light of the specific wavelength is blue light, and the light of the other wavelength is red light. 3. The substrate outline detection device according to claim 1, wherein the substrate is a printed wiring board having a plated portion. 4. The circuit board outline detection apparatus according to claim 1, wherein a plurality of said illumination devices are used, and the plurality of illumination devices are arranged around said substrate at equal intervals. 5. The board outline detection apparatus according to claim 1, wherein said illumination device is a bar illumination. A substrate transfer apparatus using the substrate outline detection apparatus according to any one of claims 1 to 5, wherein the substrate is held by the suction head based on the outline of the substrate detected by the substrate outline detection apparatus. A substrate transfer apparatus for transferring and inserting the substrate into a predetermined position of a tray.

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