JP2021009116A - Output device, output method and output program - Google Patents

Abstract

To provide an output device or the like making it possible to specify an abnormal suspicious part whose secular change in temper is difficult to specify.SOLUTION: An output device includes: a magnetic field detection part for outputting a magnetic field detection signal about a detected magnetic field; movement means for moving the magnetic field detection part, that is, an in-plane of a surface parallel with a substrate face, separated from a substrate face of a mounting substrate by a prescribed interval; acquisition means for acquiring magnetic field information on the magnetic field represented by the magnetic field detection signal outputted by the magnetic field detection part in a step of the movement, in association with position information representing the position of the in-plane; and output means for outputting magnetic field difference information representing difference between two pieces of the magnetic field information acquired at the equal position in different periods.SELECTED DRAWING: Figure 1

Description

The present invention relates to a device that outputs a suspected abnormality.

A method is known in which an abnormality suspected to have occurred due to a failure or the like on a mounting board on which an electronic device or the like is mounted is identified by a change in temperature of each part of the mounting board over time.

For example, Patent Document 1 includes a substrate mounting heating stage, a thermoviewer unit for investigating a temperature change on a substrate to be tested, a spotlight unit for displaying defective parts, and a control unit for controlling their operation. Disclose a mounting inspection device provided with.

Further, Patent Document 2 discloses a deterioration diagnosis method for determining that there is deterioration when the amount of change in the temperature distribution obtained from the temperature distribution on the mounting surface of the mounting substrate exceeds the threshold value.

Jikkenhei 03-0233349 Japanese Unexamined Patent Publication No. 11-014576

However, in the methods disclosed in Patent Documents 1 and 2, it may be difficult to sufficiently identify the suspected abnormality on the mounting substrate because the suspected abnormality is identified only by the change of the temperature distribution with time.

One of the difficult cases is that the energization of the energized portion where the amount of heat generated in the normal state is not large is abnormally stopped. Since the original temperature is not high, the temperature hardly changes even if the power is turned off. The energization stop may occur, for example, due to improper soldering or improper mounting of the mounted electronic device due to poor contact of the electrical terminals. The mounting defect may be caused by vibration, ambient temperature or humidity. The energization stop may occur due to the operation stop of the electronic device due to aging, or the destruction of the on-board electronic device by a high voltage or high current flowing due to the influence of static electricity, lightning strike, or the like.

As a difficult case, there is a case where there is a hot object in the vicinity of the suspected abnormality in the normal state. Due to the heat generated by high-temperature objects, the temperature change at the suspected abnormality cannot be observed. The high temperature object is, for example, a central processing unit.

In that difficult case, the heat distribution may change in a relatively short time. For example, the temperature distribution may change when the operation mode of the circuit on the mounting board changes. In that case, the temperature distribution depends on the time elapsed since the operation mode was switched. Therefore, in order to identify the suspected abnormal location due to changes in temperature over time, it may be necessary to perform measurements with the same time elapsed after the operation mode is switched and the duration of the operation mode before the switch. ..

An object of the present invention is to provide an output device or the like that enables identification of a suspected abnormality that is difficult to identify due to a change in temperature over time.

The output device of the present invention has the magnetic field in the plane of a magnetic field detection unit that outputs a magnetic field detection signal relating to the detected magnetic field and a surface parallel to the substrate surface at a predetermined distance from the substrate surface of the mounting substrate. A moving means for moving the detection unit and an acquisition means for acquiring magnetic field information regarding the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of movement in association with position information representing a position in the plane. And an output means for outputting magnetic field difference information representing the difference between the two magnetic field information acquired at different times at the same position.

The output device or the like of the present invention makes it possible to identify a suspected abnormality that is difficult to identify due to a change in temperature over time.

It is a conceptual diagram which shows the structural example of the output device of this embodiment. It is a figure which shows the example of the information about the voltage value of a magnetic field detection signal. It is a conceptual diagram which shows the structural example of a processing apparatus. It is a conceptual diagram which shows the operation flow example of the operation performed by a worker or the like. It is a conceptual diagram which shows the processing flow example of the magnetic field map information acquisition and storage processing performed by a processing unit. It is a conceptual diagram which shows the processing flow example of derivation of magnetic field difference map information and output processing performed by a processing unit. It is a conceptual diagram which shows the processing flow example of the processing performed by the processing unit when the processing unit executes the operation of A111 and A112. It is a conceptual diagram which shows the modified output device. It is a conceptual diagram which shows the modified processing apparatus. It is a conceptual diagram which shows the structural example of the output device which can acquire the magnetic field map information and the temperature map information at the same time. It is a conceptual diagram which shows the structural example of the processing apparatus shown in FIG. It is a conceptual diagram which shows the minimum structure of the output device of embodiment.

<First Embodiment>
The present embodiment is an embodiment relating to an output device that enables identification of a suspected abnormality by outputting magnetic field difference map information indicating the degree of change of the magnetic field generated from each part of the mounting board with time. Here, the "abnormality suspected place" in the embodiment is a place where the occurrence of an abnormality is suspected, and the place includes a place where the occurrence of the abnormality is unknown at present but is likely to occur in the future. It shall be.
[Configuration and operation]
FIG. 1 is a conceptual diagram showing a configuration of an output device 1 which is an example of the output device of the present embodiment. In FIG. 1, in addition to the output device 1, the device 50 is shown. The device 50 includes a mounting board 71 and a housing 40. The device 50 is a device that operates by operating the mounting board 71. The type of operation is arbitrary. Further, the output device 1 is a device for outputting information for identifying a suspected abnormality location on the mounting board 71.

The output device 1 includes a measuring unit 10 and a processing device 20.

The measuring unit 10 is used by being attached to the top plate 41 of the housing 40 by a worker, a working robot, or the like (hereinafter, referred to as “worker or the like”) when acquiring the magnetic field map information described below. It is a thing. The measuring unit 10 is removed from the housing 40 except when acquiring the magnetic field map information.

The measuring unit 10 includes an XY stage 11, a Z stage 12, a rotating stage 13, and a magnetic field sensor 14. These are connected to the processing device 20 by a control wiring (not shown).

The upper surface of the XY stage 11 is fixed to the top plate 41 of the housing 40. The XY stage 11 moves the lower surface 11b in the XY direction with respect to the upper surface 11a according to the XY direction movement control signal sent from the processing device 20. A Z stage 12 is fixed to the lower surface. The Z stage 12 moves in the XY directions as the lower surface 11b of the XY stage 11 moves.

The Z stage 12 moves its lower surface in the Z direction with respect to its upper surface in accordance with the Z direction movement control signal sent from the processing device 20. A rotating stage 13 is fixed to the lower surface. The rotary stage 13 moves as the lower surface of the Z stage 12 moves.

The rotation stage 13 rotates its lower surface in the XY plane with respect to the upper surface in accordance with the rotation control signal sent from the processing device 20. A magnetic field sensor 14 is fixed to the lower surface. The magnetic field sensor 14 moves or rotates as the lower surface moves or rotates.

The magnetic field sensor 14 sends a magnetic field detection signal detected by a magnetic field detection unit located near the lower end thereof to the processing device 20. The delivery may be wireless or wired. As the magnetic field sensor 14, for example, the magnetic field probe CP-25A sold by NEC Platforms, Ltd. and the magnetic field probe E19-CP-25A sold by Seiwa Electric Co., Ltd. can be used. In that case, the magnetic field detection signal can be wirelessly sent to the processing unit 20. However, it is premised that the processing unit 20 includes a receiving unit that receives the magnetic field detection signal of the radio.

The processing device 20 is configured to include, for example, a computer. The processing device 20 causes the Z stage to set the distance between the lower end of the magnetic field sensor 14 and the upper surface of the mounting board 71 to a predetermined set value according to the input information from the operator or the like. The set value is such that the lower end of the magnetic field sensor 14 does not hit the component mounted on the mounting board 71 and is sufficiently close to the mounting board 71. However, if the processing device 20 has a high-mounting component such as a connector or a heat-dissipating device whose height is significantly higher than that of other mounting components, the processing device 20 hits a mounting component other than the high-mounting component. Instead, the distance should be sufficiently close to the mounting board 71. In that case, the processing device 20 preliminarily excludes the (X, Y) coordinates of the magnetic field sensor 14 from the (X, Y) coordinates in which mounting components having a significantly high height are installed. Instruct 11.

Next, the processing device 20 causes the rotation stage 13 to set the rotation position of the magnetic field sensor 14 in the XY plane to the initial value.

Then, the processing device 20 causes the XY stage 11 to scan the lower end of the magnetic field sensor 14 with respect to the mounting substrate 71 in the XY plane. At that time, if there is the above-mentioned high-mounting component, the processing device 20 excludes the range in which the magnetic field sensor 14 hits the high-mounting component from the scanning range. During the scan, the magnetic field sensor 14 sequentially sends the magnetic field detection signal to the processing device 20.

The processing device 20 sequentially measures the voltage value of the magnetic field detection signal, associates it with the XY coordinates of the lower end of the magnetic field sensor 14 at that time, and sequentially stores it. The voltage value represents the magnitude of the magnetic field at the position of the detection unit of the magnetic field sensor 14.

The processing device 20 may acquire the voltage value of the magnetic field detection signal, for example, by providing the configuration provided in the spectrum analyzer. When the spectrum analyzer has the configuration provided, the processing device 20 can acquire the voltage value of the magnetic field detection signal for each frequency specified by the operator or the like. The magnetic field generated from each position of the mounting board 71 may have a plurality of different frequencies depending on the frequency of the current that causes the generation. When the spectrum analyzer is provided with the configuration, the processing device 20 can acquire the voltage value of the magnetic field detection signal for each assumed frequency.

In this way, when one scan is completed, the magnetic field map information representing the voltage value of the magnetic field detection signal associated with the XY coordinates of the lower end of the magnetic field sensor 14 is stored in the processing device 20.

If the magnetic field map information changes frequently in a short period of time due to changes in the current path, etc., the magnetic field map information is acquired multiple times and the average value of the voltage for each (X, Y) coordinate is obtained. It doesn't matter.

The processing device 20 performs such a scan by setting the rotation angle of the magnetic field sensor 14 in the XY plane to some value. The rotation angle to be set is, for example, three types: an initial value, an angle rotated by 45 degrees from the initial value, and an angle rotated by 90 degrees from the initial value. The reason why the rotation angle of the magnetic field sensor 14 in the XY plane is changed in this way is that the magnitude of the magnetic field input from each part of the mounting substrate to the magnetic field detection unit of the magnetic field sensor 14 is changed in the XY plane. This is because it may depend on the rotation angle of.

When each magnetic field map information is acquired, the processing device 20 holds the magnetic field sensor 14 in association with the rotation angle in the XY plane and the acquired date and time.

After that, the measuring unit 10 is removed from the top plate 41 of the housing 40 by an operator or the like.

When the mounting board 71 starts operation, the operator first attaches the measuring unit 10 to the top plate 41 of the housing 40, and causes the processing device 20 to acquire and store the magnetic field map information. The magnetic field map information is hereinafter referred to as "initial magnetic field map information". After that, the measuring unit 10 is removed from the top plate 41 of the housing 40.

The operator or the like attaches the measuring unit 10 to the top plate 41, acquires and stores the magnetic field map information by the processing device 20, and removes the measuring unit 10 from the top plate 41 at a predetermined timing thereafter. The timing is, for example, an annual timing. However, when there are a plurality of operation modes of the mounting board, the operator or the like unifies the timing to the timing of operating in the same operation mode. The reason is that the magnetic field map information may differ depending on the operation mode. Hereinafter, the magnetic field map information acquired after the acquisition of the initial magnetic field map information will be referred to as the measured magnetic field map information.

When the processing device 20 acquires the measured magnetic field map information, it obtains the map information representing the difference between the measured magnetic field map information and the initial magnetic field map information for each XY coordinate. The difference between the measured magnetic field map information and the initial magnetic field map information for each XY coordinate is hereinafter referred to as "magnetic field difference map information". The magnetic field difference map information is obtained for each rotation angle of the magnetic field sensor 14 in the XY plane.

The processing device 20 outputs the magnetic field difference map information. The magnetic field difference map information is, for example, a map-like information representing the XY coordinates of the magnetic field detection unit of the magnetic field sensor 14.

Here, the description of the processing device 20 of FIG. 1 is interrupted, and examples of the initial magnetic field map information, the measured magnetic field map information, and the magnetic field difference map information will be described with reference to FIG. FIG. 2 is an image diagram showing an example of initial magnetic field map information, measured magnetic field map information, and magnetic field difference map information. FIG. 2 is a diagram showing an example of information regarding the voltage value of the magnetic field detection signal when the rotation position of the magnetic field sensor 14 in the XY plane is set as the initial value.

FIG. 2A shows an example of the above-mentioned initial magnetic field map information. Further, FIG. 2B shows the measured magnetic field map information. Further, FIG. 2C shows magnetic field difference map information. In FIGS. 2A and 2B, the light color region surrounded by the surrounding dark color region has a higher voltage value of the magnetic field detection signal than the dark color region. Further, the dark color region surrounded by the light color region has a higher voltage value of the magnetic field detection signal than the light color region. In FIG. 2C, the darker the region, the larger the difference in the voltage value of the magnetic field detection signal between the initial magnetic field map information and the measured magnetic field map information. The operator or the like compares the measurement magnetic field map information with the mounting map information indicating the arrangement of the electronic devices and the like separately held.

As a result, the operator or the like determines that there is a high possibility that an abnormality has occurred in the electronic device or the like installed in the dark color region of FIG. 2C.

For example, when the energization of the energized portion is abnormally stopped, the current does not flow, so that the magnetic field generated by the current under normal conditions cannot be detected. In that case, the energization stop location is displayed in dark color in the magnetic field difference map information as shown in FIG. 2 (c). The energization stop may occur, for example, due to improper soldering or improper mounting of the mounted electronic device due to poor contact of the electrical terminals. The mounting defect may be caused by vibration, ambient temperature or humidity. The energization stop may occur due to the operation stop of the electronic device due to aging, or the destruction of the on-board electronic device due to the high voltage or high current flowing due to the influence of static electricity or lightning strike.

Alternatively, for example, a portion where the energizing current is abnormally increased is also displayed in dark color in the magnetic field difference map information as shown in FIG. 2C.

The operator or the like can identify the location where the above abnormality occurs in the magnetic field difference map information.

Here, the description returns to the processing device 20 of FIG.

The processing device 20 holds, for example, a voltage difference threshold value, which is a threshold value for the difference in the voltage values of the magnetic field detection signals, in advance. Then, the processing device outputs information representing the range of XY coordinates exceeding these threshold values in each magnetic field difference map information. The range corresponds to a range in which it is suspected that an abnormality has occurred in the electronic device or the like mounted on the mounting board 71.

The operator or the like identifies the electronic device or the like in which the abnormality has occurred from the range and the mounting map information indicating the mounting position of the electronic device or the like on the mounting board 71 created in advance, and takes measures such as replacement.

The processing device 20 holds the mounting map information in advance, identifies an electronic device or the like suspected of having an abnormality from the range and the mounting map information, and outputs information representing the electronic device or the like. It doesn't matter.

Further, in the configuration of FIG. 1, the upper surface of the measuring unit 10 is fixed to the mounting substrate 71 by the housing 40. However, the upper surface of the measuring unit 10 may be fixed to the mounting substrate 71 via a member other than the housing 40. The structure used to fix the upper part of the measuring unit 10 to the mounting substrate 71 is arbitrary.

Further, when the upper surface of the measuring unit 10 is fixed to the mounting board 71 by a member other than the housing 40, the housing 40 may not exist.

FIG. 3 is a conceptual diagram showing a configuration example of the processing device 20 shown in FIG. The processing device 20 includes a movement control unit 21, a magnetic field measuring unit 22, a processing unit 23, a storage unit 24, an output unit 25, and an input unit 26.

The input unit 26 is, for example, a keyboard. The input unit 26 sends the input information to the processing unit 23. The input information includes, for example, start information for acquiring magnetic field map information performed by the processing unit 23.

The processing unit 23 is, for example, a central processing unit of a computer. When the above-mentioned start information is input from the input unit 26, the processing unit 23 causes the movement control unit 21 to move the magnetic field sensor 14 shown in FIG. 1 from the magnetic field sensor 14 via the magnetic field measurement unit 22. Acquires the voltage value of the sent magnetic field detection signal. The processing unit 23 further stores the magnetic field map information associated with the position of the magnetic field detection unit near the lower end of the magnetic field sensor 14 and the measurement date and time in the storage unit 24.

The processing unit 23 stores the magnetic field map information to be stored first in the storage unit 24 in the initial magnetic field map information storage unit 51 as the initial magnetic field map information. The processing unit 23 also stores the magnetic field map information to be stored in the second and subsequent times as the measurement magnetic field map information in the storage unit 24 and in the measurement magnetic field map information storage unit 52. The measurement magnetic field map information storage unit 52 accumulates the measurement magnetic field map information each time the measurement magnetic field map information is acquired.

When the new measurement magnetic field map information is stored in the storage unit 24, the processing unit 23 derives and stores the magnetic field difference map information at each XY coordinates of the magnetic field detection unit of the magnetic field sensor 14 shown in FIG. The magnetic field difference map information storage unit 53 is stored in the unit 24. The magnetic field difference map information is map information representing a voltage difference between the measurement map information and the initial magnetic field map information. The magnetic field difference map information storage unit 53 stores magnetic field difference map information each time it is newly created.

The processing unit 23 causes the output unit 25 to output the initial magnetic field map information, the measured magnetic field map information, or the magnetic field difference map information specified by the information input from the input unit 26.

The movement control unit 21 sends a control signal to the XY stage 11, the Z stage 12, and the rotation stage 13 according to the instruction information from the processing unit 23, and moves the magnetic field detection unit of the magnetic field sensor 14 to a designated position.

The magnetic field measuring unit 22 identifies the voltage value of the magnetic field detection signal sent from the magnetic field sensor 14, and sends information representing the voltage value to the processing unit 23.

The magnetic field detection unit 22 may acquire the voltage value of the magnetic field detection signal for each frequency specified by the operator or the like by providing the configuration provided in the spectrum analyzer. As described above, the magnetic field generated from each position of the mounting board 71 may have a plurality of different frequencies depending on the frequency of the current that causes the generation. When the magnetic field detection unit 22 has a configuration included in the spectrum analyzer, the processing device 20 can acquire the voltage value of the magnetic field detection signal for each assumed frequency.

The storage unit 24 holds in advance programs and information necessary for each configuration of the processing device 20 to perform the above operation. The storage unit 24 also holds information instructed by each configuration of the processing device 20. The information includes initial magnetic field map information, measured magnetic field map information, and magnetic field difference map information that the processing unit 23 instructs to store. The storage unit 24 also sends the stored information instructed by each configuration of the processing device 20 to the configuration instructed to be sent provided in the processing device 20.

The output unit 25 is, for example, a display, a printer, or a communication device. The output unit 25 outputs the information instructed by the processing unit 23.

FIG. 4 is a conceptual diagram showing an example of an operation flow of an operation performed by an operator or the like.

The operator or the like starts the operation shown in FIG. 4, for example, by determining that the first operation of the target substrate has been started. Here, the target board is the mounting board (mounting board 71 in FIG. 1) that is the target of the operation shown in FIG.

First, as the operation of A101, the operator or the like determines whether or not there is a target substrate for which the operation of A102 has not been executed. Here, it is assumed that there are a plurality of target substrates.

When the determination result by the operation of A101 is yes, the operator or the like identifies one target substrate in which the operation of A102 has not been executed as the operation of A102.

Then, as the operation of the A103, the operator or the like installs the measuring unit 10 on the top plate 41 of the housing 40 with respect to the specified target substrate, for example, as shown in FIG.

Then, as the operation of A104, the worker or the like acquires and stores the initial magnetic field map information by the output device 1 shown in FIG. A processing example for acquiring and storing magnetic field map information (including initial magnetic field map information) performed by the processing unit 23 of the processing device 20 of the output device 1 is shown in FIG.

Then, the operator or the like removes the measuring unit 10 from the top plate 41 of the housing 40 as the operation of the A105. Then, the worker or the like repeats the operation of A101.

In this way, the operations of A101 to A105 are repeated, and the acquisition of the initial magnetic field map information by the operation of A104 is completed for all the target substrates. Then, the determination result by the operation of A101 becomes no, and it is determined whether or not the operation of A106 attempts to identify the suspected abnormality. The subject such as a worker makes the determination, for example, by determining whether or not the preset date and time has come.

When the determination result by the operation of A106 is yes, the operator or the like determines whether or not there is a target substrate for which the operation of A108 has not been executed as the operation of A107.

When the determination result by the operation of A107 is yes, the operator or the like performs the operation of A108. On the other hand, when the determination result by the operation of A107 is no, the operator or the like identifies one target substrate for which the operation of A108 has not been executed as the same operation.

Then, as the operation of A109, the operator or the like attaches the measurement unit (measurement unit 10 shown in FIG. 1) to the target substrate specified by the operation of A108.

Then, the operator or the like causes the processing device 20 shown in FIG. 1 to output the magnetic field difference map information as the operation of the A110. As described above, the magnetic field difference map information is map information representing the difference between the newly acquired measured magnetic field map information and the initial magnetic field map information acquired by the processing of A104. An example of processing performed by the processing unit 23 shown in FIG. 3 for the magnetic field difference map information is shown in FIG.

Then, as the operation of A111, the operator or the like determines from the magnetic field difference map information output by the operation of A110 whether or not there is a suspected abnormality on the target substrate. The operator or the like makes the determination by, for example, determining in the magnetic field difference map information whether or not there is a region in which the voltage difference exceeds a preset threshold value.

When the determination result by the operation of A111 is yes, the operator or the like performs the operation of A112. On the other hand, when the determination result by the operation of A111 is no, the worker or the like performs the operation of A113.

When the operator or the like performs the operation of A112, the operator or the like identifies the suspected abnormality portion as the same operation. The operator or the like performs the identification by, for example, identifying a device within the range determined to be a suspected abnormality in the operation of the A111 from the arrangement map of the electronic device or the like for the target substrate held in advance. ..

Then, the operator or the like removes the measuring unit attached by the operation of A109 as the operation of A113. Then, the operator or the like repeats the operation of A107.

As a result of repeating the operations of A107 to A113 in this way, the suspected abnormality is identified by the operation of A112 for all the target substrates. Then, the determination result by the operation of A107 becomes no, and the operation of A114 is performed.

When the operation of A114 is performed, the operator or the like determines whether to end the operation shown in FIG. 4 as the same operation. When the worker or the like is a robot, the worker or the like makes the determination by determining whether or not the end information is input from the outside.

When the determination result by the operation of A114 is yes, the operator or the like ends the operation of FIG. On the other hand, when the determination result by the operation of A114 is no, the operator or the like repeats the operation of A106.

Then, the operations of A106 to A114 are repeated until the determination result of the operation of A114 becomes yes, and the magnetic field difference map information and the suspected abnormality portion acquired at different timings are accumulated in the processing device 20 shown in FIG. Will be done.

It is also possible that the measuring unit is attached to the target substrate in advance and the state is maintained without removing the measuring unit. In that case, the operations of A103, A105, A109 and A113 shown in FIG. 4 are eliminated. In that case, the operation shown in FIG. 4 can be executed by a process performed by an information processing device such as a robot or a computer having no moving portion.

FIG. 5 is a conceptual diagram showing an example of a processing flow of magnetic field map information acquisition and storage processing performed by the processing unit 23 shown in FIG. 3 in response to the operation of A104 shown in FIG. 4 or the operation of A110. The magnetic field map information is initial magnetic field map information when acquired during the operation of A104 shown in FIG. On the other hand, the magnetic field map information is the measured magnetic field map information which is the magnetic field map information acquired after the acquisition of the initial magnetic field map information when it is acquired during the operation of A110 shown in FIG.

The processing unit 23 starts the processing shown in FIG. 5 by, for example, the start information input by the operator or the like via the input unit 26 shown in FIG.

First, as the processing of S201, the processing unit 23 tells the movement control unit 21 shown in FIG. 3 that the distance between the lower end of the magnetic field sensor 14 and the upper surface of the mounting substrate 71, which is the target substrate, is obtained in order to acquire magnetic field map information. Set to a preset setting value. Upon receiving the instruction, the movement control unit 21 causes the Z stage 12 shown in FIG. 1 to set the distance to a set value.

Next, the processing unit 23 determines whether or not the processing of S203 has not been performed in the rotation angle of the magnetic field sensor 14 set in advance as the processing of S202. When the determination result by the processing of S202 is yes, the processing unit 23 selects one rotation angle of the magnetic field sensor 14 that has not yet been processed by S203 from the preset values as the processing of S203. ..

Then, the processing unit 23 causes the movement control unit 21 shown in FIG. 3 to set the rotation angle of the magnetic field sensor 14 to the rotation angle selected by the processing of S203. In response to the instruction, the movement control unit 21 causes the rotation stage 13 shown in FIG. 1 to set the rotation angle of the magnetic field sensor 14.

Then, the processing unit 23 sets the value of the (X, Y) coordinate to the initial value (X0, Y0) as the processing of S205.

Then, the processing unit 23 moves the magnetic field sensor 14 to the coordinates (X, Y) in the movement control unit 21 as the processing of S206.

Then, the processing unit 23 associates the voltage value of the magnetic field detection signal detected by the magnetic field measurement unit 22 with the magnetic field detection signal 14 with the (X, Y) coordinates, the rotation angle, and the substrate ID (identifier) of the target substrate. And store it in the storage unit 24. The storage unit 24 stores the information in the initial magnetic field map information storage unit 51 when acquiring the initial magnetic field map information. Further, the storage unit 24 stores the information in the measurement magnetic field map information storage unit 52 when acquiring the measurement magnetic field map information.

Then, the processing unit 23 sets the X coordinate to X = X + ΔX as the processing of S208. ΔX is an interval with respect to the X coordinate for acquiring the voltage value of the magnetic field detection signal. ΔX has been adjusted to a somewhat coarse value by prior examination to the extent that an abnormal suspected portion on the mounting substrate 71 can be identified. The reason why ΔX is set to a coarse value to some extent is that the time required for acquiring the magnetic field map information is shortened and the amount of information of the magnetic field map information stored in the storage unit 24 is reduced.

Then, as the process of S209, the processing unit 23 determines whether the value of X exceeds Xm, which is a preset value as the maximum value of X. The value of Xm is set so that the range in the X-axis direction in which the magnetic field sensor 14 detects the magnetic field detection signal includes the range in the X-axis direction of the mounting board 71.

When the determination result by the processing of S209 is no, the processing unit 23 performs the processing of S206 again. Then, the processes of S206 to S209 are repeated, and the voltage value of the magnetic field detection signal of the X coordinate for each ΔX is stored in the storage unit 24 with respect to the coordinate Y = Y0.

Then, the processing unit 23 determines yes by the processing of S209, and performs the processing of S210. In that case, the processing unit 23 sets the value of the (X, Y) coordinate to (X0, Y + ΔY). ΔY is an interval with respect to the Y coordinate for acquiring the voltage value of the magnetic field detection signal. ΔY has been adjusted to a somewhat coarse value by prior examination to the extent that the suspected abnormality on the mounting substrate 71 can be identified. The reason why the value is set to a coarse value to some extent is to shorten the time required for acquiring the magnetic field map information and to reduce the amount of information of the magnetic field map information stored in the storage unit 24.

Then, the processing unit 23 determines whether the value of Y exceeds Ym, which is a preset value as the maximum value of Y, as the processing of S211. The value of Ym is set so that the range in the Y direction in which the magnetic field sensor 14 detects the magnetic field detection signal includes the range in the Y direction of the mounting board 71.

When the determination result by the process of S211 is no, the processing unit 23 performs the process of S206 again. Then, the processes of S206 to S211 are repeated, and the voltage values of the magnetic field detection signals of the X coordinate for each ΔX and the Y coordinate for each ΔY included between the coordinates (X0, Y0) and the coordinates (X, Ym) are obtained. It is stored in the storage unit 24.

Then, the processing unit 23 determines yes by the processing of S211 and performs the processing of S202 again. After that, the processing unit 23 repeats the processing of S202 to S211 and stores the magnetic field map information representing the distribution of the voltage value of the magnetic field detection signal for each rotation angle preset for the magnetic field sensor 14 in the storage unit 24.

Then, the processing unit 23 determines no by the processing of S202, and ends the processing shown in FIG.

When there are a plurality of target substrates, the process shown in FIG. 5 is performed on each target substrate.

FIG. 6 is a conceptual diagram showing an example of a processing flow of derivation of magnetic field difference map information and output processing performed by the processing unit 23 during the operation of A110 shown in FIG.

The processing unit 23 starts the processing shown in FIG. 6 by, for example, the start information input by an operator or the like via the input unit 26 shown in FIG.

First, as the processing of S301, the processing unit 23 determines whether or not there is a target substrate for which the processing of S302 has not been processed.

When the determination result of the processing of S301 is yes, the processing unit 23 selects one target substrate that has not been processed by S302 as the processing of S302.

Then, as the processing of S303, the processing unit 23 reads out the initial magnetic field map information and the measurement magnetic field map information of the target substrate selected by the processing of S302 from the storage unit 24.

Then, as the processing of S304, the processing unit 23 determines whether or not the selected target substrate has a rotation angle of the magnetic field sensor 14 for which the processing of S305 has not been performed.

When the determination result by the processing of S304 is yes, the processing unit 23 selects one rotation angle in which the processing of S305 has not been performed as the processing of S305.

Then, the processing unit 23 selects (X0, Y0) as the coordinates (X, Y) as the processing of S306. The coordinates (X0, Y0) are the same as those shown in S205 of FIG.

Then, the processing unit 23 obtains the voltage difference as the processing of S307. Here, the voltage difference is the value in the initial magnetic field map information and the measured magnetic field map of the voltage value of the magnetic field detection signal for the target substrate, the rotation angle, and the (X, Y) coordinates selected at the time of processing in S307. The difference from the value in the information.

Then, the processing unit 23 stores the voltage difference derived by the processing of S307 in the storage unit 24 in association with the substrate ID of the target substrate, its rotation angle, and the (X, Y) coordinates as the processing of S308. The storage unit 24 stores these in the magnetic field difference map information storage unit 53.

Then, the processing unit 23 adds ΔX to the value of X as the processing of S309. ΔX is the same as that shown in S208 of FIG.

Then, the processing unit 23 determines whether the value of X exceeds Xm as the processing of S310. Xm is the same as that shown in S209 of FIG.

When the determination result by the processing of S310 is no, the processing unit 23 performs the processing of S307.

After that, the processes of S307 to S310 are repeated, and for Y = Y0, the voltage difference for each X for each ΔX is stored in the magnetic field difference map information storage unit 53 shown in FIG.

Then, the processing unit 23 determines yes by the processing of S310, and sets (X, Y) to (X0, Y + ΔY) as the processing of S311. Here, ΔY is the same as that shown in S210 of FIG.

Then, when the processing unit 23 determines no by the processing of S312, the processing unit 23 performs the processing of S307 again. After that, the processes of S307 to S312 are repeated, and the voltage difference for each (X, Y) coordinate for each ΔX and each ΔY is stored in the magnetic field difference map information storage unit 53 shown in FIG.

Then, the processing unit 23 determines yes by the processing of 312, and performs the processing of S304 again. After that, the processes of S304 to S312 are repeated, and the magnetic field difference map information for each rotation angle is stored in the magnetic field difference map information storage unit 53 shown in FIG.

Then, the processing unit 23 determines no by the processing of S304, and performs the processing of S301 again. After that, as a result of repeating the processes of S301 to S312, the magnetic field difference map information for each target substrate is stored in the magnetic field difference map information storage unit 53 shown in FIG.

Then, the processing unit 23 determines no by the processing of S301, and performs the processing of S313.

When processing S313, the processing unit 23 displays the voltage difference in the magnetic field difference map information stored in the magnetic field difference map information storage unit 53 shown in FIG. 3 for each target substrate and each rotation angle in FIG. 2. Map as shown in (c). Then, the processing unit 23 outputs the mapped magnetic field difference map information to the output unit shown in FIG.

It can be assumed that the operations of A111 and A112 of FIG. 4 are executed as the processing performed by the processing unit 23 shown in FIG. FIG. 7 is a conceptual diagram showing an example of a processing flow of processing performed by the processing unit 23 when the processing unit 23 executes the operations of A111 and A112.

The processing unit 23 starts the processing shown in FIG. 7 based on the start information input by the operator or the like via the input unit 26 shown in FIG. 3, for example.

First, as the processing of S401, the processing unit 23 stores the voltage difference stored in the magnetic field difference map information storage unit 53 held by the storage unit 24 of FIG. 3 during the latest operation of A110 of FIG. Read from. Each voltage difference is associated with the substrate ID of the target substrate, the rotation angle of the magnetic field sensor 14, and the (X, Y) coordinates of the magnetic field sensor 14.

The processing unit 23 also reads the mounting map information from the storage unit 24 as the processing of S402. The mounting map information is information indicating what kind of configuration (electronic device or the like) is arranged at which position on the XY coordinates of each mounting board.

Then, as the processing of S403, the processing unit 23 determines whether or not there is a substrate ID of the target substrate for which the processing of S404 has not been processed. When the determination result by the processing of S403 is yes, the processing unit 23 selects one substrate ID of the target substrate whose processing of S404 has not been processed as the processing of S404.

Then, as the processing of S405, it is determined whether or not the processing of S406 has a rotation angle of the unprocessed magnetic field sensor 14. When the determination result by the processing of S405 is yes, the processing unit 23 selects one rotation angle in which the processing of S406 is not processed as the processing of S406.

Then, the processing unit 23 selects (X0, Y0) as the (X, Y) coordinates as the processing of S407. (X0, Y0) are the same as those represented in the processing of S205 of FIG. 5 and S306 of FIG.

Then, as the processing of S408, the processing unit 23 determines whether the voltage difference associated with the substrate ID, the rotation angle, and the (X, Y) coordinates selected at the time of the processing exceeds the threshold value for the voltage difference. To make a judgment about. The threshold value is determined in advance by experience or the like, assuming that an abnormality is likely to occur when the voltage difference exceeds the threshold value.

When the determination result by the processing of S408 is yes, the processing unit 23 performs the processing of S410. On the other hand, when the determination result by the processing of S408 is no, the processing unit 23 performs the processing of S410.

When the determination result of S408 is yes, the processing unit 23 identifies the configuration (electronic device, etc.) existing at the (X, Y) coordinates selected in the mounting map of the selected board ID as the processing of S410. To do.

Then, the processing unit 23 determines whether or not the configuration ID of the configuration specified by the processing of S410 is in the abnormal configuration list. The abnormality configuration list is created by the processing unit 23 when the first processing of S411 for the selected substrate ID is performed, and is stored in the storage unit 24 shown in FIG. The process of S411 is performed for the purpose of eliminating duplicate storage of the same configuration ID in the abnormal configuration list.

When the determination result by the process of S411 is no, the processing unit 23 stores the configuration ID specified by the process of S410 in the abnormal configuration list as the process of S412. On the other hand, when the determination result by the processing of S411 is yes, the processing unit 23 performs the processing of S413 without storing the configuration ID specified by the processing of S410 in the abnormal configuration list.

When processing S413, the processing unit 23 selects X + ΔX as the value of X. Here, ΔX is the same as that represented in S208 of FIG. 5 and S309 of FIG.

Then, the processing unit 23 determines whether the value of X exceeds Xm as the processing of S414. Here, the value of Xm is the same as that shown in S209 of FIG. 5 and S310 of FIG.

When the determination result by the processing of S414 is no, the processing unit 23 performs the processing of S408 again. Then, as a result of repeating the processes of S408 to S414, when the voltage difference exceeds the threshold value for each X coordinate for each ΔX for Y = Y0, the configuration ID of the configuration at that coordinate is abnormal. Stored in the configuration list.

Then, the processing unit 23 determines yes by the processing of S414, and selects (X0, Y + ΔY) as (X, Y) by the processing of S415.

Then, the processing unit 23 determines whether the value of Y exceeds Ym by the processing of S416. Then, when the determination result by the processing of S416 is no, the processing unit 23 performs the processing of S408 again. Then, as a result of repeating the processes of S408 to S416, when the voltage difference exceeds the threshold value for each Y coordinate for each ΔY and each X coordinate for each ΔX, the configuration ID of the configuration at that coordinate Is stored in the abnormal configuration list.

Then, when the processing unit 23 determines yes by the processing of S416, the processing unit 23 performs the processing of S405 again. Then, for each rotation angle of the magnetic field sensor 14 shown in FIG. 1, the configuration ID is stored in the abnormal configuration list in the same case as described above.

Then, the determination result of S405 becomes no, and the processing unit 23 performs the processing of S403 again. Then, as a result of repeating the processes of S403 to S416, the configuration ID is stored in the abnormal configuration list for each target substrate in the same case as described above.

Then, the processing unit 23 determines no indicating that the processing of FIG. 7 for all the target substrates is completed by the processing of S403.

Then, as the process of S417, the processing unit 23 causes the output unit 25 shown in FIG. 3 to output the abnormality configuration list in which the configuration IDs of the configurations having a high possibility of abnormality are stored for each target substrate.

Then, the processing unit 23 ends the processing shown in FIG. 7.

As described above, the output device of the present embodiment may use a spectrum analyzer to specify the voltage value of the magnetic field detection information. In that case, the output device can output magnetic field difference map information for each assumed frequency. As described above, the magnetic field generated from each position of the mounting board may have a plurality of different frequencies depending on the frequency of the current causing the generation. When the output device outputs magnetic field difference map information for each assumed frequency, the operator or the like can narrow down the electronic devices or the like related to each frequency in advance. Therefore, the output device enables an operator or the like to more accurately identify an electronic device or the like suspected of having an abnormality.

In the above description, an example has been described in which the magnetic field information represented by the magnetic field detection signal detected by the magnetic field sensor is the voltage value of the magnetic field detection signal. However, the magnetic field information may be other information about the magnetic field detected by the magnetic field detection unit. As the information, for example, information indicating the frequency and direction of the magnetic field can be assumed. In that case, the output device of the present embodiment outputs information indicating a difference due to a change over time in the frequency and direction of the magnetic field. Then, the operator or the like identifies the suspected abnormality from the information indicating the difference due to the change in the frequency and direction of the magnetic field with time.
[effect]
The output device of this embodiment outputs magnetic field difference map information indicating the degree of change of the magnetic field generated from each part of the mounting board with time. The operator or the like can identify the suspected abnormality on the mounting board from the output magnetic field difference map information. The degree of change in the magnetic field of a certain part of the mounting substrate with time is not necessarily linked to the change of temperature of that part with time. Therefore, the output device makes it possible to identify a suspected abnormality on the mounting substrate due to a change in temperature over time. If it is difficult to identify the suspected abnormality on the mounting substrate due to changes in temperature over time, it is as described in the section [Problems to be solved by the invention].

The output device may output magnetic field difference map information for each assumed frequency. As described above, the magnetic field generated from each position of the mounting board may have a plurality of different frequencies depending on the frequency of the current causing the generation. When the output device outputs magnetic field difference map information for each assumed frequency, the operator or the like can narrow down the electronic devices or the like related to each frequency in advance. Therefore, the output device enables an operator or the like to more accurately identify an electronic device or the like suspected of having an abnormality.
<Second embodiment>
The second embodiment is an embodiment relating to an output device that outputs temperature difference map information in addition to the magnetic field difference map information described in the first embodiment. The temperature difference map information is map information representing the difference between the temperature for each (X, Y) coordinate and the temperature at the start of operation of the mounting board.
[Configuration and operation]
The output device of the present embodiment first outputs the above-mentioned magnetic field difference map information according to the configuration of the output device 1 shown in FIG.

After that, the output device of the present embodiment is changed to the state shown in FIGS. 8 and 9 by an operator or the like.

In the state shown in FIG. 8, the magnetic field sensor 14 included in the output device 1 shown in FIG. 1 is removed, and the temperature sensor 15 is installed at the position where the magnetic field sensor 14 was. Further, in the processing device 20 shown in FIG. 9, the magnetic field measuring unit 22 shown in FIG. 3 is removed, and the temperature measuring unit 27 is connected to the temperature sensor 15, the processing unit 23, and the like.

Hereinafter, the acquisition of temperature difference map information, the output operation, and the like performed by the output device 1 of the present embodiment will be described.

The processing unit 23 shown in FIG. 9 moves the temperature sensor 15 shown in FIG. 8 by the same method as when the magnetic field sensor 14 in the first embodiment is moved. As a result, the temperature sensor 15 sends a temperature detection signal for detecting the temperature for each (X, Y) coordinate to the temperature measuring unit 27. The temperature measuring unit 27 converts the temperature detection signal into temperature information and sequentially sends it to the processing unit 23.

As a result, the processing unit 23 acquires the temperature map information which is the temperature information for each (X, Y) coordinate and stores it in the storage unit 24 shown in FIG. The processing unit 23 stores the initial temperature map information, which is the temperature map information acquired at the time when the mounting board 71 first starts operation, in the initial temperature map information storage unit 61. The processing unit 23 stores the measured temperature map information, which is the temperature map information acquired thereafter, in the measured temperature map information storage unit 62.

When the measured temperature map information is stored, the processing unit 23 derives the temperature difference map information representing the temperature difference between the initial temperature map information and the measured temperature map information for each (X, Y) coordinate. Then, the derived temperature difference map information is stored in the temperature difference map information storage unit 63.

The processing unit 23 causes the output unit 25 to output the stored temperature difference map information.

From the temperature difference map information and the mounting map information described in the first embodiment, the operator or the like sets a configuration (electronic device, etc.) at a position where an abnormality is suspected from the viewpoint of the temperature difference as a suspected abnormality location. Identify.

The processing unit 23 shown in FIG. 9 may automatically identify the abnormal suspected configuration from the temperature difference map information and the mounting map information, and output the specified suspected configuration to the output unit 25.

The output device of the present embodiment may simultaneously acquire the magnetic field map information and the temperature map information. 10 and 11 are conceptual diagrams showing a configuration example of the output device 1 capable of simultaneously acquiring magnetic field map information and temperature map information.

In the measuring unit 10 shown in FIG. 10, the magnetic field sensor 14 and the temperature sensor 15 are installed close to each other on the lower surface of the rotating stage 13.

Further, as shown in FIG. 11, the processing device 20 includes a magnetic field measuring unit 22 and a temperature measuring unit 27.

The processing unit 23 acquires magnetic field map information and temperature map information for each (X, Y) coordinate according to the configuration.

The processing unit 23 corrects the positional deviation between the magnetic field sensor 14 and the temperature sensor 15 on the XY plane with the XY coordinates in the acquired magnetic field map information and the XY coordinates in the temperature map information. It doesn't matter.

The operations other than the above performed by the output devices shown in FIGS. 10 and 11 are the same as those shown in FIGS. 8 and 9.
[effect]
The output device of the present embodiment also outputs the temperature difference map information in addition to the output of the magnetic field difference map information performed by the output device of the first embodiment. The temperature difference map information is information representing the difference between the initial temperature and the measured temperature for each (X, Y) coordinate of the mounting board. Therefore, the operator or the like can identify the suspected abnormality from the viewpoint of the change in temperature with time, in addition to the identification of the suspected abnormality from the viewpoint of the change in magnetic field with time, from the magnetic field difference map information. Therefore, the output device of the second embodiment makes it possible to identify the suspected abnormal portion due to the change of the magnetic field with time. As a case where it is difficult to identify the suspected abnormality due to the change of the magnetic field with time, for example, it is assumed that the magnetic field sensor cannot be sufficiently brought close to the mounting board due to the high mounting component described in the first embodiment. .. Even in such a case, if it is a temperature sensor, it may be possible to measure the temperature at a distance from the mounting board.

FIG. 12 is a conceptual diagram showing the configuration of the output device 1x, which is the minimum configuration of the output device of the embodiment.

The output device 1x includes a magnetic field detection unit 14x, a moving means 11x, an acquisition means 23x, and an output means 25x.

The magnetic field detection unit 14x outputs a magnetic field detection signal related to the detected magnetic field. The moving means 11x moves the magnetic field detection unit in the plane of a plane parallel to the substrate surface, which is separated from the substrate surface of the mounting substrate by a predetermined distance. The acquisition means 23x acquires the magnetic field information regarding the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of the movement in association with the position information representing the position in the plane. The output means 25x outputs magnetic field difference information representing the difference between the two magnetic field information acquired at different times at the same position.

The magnetic field difference information output by the output device 1x is information indicating whether or not the magnetic field emitted by each portion of the mounting substrate has changed over time. Therefore, the operator or the like can identify the configuration at the position on the mounting board where it is determined that the abnormality in which the magnetic field changes has occurred from the magnetic field difference information. Further, the place where the abnormality occurs in which the magnetic field changes with time is not necessarily equal to the place where the temperature changes with time. Therefore, the output device 1x makes it possible to identify a suspected abnormality that is difficult to identify due to a change in temperature over time.

Therefore, the output device 1x exhibits the effects described in the section [Effects of the Invention] according to the above configuration.

Here, the output device 1x shown in FIG. 12 is, for example, the output device 1 shown in FIG. 1 or FIG. Further, the magnetic field detection unit 14x is, for example, a portion that detects the magnetic field of the magnetic field sensor 14 shown in FIG. 1 or FIG. Further, the moving means 11x is, for example, the XY stage shown in FIG. 1 or FIG. Further, the acquisition means 23x is, for example, a combination of the magnetic field measuring unit 22 and the processing unit 23 shown in FIG. 3 or “FIG. 10. The output means 25x is represented by, for example, FIG. 3 or FIG. The output unit 25. Further, the mounting board is, for example, the mounting board 71 shown in FIG. 1 or FIG. 10, and the board surface is, for example, the upper surface of the mounting board 71 shown in FIG. 1 or FIG. Further, the magnetic field information is, for example, the voltage value, frequency, or direction of the magnetic field of the magnetic field detection signal described above, and the in-plane is, for example, in the XY plane described above. The position information is, for example, the above-mentioned (X, Y) coordinates, and the magnetic field difference information is, for example, the above-mentioned voltage difference, frequency difference, or difference due to a change in the direction of the magnetic field over time.

Although each embodiment of the present invention has been described above, the present invention is not limited to the above-described embodiment, and further modifications, substitutions, and adjustments can be made without departing from the basic technical idea of the present invention. Can be added. For example, the composition of the elements shown in each drawing is an example for assisting the understanding of the present invention, and is not limited to the composition shown in these drawings.

Further, a part or all of the above-described embodiment may be described as in the following appendix, but is not limited to the following.
(Appendix 1)
A magnetic field detector that outputs a magnetic field detection signal related to the detected magnetic field,
A moving means for moving the magnetic field detection unit within the plane of a plane parallel to the substrate surface, which is separated from the substrate surface of the mounting board by a predetermined distance.
An acquisition means for acquiring magnetic field information related to the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of movement in association with position information representing a position in the plane.
An output means for outputting magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position, and
The output device.
(Appendix 2)
The output device according to Appendix 1, wherein the magnetic field information represents a voltage value of the magnetic field detection signal.
(Appendix 3)
The output according to Appendix 1 or Appendix 2, further comprising a rotating means for rotating the magnetic field detection unit in the plane, and the output means outputs the magnetic field difference information regarding a plurality of rotation angles related to the rotation. apparatus.
(Appendix 4)
Further equipped with a temperature sensor that outputs a temperature detection signal related to the temperature detected by the temperature detection unit,
The moving means moves the temperature detection unit, and the moving means moves the temperature detection unit.
The acquisition means acquires temperature information related to the temperature represented by the temperature detection signal output by the temperature sensor in the process of the movement in association with the position information.
The output means outputs temperature difference information representing the difference between two temperature information acquired at different times at the same position.
The output device according to any one of Supplementary note 1 to Supplementary note 3.
(Appendix 5)
Of Appendix 1 to Appendix 4, the mounting information representing the configuration existing at the position of the mounting board is held, and the suspected configuration, which is the configuration suspected of being abnormal, is output from the magnetic field difference information and the mounting information. The output device according to any one of.
(Appendix 6)
Appendix 4 holds mounting information representing the configuration existing at the position of the mounting board, and outputs the suspected configuration which is the configuration suspected of being abnormal from the magnetic field difference information, the temperature difference information, and the mounting information. The output device described in.
(Appendix 7)
The output device according to any one of Supplementary note 1 to Supplementary note 6, wherein the magnetic field difference information is for a predetermined frequency of the magnetic field detection signal.
(Appendix 8)
The output device according to Appendix 7, wherein the magnetic field difference information is for each of the plurality of frequencies.
(Appendix 9)
A magnetic field detection unit that outputs a magnetic field detection signal related to the detected magnetic field is moved in a plane parallel to the substrate surface, which is separated from the substrate surface of the mounting substrate by a predetermined distance.
In the process of the movement, the magnetic field information regarding the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit is acquired in association with the position information representing the position in the plane.
Outputs magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position.
output method.
(Appendix 10)
The temperature detection unit of the temperature sensor that outputs the temperature detection signal related to the temperature detected by the temperature detection unit is moved.
The temperature information regarding the temperature represented by the temperature detection signal output by the temperature sensor in the process of the movement is acquired in association with the position information.
Outputs temperature difference information representing the difference between two temperature information acquired at different times at the same position.
The output method described in Appendix 9.
(Appendix 11)
The magnetic field detection unit and the moving means which is a means for causing the movement at the time of acquiring the magnetic field information are installed on the mounting substrate, and the installation is canceled after the acquisition of the magnetic field information. The output method according to 10.
(Appendix 12)
The output method according to Appendix 9 or Appendix 10, wherein the magnetic field detection unit and the moving means, which is a means for causing the movement, are not installed on the mounting board and the installation is not released.
(Appendix 13)
At the time of acquisition of the magnetic field information, the magnetic field detection unit is attached to the moving means which is the means for performing the movement, and the temperature detection unit is not attached to the moving means, and the temperature information is obtained. The output method according to Appendix 10, wherein the temperature detection unit is attached to the moving means and the magnetic field detecting unit is not attached to the moving means at the time of acquisition.
(Appendix 14)
A process of moving the magnetic field detection unit with the magnetic field detection unit that outputs a magnetic field detection signal related to the detected magnetic field in the plane of a surface parallel to the substrate surface at a predetermined distance from the substrate surface of the mounting substrate. ,
A process of acquiring magnetic field information related to the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of movement in association with position information representing a position in the plane.
Processing to output magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position, and
An output program that lets your computer run.

1, 1x output device 10 Measuring unit 11 XY stage 11x Moving means 11a Upper surface 11b Lower surface 12 Z stage 13 Rotating stage 14 Magnetic field sensor 14x Magnetic field detector 15 Temperature sensor 20 Processing device 21 Moving control unit 22 Magnetic field measuring unit 23 Processing unit 23x Acquisition means 24 Storage unit 25 Output unit 25x Output means 26 Input unit 27 Temperature measurement unit 40 Housing 41 Top plate 51 Initial magnetic field map information storage unit 52 Measurement magnetic field map information storage unit 53 Magnetic field difference map information storage unit 61 Initial temperature map Information storage unit 62 Measurement temperature map information storage unit 63 Temperature difference map information storage unit 71 Mounting board

Claims (10)

A magnetic field detector that outputs a magnetic field detection signal related to the detected magnetic field,
A moving means for moving the magnetic field detection unit within the plane of a plane parallel to the substrate surface, which is separated from the substrate surface of the mounting board by a predetermined distance.
An acquisition means for acquiring magnetic field information related to the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of movement in association with position information representing a position in the plane.
An output means for outputting magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position, and
The output device. The output device according to claim 1, wherein the magnetic field information represents a voltage value of the magnetic field detection signal. The first or second aspect of the present invention, further comprising a rotating means for rotating the magnetic field detection unit in the plane, the output means outputs the magnetic field difference information regarding a plurality of rotation angles related to the rotation. Output device. Further equipped with a temperature sensor that outputs a temperature detection signal related to the temperature detected by the temperature detection unit,
The moving means moves the temperature detection unit, and the moving means moves the temperature detection unit.
The acquisition means acquires temperature information related to the temperature represented by the temperature detection signal output by the temperature sensor in the process of the movement in association with the position information.
The output means outputs temperature difference information representing the difference between two temperature information acquired at different times at the same position.
The output device according to any one of claims 1 to 3. Claims 1 to 4 which hold the mounting information representing the configuration existing at the position of the mounting board and output the suspected configuration which is the configuration suspected of being abnormal from the magnetic field difference information and the mounting information. The output device according to any one of the following. A claim that holds mounting information representing a configuration existing at the position of the mounting board, and outputs a suspected configuration that is the configuration suspected of being abnormal from the magnetic field difference information, the temperature difference information, and the mounting information. The output device according to 4. The output device according to any one of claims 1 to 6, wherein the magnetic field difference information is for a predetermined frequency of the magnetic field detection signal. A magnetic field detection unit that outputs a magnetic field detection signal related to the detected magnetic field is moved in a plane parallel to the substrate surface, which is separated from the substrate surface of the mounting substrate by a predetermined distance.
In the process of the movement, the magnetic field information regarding the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit is acquired in association with the position information representing the position in the plane.
Outputs magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position.
output method. The temperature detection unit of the temperature sensor that outputs the temperature detection signal related to the temperature detected by the temperature detection unit is moved.
The temperature information regarding the temperature represented by the temperature detection signal output by the temperature sensor in the process of the movement is acquired in association with the position information.
Outputs temperature difference information representing the difference between two temperature information acquired at different times at the same position.
The output method according to claim 8. A process of moving the magnetic field detection unit with the magnetic field detection unit that outputs a magnetic field detection signal related to the detected magnetic field in the plane of a surface parallel to the substrate surface at a predetermined distance from the substrate surface of the mounting substrate. ,
A process of acquiring magnetic field information related to the magnetic field represented by the magnetic field detection signal output by the magnetic field detection unit in the process of movement in association with position information representing a position in the plane.
Processing to output magnetic field difference information representing the difference between two magnetic field information acquired at different times at the same position, and
An output program that lets your computer run.

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