JP2019187112A - Solar battery evaluation apparatus and method thereof - Google Patents

Abstract

To easily evaluate the soundness of the solar cells and ascertain the potential risks of solar power plants even for large-scale photovoltaic power generation sites.SOLUTION: For a solar cell module 1a in which a plurality of solar cells 11 are connected in series, a first pn junction current amount when the semiconductor characteristics of the solar cell are normal and a second pn junction current amount as measured are calculated (S53, S54) on the basis of the measured current-voltage characteristics data of the solar cells, and the ratio of the second pn junction current amount to the first pn junction current amount is set as the deterioration index of the solar cell module (S55).SELECTED DRAWING: Figure 5

Description

  The present invention relates to a solar cell evaluation apparatus and a solar cell evaluation method.

  Large-scale solar power plants have been introduced in large quantities due to FIT (Feed-in Tariffs). In order to maximize the power sales revenue, the cost reduction of the solar cell module has progressed, but at this time, if a member with poor performance is used, the performance of the solar cell module will be greatly deteriorated in the future Can happen. In addition, secondary markets such as solar power plant sales and securitization are also starting up. For this reason, there is an increasing need for technical due diligence for the solar power plant, that is, how much performance the solar power plant can continue to generate in the future. It is thought that there is. For this reason, it is required to quantify the performance and soundness of a solar cell module as a semiconductor to grasp potential risks.

  Although patent document 1 does not directly refer to the solar cell module, it is disclosed to measure the electroluminescence (EL) for quality evaluation of a semiconductor substrate used for a light emitting diode or a laser diode. Yes. Patent Document 2 applies the evaluation method disclosed in Patent Document 1 to a solar cell module, and discloses that the performance of a solar cell panel is inspected and evaluated from an EL emission image of the solar cell panel.

JP-A-2-296347 Japanese Unexamined Patent Publication No. 2016-220471

  A large-scale photovoltaic power generation site consisting of tens of thousands to hundreds of thousands of solar cell modules when solar panels are transported one by one to an indoor darkroom and an electric field for measuring EL is applied. It is practically extremely difficult to measure the target even if the number of samples is narrowed to such an extent that the statistical reliability is satisfied. Patent Document 2 discloses a method for measuring EL in an exposure environment. However, since the labor involved in measurement is large and the measurement is limited to nighttime, a solar cell module at a large-scale photovoltaic power generation site. There are limits to testing and evaluating the performance of

  An object of the present invention is to make it possible to easily evaluate the soundness of a solar cell even in a large-scale photovoltaic power generation site and grasp a potential risk of the photovoltaic power plant.

  A solar battery evaluation apparatus for evaluating a solar battery having a solar battery module in which a plurality of solar battery cells are connected in series, which is an embodiment of the present invention, is read by the processor, the memory, and the memory, and is executed by the processor. A solar cell evaluation program, the solar cell evaluation program has a junction current calculation unit, the junction current calculation unit, from the current-voltage characteristic data of the solar cell measured for the solar cell module, A first pn junction current amount when the semiconductor characteristics of the solar battery cell are normal and a second pn junction current amount as measured are calculated, and a second pn with respect to the first pn junction current amount is calculated. The ratio of the junction current amount is used as a deterioration index of the solar cell module.

  Other problems and novel features will become apparent from the description of the specification and the accompanying drawings.

  It becomes possible to grasp the semiconductor characteristics of the solar cell module of the solar cell in an average and quantitative manner.

It is a figure which shows the equivalent circuit of a photovoltaic cell. It is a schematic diagram of the EL image of a solar cell string. It is a schematic diagram of the EL image of a solar cell string. It is a figure for demonstrating the difference in the generation | occurrence | production probability of PID and a sealing material. It is a figure which shows the current-voltage characteristic of a photovoltaic cell. It is a figure which shows the current-voltage characteristic of a photovoltaic cell. It is a figure which shows the current-voltage characteristic of a photovoltaic cell. It is a flowchart which calculates the brightness | luminance of a photovoltaic cell based on a measured value. It is a flowchart which evaluates and visualizes deterioration of a solar cell module from measured IV data. It is a flowchart which evaluates and visualizes deterioration of a solar cell module from measured IV data. It is a flowchart which visualizes deterioration evaluation of a solar cell module. It is an example of a frame which displays degradation evaluation of a solar cell module. It is an example of a frame which displays degradation evaluation of a solar cell module. It is an example of a cell image which displays degradation evaluation of a solar cell module. It is a hardware structural example of the solar cell diagnostic apparatus which performs degradation evaluation of a solar cell module.

  FIG. 1 shows an equivalent circuit of the solar battery cell 11. The solar cell module 1 a can be represented as a plurality of solar cells 11 arranged in series and divided into bypass diodes 12. A solar cell string 1b is obtained by further connecting the solar cell modules 1a in series. The solar battery cell 11 can be expressed as an equivalent circuit in which a series resistor 16 is connected in series with a current source 13, a pn junction diode 14, and a shunt resistor 15 connected in parallel, and a current proportional to the amount of solar radiation is obtained. Supplied from the current source 13. Further, when any one of the solar cells 11 in the solar cell module 1 a fails, the current path bypasses the bypass diode 12.

In the photovoltaic power generation site, a plurality of solar cell strings 1b are bundled in parallel and connected to a power conditioner, and the direct current and direct current voltage of the solar cell string 1b are measured in units of power conditioners. Therefore, when the DC current I _opp and the DC voltage V _op of the solar cell string group (referred to as a plurality of solar cell strings 1b connected to one power conditioner) measured by the power conditioner are obtained, The operating current per solar cell is I _op (= I _opp / N _str : N _str is the number of solar cell strings 1b bundled in the inverter (referred to as “string number”)) and operation Voltage is V _op / N _cell : N _cell is the number of solar cells 11 connected in series in the solar cell string 1b (referred to as “number of cells”).

  It can be said that the semiconductor characteristics of the solar battery cell 11 are determined by the partial circuit 17 including the pn junction diode 14 and the shunt resistor 15. Degradation of the semiconductor characteristics of the solar battery cell 11 is equivalent to a decrease in the shunt resistance 15. is there.

  In the case of the EL method disclosed in the prior art document, a phenomenon is used in which minority carriers are injected into the pn junction diode 14 by applying current to the solar cell module, and the injected minority carriers cause coupling to emit light. . This light emission is captured by a camera, and an EL image displaying the light emission luminance is acquired. 2A and 2B schematically show EL images obtained by applying the EL method to the solar cell strings, respectively. In any figure, the whole is one solar cell string image 21, and the sections separated from each other are solar cell module images 22. FIG. 2A shows a case where all the solar cell modules of the solar cell string are normal, and the images of all the solar cell modules are imaged in a high luminance state. On the other hand, FIG. 2B shows an example in the case where there is a solar battery module in which the semiconductor characteristics of the solar battery cell 11 are deteriorated. When a large amount of electric charge is generated in some form in the solar cell module and recombination occurs on the surface of the solar battery cell or the like, the current associated with the recombination is concentrated on the shunt resistor 15 (see FIG. 1). As shown in the solar cell module images 22a and 22b, the solar cell module in which the luminance is reduced appears. Regarding the performance as a semiconductor characteristic of the solar battery cell, when the shunt resistance is dominant, that is, when it is ohmic, no light emission occurs, and the luminance becomes zero as shown in the solar battery module image 22a. Such deterioration is called PID (Potential Induced Degradation).

  By the way, the cause of lowering the brightness of the solar battery module image is not only the deterioration of the solar battery cells such as PID. When moisture enters the solar cell module due to the humidity of the environment in which the solar cell module is installed, a solar cell module sealing material (such as EVA (ethylene vinyl acetate copolymer resin)) that seals the solar cells is solar. A phenomenon of peeling from the battery cell occurs. Since such a sealing material generates low resistance even when peeling occurs, the luminance of the solar cell module is reduced.

  Both the decrease in luminance due to PID and the deterioration in luminance due to peeling of the sealing material are degradation of the solar cell module, but the occurrence of PID occurs stochastically depending on the semiconductor characteristics of the solar cell, whereas The occurrence of material peeling occurs uniformly throughout the solar cell depending on the material of the sealing material, the assembly process of the solar cell module and the subsequent installation environment. For this reason, there is a difference in the occurrence probability of both. FIG. 3 shows a histogram of a solar cell module having the luminance on the horizontal axis and each luminance. (A) In the initial state (when all the solar cell modules are normal), as shown in the luminance distribution 31, all have high luminance. (B) When solar cell deterioration occurs, the recombination of charges on the cell surface statistically occurs in the PID, and those that are ohmic become out of group. For this reason, an out-of-group 33 occurs in the histogram, and the distribution 32 widens greatly. On the other hand, (c) when the sealing material is peeled off, the luminance is uniformly reduced. Therefore, as shown in the distribution 34, no group deviation occurs, and the luminance is low and the distribution is narrow.

  Thus, the degree of deterioration of the solar cell module and the cause of the deterioration can be determined from the luminance of the solar cell module in the EL image. In this embodiment, a deterioration index corresponding to the luminance of the EL image of the solar cell module that is difficult to measure (hereinafter, the deterioration index obtained from this measurement value is also referred to as luminance) is quantified by the measurement value that can be measured by the power conditioner. Turn into. In addition, although it is easiest to use the measured value in the power conditioner for the measurement, in this case, the IV data of the solar cells averaged in units of the solar cell string is used. On the other hand, it is also possible to perform measurement in units of solar cell modules and use IV data of solar cells averaged in units of solar cell modules. Below, the case where the measured value in a power conditioner is used is demonstrated to an example.

FIG. 4A is current-voltage characteristic data (IV data 41) of the solar battery cell based on the actual measurement value in the power conditioner. At this time, the short-circuit current I _sc0 , the open circuit voltage V _oc ′, and the shunt resistance R _sh (IV data slope) can be read from the graph. FIG. 4B shows IV data 42 in the case where the semiconductor characteristics of the solar battery cells are normal (the shunt resistance R _sh is sufficiently high (∞)) in addition to the IV data 41 of FIG. 4A. The open circuit voltage at this time is V _oc . Further, FIG. 4C shows IV data 43 in which the semiconductor characteristics of the solar battery cells are normal and at normal temperature (298 K), in addition to the IV data 42 of FIG. 4B. The open-circuit voltage at this time is V _oc0 . The IV data 42 and 43 are estimated from the IV data 41 that is actually measured values.

The general formula of the solar battery cell is shown in (Equation 1). I _s is the reverse saturation current, q is Motoni amount, the n _f junction coefficient (diode performance index), k is the Boltzmann coefficient, T is the operation temperature of the solar cell [K].

  Here, the third term on the right side shows the influence of the ohmicization of the shunt resistor.

Since I _op = 0 when V _op = V _oc 'for the actual measurement value, (Equation 2) holds, but when the semiconductor characteristics of the solar cell are normal (R _sh = ∞), V _op = V _oc Since I _op = 0, (Equation 3) holds.

V _oc 'is obtained from ( _Equation 2), and V _oc is obtained from (Equation 3), and from this, the relationship of (Equation 4) is established.

Further, when the semiconductor characteristics of the solar cell are normal and normal temperature (T = 298K), assuming that reverse saturation current I _s = I _s0 (≈1.7e ⁻⁵ [A]) at normal temperature, V _op = V _Since I _op = 0 at _oc0 , ( _Equation 5) is derived from ( _Equation 1). Since 298 / q≈0.026, replacement is performed.

  On the other hand, when the temperature characteristic of the solar battery cell is β [V / K], the change amount of the open-circuit voltage due to temperature is expressed by (Equation 6).

  By substituting (Equation 5) into (Equation 6), the relational expression of (Equation 7) is obtained.

  From (Equation 4) and (Equation 7), T is obtained (Equation 8).

By further substituting (Equation 8) into (Equation 7), V _oc is obtained (Equation 9).

As described above, when the temperature T and the semiconductor characteristics of the solar cells are normal using the short-circuit current I _sc0 , the open-circuit voltage V _oc ′, and the shunt resistance R _sh that are measurement values that can be measured by the power conditioner. The open-circuit voltage V _oc can be calculated.

FIG. 5 shows a flowchart for calculating the luminance of the solar battery cell based on the measured value (IV data in FIG. 4A). First, the short circuit current I _sc0 , the open circuit voltage V _oc ′, and the shunt resistance R _sh are calculated from the measured IV data (S51). Based on these actually measured values, the temperature T is calculated by (Equation 8), and the open circuit voltage V _oc when the semiconductor characteristics of the solar battery cells are normal is calculated by (Equation 9) (S52). Next, the current flowing through the pn junction of the solar battery cell (pn junction current I _pn ) is calculated (S53, S54). The current shown in steps S53 and S54 is a current generated by combining the injected minority carriers, and this amount of current corresponds to the luminance of the EL image. However, the deterioration index (luminance) L is obtained as I _pn2 / I _pn1 by normalizing the pn junction current amount I _pn1 at normal time as 1 (S55). Incidentally, the reverse saturation current I _s bandgap reference -E _go, obtained by using the saturation constant A (number 10).

  In this way, it is possible to calculate the deterioration index L corresponding to the luminance of the EL image from the measurement value that can be measured by the power conditioner. If the degradation index L is a measurement value measured in units of solar cell strings, it is a degradation index of the solar cell module averaged in units of solar cell strings, and if it is a measurement value measured in units of solar cell modules. It can be regarded as a deterioration index of the solar cell module averaged for each solar cell module.

  In FIG. 3, the histogram of the solar cell module in one solar cell string according to the prior art has been described. However, the solar cell module histogram in the photovoltaic power generation site also shows the solar cell deterioration and the sealing material peeling. It is considered that each of them has the same tendency, that is, the deterioration of the solar cell is stochastically and the sealing material peels off uniformly, which appears in the luminance distribution of the solar cell module. Therefore, the brightness (deterioration index) is calculated for a sufficient number of solar cell strings (solar cell modules) to satisfy the statistical reliability in units of solar cell strings (solar cell modules), and the distribution of the luminance differs depending on the cause of deterioration. It is possible to grasp the deterioration state and cause of deterioration of the solar cell module at the photovoltaic power generation site by using the fact that there is. Furthermore, the degree of deterioration of the solar cell module and the cause of the deterioration can be visualized in an easy-to-understand manner for the user.

  FIGS. 6A and 6B are flowcharts for evaluating and imaging the deterioration of the solar cell module from IV data measured for n solar cell strings or n solar cell modules. n is a number sufficient to perform statistical processing described later.

In FIG. 6A, the solar cell modules that are out of the group are extracted based on the pn junction current amount calculated from the measured IV data. First, the luminance calculation flow shown in FIG. 5 is executed for each of n solar cell strings (or n solar cell modules, which will be described below as an example) (S61). , S62). Thus, for the solar cell strings [1] to [n], the pn junction current I _pn1 [1] to [n] and the actually measured pn junction current I when the semiconductor characteristics of the solar cells are normal are obtained. _pn2 [1] to [n] 601 are acquired. An average and a standard deviation are calculated for the acquired pn junction current (S63). The average of the pn junction current when the semiconductor characteristics of the solar battery cell are normal is I _pn1 _av and the standard deviation I _pn1 _σ. In addition, the average of the pn junction current as measured is I _pn2 —av and the standard deviation I _pn2 —σ.

Next, the solar cell modules that are out of group are extracted (S64). For n solar cell strings, it is determined whether each of the pn junction current I _{pn2 of} the solar cell module calculated from the measured IV data is a value that is out of the group (S641 to S645). Whether or not the actually measured pn junction current I _pn2 is out of the group can be determined by whether or not the following two conditions are satisfied simultaneously.
First condition: (I _pn2 _σ / I _pn2 _av) / (I _pn1 _σ / I _pn1 _av)> α
Second condition: | I _pn2 _av−I _pn2 [i] |> 3I _pn2 _σ
Α in the first condition is a predetermined value, and when this condition is satisfied, the distribution of the measured pn junction current is the distribution of the pn junction current when the semiconductor characteristics of the solar battery cells are normal. Is larger than the normal range defined by α. When the second condition is satisfied, it means that the actually measured pn junction current is out of ± 3σ.

In FIG. 6B, following the flow in FIG. 6A, the deterioration state of the solar battery cell is evaluated and imaged. First, the average I _pn2 —av ′ and the standard deviation I _pn2 —σ ′ of the pn junction current are calculated for the remaining solar cell modules excluding the solar cell modules that are out of the group obtained in FIG. 6A (S65). For the actually measured pn junction current I _pn2 [i], the value determined to be out of group is 0, and the value other than that is calculated as an average and standard deviation.

Based on the values calculated in step S65, the reference luminance L ′ and the variation coefficient CV are calculated (S66). The reference luminance L ′ is obtained by I _pn2 —av ′ / I _pn1 —av, and the variation coefficient CV is obtained by I _pn2 —σ ′ / I _pn2 _av ′. The reference luminance L ′ is a representative value of the deterioration index of the remaining solar cell modules excluding the group deviation, and the coefficient of variation CV indicates a variation in the pn junction current I _pn2 of the remaining solar cell modules excluding the group deviation. Is. Based on these, the deterioration evaluation of the solar cell module at the photovoltaic power generation site is performed (S67). First, the presence / absence of group deviation is evaluated (S671). When there is a deviation from the group, it is evaluated that the solar cell deterioration 604 is progressing in the solar cell module of the photovoltaic power generation site. Next, the reference luminance L ′ is compared with the predetermined value β (S672). If there is no group deviation and the reference luminance L ′ also satisfies a predetermined value (in this case, L ′ ≧ β), the solar cell module at the solar power generation site is evaluated as normal 602. Next, the coefficient of variation CV is compared with a predetermined value γ (S673). Although this is not determined as out-of-group in the flow of FIG. 6A, if the pn junction current I _{pn2 of} the remaining solar cell modules varies significantly (CV> γ), it is determined that the solar cell deterioration 604 It is. When there is no group deviation, the reference luminance L ′ does not satisfy the predetermined value (L ′ <β), and the variation is not so large (CV ≦ γ), it is determined that the sealing material is peeled off 603.

  Based on the above-described deterioration evaluation of the solar cell module, this is imaged so as to be easily understood by the user (S68). A flowchart of imaging is shown in FIG.

First, a frame for imaging the deterioration state of the solar cell module is set (S71). Although it does not specifically limit as a flame | frame, The flame | frame 80 imitating the solar cell panel by which the solar cell module was laid like FIG. 8A can be used. In this example, a total of 60 cells 81 are arranged in a matrix of 10 rows and 6 columns. First, when there is a group deviation, the luminance of the cell corresponding to the group deviation ratio is set to 0 (S72). For example, if n = 60 and there are two group deviations, the luminance of two cells is 0. If n = 120 and there are two group deviations, the luminance of one cell is zero. Subsequently, the luminance of each remaining cell is calculated so that the average luminance of the remaining cells (all cells when there is no group deviation) corresponds to I _pn2 —av ′ and the standard deviation corresponds to I _pn2 —σ ′ (S73). . For example, the Monte Carlo method can be used to calculate the luminance. As described above, since the luminance of the cell of the frame is obtained, the luminance is assigned to each cell (S74). This assignment may be randomly assigned. FIG. 8B shows the luminance after the assignment.

  Moreover, you may display the cause of deterioration of a solar cell module with respect to the cell. As shown in FIG. 9, when the deterioration evaluation of the solar battery module is normal or solar battery deterioration, the cell image 90 is used, and the degree of deterioration is expressed by the luminance of the background portion 91. On the other hand, when the deterioration evaluation of the solar cell module is peeling of the sealing material, the cell image 92 is used, and the degree of deterioration is expressed by the luminance of the background portion 93.

  FIG. 10 shows a hardware configuration example of the solar cell evaluation apparatus that performs the deterioration evaluation of the solar cell module described above. The solar cell evaluation apparatus 100 includes a processor 101, a main memory 102, an auxiliary memory 103, an input / output interface 104, a display interface 105, and a network interface 106, which are coupled by a bus 107. The input / output interface 104 is connected to an input device 109 such as a keyboard and a mouse, and the display interface 105 is connected to a display 108 to realize a GUI. In addition, the evaluation result is displayed with an image as shown in FIG. 8B or FIG. The network interface 106 is an interface for connecting to a network. The auxiliary storage 103 is usually composed of a nonvolatile memory such as an HDD, a ROM, or a flash memory, and stores a program executed by the solar cell evaluation apparatus 100, data to be processed by the program, and the like. The main memory 102 is constituted by a RAM, and temporarily stores a program, data necessary for executing the program, and the like according to instructions from the processor 101. The processor 101 executes a program loaded from the auxiliary memory 103 to the main memory 102. The solar cell evaluation apparatus 100 can be realized by a PC (Personal Computer) or a server, for example.

The auxiliary storage 103 stores measurement data 110, solar cell specifications 111 necessary for evaluation, other data, a solar cell evaluation program 112, and other programs. The solar cell evaluation program 112 includes a junction current calculation unit 112a, a deterioration evaluation unit 112b, and an imaging unit 112c as main parts. The measurement data 110 includes, for example, a direct current I _opp and a direct current voltage V _op of n solar cell strings measured by a power conditioner. The junction current calculation unit 112a executes the flow described with reference to FIG. The deterioration evaluation unit 112b executes the flow described with reference to FIGS. 6A and 6B (except for step S68). The imaging unit 112c executes step S68, that is, the flow described in FIG.

  As described above, it is possible to quantitatively evaluate the average deterioration state of the solar cell module at the photovoltaic power generation site from the measured IV data.

1a: solar cell module, 1b: solar cell string, 11: solar cell, 12: bypass diode, 13: current source, 14: pn junction diode, 15: shunt resistor, 16: series resistor, 17: partial circuit, 21 : Solar cell string image, 22: Solar cell module image, 100: Solar cell evaluation device, 101: Processor, 102: Main memory, 103: Auxiliary memory, 104: Input / output I / F, 105: Display I / F, 106 : Network I / F, 107: Bus, 108: Display, 109: Input device.

Claims (15)

A solar cell evaluation device for evaluating a solar cell having a solar cell module in which a plurality of solar cells are connected in series,
A processor;
Memory,
A solar cell evaluation program read into the memory and executed by the processor;
The solar cell evaluation program has a junction current calculation unit,
The junction current calculation unit calculates the first pn junction current amount and the actual measurement when the semiconductor characteristics of the solar battery cell are normal based on the current-voltage characteristic data of the solar battery cell measured for the solar battery module. Calculating the second pn junction current amount of the street,
The solar cell evaluation apparatus which uses the ratio of the said 2nd pn junction part current amount with respect to a said 1st pn junction part current amount as a degradation parameter | index of the said solar cell module. In claim 1,
The first pn junction current amount is calculated from the current-voltage characteristic data of the solar cell actually measured for the solar cell module based on the current-voltage characteristic data when the shunt resistance of the solar cell is ∞. Pn junction current amount,
The second pn junction current amount is a solar cell evaluation device that is a pn junction current amount calculated from current-voltage characteristic data of a solar battery cell measured for the solar battery module. In claim 1,
The solar cell evaluation program has a deterioration evaluation unit,
The junction current calculation unit calculates, for each of the plurality of solar cell modules, the first pn junction current amount and the second pn junction current amount of the solar cell module,
The degradation evaluation unit evaluates that solar cell degradation has occurred in the solar cell when the presence of out-of-group is determined from the distribution of the second pn junction current amount of the plurality of solar cell modules. Solar cell evaluation device. In claim 3,
For the remaining solar cell modules excluding the solar cell modules that are out of the group among the plurality of solar cell modules, the degradation evaluation unit has a representative value of the degradation index of the remaining solar cell modules as a first predetermined value. The solar cell evaluation apparatus which evaluates that the said solar cell is normal when it is more than a value. In claim 4,
The degradation evaluation unit is configured to determine, for the remaining solar cell modules, the representative value of the degradation index of the remaining solar cell modules is smaller than the first predetermined value, and the second solar cell modules. The solar cell evaluation apparatus which evaluates that the sealing material has peeled in the said solar cell, when the dispersion | variation in the distribution of pn junction part current amount is below 2nd predetermined value. In claim 5,
The degradation evaluation unit is configured to determine, for the remaining solar cell modules, the representative value of the degradation index of the remaining solar cell modules is smaller than the first predetermined value, and the second solar cell modules. The solar cell evaluation apparatus which evaluates that the photovoltaic cell deterioration has arisen in the said solar cell, when the dispersion | variation in distribution of pn junction part electric current amount is larger than the said 2nd predetermined value. In any one of Claims 1-6,
The solar cell has a solar cell string in which a plurality of solar cell modules are connected in series,
From the current-voltage characteristic data of the solar cell applied to the solar cell module included in the solar cell string, the junction current calculation unit is obtained from the DC current and DC voltage measurement values of the solar cell string. A solar cell evaluation device for calculating the first pn junction current amount and the second pn junction current amount of a solar cell module. In claim 6,
The solar cell evaluation program has an imaging unit,
The imaging unit displays a frame imitating a solar cell panel on a display device, which represents a deterioration state of the solar cell,
The frame includes a plurality of cells arranged in a matrix, and the brightness of the plurality of cells is determined according to a deterioration index of a solar cell module of the solar cell. In claim 8,
The imaging unit represents a solar cell module that is out of the group by a cell having a luminance of 0 among the plurality of cells,
The solar cell evaluation apparatus which is set so that the ratio of the cells having a luminance of 0 among the plurality of cells is the ratio of the solar cell modules out of the group among the plurality of solar cell modules. In claim 9,
The imaging unit includes a solar cell in which the average and standard deviation of the luminance of the remaining cells excluding the cells whose luminance is 0 among the plurality of cells are out of the group of the plurality of solar cell modules. The solar cell evaluation apparatus which calculates the brightness | luminance of the said remaining cell so that it may respond | correspond to the average and standard deviation of the degradation parameter | index of the remaining solar cell modules except a module. In any one of Claims 8-10,
The imaging unit is a case where the deterioration evaluation unit evaluates that the solar cell is normal or solar cell deterioration occurs and a case where the solar cell evaluates that the sealing material is peeled off, The solar cell evaluation apparatus which displays the said several cell by a different image. A solar cell evaluation method for evaluating a solar cell having a solar cell module in which a plurality of solar cells are connected in series,
From the current-voltage characteristic data of the solar cell measured for the solar cell module, the first pn junction current amount when the semiconductor characteristics of the solar cell are normal and the second pn junction as measured Calculate the amount of current,
A solar cell evaluation method in which a ratio of the second pn junction current amount to the first pn junction current amount is a deterioration index of the solar cell module. In claim 12,
For each of the plurality of solar cell modules, calculate the first pn junction current amount and the second pn junction current amount of the solar cell module,
A solar cell evaluation method for determining a cause of deterioration occurring in the solar cell based on the deterioration index of the plurality of solar cell modules and the distribution of the second pn junction current amount. In claim 12 or claim 13,
The solar cell has a solar cell string in which a plurality of solar cell modules are connected in series,
From the current-voltage characteristic data of the solar cell applied to the solar cell module included in the solar cell string, obtained from the measured values of the DC current and DC voltage of the solar cell string, the first of the solar cell module A solar cell evaluation method for calculating a pn junction current amount and a second pn junction current amount. In claim 13,
Displaying a frame imitating a solar cell panel that represents the deterioration status of the solar cell on a display device,
The frame includes a plurality of cells arranged in a matrix, and the luminance of the plurality of cells is determined according to the deterioration index of the solar cell module of the solar cell.

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