JP2023041342A5

JP2023041342A5 -

Info

Publication number: JP2023041342A5
Application number: JP2021148660A
Authority: JP
Filing date: 2021-09-13
Publication date: 2023-10-27

Description

このように構成すれば、外部より強制ＯＮ指令が入力されることで、制御信号は半導体素子をＯＮにする制御信号となり、これに伴い素子異常検出部が半導体素子の駆動状態に関する異常を検出しても、無効化信号が入力されることで異常検出信号の出力が停止される。したがって、駆動信号出力部は、強制ＯＮ指令の入力に従って半導体素子をＯＮにする駆動信号の出力を継続することが可能になる。 With this configuration, when a forced ON command is input from the outside, the control signal becomes a control signal that turns on the semiconductor element, and accordingly, the element abnormality detection section detects an abnormality regarding the driving state of the semiconductor element. However, the output of the abnormality detection signal is stopped by inputting the invalidation signal. Therefore, the drive signal output section can continue to output the drive signal that turns on the semiconductor element in accordance with the input of the forced ON command.

Claims

a drive signal output section (8) that outputs a drive signal to the semiconductor element in accordance with a control signal that turns the semiconductor element ON/OFF;
an element abnormality detection unit (9, 9NA) that detects an abnormality regarding the driving state of the semiconductor element and outputs an element abnormality detection signal to the drive signal output unit;
and a disabling signal output section (7) that outputs a disabling signal for disabling detection of the abnormality to the element abnormality detecting section when a forced ON command is input from the outside,
The control signal becomes a control signal that turns on the semiconductor element when the forced ON command is input,
The drive signal output section stops outputting a drive signal that turns on the semiconductor element when the element abnormality detection signal is input,
The element abnormality detection section is a semiconductor element drive circuit that stops outputting the abnormality detection signal when the invalidation signal is input.

The semiconductor device drive circuit according to claim 1, further comprising a control signal output section (6, 6A) that outputs the control signal.

The element abnormality detection section also outputs an element abnormality detection signal to the control signal output section,
3. The drive circuit for a semiconductor device according to claim 1 , wherein the control signal output section stops outputting a control signal for turning on the semiconductor device when the device abnormality detection signal is input.

A circuit abnormality detection unit (22) that monitors the operation of peripheral circuits other than the element abnormality detection unit and outputs a circuit abnormality detection signal to the control signal output unit when an abnormality occurs in the operation,
The control signal output unit stops outputting a control signal for turning on the semiconductor element when the circuit abnormality detection signal is input,
The disabling signal output section also outputs the disabling signal to the circuit abnormality detecting section when a forced ON command is input from the outside,
4. The semiconductor device drive circuit according to claim 1, wherein the circuit abnormality detection section stops outputting the circuit abnormality detection signal when the invalidation signal is input.

a control signal output section (6B) that outputs a control signal to turn on/off the semiconductor element;
a drive signal output section (8B) that outputs a drive signal to the semiconductor element according to the control signal;
an element abnormality detection section (9B) that detects an abnormality regarding the driving state of the semiconductor element and outputs an element abnormality detection signal to the control signal output section and the drive signal output section;
and a disabling signal output section (7) that outputs a disabling signal for disabling detection of the abnormality to the control signal output section when a forced ON command is input from the outside,
The drive signal output section stops outputting a drive signal that turns on the semiconductor element when the element abnormality detection signal is input,
When the invalidation signal is input, the element abnormality detection section stops outputting the abnormality detection signal to the drive signal output section,
The control signal output section includes:
When the element abnormality detection signal is input, stopping output of a control signal to turn on the semiconductor element on the condition that the forced ON command is not input;
A drive circuit for a semiconductor device that outputs a control signal to turn on the device when the device abnormality detection signal is input during a period when the forced ON command is input.

The disabling signal input to the circuit abnormality detection section (9NA) is configured to be also input to the control signal output section (6A) via the circuit abnormality detection section,
The control signal output unit outputs the control signal when the disabling signal is input while the forced ON command is not input while outputting the control signal to turn on the semiconductor element. 6. The drive circuit for a semiconductor device according to claim 1, wherein the drive circuit for a semiconductor device stops the operation.

a control signal output section (6) that outputs a control signal to turn on/off the semiconductor element;
an element abnormality detection section (9) that detects an abnormality regarding the driving state of the semiconductor element and outputs an element abnormality detection signal to the control signal output section;
The control signal output unit stops outputting a control signal for turning on the semiconductor element when the element abnormality detection signal is input,
The device further includes a forced ON signal output unit (34) that outputs a forced ON signal that turns on the semiconductor element when a forced ON command is input from the outside, regardless of the output state of the control signal by the control signal output unit. Semiconductor device drive circuit.