JP2019191799A - 故障予兆診断システム及び故障予兆診断方法 - Google Patents

故障予兆診断システム及び故障予兆診断方法 Download PDF

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JP2019191799A
JP2019191799A JP2018082178A JP2018082178A JP2019191799A JP 2019191799 A JP2019191799 A JP 2019191799A JP 2018082178 A JP2018082178 A JP 2018082178A JP 2018082178 A JP2018082178 A JP 2018082178A JP 2019191799 A JP2019191799 A JP 2019191799A
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operation mode
sensor data
data table
failure sign
diagnosis
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JP2019191799A5 (enExample
Inventor
祥平 藤本
Shohei Fujimoto
祥平 藤本
俊之 小高
Toshiyuki Odaka
俊之 小高
野口　純司
Junji Noguchi
純司 野口
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Hitachi Ltd
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Hitachi Ltd
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Priority to JP2018082178A priority Critical patent/JP2019191799A/ja
Priority to CN201980022894.5A priority patent/CN111989629A/zh
Priority to PCT/JP2019/001441 priority patent/WO2019207855A1/ja
Priority to EP19791478.1A priority patent/EP3786748A4/en
Priority to US17/046,317 priority patent/US20210149875A1/en
Publication of JP2019191799A publication Critical patent/JP2019191799A/ja
Publication of JP2019191799A5 publication Critical patent/JP2019191799A5/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/23—Updating
    • G06F16/2365—Ensuring data consistency and integrity
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0254—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0297—Reconfiguration of monitoring system, e.g. use of virtual sensors; change monitoring method as a response to monitoring results
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2252—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using fault dictionaries
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2263—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using neural networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268—Logging of test results
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/22—Indexing; Data structures therefor; Storage structures
    • G06F16/2282—Tablespace storage structures; Management thereof
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24—Querying
    • G06F16/242—Query formulation
    • G06F16/2433—Query languages
    • G06F16/244—Grouping and aggregation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Automation & Control Theory (AREA)
  • Computational Linguistics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Computer Security & Cryptography (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2018082178A 2018-04-23 2018-04-23 故障予兆診断システム及び故障予兆診断方法 Pending JP2019191799A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018082178A JP2019191799A (ja) 2018-04-23 2018-04-23 故障予兆診断システム及び故障予兆診断方法
CN201980022894.5A CN111989629A (zh) 2018-04-23 2019-01-18 故障预兆诊断系统以及故障预兆诊断方法
PCT/JP2019/001441 WO2019207855A1 (ja) 2018-04-23 2019-01-18 故障予兆診断システム及び故障予兆診断方法
EP19791478.1A EP3786748A4 (en) 2019-01-18 Fault indicator diagnostic system and fault indicator diagnostic method
US17/046,317 US20210149875A1 (en) 2018-04-23 2019-01-18 Fault indicator diagnostic system and fault indicator diagnostic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018082178A JP2019191799A (ja) 2018-04-23 2018-04-23 故障予兆診断システム及び故障予兆診断方法

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JP2019191799A true JP2019191799A (ja) 2019-10-31
JP2019191799A5 JP2019191799A5 (enExample) 2021-03-04

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JP2018082178A Pending JP2019191799A (ja) 2018-04-23 2018-04-23 故障予兆診断システム及び故障予兆診断方法

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US (1) US20210149875A1 (enExample)
JP (1) JP2019191799A (enExample)
CN (1) CN111989629A (enExample)
WO (1) WO2019207855A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022190459A (ja) * 2021-06-14 2022-12-26 パナソニックＩｐマネジメント株式会社 劣化判定方法及び装置
JPWO2022269706A1 (enExample) * 2021-06-21 2022-12-29
WO2024048428A1 (ja) * 2022-08-31 2024-03-07 株式会社日立産機システム 予兆検知システム及び予兆検知方法

Citations (8)

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JP2001217169A (ja) * 1999-11-26 2001-08-10 Matsushita Electric Ind Co Ltd データ変動監視方法と監視装置
JP2001306140A (ja) * 2000-04-26 2001-11-02 Howa Mach Ltd 異常検出システム
JP2007165721A (ja) * 2005-12-15 2007-06-28 Omron Corp プロセス異常分析装置及びプログラム
JP2016113819A (ja) * 2014-12-15 2016-06-23 日立建機株式会社 作業機械のオイル性状の診断システム
JP2017120622A (ja) * 2015-12-25 2017-07-06 株式会社リコー 診断装置、診断方法、プログラムおよび診断システム
JP2018005645A (ja) * 2016-07-05 2018-01-11 山本　隆義 対象物の状態変化の原因探索方法
JP2018018507A (ja) * 2016-07-15 2018-02-01 株式会社リコー 診断装置、プログラムおよび診断システム
JP2018041326A (ja) * 2016-09-08 2018-03-15 株式会社東芝 異常検知装置、異常検知方法、およびプログラム

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US6917839B2 (en) * 2000-06-09 2005-07-12 Intellectual Assets Llc Surveillance system and method having an operating mode partitioned fault classification model
US7233886B2 (en) * 2001-01-19 2007-06-19 Smartsignal Corporation Adaptive modeling of changed states in predictive condition monitoring
IN2013DE02965A (enExample) * 2013-10-04 2015-04-10 Samsung India Electronics Pvt Ltd
JP5684941B1 (ja) 2014-07-31 2015-03-18 株式会社日立パワーソリューションズ 異常予兆診断装置及び異常予兆診断方法
JP6148316B2 (ja) 2015-07-31 2017-06-14 ファナック株式会社 故障条件を学習する機械学習方法及び機械学習装置、並びに該機械学習装置を備えた故障予知装置及び故障予知システム
US10739764B2 (en) * 2016-07-15 2020-08-11 Ricoh Company, Ltd. Diagnostic apparatus, diagnostic system, diagnostic method, and recording medium

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001217169A (ja) * 1999-11-26 2001-08-10 Matsushita Electric Ind Co Ltd データ変動監視方法と監視装置
JP2001306140A (ja) * 2000-04-26 2001-11-02 Howa Mach Ltd 異常検出システム
JP2007165721A (ja) * 2005-12-15 2007-06-28 Omron Corp プロセス異常分析装置及びプログラム
JP2016113819A (ja) * 2014-12-15 2016-06-23 日立建機株式会社 作業機械のオイル性状の診断システム
JP2017120622A (ja) * 2015-12-25 2017-07-06 株式会社リコー 診断装置、診断方法、プログラムおよび診断システム
JP2018005645A (ja) * 2016-07-05 2018-01-11 山本　隆義 対象物の状態変化の原因探索方法
JP2018018507A (ja) * 2016-07-15 2018-02-01 株式会社リコー 診断装置、プログラムおよび診断システム
JP2018041326A (ja) * 2016-09-08 2018-03-15 株式会社東芝 異常検知装置、異常検知方法、およびプログラム

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022190459A (ja) * 2021-06-14 2022-12-26 パナソニックＩｐマネジメント株式会社 劣化判定方法及び装置
JP7660292B2 (ja) 2021-06-14 2025-04-11 パナソニックＩｐマネジメント株式会社 劣化判定方法及び装置
JPWO2022269706A1 (enExample) * 2021-06-21 2022-12-29
JP7688127B2 (ja) 2021-06-21 2025-06-03 ファナック株式会社 ロボットシステムで発生した異常に対する手順を提供する異常処理装置、ネットワークシステム、及び方法
WO2024048428A1 (ja) * 2022-08-31 2024-03-07 株式会社日立産機システム 予兆検知システム及び予兆検知方法

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WO2019207855A1 (ja) 2019-10-31
US20210149875A1 (en) 2021-05-20
CN111989629A (zh) 2020-11-24
EP3786748A1 (en) 2021-03-03

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