JP2021177510A - Sample holding tool - Google Patents

Sample holding tool Download PDF

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JP2021177510A
JP2021177510A JP2020082026A JP2020082026A JP2021177510A JP 2021177510 A JP2021177510 A JP 2021177510A JP 2020082026 A JP2020082026 A JP 2020082026A JP 2020082026 A JP2020082026 A JP 2020082026A JP 2021177510 A JP2021177510 A JP 2021177510A
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metal plate
tubular member
hole
sample holding
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康平 又吉
Kohei Matayoshi
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Kyocera Corp
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Kyocera Corp
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Abstract

To improve the soaking property of a sample holding surface.SOLUTION: A sample holding tool 10 comprises: a ceramic substrate 1; a heat generating element 2 that is located in the ceramic substrate 1; a metal plate 3 that is opposite to the ceramic substrate 1 and located below the ceramic substrate 1 and has a through hole 31; a first fixing member 51 that fixes the ceramic substrate 1 and the metal plate 3; and a cylindrical member 4 that is located on an under surface of the metal plate 3 and connected with the through hole 31. The cylindrical member 4 has a first area 41 that extends downward from the through hole 31, a second area 42 that overlaps the through hole 31 when seen from the vertical direction of the sample holding surface 11, and a third area 43 that extends downward from the second area 42.SELECTED DRAWING: Figure 1

Description

本開示は、半導体ウェハーや液晶基板あるいは回路基板等のウェハー上に半導体薄膜を生成する、もしくは、前記ウェハー上に塗布されたレジスト液の乾燥および焼付を行い、レジスト膜を形成するために用いられるウェハー加熱装置などの試料保持具に関するものである。 The present disclosure is used for forming a resist film by forming a semiconductor thin film on a wafer such as a semiconductor wafer, a liquid crystal substrate, or a circuit board, or by drying and baking a resist liquid applied on the wafer. It relates to a sample holder such as a wafer heating device.

試料保持具として、例えば、特許文献1に記載の半導体ウェハー加熱装置が知られている。特許文献1に開示された半導体ウェハー加熱装置は、発熱抵抗体と、セラミック部材と、リフレクターとを備えている。セラミック部材は、ウェハー加熱面を有している。 As a sample holder, for example, the semiconductor wafer heating device described in Patent Document 1 is known. The semiconductor wafer heating device disclosed in Patent Document 1 includes a heat generating resistor, a ceramic member, and a reflector. The ceramic member has a wafer heating surface.

このような半導体ウェハー加熱装置において、発熱抵抗体が熱を発生する。この熱がセラミック部材に伝わり、ウェハー加熱面を加熱することができる。また、発熱抵抗体で発生した熱の一部は、ウェハー加熱面へと伝わらず、セラミック部材から輻射熱として外部へ放出されてしまう。リフレクターは、この輻射熱の一部を反射することができる。これにより、リフレクターが外部へ伝播される熱の一部を、セラミック部材に戻すことができる。その結果、ウェハー加熱面を効率的に加熱することができる。 In such a semiconductor wafer heating device, the heat generating resistor generates heat. This heat is transferred to the ceramic member, and the wafer heating surface can be heated. Further, a part of the heat generated by the heat generating resistor is not transferred to the wafer heating surface and is released to the outside as radiant heat from the ceramic member. The reflector can reflect a part of this radiant heat. As a result, a part of the heat transmitted to the outside by the reflector can be returned to the ceramic member. As a result, the wafer heating surface can be efficiently heated.

特開平6−53145JP-A-6-53145

このような半導体ウェハー加熱装置においては、半導体ウェハーを加熱する工程を繰り返し行う必要があった。半導体ウェハー加熱装置を繰り返し使用するときに、加熱後のウェハー加熱面の温度を一定にするために、ウェハー加熱面は加熱前に常温に戻す必要があった。ウェハー加熱面を常温に戻すための方法として、リフレクターに貫通孔を設け、貫通孔に冷却のための気体が流すことによって、セラミック部材を常温にまで冷却することが知られていた。 In such a semiconductor wafer heating device, it is necessary to repeat the step of heating the semiconductor wafer. When the semiconductor wafer heating device is repeatedly used, the wafer heating surface needs to be returned to room temperature before heating in order to keep the temperature of the wafer heating surface after heating constant. As a method for returning the wafer heating surface to room temperature, it has been known that a ceramic member is cooled to room temperature by providing a through hole in a reflector and allowing a cooling gas to flow through the through hole.

しかしながら、リフレクターのうち貫通孔が設けられた部位においては、発熱抵抗体からの輻射熱を反射することができなかった。これにより、ウェハー加熱面のうち貫通孔の上方に位置する領域は、ウェハー加熱面のうち貫通孔の上方に位置しない領域と比較して、ウェハー加熱面の温度を高めることが困難であった。その結果、ウェハー加熱面の均熱性を高めることが困難であった。 However, the radiant heat from the heat generation resistor could not be reflected at the portion of the reflector where the through hole was provided. As a result, it is difficult to raise the temperature of the wafer heating surface in the region of the wafer heating surface located above the through hole as compared with the region of the wafer heating surface not located above the through hole. As a result, it was difficult to improve the heat soaking property of the wafer heating surface.

本開示の試料保持具は、セラミック基板と、該セラミック基板に位置する発熱要素と、前記セラミック基板に対向して前記セラミック基板の下方に位置し、貫通孔を有する金属板と、前記セラミック基板と前記金属板とを固定する第1固定部材と、前記金属板の下面に位置し、前記貫通孔に繋がる筒状部材とを備えており、前記筒状部材は、前記貫通孔から下方に伸びる第1領域、試料保持面の垂直方向からみたときに前記貫通孔と重なる第2領域および該第2領域から下方に伸びる第3領域を有することを特徴とする。 The sample holder of the present disclosure includes a ceramic substrate, a heat generating element located on the ceramic substrate, a metal plate located below the ceramic substrate facing the ceramic substrate and having a through hole, and the ceramic substrate. A first fixing member for fixing the metal plate and a tubular member located on the lower surface of the metal plate and connected to the through hole are provided, and the tubular member extends downward from the through hole. It is characterized by having one region, a second region that overlaps the through hole when viewed from the vertical direction of the sample holding surface, and a third region that extends downward from the second region.

本開示の一形態の試料保持具によると、筒状部材は、貫通孔から下方に伸びる第1領域
、試料保持面の垂直方向からみたときに貫通孔と重なる第2領域および第2領域から下方に伸びる第3領域を有している。筒状部材が、貫通孔と重なる第2領域を有していることによって、発熱要素で発生した輻射熱のうち金属板で反射されずに貫通孔に入射した輻射熱を筒状部材の第2領域で反射できる。これにより、試料保持面のうち貫通孔の上方に位置する領域においても、温度を高めることができる。その結果、試料保持面の均熱性を高めることができる。
According to one embodiment of the sample holder of the present disclosure, the tubular member has a first region extending downward from the through hole, a second region overlapping the through hole when viewed from the vertical direction of the sample holding surface, and a lower portion from the second region. It has a third region that extends to. Since the tubular member has a second region that overlaps with the through hole, the radiant heat generated by the heat generating element that is not reflected by the metal plate and is incident on the through hole is transferred to the second region of the tubular member. Can be reflected. As a result, the temperature can be raised even in the region of the sample holding surface located above the through hole. As a result, the heat equalizing property of the sample holding surface can be improved.

試料保持具の一例を示す断面図である。It is sectional drawing which shows an example of the sample holder. 試料保持具の他の例の筒状部材近傍を示す拡大断面図である。It is an enlarged cross-sectional view which shows the vicinity of the cylindrical member of another example of a sample holder. 試料保持具の他の例の筒状部材近傍を示す拡大断面図である。It is an enlarged cross-sectional view which shows the vicinity of the cylindrical member of another example of a sample holder. 試料保持具の他の例の筒状部材近傍を示す平面図である。It is a top view which shows the vicinity of the cylindrical member of another example of a sample holder. 試料保持具の他の例の筒状部材近傍を示す拡大断面図である。It is an enlarged cross-sectional view which shows the vicinity of the cylindrical member of another example of a sample holder. 試料保持具の他の例の筒状部材近傍を示す拡大断面図である。It is an enlarged cross-sectional view which shows the vicinity of the cylindrical member of another example of a sample holder. 試料保持具の他の例の筒状部材近傍を示す平面図である。It is a top view which shows the vicinity of the cylindrical member of another example of a sample holder.

試料保持具10について詳細に説明する。 The sample holder 10 will be described in detail.

図1は、試料保持具10の一例を示す断面図である。図1に示すように、試料保持具10は、発熱要素2を有するセラミック基板1と、セラミック基板1に対向してセラミック基板1の下面に位置し、貫通孔31を有する金属板3と、セラミック基板1と金属板3とを固定する第1固定部材51と、金属板3の下面に位置し、貫通孔31に繋がる筒状部材4とを備えている。 FIG. 1 is a cross-sectional view showing an example of the sample holder 10. As shown in FIG. 1, the sample holder 10 includes a ceramic substrate 1 having a heat generating element 2, a metal plate 3 located on the lower surface of the ceramic substrate 1 facing the ceramic substrate 1 and having a through hole 31, and a ceramic. It includes a first fixing member 51 for fixing the substrate 1 and the metal plate 3, and a tubular member 4 located on the lower surface of the metal plate 3 and connected to the through hole 31.

セラミック基板1は、試料を保持するための部材である。セラミック基板1の形状は、例えば主面が円形状の円板状である。セラミック基板1は、一方の主面が試料保持面11である。試料保持具10は、例えば、窒化アルミニウムまたはアルミナ等のセラミック材料からなる。 The ceramic substrate 1 is a member for holding a sample. The shape of the ceramic substrate 1 is, for example, a disk having a circular main surface. One of the main surfaces of the ceramic substrate 1 is the sample holding surface 11. The sample holder 10 is made of, for example, a ceramic material such as aluminum nitride or alumina.

セラミック基板1は、例えば複数のグリーンシートを積層して、これを窒素雰囲気中で焼成することによって得ることができる。セラミック基板1の内部には、必要に応じて、静電吸着用電極が設けられていてもよい。セラミック基板1の寸法は、例えば形状が円板状のときは、主面の直径を200〜400mm程度に、厚みを1〜7mm程度にすることができる。 The ceramic substrate 1 can be obtained, for example, by laminating a plurality of green sheets and firing them in a nitrogen atmosphere. If necessary, an electrostatic adsorption electrode may be provided inside the ceramic substrate 1. For example, when the shape of the ceramic substrate 1 is a disk shape, the diameter of the main surface can be about 200 to 400 mm and the thickness can be about 1 to 7 mm.

発熱要素2は、電流が流れることによって発熱する部材である。発熱要素2は、試料保持面11に保持された試料を加熱するために設けられている。発熱要素2は、セラミック基板1の内部または下面に設けられている。発熱要素2は、複数の折返し部を有する線状のパターンを有している。これにより、発熱要素2は試料保持面11を均等に加熱することができる。 The heat generating element 2 is a member that generates heat when an electric current flows. The heat generating element 2 is provided to heat the sample held on the sample holding surface 11. The heat generating element 2 is provided inside or on the lower surface of the ceramic substrate 1. The heat generating element 2 has a linear pattern having a plurality of folded portions. As a result, the heat generating element 2 can uniformly heat the sample holding surface 11.

発熱要素2は、例えば、金属材料を有している。発熱要素2として用いられる金属材料としては、例えば、金、銀、パラジウムまたは白金等が挙げられる。発熱要素2は、例えば二酸化珪素等の酸化物等のガラス成分を含んでいてもよい。発熱要素2の寸法は、例えば幅を1〜10mmに、厚みを0.01〜0.1mmに、長さを300〜5000mmにすることができる。 The heat generating element 2 has, for example, a metal material. Examples of the metal material used as the heat generating element 2 include gold, silver, palladium, platinum and the like. The heat generating element 2 may contain a glass component such as an oxide such as silicon dioxide. The dimensions of the heat generating element 2 can be, for example, a width of 1 to 10 mm, a thickness of 0.01 to 0.1 mm, and a length of 300 to 5000 mm.

金属板3は、発熱要素2の輻射熱を反射するための部材である。金属板3は、例えば円板状または角板状の部材である。金属板3は、上面と下面とを有している。金属板3は、
セラミック基板1よりも下側においてセラミック基板1から離れて位置している。また、金属板3は、セラミック基板1の下面に対して上面が向かい合うように設けられている。金属板3は、例えば、セラミック基板1に対して平行に設けられていてもよい。金属板3は、例えば、ステンレス、アルミニウムまたは鉄等の部材を有している。金属板3の寸法は、例えば金属板3が円板状のときは、直径を200〜400mmに、厚みを1〜3mmにすることができる。金属板3の下面とセラミック基板1の下面との間隔は、例えば1〜10mmにすることができる。金属板3を有することにより、セラミック基板1外部への輻射熱を反射することができる。そのため、セラミック基板1外部へ熱が逃げるおそれを低減でき、試料保持面11を効率的に加熱することができる。
The metal plate 3 is a member for reflecting the radiant heat of the heat generating element 2. The metal plate 3 is, for example, a disk-shaped or square plate-shaped member. The metal plate 3 has an upper surface and a lower surface. The metal plate 3 is
It is located below the ceramic substrate 1 and away from the ceramic substrate 1. Further, the metal plate 3 is provided so that the upper surface faces the lower surface of the ceramic substrate 1. The metal plate 3 may be provided, for example, in parallel with the ceramic substrate 1. The metal plate 3 has a member such as stainless steel, aluminum, or iron. The dimensions of the metal plate 3 can be, for example, when the metal plate 3 has a disk shape, the diameter can be 200 to 400 mm and the thickness can be 1 to 3 mm. The distance between the lower surface of the metal plate 3 and the lower surface of the ceramic substrate 1 can be, for example, 1 to 10 mm. By having the metal plate 3, it is possible to reflect the radiant heat to the outside of the ceramic substrate 1. Therefore, the possibility that heat escapes to the outside of the ceramic substrate 1 can be reduced, and the sample holding surface 11 can be efficiently heated.

金属板3は、上面から下面にかけて貫通する貫通孔31を有している。試料保持面11の垂直方向からみたときに、貫通孔31の形状は、例えば円形状、三角形状または四角形状であってもよい。また、貫通孔31の数は、複数あってもよい。貫通孔31の形状が円形状の時の寸法は、例えば、直径10〜100mmにすることができる。また、貫通孔31の数が複数ある時の寸法は、例えば、直径10〜100mmにすることができる。貫通孔31を設けることにより、冷却のための気体が貫通孔31を通ることができる。これにより、冷却のための気体がセラミック基板1を冷却することができる。 The metal plate 3 has a through hole 31 penetrating from the upper surface to the lower surface. When viewed from the vertical direction of the sample holding surface 11, the shape of the through hole 31 may be, for example, a circular shape, a triangular shape, or a square shape. Further, the number of through holes 31 may be plural. When the shape of the through hole 31 is circular, the dimensions can be, for example, 10 to 100 mm in diameter. Further, when there are a plurality of through holes 31, the dimensions can be, for example, 10 to 100 mm in diameter. By providing the through hole 31, the gas for cooling can pass through the through hole 31. As a result, the cooling gas can cool the ceramic substrate 1.

図1に示すように、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の内壁面を通る線は直線上に伸びているが、これに限られない。具体的には、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の内壁面を通る線は曲線を有していてもよい。図1に示すように、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の外壁面を通る線は直線上に伸びているが、これに限られない。具体的には、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の外壁面を通る線は曲線を有していてもよい。なお、ここで内壁面とは、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の壁面のうち、金属板3の中心側の壁面を意味しており、外壁面とは、試料保持面11に垂直で金属板3を含む断面をみたときに、貫通孔31の壁面のうち、金属板3の外側の壁面を意味している。 As shown in FIG. 1, when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11, the line passing through the inner wall surface of the through hole 31 extends in a straight line, but the present invention is not limited to this. Specifically, when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11, the line passing through the inner wall surface of the through hole 31 may have a curved line. As shown in FIG. 1, when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11, the line passing through the outer wall surface of the through hole 31 extends in a straight line, but is not limited to this. Specifically, when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11, the line passing through the outer wall surface of the through hole 31 may have a curved line. Here, the inner wall surface means the wall surface on the center side of the metal plate 3 among the wall surfaces of the through hole 31 when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11. The wall surface means the outer wall surface of the metal plate 3 among the wall surfaces of the through hole 31 when the cross section including the metal plate 3 is viewed perpendicular to the sample holding surface 11.

第1固定部材51は、セラミック基板1と金属板3とを固定するための部材である。第1固定部材51は、例えば棒状の部材である。第1固定部材51は、例えば、セラミック基板1と金属板3との間に複数設けられている。第1固定部材51は、例えば金属板3の上面に対し垂直に設けられている。第1固定部材51は、一方の端部がセラミック基板1に固定されている。第1固定部材51は、他方の端部が金属板3に固定されている。 The first fixing member 51 is a member for fixing the ceramic substrate 1 and the metal plate 3. The first fixing member 51 is, for example, a rod-shaped member. A plurality of first fixing members 51 are provided, for example, between the ceramic substrate 1 and the metal plate 3. The first fixing member 51 is provided, for example, perpendicular to the upper surface of the metal plate 3. One end of the first fixing member 51 is fixed to the ceramic substrate 1. The other end of the first fixing member 51 is fixed to the metal plate 3.

第1固定部材51とセラミック基板1との固定には、例えば、接合材を用いることができる。接合材として用いられる材料としては、例えば、銀ろうまたは銀銅ろう等が挙げられる。第1固定部材51は、セラミック基板1にネジによって固定されていてもよい。第1固定部材51と金属板3との固定には、例えば、接合材を用いることができる。接合材として用いられる材料としては、例えば、銀ろうまたは銀銅ろう等が挙げられる。 For fixing the first fixing member 51 and the ceramic substrate 1, for example, a joining material can be used. Examples of the material used as the bonding material include silver wax and silver copper wax. The first fixing member 51 may be fixed to the ceramic substrate 1 with screws. For fixing the first fixing member 51 and the metal plate 3, for example, a joining material can be used. Examples of the material used as the bonding material include silver wax and silver copper wax.

第1固定部材51は、例えば、金属材料を有している。第1固定部材51として用いられる金属材料としては、例えば、ステンレス、アルミニウムまたは鉄等が挙げられる。第1固定部材51の寸法は、例えば、径を1〜10mmに、長さを1〜50mmにすることができる。第1固定部材51を設けることにより、セラミック基板1と金属板3とを固定することができる。 The first fixing member 51 has, for example, a metal material. Examples of the metal material used as the first fixing member 51 include stainless steel, aluminum, iron and the like. The dimensions of the first fixing member 51 can be, for example, a diameter of 1 to 10 mm and a length of 1 to 50 mm. By providing the first fixing member 51, the ceramic substrate 1 and the metal plate 3 can be fixed.

筒状部材4は、内部に冷却のための気体を通すための部材である。筒状部材4は、筒状の部材であって、内側が冷却のための気体を通すための流路を有している。筒状部材4は、金属板3の下面に設けられている。冷却のための気体としては、例えば、外気が挙げら
れる。
The tubular member 4 is a member for passing a cooling gas inside. The tubular member 4 is a cylindrical member, and the inside has a flow path for passing a gas for cooling. The tubular member 4 is provided on the lower surface of the metal plate 3. Examples of the gas for cooling include outside air.

筒状部材4は、貫通孔31から下方に伸びる第1領域41、試料保持面11の垂直方向からみたときに貫通孔31と重なる第2領域42および第2領域42から下方に伸びる第3領域43を有している。具体的には、第1領域41と第3領域43は共に筒状である。第1領域41は第3領域43よりも大きな内径を有している。第2領域42は、環状であって、第1領域41の下端と第3領域43の上端とを繋いでいる。第2領域42の外周と第1領域41の下端とが連続しており、第2領域42の内周と第3領域43の上端とが連続している。 The tubular member 4 has a first region 41 extending downward from the through hole 31, a second region 42 overlapping the through hole 31 when viewed from the vertical direction of the sample holding surface 11, and a third region extending downward from the second region 42. It has 43. Specifically, both the first region 41 and the third region 43 are cylindrical. The first region 41 has a larger inner diameter than the third region 43. The second region 42 is annular and connects the lower end of the first region 41 and the upper end of the third region 43. The outer circumference of the second region 42 and the lower end of the first region 41 are continuous, and the inner circumference of the second region 42 and the upper end of the third region 43 are continuous.

また、図1に示すように、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41の内周面を通る線は、直線状に伸びているが、これに限られない。具体的には、試料保持面11に垂直で、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41の内周面を通る線は、曲線を有してもよい。 Further, as shown in FIG. 1, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the first tubular member 4 is viewed. The line passing through the inner peripheral surface of the region 41 extends linearly, but is not limited to this. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the first region 41 of the cylindrical member 4 The line passing through the inner peripheral surface may have a curved line.

また、図1に示すように、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第2領域42の上面を通る線は、直線状に伸びているが、これに限られない。具体的には、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第2領域42の上面を通る線は、曲線を有してもよい。 Further, as shown in FIG. 1, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the second portion of the cylindrical member 4 is viewed. The line passing through the upper surface of the region 42 extends linearly, but is not limited to this. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the upper surface of the second region 42 of the cylindrical member 4 is viewed. The line passing through may have a curved line.

また、図1に示すように、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第3領域43の内周面を通る線は、直線状に伸びているが、これに限られない。具体的には、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第3領域43の内周面を通る線は、曲線を有してもよい。 Further, as shown in FIG. 1, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the third tubular member 4 is viewed. The line passing through the inner peripheral surface of the region 43 extends linearly, but is not limited to this. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the inside of the third region 43 of the cylindrical member 4 The line passing through the peripheral surface may have a curved line.

筒状部材4は、貫通孔31に繋がる。ここでいう「貫通孔31に繋がる」とは、冷却のための気体が流れる程度に空間的に連続していることを意味している。具体的には、金属板3の下面のうち貫通孔31の周囲に筒状部材4の端面が接していてもよい。また、金属板3の貫通孔31の内側に筒状部材4がはめ込まれていてもよい。また、金属板3の貫通孔31よりも下方向に冷却のための気体が筒状部材4以外に逃げない程度に隙間を空けて、筒状部材4が位置していてもよい。また、筒状部材4と金属板3との固定には、例えば、接合材を用いることができる。接合材として用いられる材料としては、例えば、銀ろうまたは銀銅ろう等が挙げられる。筒状部材4の材質は、例えば、ステンレス、アルミニウムまたは鉄等にすることができる。筒状部材4の第1領域41、第2領域42または第3領域43の材質は、全て同じでもよい。また、筒状部材4の第1領域41、第2領域42または第3領域43は、全て異なる材質を有していてもよい。 The tubular member 4 is connected to the through hole 31. The term "connected to the through hole 31" as used herein means that the gas for cooling is spatially continuous to the extent that the gas flows. Specifically, the end surface of the tubular member 4 may be in contact with the periphery of the through hole 31 on the lower surface of the metal plate 3. Further, the tubular member 4 may be fitted inside the through hole 31 of the metal plate 3. Further, the tubular member 4 may be located with a gap below the through hole 31 of the metal plate 3 so that the cooling gas does not escape to other than the tubular member 4. Further, for fixing the tubular member 4 and the metal plate 3, for example, a joining material can be used. Examples of the material used as the bonding material include silver wax and silver copper wax. The material of the tubular member 4 can be, for example, stainless steel, aluminum, iron, or the like. The materials of the first region 41, the second region 42, or the third region 43 of the tubular member 4 may all be the same. Further, the first region 41, the second region 42, or the third region 43 of the cylindrical member 4 may all have different materials.

本例においては、第1領域41の内径は30〜65mmに、外径は30〜70mmに、長さを1〜10mmにすることができる。第2領域42の内径は20〜60mm、外径は30〜65mmに、長さを0.5〜3mmにすることができる。第3領域43の内径は20〜60、外径は20〜60mmに、長さを10〜50mmにすることができる。 In this example, the inner diameter of the first region 41 can be 30 to 65 mm, the outer diameter can be 30 to 70 mm, and the length can be 1 to 10 mm. The inner diameter of the second region 42 can be 20 to 60 mm, the outer diameter can be 30 to 65 mm, and the length can be 0.5 to 3 mm. The inner diameter of the third region 43 can be 20 to 60, the outer diameter can be 20 to 60 mm, and the length can be 10 to 50 mm.

筒状部材4が、貫通孔31と重なる第2領域42を有していることによって、発熱要素2で発生した輻射熱のうち金属板3で反射されずに貫通孔31に入射した輻射熱を筒状部材4の第2領域42で反射できる。これにより、試料保持面11のうち貫通孔31の上方に位置する領域においても、温度を高めることができる。その結果、試料保持面11の均熱性を高めることができる。 Since the tubular member 4 has a second region 42 that overlaps with the through hole 31, the radiant heat generated by the heat generating element 2 that is not reflected by the metal plate 3 and is incident on the through hole 31 is cylindrical. It can be reflected in the second region 42 of the member 4. As a result, the temperature can be raised even in the region of the sample holding surface 11 located above the through hole 31. As a result, the heat equalizing property of the sample holding surface 11 can be improved.

また、図1に示すように、筒状部材4の第2領域42の外径は、貫通孔31の径より大きくてもよい。また、試料保持面11の垂直方向からみたときに、貫通孔31は、全体が第1領域41の内側に位置していてもいい。具体的には、試料保持面11に垂直で金属板3、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、貫通孔31の外壁面を通る線が筒状部材4の第1領域41よりも内側に位置していることを示す。これにより、金属板3で反射されずに貫通孔31に入射した輻射熱が筒状部材4で反射されずに、部材外に放出されるおそれを低減できる。その結果、試料保持面11の均熱性を高めることができる。 Further, as shown in FIG. 1, the outer diameter of the second region 42 of the tubular member 4 may be larger than the diameter of the through hole 31. Further, when viewed from the vertical direction of the sample holding surface 11, the through hole 31 may be entirely located inside the first region 41. Specifically, when looking at the cross section including the metal plate 3, the first region 41, the second region 42, and the third region 43 of the tubular member 4 perpendicular to the sample holding surface 11, the outer wall surface of the through hole 31 is seen. It indicates that the passing line is located inside the first region 41 of the tubular member 4. As a result, it is possible to reduce the possibility that the radiant heat that is not reflected by the metal plate 3 and is incident on the through hole 31 is not reflected by the tubular member 4 and is released to the outside of the member. As a result, the heat equalizing property of the sample holding surface 11 can be improved.

また、図1に示すように、筒状部材4の第1領域41の内周面は、貫通孔31の外壁面よりも外側にあってもよい。発熱要素2で発せられた熱が金属板3に伝わった際に、金属板3が熱膨張する場合がある。このとき、貫通孔31および貫通孔31の周囲と筒状部材4との位置関係にずれが生じるおそれがある。第1領域41の内周面が貫通孔31の外壁面よりも外側にあることによって、多少の位置関係のずれが金属板3および筒状部材4に生じても、貫通孔31の下方向に第2領域42を位置させ続けることができる。その結果、第2領域42による輻射熱の反射を良好に行うことができる。 Further, as shown in FIG. 1, the inner peripheral surface of the first region 41 of the cylindrical member 4 may be outside the outer wall surface of the through hole 31. When the heat generated by the heat generating element 2 is transferred to the metal plate 3, the metal plate 3 may thermally expand. At this time, the positional relationship between the through hole 31 and the periphery of the through hole 31 and the tubular member 4 may be displaced. Since the inner peripheral surface of the first region 41 is outside the outer wall surface of the through hole 31, even if a slight positional relationship shift occurs in the metal plate 3 and the tubular member 4, the through hole 31 is downward. The second region 42 can continue to be positioned. As a result, the reflection of radiant heat by the second region 42 can be satisfactorily performed.

また、試料保持面11の垂直方向からみたときに、貫通孔31は、全体が第2領域42に重なっていてもよい。これにより、貫通孔31と第2領域42とが部分的に重なっている場合と比較して、貫通孔31を通った輻射熱を第2領域42で反射することができる。その結果、より試料保持面11の均熱性を高めることができる。 Further, when viewed from the vertical direction of the sample holding surface 11, the through hole 31 may entirely overlap the second region 42. As a result, the radiant heat that has passed through the through hole 31 can be reflected in the second region 42 as compared with the case where the through hole 31 and the second region 42 partially overlap each other. As a result, the heat equalizing property of the sample holding surface 11 can be further improved.

また、図2に示すように、筒状部材4の第1領域41と第2領域42との間に、間隙を有していてもよい。これにより、筒状部材4の第1領域41および第2領域42に輻射熱が入射したときに、熱膨張の影響を受けて、筒状部材4の第1領域41および第2領域42に歪みが生じるおそれを低減できる。 Further, as shown in FIG. 2, a gap may be provided between the first region 41 and the second region 42 of the cylindrical member 4. As a result, when radiant heat is incident on the first region 41 and the second region 42 of the cylindrical member 4, the first region 41 and the second region 42 of the cylindrical member 4 are distorted due to the influence of thermal expansion. The risk of occurrence can be reduced.

また、図3に示すように、筒状部材4は、金属板3に接触する鍔部44を備えていてもよい。鍔部44は金属板3と筒状部材4との接合面積を増やすための部材である。鍔部44は、金属板3と筒状部材4の第1領域41の上端との間に位置している。 Further, as shown in FIG. 3, the tubular member 4 may include a flange portion 44 that comes into contact with the metal plate 3. The flange portion 44 is a member for increasing the joint area between the metal plate 3 and the tubular member 4. The flange portion 44 is located between the metal plate 3 and the upper end of the first region 41 of the tubular member 4.

鍔部44は、試料保持面11の垂直方向からみたときに、環状であってもよいが、これに限られない。具体的には、試料保持面11の垂直方向からみたときに、鍔部44の外周面は、例えば、楕円形状、三角形状や四角形状のような多角形状であってもよい。試料保持面11の垂直方向からみたときに、鍔部44が環状であれば、鍔部44は、一定の幅を有することができる。また、環状の鍔部44の幅は、筒状部材4の第2領域42の幅よりも小さくてもよい。 The collar portion 44 may be annular when viewed from the vertical direction of the sample holding surface 11, but is not limited to this. Specifically, when viewed from the vertical direction of the sample holding surface 11, the outer peripheral surface of the flange portion 44 may have a polygonal shape such as an elliptical shape, a triangular shape, or a quadrangular shape. If the collar portion 44 is annular when viewed from the vertical direction of the sample holding surface 11, the collar portion 44 can have a constant width. Further, the width of the annular flange portion 44 may be smaller than the width of the second region 42 of the tubular member 4.

鍔部44は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41に対して垂直方向に伸びることができるが、これに限られない。具体的には、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、鍔部44が金属板3から離れる方向に伸びていてもよい。また、具体的には、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、鍔部44が金属板3に近づく方向に伸びていてもよい。また、具体的には、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、鍔部44が曲線を有して伸びていてもよい。 The collar portion 44 has a cross section perpendicular to the sample holding surface 11 and includes the first region 41, the second region 42, and the third region 43 of the cylindrical member 4, with respect to the first region 41 of the cylindrical member 4. Can extend vertically, but is not limited to this. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 is viewed perpendicular to the sample holding surface 11, the flange portion 44 is in the direction away from the metal plate 3. It may be stretched. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 is viewed perpendicular to the sample holding surface 11, the collar portion 44 approaches the metal plate 3. It may extend in the direction. Specifically, when the cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 is viewed perpendicular to the sample holding surface 11, the collar portion 44 has a curved line. It may be stretched.

試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43
を含む断面をみたときに、筒状部材4の第1領域41に垂直方向に伸びる鍔部44の上面は、金属板3の下面と接していてもよい。また、図3で示す例では、鍔部44の上面は、平らな面であるが、凹凸の形状を有していてもよい。これにより、鍔部44の上面と金属板3との接触箇所の間に間隙を有していてもよい。
The first region 41, the second region 42, and the third region 43 of the cylindrical member 4 perpendicular to the sample holding surface 11
The upper surface of the flange portion 44 extending in the direction perpendicular to the first region 41 of the tubular member 4 may be in contact with the lower surface of the metal plate 3 when the cross section including the above is viewed. Further, in the example shown in FIG. 3, the upper surface of the collar portion 44 is a flat surface, but may have an uneven shape. As a result, a gap may be provided between the upper surface of the flange portion 44 and the contact portion between the metal plate 3 and the metal plate 3.

また、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41に垂直方向に伸びる鍔部44の下面では、筒状部材4の第1領域41の上端と接していてもよい。図3で示す例では、鍔部44の下面は、平らな面であるが、凹凸の形状を有していてもよい。これにより、鍔部44の下面と筒状部材4の第1領域41の上端との接触箇所の間に、間隙を有していてもよい。 Further, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the tubular member 4 extends in the direction perpendicular to the first region 41. The lower surface of the flange portion 44 may be in contact with the upper end of the first region 41 of the tubular member 4. In the example shown in FIG. 3, the lower surface of the collar portion 44 is a flat surface, but may have an uneven shape. As a result, a gap may be provided between the lower surface of the flange portion 44 and the contact point between the upper end of the first region 41 of the tubular member 4.

鍔部44の厚さは、図3で示す例では、筒状部材4の第2領域42の厚さと同じであるが、異なっていてもよい。具体的には、鍔部44の厚さは、筒状部材4の第2領域42よりも厚くてもよい。また、鍔部44の厚さは、筒状部材4の第2領域42よりも薄くてもよい。 In the example shown in FIG. 3, the thickness of the collar portion 44 is the same as the thickness of the second region 42 of the tubular member 4, but may be different. Specifically, the thickness of the flange portion 44 may be thicker than that of the second region 42 of the tubular member 4. Further, the thickness of the flange portion 44 may be thinner than that of the second region 42 of the tubular member 4.

また、鍔部44が、冷却のための気体が通る流路を塞いでいてもよい。「流路を塞ぐ」とは、筒状部材4の流路の垂直方向から流れてきた気体を通過させるために、試料保持面11の垂直方向に気体が通過する流路を鍔部44が狭くすることを意味している。具体的には、鍔部44が、試料保持面11の垂直方向からみたときに、気体が通過する流路の中央を通る平板441を有していてもよい。図4で示す例では、試料保持面11の垂直方向からみたときに、平板441の幅は、環状の鍔部44の幅よりも大きいが、これに限られない。具体的には、試料保持面11の垂直方向からみたときに、平板441の鍔部44の幅は、環状の鍔部44の幅よりも小さくてもよい。 Further, the flange portion 44 may block the flow path through which the cooling gas passes. “Closing the flow path” means that the flange portion 44 narrows the flow path through which the gas passes in the vertical direction of the sample holding surface 11 in order to allow the gas flowing from the vertical direction of the flow path of the tubular member 4 to pass through. Means to do. Specifically, the flange portion 44 may have a flat plate 441 that passes through the center of the flow path through which the gas passes when viewed from the vertical direction of the sample holding surface 11. In the example shown in FIG. 4, the width of the flat plate 441 is larger than the width of the annular flange portion 44 when viewed from the vertical direction of the sample holding surface 11, but the width is not limited to this. Specifically, the width of the flange portion 44 of the flat plate 441 may be smaller than the width of the annular flange portion 44 when viewed from the vertical direction of the sample holding surface 11.

鍔部44の材料としては、例えば、ステンレス、アルミニウムまたは鉄が挙げられる。鍔部44の寸法は、例えば、試料保持面11に垂直な方向からみたときに環状であるときは、幅を1〜10mmに、厚みを0.5〜3mmに、内周の径の長さを30〜70mmに、外周の径の長さを30〜75mmにすることができる。筒状部材4が鍔部44を備えていることで、金属板3と筒状部材4との接触面積を増やすことができる。これにより、金属板3と筒状部材4との接合強度を上げ、筒状部材4が動かないように固定することができる。 Examples of the material of the collar portion 44 include stainless steel, aluminum, and iron. The dimensions of the collar 44 are, for example, a width of 1 to 10 mm, a thickness of 0.5 to 3 mm, and an inner diameter length when the flange portion 44 is annular when viewed from a direction perpendicular to the sample holding surface 11. Can be 30 to 70 mm, and the length of the outer diameter can be 30 to 75 mm. Since the tubular member 4 includes the flange portion 44, the contact area between the metal plate 3 and the tubular member 4 can be increased. As a result, the joint strength between the metal plate 3 and the tubular member 4 can be increased, and the tubular member 4 can be fixed so as not to move.

また、筒状部材4の鍔部44のうち金属板3に接触している面の表面粗さが、筒状部材4の第2領域42の上面の表面粗さより粗くてもよい。金属板3は、輻射熱を反射するときに熱を発生する。筒状部材4の鍔部44のうち金属板3に接触している面が粗いことで、筒状部材4の鍔部44と金属板3との間で、間隙を有することができる。これにより、金属板3から筒状部材4の鍔部44に伝わる熱を減らすことができる。その結果、試料保持面11の均熱性を高めることができる。 Further, the surface roughness of the surface of the flange portion 44 of the tubular member 4 in contact with the metal plate 3 may be rougher than the surface roughness of the upper surface of the second region 42 of the tubular member 4. The metal plate 3 generates heat when it reflects radiant heat. Since the surface of the flange portion 44 of the tubular member 4 in contact with the metal plate 3 is rough, a gap can be provided between the flange portion 44 of the tubular member 4 and the metal plate 3. As a result, the heat transferred from the metal plate 3 to the flange portion 44 of the tubular member 4 can be reduced. As a result, the heat equalizing property of the sample holding surface 11 can be improved.

また、筒状部材4の第2領域42の上面が平らであり、金属板3と向かい合っていることで、筒状部材4の第2領域42の上面で反射した熱を金属板3に向けて照射することができる。その結果、試料保持面11の均熱性を高めることができる。 Further, since the upper surface of the second region 42 of the tubular member 4 is flat and faces the metal plate 3, the heat reflected by the upper surface of the second region 42 of the tubular member 4 is directed toward the metal plate 3. Can be irradiated. As a result, the heat equalizing property of the sample holding surface 11 can be improved.

また、図5に示すように、筒状部材4の第2領域42と金属板3とが、第2固定部材52によって固定されていてもよい。第2固定部材52は、例えば、金属板3と筒状部材4の第2領域42とを固定するために設けられている。 Further, as shown in FIG. 5, the second region 42 of the tubular member 4 and the metal plate 3 may be fixed by the second fixing member 52. The second fixing member 52 is provided, for example, for fixing the metal plate 3 and the second region 42 of the tubular member 4.

第2固定部材52は、試料保持面11に垂直で金属板3、筒状部材4の第1領域41、
第2領域42および第3領域43を含む断面をみたときに、金属板3および筒状部材4の第2領域42の間に位置している。
The second fixing member 52 is perpendicular to the sample holding surface 11, the metal plate 3, the first region 41 of the tubular member 4, and the like.
When the cross section including the second region 42 and the third region 43 is viewed, it is located between the metal plate 3 and the second region 42 of the tubular member 4.

第2固定部材52は、例えば、棒状の部材であってもよい。また、他の形状としては、例えば、楕円形状、三角形状や四角形状のような多角形状であってもよい。 The second fixing member 52 may be, for example, a rod-shaped member. Further, the other shape may be a polygonal shape such as an elliptical shape, a triangular shape or a quadrangular shape.

棒状の第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第2領域42の上面に垂直な方向に伸びているが、これに限られない。具体的には、棒状の第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41に近づく方向に伸びていてもよい。また、具体的には、棒状の第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41に離れる方向に伸びていてもよい。また、具体的には、棒状の第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、曲線を有して伸びていてもよい。 The rod-shaped second fixing member 52 is the second of the cylindrical member 4 when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11. It extends in a direction perpendicular to the upper surface of the region 42, but is not limited to this. Specifically, the rod-shaped second fixing member 52 has a cylindrical shape when viewed in a cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 perpendicular to the sample holding surface 11. It may extend in a direction approaching the first region 41 of the member 4. Specifically, when the rod-shaped second fixing member 52 is perpendicular to the sample holding surface 11 and the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed, It may extend in a direction away from the first region 41 of the tubular member 4. Specifically, when the rod-shaped second fixing member 52 is perpendicular to the sample holding surface 11 and the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed, It may have a curved line and extend.

第2固定部材52と金属板3との固定方法としては、例えば、ネジを用いてもよい。また、ネジで第2固定部材52と金属板3とを固定するときに、ナットを用いてもよい。また、他の固定方法としては、接合材を用いてもよい。接合材として用いられる材料としては、例えば、銀ろうまたは銀銅ろう等が挙げられる。 As a method of fixing the second fixing member 52 and the metal plate 3, for example, a screw may be used. Further, a nut may be used when fixing the second fixing member 52 and the metal plate 3 with screws. Moreover, as another fixing method, a bonding material may be used. Examples of the material used as the bonding material include silver wax and silver copper wax.

第2固定部材52と筒状部材4の第2領域42との固定方法としては、例えば、ネジを用いてもよい。また、ネジで第2固定部材52と金属板3とを固定するときに、ナットを用いてもよい。また、他の固定方法としては、接合材を用いてもよい。接合材として用いられる材料としては、例えば、銀ろうまたは銀銅ろう等が挙げられる。 As a method of fixing the second fixing member 52 and the second region 42 of the tubular member 4, for example, a screw may be used. Further, a nut may be used when fixing the second fixing member 52 and the metal plate 3 with screws. Moreover, as another fixing method, a bonding material may be used. Examples of the material used as the bonding material include silver wax and silver copper wax.

また、第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、金属板3を貫通していてもよい。具体的には、第2固定部材52は、金属板3を通過し、第2固定部材52の上端が金属板3の下面よりも高くてもよい。 Further, the second fixing member 52 penetrates the metal plate 3 when the cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 is viewed perpendicular to the sample holding surface 11. You may. Specifically, the second fixing member 52 may pass through the metal plate 3 and the upper end of the second fixing member 52 may be higher than the lower surface of the metal plate 3.

また、第2固定部材52は、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第2領域42を貫通していてもよい。具体的には、第2固定部材52は、筒状部材4の第2領域42を通過し、第2固定部材52の下端が筒状部材4の第2領域42の下面よりも低くてもよい。 Further, when the cross section of the tubular member 4 including the first region 41, the second region 42, and the third region 43 is viewed perpendicular to the sample holding surface 11, the second fixing member 52 is the second of the cylindrical member 4. It may penetrate the region 42. Specifically, the second fixing member 52 may pass through the second region 42 of the tubular member 4, and the lower end of the second fixing member 52 may be lower than the lower surface of the second region 42 of the cylindrical member 4. ..

また、第2固定部材52は、例えば、筒状部材4の第2領域42と複数箇所で固定されていてもよい。 Further, the second fixing member 52 may be fixed to the second region 42 of the cylindrical member 4 at a plurality of locations, for example.

第2固定部材52として用いられる金属材料としては、例えば、ステンレス、アルミニウムまたは鉄等が挙げられる。第2固定部材52の寸法は、丸棒状であるときは、例えば、径を1〜4mmに、長さを1〜10mmにすることができる。筒状部材4の第2領域42と金属板3とが、第2固定部材52によって固定されていることで、筒状部材4と金属板3との接触面積を増やすことができる。これにより、輻射熱が筒状部材4に入射してきたときに、熱膨張の影響を受けて、筒状部材4および金属板3が歪みを生じ、外れてしまうおそれを低減できる。 Examples of the metal material used as the second fixing member 52 include stainless steel, aluminum, iron and the like. When the second fixing member 52 has a round bar shape, for example, the diameter can be 1 to 4 mm and the length can be 1 to 10 mm. Since the second region 42 of the tubular member 4 and the metal plate 3 are fixed by the second fixing member 52, the contact area between the tubular member 4 and the metal plate 3 can be increased. As a result, when radiant heat is incident on the tubular member 4, the possibility that the tubular member 4 and the metal plate 3 are distorted and come off due to the influence of thermal expansion can be reduced.

また、図6に示すように、試料保持面11に垂直で筒状部材4の第1領域41、第2領域42および第3領域43を含む断面をみたときに、筒状部材4の第1領域41の内周面
を通る線と第2領域42の上面を通る線とで形成される角度は、直角よりも大きくてもよい。
Further, as shown in FIG. 6, when the cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 is viewed perpendicular to the sample holding surface 11, the first tubular member 4 is viewed. The angle formed by the line passing through the inner peripheral surface of the region 41 and the line passing through the upper surface of the second region 42 may be larger than a right angle.

また、本実施形態においては、試料保持面11を垂直方向に通り、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面からみたときに、筒状部材4の第1領域41の内周面を通る線と第2領域42の上面を通る線とで形成される角度は、筒状部材4の第1領域41および第2領域42に沿って一定であるが、これに限られない。具体的には、1つの筒状部材4に、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面からみたときに、筒状部材4の第1領域41の内周面を通る線と第2領域42の上面を通る線とで形成される角度が直角になっている箇所と、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面からみたときに、筒状部材4の第1領域41の内周面を通る線と第2領域42の上面を通る線とで形成される角度が、直角よりも大きくなる箇所が存在してもよい。 Further, in the present embodiment, the tubular member 4 is viewed from a cross section including the first region 41, the second region 42, and the third region 43 of the cylindrical member 4 through the sample holding surface 11 in the vertical direction. The angle formed by the line passing through the inner peripheral surface of the first region 41 and the line passing through the upper surface of the second region 42 is constant along the first region 41 and the second region 42 of the cylindrical member 4. , Not limited to this. Specifically, when viewed from a cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 in one tubular member 4, the first region 41 of the tubular member 4 The angle formed by the line passing through the inner peripheral surface and the line passing through the upper surface of the second region 42 is a right angle, and the first region 41, the second region 42, and the third region 43 of the cylindrical member 4. When viewed from the cross section including, there is a place where the angle formed by the line passing through the inner peripheral surface of the first region 41 of the tubular member 4 and the line passing through the upper surface of the second region 42 is larger than the right angle. You may.

試料保持面11を垂直方向に通り、筒状部材4の第1領域41、第2領域42および第3領域43を含む断面からみたときに、筒状部材4の第1領域41の内周面を通る線と第2領域42の上面とを通る線で形成される角度が直角よりも大きいことによって、発熱要素2から発せられた熱を筒状部材4の第1領域41の内周面および第2領域42で金属板3方向に反射させることができる。また、一度の反射で発熱要素2から発せられた熱を金属板3方向に反射させることができる。これにより、試料保持面11の均熱性を高めることができる。 When viewed from a cross section including the first region 41, the second region 42, and the third region 43 of the tubular member 4 through the sample holding surface 11 in the vertical direction, the inner peripheral surface of the first region 41 of the cylindrical member 4 Since the angle formed by the line passing through the line passing through and the upper surface of the second region 42 is larger than the right angle, the heat generated from the heat generating element 2 is transferred to the inner peripheral surface of the first region 41 of the tubular member 4 and the inner peripheral surface of the first region 41. The second region 42 can be reflected in the three directions of the metal plate. Further, the heat generated from the heat generating element 2 can be reflected in the direction of the metal plate 3 by one reflection. Thereby, the heat equalizing property of the sample holding surface 11 can be improved.

また、筒状部材4の第3領域43で、輻射熱を反射する領域を有していてもよい。具体的には、この領域が、試料保持面11の垂直方向に気体が通過する流路を狭めてもよい。これにより、筒状部材4の第3領域43を通過した輻射熱を反射することができ、均熱性を高めることができる。 Further, the third region 43 of the tubular member 4 may have a region for reflecting radiant heat. Specifically, this region may narrow the flow path through which the gas passes in the direction perpendicular to the sample holding surface 11. As a result, the radiant heat that has passed through the third region 43 of the tubular member 4 can be reflected, and the heat equalizing property can be improved.

また、鍔部44は、筒状部材の第1領域41の試料保持面11に垂直な方向からみたときに、筒状部材4の第1領域41より内側にも伸びてもよい。これにより、金属板3と筒状部材4との接合強度を上げ、筒状部材4が動かないように固定することができる。 Further, the flange portion 44 may extend inward from the first region 41 of the tubular member 4 when viewed from a direction perpendicular to the sample holding surface 11 of the first region 41 of the tubular member. As a result, the joint strength between the metal plate 3 and the tubular member 4 can be increased, and the tubular member 4 can be fixed so as not to move.

また、図7に示すように、複数の貫通孔31は、周方向に広がって位置していてもよい。例えば、4〜8個の扇型の貫通孔31が、点対称に位置していてもよい。また、金属板3のうち、複数の貫通孔31に囲まれた中央部には、貫通孔31が設けられていなくてもよい。これにより、第2領域42のうち貫通孔31に重なる部位において、貫通孔31を通過した輻射熱を反射しつつ、複数の貫通孔31に囲まれた中央部においても、輻射熱を反射することができる。その結果、均熱性をより高めることができる。このときに、金属板3の中央部は、試料保持面11の垂直方向からみたときに、第3領域43と重なる部位であってもよい。 Further, as shown in FIG. 7, the plurality of through holes 31 may be located so as to expand in the circumferential direction. For example, 4 to 8 fan-shaped through holes 31 may be located point-symmetrically. Further, the through hole 31 may not be provided in the central portion of the metal plate 3 surrounded by the plurality of through holes 31. As a result, the radiant heat that has passed through the through hole 31 can be reflected in the portion of the second region 42 that overlaps the through hole 31, and the radiant heat can be reflected even in the central portion surrounded by the plurality of through holes 31. .. As a result, the heat soaking property can be further improved. At this time, the central portion of the metal plate 3 may be a portion that overlaps with the third region 43 when viewed from the vertical direction of the sample holding surface 11.

なお、図7は平面図であるが、理解し易さを優先して、筒状部材4を透過して一点鎖線で示している。 Although FIG. 7 is a plan view, prioritizing ease of understanding, it is shown by a alternate long and short dash line through the cylindrical member 4.

1:セラミック基板
2:発熱要素
3:金属板
31:貫通孔
4:筒状部材
41:第1領域
42:第2領域
43:第3領域
44:鍔部
441:平板
51:第1固定部材
52:第2固定部材
10:試料保持具
11:試料保持面
1: Ceramic substrate 2: Heat generating element 3: Metal plate 31: Through hole 4: Cylindrical member 41: First region 42: Second region 43: Third region 44: Brim portion 441: Flat plate 51: First fixing member 52 : Second fixing member 10: Sample holder 11: Sample holding surface

Claims (8)

セラミック基板と、該セラミック基板に位置する発熱要素と、前記セラミック基板に対向して前記セラミック基板の下方に位置し、貫通孔を有する金属板と、前記セラミック基板と前記金属板とを固定する第1固定部材と、前記金属板の下面に位置し、前記貫通孔に繋がる筒状部材とを備えており、
前記筒状部材は、前記貫通孔から下方に伸びる第1領域、試料保持面の垂直方向からみたときに前記貫通孔と重なる第2領域および該第2領域から下方に伸びる第3領域を有することを特徴とする試料保持具。
The ceramic substrate, the heat generating element located on the ceramic substrate, the metal plate located below the ceramic substrate facing the ceramic substrate and having a through hole, and the ceramic substrate and the metal plate are fixed to each other. 1 It is provided with a fixing member and a tubular member located on the lower surface of the metal plate and connected to the through hole.
The tubular member has a first region extending downward from the through hole, a second region overlapping the through hole when viewed from the vertical direction of the sample holding surface, and a third region extending downward from the second region. A sample holder characterized by.
試料保持面の垂直方向からみたときに、前記貫通孔は、全体が前記第1領域よりも内側に位置することを特徴とする請求項1に記載の試料保持具。 The sample holder according to claim 1, wherein the through hole is entirely located inside the first region when viewed from the vertical direction of the sample holding surface. 試料保持面の垂直方向からみたときに、前記貫通孔は、全体が前記第2領域に重なることを特徴とする請求項1または請求項2に記載の試料保持具。 The sample holder according to claim 1 or 2, wherein the through hole is entirely overlapped with the second region when viewed from the vertical direction of the sample holding surface. 前記筒状部材の前記第1領域と前記第2領域との間に、間隙を有していることを特徴とする請求項1乃至請求項3のうちのいずれかに記載の試料保持具。 The sample holder according to any one of claims 1 to 3, wherein a gap is provided between the first region and the second region of the tubular member. 前記筒状部材は、前記金属板に接触する鍔部を備えていることを特徴とする請求項1乃至請求項4のうちのいずれかに記載の試料保持具。 The sample holder according to any one of claims 1 to 4, wherein the tubular member includes a collar portion that comes into contact with the metal plate. 前記筒状部材の前記鍔部のうち前記金属板に接触している面の表面粗さが、前記筒状部材の前記第2領域の上面の表面粗さより粗いことを特徴とする請求項5に記載の試料保持具。 The fifth aspect of the present invention is characterized in that the surface roughness of the surface of the flange portion of the tubular member that is in contact with the metal plate is coarser than the surface roughness of the upper surface of the second region of the tubular member. The sample holder described. 前記筒状部材の前記第2領域と前記金属板とを固定する第2固定部材を更に有することを特徴とする請求項1乃至請求項6のうちのいずれかに記載の試料保持具。 The sample holder according to any one of claims 1 to 6, further comprising a second fixing member for fixing the second region of the tubular member and the metal plate. 前記試料保持面を垂直方向に通り、前記筒状部材の前記第1領域、前記第2領域および前記第3領域を含む断面からみたときに、前記筒状部材の第1領域の内周面を通る線と前記第2領域の上面を通る線とで形成される角度は、直角よりも大きいことを特徴とする請求項1乃至請求項7のうちのいずれかに記載の試料保持具。
When viewed from a cross section including the first region, the second region, and the third region of the tubular member through the sample holding surface in the vertical direction, the inner peripheral surface of the first region of the tubular member is viewed. The sample holder according to any one of claims 1 to 7, wherein the angle formed by the line passing through and the line passing through the upper surface of the second region is larger than a right angle.
JP2020082026A 2020-05-07 2020-05-07 Sample holding tool Pending JP2021177510A (en)

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