JP2020529332A - 平坦性が向上された微細複製研磨表面 - Google Patents
平坦性が向上された微細複製研磨表面 Download PDFInfo
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- JP2020529332A JP2020529332A JP2020505906A JP2020505906A JP2020529332A JP 2020529332 A JP2020529332 A JP 2020529332A JP 2020505906 A JP2020505906 A JP 2020505906A JP 2020505906 A JP2020505906 A JP 2020505906A JP 2020529332 A JP2020529332 A JP 2020529332A
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/12—Lapping plates for working plane surfaces
- B24B37/16—Lapping plates for working plane surfaces characterised by the shape of the lapping plate surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D2203/00—Tool surfaces formed with a pattern
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2031/00—Other particular articles
- B29L2031/736—Grinding or polishing equipment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Abstract
Description
Claims (27)
- 複数のチャネルによって分離された複数の隆起したセルを含む研磨層を備え、
前記複数の隆起したセルのそれぞれは、
複数の微細構造を含む微細構造化作業表面であって、前記複数の微細構造の頂部が上面を画定し、前記複数の微細構造の基部がベース面を画定する、微細構造化作業表面と、
前記複数のチャネルの壁を画定する実質的に垂直なチャネル表面であって、チャネル面を画定するチャネル表面と、
前記作業表面の縁部と前記チャネル表面の上縁部との間のオフセット表面と、
を含む、物品。 - 前記オフセット表面は、変位した材料の非平面部分を含み、前記変位した材料の山部が、前記作業表面に平行な変位面を画定する、請求項1に記載の物品。
- 前記変位面は、前記ベース面の下方にある、請求項2に記載の物品。
- 前記上面からの前記変位面の深さが、前記複数の微細構造の平均高さよりも大きい、請求項2に記載の物品。
- 前記上面からの前記変位面の深さは、少なくとも10μmである、請求項2に記載の物品。
- 前記上面からの前記変位面の深さは、5μm未満である、請求項2に記載の物品。
- 前記上面、前記チャネル面、及び前記オフセット表面は、オフセット体積を画定する、請求項6に記載の物品。
- 前記作業表面の前記縁部は、隣接するチャネル面からオフセット幅又はオフセット長さだけオフセットされている、請求項7に記載の物品。
- 前記オフセット幅又はオフセット長さは、約10μm〜1mmである、請求項8に記載の物品。
- 前記オフセット幅又はオフセット長さは、前記作業表面の幅又は長さの約1%〜約50%である、請求項8に記載の物品。
- 前記隆起したセルは、多角形である、請求項1に記載の物品。
- 前記隆起したセルは、矩形、三角形、円形、又は楕円形である、請求項1に記載の物品。
- 前記複数のチャネルの少なくとも一部は、前記物品の長さにわたって連続的である、請求項1に記載の物品。
- 前記複数のチャネルの少なくとも一部は、前記物品の長さにわたって不連続である、請求項1に記載の物品。
- 前記複数のセルは、ヘリンボーン、クロスハッチ、又は湾曲パターンである、請求項14に記載の物品。
- 前記微細構造化作業表面は、複数の細孔及び複数の凹凸を含む、請求項15に記載の物品。
- 前記オフセット表面の少なくとも一部は、実質的に垂直な段付き表面を有する、請求項16に記載の物品。
- 前記オフセット表面は、階段状表面、角度付き表面、及び湾曲表面のうちの少なくとも1つである、請求項17に記載の物品。
- 前記オフセット表面は、実質的に垂直な上部と傾斜した下部とを含む、請求項18に記載の物品。
- 前記研磨層とは異なる熱膨張係数を有する第2の層を前記研磨層の下方に更に備える、請求項1に記載の物品。
- 基材を保持するように構成されたキャリヤアセンブリと、
請求項1に記載の物品を備える研磨パッドと、
前記研磨パッドに連結されたプラテンと、
流体成分と研磨成分とを含む研磨溶液と、
を備え、
前記研磨パッドを前記基材に対して移動させるように構成されているシステム。 - 主表面を有する基材を準備することと、
請求項1に記載の前記物品を備える研磨パッドを準備することと、
流体成分及び研磨成分を含む研磨溶液を含むことと、
前記研磨パッドと前記基材の前記主表面とを相対運動させながら、前記基材の前記主表面を前記研磨パッド及び前記研磨溶液と接触させることと、
を含む、方法。 - 請求項1に記載の前記物品の作業表面と、前記チャネル表面と、前記オフセット表面と、に対応する構造化表面を有する高精細ツール。
- 前記構造化表面は、高精細中の材料の変位に適応するオフセット表面を形成するように構成されている、請求項23に記載の高精細ツール。
- 前記変位した材料が前記ベース面の下方にくるように、前記構造化表面は、前記オフセット表面に対応する部分を有して構成されている、請求項23に記載の高精細ツール。
- 前記変位した材料が前記上面の公差内に収まるように、前記構造化表面は、前記オフセット表面に対応する部分を有して構成されている、請求項23に記載の高精細ツール。
- 前記公差は、5μm未満である、請求項26に記載の高精細ツール。
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