JP2021052134A - Electronic control device - Google Patents
Electronic control device Download PDFInfo
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- JP2021052134A JP2021052134A JP2019175469A JP2019175469A JP2021052134A JP 2021052134 A JP2021052134 A JP 2021052134A JP 2019175469 A JP2019175469 A JP 2019175469A JP 2019175469 A JP2019175469 A JP 2019175469A JP 2021052134 A JP2021052134 A JP 2021052134A
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- control device
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/2039—Modifications to facilitate cooling, ventilating, or heating characterised by the heat transfer by conduction from the heat generating element to a dissipating body
- H05K7/20436—Inner thermal coupling elements in heat dissipating housings, e.g. protrusions or depressions integrally formed in the housing
- H05K7/20445—Inner thermal coupling elements in heat dissipating housings, e.g. protrusions or depressions integrally formed in the housing the coupling element being an additional piece, e.g. thermal standoff
- H05K7/20454—Inner thermal coupling elements in heat dissipating housings, e.g. protrusions or depressions integrally formed in the housing the coupling element being an additional piece, e.g. thermal standoff with a conformable or flexible structure compensating for irregularities, e.g. cushion bags, thermal paste
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/053—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having an insulating or insulated base as a mounting for the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
- H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
- H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3675—Cooling facilitated by shape of device characterised by the shape of the housing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/50—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/182—Disposition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
Abstract
Description
本発明は、ICを備える電子制御装置に関する。 The present invention relates to an electronic control device including an IC.
例えば車両制御を行うECU(Electronic Control Unit)のような電子制御装置は、マイクロコンピュータ等のICを備えている。このようなICは動作時にノイズを発生させるため、例えばシールド部材によりマイコンを覆うことで対策を行っている。 For example, an electronic control device such as an ECU (Electronic Control Unit) that controls a vehicle includes an IC such as a microcomputer. Since such an IC generates noise during operation, measures are taken by covering the microcomputer with, for example, a shield member.
しかしながら、マイクロコンピュータのようなICは、動作周波数が上昇して機能が向上することに伴い、消費電力が増加して発熱温度も上昇する傾向にあるため、ノイズ対策と共に放熱対策も行う必要がある。例えば、ICのパッケージに熱伝導部材である放熱ゲルを塗布し、金属製の筐体に接触させることで放熱を行うことが考えられる。この場合、放熱ゲルがパッケージの外周部からICの接続ピン側に回り込むことが想定される。すると、放熱ゲルの誘電率は空気の数倍であることから、高周波信号を扱うICの動作特性に影響を与える可能性がある。 However, ICs such as microcomputers tend to increase power consumption and heat generation temperature as the operating frequency increases and their functions improve. Therefore, it is necessary to take measures against heat dissipation as well as noise countermeasures. .. For example, it is conceivable to apply a heat radiating gel, which is a heat conductive member, to an IC package and bring it into contact with a metal housing to dissipate heat. In this case, it is assumed that the heat radiating gel wraps around from the outer peripheral portion of the package to the connection pin side of the IC. Then, since the dielectric constant of the heat-dissipating gel is several times that of air, it may affect the operating characteristics of the IC that handles high-frequency signals.
本発明は上記事情に鑑みてなされたものであり、その目的は、ICのパッケージと筺体との間に熱伝導部材を介在させる際に、ICの動作特性に影響を及ぼすことを回避できる電子制御装置を提供することにある。 The present invention has been made in view of the above circumstances, and an object of the present invention is electronic control that can avoid affecting the operating characteristics of the IC when a heat conductive member is interposed between the package of the IC and the housing. To provide the equipment.
請求項1記載の電子制御装置によれば、ICと、プリント配線板の当該ICが実装されている面側を覆う金属製のカバーとの間に熱伝導部材を配置する。そして、プリント配線板においてICが実装される領域の端部と当該ICの接続端子との間の少なくとも一部に、熱伝導部材の浸入を防止する障壁部材を備える。このように構成すれば、ICとカバーとの間に配置された熱伝導部材の端部がICの実装面側に回り込もうとした場合でも、実装上の必要に応じて障壁部材を設けることで、熱伝導部材がICの接続端子に接触することを防止できる。 According to the electronic control device according to claim 1, the heat conductive member is arranged between the IC and the metal cover covering the surface side of the printed wiring board on which the IC is mounted. Then, at least a part of the printed wiring board between the end of the region where the IC is mounted and the connection terminal of the IC is provided with a barrier member for preventing the intrusion of the heat conductive member. With this configuration, even if the end of the heat conductive member arranged between the IC and the cover tries to wrap around to the mounting surface side of the IC, a barrier member can be provided as necessary for mounting. Therefore, it is possible to prevent the heat conductive member from coming into contact with the connection terminal of the IC.
請求項3記載の電子制御装置によれば、障壁部材をはんだで構成する。
そして、請求項4記載の電子制御装置のように、はんだをプリント配線板上のランドに配置することで、障壁部材を必要となる配置箇所に容易に形成できる。
According to the electronic control device according to
Then, by arranging the solder on the land on the printed wiring board as in the electronic control device according to
請求項7記載の電子制御装置によれば、障壁部材を、少なくとも、発振器が接続される接続端子が配置されるICの一辺側に形成する。すなわち、一般に発振器は高周波帯域の信号を出力するので、前記ICの一辺側に障壁部材を設けることで、熱伝導部材が容量結合してその誘電率が高周波信号の特性に影響を及ぼすことを回避できる。 According to the electronic control device according to claim 7, the barrier member is formed at least on one side of the IC in which the connection terminal to which the oscillator is connected is arranged. That is, since an oscillator generally outputs a signal in a high frequency band, by providing a barrier member on one side of the IC, it is possible to prevent the heat conductive member from being capacitively coupled and its dielectric constant affecting the characteristics of the high frequency signal. it can.
請求項8記載の電子制御装置によれば、障壁部材を、少なくとも、アナログ回路が接続される接続端子が配置される前記ICの一辺側に形成する。このように構成すれば、請求項7と同様に、熱伝導部材が容量結合してその誘電率がアナログ回路の特性に影響を及ぼすことを回避できる。 According to the electronic control device according to claim 8, the barrier member is formed at least on one side of the IC in which the connection terminal to which the analog circuit is connected is arranged. With this configuration, it is possible to prevent the heat conductive member from being capacitively coupled and its dielectric constant affecting the characteristics of the analog circuit, as in claim 7.
(第1実施形態)
本実施形態の電子制御装置1は、例えば車両制御用のECUであり車両に搭載される。図1に示す電子制御装置1は、何れも金属製であり四角形状の第1カバー2と第2カバー3とで筐体を構成しており、その筐体の内部に図2に示すIC4等の回路部品が実装されたプリント配線板5が収容されている。
(First Embodiment)
The electronic control device 1 of the present embodiment is, for example, an ECU for vehicle control and is mounted on a vehicle. The electronic control device 1 shown in FIG. 1 is made of metal and has a housing composed of a square
プリント配線板5には、コネクタ6が実装されており、電子制御装置1はコネクタ6を介して外部機器と電気的に接続される。第1カバー2には、コネクタ6の図中上方側を覆うためのコネクタカバー部7が形成されている。また、第1カバー2には、IC4が位置する部位が、IC4のパッケージ表面との隙間をより狭くするように凹んだ形状の凹部2aが形成されている。
A
IC4は、BGA(Ball Grid Array)によってプリント配線板5に実装される。プリント配線板5には、IC4をはんだボール9を介して電気的に接続する位置に合せて、銅箔のランド10が格子点状にレイアウトされている。破線αは、IC4のパッケージ外縁を示している。図3Aに示すように、ランド10の外周側には、コンデンサや抵抗等の受動部品11や、トランジスタ等の半導体部品12や、発振器OSC等が表面実装されている。また、図中の「Via」はビアホールを示す。
The IC4 is mounted on the printed
尚、図1や図2に比較して、図3Bに示す図3AのC−C断面では、凹部2aの両側における第1カバー2の高さ寸法が、各部に配置される部品の高さに合せて異なるように示されている。これは、第1カバー2の形状をこのようにしても良いことを、バリエーションとして示したものである。したがって、例えば凹部2aの図中右側の高さ寸法を、同左側の高さ寸法と同一にしても良い。
Compared to FIGS. 1 and 2, in the CC cross section of FIG. 3A shown in FIG. 3B, the height dimension of the
図2や図3Bに示すように、第2カバー3側の四隅には、基板固定用のゴム13が配置されている。第1カバー2と第2カバー3とは、プリント配線板5を内部に収容するようにして図中下方によりねじ14をねじ止めして結合される。その際に、プリント配線板5は、第1カバー2の縁部15とゴム13との間に挟まれて固定される。
As shown in FIGS. 2 and 3B,
また、第1カバー2と第2カバー3とが結合される際には、IC4のパッケージ表面にゲル状材料16が予め載置される。熱伝導部材の一例であるゲル状材料16は、熱伝導性が良好な誘電体であり、且つ図2に示すように、一定の形状を維持できる程度の粘性を有する材料である。そして、第1カバー2と第2カバー3とが結合される際には、IC4のパッケージ表面に載置されたゲル状材料16が凹部2aにより圧迫され、弾性的に変形することで外周方向に伸びて、IC4のパッケージ全体を覆うようになる。
Further, when the
これに対応して、プリント配線板5には、発振器OSCに対向するIC4の一辺側に、長方形状のランド17が形成されており、そのランド17には障壁部材の一例であるはんだ18が乗せられる。本実施形態では、プリント配線板5の表面を配線層としており、図3Aには、発振器OSCと対応するランド10aとを接続する配線パターン19のみを示している。また、はんだ18をハッチングで示しており、はんだボール9は図示していない。はんだ18は、ゲル状材料16がIC4の外縁側から回り込んで、ランド10aに接触することを阻止する目的で配置されている。
Correspondingly, on the printed
尚、図3Bには、はんだボール9に接続されるIC4の接続端子であるランド20を示している。このランド20とはんだボール9及びランド10は電気的に接続されるので、はんだボール9及びランド10も接続端子と見做すことができる。また、第1カバー2と第2カバー3とを結合した際に、ゲル状材料16が必ずしも図3Bに示すようにIC4の実装面側に回り込むとは限らない。図3Bは、ワーストケースを想定したものである。
Note that FIG. 3B shows a
以上のように本実施形態によれば、プリント配線板5のIC4が実装されている面側を金属製のカバー2で覆う際に、IC4とカバー2との間に熱伝導性が良好なゲル状材料16を配置する。そして、プリント配線板5においてIC4が実装される領域の端部,すなわち破線αとIC4の接続端子との間の一部に、ゲル状材料16の浸入を防止する障壁部材としてはんだ18を備える。このように構成すれば、ゲル状材料16の端部がIC4の実装面側に回り込もうとした場合でも、はんだ18により、ゲル状材料16がIC4の接続端子側に浸入して接触することを防止できる。
As described above, according to the present embodiment, when the surface side of the printed
この場合、はんだ18をプリント配線板5上のランド17に配置するので、障壁部材を必要となる配置箇所に容易に形成できる。また、はんだ18を、発振器OSCが接続されるランド10aが配置されるIC4の一辺側に形成する。これにより、ゲル状材料16が容量結合することで、その誘電率が発振器OSCが出力する高周波信号の特性に影響を及ぼすことを回避できる。この際に、はんだ18の配置長さをランド10a,10aの配置間隔よりも長くすることで、ランド10a,10aの間にゲル状材料16が浸入することを確実に阻止できる。
In this case, since the
(第2実施形態)
以下、第1実施形態と同一部分には同一符号を付して説明を省略し、異なる部分について説明する。図4に示すように、第2実施形態は、ランド17を、プリント配線板5の内層であるGNDにビアホール21を介して接続した構成を示す。
(Second Embodiment)
Hereinafter, the same parts as those in the first embodiment are designated by the same reference numerals, description thereof will be omitted, and different parts will be described. As shown in FIG. 4, the second embodiment shows a configuration in which the
(第3実施形態)
図5に示す第3実施形態は、第1実施形態と同様に形成した障壁部材としてのはんだ22,23を、IC4の二辺に配置した構成である。第3実施形態は、これらのはんだ22,23を、IC4の周辺回路として、受動部品11により構成される例えばCRフィルタなどのアナログ回路に接続されるランド10b,10cが配置される各辺に対して配置している。このように構成すれば、ゲル状材料16が容量結合することで、その誘電率がCRフィルタの特性に影響を及ぼすことを回避できる。尚、はんだ22,23は第1実施形態と同様に、ランド上に配置されている。
(Third Embodiment)
The third embodiment shown in FIG. 5 has a configuration in which solders 22 and 23 as barrier members formed in the same manner as in the first embodiment are arranged on two sides of the IC4. In the third embodiment, these
(第4実施形態)
図6に示す第4実施形態は、第3実施形態において、ランド10b,10cが配置される辺に対して配置したはんだ22,23を、一端が共通するIC4の角部で接続した形状である1つのはんだ24を配置している。このように構成すれば、第3実施形態におけるはんだ22,23の隙間から、ゲル状材料16が内部側に侵入することを阻止できる。
(Fourth Embodiment)
The fourth embodiment shown in FIG. 6 has a shape in which the
(その他の実施形態)
障壁部材ははんだに限ることなく、例えばアンダーフィル等を用いても良い。
障壁部材の長さは、必ずしも2つの接続端子の配置間隔より長くする必要は無い。熱電導部材との接触を回避したい接続端子が1つであれば、少なくともその1つの接続端子をカバーできる長さにすれば良い。
(Other embodiments)
The barrier member is not limited to solder, and for example, underfill or the like may be used.
The length of the barrier member does not necessarily have to be longer than the arrangement interval between the two connection terminals. If there is only one connection terminal for which contact with the thermoconducting member is desired, the length may be set so as to cover at least one connection terminal.
また、上記の実施形態では、障壁部材をICが実装される領域の端に係る部分とICの最外周部にある接続端子との間に形成したが、必ずしもこれに限らない。熱電導部材との接触を回避したい接続端子が最外周部以外に配置されている場合は、その接触を回避したい接続端子の位置に応じて障壁部材を配置すれば良い。
障壁部材を、ICの3辺以上に配置しても良い。
Further, in the above embodiment, the barrier member is formed between the portion related to the end of the region where the IC is mounted and the connection terminal on the outermost peripheral portion of the IC, but the present invention is not necessarily limited to this. When the connection terminal for which the contact with the thermoconducting member is to be avoided is arranged other than the outermost peripheral portion, the barrier member may be arranged according to the position of the connection terminal for which the contact is to be avoided.
Barrier members may be arranged on three or more sides of the IC.
本開示は、実施例に準拠して記述されたが、本開示は当該実施例や構造に限定されるものではないと理解される。本開示は、様々な変形例や均等範囲内の変形をも包含する。加えて、様々な組み合わせや形態、さらには、それらに一要素のみ、それ以上、あるいはそれ以下、を含む他の組み合わせや形態をも、本開示の範疇や思想範囲に入るものである。 Although the present disclosure has been described in accordance with the examples, it is understood that the present disclosure is not limited to the examples and structures. The present disclosure also includes various modifications and modifications within an equal range. In addition, various combinations and forms, as well as other combinations and forms that include only one element, more, or less, are also within the scope of the present disclosure.
図面中、1は電子制御装置、2は第1カバー、2aは凹部、3は第2カバー、4はIC、5はプリント配線板、10はランド、16はゲル状材料である。 In the drawings, 1 is an electronic control device, 2 is a first cover, 2a is a recess, 3 is a second cover, 4 is an IC, 5 is a printed wiring board, 10 is a land, and 16 is a gel-like material.
Claims (10)
このICが実装されるプリント配線板(5)と、
このプリント配線板の前記ICが実装されている面側を覆う金属製のカバー(2)と、
前記ICと前記カバーとの間に配置される熱伝導部材(16)と、
前記プリント配線板において前記ICが実装される領域の端に係る部分と前記接続端子との間の少なくとも一部に配置され、前記熱伝導部材の浸入を防止する障壁部材(18,22,23,24)とを備える電子制御装置。 IC (4) having a connection terminal (20) on one side of the package,
The printed wiring board (5) on which this IC is mounted and
A metal cover (2) that covers the surface side of the printed wiring board on which the IC is mounted, and
A heat conductive member (16) arranged between the IC and the cover,
Barrier members (18, 22, 23, which are arranged at least a part between the end of the region where the IC is mounted and the connection terminal in the printed wiring board and prevent the heat conductive member from entering. 24) and an electronic control device.
前記障壁部材が、少なくとも、前記発振器が接続される接続端子(10a)が配置される前記ICの一辺側に形成されている請求項1から6の何れか一項に記載の電子制御装置。 It is equipped with an oscillator (OSC) mounted around the IC.
The electronic control device according to any one of claims 1 to 6, wherein the barrier member is formed at least on one side of the IC to which the connection terminal (10a) to which the oscillator is connected is arranged.
前記障壁部材が、少なくとも、前記アナログ回路が接続される接続端子(10b,10c)が配置される前記ICの一辺側に形成されている請求項1から7の何れか一項に記載の電子制御装置。 It is equipped with an analog circuit mounted around the IC.
The electronic control according to any one of claims 1 to 7, wherein the barrier member is formed at least on one side of the IC to which connection terminals (10b, 10c) to which the analog circuit is connected are arranged. apparatus.
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Citations (5)
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JPS6221249A (en) * | 1985-07-22 | 1987-01-29 | Hitachi Ltd | Semiconductor device |
JP2005012127A (en) * | 2003-06-20 | 2005-01-13 | Denso Corp | Electronic control apparatus |
US20050074923A1 (en) * | 2003-10-03 | 2005-04-07 | Vahid Goudarzi | Metallic dam and method of forming therefor |
JP2005236036A (en) * | 2004-02-19 | 2005-09-02 | Denso Corp | Electronic controller for vehicle |
JP2011009643A (en) * | 2009-06-29 | 2011-01-13 | Denso Corp | Electronic device |
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JP4691455B2 (en) | 2006-02-28 | 2011-06-01 | 富士通株式会社 | Semiconductor device |
US20180233423A1 (en) | 2017-02-14 | 2018-08-16 | Skyworks Solutions, Inc. | Flip-chip mounting of silicon-on-insulator die |
WO2019112582A1 (en) | 2017-12-07 | 2019-06-13 | Intel Corporation | A heat dissipation structure for an integrated circuit package |
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JPS6221249A (en) * | 1985-07-22 | 1987-01-29 | Hitachi Ltd | Semiconductor device |
JP2005012127A (en) * | 2003-06-20 | 2005-01-13 | Denso Corp | Electronic control apparatus |
US20050074923A1 (en) * | 2003-10-03 | 2005-04-07 | Vahid Goudarzi | Metallic dam and method of forming therefor |
JP2005236036A (en) * | 2004-02-19 | 2005-09-02 | Denso Corp | Electronic controller for vehicle |
JP2011009643A (en) * | 2009-06-29 | 2011-01-13 | Denso Corp | Electronic device |
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