JP2020076659A - Inspection device of electronic component tray - Google Patents

Abstract

To provide an inspection device of an electronic component tray capable of improving inspection precision and reducing a burden, and reducing inspection time when inspecting whether electronic components remain in a tray after use.SOLUTION: An inspection device inspects an electronic component tray 10 that is made of a nonmetal material and includes a number of recesses 11 for storing electronic components 1. The inspection device includes: a detection part 120 for detecting the electronic components 1 remaining in the recesses 11 of the tray 10; a conveyance part 130 for conveying the tray 10 toward the detection part 120; a display part 140 for displaying a detection result; and a control part 150 for controlling the entire device.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inspection device for inspecting forgetting to take out an electronic component from an electronic component tray used for protection, storage, transportation, etc. of an electronic component.

  Small electronic components such as capacitors, diodes, and transistors are stored in a dedicated tray after manufacturing and inspection steps. The tray is made of resin and is used for the purpose of safely protecting, storing, and transporting electronic components. Particularly, extremely small-sized electronic components are stored in the storage recesses so as not to be lost.

  FIG. 5 shows an example of the tray. As shown in FIG. 5A, the tray 10 shown in FIG. 5 is provided with recesses 11 for accommodating electronic components in an aligned state in a matrix, and as shown in FIG. One hundred trays 10 can accommodate 100 electronic components 1. The tray 10 in which the electronic components 1 are stored is shipped in a stacked state, and after the electronic components are taken out and used in the factory of the shipping destination, the trays 10 are collected in an empty state shown in FIG. It has become.

  Conventionally, various proposals have been made regarding the tray for the above purpose (Patent Documents 1 to 3).

JP, 2003-226395, A JP 2012-80028A JP, 2017-50454, A

  However, as shown in FIG. 6, there are cases where electronic components that have not been taken out remain on the used tray. If the electronic components are collected while they remain, it may hinder the use of the next tray. Therefore, it is necessary to inspect before or after the recovery of the electronic components that have not been taken out from the used tray.

  Conventionally, visual inspection or image inspection is performed, but the visual inspection is a heavy burden on the inspector (inspecting tens of thousands of sheets a day), and small electronic parts are overlooked visually while they are fitted in the tray. There is a risk. The image inspection has a problem that it takes time to perform image processing and it takes time to perform the inspection.

  The present invention has been made in view of the above, and it is possible to improve the inspection accuracy, reduce the burden, and shorten the inspection time when inspecting whether or not electronic components remain in the tray after use. It is an object to provide an inspection device for a tray for parts.

In order to solve the above problems, an inspection device for an electronic component tray according to the present invention,
An inspection device for inspecting a tray for electronic parts, which is made of a non-metallic material and provided with a large number of recesses for accommodating electronic parts,
A detection unit that detects an electronic component remaining in the recess of the tray using a magnetic field, a conveyance unit that conveys the tray toward the detection unit, a display unit that displays the detection result, and a control that controls the entire apparatus. The main feature is to have a section.

  In the inspection device for an electronic component tray according to the present invention, the detection unit includes a transmission coil unit arranged at one of upper and lower sides of the conveyance unit and a detection coil unit arranged at another upper and lower sides of the conveyance unit. This is the second feature.

  In the inspection device for an electronic component tray according to the present invention, the transport unit is capable of transporting a plurality of the trays stacked, and the detection unit remains in any recess of the stacked trays. A third feature is that the electronic component can be detected.

  In the electronic-parts tray inspection device according to the present invention, the control section causes a current to flow in the transmission coil section of the detection section to generate a magnetic field between the detection coil section and the transfer section to operate the tray. A fourth characteristic is to pass the magnetic field, detect the electronic component remaining in the recess of the tray due to the change of the magnetic field, and display the detection result on the display unit.

  In the electronic component tray inspection device according to the present invention, when the display unit detects an electronic component remaining in the recess of the tray, the display unit displays an NG judgment together with the detection result, and when the electronic component is not detected, the detection result is displayed. The fifth feature is that the determination display of OK is also displayed.

  As described above, according to the electronic component tray inspection apparatus of the present invention, it is possible to reliably and efficiently detect the electronic components remaining in the recessed portions of the tray, and re-use the used tray with the electronic components remaining. It is possible to prevent problems such as use and shipping.

  Further, as compared with the conventional inspection method, there is an excellent effect that the inspection load can be reduced and the inspection time can be greatly shortened.

Overall structure of inspection device for electronic parts tray, (A) is a perspective view showing the transport unit and the detection unit, (B) is a front view thereof, (A) is a screen showing a detection example of the display unit, (B) is a screen showing a setting example, A diagram showing a configuration example of a control unit, (A) is a plan view of a tray for electronic parts, (B) is a plan view of a tray in which electronic parts are stored in respective recesses, It is a top view showing a tray with which electronic parts remained after use.

  Modes for carrying out the present invention will be described with reference to the drawings. In FIG. 1, reference numeral 10 indicates an electronic component tray, and reference numeral 100 indicates an electronic component tray inspection apparatus.

  The inspection device 100 is a device for inspecting whether or not the electronic component 1 remains in the used electronic component tray 10 (hereinafter, abbreviated as the tray 10) as shown in FIG. 6, and as shown in FIG. In addition, the gantry 110, the detection unit 120, the belt conveyance unit 130, the display unit 140, and the control unit 150 are provided.

  The detection unit 120 detects the electronic component 1 remaining in the recess 11 of the tray 10 as shown in FIG. 6, has an opening 122 through which the tray 10 passes, and has an upper transmission coil unit 124 and a lower detection coil unit. It is equipped with 126.

  When a current is applied to the transmission coil unit 124 by a command from the control unit 150, the transmission coil unit 124 generates a magnetic field (magnetic force line G) toward the detection coil unit 126 as shown in FIG. 2 (B). The detection coil unit 126 is composed of two reception coils, and each reception coil receives a magnetic field from the transmission coil unit 124. However, when the electronic component 1 in the recess 11 together with the tray 10 passes through the magnetic field, the two reception coils receive a magnetic field. When a difference occurs (change in magnetic field), the electronic component 1 on the tray 10 is detected by detecting the difference.

  The electronic component 1 corresponds to a chip-type electronic component, for example, a laminated ceramic capacitor. A multilayer ceramic capacitor is formed by printing an internal electrode pattern (metal paste such as Ni) on a ceramic sheet (green sheet), stacking them, press-bonding them integrally, cutting them into a predetermined size into chips, and firing them. External electrodes (metal paste such as Cu) are applied to both end faces of the chip and baked, and plating (metal such as Ni and Sn) processing is applied to the surface. The electronic component 1 also includes other components that can be accommodated in the recess 11 of the tray 10, such as a diode, a transistor, a semiconductor, a sensor, a thermistor, and the like.

  The tray 10 is made of a resin such as polypropylene, polystyrene, polyester, or polyvinyl chloride, and also includes a conductive tray containing a conductive material (such as carbon). As shown in FIG. 5, the tray 10 is provided with a large number of concave portions 11 arranged in a matrix for accommodating the electronic components 1 in an aligned manner.

  The detection unit 120 detects the electronic component 1 by detecting the metal (metal such as Ni, Cu, Sn in the case of the above-mentioned laminated ceramic capacitor) contained in the electronic component 1 remaining in the recess 11 of the tray 10.

  The belt conveyance unit 130 includes a belt 132, and sequentially guides the tray 10 on the belt 132 to the opening 122 of the detection unit 120 and allows the tray 10 to pass therethrough. A plurality of trays 10 (for example, 2 to 10 trays) can be conveyed to the detection unit 120 in a stacked state.

  The display unit 140 displays the detection result of the detection unit 130, and an example of the display screen 141 is shown in FIG. FIG. 3A illustrates a waveform display unit 142 indicating whether or not the magnetic field has changed and a determination display unit 143 indicating OK / NG. When there is no electronic component 1 on the tray 10 passing through the detection unit 130, the waveform display unit 142 displays a standard waveform with no change in magnetic field, and the determination display unit 143 displays OK determination. When the electronic component 1 remains on the tray 10 that passes through the detection unit 130, the waveform display unit 142 displays the waveform disturbed by the change in the magnetic field, and the determination display unit 143 displays the NG determination.

  On the display unit 140, inspection conditions can be set according to the type of tray 10 to be inspected and the type of electronic component 1 to be stored. FIG. 3B shows an example of the setting input screen 144. In the setting input screen 144 of FIG. 3B, a tray specification and type (JEDEC standard, material, presence / absence of conductivity, etc.) setting section 145A, tray number (number of sheets stacked at one time) setting section 145B, electronic Component type (multilayer ceramic capacitor, diode, resistor, etc.) and part number setting unit 146, sensitivity (small to large) adjustment setting unit 147, phase adjustment setting unit 148, transport speed (small to large) adjustment A setting unit 149 is provided.

  The electronic component setting unit 146 additionally sets a single metal material or a combination of a plurality of metal materials used for the electronic component (whether it includes only a ferromagnetic material such as Ni, only a nonmagnetic material such as Cu, or both). Is possible.

  In the above example, when the electronic component 1 is a multilayer ceramic capacitor, the metal includes Ni, Cu, and Sn. Ni (nickel) is a ferromagnetic substance like Fe (iron), but Cu (copper) and Sn (tin) are non-magnetic substances like Al (aluminum). In such a case, setting is made so that a high-frequency AC magnetic field is generated between the transmission coil 124 and the detection coil 126, and the current phases of the ferromagnetic material and the non-magnetic material differ by 90 °, so that each metal is detected. In order to improve the detection accuracy by adjusting the phase, the phase of each metal is adjusted to a detectable phase.

  The control unit 150 controls the entire apparatus, that is, the detection unit 120, the belt conveyance unit 130, and the display unit 140. FIG. 4 shows the configuration of the control unit 150. As shown in the figure, the control unit 150 includes a condition setting unit 152 that performs various settings by an input operation from the display unit 140, a detection processing unit 154 that executes and processes the detection unit 120, and OK based on the detection result. A determination unit 156 that performs / NG determination processing and a data storage unit 158 that stores various data are provided.

  The detection processing unit 154 previously measures the waveform of the tray 10 that does not include the electronic component 1 as a reference waveform, compares the waveform with the waveform of the tray 10 that includes the electronic component 1 (waveform due to change in magnetic field), and compares the electronic component 1 with the electronic component 1. To detect. Each waveform is stored in the data storage unit 158.

  The control unit 150 causes the detection coil 120 to generate a magnetic field (AC magnetic field) between the detection coil unit 120 and the detection coil unit 126 by operating the inspection start button ST by the operator. Then, the belt transport unit 130 transports the tray 10 on the belt 132 toward the opening 122 of the detection unit 120 at a predetermined speed. Further, based on the detection result of the detection unit 120, the display unit 140 displays the detection result and the determination result.

  Next, a method of using the inspection device 100 having the above configuration will be described below with reference to the drawings.

  The tray 10 on which a large number of electronic components 1 as shown in FIG. 5B are arranged is transported to an assembly process of an electronic device (such as a smartphone), taken out one by one from the tray 10 and used for assembly.

  Although the used tray 10 is collected, whether the electronic component 1 remains in the tray 10 before or after the collection (FIG. 5A) or the unused electronic component 1 remains (FIG. 5). 6) The inspection is performed by the inspection device 100.

  First, an operator checks the setting input screen 144 displayed on the display unit 140 of the inspection apparatus 100 so that the standard and type of the tray 10, the number of stacked sheets, and the type of the electronic component 1 stored in the tray 10 (eg, multilayer ceramic capacitor). ) And various settings for product number, sensitivity, phase, and speed.

  Next, the start button ST is pressed on the setting input screen 144 displayed on the display unit 140 to activate the detection unit 120 and the conveyor transport unit 130. Next, a set number (two to ten) of the used trays 10 are stacked, placed on the conveyor 132, and conveyed toward the opening 122 of the detection unit 120 as shown in FIGS. 1 and 2A. Let

  As shown in FIG. 2B, while the set number of trays 10 are stacked toward the downstream side of the opening 122 of the detection unit 120, a magnetic field (magnetic field line G) from the transmission coil unit 124 toward the detection coil unit 126 is generated, as shown in FIG. 2B. pass. At this time, if none of the electronic components 1 remains in the stacked trays 10, there is no change in the detection coil unit 126 that has received the magnetic field, and the detection result (standard waveform) is displayed on the display screen 141 of the display unit 140. At the same time, a determination display of "OK" is displayed.

  When the electronic component 1 remains on any one of the stacked trays 10, the detection coil unit 126 that receives the magnetic field changes, and the electronic component 1 is detected. With respect to Ni contained in the electronic component 1, Ni draws a magnetic force line, and a difference in magnetic flux density occurs in the left and right receiving coil portions as a change. For Cu and Sn contained in the electronic component 1, Cn and Sn generate an eddy current, and a difference in magnetic flux density occurs as a change in the left and right receiving coil portions.

  When the detection unit 120 detects the electronic component 1, the display screen 141 of the display unit 140 displays the detection result (waveform due to the change of the magnetic field) and “NG” determination display. The operator sequentially performs the re-inspection from the uppermost tray 10 among the stacked trays 10 according to the detection result displayed on the display unit 140 and the determination of “NG”.

  That is, from the uppermost tray 10 to the lowermost tray 10, the sheets are sequentially placed one by one on the conveyor 132 of the conveyor conveyance unit 130 and conveyed one by one to the opening 122 of the detection unit 120 to check the presence or absence of the electronic component 1. To detect. If the tray 10 in which the electronic component 1 remains is passed, the determination display of "NG" is displayed, and if the tray 10 without the electronic component 1 is passed, the determination display of "OK" is displayed.

  In this way, after detecting the tray 10 in which the electronic component 1 remains, the electronic component 1 is removed from the tray 10 and is collected together with the empty tray 10 without the electronic component 1. A sorter may be provided on the downstream side of the conveyor transport unit 130 to sort only the trays 10 on which the OK / NG determination is displayed based on the OK / NG determination.

  By using the inspection apparatus 100 of the present embodiment, the electronic components 1 remaining on the tray 10 can be reliably detected, and the inspection failure of the tray 10 after use can be eliminated, while at the same time improving the efficiency of inspection work and shortening the inspection time. Can be promoted.

  From the past experience, the number of trays 10 to be inspected reaches tens of thousands per day, while the number of trays 10 with the electronic components 1 remaining is very small, less than a few% of the total. The fact that multiple sheets can be inspected at one time is that the inspection efficiency is very good and the inspection time is greatly reduced even after subtracting the point of re-inspecting the trays 10 each of which is piled up based on the judgment display of "NG". Can be shortened.

  According to the inspection apparatus 100 of the present embodiment, the electronic components 1 remaining on the tray 10 can be detected reliably and efficiently, and the work load can be greatly reduced by eliminating the conventional manual work. You can

  Thus, according to the present invention, it is possible to realize an inspection device for an electronic component tray, which can improve the inspection accuracy, reduce the load, and shorten the inspection time.

  INDUSTRIAL APPLICABILITY The electronic component tray inspection apparatus according to the present invention can be used as an apparatus for inspecting whether an electronic component remains on a used tray.

DESCRIPTION OF SYMBOLS 1 Electronic component 10 Electronic component tray 11 Recessed portion 100 Inspection device 110 Frame 120 Detection part 122 Opening part 124 Transmission coil part 126 Detection coil part 130 Conveyor transfer part 132 Conveyor 140 Display part 141 Display screen 142 Waveform display part 143 Judgment display part 144 Setting input screen 145A Tray standard and type setting unit 145B Tray number setting unit 146 Electronic component type and product number setting unit 147 Sensitivity adjustment setting unit 148 Phase adjustment setting unit 149 Transport speed adjustment setting unit 150 Control Part 152 Condition setting part 154 Detection processing part 156 Judgment part 158 Data storage part

Claims (5)

An inspection device for inspecting a tray for electronic parts, which is made of a non-metallic material and provided with a large number of recesses for accommodating electronic parts,
A detection unit that detects an electronic component remaining in the recess of the tray using a magnetic field, a conveyance unit that conveys the tray toward the detection unit, a display unit that displays the detection result, and a control that controls the entire apparatus. An apparatus for inspecting a tray for electronic parts, which is provided with a section.   The electronic component tray according to claim 1, wherein the detection unit includes a transmission coil unit disposed on one of the upper and lower sides of the transport unit and a detection coil unit disposed on the other upper and lower sides of the transport unit. Inspection equipment.   The transport unit is capable of transporting a plurality of the trays stacked, and the detection unit is capable of detecting electronic components remaining in any of the recesses of the stacked trays. The electronic device tray inspection device according to claim 1 or 2.   The control section causes a current to flow in the transmission coil section of the detection section to generate a magnetic field between the detection coil section and the transfer section, and causes the tray to pass through the magnetic field. The electronic component tray inspection device according to claim 1, wherein the electronic component remaining in the recess is detected, and the detection result is displayed on the display unit. The display unit displays NG judgment display together with the detection result when an electronic component remaining in the recess of the tray is detected, and OK judgment display together with the detection result when the electronic component is not detected. The apparatus for inspecting a tray for electronic parts according to any one of claims 1 to 4.

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