JP2020002400A5 - - Google Patents
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- JP2020002400A5 JP2020002400A5 JP2018121004A JP2018121004A JP2020002400A5 JP 2020002400 A5 JP2020002400 A5 JP 2020002400A5 JP 2018121004 A JP2018121004 A JP 2018121004A JP 2018121004 A JP2018121004 A JP 2018121004A JP 2020002400 A5 JP2020002400 A5 JP 2020002400A5
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- Prior art keywords
- film
- nitride
- ions
- forming material
- ion irradiation
- Prior art date
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- -1 nitride ion Chemical class 0.000 claims description 32
- 239000007789 gas Substances 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 15
- 150000002500 ions Chemical class 0.000 claims description 13
- 210000002381 Plasma Anatomy 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- 229910017083 AlN Inorganic materials 0.000 claims description 9
- PIGFYZPCRLYGLF-UHFFFAOYSA-N aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 9
- TWXTWZIUMCFMSG-UHFFFAOYSA-N nitride(3-) Chemical compound [N-3] TWXTWZIUMCFMSG-UHFFFAOYSA-N 0.000 claims description 7
- 229910052757 nitrogen Inorganic materials 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 6
- 230000001678 irradiating Effects 0.000 claims 3
- 229910001873 dinitrogen Inorganic materials 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 238000005755 formation reaction Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
Description
続いて、窒化物イオン照射部24の構成について詳細に説明する。窒化物イオン照射部24は、プラズマガン7と、窒化物ガス供給部40と、制御部50と、回路部34とを有している。なお、制御部50及び回路部34に含まれる一部の機能は、前述の成膜部14にも属する。窒化物イオン照射部24は、窒化物イオンを生成する。また、窒化物イオン照射部24は、生成した窒化物イオンをAlN基板150に照射する(図4参照)。窒化物イオン照射部24は、窒化物イオンとして、負イオンを生成する。窒化物イオンとして、水素の窒化物イオン(NH2 −)が挙げられる。なお、窒化物イオン照射部24は、例えば、N+、N2 +などの窒素の陽イオンを生成してもよい。 Subsequently, the configuration of the nitride ion irradiation unit 24 will be described in detail. The nitride ion irradiation unit 24 includes a plasma gun 7, a nitride gas supply unit 40, a control unit 50, and a circuit unit 34. Some functions included in the control unit 50 and the circuit unit 34 also belong to the film forming unit 14 described above. The nitride ion irradiation unit 24 generates nitride ions. Further, the nitride ion irradiation unit 24 irradiates the AlN substrate 150 with the generated nitride ions (see FIG. 4). The nitride ion irradiation unit 24 generates negative ions as nitride ions. As a nitride ion, a nitride ion hydrogen (NH 2 -) and the like. Incidentally, nitride ion irradiation unit 24 is, for example, N +, and may generate a cationic nitrogen such as N 2 +.
例えば、成膜材料としてAlを採用する場合、窒化物ガス供給部40は、成膜処理モード時にN2ガスを供給する。これにより、N2をプラズマPと反応させてN+またはN 2 +とし、昇華したAlとN+またはN 2 +によって、AlN膜を形成する。そして、窒化物ガス供給部40は、窒化物イオン照射モード時には、N2ガス(正イオンを作る場合)、またはNH3ガス若しくはNH2ガス(負イオンを作る場合)を供給する。このような場合、窒化物ガス供給部40は、供給するガスの種類に応じた複数のガス貯留部と接続され、使用するガスに応じてガス貯留部からガスを引き出してよい。
For example, when Al is used as the film forming material, the nitride gas supply unit 40 supplies N 2 gas in the film forming processing mode. Thus, by reacting N 2 plasma P N + or N 2 + and then sublimated by Al and N + or N 2 + it was to form the AlN film. Then, the nitride gas supply unit 40 supplies N 2 gas (when producing positive ions), or NH 3 gas or NH 2 gas (when producing negative ions) in the nitride ion irradiation mode. In such a case, the nitride gas supply unit 40 may be connected to a plurality of gas storage units according to the type of gas to be supplied, and gas may be drawn out from the gas storage unit according to the gas to be used.
Claims (7)
窒化物イオンを生成して、前記AlN基板に窒化物イオンを照射する窒化物イオン照射部を備える、イオン照射装置。 An ion irradiation device that irradiates an AlN substrate with ions.
An ion irradiation device including a nitride ion irradiation unit that generates nitride ions and irradiates the AlN substrate with nitride ions.
窒化物イオンを生成して、前記AlN基板に窒化物イオンを照射する工程を備える、イオン照射方法。 It is an ion irradiation method of irradiating an AlN substrate with ions.
An ion irradiation method comprising a step of generating nitride ions and irradiating the AlN substrate with the nitride ions.
前記成膜対象物を収容し成膜を行うチャンバーと、
前記チャンバー内でプラズマを生成するプラズマガンと、
前記チャンバー内でAl又はAlNを含む前記成膜材料を保持する成膜材料保持部と、
窒化物ガス及び窒素ガスのうち少なくとも一方を前記チャンバー内へ供給するガス供給部と、
前記成膜装置を制御する制御部と、を備え、
前記制御部は、
前記プラズマガンで生成したプラズマを前記成膜材料又は前記成膜材料保持部へ照射し、前記成膜対象物に前記成膜材料の膜を形成し、
前記プラズマガンで前記プラズマを生成すると共に、前記ガス供給部から前記窒化物ガス及び前記窒素ガスのうち少なくとも一方を前記チャンバー内へ供給することで窒化物イオン及び窒素イオンのうち少なくとも一方を生成し、前記成膜材料の膜に前記窒化物イオン及び前記窒素イオンのうち少なくとも一方を照射する、成膜装置。 A film forming apparatus that forms a film of a film forming material on a film forming object.
A chamber for accommodating the film-forming object and performing film-forming,
A plasma gun that generates plasma in the chamber and
A film-forming material holding portion that holds the film-forming material containing Al or AlN in the chamber, and a film-forming material holding portion.
And Ruga scan supply unit to supply at least one to the chamber of the nitride gas and nitrogen gas,
A control unit for controlling the film forming apparatus is provided.
The control unit
The plasma generated by the plasma gun is applied to the film forming material or the film forming material holding portion to form a film of the film forming material on the film forming object.
And it generates the plasma in the plasma gun, at least one of nitride ions and nitrogen ions at least one by supplying into the chamber of the front Kiga scan feed the nitride from part gas and the nitrogen gas A film forming apparatus that is generated and irradiates a film of the film forming material with at least one of the nitride ion and the nitrogen ion.
チャンバー内にプラズマガンで生成したプラズマをAl又はAlNを含む前記成膜材料又は当該成膜材料を保持する成膜材料保持部へ照射し、前記成膜対象物に前記成膜材料の膜を形成する工程と、
前記プラズマガンで前記プラズマを生成すると共に、ガス供給部から窒化物ガス及び窒素ガスのうち少なくとも一方を前記チャンバー内へ供給することで窒化物イオン及び窒素イオンの少なくとも一方を生成し、前記成膜材料の膜に前記窒化物イオン及び窒素イオンの少なくとも一方を照射する工程と、を備える、成膜方法。 This is a film forming method for forming a film of a film forming material on a film forming object.
The plasma generated by the plasma gun is irradiated into the chamber to the film-forming material containing Al or AlN or the film-forming material holding portion that holds the film-forming material to form a film of the film-forming material on the film-forming object. And the process to do
And generates the plasma in the plasma gun to generate at least one of nitride ions and nitrogen ions by supplying at least one of nitride and nitrogen gases from the gas supply unit into the chamber, the formation A film forming method comprising a step of irradiating a film of a film material with at least one of the nitride ion and the nitrogen ion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018121004A JP7120540B2 (en) | 2018-06-26 | 2018-06-26 | Ion irradiation apparatus, ion irradiation method, film formation apparatus, and film formation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018121004A JP7120540B2 (en) | 2018-06-26 | 2018-06-26 | Ion irradiation apparatus, ion irradiation method, film formation apparatus, and film formation method |
Publications (3)
Publication Number | Publication Date |
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JP2020002400A JP2020002400A (en) | 2020-01-09 |
JP2020002400A5 true JP2020002400A5 (en) | 2021-06-17 |
JP7120540B2 JP7120540B2 (en) | 2022-08-17 |
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Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH0784640B2 (en) * | 1987-12-11 | 1995-09-13 | 理化学研究所 | Method for producing crystalline aluminum nitride |
JPH07221018A (en) * | 1994-01-31 | 1995-08-18 | Sanyo Electric Co Ltd | Method for forming nitric compound semiconductor |
JP3865513B2 (en) * | 1998-09-15 | 2007-01-10 | 独立行政法人科学技術振興機構 | Method of forming nitride or nitride surface by nitrogen compound gas cluster ion beam |
JP6584982B2 (en) * | 2015-07-21 | 2019-10-02 | 住友重機械工業株式会社 | Deposition equipment |
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2018
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