JP2021085727A - Detector, surface property measuring device, and measurement method - Google Patents

Abstract

To provide a detector, a surface property measuring device and a measurement method with which it is possible to suppress the influence of foreign matter on the measured data of a measurement object.SOLUTION: A detector comprises: a contact maker (102) brought into contact with a measurement object (110); an arm (104) with the contact maker attached to a tip (104B); a cleaning member (114) attached to the tip of the arm, the cleaning member being brought into contact with the measurement object and removing the foreign matter sticking to the measurement object; a contact switching unit for switching whether to bring the contact maker or the cleaning member into contact with the measurement object; a measurement force addition unit (106) for adding an urging force via the arm to either the contact maker or the cleaning member; and a displacement detector (108) for detecting the displacement of the contact maker via the arm.SELECTED DRAWING: Figure 1

Description

The present invention relates to a detector, a surface texture measuring device, and a measuring method.

When measuring the surface texture of the object to be measured by bringing the contactor into contact with the object to be measured, due to the presence of fine foreign matter such as dust and dirt adhering to the surface of the object to be measured, There is a problem that the measurement data is affected.

In the past, the measurer confirmed the measurement data, and if it was affected by a foreign substance, remeasured it to deal with the influence on the measurement data caused by the minute foreign substance. In addition, it is possible to perform a filter process to which a mathematical filter is applied to remove the influence of foreign matter from the measurement data.

Patent Document 1 describes a surface property measuring device that measures the same portion twice and determines the portion changed between the two measurements as dust. The device described in the document automatically identifies and corrects the presence of debris to avoid the output of erroneous measurement results.

Japanese Unexamined Patent Publication No. 5-264213

However, conventional measures require the measurer to check the measurement data for each measurement, which can be an obstacle to the automation of measurement. Further, when the filter processing is applied to the measurement data, it is difficult to determine whether the measurement data to be filtered represents the actual shape of the measurement target or the influence of a foreign substance.

Further, the apparatus described in Patent Document 1 is based on the premise that the foreign matter receives some displacement due to the measurement, but when the displacement of the foreign matter is minute, the measurement data is measured between the two measurements. Does not change. Then, the measurement data is processed as representing the shape of the object to be measured. Further, when the change between the two measurements is minute, it is difficult to distinguish whether the change is due to a foreign substance or a measurement error.

The present invention has been made in view of such circumstances, and an object of the present invention is to provide a detector, a surface property measuring device, and a measuring method capable of suppressing the influence of a foreign substance on the measurement data of a measurement object.

In order to achieve the above object, the following aspects of the invention are provided.

The detector according to the first aspect is a contactor that comes into contact with the object to be measured, an arm to which the contactor is attached to the tip, and a cleaning member that is attached to the tip of the arm, and measures by contacting the object to be measured. A cleaning member that removes foreign matter adhering to the object, a contact switching unit that switches between contacting the contact with the object to be measured or contacting the cleaning member, and either the contact or the cleaning member via an arm. It is a detector provided with a measuring force applying unit that applies urging force to the object and a displacement detecting unit that detects the displacement of the contactor via the arm.

According to the first aspect, when measuring an object to be measured, a contactor attached to the tip of the arm is brought into contact with the object to be measured. When removing foreign matter from the object to be measured, a cleaning member attached to the tip of the arm instead of the contactor is brought into contact with the object to be measured. As a result, the adhesion of foreign matter to the object to be measured can be effectively suppressed.

In the second aspect, in the detector of the first aspect, the cleaning member is attached to the tip of the arm at a position opposite to the contacts with the arm interposed therebetween.

In the second aspect, the angle formed by the contactor and the cleaning member is preferably 180 degrees.

In the third aspect, in the detector of the first aspect or the second aspect, the contact switching unit rotates the arm or the detector with respect to the central axis of the arm to bring the contactor into contact with the object to be measured or to clean it. Switch whether to bring the members into contact.

According to the third aspect, it is easy to switch between the contact and the cleaning member.

The fourth aspect is the urging force applied to the cleaning member by using the measuring force applying unit when the cleaning member is brought into contact with the object to be measured in the detector of any one of the first to third aspects. It is provided with an urging direction switching unit that switches the direction of.

According to the fourth aspect, both the contactor when measuring the object to be measured and the cleaning member when removing the foreign matter can be provided with an urging force toward the object to be measured.

A fifth aspect is the detector according to any one of the first to fourth aspects, wherein the cleaning member has a curved contact surface in contact with the object to be measured.

According to the fifth aspect, the cleaning member can come into contact with the object to be measured even when the bus is displaced.

A sixth aspect is the detector according to any one of the first to fifth aspects, wherein the cleaning member has a distance from the central axis of the arm as a distance from the central axis of the arm to the outer circumference of the main body of the detector. It is supported in a position that exceeds it.

According to the sixth aspect, it is possible to suppress the interference between the main body of the detector and the object to be measured when the contactor and the cleaning member are brought into contact with the object to be measured.

In the seventh aspect, in the detector of any one of the first to sixth aspects, the cleaning member is located at a position where the distance from the central axis of the arm is the same as the distance from the central axis of the arm to the contactor. Supported by.

According to the seventh aspect, the contact position of the contactor with respect to the object to be measured and the contact position of the cleaning member can be the same. As a result, foreign matter adhering to the measurement target position can be removed. In addition, since unnecessary foreign matter is not removed from the object to be measured, consumption of the cleaning member can be suppressed.

The eighth aspect is the detector of any one of the first to seventh aspects, in which the measuring force applying unit is a contactor with respect to the measuring object when the cleaning member is brought into contact with the measuring object. An urging force of the same magnitude as the measuring force at the time of contact is applied.

According to the eighth aspect, when the foreign matter of the measurement object is removed by using the cleaning member, the same urging force as the measuring force is applied. As a result, deformation of the measurement target can be suppressed without applying an excessive urging force to the measurement target when removing the foreign matter of the measurement target.

The surface property measuring device according to the ninth aspect includes a detector for detecting the displacement of the object to be measured and a control device for controlling the measurement and cleaning of the object to be measured, and the detector is brought into contact with the object to be measured. A contactor, an arm to which the contactor is attached to the tip, and a cleaning member attached to the tip of the arm, which is a cleaning member that comes into contact with the object to be measured and removes foreign matter adhering to the object to be measured, and the object to be measured. A contact switching unit that switches whether the contactor is brought into contact with an object or the cleaning member is brought into contact with the object, and a measuring force applying unit that applies an urging force to either the contactor or the cleaning member via an arm. It is a surface property measuring device provided with a displacement detecting unit for detecting the displacement of the contactor via an arm.

According to the ninth aspect, the same effect as that of the first aspect can be obtained.

In the ninth aspect, the same items as those specified in the second to eighth aspects can be appropriately combined. In that case, the component responsible for the process or function specified in the detector can be grasped as the component of the surface texture measuring device responsible for the corresponding process or function.

A tenth aspect is the surface texture measuring device of the ninth aspect, in which the control device contacts the measuring object with a contact element when the cleaning member is brought into contact with the measuring object to clean the measurement object. Apply the procedure for measuring the object to be measured by contacting.

According to the tenth aspect, the removal of foreign matter of the object to be measured can be automated by applying the same procedure as the measurement of the object to be measured. In addition, it is not necessary to create a procedure for removing foreign matter, and the cost of creating a procedure for removing foreign matter can be reduced.

The eleventh aspect is the surface texture measuring device of the ninth aspect or the tenth aspect, in which the control device performs the measurement of the measurement object after removing the foreign matter of the measurement object.

According to the eleventh aspect, the measurement of the object to be measured can be performed immediately after the foreign matter is removed from the object to be measured. In addition, it is possible to suppress the adhesion of foreign matter to the object to be measured.

In the eleventh aspect, after removing the foreign matter collectively at a plurality of measurement target positions, the measurement may be performed collectively at the plurality of measurement target positions. According to such an aspect, the number of times of switching between the contact and the cleaning member can be reduced, and the period spent for measurement and removal of foreign matter can be shortened.

In the twelfth aspect, in the surface property measuring device of any one of the ninth to eleventh aspects, the control device analyzes the measurement data of the measurement object output from the displacement detection unit and is affected by the foreign matter. Equipped with a measurement data processing unit that determines the presence or absence of measured data, the control device brings the cleaning member into contact with the measurement object when there is measurement data affected by the foreign matter, and the foreign matter adheres to the measurement object. To remove.

According to the twelfth aspect, the foreign matter can be removed if necessary. This can reduce the time spent removing foreign matter.

In the thirteenth aspect, in the surface property measuring device of any one of the ninth to twelfth aspects, the control device includes a cleaning number determination unit for determining whether or not the number of cleanings of the object to be measured exceeds the specified number of times. If the number of times the measurement object is cleaned is less than or equal to the specified number of times, the control device will perform subsequent cleaning of the measurement object, and if the number of times the measurement object is cleaned exceeds the specified number of times, the subsequent measurement object will be cleaned. Cleaning will not be carried out.

According to the thirteenth aspect, it is possible to reduce the generation of measurement data due to the adhesion of foreign matter to the object to be measured. In addition, it is possible to balance the improvement of measurement reliability with the reduction of the period spent for measurement.

In the 14th aspect, in the surface property measuring device of any one of the 9th to 13th aspects, the control device includes a measurement target position where the foreign matter has been removed and a measurement target position where the foreign matter has not been removed. It is provided with a cleanliness calculation unit for calculating the cleanliness of the measurement object represented by the ratio of.

According to the fourteenth aspect, the cleanliness of the object to be measured can be evaluated.

The measuring method according to the fifteenth aspect is a measuring method in which a contactor attached to the tip of an arm is brought into contact with a measuring object to measure the surface texture of the measuring object. On the other hand, a contact switching step of contacting the cleaning member attached to the tip of the arm, an urging force applying step of applying urging force to the cleaning member via the arm, and cleaning contacting the object to be measured. A measurement method including a removal step of removing foreign matter adhering to a measurement object using a member.

According to the fifteenth aspect, the same effect as that of the first aspect can be obtained.

In the fifteenth aspect, the same items as those specified in the second to eighth aspects and the tenth to fourteenth aspects can be appropriately combined. In that case, the component responsible for the process or function specified in the detector and the surface texture measuring device can be grasped as the component of the measurement method responsible for the corresponding process or function.

According to the present invention, when measuring an object to be measured, a contactor attached to the tip of the arm is brought into contact with the object to be measured. When removing foreign matter from the object to be measured, a cleaning member attached to the tip of the arm instead of the contactor is brought into contact with the object to be measured. As a result, the adhesion of foreign matter to the object to be measured can be effectively suppressed.

FIG. 1 is an overall configuration diagram of the detector according to the first embodiment. FIG. 2 is a schematic diagram of measurement of a measurement object using the detector shown in FIG. FIG. 3 is a schematic view of the adsorbent according to the first modification. FIG. 4 is an overall configuration diagram of the detector according to the second modification. FIG. 5 is an overall configuration diagram of a roundness measuring device to which the detector shown in FIG. 1 is applied. FIG. 6 is a functional block diagram of the roundness measuring device shown in FIG. FIG. 7 is a flowchart showing a procedure of a measuring method applied to the roundness measuring apparatus shown in FIG. FIG. 8 is a flowchart showing the procedure of the measurement method according to the second embodiment. FIG. 9 is a functional block diagram of the roundness measuring device according to the third embodiment. FIG. 10 is a flowchart showing the procedure of the measurement method according to the third embodiment. FIG. 11 is a schematic diagram of measurement data analysis according to a modified example of the third embodiment. FIG. 12 is an overall configuration diagram of the detector according to the application example. FIG. 13 is an explanatory view of a mode in which a contactor is attached instead of the adsorbent in the detector shown in FIG.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the present specification, the same components are designated by the same reference numerals, and duplicate description will be omitted as appropriate.

[First Embodiment]
[Overall configuration of detector]
FIG. 1 is an overall configuration diagram of the detector according to the first embodiment. A lever type detector is applied to the detector 100 shown in the figure. The detector 100 includes a contact 102, an arm 104, a measuring force applying mechanism 106, and a displacement sensor 108.

The contact 102 is attached to the tip 104B of the arm 104 that is swingably supported at the swing fulcrum 104A. The swing fulcrum 104A is supported by the fixed portion 118. The arrow line with reference numeral 104E indicates the swing direction of the arm 104.

The tip 104B of the arm 104 means a portion of the arm 104 that includes the tip 104C of the arm 104 and has a constant length from the tip 104C of the arm 104 in the longitudinal direction of the arm 104.

When the contactor 102 is brought into contact with the object to be measured 110, the measuring force applying mechanism 106 applies a measuring force, which is an urging force toward the object to be measured 110, to the contact 102. In FIG. 1, the measurement force is not shown. Measuring force is shown in Figure 2 by reference numeral F _M. Further, in FIG. 1, the measurement object 110 is not shown as a whole but only a part thereof. The same applies to FIG. 2 and the like.

The displacement sensor 108 detects the displacement of the displacement detection position 112 of the arm 104. The displacement detection position 112 is the position of the arm 104 on the side opposite to the contact 102 with the swing fulcrum 104A of the arm 104 interposed therebetween. FIG. 1 shows an embodiment in which the base end of the arm 104 is applied to the displacement detection position 112.

The displacement sensor 108 outputs measurement data representing the displacement of the displacement detection position 112. FIG. 1 schematically illustrates the displacement sensor 108 using a scale fixedly supported by the fixed portion 118.

In the detector 100, the adsorbent 114 is attached to the tip portion 104B of the arm 104 at a position symmetrical with the contactor 102 across the central axis 104D of the arm 104. Distance _{L C} of the center axis 104D of arm 104 from the tip 114A of the adsorbent 114 is the same as the distance _{L M} from the distal end 102A of the contact 102 to the center axis 104D of arm 104. The same here may include a certain error.

The detector 100 brings the adsorbent 114 into contact with the object to be measured 110 and wipes off fine foreign substances such as dust and dirt adhering to the object to be measured 110. Chamois leather is an example of the material of the adsorbent 114.

The detector 100 includes a contact switching unit that switches between contacting the contact element 102 and contacting the adsorbent 114 with the object to be measured 110. The contact switching unit may apply an embodiment in which the detector 100 is rotated around the central axis 104D of the arm 104 as a rotation axis.

The contact switching unit may apply an embodiment in which the arm 104 is rotated around the central axis 104D of the arm 104 as a rotation axis. In FIG. 1, the contact switching portion is not shown. The contact switching unit is designated by reference numeral 76 and is shown in FIG.

Measuring force applying mechanism 106, when contacting the adsorbent 114 with respect to the measurement object 110, imparts force _{F C} with towards the measurement object 110 with respect to the adsorbent 114. Further, the measuring force applying mechanism 106 applies a measuring force toward the measuring object 110 to the contact 102 when the contactor 102 is brought into contact with the measuring object 110. The state in which the contactor 102 is brought into contact with the object to be measured 110 is shown in FIG. FIG. 1 schematically illustrates a measuring force applying mechanism 106 using a coil spring.

That is, the detector 100 includes an urging direction switching unit that switches the direction of the urging force applied by using the measuring force applying mechanism 106. In FIG. 1, the urging direction switching portion is not shown. The urging direction switching unit is designated by reference numeral 78 and is shown in FIG.

The detector 100 brings the adsorbent 114 into contact with the object to be measured 110. When cleaning the measurement object 110, the measurement object 110 rotates. Reference numeral 110A indicates the rotation direction of the object to be measured 110.

The adsorbent 114 described in the embodiment corresponds to an example of a cleaning member. The measuring force applying mechanism 106 described in the embodiment corresponds to an example of the measuring force applying unit. The displacement sensor 108 described in the embodiment corresponds to an example of a displacement detection unit.

FIG. 2 is a schematic diagram of measurement of a measurement object using the detector shown in FIG. FIG. 2 illustrates a state in which the detector 100 is rotated 180 degrees with respect to the detector 100 shown in FIG. 1 with respect to the central axis 104D of the arm 104.

The detector 100 brings the contactor 102 into contact with the object to be measured 110. Measuring force applying mechanism 106 imparts a measuring force _{F M} facing the measurement object 110 with respect to the contact 102. Measuring force applying mechanism 106, the measuring force F _M and the urging force F _C as the same value, can perform a measurement and cleaning of the measuring object 110 to be measured 110. It is also a measuring force F _M and the urging force F _C different values.

Measuring force applying mechanism 106, to give a biasing force F _C to the adsorbent 114, switching the urging direction relative to the case of providing the measuring force F _M in the contact 102. The measuring force applying mechanism 106, which is illustrated with a broken line in FIG. 2, shows a state before switching the urging direction.

On the other hand, the measuring force applying mechanism 106 shown by the solid line shows the state after switching the urging direction. The arrow line using the broken line attached to the measuring force applying mechanism 106 represents the moving direction of the measuring force applying mechanism 106 when switching the urging direction.

[Action and effect of the detector according to the first embodiment]
According to the detector 100 configured as described above, the following effects can be obtained.

[1]
The adsorbent 114 is attached to the contactor 102 attached to the tip portion 104B of the arm 104 at a position opposite to the contactor 102 with the central axis 104D of the arm 104 interposed therebetween. The contact switching unit is used to switch between contacting the adsorbent 114 and contacting the contactor 102 with the object to be measured 110. As a result, the detector 100 can be used to remove the foreign matter adhering to the object to be measured 110. In addition, it is possible to automate the removal of foreign matter by using a measurement algorithm using the detector 100.

[2]
The adsorbent 114 is attached to the contactor 102 attached to the tip portion 104B of the arm 104 at a position symmetrical with respect to the central axis 104D of the arm 104. As a result, the adsorbent 114 can be brought into contact with the measurement position where the contactor 102 is brought into contact with the measurement object 110, and the foreign matter existing at the measurement position can be removed. Further, since the cleaning is not performed except at the measurement position, the consumption of the adsorbent 114 can be suppressed, and the adsorbent 114 lasts a long time.

[3]
Measuring force applying mechanism 106, when contacting the adsorbent 114 with respect to the measurement object 110, the biasing force _{F C} in the direction towards the measurement object 110 is given to the adsorbent 114. Thus, removal of the foreign matter is possible the measuring object 110 using the adsorbent 114 that imparts a biasing force F _C provisions.

[4]
Measuring force applying mechanism 106, the same value as the measuring force F _M applied when the biasing force F _C, to measure the measurement target 110 to impart to the measurement target 110 during the cleaning of the measuring object 110 To do. Thus, during the cleaning of the measuring object 110 using the adsorbent 114, the excess biasing force F _C that exceeds the measuring force F _M without adding to the measurement object 110, deformation of the measuring object 110, etc. Can be suppressed.

[First modification of detector]
FIG. 3 is a schematic view of the adsorbent according to the first modification. In the detector 100B shown in FIG. 3, the shape of the adsorbent 114B when viewed from the upper side to the lower side in the vertical direction is circular. In other words, the adsorbent 114B includes a curved surface on the contact surface 114C that comes into contact with the object to be measured 110. As an example of the curved surface forming the contact surface 114C of the adsorbent 114B shown in FIG. 3, a part of a spherical surface can be mentioned. The overall shape of the adsorbent 114B may be spherical.

According to the detector 100B according to the first modification, even if the contact position 122 of the actual adsorbent 114B deviates from the bus 121 of the measurement object 110, the adsorbent 114B is attached to the measurement object 110. Since they are in contact with each other, foreign matter can be removed at the contact position 122 of the adsorbent 114B even if the bus is displaced.

[Second modification of the detector]
FIG. 4 is an overall configuration diagram of the detector according to the second modification. In the detector 100C shown in FIG. 4, the stylus 130 has a total length exceeding the total width of the detector main body 101. The stylus 130 has a contactor 102 attached to one end and an adsorbent 114 attached to the other end.

If the full width of the detector body 101 is D, the distance _{L C} from the central axis 104D of arm 104 to the contact surface 114C of the adsorbent 114 of the adsorbent 114 _satisfies L C> D / 2. In other words, the distance _{L C} from the central axis 104D of arm 104 to the contact surface 114C of the adsorbent 114 of the adsorbent 114 is greater than the distance from the center axis 104D of arm 104 to the outer peripheral surface 101A of the detector body 101.

Similarly, the distance _{L M} of the center axis 104D of arm 104 to the tip 102A of the contact 102 _satisfies L M> D / 2. In other words, the distance _{L M} of the center axis 104D of arm 104 to the tip 102A of the contact 102 is greater than the distance from the center axis 104D of arm 104 to the outer peripheral surface 101A of the detector body 101.

According to the detector 100C according to the second modification, when the adsorbent 114 is brought into contact with the measurement object 110, the contact between the measurement object 110 and the detector main body 101 can be avoided. Similarly, when the contactor 102 is brought into contact with the measurement object 110, the contact between the measurement object 110 and the detector main body 101 can be avoided.

[Third modification of the detector]
FIG. 1 and the like exemplify an embodiment in which the adsorbent 114 is attached to the tip 104B of the arm 104 at a position opposite to the contactor 102 with the central axis 104D of the arm 104 interposed therebetween. The adsorbent 114 may be attached at a position on the same side as the contactor 102.

That is, when the direction of the central axis 104D of the arm 104 is viewed from the tip 104C of the arm 104, the angle formed by the contactor 102 and the adsorbent 114 may be an angle of more than 0 degrees and less than 180 degrees. However, considering the ease of switching between the contact 102 and the adsorbent 114, ensuring the sameness between the measurement target position and the cleaning target position, etc., the angle formed by the contact 102 and the adsorbent 114 is preferably 180 degrees. .. The 180 degrees referred to here may include an error within an allowable range.

In the present embodiment, the embodiment in which the central axis 104D of the arm 104 is along the vertical direction is illustrated, but the embodiment in which the central axis 104D of the arm 104 is along the horizontal direction orthogonal to the vertical direction is also possible.

[Example of application to roundness measuring device]
FIG. 5 is an overall configuration diagram of a roundness measuring device to which the detector shown in FIG. 1 is applied. The roundness measuring device 10 shown in FIG. 5 brings the contactor 102 into contact with the measurement target portion of the work 9 to measure the work 9. The roundness measuring device 10 can analyze the measurement data of the work 9 to derive geometrical tolerances such as the cylindricity and the roundness of the work 9. The work 9 corresponds to the measurement object 110 shown in FIG. 1 and the like.

The roundness measuring device 10 includes a base 11. The base 11 is a support base that supports each part of the roundness measuring device 10. The support base may be called a base. The roundness measuring device 10 includes a table 13. The table 13 is sometimes called a loading platform.

The table 13 has a disk shape and is attached to the upper surface of the base 11. The table 13 is rotatably supported by the base 11 at a position of a rotation shaft 22 that passes through the center of the table 13 and extends in the vertical direction. The inclination of the table 13 with respect to the reference plane is adjusted so as to be parallel to the reference plane in the horizontal direction.

Here, the term upward in the present specification means a vertical upward direction. The term downward refers to the vertical downward direction.

A gripper is attached to the upper surface of the table 13. The gripper grips the base end portion of the work 9 when the work 9 is placed on the upper surface of the table 13. As the gripping tool, a three-claw scroll chuck may be applied. The illustration of the gripper is omitted.

The work 9 is placed on the upper surface of the table 13 so that the shape center of the measurement target portion coincides with the rotation axis 22 of the table 13. FIG. 5 shows an example in which the outer peripheral surface of the cylindrical work 9 is the measurement target portion, and the work 9 is placed so that the central axis of the cylinder coincides with the rotation axis 22 of the table 13.

The roundness measuring device 10 includes a motor 14. The motor 14 is arranged inside the base 11. The rotation shaft of the motor 14 is connected to the drive shaft of the table 13 via the drive transmission mechanism 20. The motor 14 rotates the table 13 around the rotation shaft 22 as the center of rotation. The drive transmission mechanism 20 may include gears and the like.

The roundness measuring device 10 includes a column 15, a carriage 16, a horizontal arm 17, and a detector 100. The column 15 is the upper surface of the base 11 and is arranged on the side side of the base 11 in the horizontal direction. Column 15 is a pillar extending in the vertical direction.

The column 15 supports the carriage 16 to which the horizontal arm 17 is movably attached in the horizontal direction so as to be able to move up and down. A detector 100 is attached to the tip of the horizontal arm 17. Here, a detailed description of the detector 100 will be omitted. Reference numeral A represents the moving direction of the contactor 102 and the adsorbent 114.

The roundness measuring device 10 includes a control device 19, a display device 19A, and an input device 19B. A display device 19A and an input device 19B are connected to the control device 19. The display device 19A may apply a display device such as a liquid crystal display. The input device 19B may apply a keyboard and a mouse. A touch panel type display device may be applied to the display device 19A, and the display device 19A and the input device 19B may be used in combination.

The measurement data of the work 9 output from the detector 100 is transmitted to the control device 19. The control device 19 derives a measurement result such as the roundness of the work 9 based on the measurement data of the work 9. The display device 19A displays the measurement result of the work 9.

The input device 19B inputs information such as measurement conditions when carrying out the measurement of the work 9 to the control device 19. The control device 19 controls the operations of the motor 14, the carriage 16, and the detector 100 based on the measurement conditions input by using the control device 19.

[Explanation of control device]
FIG. 6 is a functional block diagram of the roundness measuring device shown in FIG. The roundness measuring device 10 includes a control device 19. The control device 19 includes a measurement data acquisition unit 40, a measurement data processing unit 42, a measurement data storage unit 44, and a processing result storage unit 46.

The measurement data acquisition unit 40 acquires the measurement data of the work 9 transmitted from the displacement sensor 108 provided in the detector 100. The measurement data acquisition unit 40 stores the measurement data acquired through the measurement data acquisition unit 40 using the measurement data storage unit 44.

The measurement data processing unit 42 processes the measurement data acquired via the measurement data acquisition unit 40. The measurement data processing unit 42 stores the processing result using the processing result storage unit 46.

The control device 19 includes a display control unit 48. The display control unit 48 controls the display device 19A. The display control unit 48 converts an electric signal corresponding to the information to be displayed on the display device 19A into a display signal, and transmits the display signal to the display device 19A. The display device 19A displays the information represented by the display signal transmitted from the display control unit 48.

The control device 19 includes a measuring force applying control unit 50 and a measuring force setting unit 52. The measuring force applying control unit 50 controls the operation of the measuring force applying mechanism 106 provided in the detector 100 based on the set value of the measuring force applying mechanism 106 applied to the measurement of the work 9.

The measuring force setting unit 52 acquires the set value of the measuring force applying mechanism 106. The measuring force setting unit 52 can acquire the set value of the measuring force applying mechanism 106 input by using the input device 19B or the like. The measuring force setting unit 52 transmits the acquired set value of the measuring force applying mechanism 106 to the measuring force applying control unit 50.

The control device 19 includes a drive control unit 60. The drive control unit 60 controls the operation of the drive mechanism 62 based on the operation parameters of the drive mechanism 62. The drive mechanism 62 may include, in FIG. 5, a motor 14 for rotating the table 13, a motor for operating the carriage 16, and a motor for operating the horizontal arm 17.

The control device 19 includes an input unit 64. The input unit 64 acquires an input signal transmitted from the input device 19B. The input unit 64 transmits information corresponding to the input signal to each unit of the control device 19. For example, when the set value of the control parameter is input using the input device 19B, the input unit 64 transmits the control parameter corresponding to the acquired input signal to the corresponding control unit.

The control device 19 includes a program storage unit 66. The program storage unit 66 stores various programs applied to the roundness measuring device 10 and the control device 19. An example of a program is a cylindricity measurement program applied to cylindricity measurement.

The control device 19 includes a mode setting unit 70. The mode setting unit 70 sets the operation mode of the roundness measuring device 10 based on the operation mode information input via the input unit 64. The roundness measuring device 10 may carry out either a measurement mode or a cleaning mode as an operation mode. The measurement mode is an operation mode for setting the work 9. The cleaning mode is an operation mode for cleaning the work 9.

The control device 19 includes a contact switching control unit 72 and an urging direction switching control unit 74. The contact switching control unit 72 controls the operation of the contact switching unit 76 provided in the detector 100 according to the operation mode of the roundness measuring device 10.

The contact switching unit 76 switches whether the contact element 102 is brought into contact with the work 9 or the adsorbent 114 is brought into contact with the work 9 based on the control signal transmitted from the contact switching control unit 72. For example, when the measurement mode is set, the contact switching unit 76 brings the contact element 102 into contact with the work 9. When the cleaning mode is set, the contact switching unit 76 brings the adsorbent 114 into contact with the work 9.

The urging direction switching control unit 74 controls the operation of the urging direction switching unit 78 provided in the detector 100. The urging direction switching unit 78 refers to the contact element 102 or the adsorbent 114 when the contact element 102 is brought into contact with the work 9 in the measurement mode and when the adsorbent 114 is brought into contact with the work 9 in the cleaning mode. Switch the direction of the urging force given.

[Hardware configuration of control device]
The control device 19 may apply a computer. The control device 19 executes a specified program to realize the function of the roundness measuring device 10 by using the hardware described below. The hardware of each control unit may apply various processors and various memories. An example of a processor is a CPU (Central Processing Unit). The CPU executes a program and functions as various processing units. Examples of the memory include ROM (Read Only Memory) and RAM (Random Access Memory).

[Measurement method procedure]
FIG. 7 is a flowchart showing a procedure of a measuring method applied to the roundness measuring apparatus shown in FIG. In the moving step S10, the drive control unit 60 shown in FIG. 6 operates the drive mechanism 62 to move the detector 100 to an unmeasured measurement target position on the work 9. After the moving step S10, the process proceeds to the cleaning step S12.

In the cleaning step S12, the mode setting unit 70 sets the operation mode to the cleaning mode. That is, in the cleaning step S12, the contact switching control unit 72 operates the contact switching unit 76 to bring the adsorbent 114 into contact with the work 9.

Further, in the cleaning step S12, the urging direction switching control unit 74 operates the urging direction switching unit 78, to impart force F _C with directed from the adsorbent 114 to the work 9 against the adsorbent 114.

Furthermore, in the cleaning step S12, the drive control unit 60 operates the drive mechanism 62 to rotate the work 9, and cleans the work 9 using the adsorbent 114. After the cleaning step S12, the process proceeds to the measurement step S14.

In the cleaning step S12 described in the embodiment, the step of bringing the adsorbent 114 into contact with the work 9 corresponds to an example of the contact switching step. In the cleaning step S12 in described embodiment, applying a force F _C with directed from the adsorbent 114 to the work 9 relative adsorbent 114 corresponds to an example of a biasing force applying step. The cleaning step S12 described in the embodiment corresponds to an example of the removing step.

In the measurement step S14, the contact switching control unit 72 sets the operation mode to the measurement mode. Further, in the measurement step S14, the contact switching control unit 72 operates the contact switching unit 76, and the contact switching control unit 72 brings the contactor 102 into contact with the work 9.

Furthermore, the measuring step S14, the urging direction switching controller 74 operates the urging direction switching unit 78, imparts measuring force F _M directed from the contact 102 to the work 9 against the contact 102.

Furthermore, in the measurement step S14, the drive control unit 60 operates the drive mechanism 62, rotates the work 9, and measures the work 9 using the contact 102. The detector 100 transmits the measurement data of the work 9 to the control device 19. After the measurement step S14, the process proceeds to the measurement determination step S16.

In the measurement step S14 described in the embodiment, the step of bringing the contactor 102 into contact with the work 9 corresponds to an example of the contact switching step.

In the measurement determination step S16, the measurement data acquisition unit 40 determines whether or not all the measurement target positions have been measured. That is, the measurement data acquisition unit 40 determines whether or not the measurement data at all the measurement target positions has been acquired.

In the measurement determination step S16, when the measurement data acquisition unit 40 determines that there is an unmeasured measurement target position, a No determination is made. In the case of No determination, the process proceeds to the moving step S10, and each step from the moving step S10 to the measurement determination step S16 is repeatedly carried out until a Yes determination is made in the measurement determination step S16.

On the other hand, in the measurement determination step S16, when the measurement data acquisition unit 40 determines that all the measurement target positions have been measured, the determination is Yes. In the case of Yes determination, the control device 19 executes a specified termination process to terminate the measurement method.

[Action and effect of the measurement method according to the first embodiment]
According to the measurement method according to the first embodiment, the following effects can be obtained.

[1]
For each measurement target position, the measurement target position is cleaned before measurement. As a result, it is possible to measure each measurement target position immediately after the foreign matter is removed.

[2]
Measurement is performed immediately after cleaning is performed for each measurement target position. This makes it possible to reduce the possibility of foreign matter adhering to the measurement target position during measurement.

[Second Embodiment]
FIG. 8 is a flowchart showing the procedure of the measurement method according to the second embodiment. The measuring method according to the second embodiment can be carried out by using the roundness measuring device 10 to which the detector 100 according to the first embodiment is applied.

In the measurement method according to the second embodiment, all the measurement target positions are cleaned in the cleaning mode, the operation mode is switched to the measurement mode, and all the measurement target positions are measured in the measurement mode.

In the cleaning mode setting step S100, the mode setting unit 70 sets the operation mode to the cleaning mode. In the cleaning mode setting step S100, as in the cleaning step S12 of FIG. 7, switching of contacting the adsorbent 114 with the work 9 and switching of the urging direction with respect to the adsorbent 114 are performed. After the cleaning mode setting step S100, the process proceeds to the first moving step S102.

The first moving step S102 corresponds to the moving step S10. After the first moving step S102, the process proceeds to the cleaning step S104. In the cleaning step S104, as in the cleaning step S12, cleaning is performed for each measurement target position using the adsorbent 114.

In the cleaning step S104, cleaning for each measurement target position is performed collectively, so that the measurement program applied to the measurement step S14 can be applied. After the cleaning step S104, the process proceeds to the cleaning determination step S106.

In the cleaning determination step S106, the control device 19 determines whether or not all the measurement target positions have been cleaned. The control device 19 subtracts the number of times the first moving step is performed from the number of measurement target positions, and when the subtraction result is 0 or less, it can be determined that all the measurement target positions have been cleaned.

In the cleaning determination step S106, when the control device 19 determines that there is an uncleaned measurement target position, a No determination is made. In the case of No determination, the process proceeds to the first moving step S102, and each step from the first moving step S102 to the cleaning determination step S106 is repeatedly carried out until a Yes determination is made in the cleaning determination step S106.

On the other hand, in the cleaning determination step S106, when the control device 19 determines that all the measurement target positions have been cleaned, the determination is Yes. In the case of Yes determination, the process proceeds to the measurement mode setting step S108.

In the measurement mode setting step S108, the mode setting unit 70 sets the operation mode to the measurement mode. In the measurement mode setting step S108, switching for bringing the contactor 102 into contact with the work 9 and switching for the biasing direction with respect to the contactor 102 are performed. After the measurement mode setting step S108, the process proceeds to the second moving step S110.

In the second moving step S110, the same processing as in the first moving step S102 is carried out. After the second moving step S110, the process proceeds to the measuring step S112. In the measurement step S112, similarly to the measurement step S14, the contactor 102 is brought into contact with the measurement target position, and measurement is performed for each measurement target position. In the measurement step S112, the same measurement program as in the measurement step S14 is applied. After the measurement step S112, the process proceeds to the measurement determination step S114.

In the measurement determination step S114, similarly to the measurement determination step S16, the measurement data acquisition unit 40 determines whether or not all the measurement target positions have been measured. In the measurement determination step S114, when the measurement data acquisition unit 40 determines that there is an unmeasured measurement target position, a No determination is made. In the case of No determination, the process proceeds to the second movement step S110, and each step from the second movement step S110 to the measurement determination step S114 is repeatedly carried out until a Yes determination is made in the measurement determination step S114.

On the other hand, in the measurement determination step S114, when the measurement data acquisition unit 40 determines that all the measurement target positions have been measured, the determination is Yes. In the case of Yes determination, the control device 19 executes a specified termination process to terminate the measurement method.

[Action and effect of the second embodiment]
According to the second embodiment, the following effects can be obtained.

[1]
Since the number of times of switching between the cleaning mode and the measurement mode is smaller than that of the measurement method according to the first embodiment, the entire implementation period of the measurement method can be shortened.

[2]
In the cleaning step S104, the same program as in the measuring step S112 is applied. As a result, it is not necessary to create a program for the cleaning process applied to the cleaning step S104, and the cost required for creating the program can be reduced.

[Third Embodiment]
FIG. 9 is a functional block diagram of the roundness measuring device according to the third embodiment. In the roundness measuring device 10A according to the third embodiment, the control device 19C has a cleaning count determination unit 80, a cleaning count setting unit 82, and a cleaning count storage unit 84 with respect to the roundness measuring device 10 shown in FIG. Will be added.

The cleaning count determination unit 80 determines whether or not the cleaning count of the work 9 exceeds the predetermined number of cleanings. As the number of cleanings, the number of times the cleaning steps S12 of FIG. 7 and the cleaning process S104 of FIG. 8 are carried out can be applied. The control device 19C cleans the work 9 when the number of times the work 9 is cleaned is less than or equal to the specified number of times, and does not clean the work 9 when the number of times the work 9 is cleaned exceeds the specified number of times.

The cleaning number setting unit 82 sets the maximum number of cleanings. The maximum number of cleanings may be a fixed value or a variable value. The cleaning count storage unit 84 stores the number of cleanings actually performed.

FIG. 10 is a flowchart showing the procedure of the measurement method according to the third embodiment. In the measurement method according to the third embodiment, when measurement data affected by a foreign substance is found during analysis of the measurement data, remeasurement is performed immediately after cleaning the work 9. The analysis of the measurement data is performed using the measurement data processing unit 42 shown in FIG.

In the first measurement step S200, the control device 19 performs measurement with respect to an unmeasured measurement target position. In the first measurement step S200, the same processing as in the measurement step S14 is performed, and measurement is performed for all the measurement target positions. After the first measurement step S200, the process proceeds to the first measurement data determination step S202.

In the first measurement data determination step S202, the measurement data processing unit 42 determines the presence or absence of measurement data affected by the foreign matter. An example of measurement data affected by a foreign substance is measurement data with abrupt changes.

In the first measurement data determination step S202, when the measurement data processing unit 42 determines that there is no measurement data affected by the foreign matter, a No determination is made. In the case of No determination, the process proceeds to the measurement determination step S204.

In the first measurement data determination step S202, when the measurement data processing unit 42 determines that there is measurement data affected by a foreign substance, a Yes determination is made. In the case of Yes determination, the process proceeds to the cleaning step S206.

The measurement determination step S204 corresponds to the measurement determination step S16. In the case of No determination in the measurement determination step S204, the process proceeds to the first measurement step S200, and each step from the first measurement step S200 to the measurement determination step S204 is repeatedly carried out until a Yes determination is made in the measurement determination step S204.

On the other hand, in the case of Yes determination in the measurement determination step S204, the control device 19 executes a specified termination process to terminate the measurement method.

In the cleaning step S206, the control device 19 cleans the measurement target position corresponding to the measurement data affected by the foreign matter. The cleaning step S206 corresponds to the cleaning step S12. After the cleaning step S206, the process proceeds to the second measurement step S208.

In the second measurement step S208, the control device 19 measures the measurement target position cleaned in the cleaning step S206. The second measurement step S208 corresponds to the cleaning step S12. After the second measurement step S208, the process proceeds to the cleaning frequency determination step S210.

In the cleaning number determination step S210, the cleaning number determination unit 80 determines whether or not the number of times the cleaning step S206 is performed exceeds the specified number of times. In the cleaning number determination step S210, when the cleaning number determination unit 80 determines that the number of times the cleaning step S206 is performed is equal to or less than the specified number, a No determination is made. In the case of No determination, the process proceeds to the second measurement data determination step S212.

On the other hand, in the cleaning number determination step S210, when the cleaning number determination unit 80 determines that the number of times the cleaning step S206 is performed exceeds the specified number, a Yes determination is made. In the case of Yes determination, the process proceeds to the first measurement step S200.

That is, in the case of No determination in the cleaning frequency determination step S210, the subsequent measurement of the work 9 is not performed. On the other hand, in the case of Yes determination in the cleaning number determination step S210, the subsequent measurement of the work 9 is carried out.

When the number of times the cleaning step S206 is performed exceeds the specified number of times, the measurement data determined to be the measurement data affected by the foreign matter in the first measurement data determination step S202 is stored as the actual measurement data of the work 9. That is, it is determined that the measurement data obtained in the measurement immediately after the cleaning step S206 is performed one or more times and sufficient cleaning is performed is not affected by the foreign matter.

In the second measurement data determination step S212, similarly to the first measurement data determination step S202, the measurement data processing unit 42 determines the presence or absence of measurement data affected by the foreign matter. In the case of No determination in the second measurement data determination step S212, the process proceeds to the first measurement step S200.

That is, in the case of the No determination in the second measurement data determination step S212, it is determined that the foreign matter at the measurement target position has been removed and the measurement data not affected by the foreign matter has been acquired. Such measurement data is stored as measurement data of the actual work 9.

On the other hand, in the case of Yes determination in the second measurement data determination step S212, the process proceeds to the cleaning step S206, and each step from the cleaning step S206 to the cleaning number determination step S210 is performed until a Yes determination is made in the cleaning number determination step S210. Repeat.

The roundness measuring device 10A according to the third embodiment may include a cleanliness calculation unit that calculates a ratio between a cleaning-implemented measurement target position that has been cleaned and a non-cleaning measurement target position that has not been cleaned. The cleanliness of the surface of the work 9 may be evaluated based on the calculation result of the cleanliness calculation unit. When calculating such a ratio, a weighting coefficient corresponding to the number of cleanings for each measurement target position may be used for the cleaning execution measurement target position.

[Action and effect of the third embodiment]
According to the third embodiment, the following effects can be obtained.

[1]
Based on the analysis result of the measurement data, cleaning is performed at each measurement target position as necessary. As a result, the period spent for cleaning the work 9 can be reduced as compared with the measurement method according to the first embodiment and the measurement method according to the second embodiment.

[2]
The maximum number of times the cleaning step S206 is performed is specified. As a result, it is possible to suppress the possibility that the measurement data affected by the foreign matter remains in the entire measurement data of the work 9. In addition, it is possible to balance the improvement of measurement reliability with the reduction of the period spent for measurement.

[3]
Calculate the ratio between the measurement target position that has been cleaned and the measurement target position that has not been cleaned. Thereby, the cleanliness of the surface of the work 9 can be evaluated.

[Modified example of the third embodiment]
FIG. 11 is a schematic diagram of measurement data analysis according to a modified example of the third embodiment. FIG. 11 shows a graph 200 in which the position on the contour of the rotating cross section at the measurement target position is on the horizontal axis and the measured value of the displacement sensor 108 is on the vertical axis.

The curve shown by the dotted line in the graph 200 shows the measurement data 202 before cleaning. The measurement data before cleaning is the measurement data acquired in the first measurement step S200 of FIG.

The curve illustrated with the solid line in the graph 200 shows the measurement data 204 after cleaning. The measurement data after cleaning is the measurement data acquired in the second measurement step S208 of FIG.

The measurement data 202 before cleaning includes the protrusion shape 202A, which is a sudden change. Similarly, the measurement data 204 after cleaning includes the protrusion shape 204A. The appearance position _{P 1} of the projecting shapes 202A in cleaning prior measurement data 202, if the appearance position _{P 2} of the projection-shaped 204A is different in the measurement data 204 after cleaning of the appearance position _{P 1} foreign matter into appearance position _{P 2} deposition of new foreign matter into movement and appearance position P ₂ can be considered.

In such a case, the measurement data in the measurement data and the occurrence position P ₂ in appearance position P ₁ are all determined to measured data affected by foreign substances, cleaning of the measuring points including appearance position P ₁ and the appearance position P ₂ Is carried out.

According to the modified example of the third embodiment, the measurement data affected by the foreign matter can be accurately recognized, and the foreign matter can be removed by cleaning.

[Application example of detector]
FIG. 12 is an overall configuration diagram of the detector according to the application example. In the detector 300 shown in the figure, only the adsorbent 114 is attached to the tip portion 104B of the arm 104, and the contactor 102 shown in FIG. 1 and the like is not attached.

FIG. 13 is an explanatory view of a mode in which a contactor is attached instead of the adsorbent in the detector shown in FIG. That is, the detector 300 shown in FIG. 12 and the like has a structure in which the contactor 102 and the adsorbent 114 are replaced.

Detector 300 does not require switching of the biasing direction, the measuring force F _M applied to the measurement of the workpiece 9 can be applied as the biasing force F _C during cleaning work 9.

The roundness measuring device including the detector 300 detects whether the contact 102 or the adsorbent 114 is attached to the tip 104B of the arm 104, and automatically sets the measurement mode when the contact 102 is attached. If the adsorbent 114 is attached, the cleaning mode can be automatically performed.

The detector 300 shown in FIG. 12 and the like may be configured such that the tip portion 104B of the arm 104 can be exchanged. That is, the detector 300 may include an arm 104 configured so that the tip portion 104B of the arm 104 to which the contactor 102 is attached and the tip portion 104B of the arm 104 to which the adsorbent 114 is attached can be exchanged.

In the present embodiment, as an example of the surface texture measuring device for measuring the surface texture of the work 9, a roundness measuring device for measuring the cylindricity and the like of the work 9 has been described as an example, but the present invention is not limited to this. A surface property measuring device other than the circularity measuring device may be used.

In the embodiment of the present invention described above, the constituent requirements can be appropriately changed, added, or deleted without departing from the spirit of the present invention. The present invention is not limited to the embodiments described above, and many modifications can be made by a person having ordinary knowledge in the art within the technical idea of the present invention.

9 ... work, 10 ... roundness measuring device, 19 ... control device, 42 ... measurement data processing unit, 70 ... mode setting unit, 72 ... contact switching control unit, 74 ... urging direction switching control unit, 76 ... contact switching Unit, 78 ... Biasing direction switching unit, 100, 100B, 100C ... Detector, 102 ... Contact, 102A ... Tip, 104 ... Arm, 104B ... Tip, 106 ... Measuring force applying mechanism, 108 ... Displacement sensor, 114 , 114B ... Adsorbent, 114C ... Contact surface, 130 ... Stylus

The seventh embodiment is the detector according to any one of the sixth aspect of the first embodiment, the cleaning member, the distance from the center axis of the arm, the same positions as the distance to the contact from the central axis of the arm Be supported.

Claims (15)

A contactor that comes into contact with the object to be measured and
An arm to which the contact is attached to the tip,
A cleaning member attached to the tip of the arm, which is a cleaning member that comes into contact with the measurement object to remove foreign matter adhering to the measurement object.
A contact switching unit that switches whether the contactor is brought into contact with the measurement object or the cleaning member is brought into contact with the object to be measured.
A measuring force applying unit that applies an urging force to either the contactor or the cleaning member via the arm, and a measuring force applying unit.
A displacement detection unit that detects the displacement of the contact via the arm, and
Detector equipped with. The detector according to claim 1, wherein the cleaning member is attached to a position opposite to the contact with the arm at the tip of the arm. The contact switching unit rotates the arm or the detector with respect to the central axis of the arm to switch whether the contactor is brought into contact with the measurement object or the cleaning member is brought into contact with the object to be measured. Or the detector according to 2. Any of claims 1 to 3, further comprising an urging direction switching unit that switches the direction of the urging force applied to the cleaning member by using the measuring force applying unit when the cleaning member is brought into contact with the measurement object. The detector according to one item. The detector according to any one of claims 1 to 4, wherein the cleaning member includes a curved surface as a contact surface for contacting the object to be measured. The cleaning member according to any one of claims 1 to 5, wherein the cleaning member is supported at a position where the distance from the central axis of the arm exceeds the distance from the central axis of the arm to the outer periphery of the main body of the detector. Detector. The detection according to any one of claims 1 to 6, wherein the cleaning member is supported at a position where the distance from the central axis of the arm is the same as the distance from the central axis of the arm to the contactor. vessel. When the cleaning member is brought into contact with the object to be measured, the measuring force applying unit imparts an urging force having the same magnitude as the measuring force when the contact is brought into contact with the object to be measured. The detector according to any one of claims 1 to 7. A detector that detects the displacement of the object to be measured and
A control device that controls the measurement and cleaning of the object to be measured, and
With
The detector
A contactor that comes into contact with the object to be measured and
An arm to which the contact is attached to the tip,
A cleaning member attached to the tip of the arm, which is a cleaning member that comes into contact with the measurement object to remove foreign matter adhering to the measurement object.
A contact switching unit that switches whether the contactor is brought into contact with the measurement object or the cleaning member is brought into contact with the object to be measured.
A measuring force applying unit that applies an urging force to either the contactor or the cleaning member via the arm, and a measuring force applying unit.
A displacement detection unit that detects the displacement of the contact via the arm, and
Surface property measuring device equipped with. When the cleaning member is brought into contact with the measurement object to remove foreign matter from the measurement object, the control device brings the contactor into contact with the measurement object to perform the measurement object. The surface property measuring device according to claim 9, wherein the procedure for measuring an object is applied. The surface property measuring device according to claim 9 or 10, wherein the control device measures the measurement target after removing foreign substances from the measurement target. The control device includes a measurement data processing unit that analyzes measurement data of the measurement object output from the displacement detection unit and determines the presence or absence of measurement data affected by a foreign substance.
The control device is any one of claims 9 to 11 for removing the foreign matter adhering to the measurement object by bringing the cleaning member into contact with the measurement object when there is measurement data affected by the foreign matter. The surface property measuring apparatus according to one item. The control device includes a cleaning count determination unit that determines whether or not the number of cleanings of the measurement object exceeds a predetermined number.
When the number of times the measurement object is cleaned is less than or equal to the specified number of times, the control device performs subsequent cleaning of the measurement object, and when the number of times the measurement object is cleaned exceeds the specified number of times, the subsequent measurement is performed. The surface property measuring device according to any one of claims 9 to 12, wherein cleaning of the object is not performed. The control device includes a cleanliness calculation unit that calculates the cleanliness of the measurement object, which is represented by using the ratio between the measurement target position where the foreign matter has been removed and the measurement target position where the foreign matter has not been removed. The surface texture measuring apparatus according to any one of claims 9 to 13. A measurement method in which a contactor attached to the tip of an arm is brought into contact with a measurement object to measure the surface texture of the measurement object.
A contact switching step in which a cleaning member attached to the tip of the arm is brought into contact with the object to be measured.
An urging force applying step of applying an urging force to the cleaning member via the arm,
A removal step of removing foreign matter adhering to the measurement object by using the cleaning member brought into contact with the measurement object.
Measurement method including.

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