JP2020112501A5 - - Google Patents

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JP2020112501A5
JP2020112501A5 JP2019004953A JP2019004953A JP2020112501A5 JP 2020112501 A5 JP2020112501 A5 JP 2020112501A5 JP 2019004953 A JP2019004953 A JP 2019004953A JP 2019004953 A JP2019004953 A JP 2019004953A JP 2020112501 A5 JP2020112501 A5 JP 2020112501A5
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JP2019004953A
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JP2020112501A (ja
JP7115329B2 (ja
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Priority to PCT/JP2019/049602 priority patent/WO2020149080A1/ja
Priority to CN201980089019.9A priority patent/CN113302516B/zh
Publication of JP2020112501A publication Critical patent/JP2020112501A/ja
Publication of JP2020112501A5 publication Critical patent/JP2020112501A5/ja
Priority to US17/375,795 priority patent/US12386046B2/en
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JP2019004953A 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法 Active JP7115329B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法
PCT/JP2019/049602 WO2020149080A1 (ja) 2019-01-16 2019-12-18 光学的測距装置および光学的測距装置における異常の発生を検出する方法
CN201980089019.9A CN113302516B (zh) 2019-01-16 2019-12-18 光学测距装置及检测光学测距装置中的异常的产生的方法
US17/375,795 US12386046B2 (en) 2019-01-16 2021-07-14 Optical ranging device and method for detecting occurrence of abnormality in the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

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JP2020112501A JP2020112501A (ja) 2020-07-27
JP2020112501A5 true JP2020112501A5 (https=) 2021-06-10
JP7115329B2 JP7115329B2 (ja) 2022-08-09

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JP2019004953A Active JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

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US (1) US12386046B2 (https=)
JP (1) JP7115329B2 (https=)
CN (1) CN113302516B (https=)
WO (1) WO2020149080A1 (https=)

Families Citing this family (4)

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Publication number Priority date Publication date Assignee Title
CN113544535B (zh) * 2019-03-05 2024-07-05 伟摩有限责任公司 用于检测降低的lidar范围测量准确性的方法和系统
US12528518B2 (en) 2021-02-12 2026-01-20 Sony Semiconductor Solutions Corporation Information processing with driver eye movement monitoring
CN116888496A (zh) 2021-02-25 2023-10-13 索尼半导体解决方案公司 光检测装置及光检测系统
JP7836302B2 (ja) 2021-06-04 2026-03-26 ソニーセミコンダクタソリューションズ株式会社 光検出装置及び測距システム

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
JP2613655B2 (ja) * 1989-09-14 1997-05-28 松下電工株式会社 光電スイッチ
JPH10319121A (ja) * 1997-05-19 1998-12-04 Olympus Optical Co Ltd 距離測定装置
WO2005048319A2 (en) * 2003-11-06 2005-05-26 Yale University Large-area detector
JP2005331526A (ja) * 2005-08-24 2005-12-02 Denso Corp 距離測定装置
WO2008011617A2 (en) * 2006-07-21 2008-01-24 The Regents Of The University Of California Shallow-trench-isolation (sti)-bounded single-photon avalanche photodetectors
JP4663743B2 (ja) * 2008-01-31 2011-04-06 北陽電機株式会社 走査式測距装置
DE102009045323A1 (de) * 2009-10-05 2011-04-07 Robert Bosch Gmbh Optisches Entfernungsmessgerät mit Kalibrierungseinrichtung
JP6236758B2 (ja) * 2012-10-09 2017-11-29 株式会社豊田中央研究所 光学的測距装置
JP6225411B2 (ja) * 2012-10-16 2017-11-08 株式会社豊田中央研究所 光学的測距装置
US8836920B2 (en) * 2013-02-05 2014-09-16 Nen-Tsua Li Structure of an optical path for laser range finding
CN106463565B (zh) * 2013-11-22 2018-06-01 优步技术公司 激光雷达扫描仪校准
US9176361B2 (en) * 2014-03-11 2015-11-03 Sony Corporation Optical analog to digital converter and method
KR102409952B1 (ko) * 2014-04-07 2022-06-17 삼성전자주식회사 고해상도, 고프레임률, 저전력 이미지 센서
JP6477083B2 (ja) 2015-03-19 2019-03-06 株式会社豊田中央研究所 光学的測距装置
WO2018128655A2 (en) * 2016-09-25 2018-07-12 Okeeffe James Distributed laser range finder with fiber optics and micromirrors
JP7120756B2 (ja) * 2017-12-05 2022-08-17 シャープ株式会社 受光素子、飛行時間測定装置及び光レーダー装置

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