JP2019220676A - Wiring fixing structure and processing device - Google Patents

Wiring fixing structure and processing device Download PDF

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Publication number
JP2019220676A
JP2019220676A JP2019030943A JP2019030943A JP2019220676A JP 2019220676 A JP2019220676 A JP 2019220676A JP 2019030943 A JP2019030943 A JP 2019030943A JP 2019030943 A JP2019030943 A JP 2019030943A JP 2019220676 A JP2019220676 A JP 2019220676A
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Prior art keywords
wiring
fixing structure
insulating member
holding portions
holding
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JP2019030943A
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JP7233245B2 (en
Inventor
阿部 純一
Junichi Abe
純一 阿部
中尾 博人
Hiroto Nakao
博人 中尾
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to TW108119496A priority Critical patent/TWI816808B/en
Priority to KR1020190071278A priority patent/KR102156500B1/en
Priority to CN201910530316.4A priority patent/CN110620063B/en
Publication of JP2019220676A publication Critical patent/JP2019220676A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/32119Windows

Abstract

To provide a technique enabling wiring to be arranged on a metal member or a dielectric member with a narrow pitch and fixing the arranged wiring onto the member.SOLUTION: Wiring fixing structure in accordance with an embodiment of the present disclosure comprises: a metal member having a metal surface; wiring in which a plurality of conductive boards having a through-hole penetrating the board to a plate-thickness direction is arranged in parallel at a prescribed interval; a first insulating member that includes, a plurality of first holding parts in which a convex part fittable to the through-hole is formed, a first connection part connecting the plurality of first holding parts at the prescribed interval, and a leg part formed extending in parallel to the first holding part from the first connection part, and fixed to the metal surface; and a second insulating member having a plurality of second holding parts holding the conductive board while being nipped in cooperation with the plurality of first holding parts, and a second connection part connecting the plurality of second holding parts to each other at the prescribed interval. The wiring is held by the first and second insulating members while separated from the metal surface.SELECTED DRAWING: Figure 1

Description

本開示は、配線固定構造及び処理装置に関する。   The present disclosure relates to a wiring fixing structure and a processing device.

従来、金属部材の上に絶縁部材を介して配線が存在する構造が知られている(例えば、特許文献1参照)。   2. Description of the Related Art Conventionally, a structure in which a wiring is present on a metal member via an insulating member is known (for example, see Patent Document 1).

特開2011−029584号公報JP 2011-029584 A

本開示は、金属部材若しくは誘電体部材の上に配線を狭ピッチで配置して固定することができる技術を提供する。   The present disclosure provides a technique capable of arranging and fixing wires at a narrow pitch on a metal member or a dielectric member.

本開示の一態様による配線固定構造は、金属面を有する金属部材と、板厚方向に貫通する貫通孔を有する導体板を、所定間隔をあけて互いに平行に複数配置した配線と、前記貫通孔に嵌合可能な凸部が形成された複数の第1の保持部と、前記複数の第1の保持部を前記所定間隔で接続する第1の接続部と、前記第1の接続部から前記第1の保持部と平行に延びて形成され、前記金属面に固定される脚部と、を有する第1の絶縁部材と、前記複数の第1の保持部の各々と協働して前記導体板を挟持して保持する複数の第2の保持部と、前記複数の第2の保持部を前記所定間隔で接続する第2の接続部と、を有する第2の絶縁部材と、を備え、前記配線は、前記第1の絶縁部材及び前記第2の絶縁部材によって、前記金属面から離間して保持される。   The wiring fixing structure according to an aspect of the present disclosure includes a wiring in which a plurality of metal members having a metal surface and a plurality of conductive plates having through holes penetrating in a thickness direction are arranged at predetermined intervals in parallel with each other; A plurality of first holding portions formed with protrusions that can be fitted into the first connection portion; a first connection portion that connects the plurality of first holding portions at the predetermined interval; A first insulating member having a leg formed to extend parallel to the first holding portion and fixed to the metal surface; and the conductor cooperating with each of the plurality of first holding portions. A second insulating member having a plurality of second holding portions that sandwich and hold the plate, and a second connection portion that connects the plurality of second holding portions at the predetermined interval; The wiring is held apart from the metal surface by the first insulating member and the second insulating member. .

本開示によれば、金属部材若しくは誘電体部材の上に配線を狭ピッチで配置して固定することができる。   According to the present disclosure, wires can be arranged and fixed at a narrow pitch on a metal member or a dielectric member.

配線固定構造の構成例を示す斜視図Perspective view showing a configuration example of a wiring fixing structure 図1の配線固定構造の分解斜視図1. Exploded perspective view of the wiring fixing structure of FIG. 図1のA−A線断面図1 is a sectional view taken along line AA of FIG. 配線固定構造の別の構成例を示す斜視図Perspective view showing another configuration example of the wiring fixing structure 図4の配線固定構造の分解斜視図FIG. 4 is an exploded perspective view of the wiring fixing structure in FIG. 4. 図4のB−B線断面図BB sectional drawing of FIG. 配線固定構造を備える処理装置の構成例を示す断面図Sectional view showing a configuration example of a processing apparatus having a wiring fixing structure. 図7の処理装置の高周波アンテナの構成例を示す平面図FIG. 7 is a plan view showing a configuration example of a high-frequency antenna of the processing device of FIG.

以下、添付の図面を参照しながら、本開示の限定的でない例示の実施形態について説明する。添付の全図面中、同一又は対応する部材又は部品については、同一又は対応する参照符号を付し、重複する説明を省略する。   Hereinafter, non-limiting exemplary embodiments of the present disclosure will be described with reference to the accompanying drawings. In all the attached drawings, the same or corresponding members or parts are denoted by the same or corresponding reference numerals, and redundant description will be omitted.

〔配線固定構造〕
本開示の実施形態に係る配線固定構造の一例について説明する。図1は、配線固定構造の構成例を示す斜視図である。図2は、図1の配線固定構造の分解斜視図である。図3は、図1のA−A線断面図である。
(Wiring fixing structure)
An example of the wiring fixing structure according to the embodiment of the present disclosure will be described. FIG. 1 is a perspective view showing a configuration example of a wiring fixing structure. FIG. 2 is an exploded perspective view of the wiring fixing structure of FIG. FIG. 3 is a sectional view taken along line AA of FIG.

図1から図3に示されるように、配線固定構造100は、金属部材1と、配線2と、第1の絶縁部材3と、第2の絶縁部材4と、を備える。第1の絶縁部材3及び第2の絶縁部材4は、協働して配線2を保持する配線保持具として機能する。   As shown in FIGS. 1 to 3, the wiring fixing structure 100 includes a metal member 1, a wiring 2, a first insulating member 3, and a second insulating member 4. The first insulating member 3 and the second insulating member 4 function as a wiring holder for holding the wiring 2 in cooperation.

金属部材1は、配線固定構造100を固定する固定面である金属面11を有する。金属部材1は、例えばアルミニウム、アルミニウムを含む合金であってよい。   The metal member 1 has a metal surface 11 that is a fixing surface for fixing the wiring fixing structure 100. The metal member 1 may be, for example, aluminum or an alloy containing aluminum.

配線2は、所定間隔(例えば10〜15mm)をあけて互いに平行に配置された複数(例えば9つ)の導体板21により形成されている。配線2は、第1の絶縁部材3及び第2の絶縁部材4によって、金属面11から離間して保持される。各導体板21の主面は、例えば金属面11と直交する。各導体板21は、板厚方向に貫通する一又は複数の貫通孔22を有する。図示の例では、各導体板21に2つの貫通孔22が導体板21の長手方向に沿って形成されている。導体板21は、例えば銅によって形成されている。   The wiring 2 is formed by a plurality (for example, nine) of the conductor plates 21 arranged in parallel with each other at a predetermined interval (for example, 10 to 15 mm). The wiring 2 is held apart from the metal surface 11 by the first insulating member 3 and the second insulating member 4. The main surface of each conductor plate 21 is orthogonal to, for example, the metal surface 11. Each conductor plate 21 has one or a plurality of through holes 22 penetrating in the plate thickness direction. In the illustrated example, two through holes 22 are formed in each conductor plate 21 along the longitudinal direction of the conductor plate 21. The conductor plate 21 is formed of, for example, copper.

第1の絶縁部材3は、例えばポリエーテルイミド等の弾性部材により形成されている。第1の絶縁部材3は、複数の第1の保持部31と、第1の接続部32と、脚部33と、を有する。   The first insulating member 3 is formed of an elastic member such as, for example, polyetherimide. The first insulating member 3 has a plurality of first holding parts 31, first connecting parts 32, and legs 33.

第1の保持部31は、略矩形状の板状に形成された部位である。第1の保持部31の一方の面には、貫通孔22に嵌合可能な凸部34が形成されている。凸部34の高さは、例えば導体板21の厚さ以上であることが好ましい。   The first holding portion 31 is a portion formed in a substantially rectangular plate shape. On one surface of the first holding portion 31, a convex portion 34 that can be fitted into the through hole 22 is formed. It is preferable that the height of the convex portion 34 be equal to or greater than the thickness of the conductive plate 21, for example.

第1の接続部32は、複数の第1の保持部31を所定間隔で接続する部位である。所定間隔は、配線2を構成する複数の導体板21の配列間隔と同一又は略同一の間隔である。第1の接続部32は、例えば複数の第1の保持部31が配列されている方向を長手方向とする板状に形成されている。第1の接続部32には、その長手方向に沿って所定間隔をあけて板厚方向に貫通する複数の開口35が形成されている。所定間隔は、配線2を構成する複数の導体板21の配列間隔と同一又は略同一の間隔である。複数の開口35は、後述する第2の絶縁部材4の複数の第2の保持部41が挿通可能な大きさに形成されている。第1の接続部32には、その長手方向の両端にボルト等の第1の締結部材5が挿通可能な挿通孔36が形成されている。   The first connection part 32 is a part that connects the plurality of first holding parts 31 at predetermined intervals. The predetermined interval is the same or substantially the same as the arrangement interval of the plurality of conductor plates 21 configuring the wiring 2. The first connection part 32 is formed, for example, in a plate shape whose longitudinal direction is the direction in which the plurality of first holding parts 31 are arranged. The first connection portion 32 is formed with a plurality of openings 35 penetrating in the plate thickness direction at predetermined intervals along the longitudinal direction. The predetermined interval is the same or substantially the same as the arrangement interval of the plurality of conductor plates 21 configuring the wiring 2. The plurality of openings 35 are formed in such a size that the plurality of second holding portions 41 of the second insulating member 4 described later can be inserted. The first connection portion 32 has insertion holes 36 at both ends in the longitudinal direction through which the first fastening member 5 such as a bolt can be inserted.

脚部33は、金属面11に固定される部位である。脚部33は、第1の接続部32の長手方向の両端における下面から第1の保持部31と平行に下方に延びて形成されている。脚部33には、ボルト等の第2の締結部材6が挿通可能な挿通孔37が形成されている。金属面11に第2の締結部材6により脚部33が固定されることで、導体板21は金属面11から離間して保持される。   The leg 33 is a part fixed to the metal surface 11. The legs 33 are formed to extend downward from the lower surfaces at both ends in the longitudinal direction of the first connecting portion 32 in parallel with the first holding portion 31. An insertion hole 37 through which the second fastening member 6 such as a bolt can be inserted is formed in the leg 33. By fixing the leg portion 33 to the metal surface 11 by the second fastening member 6, the conductor plate 21 is held apart from the metal surface 11.

第2の絶縁部材4は、例えばポリエーテルイミド等の弾性部材により形成されている。第2の絶縁部材4は、複数の第2の保持部41と、第2の接続部42と、を有する。   The second insulating member 4 is formed of an elastic member such as, for example, polyetherimide. The second insulating member 4 has a plurality of second holding parts 41 and a second connecting part 42.

第2の保持部41は、複数の第1の保持部31の各々と協働して複数の導体板21を挟持して保持する部位である。一実施形態では、第2の保持部41は、第1の接続部32に形成された開口35に挿通されることにより、第1の保持部31との間に導体板21を挟持して保持する。第2の保持部41の一方の面には、凸部34の先端と接触する位置に凹部43が形成されている。凹部43の深さは、導体板21の厚さ及び凸部34の高さに応じて定められ、例えば凸部34を導体板21の貫通孔22に挿通したときに貫通孔22から突出する部分の高さと同一又は略同一の深さとすることができる。   The second holding portion 41 is a portion that holds and holds the plurality of conductor plates 21 in cooperation with each of the plurality of first holding portions 31. In one embodiment, the second holding portion 41 is inserted into the opening 35 formed in the first connection portion 32, thereby holding the conductor plate 21 between the first holding portion 31 and the second holding portion 41. I do. A concave portion 43 is formed on one surface of the second holding portion 41 at a position where the concave portion 43 comes into contact with the tip of the convex portion 34. The depth of the concave portion 43 is determined according to the thickness of the conductive plate 21 and the height of the convex portion 34. For example, a portion that projects from the through hole 22 when the convex portion 34 is inserted into the through hole 22 of the conductive plate 21. The height may be the same or substantially the same as the height.

第2の接続部42は、複数の第2の保持部41を所定間隔で接続する。所定間隔は、配線2を構成する複数の導体板21の配列間隔と同一又は略同一の間隔である。第2の接続部42は、隣接する第2の保持部41の一方との接続部から他方との接続部に向かって断面凸状に屈曲する屈曲部44を有する。これにより、第2の保持部41を開口35に挿通させる際、第2の保持部41が第2の接続部42の長手方向に弾性変形して撓むため、第1の絶縁部材3及び第2の絶縁部材4に製作公差があっても、開口35への挿通を容易に行うことができる。   The second connecting part 42 connects the plurality of second holding parts 41 at predetermined intervals. The predetermined interval is the same or substantially the same as the arrangement interval of the plurality of conductor plates 21 configuring the wiring 2. The second connecting portion 42 has a bent portion 44 that bends in a convex shape in cross section from a connecting portion with one of the adjacent second holding portions 41 to a connecting portion with the other. Accordingly, when the second holding portion 41 is inserted into the opening 35, the second holding portion 41 is elastically deformed and bent in the longitudinal direction of the second connection portion 42, so that the first insulating member 3 and the second Even if the second insulating member 4 has a manufacturing tolerance, it can be easily inserted into the opening 35.

以上に説明した配線固定構造100によれば、第1の絶縁部材3(第1の保持部31)と第2の絶縁部材4(第2の保持部41)との間に導体板21を挟み込むことにより、複数の導体板21を所定間隔で保持する。これにより、金属部材1の上に配線2を狭ピッチで配置して固定することができる。また、一対の絶縁部材による挟み込み構造であることから、組立が容易であり、組立に要する工数を削減することができる。   According to the wiring fixing structure 100 described above, the conductor plate 21 is sandwiched between the first insulating member 3 (first holding portion 31) and the second insulating member 4 (second holding portion 41). Thereby, the plurality of conductor plates 21 are held at predetermined intervals. Thereby, the wirings 2 can be arranged and fixed on the metal member 1 at a narrow pitch. Further, since the structure is sandwiched between a pair of insulating members, assembly is easy, and the number of steps required for assembly can be reduced.

また、配線固定構造100によれば、配線2を構成する導体板21は板厚方向に貫通する貫通孔22を有し、第1の絶縁部材3は貫通孔22に嵌合可能な凸部34を有する。これにより、導体板21を固定する際、貫通孔22に凸部34が嵌合するので、導体板21がずれることを抑制することができる。   Further, according to the wiring fixing structure 100, the conductor plate 21 constituting the wiring 2 has the through hole 22 penetrating in the plate thickness direction, and the first insulating member 3 is the convex portion 34 that can be fitted into the through hole 22. Having. Accordingly, when the conductor plate 21 is fixed, the projection 34 is fitted into the through hole 22, so that the conductor plate 21 can be prevented from being displaced.

また、配線固定構造100によれば、凸部34の高さは、導体板21の厚さ以上である。これにより、第1の絶縁部材3と第2の絶縁部材4とにより導体板21を挟持して保持したときに導体板21がずれることを特に抑制することができる。   Further, according to the wiring fixing structure 100, the height of the protrusion 34 is equal to or greater than the thickness of the conductor plate 21. Thereby, when the conductor plate 21 is sandwiched and held between the first insulating member 3 and the second insulating member 4, the displacement of the conductor plate 21 can be particularly suppressed.

また、配線固定構造100によれば、第2の絶縁部材4は、弾性部材により形成されており、第2の接続部42は、隣接する第2の保持部41の一方との接続部から他方との接続部に向かって断面凸状に屈曲する屈曲部44を有する。これにより、第2の保持部41を開口35に挿通させる際、第2の保持部41が第2の接続部42の長手方向に弾性変形して撓むため、第1の絶縁部材3及び第2の絶縁部材4に製作公差があっても、開口35への挿通を容易に行うことができる。   Further, according to the wiring fixing structure 100, the second insulating member 4 is formed of an elastic member, and the second connecting portion 42 is connected from one of the adjacent second holding portions 41 to the other. And a bent portion 44 that is bent in a convex shape in cross section toward the connection portion with the connecting portion. Accordingly, when the second holding portion 41 is inserted into the opening 35, the second holding portion 41 is elastically deformed and bent in the longitudinal direction of the second connection portion 42, so that the first insulating member 3 and the second Even if the second insulating member 4 has a manufacturing tolerance, it can be easily inserted into the opening 35.

本開示の実施形態に係る配線固定構造の別の例について説明する。図4は、配線固定構造の別の構成例を示す斜視図である。図5は、図4の配線固定構造の分解斜視図である。図6は、図4のB−B線断面図である。   Another example of the wiring fixing structure according to the embodiment of the present disclosure will be described. FIG. 4 is a perspective view showing another configuration example of the wiring fixing structure. FIG. 5 is an exploded perspective view of the wiring fixing structure of FIG. FIG. 6 is a sectional view taken along line BB of FIG.

図4から図6に示されるように、配線固定構造100Aは、板状に形成された第2の接続部42Aを有する第2の絶縁部材4Aを備える。言い換えると、配線固定構造100Aが備える第2の接続部42Aは屈曲部44を有していない。なお、その他の点については、配線固定構造100と同様である。   As shown in FIGS. 4 to 6, the wiring fixing structure 100A includes a second insulating member 4A having a second connecting portion 42A formed in a plate shape. In other words, the second connecting portion 42A included in the wiring fixing structure 100A does not have the bent portion 44. The other points are the same as those of the wiring fixing structure 100.

配線固定構造100Aによれば、第1の絶縁部材3(第1の保持部31)と第2の絶縁部材4A(第2の保持部41)との間に導体板21を挟み込むことにより、複数の導体板21を所定間隔で保持する。これにより、金属部材1の上に配線2を狭ピッチで配置して固定することができる。また、一対の絶縁部材による挟み込み構造であることから、組立が容易であり、組立に要する工数を削減することができる。   According to the wiring fixing structure 100A, the conductor plate 21 is sandwiched between the first insulating member 3 (the first holding portion 31) and the second insulating member 4A (the second holding portion 41). Are held at predetermined intervals. Thereby, the wirings 2 can be arranged and fixed on the metal member 1 at a narrow pitch. Further, since the structure is sandwiched between a pair of insulating members, assembly is easy, and the number of steps required for assembly can be reduced.

また、配線固定構造100Aによれば、配線2を構成する導体板21は板厚方向に貫通する貫通孔22を有し、第1の絶縁部材3は貫通孔22に嵌合可能な凸部34を有する。これにより、導体板21を固定する際、貫通孔22に凸部34が嵌合するので、導体板21がずれることを抑制することができる。   Further, according to the wiring fixing structure 100A, the conductor plate 21 forming the wiring 2 has the through-hole 22 penetrating in the thickness direction, and the first insulating member 3 is the convex portion 34 that can be fitted into the through-hole 22. Having. Accordingly, when the conductor plate 21 is fixed, the projection 34 is fitted into the through hole 22, so that the conductor plate 21 can be prevented from being displaced.

また、配線固定構造100Aによれば、凸部34の高さは、導体板21の厚さ以上である。これにより、第1の絶縁部材3と第2の絶縁部材4Aとにより導体板21を挟持して保持したときに導体板21がずれることを特に抑制することができる。   Further, according to the wiring fixing structure 100A, the height of the projection 34 is equal to or greater than the thickness of the conductor plate 21. Thereby, when the conductor plate 21 is sandwiched and held by the first insulating member 3 and the second insulating member 4A, it is possible to particularly suppress the conductor plate 21 from shifting.

〔処理装置〕
本開示の実施形態に係る配線固定構造100,100Aを適用可能な処理装置の一例について説明する。図7は、配線固定構造を備える処理装置の構成例を示す断面図である。図8は、図7の処理装置の高周波アンテナの構成例を示す平面図である。
[Processing equipment]
An example of a processing apparatus to which the wiring fixing structures 100 and 100A according to the embodiment of the present disclosure can be applied will be described. FIG. 7 is a cross-sectional view illustrating a configuration example of a processing apparatus including a wiring fixing structure. FIG. 8 is a plan view illustrating a configuration example of a high-frequency antenna of the processing device in FIG.

図7に示される処理装置200は、例えば液晶ディスプレイ、有機ELディスプレイ等のFPD(Flat Panel Display)用のガラス基板(以下「基板S」という。)に対してプラズマ処理を行うための真空処理装置である。   A processing apparatus 200 shown in FIG. 7 is a vacuum processing apparatus for performing plasma processing on a glass substrate (hereinafter, referred to as “substrate S”) for an FPD (Flat Panel Display) such as a liquid crystal display or an organic EL display. It is.

処理装置200は、導電性材料により形成された角筒形状の気密な処理容器201を有する。処理容器201は、接地されている。処理容器201は、処理容器201と絶縁されて形成された窓部材である金属窓202により上下にアンテナ室203及び処理室204に区画されている。金属窓202は、一実施形態では処理室204の天井壁を構成する。金属窓202は、支持棚205及び支持梁211の上に絶縁物216を介して載置される。金属窓202は、例えば非磁性体で導電性の金属で構成される。非磁性体で導電性の金属としては、例えばアルミニウム、アルミニウムを含む合金が挙げられる。絶縁物216は、例えばセラミック、ポリテトラフルオロエチレン(PTFE)であってよい。   The processing apparatus 200 includes a rectangular cylindrical airtight processing container 201 formed of a conductive material. The processing container 201 is grounded. The processing chamber 201 is vertically divided into an antenna chamber 203 and a processing chamber 204 by a metal window 202 which is a window member formed insulated from the processing chamber 201. The metal window 202 forms a ceiling wall of the processing chamber 204 in one embodiment. The metal window 202 is placed on the support shelf 205 and the support beam 211 via an insulator 216. The metal window 202 is made of, for example, a nonmagnetic conductive metal. Examples of the nonmagnetic conductive metal include aluminum and alloys containing aluminum. Insulator 216 may be, for example, ceramic, polytetrafluoroethylene (PTFE).

アンテナ室203の側壁203aと処理室204の側壁204aとの間には、処理容器201の内側に突出する支持棚205、及び処理ガス供給用のシャワー筐体を兼ねる十字形状の支持梁211が設けられている。支持梁211がシャワー筐体を兼ねる場合には、支持梁211の内部に、基板Sの表面に対して平行に伸びるガス流路212が形成され、ガス流路212には、処理室204内にガスを噴出する複数のガス吐出孔212aが連通される。また、支持梁211の上部には、ガス流路212に連通するようにガス供給管220aが設けられる。ガス供給管220aは、処理容器201の天井からその外側へ貫通し、処理ガス供給源及びバルブシステム等を含む処理ガス供給系220に接続されている。したがって、プラズマ処理においては、処理ガス供給系220から供給された処理ガスがガス供給管220aを介して支持梁211内に供給され、ガス吐出孔212aから処理室204内へ吐出される。支持棚205及び支持梁211は導電性材料、好ましくはアルミニウム等の金属で構成される。   Between the side wall 203a of the antenna chamber 203 and the side wall 204a of the processing chamber 204, a supporting shelf 205 protruding inside the processing chamber 201 and a cross-shaped supporting beam 211 also serving as a shower housing for supplying processing gas are provided. Have been. When the support beam 211 also serves as a shower housing, a gas flow path 212 extending parallel to the surface of the substrate S is formed inside the support beam 211, and the gas flow path 212 is provided in the processing chamber 204. A plurality of gas ejection holes 212a for ejecting gas are communicated. A gas supply pipe 220 a is provided above the support beam 211 so as to communicate with the gas flow path 212. The gas supply pipe 220a penetrates from the ceiling of the processing container 201 to the outside, and is connected to a processing gas supply system 220 including a processing gas supply source, a valve system, and the like. Therefore, in the plasma processing, the processing gas supplied from the processing gas supply system 220 is supplied into the support beam 211 via the gas supply pipe 220a, and is discharged from the gas discharge holes 212a into the processing chamber 204. The support shelf 205 and the support beam 211 are made of a conductive material, preferably a metal such as aluminum.

アンテナ室203内には金属窓202の上には、金属窓202に面するように高周波アンテナ213が配設されている。高周波アンテナ213は、金属窓202から離間している。プラズマ処理中、第1の高周波電源215から、誘導電界形成用の、例えば周波数が13.56MHzの高周波電力が整合器214を介して高周波アンテナ213へ供給される。   In the antenna room 203, a high-frequency antenna 213 is provided above the metal window 202 so as to face the metal window 202. The high-frequency antenna 213 is separated from the metal window 202. During the plasma processing, high-frequency power having a frequency of 13.56 MHz, for example, for generating an induced electric field is supplied from the first high-frequency power supply 215 to the high-frequency antenna 213 via the matching unit 214.

高周波アンテナ213は、図8に示されるように、2つの渦巻状アンテナ213a,213bを有する。各渦巻状アンテナ213a,213bには、第1の高周波電源215からの高周波電力が整合器214を介して供給される。各渦巻状アンテナ213a,213bの終端にはコンデンサ218が接続され、各渦巻状アンテナ213a,213bはコンデンサ218を介して接地されている。このように高周波電力が供給された高周波アンテナ213により、処理室204内に誘導電界が形成され、誘導電界により複数のガス吐出孔212aから供給された処理ガスがプラズマ化される。高周波アンテナ213を構成する渦巻状アンテナ213a,213bを金属窓202から離間させて保持する際、前述した配線固定構造100,100Aを用いることができる。   As shown in FIG. 8, the high-frequency antenna 213 has two spiral antennas 213a and 213b. High-frequency power from a first high-frequency power supply 215 is supplied to each of the spiral antennas 213a and 213b via a matching unit 214. A capacitor 218 is connected to the ends of the spiral antennas 213a and 213b, and the spiral antennas 213a and 213b are grounded via the capacitor 218. An induction electric field is formed in the processing chamber 204 by the high-frequency antenna 213 supplied with the high-frequency power in this way, and the processing gas supplied from the plurality of gas discharge holes 212a is turned into plasma by the induction electric field. When the spiral antennas 213a and 213b constituting the high-frequency antenna 213 are held apart from the metal window 202, the above-described wiring fixing structures 100 and 100A can be used.

処理室204内の下方には、金属窓202を挟んで高周波アンテナ213と対向するように、基板Sを載置するための載置台223が設けられている。載置台223は、導電性材料、例えば表面が陽極酸化処理されたアルミニウムで構成されている。載置台223に載置された基板Sは、静電チャック(図示せず)により吸着保持される。   A mounting table 223 for mounting the substrate S is provided below the processing chamber 204 so as to face the high-frequency antenna 213 with the metal window 202 interposed therebetween. The mounting table 223 is made of a conductive material, for example, aluminum whose surface is anodized. The substrate S mounted on the mounting table 223 is suction-held by an electrostatic chuck (not shown).

載置台223は絶縁体枠224内に収納され、中空の支柱225に支持される。支柱225は処理容器201の底部を、気密状態を維持しつつ貫通し、処理容器201外に配設された昇降機構(図示せず)に支持され、基板Sの搬入出の際に昇降機構により載置台223が上下方向に駆動される。載置台223を収納する絶縁体枠224と処理容器201の底部との間には、支柱225を気密に包囲するベローズ226が配設されている。これにより、載置台223の上下動によっても処理室204内の気密性が保証される。処理室204の側壁204aには、基板Sを搬入出するための搬入出口227a及び搬入出口227aを開閉するゲートバルブ227が設けられている。   The mounting table 223 is housed in the insulator frame 224 and supported by the hollow support 225. The support 225 penetrates through the bottom of the processing container 201 while maintaining an airtight state, and is supported by an elevating mechanism (not shown) provided outside the processing container 201. The mounting table 223 is driven in the vertical direction. A bellows 226 that hermetically surrounds the column 225 is disposed between the insulator frame 224 that stores the mounting table 223 and the bottom of the processing container 201. Thereby, the airtightness in the processing chamber 204 is ensured even by the vertical movement of the mounting table 223. On the side wall 204a of the processing chamber 204, a loading / unloading port 227a for loading / unloading the substrate S and a gate valve 227 for opening / closing the loading / unloading port 227a are provided.

載置台223には、中空の支柱225内に設けられた給電線225aにより、整合器228を介して第2の高周波電源229が接続されている。第2の高周波電源229は、プラズマ処理中に、バイアス用の高周波電力、例えば、周波数が3.2MHzの高周波電力を載置台223に印加する。バイアス用の高周波電力により、処理室204内に生成されたプラズマ中のイオンが効果的に基板Sに引き込まれる。   A second high-frequency power supply 229 is connected to the mounting table 223 via a matching unit 228 by a power supply line 225 a provided in the hollow column 225. The second high frequency power supply 229 applies high frequency power for bias, for example, high frequency power having a frequency of 3.2 MHz to the mounting table 223 during the plasma processing. The ions in the plasma generated in the processing chamber 204 are effectively drawn into the substrate S by the high frequency power for bias.

載置台223内には、基板Sの温度を制御するため、セラミックヒータ等の加熱手段や冷媒流路等からなる温度制御機構と、温度センサとが設けられている(いずれも図示せず)。これらの機構や部材に対する配管や配線は、いずれも中空の支柱225を通して処理容器201外に導出される。   In the mounting table 223, a temperature control mechanism including a heating means such as a ceramic heater, a coolant flow path, and the like, and a temperature sensor are provided to control the temperature of the substrate S (none is shown). All of the piping and wiring for these mechanisms and members are led out of the processing vessel 201 through the hollow columns 225.

処理室204の底部には、排気管231を介して真空ポンプ等を含む排気装置230が接続される。排気装置230により、処理室204が排気され、プラズマ処理中、処理室204内が所定の真空雰囲気(例えば1.33Pa)に設定、維持される。   An exhaust device 230 including a vacuum pump and the like is connected to the bottom of the processing chamber 204 via an exhaust pipe 231. The processing chamber 204 is evacuated by the exhaust device 230, and the inside of the processing chamber 204 is set and maintained at a predetermined vacuum atmosphere (for example, 1.33 Pa) during the plasma processing.

処理装置200は、各部の動作を制御する制御部250を有する。制御部250は、CPU(Central Processing Unit)、ROM(Read Only Memory)、及びRAM(Random Access Memory)を有する。CPUは、RAM等の記憶領域に格納されたレシピに従って、所望の処理を実行する。レシピには、プロセス条件に対する装置の制御情報が設定されている。制御情報は、例えばガス流量、圧力、温度、プロセス時間であってよい。レシピ及び制御部250が使用するプログラムは、例えばハードディスク、半導体メモリに記憶されてもよい。レシピ等は、CD−ROM、DVD等の可搬性のコンピュータにより読み取り可能な記憶媒体に収容された状態で所定の位置にセットされ、読み出されるようにしてもよい。   The processing device 200 includes a control unit 250 that controls the operation of each unit. The control unit 250 has a CPU (Central Processing Unit), a ROM (Read Only Memory), and a RAM (Random Access Memory). The CPU executes a desired process according to a recipe stored in a storage area such as a RAM. In the recipe, control information of the apparatus with respect to the process conditions is set. The control information may be, for example, gas flow rate, pressure, temperature, process time. The program used by the recipe and control unit 250 may be stored in, for example, a hard disk or a semiconductor memory. The recipe or the like may be set at a predetermined position and read out while being stored in a portable computer-readable storage medium such as a CD-ROM or a DVD.

以上に説明した処理装置200によれば、第1の絶縁部材3(第1の保持部31)と第2の絶縁部材4,4A(第2の保持部41)との間に導体板21を挟み込むことにより、複数の導体板21を所定間隔で保持する配線固定構造100,100Aを備える。これにより、金属窓202の上に高周波アンテナ213を狭ピッチで配置して固定することができるので、単位面積当たりの巻き数を増やすことができる。   According to the processing apparatus 200 described above, the conductor plate 21 is placed between the first insulating member 3 (first holding unit 31) and the second insulating members 4 and 4A (second holding unit 41). Wiring fixing structures 100 and 100A that hold the plurality of conductor plates 21 at predetermined intervals by being sandwiched are provided. Thus, the high-frequency antennas 213 can be arranged and fixed at a narrow pitch on the metal window 202, so that the number of turns per unit area can be increased.

また、上記の処理装置200については窓部材が金属窓202である場合について説明したが、窓部材が誘電体窓であってもよい。高周波アンテナ213を直接誘電体窓に配置した場合、誘電体窓の表面において沿面放電を起こすことがあり、このような場合には上記の配線固定構造100、100Aを適用することにより沿面放電を防ぐことができる。誘電体窓の場合も、金属窓202の場合と同様の構造で支持梁211により支持することができ、誘電体窓の固定面に配線固定構造100、100Aを固定することができる。なお、金属窓202の場合と同様に第1の絶縁部材3の脚部33を直接誘電体窓の固定面にボルトなどで固定してもよいが、他の部材を介して間接的に固定してもよい。誘電体窓の材料は、例えば、セラミックスや石英で構成される。   In the above-described processing apparatus 200, the case where the window member is the metal window 202 has been described, but the window member may be a dielectric window. When the high-frequency antenna 213 is directly disposed on the dielectric window, a creeping discharge may occur on the surface of the dielectric window. In such a case, the creeping discharge is prevented by applying the wiring fixing structures 100 and 100A described above. be able to. Also in the case of the dielectric window, it can be supported by the support beam 211 with the same structure as the case of the metal window 202, and the wiring fixing structures 100 and 100A can be fixed to the fixing surface of the dielectric window. Note that, similarly to the case of the metal window 202, the leg 33 of the first insulating member 3 may be directly fixed to the fixing surface of the dielectric window with a bolt or the like, but is indirectly fixed via another member. You may. The material of the dielectric window is made of, for example, ceramics or quartz.

今回開示された実施形態はすべての点で例示であって制限的なものではないと考えられるべきである。上記の実施形態は、添付の請求の範囲及びその趣旨を逸脱することなく、様々な形態で省略、置換、変更されてもよい。   The embodiments disclosed this time are to be considered in all respects as illustrative and not restrictive. The above embodiments may be omitted, replaced, or modified in various forms without departing from the scope and spirit of the appended claims.

100 配線固定構造
1 金属部材
11 金属面
2 配線
21 導体板
3 第1の絶縁部材
31 第1の保持部
32 第1の接続部
33 脚部
34 凸部
4 第2の絶縁部材
41 第2の保持部
42 第2の接続部
Reference Signs List 100 Wiring fixing structure 1 Metal member 11 Metal surface 2 Wiring 21 Conductor plate 3 First insulating member 31 First holding part 32 First connecting part 33 Leg 34 Convex part 4 Second insulating member 41 Second holding Part 42 Second connection part

Claims (12)

金属面を有する金属部材と、
板厚方向に貫通する貫通孔を有する導体板を、所定間隔をあけて互いに平行に複数配置した配線と、
前記貫通孔に嵌合可能な凸部が形成された複数の第1の保持部と、前記複数の第1の保持部を前記所定間隔で接続する第1の接続部と、前記第1の接続部から前記第1の保持部と平行に延びて形成され、前記金属面に固定される脚部と、を有する第1の絶縁部材と、
前記複数の第1の保持部の各々と協働して前記導体板を挟持して保持する複数の第2の保持部と、前記複数の第2の保持部を前記所定間隔で接続する第2の接続部と、を有する第2の絶縁部材と、
を備え、
前記配線は、前記第1の絶縁部材及び前記第2の絶縁部材によって、前記金属面から離間して保持される、
配線固定構造。
A metal member having a metal surface,
Wiring in which a plurality of conductor plates having through holes penetrating in the thickness direction are arranged in parallel with each other at predetermined intervals,
A plurality of first holding portions each having a projection that can be fitted into the through hole; a first connection portion connecting the plurality of first holding portions at the predetermined interval; and the first connection A first insulating member formed extending from the portion in parallel with the first holding portion and having a leg fixed to the metal surface;
A plurality of second holding portions that sandwich and hold the conductor plate in cooperation with each of the plurality of first holding portions, and a second connecting portion that connects the plurality of second holding portions at the predetermined interval. A second insulating member having:
With
The wiring is held apart from the metal surface by the first insulating member and the second insulating member,
Wiring fixing structure.
前記第1の接続部は、板状に形成され、板厚方向に貫通する複数の開口を有し、
前記複数の開口の各々に前記複数の第2の保持部の各々が挿通されることにより、前記導体板が挟持される、
請求項1に記載の配線固定構造。
The first connection portion is formed in a plate shape, and has a plurality of openings penetrating in a plate thickness direction,
By inserting each of the plurality of second holding portions into each of the plurality of openings, the conductor plate is sandwiched.
The wiring fixing structure according to claim 1.
前記導体板の主面は、前記金属面と直交する、
請求項1又は2に記載の配線固定構造。
The main surface of the conductor plate is orthogonal to the metal surface,
The wiring fixing structure according to claim 1.
前記凸部の高さは、前記導体板の厚さ以上である、
請求項1乃至3のいずれか一項に記載の配線固定構造。
The height of the protrusion is equal to or greater than the thickness of the conductor plate,
The wiring fixing structure according to claim 1.
前記第2の保持部には、前記凸部と接触する位置に凹部が形成されている、
請求項1乃至4のいずれか一項に記載の配線固定構造。
A concave portion is formed in the second holding portion at a position in contact with the convex portion;
The wiring fixing structure according to claim 1.
前記第2の接続部は、隣接する前記第2の保持部の一方との接続部から他方との接続部に向かって断面凸状に屈曲する屈曲部を有する、
請求項1乃至5のいずれか一項に記載の配線固定構造。
The second connecting portion has a bent portion that bends in a convex shape in cross section from a connecting portion with one of the adjacent second holding portions toward a connecting portion with the other.
The wiring fixing structure according to claim 1.
前記第2の絶縁部材は、弾性部材により形成されている、
請求項1乃至6のいずれか一項に記載の配線固定構造。
The second insulating member is formed of an elastic member;
The wiring fixing structure according to claim 1.
前記弾性部材は、ポリエーテルイミドである、
請求項7に記載の配線固定構造。
The elastic member is a polyetherimide,
The wiring fixing structure according to claim 7.
前記金属部材は、基板を収容して処理を施す処理容器の天井壁を形成する、
請求項1乃至8のいずれか一項に記載の配線固定構造。
The metal member forms a ceiling wall of a processing container that accommodates a substrate and performs processing.
The wiring fixing structure according to claim 1.
固定面を有する窓部材を含む処理容器と、
板厚方向に貫通する貫通孔を有する導体板を、所定間隔をあけて互いに平行に複数配置した配線と、
前記貫通孔に嵌合可能な凸部が形成された複数の第1の保持部と、前記複数の第1の保持部を前記所定間隔で接続する第1の接続部と、前記第1の接続部から前記第1の保持部と平行に延びて形成され、前記固定面に固定される脚部と、を有する第1の絶縁部材と、
前記複数の第1の保持部の各々と協働して前記導体板を挟持して保持する複数の第2の保持部と、前記複数の第2の保持部を前記所定間隔で接続する第2の接続部と、を有する第2の絶縁部材と、
を備え、
前記配線は、前記第1の絶縁部材及び前記第2の絶縁部材によって、前記固定面から離間して保持される、
処理装置。
A processing container including a window member having a fixed surface,
Wiring in which a plurality of conductor plates having through holes penetrating in the thickness direction are arranged in parallel with each other at predetermined intervals,
A plurality of first holding portions each having a projection that can be fitted into the through hole; a first connection portion connecting the plurality of first holding portions at the predetermined interval; and the first connection A first insulating member having a leg portion formed to extend from the portion in parallel with the first holding portion and fixed to the fixing surface;
A plurality of second holding portions that sandwich and hold the conductor plate in cooperation with each of the plurality of first holding portions, and a second connecting portion that connects the plurality of second holding portions at the predetermined interval. A second insulating member having:
With
The wiring is held apart from the fixing surface by the first insulating member and the second insulating member,
Processing equipment.
前記窓部材は、金属窓である、請求項10に記載の処理装置。   The processing apparatus according to claim 10, wherein the window member is a metal window. 前記窓部材は、誘電体窓である、請求項10に記載の処理装置。   The processing apparatus according to claim 10, wherein the window member is a dielectric window.
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