JP2021139651A - Device and method for evaluating surface irregularity - Google Patents

Abstract

To provide a device and a method for evaluating a surface irregularity for evaluating a surface irregularity by a new evaluation index.SOLUTION: A surface irregularity evaluation device D of the present invention includes: a data acquisition unit 1 for irradiating a measurement target surface of a measurement target with an illumination light at a predetermined incidence angle and acquiring light intensity distribution data of reflected light of the illumination light reflected by the measurement target surface at a predetermined light reception angle; and an evaluation processing unit 23 for determining the ratio of the maximum value and the minimum value in the light intensity distribution data and using the ratio as an evaluation index value showing the degree of the apparent irregularity in the surface of the measurement target surface.SELECTED DRAWING: Figure 1

Description

The present invention relates to a surface unevenness evaluation device for evaluating the surface unevenness feeling on the surface to be measured and a surface unevenness evaluation method.

Conventionally, the appearance of the surface to be measured is determined by using an optical characteristic measuring device such as a brightness meter, a spectrometer, and a colorimeter, which is disclosed in Patent Document 1, for example, to obtain brightness, spectral characteristics, and, for example, an XYZ color system. L ^* a ^* b ^* It is represented by the color of the color coordinates (chromaticity diagram) such as the color system and evaluated.

Japanese Unexamined Patent Publication No. 2018-4421

However, in the evaluation of the surface unevenness feeling, which is the appearance of the surface unevenness, there is a circumstance that the measurement result of the optical characteristic measuring device and the surface unevenness feeling felt by a person do not always match. In particular, when the surface to be measured is a surface having irregularities due to, for example, annual rings or knots in wood grain or heather, not only the way the surface shines but also the irregularities of the material affect the surface unevenness, so the optical characteristics It is difficult to match the measurement result of the measuring device with the surface unevenness felt by humans.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a surface unevenness evaluation device and a surface unevenness evaluation method for evaluating a surface unevenness feeling with a new evaluation index.

As a result of various studies, the present inventor has found that the above object can be achieved by the following invention. That is, the surface unevenness evaluation device according to one aspect of the present invention irradiates the surface to be measured with illumination light at a predetermined incident angle and reflects the illumination light reflected on the surface to be measured. The ratio of the maximum value and the minimum value in the light intensity distribution data is obtained from the data acquisition unit that acquires the light intensity distribution data at the light receiving angle, and the obtained ratio is the apparent unevenness on the surface of the surface to be measured. It is provided with an evaluation processing unit that serves as an evaluation index value indicating the degree. Preferably, in the above-mentioned surface unevenness evaluation device, the data acquisition unit measures and acquires the light intensity distribution data, and the light intensity distribution data measured by the measurement unit at the incident angle and the light receiving angle. Is provided with an acquisition processing unit that acquires the data from the measurement unit. Preferably, in the above-mentioned surface unevenness evaluation device, the data acquisition unit is an input unit for inputting the light intensity distribution data. Preferably, in the above-mentioned surface unevenness evaluation device, the data acquisition unit reads the light intensity distribution data from a recording medium (for example, a CD-ROM, a DVD-ROM, etc.) on which the light intensity distribution data is recorded (for example, a reading unit (for example, a CD-ROM, a DVD-ROM, etc.)). For example, a CD drive device, a DVD drive device, etc.). Preferably, in the above-mentioned surface unevenness evaluation device, the data acquisition unit is an interface unit (for example, a USB interface device or the like) that reads the light intensity distribution data from a storage medium (for example, a USB memory or the like) that stores the light intensity distribution data. ). Preferably, in the above-mentioned surface unevenness evaluation device, the data acquisition unit is a communication interface unit that receives the light intensity distribution data from the server device that stores the light intensity distribution data via the communication network.

The surface unevenness evaluation method according to another aspect of the present invention irradiates the surface to be measured with illumination light at a predetermined incident angle and reflects the illumination light reflected on the surface to be measured. The data acquisition step of acquiring the light intensity distribution data at the light receiving angle and the ratio of the maximum value to the minimum value in the light intensity distribution data are obtained, and the obtained ratio is used as the appearance unevenness on the surface of the surface to be measured. It is provided with an evaluation processing step as an evaluation index value indicating the degree.

According to the present invention, there is a surface unevenness evaluation device and a surface unevenness evaluation method in which the ratio of the maximum value to the minimum value in the light intensity distribution data is used as a new evaluation index value for the surface unevenness feeling (appearance of the surface unevenness). Can be provided. Such a surface unevenness evaluation device and a surface unevenness evaluation method have a maximum value in the light intensity distribution data that looks like relatively strong reflected light in the convex portion and a light intensity distribution data that looks like relatively weak reflected light in the concave portion. Since the minimum value in is used, the influence of the unevenness of the material on the evaluation index can be reflected in the evaluation index value, and when the surface having the unevenness is used as the surface to be measured, the evaluation can be performed more preferably.

In another aspect, the surface unevenness evaluation device described above has a display unit for displaying, a coordinate system having an X axis representing the ratio, and coordinate points representing the evaluation index value obtained by the evaluation processing unit. Is further provided with a display processing unit for displaying the above on the display unit. In another aspect, the above-mentioned surface unevenness evaluation method further includes a display step of displaying a coordinate system having an X-axis representing the ratio and coordinate points representing the evaluation index value obtained by the evaluation processing unit. Be prepared.

In such a surface unevenness evaluation device and a surface unevenness evaluation method, since the coordinate points of the evaluation index values are plotted in the coordinate system, the evaluation index value of the surface unevenness can be visually grasped. In particular, when there are a plurality of measurement targets, each evaluation index value in the plurality of measurement targets can be grasped at a glance, and trends and mutual comparisons are easy.

In another aspect, in the above-mentioned surface unevenness evaluation device and surface unevenness evaluation method, the light receiving angle is a specular reflection angle.

According to this, it is possible to provide a surface unevenness evaluation device and a surface unevenness evaluation method in which the light receiving angle is a specular reflection angle.

In another aspect, in the above-mentioned surface unevenness evaluation device and surface unevenness evaluation method, the incident angle and the light receiving angle are 45 °, respectively.

According to this, it is possible to provide a surface unevenness evaluation device and a surface unevenness evaluation method in which the incident angle and the light receiving angle are 45 °, respectively.

In another aspect, in the above-mentioned surface unevenness evaluation device and surface unevenness evaluation method, the surface to be measured includes at least one of wood grain and main grain.

As described above, such a surface unevenness evaluation device and a surface unevenness evaluation method can reflect the influence of the unevenness of the material on the evaluation index in the evaluation index value, and therefore, at least one of the wood grain and the main grain. The surface provided with the above can be evaluated more preferably.

According to the present invention, it is possible to provide a surface unevenness evaluation device and a surface unevenness evaluation method for evaluating a surface unevenness feeling with a new evaluation index.

It is a block diagram which shows the structure of the surface unevenness evaluation apparatus in embodiment. It is a block diagram which shows the structure of the measurement part which is an example of the data acquisition part in the surface unevenness evaluation apparatus. As an example, it is a figure which shows the light intensity distribution data. It is a flowchart which shows the operation of the surface unevenness evaluation apparatus. It is a figure which shows an example of the surface to be measured. As an example, it is a figure for demonstrating the correlation between the evaluation index obtained by the surface unevenness evaluation apparatus, and subjective visual evaluation. As an example, it is a figure which shows the result of the subjective visual evaluation about the surface unevenness feeling.

Hereinafter, one or more embodiments of the present invention will be described with reference to the drawings. However, the scope of the invention is not limited to the disclosed embodiments. It should be noted that the configurations with the same reference numerals in the respective drawings indicate that they are the same configurations, and the description thereof will be omitted as appropriate. In the present specification, when they are generically referred to, they are indicated by reference numerals without subscripts, and when they refer to individual configurations, they are indicated by reference numerals with subscripts.

FIG. 1 is a block diagram showing a configuration of a surface unevenness evaluation device according to an embodiment. FIG. 2 is a block diagram showing a configuration of a measurement unit which is an example of a data acquisition unit in the surface unevenness evaluation device. FIG. 3 is a diagram showing light intensity distribution data as an example. FIG. 3A shows the measurement result when the measurement target is horse chestnut # 1000, and FIG. 3B shows the measurement result when the measurement target is quince # 1000. In FIGS. 3A and 3B, the horizontal axis represents the position and the vertical axis represents the intensity (brightness) of the light intensity. In each of FIGS. 3A and 3B, in order to show the correspondence between each position of the light intensity portion distribution data and each position value of the measurement target, each image PO1 on each measurement surface of the measurement target is displayed on the lower side thereof. PO2 is illustrated. The light intensity distribution data MR1 and MR2 are measurement results of each linear portion indicated by the solid lines RL1 and RL2 in the images PO1 and PO2.

The surface unevenness evaluation device D in the embodiment is a device that obtains an evaluation index value indicating the degree of apparent unevenness (appearance of surface unevenness, surface unevenness feeling) on the surface of the surface to be measured, for example, FIG. As shown in 1, a data acquisition unit 1, a control processing unit 2, an input unit 3, a display unit 4, an interface unit (IF unit) 5, and a storage unit 6 are provided.

The data acquisition unit 1 irradiates the surface to be measured with illumination light at a predetermined incident angle and acquires light intensity distribution data at a predetermined light receiving angle in the reflected light of the illumination light reflected by the surface to be measured. It is a device to do.

In the present embodiment, the data acquisition unit 1 includes, for example, a measurement unit S and an acquisition processing unit 22 functionally provided in the control processing unit 2 as described later. The measuring unit S is connected to, for example, the control processing unit 2, and under the control of the control processing unit 2, the surface to be measured is irradiated with illumination light at a predetermined incident angle, and the illumination reflected by the surface to be measured is reflected. It is a device that measures light intensity distribution data at a predetermined light receiving angle in the reflected light of light. More specifically, the measuring unit S includes, for example, an illuminating unit 71, a light receiving unit 72, and a main body unit 73, as shown in FIG. The illumination unit 71 is connected to the main body 73, and irradiates a virtual measurement surface HS on which the measured surface OS of the measurement target Ob is arranged with a predetermined illumination light at a predetermined incident angle θ1 under the control of the main body 73. It is a device. The illumination unit 71 is connected to, for example, a light source that is connected to the main body 73 and emits a predetermined illumination light under the control of the main body 73, and the illumination light emitted from the light source is parallelized (collimated) and guided to the measurement surface HS. The illumination unit 71 includes an illumination optical system that illuminates, and the illumination unit 71 is arranged so that the optical axis (incident light axis) AX1 of the illumination optical system has a predetermined incident angle θ1 with respect to the normal line NL of the measurement surface HS. .. The illumination light is, for example, D65, which is a standard light of CIE (International Commission on Illumination). The light receiving unit 72 receives the reflected light of the illumination light from the measurement surface HS at a predetermined light receiving angle θ2, performs photoelectric conversion, and outputs a signal corresponding to the light intensity of the reflected light of the illumination light to the main body 73. It is a device. The light receiving unit 72 includes, for example, a light receiving optical system and a light receiving unit, and the light receiving optical system is an optical system that guides the reflected light of the illumination light from the measurement surface HS to the light receiving unit. The unit is connected to the main body 73, and under the control of the main body 73, the reflected light of the illumination light guided by the light receiving optical system is photoelectrically converted, and the signal resulting from this photoelectric conversion is output to the main body 73. do. More specifically, in the present embodiment, the light receiving unit is a so-called image spectrometer (for example, ImSpector V8E type manufactured by JFE Techno Research Co., Ltd.), for example, a slit member having a slit-shaped opening and, for example, a holo. A spectroscopic element such as a diffraction grid using graphic grating and a two-dimensional image sensor such as a CCD type are provided, and the reflected light of the illumination light guided by the light receiving optical system is measured by the opening of the slit member. The slit light for one horizontal line in the field of view is used, and the slit light for one horizontal line is vertically dispersed by the spectroscopic element, and the horizontal space data and its spectroscopic data are detected by the two-dimensional image sensor. The detected horizontal space data and its spectral data are output to the main body 73. The light receiving unit 72 is arranged so that the optical axis (light receiving optical axis) AX2 of the light receiving optical system has a predetermined light receiving angle θ2 with respect to the normal NL of the measurement surface HS. The main body 73 is connected to the control processing unit 2, obtains light intensity distribution data in the reflected light of the illumination light based on the signal input from the light receiving unit 72, and obtains the light intensity in the reflected light of the illumination light obtained. This is a device that outputs distribution data to the control processing unit 2. In the present embodiment, horizontal space data and its spectral data are input as the signal from the light receiving unit. Therefore, the main body 73 obtains the brightness as the light intensity from the spectral data by a known conventional method, and thus the illumination light. Obtain the light intensity distribution data in the reflected light of. In the measuring unit S using such a light receiving unit, the measured surface OS is measured by vertically scanning the measured surface OS of the measurement target Ob arranged along the measurement surface HS. Two-dimensional spectral data for the measured surface OS of the target Ob can be generated, and two-dimensional light intensity distribution data for the measured surface OS of the measurement target Ob can be generated. The acquisition processing unit 22 will be described later.

In the above description, the light receiving unit is configured to include an image spectrometer, but the light intensity distribution data is not limited as long as it can be measured. For example, a plurality of photoelectric conversion elements juxtaposed in one direction. It may be configured to include a linear image sensor.

The input unit 3 is connected to the control processing unit 2 and is necessary for operating various commands such as commands for instructing the calculation of the evaluation index value and the surface unevenness evaluation device D such as the name of the measurement target. It is a device for inputting various data into the surface unevenness evaluation device D, for example, a plurality of input switches, keyboards, mice, etc. to which predetermined functions are assigned. The display unit 4 is connected to the control processing unit 2 and displays commands and data input from the input unit 3 and an evaluation index value calculated by the surface unevenness evaluation device D according to the control of the control processing unit 2. Such as a display device such as a CRT display, a liquid crystal display, and an organic EL display.

A so-called touch panel may be configured from the input unit 3 and the display unit 4. In the case of configuring this touch panel, the input unit 3 is a position input device that detects and inputs an operation position such as a resistance film method or a capacitance method. In this touch panel, the position input device is provided on the display surface of the display device, candidates for one or a plurality of input contents that can be input to the display device are displayed, and the user displays the input contents that he / she wants to input. When the position is touched, the position is detected by the position input device, and the display content displayed at the detected position is input to the surface unevenness evaluation device D as the operation input content of the user. With such a touch panel, since the user can intuitively understand the input operation, the surface unevenness evaluation device D that is easy for the user to handle is provided.

The IF unit 5 is a circuit that is connected to the control processing unit 2 and inputs / outputs data to / from an external device according to the control of the control processing unit 2. For example, an interface circuit of RS-232C which is a serial communication method. , An interface circuit using the Bluetooth (registered trademark) standard, an interface circuit for performing infrared communication such as the IrDA (Infrared Data Association) standard, and an interface circuit using the USB (Universal Serial Bus) standard. Further, the IF unit 5 is a circuit that communicates with an external device, and may be, for example, a data communication card, a communication interface circuit according to the IEEE802.11 standard, or the like.

The storage unit 6 is a circuit that is connected to the control processing unit 2 and stores various predetermined programs and various predetermined data under the control of the control processing unit 2. The various predetermined programs include, for example, a control processing program, and the control processing program includes parts 1 (S) of the surface unevenness evaluation device D, 3 to 6, respectively, according to the functions of the parts. The control program to be controlled, the acquisition processing program for acquiring the light intensity distribution data in the reflected light of the illumination light, and the ratio of the maximum value to the minimum value in the light intensity distribution data acquired by the acquisition processing program are obtained, and the above-mentioned calculation is performed. A display that displays on the display unit 4 an evaluation processing program in which the ratio is used as the evaluation index value, a coordinate system having an X axis representing the ratio, and coordinate points representing the evaluation index value obtained by the evaluation processing program. Processing programs and the like are included. The various predetermined data include data necessary for executing each of these programs, such as light intensity distribution data in the reflected light of the illumination light acquired by the data acquisition unit 1. Such a storage unit 6 includes, for example, a ROM (Read Only Memory) which is a non-volatile storage element, an EEPROM (Electrically Erasable Programmable Read Only Memory) which is a rewritable non-volatile storage element, and the like. The storage unit 6 includes a RAM (Random Access Memory) or the like that serves as a working memory of the so-called control processing unit 2 that stores data or the like generated during the execution of the predetermined program. The storage unit 6 may be provided with a hard disk device capable of storing a large capacity in order to store learning data having a relatively large capacity.

The control processing unit 2 controls each part 1 (S), 3 to 6 of the surface unevenness evaluation device D according to the function of each part, and has an appearance unevenness (surface unevenness) on the surface of the surface to be measured to be measured. This is a circuit for obtaining an evaluation index value indicating the degree of appearance (appearance, surface unevenness). The control processing unit 2 includes, for example, a CPU (Central Processing Unit) and peripheral circuits thereof. The control processing unit 2 is functionally configured with the control unit 21, the acquisition processing unit 22, the evaluation processing unit 23, and the display processing unit 24 by executing the control processing program.

The control unit 21 controls each part 1 (S), 3 to 6 of the surface unevenness evaluation device D according to the function of each part, and controls the entire surface unevenness evaluation device D.

The acquisition processing unit 22 acquires the light intensity distribution data measured by the measuring unit S at a predetermined incident angle and a predetermined light receiving angle from the measuring unit S. More specifically, the acquisition processing unit 22 irradiates the measurement target surface with illumination light at a predetermined incident angle and reflects the illumination light reflected on the measurement surface at a predetermined reception angle in the reflected light. The light intensity distribution data is measured by the measuring unit S, and the light intensity distribution data is acquired from the measuring unit S.

The result of measuring the surface of the surface finish # 1000 of horse chestnut (Aesculus hippocastanum # 1000, Tochinoki # 1000) by such a measuring unit S is shown in FIG. The result of measuring the surface in # 1000, Karin # 1000) is shown in FIG. 3B as the light intensity distribution data MR2. In FIGS. 3A and 3B, the incident angle θ1 is 45 °, therefore the specular reflection angle is 45 °, and the light receiving angle θ2 is this specular angle 45 °. The measuring unit S was calibrated using a so-called white calibration plate. Therefore, the light intensity of the measurement result is based on the light intensity of the reflected light of the white calibration plate. Tochinoki # 1000 is an example of a measurement target Ob having a small change in light intensity, and Karin # 1000 is an example of a measurement target Ob having a large change in light intensity.

The evaluation processing unit 23 obtains the ratio Ymax / Ymin of the maximum value Ymax and the minimum value Ymin in the light intensity distribution data acquired by the acquisition processing unit 22, and uses the obtained ratio Ymax / Ymin as the evaluation index value. be. In horse chestnut # 1000 shown in FIG. 3A, the maximum value Ymzx1 (= about 140) of the light intensity distribution data MR1 is obtained, and the minimum value Ymin1 (= about 80) of the light intensity distribution data MR1 is obtained, and these ratios Ymax1 / Ymin1 is obtained as an evaluation index value of surface unevenness with respect to horse chestnut # 1000. In Karin # 1000 shown in FIG. 3B, the maximum value Ymzx2 (= about 105) of the light intensity distribution data MR2 is obtained, and the minimum value Ymin2 (= about 20) of the light intensity distribution data MR2 is obtained, and these ratios Ymax2 / Ymin2 is obtained as an evaluation index value of surface unevenness with respect to Karin # 1000.

The display processing unit 24 displays on the display unit 4 a coordinate system having an X-axis representing the ratio and a coordinate point representing the evaluation index value obtained by the evaluation processing unit 23. More specifically, the coordinate system having the X-axis representing the ratio is displayed on the display unit 4 (that is, the X-axis of the ratio is displayed on the display unit 4), and the evaluation index obtained by the evaluation processing unit 23. The coordinate points representing the values are plotted on the coordinate system (the X-axis), and the coordinate points are displayed on the display unit 4.

The control processing unit 2, the input unit 3, the display unit 4, the IF unit 5, and the storage unit 6 can be configured by, for example, a computer such as a desktop type or a notebook type.

Next, the operation of this embodiment will be described. FIG. 4 is a flowchart showing the operation of the surface unevenness evaluation device. FIG. 5 is a diagram showing an example of the surface to be measured. FIG. 5A is a schematic view of a surface image of surface finish # 1000 in Sen (Sen # 1000), and FIG. 5B is a schematic view of a surface image of surface finish # 1000 in Tochinoki # 1000. FIG. 5C is a schematic view of an image of the surface of walnut # 1000 with surface finish # 1000, and FIG. 5D is a schematic view of an image of the surface of Karin # 1000 with surface finish # 1000. FIG. 5E is a schematic view of a surface image of surface finish # 1000 in Makaba # 1000, and FIG. 5F is a schematic view of a surface image of surface finish # 1000 in ebony (Kokutan # 1000). Each of the images of FIGS. 5A to 5F was generated by measuring each surface with an image spectrometer (JFE Techno Research Co., Ltd., ImSpector V8E type) at an incident angle of 45 ° and a light receiving angle of 30 °. FIG. 6 is a diagram for explaining the correlation between the evaluation index obtained by the surface unevenness evaluation device and the subjective visual evaluation as an example. The horizontal axis (X-axis) of FIG. 6 represents the evaluation index (Ymax / Ymin) of the surface unevenness feeling, and the vertical axis (Y-axis) thereof represents the visual evaluation of the surface unevenness feeling. SC1 and SC2 are evaluation index values of each of the main heathers provided in the current vehicles of different vehicle types, respectively. FIG. 7 is a diagram showing, as an example, the result of subjective visual evaluation of the surface unevenness.

When the power is turned on, the surface unevenness evaluation device D having such a configuration executes necessary initialization of each part and starts its operation. The control processing unit 2 is functionally configured with a control unit 21, an acquisition processing unit 22, an evaluation processing unit 23, and a display processing unit 24 by executing the control processing program.

In the operation of obtaining the evaluation index value, in FIG. 4, the surface unevenness evaluation device D acquires the light intensity distribution data by the control processing unit using the measurement unit S (S1). More specifically, for example, the operator (user) sets the measurement target Ob in the measurement unit S so that the surface OS to be measured follows the measurement surface HS of the measurement unit S, and inputs an instruction to obtain an evaluation index value. Enter from 3. When an instruction to start measurement by the operator is input from the input unit 3, the control processing unit 2 irradiates the measured surface OS of the measurement target Ob with illumination light at a predetermined incident angle by the acquisition processing unit 22 to receive the measurement. The measuring unit S is made to measure the light intensity distribution data at a predetermined light receiving angle in the reflected light of the illumination light reflected by the measuring surface OS, and the light intensity distribution data MR of the measured surface OS on the measurement target Ob is measured by the measuring unit S. Get from.

Next, the surface unevenness evaluation device D obtains an evaluation index value by the evaluation processing unit 23 (S2). More specifically, the evaluation processing unit 23 obtains the maximum value Ymax and the minimum value Ymin in the light intensity distribution data acquired in the processing S1, and obtains the ratio Ymax / Ymin of these maximum value Ymax and the minimum value Ymin. The obtained ratio Ymax / Ymin is used as an evaluation index value of the light intensity distribution data acquired in the process S1, and this evaluation index value is stored in the storage unit 6.

The ratio Ymax / Ymin may be obtained from the light intensity distribution data after performing a predetermined pretreatment such as removing noise from the light intensity distribution data, and the evaluation index value may be obtained, or one measurement. A plurality of light intensity distribution data are obtained for the target Ob, each ratio Ymax / Ymin is obtained from each of these light intensity distribution data, and an average value at these multiple ratios Ymax / Ymin is obtained, and this average value is an evaluation index. It may be a value.

Then, the surface unevenness evaluation device D displays the evaluation index value on the display unit 4 by the display processing unit 24 (S3), and ends this processing. More specifically, the display processing unit 24 displays the X-axis of the ratio on the display unit 4, displays the coordinate system having the X-axis representing the ratio on the display unit 4, and obtains it in the process S2. By plotting the coordinate points representing the evaluation index values on the coordinate system (the X-axis), the coordinate points representing the evaluation index values obtained in the process S2 are displayed on the display unit 4.

FIG. 6 shows the correlation between the evaluation index obtained by the surface unevenness evaluation device and the subjective visual evaluation of the surface unevenness shown in FIG. 7. In FIG. 7, the visual evaluation point of the surface unevenness feeling on the smooth surface is set to 0 points, and the visual evaluation point of the surface unevenness feeling on the rough surface is set to 5 points. The score was calculated. As shown in FIG. 6, the square R ² of the correlation coefficient R is 0.8369 (R ² = 0.8369), and the evaluation index value obtained by the surface unevenness evaluation device D in the present embodiment is the surface. It correlates well with the score of the visual evaluation of the unevenness feeling, and it is understood that the evaluation index value obtained by the surface unevenness feeling evaluation device D in the present embodiment is effective as the evaluation index value of the surface unevenness feeling.

The surface unevenness is a subjective visual evaluation, but on a smooth surface with no unevenness, the artificial feeling becomes stronger, so the impression of the surface unevenness is bad, and the rough surface where the unevenness is conspicuous is also inconvenient. Since it looks natural, the impression of surface unevenness is bad. As a result, the area shown by the ellipse in FIG. 7 from the time when the natural wood grain starts to feel slightly uneven to the time when the unevenness becomes tight is the surface unevenness. Impression of feeling is good. Therefore, when the result shown in FIG. 6 and the result shown in FIG. 7 are compared, the impression of surface unevenness is in the range shown by the broken line rectangle in which the evaluation index value is from about 1.5 to about 3. It can be understood that it is a good range of.

The visual evaluation shown in FIG. 7 is the result of totaling the visual evaluations of five subjects.

As described above, according to the above, the surface in which the ratio Ymax / Ymin of the maximum value Ymax and the minimum value Ymin in the light intensity distribution data MR is used as a new evaluation index value of the surface unevenness feeling (appearance of the surface unevenness). The unevenness evaluation device D and the surface unevenness evaluation method can be provided, and the surface unevenness evaluation device D and the surface unevenness evaluation method mounted on the surface unevenness evaluation device D in the embodiment can quantify the surface unevenness evaluation value by an evaluation index value. The surface unevenness evaluation device D and the surface unevenness evaluation method have a maximum value Ymax in the light intensity distribution data MR that looks like relatively strong reflected light in the convex portion and a light intensity distribution that looks like relatively weak reflected light in the concave portion. Since the minimum value Ymin in the data MR is used, the influence of the unevenness of the material on the evaluation index can be reflected in the evaluation index value, and when the surface having the unevenness is used as the surface to be measured OS, the evaluation can be performed more preferably.

Since the surface unevenness evaluation device and the surface unevenness evaluation method can reflect the influence of the unevenness of the material on the evaluation index value in the evaluation index value, as shown in FIG. 6, a surface provided with this grain is more preferable. Can be evaluated. Since the wood grain is substantially the same as that of the main heather, the surface unevenness evaluation device and the surface unevenness evaluation method can more preferably evaluate the surface provided with the wood grain.

Since the surface unevenness evaluation device and the surface unevenness evaluation method plot the coordinate points of the evaluation index values in the coordinate system, the evaluation index value of the surface unevenness can be visually grasped. In particular, when there are a plurality of measurement target Obs, each evaluation index value in the plurality of measurement target Obs can be grasped at a glance, and the tendency and mutual comparison can be easily performed.

According to the above, the surface unevenness evaluation device D and the surface unevenness evaluation method in which the light receiving angle is a specular reflection angle, and the surface unevenness evaluation device D and the surface unevenness evaluation method in which the incident angle and the light receiving angle are 45 °, respectively. Can be provided.

In the above-described embodiment, the data acquisition unit 1 is configured to include the measurement unit S and the acquisition processing unit 22, but the data acquisition unit 1 is not limited thereto. For example, the data acquisition unit 1 irradiates the surface to be measured with illumination light at a predetermined incident angle by a measuring device such as the measurement unit S described above as an example, and the illumination reflected by the surface to be measured is reflected. It may be an input unit for inputting light intensity distribution data measured at a predetermined light receiving angle in the reflected light of light. The input unit may also be used as the input unit 3 described above.

Alternatively, for example, the data acquisition unit 1 irradiates the measurement target surface with illumination light at a predetermined incident angle by a measurement device such as the measurement unit S described above as an example, and reflects the data acquisition unit 1 on the measurement surface. A reading unit (for example, a CD drive device and a CD drive device) that reads the light intensity distribution data from a recording medium (for example, CD-ROM and DVD-ROM) that records the light intensity distribution data measured at a predetermined light receiving angle in the reflected light of the illumination light. It may be a DVD drive device or the like).

Alternatively, for example, the data acquisition unit 1 irradiates the measurement target surface with illumination light at a predetermined incident angle by a measurement device such as the measurement unit S described above as an example, and reflects the data acquisition unit 1 on the measurement surface. Even if it is an interface unit (for example, a USB interface device) that reads the light intensity distribution data from a storage medium (for example, a USB memory) that stores the light intensity distribution data measured at a predetermined light receiving angle in the reflected light of the illumination light. good. The interface unit may also be used as the IF unit 5 described above.

Alternatively, for example, the data acquisition unit 11 irradiates the measurement target surface with illumination light at a predetermined incident angle by a measurement device such as the measurement unit S described above as an example, and reflects the data acquisition unit 11 on the measurement surface. It may be a communication interface unit that receives the light intensity distribution data from a server device that stores the light intensity distribution data measured at a predetermined light receiving angle in the reflected light of the illumination light via a communication network. The communication interface unit may also be used as the IF unit 5 described above.

In order to express the present invention, the present invention has been appropriately and sufficiently described through the embodiments with reference to the drawings described above, but those skilled in the art can easily change and / or improve the above-described embodiments. It should be recognized that it can be done. Therefore, unless the modified or improved form implemented by a person skilled in the art is at a level that deviates from the scope of rights of the claims stated in the claims, the modified form or the improved form is the scope of rights of the claims. It is interpreted as being comprehensively included in.

D Surface unevenness evaluation device S Measuring unit 1 Data acquisition unit 2 Control processing unit 3 Input unit 4 Display unit 5 Interface unit (IF unit)
6 Storage unit 21 Control unit 22 Acquisition processing unit 23 Evaluation processing unit 24 Display processing unit

Claims (10)

A data acquisition unit that irradiates the surface to be measured with illumination light at a predetermined incident angle and acquires light intensity distribution data at a predetermined light receiving angle in the reflected light of the illumination light reflected by the surface to be measured.
It is provided with an evaluation processing unit for obtaining a ratio between a maximum value and a minimum value in the light intensity distribution data and using the obtained ratio as an evaluation index value indicating the degree of apparent unevenness on the surface of the surface to be measured.
Surface unevenness evaluation device. The display unit that displays and
It further includes a coordinate system having an X-axis representing the ratio, and a display processing unit that displays coordinate points representing the evaluation index value obtained by the evaluation processing unit on the display unit.
The surface unevenness evaluation device according to claim 1. The light receiving angle is a specular reflection angle.
The surface unevenness evaluation device according to claim 1 or 2. The incident angle and the light receiving angle are 45 °, respectively.
The surface unevenness evaluation device according to claim 1 or 2. The surface to be measured includes at least one of wood grain and main grain.
The surface unevenness evaluation device according to any one of claims 1 to 4. A data acquisition step of irradiating the surface to be measured with illumination light at a predetermined incident angle and acquiring light intensity distribution data at a predetermined light receiving angle in the reflected light of the illumination light reflected by the surface to be measured.
It is provided with an evaluation processing step of obtaining a ratio of a maximum value and a minimum value in the light intensity distribution data and using the obtained ratio as an evaluation index value indicating the degree of apparent unevenness on the surface of the surface to be measured.
Surface unevenness evaluation method. A coordinate system having an X-axis representing the ratio and a display step for displaying coordinate points representing the evaluation index value obtained by the evaluation processing unit are further provided.
The surface unevenness evaluation method according to claim 6. The light receiving angle is a specular reflection angle.
The surface unevenness evaluation method according to claim 6 or 7. The incident angle and the light receiving angle are 45 °, respectively.
The surface unevenness evaluation method according to claim 6 or 7. The surface to be measured includes at least one of wood grain and main grain.
The surface unevenness evaluation method according to any one of claims 6 to 9.

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