JP2020520410A - How to connect components by means of metal paste - Google Patents
How to connect components by means of metal paste Download PDFInfo
- Publication number
- JP2020520410A JP2020520410A JP2019557836A JP2019557836A JP2020520410A JP 2020520410 A JP2020520410 A JP 2020520410A JP 2019557836 A JP2019557836 A JP 2019557836A JP 2019557836 A JP2019557836 A JP 2019557836A JP 2020520410 A JP2020520410 A JP 2020520410A
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- JP
- Japan
- Prior art keywords
- radiation
- metal paste
- components
- component
- weight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 229910052751 metal Inorganic materials 0.000 title claims abstract description 71
- 239000002184 metal Substances 0.000 title claims abstract description 71
- 230000005855 radiation Effects 0.000 claims abstract description 46
- 238000000034 method Methods 0.000 claims abstract description 40
- 238000001272 pressureless sintering Methods 0.000 claims abstract description 21
- 239000003960 organic solvent Substances 0.000 claims abstract description 20
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 238000005245 sintering Methods 0.000 claims abstract description 14
- 239000012298 atmosphere Substances 0.000 claims abstract description 11
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 7
- 239000001301 oxygen Substances 0.000 claims abstract description 7
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 7
- 238000001035 drying Methods 0.000 claims description 38
- 239000002243 precursor Substances 0.000 claims description 3
- 239000000654 additive Substances 0.000 claims description 2
- 150000001875 compounds Chemical class 0.000 claims description 2
- 239000002923 metal particle Substances 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 239000002245 particle Substances 0.000 description 5
- 229910052709 silver Inorganic materials 0.000 description 5
- 239000004332 silver Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 239000012299 nitrogen atmosphere Substances 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 239000013557 residual solvent Substances 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 239000001856 Ethyl cellulose Substances 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 2
- 229920001249 ethyl cellulose Polymers 0.000 description 2
- 235000019325 ethyl cellulose Nutrition 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000000643 oven drying Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000010008 shearing Methods 0.000 description 2
- NDVLTYZPCACLMA-UHFFFAOYSA-N silver oxide Chemical compound [O-2].[Ag+].[Ag+] NDVLTYZPCACLMA-UHFFFAOYSA-N 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- WUOACPNHFRMFPN-SECBINFHSA-N (S)-(-)-alpha-terpineol Chemical compound CC1=CC[C@@H](C(C)(C)O)CC1 WUOACPNHFRMFPN-SECBINFHSA-N 0.000 description 1
- ZXSQEZNORDWBGZ-UHFFFAOYSA-N 1,3-dihydropyrrolo[2,3-b]pyridin-2-one Chemical compound C1=CN=C2NC(=O)CC2=C1 ZXSQEZNORDWBGZ-UHFFFAOYSA-N 0.000 description 1
- XUJLWPFSUCHPQL-UHFFFAOYSA-N 11-methyldodecan-1-ol Chemical compound CC(C)CCCCCCCCCCO XUJLWPFSUCHPQL-UHFFFAOYSA-N 0.000 description 1
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 239000005639 Lauric acid Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- OVKDFILSBMEKLT-UHFFFAOYSA-N alpha-Terpineol Natural products CC(=C)C1(O)CCC(C)=CC1 OVKDFILSBMEKLT-UHFFFAOYSA-N 0.000 description 1
- 229940088601 alpha-terpineol Drugs 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 150000004675 formic acid derivatives Chemical class 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 235000003441 saturated fatty acids Nutrition 0.000 description 1
- 150000004671 saturated fatty acids Chemical class 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- LKZMBDSASOBTPN-UHFFFAOYSA-L silver carbonate Substances [Ag].[O-]C([O-])=O LKZMBDSASOBTPN-UHFFFAOYSA-L 0.000 description 1
- 229910001958 silver carbonate Inorganic materials 0.000 description 1
- 229910001923 silver oxide Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F1/00—Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
- B22F1/10—Metallic powder containing lubricating or binding agents; Metallic powder containing organic material
- B22F1/107—Metallic powder containing lubricating or binding agents; Metallic powder containing organic material containing organic material comprising solvents, e.g. for slip casting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F7/00—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression
- B22F7/06—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite workpieces or articles from parts, e.g. to form tipped tools
- B22F7/062—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite workpieces or articles from parts, e.g. to form tipped tools involving the connection or repairing of preformed parts
- B22F7/064—Manufacture of composite layers, workpieces, or articles, comprising metallic powder, by sintering the powder, with or without compacting wherein at least one part is obtained by sintering or compression of composite workpieces or articles from parts, e.g. to form tipped tools involving the connection or repairing of preformed parts using an intermediate powder layer
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
- B23K1/203—Fluxing, i.e. applying flux onto surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
- B23K35/025—Pastes, creams, slurries
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
- H01L21/4825—Connection or disconnection of other leads to or from flat leads, e.g. wires, bumps, other flat leads
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
- H01L21/4882—Assembly of heatsink parts
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- H—ELECTRICITY
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- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3463—Solder compositions in relation to features of the printed circuit board or the mounting process
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F1/00—Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
- B22F1/10—Metallic powder containing lubricating or binding agents; Metallic powder containing organic material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F2998/00—Supplementary information concerning processes or compositions relating to powder metallurgy
- B22F2998/10—Processes characterised by the sequence of their steps
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/42—Printed circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04026—Bonding areas specifically adapted for layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05617—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/05624—Aluminium [Al] as principal constituent
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05639—Silver [Ag] as principal constituent
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
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- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05644—Gold [Au] as principal constituent
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- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
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- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05647—Copper [Cu] as principal constituent
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Abstract
この発明は、(1)第1のコンポーネントの接触面に有機溶剤を含む金属ペーストを塗布するステップと、(2)前記第1のコンポーネントに接続される第2のコンポーネントの前記接触面に前記金属ペーストを任意に塗布するステップと、(3)前記2つのコンポーネントと、その間の金属ペーストの層を有するサンドイッチ構造を作成するステップと、(4)前記2つのコンポーネントの間の前記金属ペーストの前記層を乾燥させるステップと、(5)前記乾燥させた金属ペーストの層を備える前記サンドイッチ構造を無加圧焼結するステップと、とを備えた、コンポーネントを接続する方法において、前記乾燥および前記無加圧焼結は、750乃至1500nmの間の波長レンジにおけるピーク波長を有するIR放射を用いた放射により行われる、コンポーネントを接続する方法に関する。前記コンポーネントは、基板、能動コンポーネント、受動コンポーネントから構成されるグループから選択される。前記コンポーネントの1つまたは両方は、前記IR放射に対して透過性がある。ステップ(4)とステップ(5)は、酸素雰囲気または無酸素雰囲気の下で行われる。両方の場合において、コンポーネントの少なくとも一方は、酸素に敏感な接触面を有する。The present invention comprises (1) applying a metal paste containing an organic solvent to the contact surface of the first component, and (2) applying the metal to the contact surface of a second component connected to the first component. Optionally applying a paste; (3) creating a sandwich structure having the two components and a layer of metal paste between them; (4) the layer of the metal paste between the two components. And (5) pressureless sintering the sandwich structure comprising the layer of dried metal paste, the method comprising the steps of: Pressure sintering relates to a method of connecting components, which is performed by radiation with IR radiation having a peak wavelength in the wavelength range between 750 and 1500 nm. The component is selected from the group consisting of a substrate, an active component and a passive component. One or both of the components are transparent to the IR radiation. Steps (4) and (5) are performed under an oxygen atmosphere or an oxygen-free atmosphere. In both cases, at least one of the components has an oxygen sensitive contact surface.
Description
この発明は、金属ペーストの手段によりコンポーネントを接続する方法に関する。電力および家電の分野において、高い圧力と温度感度を有するコンポーネントの接続は、特定の課題を表す(represents a particular challenge)。このために、そのような圧力および温度に敏感なコンポーネントがしばしば接着(adhesion)により互いに接続される。しかしながら、接着技術は、それぞれ、唯一の不十分な熱伝導性又は電気伝導性を有する、コンポーネント間の接点は、接着技術により作られるという欠点を有する。 The invention relates to a method of connecting components by means of a metal paste. In the fields of power and consumer electronics, the connection of components with high pressure and temperature sensitivity represents a particular challenge. For this reason, such pressure and temperature sensitive components are often connected to each other by adhesion. However, the bonding technique has the disadvantage that the contacts between the components, which each have only one poor thermal or electrical conductivity, are made by the bonding technique.
この問題の周知の解法は、焼結(sintering)により圧力をかけない方法で接続しようとするコンポーネントを接続することである。無加圧焼結(pressureless sintering)は、安定した方法でコンポーネントを接続するための非常に簡単な方法を表す。 A well-known solution to this problem is to connect the components to be connected in a pressure-free manner by sintering. Pressureless sintering represents a very simple way to connect components in a stable manner.
有機溶剤を含む金属ペーストは、それゆえ、通常接続されるコンポーネントの一方または両方の接続すべき接触面に提供され、接続される接触面は、サンドイッチ構造(sandwich arrangement)を形成することにより、その中に位置する金属ペーストの層によって互いに接触される。それにより、コンポーネントの互いに向き合う2つの接触面は、ジョイントオーバーラップサーフェス(a joint overlap surface)を形成する。乾燥工程が、増大した温度で続き、およびその後に焼結工程が続き、焼結工程は、さらに増大した温度で、圧力をかけない態様で(押圧なしで)行われ、その過程で、コンポーネント間の固定された機械的接続が作り出される。乾燥および焼結は、通常対流式オーブンで行われる。例えば、1乃至25mm2のレンジで接続されるコンポーネントのそれぞれ接続または接触面、またはオーバーラップ面のサイズに応じて、従来技術のこの乾燥工程は、100℃乃至160℃の間のオーブン温度で、30分乃至180分の範囲の時間を必要とする。短すぎる乾燥期間を選択すると、例えば、まだ焼結している層内の引け巣(shrinkage cavities)のような望ましくない不完全さ(unwanted imperfections)をしばしば形成する。そのような気孔(pores)や欠陥(imperfections)は、次に焼結される層の形態における後の接続を機械的に弱めるだけでなく、その電気的導電性ならびに熱伝導性に関しても弱める可能性がある。 The metal paste containing the organic solvent is therefore usually provided on one or both contacting surfaces to be connected of the components to be connected, the contacting surfaces being connected by forming a sandwich arrangement thereof. The layers of metal paste located therein are in contact with each other. Thereby, the two contact surfaces of the component facing each other form a joint overlap surface. The drying step is followed by an increased temperature and then a sintering step, the sintering step being carried out at a further increased temperature in a pressure-free manner (without pressing), in the process of A fixed mechanical connection of is created. Drying and sintering are usually done in a convection oven. Depending on the size of the respective connection or contact surface or overlapping surface of the components to be connected in the range of 1 to 25 mm 2 , this prior art drying process can be carried out at oven temperatures between 100° C. and 160° C., It requires a time in the range of 30 to 180 minutes. Choosing a drying period that is too short often results in the formation of unwanted imperfections such as shrinkage cavities in the layer that are still sintering. Such pores and imperfections may not only mechanically weaken subsequent connections in the form of subsequently sintered layers, but also their electrical and thermal conductivity. There is.
この発明は、対流によってではなく、IR放射(赤外線放射)によって乾燥並びに無加圧焼結(pressureless sintering)を行うことにある。この発明に従う方法は、(1)有機溶剤を含む金属ペーストを第1のコンポーネントの接触面に塗布するステップと、(2)前記第1のコンポーネントに接続される第2のコンポーネントの前記接触面に前記金属ペーストを任意に塗布するステップと、(3)前記2つのコンポーネントとその間の前記金属ペーストの層でサンドウィッチ構造を製造するステップと、(4)前記2つのコンポーネントの間の前記金属ペーストの前記層を乾燥するステップと、(5)乾燥された金属ペーストの層を備える前記サンドイッチ構造を無加圧焼結するステップと、を備えた、コンポーネントを焼結する方法において、前記乾燥および前記無加圧焼結は、750乃至1500nmの間の波長レンジ内にピーク波長を有するIR放射(赤外線放射)により行われることを特徴とする、コンポーネントを接続する方法である。この発明に従う方法は、ステップ(1)乃至(5)を備える。それらは、特定の連続ステップであって、特に、中間ステップを伴わない直接連続したステップである。 The invention consists in carrying out drying as well as pressureless sintering by IR radiation (infrared radiation) rather than by convection. The method according to the invention comprises: (1) applying a metal paste containing an organic solvent to the contact surface of a first component; and (2) applying to the contact surface of a second component connected to the first component. Optionally applying the metal paste; (3) manufacturing a sandwich structure with the two components and a layer of the metal paste in between; (4) the metal paste between the two components. A method of sintering a component comprising the steps of: drying a layer; and (5) pressurelessly sintering the sandwich structure comprising a layer of dried metal paste, the method comprising the steps of: Pressure sintering is a method of connecting components, characterized in that it is performed by IR radiation (infrared radiation) having a peak wavelength in the wavelength range between 750 and 1500 nm. The method according to the invention comprises steps (1) to (5). They are specific consecutive steps, in particular directly consecutive steps without intermediate steps.
この発明の一部として、コンポーネントという用語は、望ましくは個々のパーツを備える。これらの個々のパーツは、望ましくは、より小さなパーツに分割することはできない。各コンポーネントは、1つの、またオプションとして複数の接触面を有する。接触面は、一般的には、例えばメタライゼーション層(metallization layer)の形態のメタリックである。コンポーネントまたは接触面の金属は、純金属または金属の合金であり得る。アルミニウム、銅、銀、金、ニッケル、パラジウム、鉄、およびプラチナが金属の例である。 As part of this invention, the term component preferably comprises individual parts. These individual parts desirably cannot be divided into smaller parts. Each component has one and optionally multiple contact surfaces. The contact surface is generally metallic, for example in the form of a metallization layer. The metal of the component or contact surface can be a pure metal or an alloy of metals. Aluminum, copper, silver, gold, nickel, palladium, iron, and platinum are examples of metals.
この発明に従う方法で使用されるコンポーネントの接触面は、例えば、1乃至150mm2の間のレンジであり、特に>20乃至150mm2の間、具体的には、40と150mm2との間のレンジである。この発明に従う方法は、また、上述したタイプの欠陥の形成を受け入れる必要なく、それにもかかわらず、かなり短期間の乾燥と無加圧焼結で大きな接触面を備えたコンポーネントで実施することができる。接続される第1および第2のコンポーネントは、同じタイプであり得、すなわち、それらは、例えば、両方の場合に基板であり得、または、それらは、各々が複数の能動または受動コンポーネントであるかまたは1つの能動および受動コンポーネントである。しかしながら、一方のコンポーネントが基板で、他方のコンポーネントが能動または受動コンポーネントであり得、または逆も同様である。基板、能動コンポーネントおよび受動コンポーネントは、特に、電子工学で使用されるパーツである。 The contact surfaces of the components used in the method according to the invention are, for example, in the range between 1 and 150 mm 2 , in particular between >20 and 150 mm 2 , in particular between 40 and 150 mm 2. Is. The method according to the invention also does not have to accept the formation of defects of the type described above, and can nevertheless be carried out on components with large contact surfaces with a very short drying and pressureless sintering. .. The connected first and second components may be of the same type, ie they may be substrates in both cases, for example, or they may each be a plurality of active or passive components. Or one active and passive component. However, one component can be a substrate and the other component can be an active or passive component, and vice versa. Substrates, active components and passive components are, inter alia, parts used in electronics.
従って、以下の実施形態は、例えば、異ならせることができる。
有機溶剤を含む金属ペーストは、金属焼結ペーストとも呼ばれる、それぞれコンポーネントまたはコンポーネントの接触面の間に焼結接続を作り出す手段として当業者に知られている、共通の金属プレートである。そのような金属ペーストは、例えば、焼結可能な金属粒子、特に、銀粒子、銀合金粒子、銅粒子及び/又は銅合金粒子を、25%乃至90%重量含み、有機溶剤を5%乃至30%重量含み、特に、金属前駆体化合物(金属前駆体)、特に銀酸化物、炭酸銀を0%乃至65%重量含み、焼結助剤、例えば、過酸化物、ギ酸塩を0%乃至5%重量含み、他の添加物、例えば、飽和脂肪酸及び/又はエチルセルロースまたはポリイミドのようなポリマーを0%乃至5%重量%含む。 Metal pastes containing organic solvents are also common metal plates, also known as metal sinter pastes, known to those skilled in the art as a means of creating sinter connections between components or contact surfaces of components, respectively. Such a metal paste contains, for example, 25% to 90% by weight of sinterable metal particles, in particular silver particles, silver alloy particles, copper particles and/or copper alloy particles, and 5% to 30% of an organic solvent. % By weight, particularly 0% to 65% by weight of metal precursor compound (metal precursor), especially silver oxide, silver carbonate, and 0% to 5% of sintering aids such as peroxides and formates. %, and other additives such as saturated fatty acids and/or polymers such as ethyl cellulose or polyimide from 0% to 5% by weight.
そのような金属ペーストは、種々の実施形態、例えば、WO2016/071005A1、EP3009211A1、 WO2016/028221A1、WO2015、193014A1、WO2014177645A1、WO2014/170050A1、WO2011/026624A1、WO2011/026623A1、EP2572814A1、EP2425920A1、およびEP2158997A2に開示されている。 Such metal pastes are disclosed in various embodiments, for example WO2016/071005A1, EP3009211A1, WO2016/028221A1, WO2015, 193014A1, WO20141776445A1, WO2014/170050A1, WO2011/0266224A1, WO2011/026623A1, EP2577282A15, EP2572814A1 and EP2572814A1, EP2572829A1. Has been done.
第1のコンポーネントの接触面への金属ペーストの塗布は、一般的な方法、、例えば、スクリーン印刷、ステンシル印刷、または噴射などの印刷方法によって実施することができる。他方、金属ペーストの塗布は、ディスペンス技術(dispensing technology)、ピントランスファー(pin transfer)、またはディッピング(dipping)によって行うこともできる。この発明に従う方法は、任意ステップ(2)を備える。ステップ(2)が生じると、すでに上で示した金属ペーストは、また第2のコンポーネントの接触面に塗布される。上述の塗布方法は、可能な塗布方法である。 The application of the metal paste to the contact surface of the first component can be carried out by a common method, for example, a printing method such as screen printing, stencil printing, or spraying. On the other hand, the application of the metal paste can also be performed by a dispensing technology, a pin transfer, or a dipping. The method according to the invention comprises an optional step (2). When step (2) occurs, the metal paste already indicated above is also applied to the contact surface of the second component. The coating method described above is a possible coating method.
2つのコンポーネントと2つのコンポーネントの間の金属ペーストによるサンドイッチ構造がステップ(3)で作成される。この目的のために、金属ペーストを備えた接触面を持つ第1のコンポーネントを、オプションで金属ペーストを備えた第2のコンポーネントの接触面に取り付けるか、第2のコンポーネントを任意に金属ペースを備えた接触面で、金属ペーストを備えた第1の構成要素の接触面に取り付ける。この結果、金属ペーストの層は、接続されるコンポーネントの間にある。 A sandwich structure with two components and a metal paste between the two components is created in step (3). For this purpose, a first component with a contact surface with metal paste is optionally attached to the contact surface of a second component with metal paste, or the second component is optionally equipped with a metal pace. The contact surface of the first component with the metal paste. As a result, a layer of metal paste is between the components to be connected.
金属ペーストの層の湿潤膜厚は、好ましくは、20乃至200μmの範囲である。ここで、湿潤フィルムの厚さは、乾燥前の構成要素の、互いに向かい合っているか、または互いに向かい合って配置されている接触面間の距離として理解される。湿潤フィルム層は、例えば、金属ペーストを塗布する選択された方法に依存することができる。スクリーン印刷法により塗布された金属ペーストの場合、湿潤フィルムの厚さは、例えば20乃至50μmの範囲、ステンシル印刷の場合、例えば50乃至200μmの範囲であり、ディスペンス塗布の場合、例えば、20乃至100μmの範囲であり、噴射による塗布の場合、例えば20乃至70μmの範囲であり得る。 The wet film thickness of the metal paste layer is preferably in the range of 20 to 200 μm. Here, the thickness of the wet film is understood as the distance between the contact surfaces of the components before drying, which face each other or are arranged facing each other. The wet film layer can depend, for example, on the selected method of applying the metal paste. In the case of the metal paste applied by the screen printing method, the thickness of the wet film is, for example, in the range of 20 to 50 μm, in the case of stencil printing, it is in the range of 50 to 200 μm, and in the case of the dispense application, for example, 20 to 100 μm. In the case of coating by spraying, it may be, for example, in the range of 20 to 70 μm.
この発明に従う、方法のステップ(4)において、2つのコンポーネントの接触面の間の金属ペーストの層は乾燥される。乾燥に応答して、有機溶剤は金属ペーストから除去される。好適実施形態に従って、乾燥した金属ペーストの有機溶剤の部位は、金属ペースト、すなわち、塗布準備ができた金属ペースト(application-ready metal paste)の有機溶剤のオリジナル部位に基づいて、例えば、0乃至5%重量の間、又は0乃至<1%重量の間である。言い換えれば、例えば、この好ましい実施形態による乾燥に応じて、金属ペーストに最初に含まれていた1つの有機溶媒又は複数の有機溶媒の95乃至100重量%または>99乃至100重量%が除去される。 In step (4) of the method according to the invention, the layer of metal paste between the contact surfaces of the two components is dried. In response to drying, the organic solvent is removed from the metal paste. According to a preferred embodiment, the organic solvent part of the dried metal paste is based on the original part of the organic solvent of the metal paste, i.e. application-ready metal paste, for example 0-5. %, or between 0 and <1% weight. In other words, 95-100% by weight or >99-100% by weight of the organic solvent or solvents originally contained in the metal paste are removed, for example, upon drying according to this preferred embodiment. ..
乾燥は、波長範囲が750乃至1500nm、好ましくは750乃至1200nmのピーク波長を有するIR放射線を照射することにより行われる。所望であれば、対流によって同時にサポートを行うことができるが、これは必要でもなければ、好ましくもない。言い換えれば、750乃至1500nm、好ましくは750乃至1200nmの波長範囲のピーク波長を有するIR放射線を照射することによってのみ乾燥を行うことも可能であるだけでなく、好ましい。 Drying is carried out by irradiation with IR radiation having a peak wavelength in the wavelength range of 750 to 1500 nm, preferably 750 to 1200 nm. If desired, simultaneous support can be provided by convection, but this is neither necessary nor preferred. In other words, it is preferable and not only possible to carry out the drying only by irradiating with IR radiation having a peak wavelength in the wavelength range of 750 to 1500 nm, preferably 750 to 1200 nm.
そのようなIR放射に使用できる放射源の例は、一般的なNIR放射体(近赤外放射体)を含む。そのようなNIRエミッタは、例えばヘレウス(Heraeus))から入手できる。NIR放射体は、例えば、高性能の短波放射体であり得る。放射体または個々のNIR放射体は、たとえば15乃至100w/cm(放射体ーの長さ1センチあたりのワット)の範囲、好ましくは20乃至50w/cmの範囲の出力で動作させることができる。それにより、NIRエミッタのエミッタ表面温度(渦巻き状フィラメント温度)は、例えば、1800乃至3000℃の範囲、好ましくは1850乃至2500℃の範囲にある。適切なNIRエミッタは、例えば、750乃至1500nm、好ましくは750乃至1200nm、特に750乃至1500nm、または750乃至1200nmの範囲の最大値を有する発光スペクトルを有する。 Examples of radiation sources that can be used for such IR radiation include the common NIR radiators (near infrared radiators). Such NIR emitters are available, for example, from Heraeus. The NIR radiator can be, for example, a high performance short wave radiator. The radiator or the individual NIR radiators can be operated with a power output in the range of, for example, 15 to 100 w/cm (watts per cm length of the radiator), preferably 20 to 50 w/cm. Thereby, the emitter surface temperature (spiral filament temperature) of the NIR emitter is, for example, in the range of 1800 to 3000°C, preferably in the range of 1850 to 2500°C. Suitable NIR emitters have, for example, an emission spectrum with a maximum in the range 750 to 1500 nm, preferably 750 to 1200 nm, especially 750 to 1500 nm, or 750 to 1200 nm.
IR放射は、静的にまたはパススループラント(a pass-through plant)で実行することができ、それによって、コンポーネントで照射されるサンドイッチ構造およびその間に乾燥される金属ペースト、および/またはIR放射源または複数の放射源が互いに関連して移動する。コンポーネントの一方または両方は、IR放射に対して透過性、すなわち部分的または完全に透過性があり、本発明による方法の目的のためにいずれの場合にも十分に透過性がある。言い換えれば、コンポーネントの少なくとも1つは、IR放射を完全には吸収しない。IR放射は、IR放射に対して透過性がある、コンポーネントの1つ又は両方を介して行われる。IR放射線が透過性である1つまたは1つの成分のみを介してIR照射が実行される場合が好ましい。IR照射は、上部にあるコンポーネントを通して上から行うことが好ましい。セラミック基板などの基板、ダイオード、LED、ダイ、IGBT、IC、MOSFETなどの能動部品、センサー、セラミック冷却素子、抵抗器、コンデンサー、コイルなどの受動部品は、部品の例であり、 赤外線に対して透過性がある。 The IR radiation can be carried out statically or in a pass-through plant, whereby a sandwich structure illuminated with components and a metal paste dried in between, and/or an IR radiation source or Multiple radiation sources move relative to each other. One or both of the components are transparent to IR radiation, i.e. partially or completely transparent and in each case sufficiently transparent for the purposes of the method according to the invention. In other words, at least one of the components does not completely absorb IR radiation. The IR radiation is provided through one or both of the components that are transparent to the IR radiation. It is preferred if the IR irradiation is carried out via only one or one component which is transparent to the IR radiation. IR irradiation is preferably done from above through the components on top. Substrates such as ceramic substrates, active components such as diodes, LEDs, dies, IGBTs, ICs, MOSFETs, passive components such as sensors, ceramic cooling elements, resistors, capacitors and coils are examples of components and It is transparent.
IR放射源の間、より正確には、IR放射源の放射放電面と無加圧で焼結される金属ペーストの層の間の距離は、たとえば1から50cmの範囲にあり、望ましくは、5から20cmの間にある。2つのコンポーネントの互いに向かい合う接触面は、互いにジョイントオーバーラップ面(a joint overlap surface)を形成する。それにより、より小さな接触面を含むコンポーネントの接触面が一般に完全に利用される、すなわち、オーバーラップ表面のサイズは、一般に、より小さな接触面を含むコンポーネントの完全な接触面のサイズに対応する。 The distance between the IR radiation sources, and more precisely between the radiation discharge surface of the IR radiation source and the layer of the metal paste to be pressureless sintered is for example in the range 1 to 50 cm, preferably 5 Between 20 and 20 cm. The facing contact surfaces of the two components form a joint overlap surface with each other. Thereby the contact surface of the component including the smaller contact surface is generally fully utilized, ie the size of the overlapping surface generally corresponds to the size of the complete contact surface of the component including the smaller contact surface.
たとえば1から150mm2の範囲の2つのコンポーネントの、互いに面する接触面から形成されるジョイントオーバーラップ面のサイズに応じて、特にIRによってのみ影響を受ける乾燥プロセスは、例えば、1乃至60分の範囲の時間しか必要とせず、したがって、従来技術による上述のオーブン乾燥の場合よりも著しく短い。オーブン乾燥と比較して、品質上の欠点はない。上記範囲の下端にある小さな重なり面の場合、短い乾燥期間で十分であり、大きな重なり面の場合、乾燥期間は、上記範囲の上端にある。当業者は、乾燥または乾燥金属ペーストの焼結または予備焼結を回避できるように、ステップ(4)のIR照射パラメータおよび/または乾燥期間を選択することができる。 Depending on the size of the joint overlapping surfaces formed from the facing surfaces of the two components, for example in the range from 1 to 150 mm 2, the drying process, which is only affected by IR in particular, is for example from 1 to 60 minutes. It only requires a range of times and is therefore significantly shorter than in the case of the oven drying described above according to the prior art. There are no quality drawbacks compared to oven drying. For small overlapping surfaces at the lower end of the range, a short drying period is sufficient, and for large overlapping surfaces, the drying period is at the upper end of the range. The person skilled in the art can select the IR irradiation parameters and/or the drying period of step (4) so that sintering or pre-sintering of the dry or dry metal paste can be avoided.
乾燥金属ペーストの層を含むサンドイッチ構造は、本発明による方法のステップ(5)において無加圧で焼結される。工程(4)による乾燥の場合のように、常圧焼結も前記IR放射線の照射により実施される。これにより、ステップ(4)および(5)は、有利には、例えばステップ(4)による乾燥の完了後、ステップ(5)の目的のために中断することなく、IR照射が継続されるという点で、互いに有利に続くことができる。したがって、ステップ(4)と(5)は実質的に一緒に溶融する。ただし、ステップ(4)およびステップ(5)を実行し、その間および中間のクールダウンを中断することも可能である。 The sandwich structure comprising a layer of dry metal paste is pressureless sintered in step (5) of the method according to the invention. As in the case of drying according to step (4), pressureless sintering is also carried out by irradiation with the IR radiation. Thereby, steps (4) and (5) are advantageously such that the IR irradiation is continued without interruption for the purpose of step (5), eg after completion of the drying according to step (4). In this way, they can advantageously continue each other. Therefore, steps (4) and (5) melt substantially together. However, it is also possible to carry out step (4) and step (5) and interrupt the cooldown during and in between.
750乃至1500nm、好ましくは750乃至1200nmの波長範囲内にピーク波長を有するIR放射線を照射することにより、無加圧焼結が実施される。必要に応じて、対流によって同時にサポートを行うことができるが、これは必要でも推奨でもない。言い換えれば、乾燥の場合のように、750乃至1500nm、好ましくは750乃至1200nmの波長範囲にピーク波長を持つIR放射線を照射することによってのみ無加圧焼結を行うことは、可能であるだけでなく、好ましい。IR放射のための放射源およびその動作状態に関しては、乾燥ステップ(4)に関連して上述したものが参照される。 Pressureless sintering is carried out by irradiating with IR radiation having a peak wavelength in the wavelength range of 750 to 1500 nm, preferably 750 to 1200 nm. If desired, convection can provide simultaneous support, but this is neither necessary nor recommended. In other words, it is only possible to carry out pressureless sintering only by irradiating with IR radiation having a peak wavelength in the wavelength range of 750 to 1500 nm, preferably 750 to 1200 nm, as in the case of drying. Not preferred. Regarding the radiation source for IR radiation and its operating condition, reference is made to what has been said above in connection with the drying step (4).
乾燥ステップ(4)の場合のように、IR照射は、静的またはパススループラントで実行可能である。これにより、コンポーネントと、その間で無加圧で焼結される金属ペーストで照射されるサンドイッチ構造および/またはIR放射源が、互いに移動する。乾燥ステップ(4)の場合のように、IR照射は、IR放射線を透過する1つまたは両方のコンポーネントを通して実行される。IR照射が、IR照射に対して透過性である1つまたは1つのコンポーネントのみを介して実行される場合が好ましい。IR照射は、上部にあるコンポーネントを通して上から行うことが好ましい。 As in the drying step (4), IR irradiation can be carried out in static or pass-through plants. This causes the components and the sandwich structure and/or the IR radiation source illuminated by the metal paste which is pressurelessly sintered between them to move relative to each other. As in the drying step (4), IR irradiation is performed through one or both components that are transparent to IR radiation. It is preferred if the IR irradiation is carried out via only one or one component that is transparent to the IR irradiation. IR irradiation is preferably done from above through the components on top.
IR放射源間の距離、またはより正確にはIR放射源の放射放電面と無加圧で焼結される金属ペーストの層との間の距離は、例えば1から50cmの範囲にある、好ましくは5から20cmの間にある。例えば、1から150mm2の範囲の2つのコンポーネントの、互いに向かい合う接触面から形成される接合オーバーラップ面のサイズに応じて、IR照射による無加圧焼結には、たとえば、15分から90分の間の時間期間しか必要としない。オーブンでの無加圧焼結と比較して、品質上の欠点はない。上記範囲の下端の小さな重なり面の場合、無加圧焼結には短い乾燥期間で十分であり、大きな重なり面の場合、乾燥期間は、上記範囲の上端である。 The distance between the IR radiation sources, or more precisely the distance between the radiation discharge surface of the IR radiation source and the layer of metal paste to be sintered without pressure, is for example in the range 1 to 50 cm, preferably It is between 5 and 20 cm. For example, pressureless sintering by IR irradiation may take, for example, 15 minutes to 90 minutes, depending on the size of the joining overlap surface formed from the contacting surfaces of two components in the range of 1 to 150 mm 2 . It only needs a time period in between. There are no quality drawbacks compared to pressureless sintering in the oven. In the case of a small overlapping surface at the lower end of the above range, a short drying period is sufficient for pressureless sintering, and in the case of a large overlapping surface, the drying period is at the upper end of the above range.
ステップ(4)およびステップ(5)は、特定の制限を受けない雰囲気で実行可能である。したがって、乾燥および常圧焼結は、酸素を含む雰囲気、たとえば空気中で実施することができる。例えば銅またはニッケルの接触面など、本質的に酸化に敏感な接触面を含むコンポーネントの場合でも、本発明による方法の結果として可能となる、おそらく比較的短い乾燥時間、および同様に無加圧焼結の短時間の結果として、酸素雰囲気、例えば空気中で操作を実行可能である。 Steps (4) and (5) can be carried out in an atmosphere without particular restrictions. Therefore, drying and pressureless sintering can be carried out in an atmosphere containing oxygen, for example air. Even in the case of components containing contact surfaces that are essentially oxidation-sensitive, for example copper or nickel contact surfaces, the possible relatively short drying times and also pressure-free baking that are possible as a result of the method according to the invention are possible. As a result of the short binding time, it is possible to carry out the operation in an oxygen atmosphere, for example air.
必要であれば、無酸素雰囲気で乾燥および無加圧焼結を行うことも可能であることは言うまでもない。本発明の一部として、無酸素雰囲気は、その酸素含有量が100ppm体積以下(体積ppm)、好ましくは10ppm以下、さらにより好ましくは、1ppm vol以下である雰囲気であると理解されるべきである。 It goes without saying that, if necessary, it is possible to perform drying and pressureless sintering in an oxygen-free atmosphere. As part of the present invention, an oxygen-free atmosphere should be understood to be an atmosphere whose oxygen content is 100 ppm volume or less (volume ppm), preferably 10 ppm or less, even more preferably 1 ppm vol or less. ..
要約すると、構成要素を接続するための本発明による方法は、対流で動作する従来技術と比較して、乾燥期間の短縮および無損失焼結期間の短縮、無加圧焼結接合技術の、大きな接触面を備えるコンポーネントへの適用の拡張、品質、大きな接触面を含む部品への適用性の拡大、および酸化に敏感な接触面を含む部品、例えば銅またはニッケルの接触面で作業する場合でも不活性化の不要性のような利点を有することに留意すべきである。 In summary, the method according to the invention for connecting the components provides a greater drying time and lossless sintering period compared to the prior art operating in convection, a pressureless sinter-bonding technique which is of great advantage. Extended application to components with contact surfaces, quality, increased applicability to parts with large contact surfaces, and even when working with parts containing oxidation-sensitive contact surfaces, e.g. copper or nickel contact surfaces. It should be noted that it has advantages such as no need for activation.
例:
参考例1、金属ペーストの製造:85重量部の銀粒子(重量比25:75の被覆銀フレーク中の0.6重量%のラウリン酸(lauric acid)/ステアリン酸(stearic acid)を含む)、7.4重量部のα-テルピネオール(α-terpineol)、7.4重量部のイソトリデカノール(iso-tridecanol)と0.2重量部のエチルセルロースを混合して金属ペーストを形成した。
Example:
Reference Example 1, production of metal paste : 85 parts by weight of silver particles (containing 0.6% by weight of lauric acid/stearic acid in a coated silver flake with a weight ratio of 25:75), A metal paste was formed by mixing 7.4 parts by weight of α-terpineol, 7.4 parts by weight of iso-tridecanol and 0.2 parts by weight of ethyl cellulose.
参考例2、例1の金属ペーストの塗布とサンドイッチ構造(sandwich arrangement)の形成:実施例1からの金属ペーストを、ステンシル印刷により、75μmの表面および4mm−4mmの表面を含むDCB基板の表面全体に塗布した。4mm−4mmの銀接触表面を含むシリコンチップは、DCB基板と4mm−4mmのチップの接合オーバーラップ表面を含むサンドイッチ構造を形成することにより、このように塗布されたペーストに取り付けられた。 Application of the metal paste of Reference Example 2, Example 1 and formation of a sandwich arrangement : The metal paste from Example 1 was stencil-printed over the entire surface of a DCB substrate including a surface of 75 μm and a surface of 4 mm-4 mm. Was applied to. Silicon chips containing a 4 mm-4 mm silver contact surface were attached to the paste thus coated by forming a sandwich structure containing the bonding overlap surface of the DCB substrate and the 4 mm-4 mm chips.
参考例3a、例2からのサンドイッチ構造をオーブンで乾燥:実施例2に従って作成されたサンドイッチ構造は、金属ペーストに元々含まれていた有機溶媒に基づいて0.5重量%未満の残留溶媒含量を除いて、150℃のオーブン温度で窒素雰囲気下で乾燥した(重量測定)。乾燥プロセスは、60分を必要とした。 Oven dried sandwich structure from Reference Example 3a, Example 2 : The sandwich structure made according to Example 2 has a residual solvent content of less than 0.5% by weight, based on the organic solvent originally contained in the metal paste. Except for the above, it was dried under an atmosphere of nitrogen at an oven temperature of 150° C. (weight measurement). The drying process required 60 minutes.
参考例3b、IR照射下での実施例2のサンドイッチ構造の乾燥:実施例2に従って作成されたサンドイッチ構造に、長さ30cm、出力30W /cm、フィラメント温度2009℃、1100nmのピーク波長のNIRエミッタを、10cmの距離から空気中で、シリコンチップの上から照射し、もともと金属ペーストに含まれていた(重量測定により決定)有機溶媒に基づいて、<0.5重量%の残留溶媒含有量を除く、有機溶媒を除去した 。
IR放射により単独で行われた乾燥プロセスは、10分を必要とする。
Reference Example 3b, drying the sandwich structure of Example 2 under IR irradiation : a sandwich structure made according to Example 2 was used with a length of 30 cm, an output of 30 W/cm, a filament temperature of 2009° C. and a peak wavelength of 1100 nm NIR emitter. Was irradiated in the air from a distance of 10 cm from above the silicon chip, and based on the organic solvent originally contained in the metal paste (determined by gravimetric measurement), a residual solvent content of <0.5% by weight was obtained. Removed, the organic solvent was removed.
The drying process carried out by IR radiation alone requires 10 minutes.
比較例4a、オーブン内で実施例3aに従って乾燥させたサンドイッチ構造の無加圧焼結:実施例3aに従って作成したサンドイッチ構造を、窒素雰囲気下の対流式オーブン内で230℃のオーブン温度で60分間、無加圧で焼結した。冷却後、せん断強度により接着力を測定した。これにより、シリコンチップは、せん断チゼル(a shearing chisel)により260℃で0.3mm/sの速度でせん断された。力は、測定ボックス(DAGE、ドイツのデバイスDAGE2000)によって記録された。20N/mm2を超えるせん断強度(shear strengths)は、満足のいく結果を示している。測定されたせん断強度:23N/mm2。 Comparative Example 4a, Pressureless Sintering of Sandwich Structure Dried According to Example 3a in Oven : Sandwich structure made according to Example 3a is heated in a convection oven under nitrogen atmosphere at an oven temperature of 230° C. for 60 minutes. Sintered without pressure. After cooling, the adhesive strength was measured by shear strength. Thereby, the silicon chip was sheared by a shearing chisel at 260° C. at a rate of 0.3 mm/s. The force was recorded by a measuring box (DAGE, German device DAGE2000). Shear strengths above 20 N/mm 2 have shown satisfactory results. Measured shear strength: 23 N/mm 2 .
比較例4b、オーブン内で実施例3bに従って乾燥したサンドイッチ構造の無加圧焼結:実施例3bに従って乾燥させたサンドイッチ構造を、230℃のオーブン温度で60分間、窒素雰囲気下の対流式オーブンで無加圧で焼結した。次に、実施例4aのように、せん断強度により接着力を決定した。測定されたせん断強度:24N/mm2。 Comparative Example 4b, Pressureless Sintering of Sandwich Structure Dried According to Example 3b in Oven : Sandwich structure dried according to Example 3b in oven at 230° C. for 60 minutes in a convection oven under nitrogen atmosphere. Sintered without pressure. Then, as in Example 4a, the adhesive strength was determined by shear strength. Measured shear strength: 24 N/mm 2 .
本発明による実施例4c、IR照射下で実施例3bに従って乾燥させたサンドイッチ構造の無加圧焼結:例3bに従って乾燥させたサンドイッチ構造は、10cmの距離で上記シリコンチップから、長さ30cm、30W/cmの出力、 200℃のフィラメント温度、及び1100nmのピーク波長で、20分間、NIRエミッタで放射され、無加圧で焼結され、この場合例3bからのIR放射プロセスは、中断せずに継続される。従って、接着は、例4aのようにせん断強度を介して決定される。測定されたせん断強度:21N/mm2。 Example 4c according to the invention, pressureless sintering of a sandwich structure dried according to Example 3b under IR irradiation : the sandwich structure dried according to Example 3b has a length of 30 cm from the silicon chip at a distance of 10 cm, At a power of 30 W/cm, a filament temperature of 200° C., and a peak wavelength of 1100 nm, emitted for 20 minutes with an NIR emitter and pressureless sintered, the IR emission process from Example 3b being uninterrupted. Continue to. Therefore, adhesion is determined via shear strength as in Example 4a. Measured shear strength: 21 N/mm 2 .
参考例5、実施例1からの金属ペーストの塗布およびサンドイッチ構造の形成:実施例1からの金属ペーストを、75μmの湿潤フィルム層(a wet film layer)で、ステンシル印刷により5mm−8mmの表面を含む湿潤フィルム層において、DCB基板の表面全体に塗布した。5mm−8mmの銀接触面を含むシリコンチップは、DCB基板と5mm−8mmのチップの接合オーバーラップ面を含むサンドイッチ構造を形成することにより、この方法で塗布されたペーストに取り付けられた。 Application of the metal paste from Reference Example 5, Example 1 and formation of a sandwich structure : The metal paste from Example 1 was applied to a surface of 5 mm-8 mm by stencil printing with a 75 μm a wet film layer. The included wet film layer was applied over the entire surface of the DCB substrate. Silicon chips containing 5 mm-8 mm silver contact surfaces were attached to pastes applied in this way by forming a sandwich structure containing the mating overlap surface of the DCB substrate and 5 mm-8 mm chips.
参考例6a、オーブンでの実施例5からのサンドイッチ構造の乾燥:実施例5に従って作成されたサンドイッチ構造は、もともと金属ペーストに含まれていた有機溶媒(重量法で測定)に基づいて、<0.5重量%の残留溶媒含有量を除いて、窒素雰囲気下で150℃のオーブン温度で乾燥された。乾燥プロセスは、90分を必要とした。 Reference Example 6a, Drying of Sandwich Structure from Example 5 in Oven : The sandwich structure made according to Example 5 is <0 based on the organic solvent originally contained in the metal paste (measured gravimetrically). It was dried at an oven temperature of 150° C. under a nitrogen atmosphere, except for residual solvent content of 0.5% by weight. The drying process required 90 minutes.
参考例6b、IR照射下での実施例5からのサンドイッチ構造の乾燥:実施例5に従って作成されたサンドイッチ構造は、30cmの長さ、30W/cmの出力、2009℃のフィラメント温度、および1100nmピーク波長のNIRエミッタで、10cmの距離から空気中で、シリコンチップの上から照射され、それにより、もともと金属ペーストに含まれていた溶媒(重量法で測定)に基づいて、<0.5重量%の残留溶媒含有量を除いて、有機溶媒を除去した。IR放射により単独で行われた乾燥プロセスは、20分を必要とした。 Reference Example 6b, Drying the sandwich structure from Example 5 under IR irradiation : The sandwich structure made according to Example 5 has a length of 30 cm, a power of 30 W/cm, a filament temperature of 2009°C and a peak of 1100 nm. Irradiation with a wavelength NIR emitter from above the silicon chip in air from a distance of 10 cm, whereby <0.5 wt% based on the solvent originally contained in the metal paste (measured gravimetrically). The organic solvent was removed, except for the residual solvent content of. The drying process performed by IR radiation alone required 20 minutes.
比較例7a、オーブン内で実施例6aに従って乾燥されたサンドイッチ構造の無加圧焼結:実施例6aに従って作成されたサンドイッチ構造は、230℃のオーブン温度で60分間、窒素雰囲気下で、対流オーブン内で無加圧で焼結された。冷却の後、接着は、せん断強度により決定された。これにより、シリコンチップは、せん断チゼル(shearing chisel)により260℃で0.3mm/sの速度でせん断された。力は、測定ボックス(DAGE、ドイツのデバイスDAGE2000)によって記録された。測定されたせん断強度:22 N/mm2。 Comparative Example 7a, Pressureless Sintering of Sandwich Structure Dried According to Example 6a in an Oven : The sandwich structure made according to Example 6a has a convection oven under an atmosphere of nitrogen for 60 minutes at an oven temperature of 230°C. It was sintered without pressure inside. After cooling, adhesion was determined by shear strength. Thereby, the silicon chip was sheared by a shearing chisel at 260° C. at a rate of 0.3 mm/s. The force was recorded by a measuring box (DAGE, German device DAGE2000). Measured shear strength: 22 N/mm 2 .
比較例7b、オーブン内で実施例6bに従って乾燥されたサンドイッチ構造の無加圧焼結:実施例6bに従って作成されたサンドイッチ構造は、230℃のオーブン温度で60分間、窒素雰囲気下で、対流オーブン内で無加圧で焼結された。次に、実施例7aのように、せん断強度により接着力を決定した。測定されたせん断強度:22 N/mm2。 Comparative Example 7b, Pressureless Sintering of Sandwich Structure Dried According to Example 6b in an Oven : The sandwich structure made according to Example 6b has a convection oven in a nitrogen atmosphere for 60 minutes at an oven temperature of 230°C. It was sintered without pressure inside. Then, as in Example 7a, the adhesive strength was determined by shear strength. Measured shear strength: 22 N/mm 2 .
この発明による実施例7c、IR放射下で、例6bに従って、乾燥させたサンドイッチ構造の無加圧焼結:例6bに従って乾燥させたサンドイッチ構造は、長さが30cmで、30w/cmの出力、2009℃のフィラメント温度、および1100nmのピーク波長で20分間、10cmの距離でシリコンチップの上からNIRエミッタで放射し、無加圧で焼結された、この場合、例6bからのIR放射は、中断なく継続された。従って、接着力は、例7aのように、せん断強度を介して決定された。測定されたせん断強度:23 N/mm2。
Example 7c according to the invention, pressureless sintering of a dried sandwich structure according to Example 6b under IR radiation : the sandwich structure dried according to Example 6b has a length of 30 cm and an output of 30 w/cm, The filament temperature of 2009° C. and the peak wavelength of 1100 nm was emitted for 20 minutes at a distance of 10 cm with a NIR emitter from above the silicon chip and sintered without pressure, in this case the IR emission from Example 6b was: It continued without interruption. Therefore, adhesion was determined via shear strength, as in Example 7a. Measured shear strength: 23 N/mm 2 .
Claims (14)
(2)前記第1のコンポーネントに接続される第2のコンポーネントの前記接触面に前記金属ペーストを任意に塗布するステップと、
(3)前記2つのコンポーネントと、その間の金属ペーストの層を有するサンドイッチ構造を作成するステップと、
(4)前記2つのコンポーネントの間の前記金属ペーストの前記層を乾燥させるステップと、
(5)前記乾燥させた金属ペーストの層を備える前記サンドイッチ構造を無加圧焼結するステップと、
とを備えた、コンポーネントを接続する方法において、前記乾燥および前記無加圧焼結は、750乃至1500nmの間の波長レンジにおけるピーク波長を有するIR放射を用いた放射により行われることを特徴とする、コンポーネントを接続する方法。 (1) applying a metal paste containing an organic solvent to the contact surface of the first component;
(2) optionally applying the metal paste to the contact surface of a second component connected to the first component;
(3) creating a sandwich structure having the two components and a layer of metal paste between them;
(4) drying the layer of the metal paste between the two components;
(5) Pressureless sintering of the sandwich structure comprising a layer of the dried metal paste,
A method of connecting components, comprising: and the drying and pressureless sintering are performed by radiation with IR radiation having a peak wavelength in the wavelength range between 750 and 1500 nm. , How to connect the components.
The method according to any one of claims 1 to 13, wherein steps (4) and (5) occur immediately after each other.
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- 2018-04-20 KR KR1020197031081A patent/KR20190130148A/en not_active Application Discontinuation
- 2018-04-20 EP EP18717630.0A patent/EP3622554A1/en not_active Withdrawn
- 2018-04-20 JP JP2019557836A patent/JP2020520410A/en active Pending
- 2018-04-20 US US16/604,248 patent/US20200147696A1/en not_active Abandoned
- 2018-04-20 WO PCT/EP2018/060155 patent/WO2018206267A1/en active Application Filing
- 2018-04-20 CN CN201880026965.4A patent/CN110546747A/en active Pending
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Also Published As
Publication number | Publication date |
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US20200147696A1 (en) | 2020-05-14 |
KR20190130148A (en) | 2019-11-21 |
EP3622554A1 (en) | 2020-03-18 |
WO2018206267A1 (en) | 2018-11-15 |
CN110546747A (en) | 2019-12-06 |
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