JP2020052004A5 - - Google Patents

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Publication number
JP2020052004A5
JP2020052004A5 JP2018184527A JP2018184527A JP2020052004A5 JP 2020052004 A5 JP2020052004 A5 JP 2020052004A5 JP 2018184527 A JP2018184527 A JP 2018184527A JP 2018184527 A JP2018184527 A JP 2018184527A JP 2020052004 A5 JP2020052004 A5 JP 2020052004A5
Authority
JP
Japan
Prior art keywords
reflected
lens
lens surface
optical system
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018184527A
Other languages
English (en)
Japanese (ja)
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JP2020052004A (ja
JP7225644B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2018184527A priority Critical patent/JP7225644B2/ja
Priority claimed from JP2018184527A external-priority patent/JP7225644B2/ja
Publication of JP2020052004A publication Critical patent/JP2020052004A/ja
Publication of JP2020052004A5 publication Critical patent/JP2020052004A5/ja
Application granted granted Critical
Publication of JP7225644B2 publication Critical patent/JP7225644B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2018184527A 2018-09-28 2018-09-28 レンズ測定装置 Active JP7225644B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018184527A JP7225644B2 (ja) 2018-09-28 2018-09-28 レンズ測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018184527A JP7225644B2 (ja) 2018-09-28 2018-09-28 レンズ測定装置

Publications (3)

Publication Number Publication Date
JP2020052004A JP2020052004A (ja) 2020-04-02
JP2020052004A5 true JP2020052004A5 (enExample) 2021-10-14
JP7225644B2 JP7225644B2 (ja) 2023-02-21

Family

ID=69996794

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018184527A Active JP7225644B2 (ja) 2018-09-28 2018-09-28 レンズ測定装置

Country Status (1)

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JP (1) JP7225644B2 (enExample)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5340467B2 (enExample) * 1973-08-31 1978-10-27
JP2005249487A (ja) * 2004-03-02 2005-09-15 Seiko Epson Corp 表面形状測定方法及び眼鏡レンズの特性測定方法
US8976250B2 (en) * 2012-05-01 2015-03-10 Apple Inc. Lens inspection system
PL3037800T3 (pl) * 2014-12-24 2018-11-30 Trioptics Gmbh Pomiar pozycji środków krzywizny powierzchni optycznych jedno- lub wielosoczewkowego układu optycznego
DE102015108839A1 (de) * 2015-06-03 2016-12-08 Rodenstock Gmbh Verfahren zum Bestimmen von Oberflächendaten und/oder Messdaten einer Oberfläche eines zumindest teilweise transparenten Objekts

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