JP2020187488A - State monitoring apparatus and program - Google Patents

Abstract

To easily ascertain a processing quality in a processing apparatus.SOLUTION: The present invention comprises: a reception unit for receiving process setting information in a processing apparatus; an acquisition unit for acquiring physical information indicating a state of processing performed by the processing apparatus in the setting of the setting information; a storage unit for storing level information indicating a state of the processing performed by the processing apparatus in the setting of the setting information, in association with the setting information; and an output unit for adding display information according to a level of the level information, to an object of the processing included in image information, and for outputting the resultant information.SELECTED DRAWING: Figure 4

Description

The present invention relates to condition monitoring devices and programs.

If an abnormality occurs in a tool during machining in the production of parts by a machine tool, the machining quality of the part to be a product deteriorates, and if machining is continued as it is, defective products will occur and cause great damage. Will come out. Therefore, when an abnormality occurs, a technique for confirming the cause of the abnormality by displaying the operation information of the machine tool and the measurement data at the time of machining is already known.

Patent Document 1 discloses a technique of mapping and displaying a graph obtained by detecting chatter vibration of a processing machine on a monitor.

However, conventionally, there is a problem that the quality of processing performed by various processing devices such as the quality of processing cannot be easily grasped.

The present invention has been made in view of the above, and an object of the present invention is to provide a condition monitoring device and a program capable of easily grasping the quality of processing in the processing device.

In order to solve the above-mentioned problems and achieve the object, the present invention shows a receiving unit that receives processing setting information in the processing device, and a state of the processing performed by setting the setting information in the processing device. An acquisition unit that acquires physical information, a storage unit that stores level information indicating the state of the processing performed by the processing device in the setting of the setting information in association with the setting information, and the processing included in the image information. It is characterized by having an output unit for adding and outputting display information according to the level of the level information to the target of the above.

According to the present invention, there is an effect that the quality of processing in the processing apparatus can be easily grasped.

FIG. 1 is a diagram showing an example of a configuration of a condition monitoring system according to the present embodiment. FIG. 2 is a block diagram showing an example of the hardware configuration of the machine tool. FIG. 3 is a block diagram showing an example of the hardware configuration of the condition monitoring device. FIG. 4 is a block diagram showing an example of the functional configuration of the condition monitoring system. FIG. 5 is an explanatory diagram of a process in which the control unit records a score indicating a state for each score data processing process of the storage unit. FIG. 6 is a diagram showing an example of a time series data screen. FIG. 7 is a diagram showing an example of a screen when a machining trajectory is mapped to a work image and the susceptibility to occurrence of an abnormality is visualized and displayed. FIG. 8 is an explanatory diagram of statistical processing. FIG. 9 is a diagram illustrating screen switching. FIG. 10 is a block diagram showing an example of the functional configuration of the condition monitoring system according to the modified example.

Hereinafter, embodiments of the condition monitoring device and the program according to the present invention will be described in detail with reference to the accompanying drawings.

(Embodiment)
FIG. 1 is a diagram showing an example of a configuration of a condition monitoring system according to the present embodiment. As shown in FIG. 1, the condition monitoring system 1 includes a condition monitoring device 100 and a machine tool 200. The machine tool 200 is an example of a processing device, and the state of processing (in this example, the state at the time of machining) is monitored by the state monitoring device 100. For example, the machine tool 200 is monitored by a condition monitoring device 100 for a state indicating an abnormality or good or bad processing quality. Although FIG. 1 shows a connection example in which one condition monitoring device 100 is connected to one machine tool 200, one condition monitoring device 100 is connected to a plurality of machine tools 200. You may. Further, the machine tool 200 and the condition monitoring device 100 may be connected to the network.

The machine tool 200 processes a work piece (corresponding to a "process target") called a work or the like. An example of the machine tool 200 is a CNC machine tool that processes a workpiece by numerical control, such as a CNC (Computerized Numerical Control) lathe, a CNC milling machine, and a machining center. In the present embodiment, a machine tool that automatically performs a plurality of processing steps (corresponding to "processing") will be described.

The condition monitoring device 100 receives information at the time of machining in each machining process of the work from the machine tool 200 at any time, and outputs information indicating the state for each machining process of the work based on the received information. For example, the condition monitoring device 100 outputs information indicating an abnormality or the quality of processing to the display unit. The display unit may be a display unit included in the condition monitoring device 100 or an external display unit of the condition monitoring device 100. In the present embodiment, as an example, the condition monitoring device 100 will be described as having a display unit.

The condition monitoring device 100 and the machine tool 200 are connected by wire or wirelessly. Further, the condition monitoring device 100 and the machine tool 200 may be connected by a dedicated connection line, or may be connected by a wired network such as a wired LAN (Local Area Network) or a wireless network such as a wireless LAN. Good.

FIG. 2 is a block diagram showing an example of the hardware configuration of the machine tool 200. As shown in FIG. 2, the machine tool 200 is driven by a CPU (Central Processing Unit) 51, a ROM (Read Only Memory) 52, a RAM (Random Access Memory) 53, a communication I / F (interface) 54, and the like. The control circuit 55 and the motor 56 are connected by a bus 58.

The CPU 51 controls the entire machine tool 200. The CPU 51 controls the operation of the entire machine tool 200 by executing a control program stored in the ROM 52 or the like, for example, using the RAM 53 as a work area (work area). Further, the CPU 51 controls the drive control circuit 55 with the CNC command value by executing the CNC machining program, and machining the workpiece in a predetermined machining step. Further, the CPU 51 transmits operation information (corresponding to "processing setting information") indicating the operation contents of each processing process to the condition monitoring device 100 via the communication I / F 54. Here, the operation information is, for example, the spindle rotation speed at the time of machining in each machining process, the feed rate, the XYZ coordinate value of the spindle, the current value of the spindle, and the like. When the user inputs information, information such as the tool type, tool maker, tool diameter, and tool protrusion amount is also included in the operation information.

The communication I / F 54 is an interface for communicating with an external device such as the condition monitoring device 100. The communication I / F 54 is, for example, a short-range wireless communication circuit, a LAN board for connecting to a LAN, or the like.

The drive control circuit 55 controls the drive of the motor 56 based on the CNC command value from the CPU 51. For example, the drive control circuit 55 controls the drive of the motor 56 to change tools such as drills, end mills, and tools, control the movement of the work mounting table, and determine the cutting start position, cutting end position, and rotation speed of the tool with respect to the work. Control the feed speed and so on. As a result, processing steps such as milling, boring, drilling, and screwing on the work are carried out in a predetermined order. Tools are not limited to drills, end mills, and cutting tools. Any other material may be used as long as it is used for processing. Further, the number of motors 56 is not limited to one. For example, a plurality of motors may be provided depending on the tool.

The sensor 57 outputs waveform data as physical measurement data. Specifically, the sensor 57 detects a physical quantity such as the feeding speed of the tool with respect to the work when the work is cut by the tool, and outputs the detected detection information (waveform data in this example) to the state monitoring device 100. The waveform data may be output to the condition monitoring device 100 by providing a dedicated connection line or communication interface used for transmitting the waveform data from the sensor 57, or also as a communication means for transmitting operation information. You may use it.

In the present embodiment, a case where an acceleration sensor is used as the sensor 57 will be described as an example. For example, when the blade of a tool is broken or chipped, the grinding speed of the tool with respect to the work changes. The state monitoring device 100 monitors the state of various machining processes performed by the machine tool 200 by receiving the waveform data output from the sensor 57. The sensor 57 is not limited to acceleration, and may detect other physical quantities (for example, sound, vibration, etc.) as long as the state of various processing processes can be known. For example, the sensor 57 may be a microphone or an AE (acoustic emission) sensor, and the physical quantity output by each may be acquired as information (referred to as physical information, detection information, or the like). Further, the number of sensors 57 is arbitrary. A plurality of sensors 57 that detect the same physical quantity may be provided, or a plurality of sensors 57 that detect different physical quantities may be provided.

FIG. 3 is a block diagram showing an example of the hardware configuration of the condition monitoring device 100. As shown in FIG. 3, the condition monitoring device 100 has a configuration in which a CPU 61, a ROM 62, a RAM 63, a communication I / F 64, a storage 65, and an I / O (Input / Output) 67 are connected by a bus 66. It has become.

The CPU 61 controls the entire condition monitoring device 100. The CPU 61 controls the operation of the entire state monitoring device 100 by executing a control program (including a state monitoring program) stored in the ROM 62 or the like using the RAM 63 as a work area (work area), and realizes a state monitoring function. To do.

The communication I / F64 is an interface for communicating with an external device such as a machine tool 200. The communication I / F64 is, for example, a short-range wireless communication circuit, a LAN board for connecting to a LAN, or the like.

The storage 65 is a non-volatile storage means such as an HDD (Hard Disk Drive), an EEPROM (Electrically Erasable Programmable Read-Only Memory), and an SSD (Solid State Drive). The storage 65 stores operation information transmitted from the machine tool 200, detection information output by the sensor 57, information indicating a determination result determined by the condition monitoring device 100 based on the operation information and the detection information, and the like. Can be remembered.

The I / O 67 connects an input device 68 such as a mouse or keyboard, a display 69 such as an LCD (Liquid Crystal Display) or an organic EL, and an external device such as a sensor 57, and inputs / outputs data between the external device and the CPU 61. To switch.

FIG. 4 is a block diagram showing an example of the functional configuration of the condition monitoring system 1. As shown in FIG. 4, the machine tool 200 includes a numerical control unit 201, a communication control unit 202, and a sensor information output unit 203. The numerical control unit 201 and the communication control unit 202 are realized by causing the CPU 51 to execute a program. When the sensor 57 and the CPU 51 are connected via the bus, the sensor information output unit 203 is included in the connection by executing the program. Further, some or all of these functions may be realized by hardware such as an IC (Integrated Circuit).

The numerical control unit 201 executes machining of the work by numerical control via the drive control circuit 55. For example, the numerical control unit 201 outputs numerical control data based on the procedure of the machining program to the drive control circuit 55. Further, the numerical control unit 201 outputs operation information of various processing processes to the communication control unit 202. When machining a workpiece, the numerical control unit 201 changes the identification information of the tool to be driven and the driving state (rotation speed, rotation speed, etc.) of the motor 56 according to the machining process. In this case, the operation information is output to the communication control unit 202.

The communication control unit 202 controls the communication I / F 54 to communicate with the condition monitoring device 100, and for example, transmits the operation information of the current processing process to the condition monitoring device 100.

The sensor information output unit 203 outputs the detection information (one-dimensional waveform data) detected by the sensor 57 to the condition monitoring device 100.

The condition monitoring device 100 includes a communication control unit 101, a collection unit 102, a signal processing unit 103, a feature amount calculation unit 104, a determination unit 105, a control unit 106, an operation unit 107, and a storage unit 108. It is provided with a display unit 109. Each part is realized by causing the CPU 61 to execute a program. Note that some or all of these functions may be realized by hardware such as an IC.

The communication control unit 101 controls the communication I / F 64, communicates with the communication control unit 202 of the machine tool 200, and receives operation information from the machine tool 200.

The collecting unit 102 associates the operation information received by the communication control unit 101 with the detection information (waveform data) output from the sensor information output unit 203. For example, when the communication control unit 101 receives the operation information, the collection unit 102 reads the detection information (waveform data) from the sensor 57 through the I / O 67 by AD conversion processing or the like, and the detection information (waveform data) and the operation information. Is associated with the storage table of the storage 65.

The signal processing unit 103 performs, for example, conversion to a spectrogram by FFT as preprocessing based on the detection information (waveform data) stored in the storage table, and the physical measurement data obtained by the preprocessing and the operation information are combined. Output to the feature amount calculation unit 104.

The feature amount calculation unit 104 calculates the feature amount from the physical measurement data after the preprocessing. The feature amount is an index showing the degree of abnormality in machining such as cutting, and is calculated and used as a score which is level information indicating the state of processing (in this example, the state at the time of machining) in each machining. For example, there is a method of calculating the score based on the error value of the spectrogram during cutting when it is new and when it is worn, but not limited to this, if the degree of abnormality (level information) can be calculated as a score, it is calculated from other physical quantities. It may be.

The determination unit 105 compares the feature amount calculated by the feature amount calculation unit 104 with a preset threshold value (predetermined level), and determines whether or not the calculated feature amount is equal to or greater than the threshold value. In this example, the threshold level can be set individually for each tool or machining number (identification number indicating the machining process). The determination unit 105 determines that the processing process is in an abnormal state and labels the processing process when the calculated feature amount is equal to or higher than the threshold level corresponding to the processing process for each processing process.

The control unit 106 performs a state monitoring process. For example, the control unit 106 stores score data in the storage unit 108 for each processing process (identification information included in the operation information).

Specifically, when the determination unit 105 notifies the storage unit 108 of the determination result such as normal or abnormal for each processing process, the control unit 106 instructs the storage unit 108 to increase the number of cycles by one, and sets the cycle number to the cycle number. Save the scores in association with each other. If the determination result is an abnormality exceeding the threshold value, information indicating the labeling of the abnormal data may be saved in the cycle number.

Further, when the control unit 106 is instructed by the operation unit 107 to display the screen including the abnormality degree (level information) by the user operation, the control unit 106 receives the score data of the time series (cycle number order) of each processing process from the storage unit 108. The labeling data and the like are read, a confirmation screen based on the score data and the labeling data and the like is generated, and the confirmation screen is output to the display unit 109. For example, the control unit 106 adds (maps) display information indicating the degree of abnormality corresponding to each portion (processing process) to be processed on the work image (image information). The degree of anomaly may be based on the amplitude value (score) of the spectrum, the number of labeling of anomalous data, or the like, or only those exceeding the threshold value may be regarded as anomalous. Further, for example, when the past data is sufficiently accumulated, the degree of abnormality may be newly defined and used, which is normalized by the past values such as the number of abnormal machining cycles / the total number of cycles. The display information indicating the degree of abnormality may be color-coded according to the level of the degree of abnormality (level information), or only those exceeding the threshold value may be displayed in a predetermined color. The work image may be an image of a three-dimensional model of the work or an image obtained by photographing the work.

Further, when the control unit 106 receives an instruction to display statistical information, individual information, or the like from the operation unit 107 on the confirmation screen displayed by the display unit 109, the control unit 106 reads the corresponding information from the storage unit 108 and generates a screen. Is output to the display unit 109. For example, when the control unit 106 receives an instruction to display statistical information, it performs statistical processing based on the score data, labeling data, etc. of the corresponding processing process, or further, based on the result, a time-series score. Display a graph of the data. Further, when the graph data is selected, the control unit 106 displays the feature amount and the waveform data which are individual information. Here, the statistical information is a list of scores and statistics (for example, a number exceeding a threshold value) of a plurality of times of processing performed in the past.

The storage unit 108 stores the information of the processing process instructed to be stored by the control unit 106 in the storage 65. Further, the storage unit 108 stores the time-series score data in the storage 65 in association with the determined processing process (identification information of the processing process). Further, in this example, the storage unit 108 stores not only the time-series score data but also the feature amount at the time of determination and the labeling information in the storage 65 in association with the processing process. In addition, operation information, waveform data, and the like are stored in association with the storage 65. Further, not limited to these, the data to be saved may be set as appropriate.

The operation unit 107 receives an operation from the input device 68 and outputs operation information to the control unit 106. The display unit 109 outputs the screen information generated by the control unit 106 to the display 69 and displays it.

Next, the recording process of the time-series score data will be described.
FIG. 5 is an explanatory diagram of a process in which the control unit 106 records a score in the storage unit 108 for each processing process. FIG. 5 shows an example in which the work is machined in a plurality of machining steps from machining 1 to machining m (m is a natural number). For example, machining 1 is a machining step of drilling a hole using a drill, and machining 2 is a step of chamfering with an end mill. In the actual machining process at the site, one workpiece can be machined by executing one program (read as a cycle here). In order to monitor the state of a specific machining in one machining process, the program is executed a plurality of times, and the same machining is grouped and processed so as to be surrounded by a broken line in FIG.

The cycles 1 to n (n is a natural number) shown in FIG. 5 indicate the number of cycles in which a large number of workpieces are machined in the same machining process (machining 1 to machining m), that is, the same tool is repeatedly used. .. For example, the processing 1 of the cycle 1 is the case where the processing of the processing 1 is performed on the first work, and the processing 1 of the cycle 2 is the case where the processing of the processing 1 is performed on the second work. That is, if the drill is continuously used without being replaced, the drilling of machining 1 is repeated n times with the drill until the cycle n in which the drill is replaced. In this way, the same machining is grouped by executing the program a plurality of times. The control unit 106 records the score for one cycle for each machining process in the recording table in chronological order. Even if it is not judged to be abnormal, if the same tool is used continuously, score data will be recorded each time the number of cycles increases. The recording table is stored in the storage 65 by the storage unit 108, read out according to the display instruction of the control unit 106, and displayed as a time series data screen G1 or the like.

Score data is recorded in the recording table of the storage 65 for each machining process until maintenance (tool change or data (information) reset) is performed. In addition, information indicating labeling is also recorded in association with the score data in which an abnormality is detected. For example, in the recording table, the number of cycles (cycle number) and the score data are recorded in association with each identification information indicating the processing process. In addition, the labeling number is recorded in association with the cycle number. The labeling number is issued when it is determined to be abnormal, and the labeling number is associated with the data (feature amount and waveform data) of the determination source determined to be abnormal. When it is detected that a new tool has been replaced, the number of cycles and the score data are initialized to 0, and the recording of the score data is started in order from the cycle number 1.

FIG. 6 is a diagram showing an example of the time series data screen G1. In FIG. 6, score data is shown with the horizontal axis representing the number of cycles (corresponding to the order in time series) and the vertical axis representing the degree of abnormality. The recording table of the storage 65 is associated with the number of cycles and the value indicating the degree of abnormality for each processing process.

FIG. 6 is an example in which the grouped time series data of processing 1 is displayed. This screen can be displayed for each processing process. The threshold value T is a threshold value indicating an abnormality. As shown in FIG. 6, the degree of abnormality gradually increases as the number of cycles increases. For example, the error of the spectrogram when it is worn from the spectrogram when it is new is gradually increased according to the number of times of use, so that the degree of abnormality is increasing. As an example, when the tool wears, the vibration during machining increases. The average power of the spectrogram may be simply used for the degree of abnormality in each cycle.

Further, when a defect occurs in the tool, the threshold value is exceeded even before the replacement time has passed, and it is detected as an abnormality. In this example, the data detected as abnormal is labeled. For example, when the cursor is placed on the portion exceeding the threshold value T in FIG. 6, the color of the graph in that range changes, and the labeling number and the like are displayed. When labeling is applied, individual information is displayed when the user selects the part by clicking or the like, and the user can analyze the details. You can also move to the data before and after the selected individual information. Here, as an example, the one in which the labeled portion is selected and the individual information is displayed has been described, but the individual information may be displayed by selecting the portion without the labeling.

Next, a process in which the control unit 106 maps a processing process in which an abnormality is likely to occur with respect to an image of the work will be described. For example, the control unit 106 acquires the coordinate values of the start point and the end point of each machining possessed by the operation information, connects the start point and the end point with a straight line, and draws the machining locus. In order to map the image of the work so that the processing trajectories match, the origin of the work coordinates is set with reference to the machine coordinate system. For example, in the machine tool 200, the tip of the tool is aligned with a position determined in advance for each shape of the work, and that position is set as the origin of the work coordinates. In this case, since the operation information with that as the origin can be obtained, the coordinate system of the work coordinate value acquired from the operation information and the work image match, and the machining trajectory is matched with the work image for mapping. be able to.

In the case of a general machine tool, the machine coordinate system shows the position of the pedestal in the XY coordinate system and the spindle in the Z coordinate system because the pedestal and the main axis move independently. The work coordinates are coordinates based on the work, and the origin can be set based on the machine coordinates.

If the work image is a basic rectangle or cylinder, prepare it as a default model, and if it is a special shape that is not a basic shape, CAD (computer-aided design) data represented by DXF (Drawing Exchange Format) format etc. It can be set by reading. To display the processing that cannot be seen from the front on the display screen, click the button for changing the viewpoint on the screen. In this case, for example, the work can be displayed by rotating it clockwise with respect to the Z axis. This viewpoint changing function can be performed by known projective transformations and coordinate transformations.

The processing trajectory may be mapped to the work image provided in the simulator incorporated in the CNC, or may be mapped to the camera-captured image from a fixed point.

When mapping to a camera-captured image, it is performed based on the work size information (work size captured in the image) in addition to the set camera mounting position, direction, and angle of view. Also, there does not have to be one camera. A plurality of cameras may be used to reduce the blind spots for display. For example, by installing two cameras in parallel to create a panoramic image, the blind spot is reduced for a wide workpiece and the processing trajectory is visualized. Further, for example, it is possible to install cameras in the front and side directions of the work and switch the captured image to reduce the blind spot. Although it is possible to set the camera coordinates individually for the settings of multiple cameras, the 3D world is restored from the epipolar geometry and the multi-viewpoint image by taking the corresponding points such as the edges and corners of the work from each camera image. The technology can also be used to automate settings by estimating the position and orientation of another camera from one camera.

FIG. 7 is a diagram showing an example of a screen when a machining trajectory is mapped to a work image and the susceptibility to occurrence of an abnormality is visualized and displayed. FIG. 7 visualizes and displays the susceptibility to occurrence of abnormalities in each machining when a plurality of machining is performed on a rectangular workpiece. FIG. 7 illustrates chamfering in the X direction and drilling at four locations in the Z direction as a plurality of processes. Then, of all the processing, the processing in which an abnormality is likely to occur is highlighted. Specifically, in the example shown in FIG. 7, since an abnormality is likely to occur in the chamfer in the X direction, the straight line connecting the start point and the end point of the chamfer is highlighted. The highlighting method is to emphasize by applying a predetermined color such as red. Further, the concentration may be changed according to the level of the degree of abnormality (level information). For example, it may be indicated by monochrome shading, or the color itself may have a meaning of strength or weakness by color (eg, it is represented by shading in the order of red> yellow> blue). As a result, the susceptibility to abnormality can be displayed as a heat map.

The degree of anomaly can be displayed in an easy-to-understand manner by drawing the mapping color where the value is high using the various calculation results described above.

FIG. 8 is an explanatory diagram of statistical processing. For example, if you want to display the data of the specified machining series (multiple cycles) in a scatter plot, display the scatter plot as follows. As an example, a case where the rotation speed, feed rate, current value, cycle, etc. set in the data list are selected will be described. First, when transitioning from the data list to the scatter plot graph, select one or more data and click the "Analysis" button. When selecting a data list, the data points displayed in the scatter plot are displayed in different colors for "normal" and "abnormal" based on the automatic labeling result of the abnormality, so it is possible to identify the processing conditions in which the abnormality occurs. Can be useful. Further, as the data that can be displayed as a scatter plot, not only the processing series by a plurality of cycles but also the processing series of different coordinates under the same processing conditions can be compared. For example, by displaying the machining series of the center and corner of the drilled workpiece as a scatter plot, it is possible to compare the ease of chattering. When transitioning from the graph to the data list, click the data and click the "Go to data list" button, and the value of the corresponding row on the data list will be highlighted. Here, the comparison of multiple cycles is taken as an example, but the comparison is not limited to this. Further, in this example, the two-dimensional graph has been described, but the number of dimensions of the graph is not limited to two.

FIG. 9 is a diagram illustrating screen switching. As shown in FIG. 9, the confirmation screen is configured to be switchable to a plurality of types of screens. Each screen can be switched as shown by an arrow in FIG. For example, the analysis screen or the like can transition to the machining information screen and display specific machining information by clicking the machining abnormality degree data specified in the feature amount graph (abnormality degree graph) for each machining. On the processing information screen, it is possible to confirm whether or not the corresponding processing is "normal" or "abnormal" based on the labeling result of the abnormality data. By clicking the left and right arrow buttons at the bottom right of the processing information screen, you can display the cycle data before and after the displayed data. By displaying the waveform or spectrogram of abnormal machining, it is possible to investigate the cause of the abnormality in which part of the machining occurred after the abnormality occurred and review the machining process. You can return to the anomaly graph screen by clicking the button that says "To the anomaly graph screen at the top right of the screen". When the processing information screen is changed to the abnormality graph screen or the analysis screen, the data selected on the processing information screen is changed in color and displayed in an easy-to-understand manner.

On the abnormal processing visualization screen, you can display the abnormality degree graph from the new product to the present of the corresponding processing by clicking the processing trajectory. For example, the current abnormality degree graph for machining with a high possibility of occurrence of abnormality can be displayed in real time.

By clicking the processing data point displayed on the analysis screen, the corresponding processing information can be displayed. You can return to the analysis screen by clicking the button labeled "To analysis screen" at the top right of the processing information screen.

As described above, in the present embodiment, it is possible to easily grasp the quality of processing in the processing apparatus.

(Modification example)
The condition monitoring device 100 outputs information (level information) indicating the degree of abnormality to the display unit. In the embodiment, the configuration when the condition monitoring device 100 includes the display unit is shown, but in the modified example, the configuration when the machine tool 200 includes the display unit will be described. The hardware configuration of the machine tool 200 is a configuration of an input device and a display in addition to the hardware configuration of FIG. Here, the configuration of the functional block different from the embodiment will be described.

FIG. 10 is a block diagram showing an example of the functional configuration of the state monitoring system 1 according to the modified example. As shown in FIG. 10, the condition monitoring system 1 according to the modified example includes a display unit 109 on the machine tool 200 side. The control unit 106 of the condition monitoring device 100 transmits the generated screen information to the machine tool 200, and the display unit 109 on the machine tool 200 side displays information indicating the degree of abnormality. The content displayed on the machine tool 200 is the same as the content displayed on the condition monitoring device 100 side shown in the embodiment. Further description will be omitted because the description of the embodiment will be repeated.

The program described in this embodiment may be provided by incorporating it into a ROM in advance. In addition, files in an installable or executable format are provided by being recorded on a computer-readable recording medium such as a CD-ROM, flexible disk (FD), CD-R, or DVD (Digital Versatile Disk). May be good. Further, it may be configured to be stored on a computer connected to a network such as the Internet and provided by downloading via the network.

Moreover, it can be widely applied not only to machine tools but also to various things. As the sensor, a sensor of the type corresponding to the physical quantity read from the detection target is used. The detection target can correspond to a wide range from large objects such as wind turbines that generate wind power to small objects such as measuring instruments. For example, when acquiring the sound (operating sound, etc.) emitted by the detection target, a microphone is arranged as a sensor. Further, when reading the acceleration of the detection target, the rotation speed of the detection target, or the like, an acceleration sensor, a speed sensor, or the like is arranged as the detection target. Further, the sensor may be a camera having an image sensor such as a CCD or CMOS that captures an image of the detection target or the surroundings.

1 Condition monitoring system 100 Condition monitoring device 101 Communication control unit 102 Collection unit 103 Signal processing unit 104 Feature amount calculation unit 105 Judgment unit 106 Control unit 107 Operation unit 108 Storage unit 109 Display unit 200 Machine tool 201 Numerical control unit 202 Communication control unit 203 Sensor information output unit

Japanese Unexamined Patent Publication No. 2012-088967

Claims (6)

A receiver that receives processing setting information in the processing device,
An acquisition unit that acquires physical information indicating the state of the processing performed by setting the setting information in the processing device, and
A storage unit that stores level information indicating the state of the processing performed by the processing device in the setting of the setting information in association with the setting information.
An output unit that adds display information according to the level of the level information to the processing target included in the image information and outputs it.
Condition monitoring device. The receiving unit receives setting information from the processing device for each process, and receives the setting information.
The output unit adds and outputs display information corresponding to the level of the level information of each process for each processing target included in the image information.
The condition monitoring device according to claim 1. The output unit visualizes the target of the processing included in the image information by mapping display information according to the level of the level information.
The condition monitoring device according to claim 1. The storage unit stores the level information in association with the setting information each time the processing device performs processing in the setting of the setting information.
The output unit adds and outputs display information according to the statistical result of the level information.
The condition monitoring device according to claim 1. A detection unit that detects a processing state of a predetermined level or higher from the physical information acquired by the acquisition unit, and a detection unit.
Further provided with an association unit that associates information based on the physical information with the setting information of the storage unit when a processing state of the predetermined level or higher is detected.
The output unit
Information based on the physical information is further output for the target in which the processing state of the predetermined level or higher is detected.
The condition monitoring device according to claim 1. Computer,
A receiver that receives processing setting information in the processing device,
An acquisition unit that acquires physical information indicating the state of the processing performed by setting the setting information in the processing device, and
A storage unit that stores level information indicating the state of the processing performed by the processing device in the setting of the setting information in association with the setting information.
A program for functioning as an output unit that adds display information according to the level of the level information to the processing target included in the image information and outputs the information.