JP2020085446A - Estimation detection method of stress-induced luminescence amount - Google Patents

Abstract

To provide a method for estimating a desired amount of stress-induced luminescence by detecting each light separately under inevitable conditions that excitation light, fluorescence, and phosphorescence are coexisting due to continuous illumination of the excitation light.SOLUTION: An estimation detection method of stress-induced luminescence amount includes: a reference luminescence amount detection step of detecting first luminescence generated by irradiation without applying stress and second luminescence different from the first luminescence by irradiating excitation light to an application surface of a detection reference part where stress luminescent paint is applied in advance; a reference relativization ratio calculating step of calculating a reference relativization ratio value by dividing a detected amount of the second luminescence by a detected amount of the first luminescence; a sample luminescence amount detection step of detecting sample first luminescence and sample second luminescence different from the sample first luminescence generated by irradiating the excitation light to a measurement object coated with the stress luminescent paint after applying stress thereto; a luminance amount estimation step of calculating an estimated luminance amount by multiplying the detected amount of the sample first luminescence by the reference relativization ratio value; and a luminance difference calculation step of calculating a luminance difference amount from difference between the detected amount of the sample first luminescence and the estimated luminance amount.SELECTED DRAWING: Figure 5

Description

The present invention relates to a method for estimating and detecting a stress-stimulated luminescence amount, and more particularly to a method for estimating a stress-stimulated luminescence amount from characteristics of wavelength of light emitted from a stress-stimulated luminescent paint.

A stress-stimulated luminescent material (stress-stimulated luminescent paint) is applied to a measurement target in order to visualize the amount of stress applied to a measurement target such as a structure or a part and the deformation such as distortion accompanying the stress. For example, as a stress-stimulated luminescent material, oxide ceramics and the like have been proposed in which MAl ₂ O ₄ (M=Sr, Ca or Ba) is added with a rare earth element such as Eu as an emission center ion (see Patent Document 1). When the stress-stimulated luminescent material emits light, it is necessary to irradiate excitation light in advance in order to bring the stress-stimulated luminescent material into an excited state.

When irradiation of excitation light is not sufficient and stress is applied to the measurement target in a low excitation state, the amount of light emission (luminance) with respect to the applied stress decreases and the light emission sensitivity decreases. Therefore, quantification based on stress emission is difficult, and continuous stress cannot be measured.

Furthermore, when the excitation light is continuously irradiated to maintain the excited state of the stress-stimulated luminescent material (stress-stimulated luminescent paint), fluorescence and phosphorescence are inevitably generated according to the irradiation amount of the excitation light. Even if the stress-stimulated luminescence generated in such a state is detected, the brightness of fluorescence and phosphorescence is detected as the brightness mixed with the excitation light and superimposed. With the current method, it was not possible to separate and detect only the intensity of stress-stimulated luminescence which is essential.

JP, 2011-127992, A

Based on a series of circumstances, the inventor succeeded in separating each light and detecting each light by paying attention to the difference in wavelength of excitation light, fluorescence, and phosphorescence. Therefore, we found a method of estimating the amount of stress-induced light emission by utilizing the brightness of each light that was actually acquired.

The present invention has been made in view of the above points, and the excitation light, fluorescence, and phosphorescence are separated under the condition that irradiation with excitation light is continuously performed and excitation light, fluorescence, and phosphorescence are unavoidable. A method for estimating a desired stress-stimulated luminescence amount is provided.

That is, the stress-stimulated luminescence amount estimation and detection method according to the first aspect of the present invention irradiates the application surface of the detection reference portion, to which the stress-stimulated luminescent coating is applied in advance, with the irradiation excitation light having the wavelength corresponding to the stress-stimulated luminescent coating. Step of detecting the first luminescence generated by irradiation of the stress-stimulated luminescent paint with irradiation excitation light without applying stress to the portion and detecting the second luminescence generated from the stress-stimulated luminescent paint different from the first luminescence And a reference relativization ratio calculating step of calculating the reference relativization ratio value by dividing the detected amount of the second luminescence by the detected amount of the first luminescence, and the excitation light on the surface of the measurement object coated with the stress-stimulated luminescent paint. Is applied to the object to be measured, and then the first light emission of the sample generated by the irradiation of the excitation light is detected, and the second light emission of the sample generated from the stress-luminescent paint different from the first light emission of the sample is detected. From the difference between the detected amount of sample first luminescence and the estimated brightness amount, a sample luminescence amount detection step, a brightness amount estimation step of calculating an estimated brightness amount by multiplying the detected amount of sample first luminescence by a reference relativization ratio value And a difference brightness calculating step of calculating a difference brightness amount.

The stress-stimulated luminescence amount estimation and detection method according to the second aspect is characterized in that the second luminescence and the sample second luminescence include either or both of fluorescence and phosphorescence generated by irradiation of the stress-stimulated luminescent material with excitation light. And

The stress-stimulated luminescence amount estimation and detection method according to the third aspect is characterized in that the position of the measurement object changes with time.

The stress emission amount estimation/detection method of the fourth aspect is characterized in that the first light emission and the sample first light emission, and the second light emission and the sample second light emission are dispersed by the spectroscopic unit according to the emission wavelength. ..

The stress emission amount estimation/detection method of the fifth aspect is characterized in that the spectroscopic unit is a dichroic mirror or a beam splitter.

The stress emission amount estimation/detection method of the sixth aspect is characterized in that the first light emission and the sample first light emission are detected by the first camera unit, and the second light emission and the sample second light emission are detected by the second camera unit. And

According to the stress emission amount estimation and detection method of the present invention, the irradiation of the excitation light is continuously performed, and the excitation light, the fluorescence, and the phosphorescence are emitted even if the excitation light, the fluorescence, and the phosphorescence are inevitable. It can be detected separately. Then, it is possible to estimate a desired stress emission amount using the reference relativization ratio value.

It is a process schematic diagram which shows a reference light emission amount detection process. It is a graph which shows calculation of standard relativization ratio. It is a process schematic diagram which shows a sample luminescence amount detection process. It is a graph which shows the light emission amount of a sample. It is a graph which shows the relationship between a sample light-emission amount and a stress-luminescence amount. It is a schematic diagram which shows the apparatus near a spectroscopic part. It is a block diagram which shows the structure of a process part. It is a flow chart explaining a stress luminescence amount presumption detection method.

As a premise of the stress-stimulated luminescence amount estimation and detection method of the present invention, a stress-stimulated luminescent coating (or stress-stimulated luminescent material) to be used is prepared in advance, and irradiation excitation light for irradiating later excitation light from the stress-stimulated luminescent coating is applied. To be done. Then, the excitation light generated by the excitation accompanying the irradiation of the irradiation excitation light when using the stress-stimulated luminescent paint and the brightness of the other light are detected. Light emission other than excitation light is fluorescence or phosphorescence. That is, as a feature of the present invention, the luminance of the excitation light and the light other than the reference that are generated from the stress-stimulated luminescent paint used is detected, and the luminance difference between this excitation light and fluorescence or phosphorescence, the relative ratio of the luminance is calculated after the fact. It is used to measure the measurement target. The characteristics of the type and brightness of the light generated for each stress-stimulated luminescent paint used in advance are understood. Then, it becomes possible to make an estimation from the brightness generated in the measurement object that is actually used for the generation of stress.

From here, the stress emission amount estimation and detection method of the present invention will be described in order based on the process schematic diagram of FIG. Excitation light having a wavelength corresponding to the stress-stimulated luminescent paint is applied to the coating surface to which the stress-stimulated luminescent paint has been applied in advance. The stress-stimulated luminescent coating material (stress-stimulated luminescent material) is a known and available coating material, and is, for example, strontium aluminate (SrAl ₂ O ₄ ) doped with europium (Eu) that emits green light and having its structure controlled. This is irradiated with electromagnetic waves such as ultraviolet rays as irradiation excitation light (light in the wavelength range for exciting the stress-stimulated luminescent paint).

In FIG. 1A, the detection reference unit 10 is prepared. The detection reference unit 10 is a metal plate, a resin plate, or the like. Of course, the shape, structure, material, and size of the detection reference unit 10 are appropriate. It may be the same as the measurement object 11 (see FIG. 3) described later. In FIG. 1B, the stress-stimulated luminescent paint 13 is applied (applied) to the surface of the detection reference portion 10 by the spray 12. In FIG. 1C, the irradiation excitation light 15 is applied from the irradiation device 14 to the applied detection reference portion 10. And in FIG.1(d), the light of various wavelengths generate|occur|produces from the stress-stimulated luminescent coating material 13 of the detection reference part 10 which the irradiation excitation light 15 irradiated. The light generated at this time is detected by the detection unit 16, and the processing unit 17 executes arithmetic processing and the like described later. As is clear from the drawing, no stress is applied to the detection reference portion 10. The light generated and detected from the stress-stimulated luminescent paint 13 is light that does not include stress-stimulated luminescence.

The light detected upon irradiation of the stress-stimulated luminescent material with irradiation excitation light is shown as a general shape in the graph of FIG. By irradiating the stress-stimulated luminescent paint with the irradiation excitation light, first, the first light emission (LA) generated by the irradiation with the irradiation excitation light is detected. The first light emission (LA) shown is light emission having a peak at a wavelength near 350 nm. The first light emission (LA) is detected as the brightness of the detection amount (DA). Further, the second luminescence (LB) generated from the stress-stimulated luminescent paint different from the first luminescence (LA) is also detected. The illustrated second light emission (LB) is light emission having a peak at a wavelength near 515 nm. The second light emission (LB) is detected as the brightness of the detection amount (DB). In this way, the first light emission (LA) and the second light emission (LB), which are characteristic of the stress-stimulated luminescent paint, are detected (“reference luminescence amount detection step”).

No stress is applied to the second light emission (LB), and the second light emission (LB) is light emission of either fluorescence or phosphorescence, or light emission in which both fluorescence and phosphorescence are mixed. Separation of the first light emission (LA) and the second light emission (LB), and detection of each light emission will be described later.

As understood from the graph of FIG. 2, in the stress-stimulated luminescent paint of this example, the detected amount (DA) of the luminance of the first light emission (LA) is equal to the detected amount (DB) of the luminance of the second light emission (LB). Higher value than. Therefore, as in the following expression (i), the detected amount (DB) of the luminance of the second light emission (LB) is divided by the detected amount (DA) of the luminance of the first light emission (LA). A standard relativization ratio value (P) is calculated as this quotient. The wavelength positions of the first light emission (LA) and the second light emission (LB) and the brightness detected at their peaks are determined for each type of stress-luminescent paint. Then, the reference relativization ratio value (P) is also determined for each type of stress-stimulated luminescent paint (“reference relativity ratio calculation step”).

The summary up to this point is as follows, and the formula (i) is referred to.
LA: First light emission generated by irradiation of irradiation excitation light DA: Detected amount of brightness of first light emission LB: Second light emission of light emission different from first light emission
(Fluorescence or phosphorescence, fluorescence and phosphorescence)
DB: Detected amount of luminance of second emission P: Reference relativization ratio value

The relationship between the detected amount (DA) of the brightness of the first light emission (LA) and the detected amount (DB) of the brightness of the second light emission (LB) of the stress-stimulated luminescent paint is established as the reference relative ratio value (P). Relative relationship is sufficient. For example, the absolute amount of the detected value that defines the calibration curve is not required. The reference relativization ratio value (P) is calculated from the detected amount (DA) of the luminance of the first light emission (LA) and the detected amount (DB) of the luminance of the second light emission (LB) detected by one measurement. May be. Alternatively, the average value may be calculated from the detected amount (DA) of the luminance of the first light emission (LA) and the detected amount (DB) of the luminance of the second light emission (LB) detected by the plurality of measurements. In this way, the reference relativization ratio value (P) corresponding to the stress-stimulated luminescent paint is defined.

With respect to the luminance of the first light emission (LA) and the luminance of the second light emission (LB), it is inevitable that each measurement is blurred. Also, the amount of generated brightness may differ even under the irradiation condition of the excitation light. However, not the specific detection values of the detection amount (DA) and the detection amount (DB), but the reference relativization ratio value (P) that is a relative value between them is calculated. The difference can be ignored, which makes it easier to use for the individual measurements described below. In other words, the reference relativization ratio value (P), which is a “specific ratio”, is obtained for each stress-stimulated luminescent paint (stress-stimulated luminescent material).

Next, it becomes the measurement of the brightness of each individual object. The same stress-stimulated luminescent paint used for calculating the reference relativization ratio value (P) described above is applied to the surface of the measurement target. Then, the coated surface is similarly irradiated with excitation light. Then, stress is applied to the measurement object. At this time, crushing, shearing, strain deformation, etc. occur in the measurement object.

Therefore, after the stress is applied to the measurement target, the first light emission (La) of the sample generated from the measurement target by the irradiation of the excitation light is detected. The first light emission (La) of the sample is detected as the detected amount (Da) of luminance. At the same time, the second light emission (Lb) of the sample generated from the measurement object is also detected. The second light emission (Lb) of the sample is detected as the detected amount of brightness (Db). The process up to this point is the “sample light emission amount detection step”.

FIG. 3 is a process schematic diagram of the sample emission amount detection process. In FIG. 3A, the measurement target 11 is prepared. For example, it is a board or the like on which electronic components and the like are mounted. In FIG. 3B, the stress-stimulated luminescent paint 13 is applied (applied) to the surface of the measuring object 11 by the spray 12. In FIG. 3C, the irradiation excitation light 15 is applied from the irradiation device 14 to the applied detection reference portion 10. Subsequently, in FIG. 3D, the stress F is applied from the left and right sides of the measurement target 11 (stress application).

And in FIG.3(e), the light of various wavelengths generate|occur|produces from the stress-stimulated luminescent coating material 13 of the detection reference part 10 which was irradiated with the irradiation excitation light 15. The light generated at this time is detected by the detection unit 16, and the processing unit 17 executes arithmetic processing and the like described later. As is clear from the drawing, the stress F is applied to the measurement object 11. The light generated from the stress-stimulated luminescent paint 13 and detected is light including stress-stimulated luminescence.

The sample second light emission (Lb) is different from the sample first light emission (La) caused by the excitation light and is either fluorescence or phosphorescence light emission, or light emission in which both fluorescence and phosphorescence are mixed. Further, these are detected as brightness including stress emission.

FIG. 4 is a schematic graph showing sample first light emission (La) and sample second light emission (Lb). Excitation light is applied to the surface of the measurement object to which the stress-stimulated luminescent coating is applied, stress is then applied to the measurement object, and the sample first emission (La) and sample second emission (Lb) are detected. is there. Since the stress-stimulated luminescent coating material in this example is the same, the sample first emission (La) has a peak at 350 nm, and the sample second emission (Lb) has a peak at 515 nm. Therefore, the luminance of the first light emission (La) of the sample is detected as the detection amount (Da). Similarly, the luminance of the second light emission (Lb) of the sample is detected as the detection amount (Db).

As can be understood from this graph, the amount of detected luminance (Db) also includes stress emission. In the detected amount of brightness (Db), the extent to which the brightness caused by the emission of fluorescence or phosphorescence and the brightness caused by the stress emission are detected. Is impossible.

In view of this point, the detection amount (Da) of the first light emission (La) of the sample is multiplied by the reference relativization ratio value (P) described above in order to estimate the stress light emission amount. Then, the estimated luminance amount (Di) corresponding to the detected amount (Da) of the first light emission (La) of the sample is calculated (“luminance amount estimation step”). Reference is made to formula (ii). That is, the estimated brightness amount (Di) is the second light emission (Lb) of the sample when it is assumed that the stress of the stress-stimulated luminescent material is applied to the surface of the measurement object and the stress is not applied. It becomes the detected amount (Db) of brightness.

Then, the difference brightness amount (Dd) is calculated from the difference between the detected amount (Db) of the sample first light emission (Lb) and the estimated brightness amount (Di) (“difference brightness calculation step”). The estimated luminance amount (Di) is subtracted from the detected amount (Db) of the first light emission (Lb) of the sample to obtain the differential luminance amount (Dd). Reference is made to formula (iii). The difference brightness amount (Dd) thus calculated is regarded as the brightness amount of the light emission due to the stress light emission.

The summary up to this point is as follows, and the formula (ii) and the formula (iii) are referred to.
La: First emission of sample Da: Detected amount of luminance of first emission of sample Lb: Second emission of sample
(Fluorescence or phosphorescence, mixed fluorescence and phosphorescence, and stress emission)
P: reference relativization ratio value Di: estimated brightness amount Dd: difference brightness amount

This situation is shown as a graph in FIG. The detected amount (Db) of the luminance of the second light emission (Lb) of the sample also includes the amount of luminance of the light emission caused by the stress light emission as described above. Therefore, the amount of luminance caused by fluorescence or phosphorescence is simply subtracted from the detected amount (Db). As a convenience for that purpose, the estimated brightness amount (Di) derived from the reference relativization ratio value (P) is used. Therefore, even if only the detection amount (Db) is known, the difference luminance amount (Dd) is calculated using the estimated luminance amount (Di). Even if the amount of luminance due to stress emission is buried in another amount of luminance and measurement is difficult in the past, it is possible to indirectly separate as a difference amount. Therefore, as long as the same stress-stimulated luminescent paint is used, the amount of brightness caused by stress-stimulated luminescence can be easily grasped, and the load of the stress applied to the measurement object can be estimated from the amount of brightness.

As described above, when the stress luminescence amount estimation/detection method of the present invention is used, even if the measurement object is continuously irradiated with the excitation light, the detection amount of the luminance of the sample second light emission (Lb) is important. Since (Db) can be detected and the estimated brightness amount (Di) is known, the difference brightness amount (Dd) due to stress emission can be easily calculated.

Then, even when the position of the measurement target changes with time, the irradiation of the irradiation excitation light with respect to the measurement target can follow the measurement target. For example, when the electronic board is fixed to another component with screws or the like and conveyed, it is convenient for grasping the influence of stress at the fixing position of the electronic board during conveyance.

The first light emission (LA) and the sample first light emission (La), and the second light emission (LB) and the sample second light emission (Lb) are different from each other in the generation factors, as is apparent from the series of descriptions and drawings. They exist in different wavelength bands. Therefore, the light is split into each wavelength by the spectroscopic unit 20 according to the emission wavelength. Here, as the spectroscopic unit 20, a known spectroscopic optical device such as a dichroic mirror or a beam splitter is used.

As can be seen from FIG. 6, the stress-stimulated luminescent paint after application is irradiated with excitation light, and the stress-stimulated luminescent paint emits light. The emitted light is split by the spectroscopic unit 20 according to the emission wavelength. For example, when the spectroscopic unit 20 is a dichroic mirror, the light emission in the wavelength band of "blue-purple-ultraviolet" is reflected by the dichroic mirror. Light emission other than those is transmitted through the dichroic mirror. Even in the case of a beam splitter, reflection and transmission are controlled according to a specific emission wavelength.

The emission wavelength reflected by the dichroic mirror corresponds to the first emission (LA) and the sample first emission (La). Therefore, as illustrated, the first light emission (LA) and the sample first light emission (La) are detected by the first camera unit 31. At the same time, the second light emission (LB) and the sample second light emission (Lb) are detected by the second camera unit 32. Since both the first camera unit 31 and the second camera unit 32 are provided, mutual light emission is detected at the same time, and the processing efficiency is improved. A processing device (not shown) such as a known personal computer is connected to the first camera unit 31 and the second camera unit 32, and the above-described various calculations are executed.

Now, the configuration of the processing unit 17 will be described with reference to the block diagram of FIG. 7. The processing unit 17 is composed of a CPU, a ROM, a RAM, and a storage unit in terms of hardware. In addition, main memory, LSI, etc. are also included. Further, it is realized by software by a stress emission amount estimation/detection program loaded in the main memory. The processing unit 17 can be realized by using various electronic computers (computation resources) such as a personal computer (PC), a mainframe, a workstation, and a cloud computing system. It is also designed as a device that can be incorporated into other devices described later.

When each functional unit of the processing unit 17 is implemented by software, the processing unit 17 is implemented by executing a program instruction that is software that implements each function. As a recording medium for storing this program, a “non-transitory tangible medium”, for example, a CD, a DVD, a semiconductor memory, a programmable logic circuit, or the like can be used. The program may be supplied to a computer such as the processing unit 17 via any transmission medium (communication network, broadcast wave, etc.) capable of transmitting the program.

The various storage units in the processing unit 17 are the ROM 102 and the RAM 103, which are known storage devices (not shown) such as HDD or SSD. Each functional unit that executes arithmetic processing is an arithmetic element such as the CPU 101. In detail, the processing unit 17 includes a reference light emission amount detection unit 110, a reference relativization ratio calculation unit 120, a sample light emission amount detection unit 130, a brightness amount estimation unit 140, and a difference brightness calculation unit 150. Further, the processing unit 17 includes an input unit 104, an output unit 105, a display unit 106 and the like. The display unit 106 is a known display (a liquid crystal display device, an organic EL display device, etc.).

The input unit 104 and the output unit 105 are a communication (transmission/reception) interface, a buffer, and the like. The detection signals detected by the first camera unit 31 and the second camera unit 32 are input to the input unit 104. After that, it is transmitted to the CPU 101 and the RAM 103 via a D/A conversion circuit (not shown). From the output unit 105, the result of arithmetic processing by the CPU 101 is displayed on the display unit 106 which is a display device such as a display.

Next, the flow of the stress luminescence amount estimation and detection method in the processing unit 17 will be described using the flowchart of FIG. The process of the stress emission amount estimation/detection method of the present invention includes a reference emission amount detection step (S110), a reference relativization ratio calculation step (S120), a sample emission amount detection step (S130), a luminance amount estimation step (S140), and a difference. The process proceeds in the order of the brightness calculation step (S150).
The data obtained in each step such as the reference relativization ratio value (P), the estimated brightness amount (Di), the difference brightness amount (Dd), and the results of calculation, calculation, etc. are stored in the RAM 103.

The processing in the reference light emission amount detection unit 110 and the reference light emission amount detection step (S110) corresponds to the description of the reference light emission amount detection step. The processing in the reference relativization ratio calculation unit 120 and the reference relativity ratio calculation step (S120) corresponds to the description of the reference relativity ratio calculation step. The processing in the sample emission amount detection unit 130 and the sample emission amount detection step (S130) corresponds to the description of the sample emission amount detection step. The processing in the brightness amount estimating unit 140 and the brightness amount estimating step (S140) corresponds to the description of the brightness amount estimating step. The processing in the difference brightness calculation unit 150 and the difference brightness calculation step (S150) corresponds to the description of the difference brightness calculation step. It should be noted that specific processing in each unit and each step corresponds to each of the above-described steps, and thus detailed description thereof will be omitted.

The method for estimating and detecting the amount of stress-induced luminescence of the present invention is more accurate because the irradiation of the excitation light is continuously performed and the separation and detection of each luminescence are possible under the condition that the mixture of the excitation light, fluorescence and phosphorescence is unavoidable. The luminance corresponding to stress emission can be estimated. Therefore, it becomes possible to detect the luminance corresponding to the stressed light emission, which has been conventionally difficult, and it is possible to contribute to the improvement of work efficiency.

LA 1st light emission DA 1st light emission luminance detection amount LB 2nd light emission DB 2nd light emission luminance detection amount P Reference relativization ratio value La Sample 1st light emission Da sample 1st light emission luminance detection amount Lb Sample light 2 Luminous emission Db Detected amount of luminance of second luminescence Di Estimated luminance amount Dd Difference luminance amount 10 Detection reference part 11 Measurement object 12 Spray 13 Stress luminescent paint 14 Irradiator 15 Irradiation excitation light 16 Detecting part 17 Processing part 20 Spectral part 31 1st camera section 32 2nd camera section 101 CPU
102 ROM
103 RAM
104 input unit 105 output unit 106 display unit

Claims (6)

Irradiation excitation light of a wavelength corresponding to the stress-stimulated luminescent material is applied to the coating surface of the detection reference portion coated with the stress-stimulated luminescent material in advance, and the irradiation excitation of the stress-stimulated luminescent material is performed without applying stress to the detection reference portion. A reference luminescence amount detecting step of detecting a first luminescence (LA) generated by light irradiation and detecting a second luminescence (LB) generated from the stress-stimulated luminescent paint different from the first luminescence (LA);
A reference relativization ratio calculation step of calculating a reference relativity ratio value (P) by dividing the detected amount (DB) of the second light emission (LB) by the detected amount (DA) of the first light emission (LA),
Sample first light emission (La) generated by irradiation of the irradiation excitation light after irradiating the irradiation excitation light on the surface of the measurement object coated with the stress-stimulated luminescent paint and applying stress to the measurement object And a sample luminescence amount detection step of detecting a sample second luminescence (Lb) generated from the stress-stimulated luminescent paint different from the sample first luminescence (La).
A brightness amount estimating step of calculating an estimated brightness amount (Di) by multiplying the detected amount (Da) of the first light emission (La) of the sample by the reference relativization ratio value (P);
A difference luminance calculation step of calculating a difference luminance amount (Dd) from a difference between the detected amount (Db) of the sample first light emission (Lb) and the estimated luminance amount (Di). Estimated detection method. The second emission (LB) and the second emission (Lb) of the sample include either or both of fluorescence and phosphorescence generated by the irradiation of the stress-stimulated luminescent material with the irradiation excitation light. Method for estimating and detecting the amount of stress-induced luminescence. The stress emission amount estimation and detection method according to claim 1, wherein the position of the measurement object changes with time. The first light emission (LA) and the first light emission (La) of the sample, and the second light emission (LB) and the second light emission (Lb) of the sample are dispersed by a spectroscopic unit according to an emission wavelength. The stress-stimulated luminescence amount estimation and detection method according to any one of 1 to 3. The stress emission amount estimation and detection method according to claim 4, wherein the spectroscopic unit is a dichroic mirror or a beam splitter. The first light emission (LA) and the sample first light emission (La) are detected by a first camera unit, and the second light emission (LB) and the sample second light emission (Lb) are detected by a second camera unit. The stress emission amount estimation/detection method according to any one of claims 1 to 5.

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