JP2022551699A - 光導電体読み出し回路 - Google Patents
光導電体読み出し回路 Download PDFInfo
- Publication number
- JP2022551699A JP2022551699A JP2022521655A JP2022521655A JP2022551699A JP 2022551699 A JP2022551699 A JP 2022551699A JP 2022521655 A JP2022521655 A JP 2022521655A JP 2022521655 A JP2022521655 A JP 2022521655A JP 2022551699 A JP2022551699 A JP 2022551699A
- Authority
- JP
- Japan
- Prior art keywords
- photoconductor
- dark
- circuit
- voltage
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000005286 illumination Methods 0.000 claims abstract description 46
- 230000001419 dependent effect Effects 0.000 claims abstract description 7
- 239000003990 capacitor Substances 0.000 claims description 72
- 238000011156 evaluation Methods 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 9
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 claims description 8
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims description 8
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 claims description 8
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical compound [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 claims description 8
- 229910052980 cadmium sulfide Inorganic materials 0.000 claims description 8
- 238000001914 filtration Methods 0.000 claims description 6
- AQCDIIAORKRFCD-UHFFFAOYSA-N cadmium selenide Chemical compound [Cd]=[Se] AQCDIIAORKRFCD-UHFFFAOYSA-N 0.000 claims description 4
- MCMSPRNYOJJPIZ-UHFFFAOYSA-N cadmium;mercury;tellurium Chemical compound [Cd]=[Te]=[Hg] MCMSPRNYOJJPIZ-UHFFFAOYSA-N 0.000 claims description 4
- GGYFMLJDMAMTAB-UHFFFAOYSA-N selanylidenelead Chemical compound [Pb]=[Se] GGYFMLJDMAMTAB-UHFFFAOYSA-N 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 3
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 claims description 2
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 claims 2
- 229910000673 Indium arsenide Inorganic materials 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000000463 material Substances 0.000 description 17
- 230000003595 spectral effect Effects 0.000 description 13
- 230000003287 optical effect Effects 0.000 description 12
- 230000005855 radiation Effects 0.000 description 9
- 230000004044 response Effects 0.000 description 9
- 238000005259 measurement Methods 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 230000003321 amplification Effects 0.000 description 5
- 230000010354 integration Effects 0.000 description 5
- 238000003199 nucleic acid amplification method Methods 0.000 description 5
- 238000007599 discharging Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000005670 electromagnetic radiation Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 229910052981 lead sulfide Inorganic materials 0.000 description 3
- 229940056932 lead sulfide Drugs 0.000 description 3
- 230000001052 transient effect Effects 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000013480 data collection Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 239000011344 liquid material Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 229910052754 neon Inorganic materials 0.000 description 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000007781 pre-processing Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000011343 solid material Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- XCAUINMIESBTBL-UHFFFAOYSA-N lead(ii) sulfide Chemical compound [Pb]=S XCAUINMIESBTBL-UHFFFAOYSA-N 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J1/46—Electric circuits using a capacitor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/4453—PMT
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Light Receiving Elements (AREA)
- Amplifiers (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP19202133.5 | 2019-10-09 | ||
| EP19202133 | 2019-10-09 | ||
| PCT/EP2020/078213 WO2021069547A1 (en) | 2019-10-09 | 2020-10-08 | Photoconductor readout circuit |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022551699A true JP2022551699A (ja) | 2022-12-13 |
| JPWO2021069547A5 JPWO2021069547A5 (https=) | 2023-10-16 |
| JP2022551699A5 JP2022551699A5 (https=) | 2023-10-16 |
Family
ID=68242418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022521655A Withdrawn JP2022551699A (ja) | 2019-10-09 | 2020-10-08 | 光導電体読み出し回路 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11754443B2 (https=) |
| EP (1) | EP4042117A1 (https=) |
| JP (1) | JP2022551699A (https=) |
| KR (1) | KR20220075421A (https=) |
| CN (1) | CN114556060A (https=) |
| WO (1) | WO2021069547A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11747197B2 (en) * | 2021-09-15 | 2023-09-05 | Endress+Hauser Conducta, Inc. | Photometer and method of performing photometric measurements with a photometer |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1042608A (en) * | 1962-07-26 | 1966-09-14 | Bosch Gmbh Robert | Improvements in lighting sets |
| US3510834A (en) * | 1966-12-27 | 1970-05-05 | Systems Technology Inc | Optical landing system |
| US3495515A (en) * | 1967-04-28 | 1970-02-17 | Pentacon Dresden Veb | Photoelectric measuring devices |
| DD229160B1 (de) * | 1984-04-16 | 1989-11-29 | Adw Ddr | Schaltungsanordnung zum betreiben von gleichstromplasmatronzerstaeubungsvorrichtungen |
| DE3606488A1 (de) * | 1986-02-28 | 1987-09-03 | Philips Patentverwaltung | Verfahren zur ermittlung von messdaten ueber eine optische uebertragungsstrecke mittels eines optischen sensors |
| US5410145A (en) * | 1994-02-25 | 1995-04-25 | Coroy; Trenton G. | Light detector using reverse biased photodiodes with dark current compensation |
| US6310346B1 (en) * | 1997-05-30 | 2001-10-30 | University Of Central Florida | Wavelength-tunable coupled antenna uncooled infrared (IR) sensor |
| EP3029485B1 (en) | 2011-02-15 | 2019-12-11 | Basf Se | Detector for optically detecting at least one object |
| US9389315B2 (en) | 2012-12-19 | 2016-07-12 | Basf Se | Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region |
| JP5944864B2 (ja) * | 2013-06-10 | 2016-07-05 | 日本電信電話株式会社 | アレイセンサ回路 |
| JP6841769B2 (ja) | 2015-01-30 | 2021-03-10 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも１個の物体を光学的に検出する検出器 |
-
2020
- 2020-10-08 JP JP2022521655A patent/JP2022551699A/ja not_active Withdrawn
- 2020-10-08 CN CN202080071598.7A patent/CN114556060A/zh active Pending
- 2020-10-08 KR KR1020227015263A patent/KR20220075421A/ko not_active Withdrawn
- 2020-10-08 US US17/754,457 patent/US11754443B2/en active Active
- 2020-10-08 WO PCT/EP2020/078213 patent/WO2021069547A1/en not_active Ceased
- 2020-10-08 EP EP20801159.3A patent/EP4042117A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| EP4042117A1 (en) | 2022-08-17 |
| KR20220075421A (ko) | 2022-06-08 |
| CN114556060A (zh) | 2022-05-27 |
| US20220397454A1 (en) | 2022-12-15 |
| US11754443B2 (en) | 2023-09-12 |
| WO2021069547A1 (en) | 2021-04-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20231005 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231005 |
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| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20240805 |