JP2020527302A - 大きなデータをより小さな表現に変換する、およびより小さな表現を当初の大きなデータに戻して再変換するためのシステムおよび方法 - Google Patents
大きなデータをより小さな表現に変換する、およびより小さな表現を当初の大きなデータに戻して再変換するためのシステムおよび方法 Download PDFInfo
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
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- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
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- G06F12/02—Addressing or allocation; Relocation
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- H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
- H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
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Abstract
【選択図】図1
Description
Claims (1)
- システムであって、
1つまたは複数のコアを伴う少なくとも1つのプロセッサと、
方法を遂行するように前記少なくとも1つのプロセッサを構成するための命令を部分的に含むメモリと
を備え、
前記方法は、
あるデータ長のデータセットを受信するステップと、
前記データセットのビットパターンを決定するステップと、
前記ビットパターンの基準セットを生成するステップであって、前記基準セットは、セット長を有し、前記セット長は、前記データ長に等しく、前記ビットパターンの前記基準セットは、すべて0からすべて1までの、あらゆる可能な異なるビットパターンを含むステップと、
試験データに適用される第1のビットパターン生成関数を使用して、第1の試験ビットパターンを決定するステップと、
前記第1の試験ビットパターンの場所および前記データセットの前記ビットパターンの場所を使用して、前記第1の試験ビットパターンと前記データセットの前記ビットパターンとの間の距離を決定するステップであって、これらの前記場所は、前記ビットパターンの前記基準セットに対するものであるステップと、
前記データセットの前記ビットパターンの方向に前記第1の試験パターン生成関数を反復し、前記第1の試験パターン生成関数を少なくとも1つの第2の試験ビットパターン生成関数と組み合わせて、前記試験データに適用される第2の試験ビットパターンを決定するステップと、
前記第2の試験ビットパターンの場所および前記データセットの前記ビットパターンの前記場所を使用して、前記第2の試験ビットパターンと前記データセットの前記ビットパターンとの間の距離を決定するステップであって、これらの前記場所は、前記ビットパターンの前記基準セットに対するものであるステップと、
前記第2の試験ビットパターンと前記データセットの前記ビットパターンとの間の前記距離が、しきい値距離以下である場合、前記しきい値距離に基づき誤差関数を生成し、ビットパターン関数および前記誤差関数を提供して、前記データセットを再現するステップであって、前記ビットパターン関数は、前記第1の試験パターン生成関数の前記反復、および前記第1の試験パターン生成関数と前記少なくとも1つの第2の試験ビットパターン生成関数の前記組合せに等価であるステップと、
前記ビットパターン関数および前記誤差関数に基づき前記データセットを回復するステップと
を備えるシステム。
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JP2021103991A JP7488798B2 (ja) | 2017-06-26 | 2021-06-23 | 大きなデータをより小さな表現に変換する、およびより小さな表現を当初の大きなデータに戻して再変換するためのシステムおよび方法 |
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US201862658432P | 2018-04-16 | 2018-04-16 | |
US62/658,432 | 2018-04-16 | ||
PCT/US2018/039620 WO2019005888A1 (en) | 2017-06-26 | 2018-06-26 | SYSTEMS AND METHODS FOR TRANSFORMING LARGE DATA TO A REDUCED SIZE REPRESENTATION |
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JP2021103991A Active JP7488798B2 (ja) | 2017-06-26 | 2021-06-23 | 大きなデータをより小さな表現に変換する、およびより小さな表現を当初の大きなデータに戻して再変換するためのシステムおよび方法 |
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US (3) | US10621108B2 (ja) |
EP (1) | EP3646208A4 (ja) |
JP (2) | JP6903773B2 (ja) |
KR (3) | KR20240019390A (ja) |
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CN112578188B (zh) * | 2020-11-04 | 2023-07-07 | 深圳供电局有限公司 | 电气量波形的生成方法、装置、计算机设备和存储介质 |
KR20240055727A (ko) | 2021-08-25 | 2024-04-29 | 유니티카 가부시끼가이샤 | 연자성 나노와이어 및 그를 포함하는 도료, 및 그를 도포하여 이루어지는 적층체 |
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US20190018793A1 (en) | 2019-01-17 |
KR102366069B1 (ko) | 2022-02-23 |
US11003589B2 (en) | 2021-05-11 |
JP7488798B2 (ja) | 2024-05-22 |
US20210326269A1 (en) | 2021-10-21 |
JP6903773B2 (ja) | 2021-07-14 |
KR20210107136A (ko) | 2021-08-31 |
CN111357203A (zh) | 2020-06-30 |
WO2019005888A1 (en) | 2019-01-03 |
EP3646208A1 (en) | 2020-05-06 |
EP3646208A4 (en) | 2021-03-17 |
JP2021166072A (ja) | 2021-10-14 |
KR20240019390A (ko) | 2024-02-14 |
KR20200064054A (ko) | 2020-06-05 |
US10621108B2 (en) | 2020-04-14 |
US20200218666A1 (en) | 2020-07-09 |
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