JP2020041929A - Automatic analyzer - Google Patents

Abstract

To sensitively detect such abnormalities of a reaction chamber as scratches or dirt on the reaction chamber or air bubbles in a reaction solution.SOLUTION: A trigger signal is generated when the optical axis extending from a light source to a photometer is passing through the liquid in a reaction chamber, the voltage equal to the output voltage of the photometer 41 at the timing T1 for the trigger signal is generated as a reference voltage Vr, and whether there are abnormalities in the reaction container is determined on the basis of an amplified waveform 204 formed by amplifying the difference between the output voltage of the photometer and the reference voltage Vr.SELECTED DRAWING: Figure 4

Description

  The present invention relates to an automatic analyzer that performs qualitative / quantitative analysis of biological samples such as blood and urine, and particularly to an automatic analyzer that detects minute scratches and dirt on a reaction vessel, and bubbles in a solution in the reaction vessel. Related to the device.

  The automatic analyzer irradiates a reaction solution obtained by reacting a biological sample such as blood or urine with a reagent with light, and calculates the concentration or presence or absence of a target component based on data obtained by measuring transmitted light or scattered light. Things. The reaction vessels containing the reaction solution are continuously arranged on the circumference of the rotatable reaction disk, and the measurement is performed while moving the optical axis of the light to be detected with the rotation of the reaction disk. .

  In recent years, automatic analyzers have been required to provide more accurate and reliable analysis results. Here, if the reaction vessel used for the analysis contains minute scratches or dirt, it may cause a variation in the analysis result. It is important to calculate the measurement data.

  Patent Literature 1 discloses a technique for performing photometry of transmitted light over an entire section from one end to the other end of a reaction vessel containing a reaction solution, and detecting a foreign substance based on a decrease in luminous intensity in obtained photometric data. It has been disclosed.

  Patent Literature 2 discloses an analytical method in which a cuvette is arranged on a cuvette wheel, the cuvette wheel is rotated, and the absorbance of a reaction solution in the cuvette rotating with the cuvette wheel is measured. After measuring and continuously acquiring and storing the photometric waveforms during this period, the degree of matching is calculated using two photometric waveforms of the photometric data of the comparison source and the photometry data of the comparison object at the same cuvette and wavelength. In addition, a technique for determining an error based on the obtained matching degree is disclosed.

JP 2007-198739 A JP 2009-281941 A

  In the technique described in Patent Document 1, when a foreign substance or the like is present on the optical axis in the reaction solution during scanning, utilizing the fact that the luminous intensity of the transmitted light decreases, this is detected by waveform analysis of luminous intensity transition. ing. In order to perform a waveform analysis of the light intensity transition, a memory for recording data during scanning is required. In particular, in order to detect minute scratches and dirt, it is necessary to increase the capacity in accordance with time resolution and to process recorded data at high speed.

  In the technique described in Patent Document 2, the degree of matching is calculated based on two photometric waveforms, that is, photometric data of a comparison source and photometric data of a comparison target. Also in this case, if the flaw is minute, the change in the waveform due to this is expected to be small, and the abnormality may not be detected.

  An automatic analyzer according to an embodiment of the present invention includes a plurality of reaction vessels including a first reaction vessel, a reaction disk that rotates intermittently, a light source, and a photometer disposed to face the light source, A sample dispensing mechanism for discharging blank water or a sample into the reaction vessel, an abnormality detection circuit for detecting an abnormality in the reaction vessel, and a computer, wherein the first reaction vessel is driven by a light source and a photometer by rotating the reaction disk. A trigger signal generating circuit that generates a trigger signal at a timing when the optical axis from the light source to the photometer passes through the liquid contained in the first reaction container. A reference voltage generation circuit that generates a voltage equal to the output voltage of the photometer at a timing according to the trigger signal as a reference voltage, and a differential amplification circuit that amplifies a difference between the output voltage of the photometer and the reference voltage. Has the door, the computer, based on the output of the differential amplifier circuit of the abnormality detection circuit determines the presence or absence of abnormality in the first reaction vessel.

  Since abnormalities in the reaction vessel such as scratches and dirt on the reaction vessel or bubbles in the reaction solution can be detected with high accuracy, highly accurate and highly reliable analysis results can be obtained.

  Other problems and novel features will be apparent from the description of this specification and the accompanying drawings.

It is a figure showing the basic composition of an automatic analyzer. It is a figure which shows the relationship between a reaction container and a photometric waveform. It is a figure which shows the positional relationship of a detector, a reaction cell, and a detection plate. It is a figure which shows the relationship between the reaction container which has a minute flaw or dirt, and a photometric waveform. FIG. 3 is a block diagram (first configuration example) of an abnormality detection circuit. It is a block diagram (2nd structural example) of an abnormality detection circuit. FIG. 10 is a block diagram (third configuration example) of an abnormality detection circuit. It is a flowchart which performs abnormality determination of a reaction container. It is a flowchart which performs abnormality determination of a reaction container and bubble detection.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In all of the drawings for describing the present embodiment, components having the same function will be denoted by the same reference symbol in principle, and repeated description will be omitted.

  FIG. 1 is a diagram showing a basic configuration of a turntable type automatic analyzer according to an embodiment of the present invention. The analyzer 1 mainly includes a reaction disk 10, a sample disk 20, a first reagent disk 30a, a second reagent disk 30b, a light source 40, a photometer 41, and a computer 50.

  The reaction disk 10 is provided so as to be intermittently rotatable, and a number of reaction vessels 11 made of a translucent material are held on the disk along the circumferential direction. The reaction vessel 11 is maintained at a predetermined temperature (for example, 37 ° C.) by a thermostat 12. The temperature of the fluid in the thermostat 12 is adjusted by a thermostat 13.

  On the sample disk 20, a number of sample containers 21 for storing biological samples such as blood and urine are mounted in the illustrated example in a double manner along the circumferential direction. A sample dispensing mechanism 22 is arranged near the sample disk 20. The sample dispensing mechanism 22 mainly includes a movable arm 23 and a pipette nozzle 24 attached thereto. With this configuration, at the time of sample dispensing, the pipette nozzle 24 is appropriately moved to the dispensing position by the movable arm 23 when the sample is dispensed, and the sample dispensing mechanism 22 transfers a predetermined amount of sample from the sample container 21 located at the suction position of the sample disk 20. After inhaling, the sample is discharged into the reaction vessel 11 at the discharge position on the reaction disk 10.

  The first reagent disk 30a and the second reagent disk 30b are disposed inside the first reagent cool box 31a and the second reagent cool box 31b, respectively. In the first reagent cool box 31a and the second reagent cool box 31b, a plurality of first reagent bottles 32a and second reagent bottles 32b each having a label indicating reagent identification information such as a barcode are attached to the first reagent cool box 31b. The reagent disk 30a and the second reagent disk 30b are placed along the circumferential direction. The first reagent bottle 32a and the second reagent bottle 32b contain a reagent solution corresponding to an analysis item that can be analyzed by the analyzer 1. The first reagent cool box 31a and the second reagent cool box 31b are provided with a first barcode reading device 33a and a second barcode reading device 33b, respectively. 32a, the barcode displayed on the outer wall of the second reagent bottle 32b is read. The read reagent information is registered in the memory 56 together with the positions on the first reagent disk 30a and the second reagent disk 30b.

  Further, near the first reagent disk 30a and the second reagent disk 30b, a first reagent dispensing mechanism 34a and a second reagent dispensing mechanism 34b, which are substantially the same as the sample dispensing mechanism 22, are disposed, respectively. I have. At the time of dispensing reagents, the pipette nozzles provided therein aspirate the reagent from the first reagent bottle 32a and the second reagent bottle 32b corresponding to the test item positioned at the reagent receiving position on the reaction disk 10, and the corresponding reaction vessel 11 Discharge into the inside.

  At positions surrounded by the reaction disk 10, the first reagent disk 30a, the second reagent disk 30b, the first reagent dispensing mechanism 34a, and the second reagent dispensing mechanism 34b, a first stirring mechanism 35a and a second stirring mechanism 35b are provided. Are located. The reaction solution of the sample and the reagent accommodated in the reaction vessel 11 is stirred by the first stirring mechanism 35a and the second stirring mechanism 35b to promote the reaction.

  The light source 40 is disposed near the center of the reaction disk 10, and the photometer 41 is disposed on the outer peripheral side of the reaction disk 10. The reaction vessel 11 after stirring is positioned at a photometric position sandwiched between the light source 40 and the photometer 41. Rotate to pass. The light source 40 and the photometer 41 constitute a light detection system. The photometer 41 is provided with a plurality of detectors and has a function of detecting both transmitted light and scattered light. The reaction liquid of the sample and the reagent in each reaction vessel 11 is measured every time it crosses the front of the photometer 41 during the rotation operation of the reaction disk 10. The analog signal of the scattered light measured for each sample is input to an A / D (analog / digital) converter 54 and an abnormality detection circuit 60. The abnormality detection circuit 60 is a circuit for detecting minute scratches and dirt on the reaction vessel 11 or fine bubbles in the reaction solution contained in the reaction vessel 11, and details thereof will be described later.

  The inside of the used reaction vessel 11 is cleaned by a reaction vessel cleaning mechanism 36 arranged near the reaction disk 10 so that it can be used repeatedly.

  Next, a control system and a signal processing system in the analyzer 1 will be briefly described. The computer 50 is connected to a sample dispensing control unit 52, a reagent dispensing control unit 53, an A / D converter 54, and an abnormality detection circuit 60 via an interface 51. The computer 50 sends a command to the sample dispensing control unit 52 to control the sample dispensing operation. Further, the computer 50 sends a command to the reagent dispensing control unit 53 to control the dispensing operation of the reagent. The photometric value converted into a digital signal by the A / D converter 54 is taken into the computer 50.

  The interface 51 is connected to a printer 55 for printing, a memory 56 as a storage device, an external output medium 57, a keyboard 58 for inputting operation commands and the like, and a display device 59 for displaying a screen. As the display device 59, a CRT display, a liquid crystal display, or the like can be employed. The memory 56 is composed of, for example, a hard disk memory or an external memory. The memory 56 stores information such as the password of each operator, the display level of each screen, analysis parameters, analysis item request contents, calibration results, and analysis results.

  Next, the analysis operation of the sample in the analyzer 1 will be described. Analysis parameters relating to items that can be analyzed by the analyzer 1 are input in advance via an information input device such as the keyboard 58 and stored in the memory 56. The operator selects an inspection item requested for each sample using the operation function screen.

  At this time, information such as a patient ID is also input from the keyboard 58. In order to analyze the test item designated for each sample, the pipette nozzle 24 of the sample dispensing mechanism 22 dispenses a predetermined amount of sample from the sample container 21 to the reaction container 11 according to the analysis parameters.

  The reaction container 11 into which the sample has been dispensed is transferred by rotation of the reaction disk 10 and stops at the reagent receiving position. The pipette nozzles of the first reagent dispensing mechanism 34a and the second reagent dispensing mechanism 34b dispense a predetermined amount of the reagent solution into the reaction container 11 according to the analysis parameters of the corresponding test item. Contrary to this example, the dispensing order of the sample and the reagent may be such that the reagent precedes the sample.

  Thereafter, the sample and the reagent are stirred and mixed by the first stirring mechanism 35a and the second stirring mechanism 35b. When the reaction container 11 crosses the photometric position, the transmitted light and the scattered light of the reaction solution are measured by the photometer 41. The measured transmitted light and scattered light are converted into numerical values proportional to the light amount by the A / D converter 54, and are taken into the computer 50 via the interface 51.

  Using this converted numerical value, concentration data is calculated based on a calibration curve measured in advance by an analysis method designated for each test item. The component concentration data as the analysis result of each inspection item is output to the screen of the printer 55 or the display device 59.

  Before the above-described measurement operation is performed, the operator sets various parameters necessary for the analysis and measurement and registers the sample via the operation screen of the display device 59. The operator confirms the analysis result after the measurement on the operation screen on the display device 59.

  FIG. 2 is a diagram illustrating a photometric waveform when the scattered light of the reaction vessel 11 containing the blank water is measured in the analyzer 1. Here, the photometric waveform refers to a time change of information (for example, a voltage, a current, a count value, etc.) regarding the intensity of light detected when photometry is performed for one wavelength. The light detection system of the analyzer 1 is a device that measures transmitted light and scattered light, and can be applied to both transmitted light and scattered light. Here, an example in which scattered light is measured will be described. FIG. 2 also shows a photometric waveform 104 and a front view 100 of the reaction vessel 11 corresponding to the photometric waveform 104.

  The reaction vessel 11 contains blank water 102. Since the reaction vessel 11 is arranged on the circumference of the reaction disk 10 and is measured while rotating, the intensity measurement of the scattered light by the reaction vessel 11 and the blank water 102 is performed by measuring the intensity of the optical axis from the light source 40 to the photometer 41. This is performed so as to cross the reaction vessel 11 along the scanning direction 103. An example of the result of the intensity measurement of the scattered light at this time is a photometric waveform 104. The vertical axis of the photometric waveform 104 is a voltage value correlated with the intensity of the scattered light, and the horizontal axis is time. Here, the vertical axis may use a current or a count digital value other than the voltage. The photometric waveform 104 obtained by measuring the scattered light of the reaction vessel 11 containing the blank water includes a photometric waveform 108 where the reaction vessel 11 is not provided, a photometric waveform 107 of the wall 101 of the reaction vessel 11, and a photometry where blank water is present. Includes waveform 106.

  In the first embodiment, in order to accurately measure the intensity of scattered light from the blank water contained in the reaction vessel 11 or the sample to be measured, the voltage value at one point of the photometric waveform 106 where the blank water exists is referred to as the reference voltage. Vr. As one method of setting the reference voltage Vr, a trigger signal synchronized with the rotating reaction vessel 11 can be generated, and the voltage value at the trigger signal generation timing T1 can be used as the reference voltage Vr. FIG. 3 is a diagram for explaining the positional relationship among the detector 61 that generates the trigger signal, the detection plate 70, and the reaction container 11. The bird's-eye view is shown in the upper part of FIG. 3, and the plan view seen from the arrow direction (from the bottom) shown in the bird's-eye view is shown in the lower part. The detection plate 70 is provided at a position corresponding to the reaction container 11 arranged along the circumferential direction of the reaction disk 10, and changes the relative positional relationship between the detection plate 70 and the reaction container 11 by rotation of the reaction disk 10. Without moving, it moves in the circumferential direction of the reaction disk 10. The detector 61 is fixed at a predetermined position, and includes, for example, a light source 62 and a light receiving unit 63 that are arranged to face each other. The detector 61 detects that the detection plate 70 has passed between the light source 62 and the light receiving unit 63, and generates a trigger signal based on the detection signal.

  In the present embodiment, the timing for measuring the scattered light of the reaction vessel 11 is determined by the trigger signal. That is, the scattered light intensity of the reaction vessel 11 is measured in a predetermined photometric period 105 from the timing T1 at which the trigger signal is generated. In addition, the voltage of the photometric waveform at the timing T1 when the trigger signal is generated is set as the reference voltage Vr. FIG. 4 also shows a front view 100 ′ of the reaction vessel 11 to which the scratches and dirt 201 have adhered, and a photometric waveform 202 when scattered light is measured. The photometric waveform 203 is a waveform obtained when the scratches and dirt 201 of the reaction container 11 are measured. Since the voltage value of the photometric waveform in the photometric waveform 108 where the reaction vessel 11 is not provided and the photometric waveform 107 of the wall portion 101 of the reaction vessel 11 fluctuate greatly, the gain cannot be increased to detect the photometric waveform 203. For this reason, when the surface of the reaction vessel has minute scratches and dirt, if the amount of change in the photometric period 105 is obtained, it cannot be distinguished from noise or the like in the signal, and the minute scratches or dirt on the reaction vessel 11 cannot be distinguished. May not be found. Therefore, in the abnormality detection circuit 60 of the present embodiment, the voltage of the photometric waveform at the timing T1 when the trigger signal is generated is set as the reference voltage Vr, and an amplified waveform 204 obtained by amplifying the difference from the reference voltage Vr is obtained. This makes it possible to accurately detect even minute scratches and dirt.

  FIG. 5 shows a block diagram (first configuration example) of the abnormality detection circuit 60. The figure also shows the blocks related to the abnormality detection circuit 60. The abnormality detection circuit 60 includes a trigger signal generation circuit 301, a reference voltage generation circuit 302, a differential amplifier circuit 303, and an A / D converter 304. As described with reference to FIG. 3, the trigger signal generation circuit 301 is a circuit that generates a trigger signal that determines the timing of starting photometry from a detection signal indicating that the detector 61 has detected the detection plate 70. The reference voltage generation circuit 302 measures the measurement value of the photometer 41 (here, it is assumed that the voltage value Vd relating to the light intensity is output) at the timing of the trigger signal, and performs the measurement at that time. A voltage equal to the value is generated as a reference voltage Vr. The differential amplifier circuit 303 amplifies the difference between the voltage value Vd output from the photometer 41 and the reference voltage Vr. The A / D converter 304 converts the output of the differential amplifier circuit 303 into a digital value, and the difference value (Vd-Vr) is input to the computer 50 via the interface 51. The presence or absence of scratches and dirt is determined.

  In this configuration, the measurement value (voltage value Vd) of the photometer 41 is also input to the A / D converter 54 in parallel with the abnormality detection circuit 60. Therefore, even when the sample to be measured is placed in the reaction vessel 11 and the sample is analyzed, the abnormality detection of the reaction vessel 11 using the abnormality detection circuit 60 can be performed in parallel. With this configuration, it is possible to detect not only the scratches and dirt on the reaction container 11 but also the bubbles generated in the sample to be measured. Not only scratches and dirt on the reaction vessel 11 but also bubbles may be generated during dispensing of a sample or a reagent in actual analysis, and such bubbles adversely affect the analysis accuracy. As described above, the first configuration example has an advantage that minute scratches, dirt, and fine bubbles of the reaction container can be accurately detected even during actual analysis.

  FIG. 6 shows a block diagram (second configuration example) of the abnormality detection circuit 60a. The A / D converter is not provided in the abnormality detection circuit 60a, and the circuit configuration is simplified. The abnormality detection circuit 60a has a multiplexer 305, and the multiplexer 305 selectively inputs the output of the photometer 41 and the output of the differential amplifier circuit 303 to the A / D converter 54. Which output the multiplexer 305 selects is controlled by the computer 50. The analyzer 1 performs the measurement a plurality of times in a state where the reaction vessel 11 is filled with blank water, in order to inspect whether there is any abnormality in the light detection system. Therefore, one of them is used for detecting scratches and dirt on the reaction vessel 11, and the computer 50 inputs the output of the differential amplifier circuit 303 to the A / D converter 54 each time, and the computer 50 Based on this difference value (Vd-Vr), the presence or absence of a flaw or dirt is determined. At other times, the output of the photometer 41 is input to the A / D converter 54, and the computer 50 performs photometry of the blank water.

  FIG. 7 shows a block diagram (third configuration example) of the abnormality detection circuit 60b. The abnormality detection circuit 60b can generate a trigger signal without the detector 61 for generating the trigger signal. As shown in FIG. 2, the photometric waveform 107 shows a large fluctuation on the wall of the reaction vessel 11. Then, the computer 50 detects a steep change occurring near the wall of the reaction vessel 11 from the output of the photometer Vd input from the A / D converter 54, and the trigger signal generation circuit 306 detects, for example, a change after the change is detected. A trigger signal is generated at a timing when a predetermined time has elapsed. Thus, even when the detector 61 is not provided, it is possible to perform the same processing as the abnormality detection circuit 60 shown in FIG. The trigger signal generation circuit 301 of the abnormality detection circuit 60a shown in FIG. 6 is replaced with the trigger signal generation circuit 306 of the third configuration example (FIG. 7), so that the detector 61 is not provided. Also, it is possible to perform the same processing as the abnormality detection circuit 60a shown in FIG.

  A method for detecting scratches and dirt on the reaction container 11 will be described with reference to a flowchart shown in FIG. The abnormality detection circuit may have any of the configurations described above.

  First, a trigger signal is generated by the trigger signal generation circuit 301 (306), and the reference voltage generation circuit 302 sets the output voltage Vd of the photometer 41 at this timing as the reference voltage Vr (step S501). The differential amplifier circuit 303 outputs an amplified waveform of the output voltage Vd of the photometer 41 and the reference voltage Vr (step S502), is digitized by the A / D converter 304 (54), and is output to the computer 50 via the interface 51. (Step S504). The computer 50 compares the amplified difference value with the threshold value (step S504). If the amplified difference value is larger than the threshold value, the computer 50 determines that the reaction vessel 11 is abnormal (step S506) and displays an alarm on the device (step S506). Step S507). On the other hand, when the difference value is smaller than the threshold value, each time the output voltage Vd of the photometer 41 is updated (the output voltage Vd is updated at a predetermined sampling interval), the determination based on the difference value with the reference voltage Vr is performed. Is performed, and the process ends if the time is outside the photometric period 105 (step S505). Here, the threshold value is a predetermined value. Thus, by determining the reference voltage in one photometric waveform and performing the abnormality determination, it is possible to accurately detect minute scratches and dirt on the reaction vessel without having comparison data in advance.

  A method for detecting bubbles while distinguishing the reaction container 11 from scratches and dirt will be described with reference to FIG. When it is determined that the cause of the abnormality is air bubbles, it is not necessary to replace the reaction container, and it is possible to cope by performing the measurement again. As the abnormality detection circuit, the abnormality detection circuit 60 or 60b is applied. Steps S501 to S505 are the same as those in the flowchart shown in FIG. 8, and a duplicate description will be omitted. If the amplified difference value is larger than the threshold value, it is determined whether or not the amplified difference value changes by a plurality of photometry performed every time the output voltage Vd of the photometer 41 is updated (step S601). If the variation width of the amplified difference value is greater than or equal to a predetermined value, it is considered to be the effect of bubbles, so an alarm is output to the apparatus to prompt re-measurement (step S602). On the other hand, if the variation width of the amplified difference value is smaller than a predetermined value, the influence of both bubbles and abnormalities inherent to the reaction vessel such as scratches and dirt can be considered. Alternatively, re-measurement is prompted (step S603).

  As described above, the invention made by the inventor has been specifically described based on the embodiment. However, the invention is not limited to the embodiment and can be variously modified without departing from the gist thereof. For example, although it has been described that the abnormality is detected by comparing the output of the differential amplifier circuit 303 with the threshold value, it is also possible to compare the moving average value of the differential amplifier circuit 303 with the threshold value in consideration of the influence of noise. Good.

  Although the example of measuring the scattered light has been described, a waveform measured with either the scattered light or the transmitted light may be used. However, sensitivity to scratches and the like is higher when scattered light is used. This is because scattered light increases due to the presence of the scratch. Further, the light detection system may be a system that measures light of a single wavelength or a system that measures light of two wavelengths. In the case of a two-wavelength photometry system, the determination may be made for each wavelength. In the case of a two-wavelength photometry system, photometry is performed at two wavelengths, and the difference between the two wavelengths is obtained. In the measurement, the influence of the scratches, dirt, or air bubbles on the reaction vessel 11 directly appears in the measured value. For this reason, particularly in a single wavelength photometry system, it is effective to perform abnormality detection using a waveform measured using scattered light.

  Further, the present invention can be used not only for an automatic analyzer but also for a quality check of a reaction container by applying to an inspection device at the time of manufacturing the reaction container.

1: analyzer, 10: reaction disk, 11: reaction container, 12: constant temperature bath, 13: constant temperature maintaining device, 20: sample disk, 21: sample container, 22: sample dispensing mechanism, 23: movable arm, 24: Pipette nozzle, 30a: 1st reagent disk, 30b: 2nd reagent disk, 31a: 1st reagent cool box, 31b: 2nd reagent cool box, 32a: 1st reagent bottle, 32b: 2nd reagent bottle, 33a: 3rd 1 barcode reader, 33b: second barcode reader, 34a: first reagent dispensing mechanism, 34b: second reagent dispensing mechanism, 35a: first stirring mechanism, 35b: second stirring mechanism, 36: reaction Container washing mechanism, 40: light source, 41: photometer, 50: computer, 51: interface, 52: sample dispensing control unit, 53: reagent dispensing control unit, 54: A / D converter, 5: printer, 56: memory, 57: external output medium, 58: keyboard, 59: display device, 60, 60a, 60b: abnormality detection circuit, 61: detector, 62: light source, 63: light receiving section, 70: detection Plates, 100, 100 ': front view of reaction vessel, 101: wall of reaction vessel, 102: blank water, 103: scanning direction of optical axis, 104: photometric waveform, 105: photometric period, 106-108: photometric waveform , 201: scratch and dirt, 202, 203: photometric waveform, 204: amplified waveform, 301, 306: trigger signal generating circuit, 302: reference voltage generating circuit, 303: differential amplifier circuit, 304: A / D converter, 305: Multiplexer.

Claims (9)

A plurality of reaction vessels including a first reaction vessel held therein, and an intermittently rotating reaction disc;
Light source,
A photometer arranged opposite to the light source,
A sample dispensing mechanism that discharges blank water or a sample into the reaction vessel,
An abnormality detection circuit for detecting an abnormality of the reaction vessel,
Having a computer,
The first reaction container moves across the space between the light source and the photometer by the rotation of the reaction disk,
The abnormality detection circuit includes a trigger signal generation circuit that generates a trigger signal at a timing when an optical axis from the light source toward the photometer passes through a liquid stored in the first reaction container, and the trigger signal includes: A reference voltage generation circuit that generates a voltage equal to the output voltage of the photometer at a corresponding timing as a reference voltage, and a differential amplifier circuit that amplifies a difference between the output voltage of the photometer and the reference voltage. ,
An automatic analyzer that determines whether there is an abnormality in the first reaction container based on an output of the differential amplifier circuit of the abnormality detection circuit. In claim 1,
A first A / D converter for converting an output voltage of the photometer into a digital value,
The abnormality detection circuit has a second A / D converter that converts an output voltage of the differential amplifier circuit into a digital value,
The computer includes an output voltage of the photometer digitized by the first A / D converter and an output voltage of the differential amplifier circuit digitized by the second A / D converter. Automatic analyzer input. In claim 1,
Having an A / D converter,
The abnormality detection circuit includes a multiplexer that selectively inputs the output voltage of the photometer or the output voltage of the differential amplifier circuit to the A / D converter,
The computer has an output voltage of the photometer digitized by the A / D converter or an output of the differential amplifier circuit digitized by the A / D converter according to the selection of the multiplexer. Automatic analyzer to which voltage is input. In claim 1,
The reaction disk is provided corresponding to the plurality of reaction vessels, a plurality of detection plates that move without changing the positional relationship with the plurality of reaction containers by rotating the reaction disk, the plurality of detection plates And a detector that outputs a detection signal by detecting the passage of
The automatic analyzer in which the trigger signal generation circuit of the abnormality detection circuit generates the trigger signal based on the detection signal of the detector. In claim 1,
An A / D converter for converting an output voltage of the photometer into a digital value;
An output voltage of the photometer digitized by the A / D converter is input to the computer, and the computer detects a predetermined change in the output voltage of the photometer,
The automatic analyzer, wherein the trigger signal generation circuit of the abnormality detection circuit generates the trigger signal based on a predetermined change detected by the computer. In claim 5,
An automatic analyzer for detecting a change in an output voltage of the photometer indicating a wall portion of the first reaction container. In claim 1,
An automatic analyzer that defines a predetermined period based on the trigger signal as a photometric period. In claim 7,
The differential amplifier circuit of the abnormality detection circuit, a plurality of times during the photometric period, amplifies the difference between the output voltage of the photometer and the reference voltage,
When the fluctuation width of the output of the differential amplifier circuit is large a plurality of times, the computer generates an abnormality in the first reaction vessel due to bubbles of the liquid stored in the first reaction vessel. Automatic analyzer that determines that In claim 1,
An automatic analyzer that outputs an alarm when the computer determines an abnormality in the first reaction vessel.

Images