JP2019186389A - Circuit-board - Google Patents

Circuit-board Download PDF

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Publication number
JP2019186389A
JP2019186389A JP2018075626A JP2018075626A JP2019186389A JP 2019186389 A JP2019186389 A JP 2019186389A JP 2018075626 A JP2018075626 A JP 2018075626A JP 2018075626 A JP2018075626 A JP 2018075626A JP 2019186389 A JP2019186389 A JP 2019186389A
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semiconductor element
solder
wiring board
wiring
electrode
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谷 直樹
Naoki Tani
直樹 谷
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JTEKT Corp
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JTEKT Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector

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  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Wire Bonding (AREA)

Abstract

To reduce distortion of solder due to difference in the coefficient of linear thermal expansion of a semiconductor element and a wiring board.SOLUTION: A circuit board 100 includes a wiring board 110, a semiconductor element 150 to be mounted on the wiring board 110, multiple conductive relay terminals 130 placed between the electrodes of the semiconductor element 150 and the wiring member 112 of the wiring board 110, a holding member 140 for holding the multiple relay terminals 130 in insulation state, a first solder 121 for electrically connecting the wiring member 112 of the wiring board 110 and the relay terminals 130, and a second solder 122 for electrically connecting the relay terminals 130 and the electrodes of the semiconductor element 150.SELECTED DRAWING: Figure 2

Description

本発明は、配線基板上に半導体素子などの電子部品が実装された回路基板に関する。   The present invention relates to a circuit board on which an electronic component such as a semiconductor element is mounted on a wiring board.

電動パワーステアリング用のモータを制御する制御装置(ECU)には、半導体素子などの電子部品が配線基板に実装された回路基板が搭載されている。昨今では、半導体素子の小型化により電極も小面積となり、また制御装置の省スペース化によりリードフレームが用いられることなく半導体素子に直接設けられた電極がはんだによって配線基板に接続されている。   A control device (ECU) that controls a motor for electric power steering is equipped with a circuit board on which electronic components such as semiconductor elements are mounted on a wiring board. In recent years, the electrodes have a small area due to the miniaturization of the semiconductor element, and the electrodes provided directly on the semiconductor element are connected to the wiring board by solder without using a lead frame due to space saving of the control device.

車両に取り付けられる制御装置は大きな温度変化に曝される場合が多く、半導体素子と配線基板との線膨張係数の違いにより、温度の変化に対し半導体素子よりも配線基板がより大きく変形する。小型の半導体素子が搭載された制御装置の場合、電極面積が小さいことからはんだも細い状態であり、配線基板と半導体素子とを接続するはんだが受けるひずみの影響は大きい。従って、半導体素子と配線基板の膨張係数の相違により、はんだにクラックが発生して抵抗が増大したり、はんだの破壊により絶縁状態になったりする可能性がある。   A control device attached to a vehicle is often exposed to a large temperature change, and due to a difference in linear expansion coefficient between the semiconductor element and the wiring board, the wiring board deforms more greatly than the semiconductor element with respect to the temperature change. In the case of a control device on which a small semiconductor element is mounted, since the electrode area is small, the solder is also thin, and the influence of the strain received by the solder connecting the wiring board and the semiconductor element is large. Therefore, the difference in expansion coefficient between the semiconductor element and the wiring board may cause cracks in the solder and increase the resistance, or may be in an insulating state due to destruction of the solder.

このような線膨張係数の違いからはんだを保護する技術として、特許文献1には、はんだ内部に球形のコアを配置する技術が提案されている。   As a technique for protecting the solder from such a difference in linear expansion coefficient, Patent Document 1 proposes a technique for arranging a spherical core inside the solder.

特開2010−177394号公報JP 2010-177394 A

ところが、特許文献1に記載の技術のように、半導体素子の各電極と配線基板との間にそれぞれ球形のコアを配置することは非常に困難であり、電極が小型化されるとさらに困難さが増加する。   However, as in the technique described in Patent Document 1, it is very difficult to dispose a spherical core between each electrode of a semiconductor element and a wiring board, and it is even more difficult when the electrode is downsized. Will increase.

また、はんだの厚さを厚くすることで、線膨張係数の違いによるひずみの影響を緩和できることが予想されるが、電極面積が小さい場合や電極の配置密度が高い場合などにおいてははんだの厚さを厚くするとハンダを溶融させた際に隣接する電極のはんだが接触しショートすることが懸念される。   In addition, increasing the solder thickness is expected to reduce the effects of strain due to differences in the linear expansion coefficient. However, when the electrode area is small or the electrode arrangement density is high, the solder thickness If the thickness is increased, there is a concern that when the solder is melted, the solder of the adjacent electrode comes into contact and short-circuits.

本発明は、上記課題に鑑みなされたものであり、配線基板と半導体素子との間に線膨張係数の大きな違いがあった場合でもこれらを接続するはんだに加えられる歪を抑制することができる回路基板の提供を目的としている。   The present invention has been made in view of the above problems, and even when there is a large difference in coefficient of linear expansion between a wiring board and a semiconductor element, a circuit capable of suppressing distortion applied to the solder connecting them. The purpose is to provide a substrate.

上記目的を達成するために、本発明の1つである回路基板は、配線基板と、前記配線基板に実装される半導体素子と、前記半導体素子の電極と前記配線基板の配線部材との間に配置される導電性を備えた複数の中継端子と、複数の前記中継端子を絶縁状態で保持する保持部材と、前記配線基板の配線部材と前記中継端子とを電気的に接続する第一はんだと、前記中継端子と前記半導体素子の電極とを電気的に接続する第二はんだとを備える。   In order to achieve the above object, a circuit board according to one aspect of the present invention includes a wiring board, a semiconductor element mounted on the wiring board, an electrode of the semiconductor element, and a wiring member of the wiring board. A plurality of relay terminals provided with conductivity, a holding member that holds the plurality of relay terminals in an insulated state, and a first solder that electrically connects the wiring member of the wiring board and the relay terminals; And a second solder for electrically connecting the relay terminal and the electrode of the semiconductor element.

本発明によれば、配線基板と半導体素子とを接続するはんだの厚さを実質的に厚くすることができ、配線基板と半導体素子との線膨張係数の違いにより発生するはんだの歪を緩和することが可能となる。   According to the present invention, the thickness of the solder connecting the wiring board and the semiconductor element can be substantially increased, and the distortion of the solder caused by the difference in linear expansion coefficient between the wiring board and the semiconductor element can be reduced. It becomes possible.

回路基板の一部を示す斜視図である。It is a perspective view which shows a part of circuit board. 回路基板の半導体素子部分の断面を示す断面斜視図である。It is a cross-sectional perspective view which shows the cross section of the semiconductor element part of a circuit board. 回路基板の半導体素子部分近傍を分解して示す分解斜視図である。It is a disassembled perspective view which decomposes | disassembles and shows the semiconductor element part vicinity of a circuit board. 半導体素子を電極側の面から示す平面図である。It is a top view which shows a semiconductor element from the surface by the side of an electrode. 回路基板の半導体素子にヒートシンクを取り付けた状態を示す側面図である。It is a side view which shows the state which attached the heat sink to the semiconductor element of a circuit board. 加温による半導体素子と保持部材と配線基板の伸びの状態を示す断面図である。It is sectional drawing which shows the state of the expansion | extension of the semiconductor element, holding member, and wiring board by heating.

次に、本発明に係る回路基板の実施の形態について、図面を参照しつつ説明する。なお、以下で説明する実施の形態は、いずれも包括的または具体的な例を示すものである。以下の実施の形態で示される数値、形状、材料、構成要素、構成要素の配置位置及び接続形態、ステップ、ステップの順序などは、一例であり、本発明を限定する主旨ではない。また、以下の実施の形態における構成要素のうち、最上位概念を示す独立請求項に記載されていない構成要素については、任意の構成要素として説明される。   Next, an embodiment of a circuit board according to the present invention will be described with reference to the drawings. It should be noted that each of the embodiments described below shows a comprehensive or specific example. The numerical values, shapes, materials, constituent elements, arrangement positions and connecting forms of the constituent elements, steps, order of steps, and the like shown in the following embodiments are merely examples, and are not intended to limit the present invention. In addition, among the constituent elements in the following embodiments, constituent elements that are not described in the independent claims indicating the highest concept are described as optional constituent elements.

また、図面は、本発明を示すために適宜強調や省略、比率の調整を行った模式的な図となっており、実際の形状や位置関係、比率とは異なる場合がある。   In addition, the drawings are schematic diagrams in which emphasis, omission, and ratio adjustment are appropriately performed to show the present invention, and may differ from actual shapes, positional relationships, and ratios.

図1は、回路基板の一部を示す斜視図である。図2は、回路基板の半導体素子部分の断面を示す断面斜視図である。図3は、回路基板の半導体素子部分近傍を分解して示す分解斜視図である。これらの図に示すように、回路基板100は、例えば、電動パワーステアリングが備えるモータの制御を行う制御装置の構成要素であり、配線基板110と、第一はんだ121と、第二はんだ122と、中継端子130と、保持部材140と、半導体素子150を備えている。   FIG. 1 is a perspective view showing a part of a circuit board. FIG. 2 is a cross-sectional perspective view showing a cross section of the semiconductor element portion of the circuit board. FIG. 3 is an exploded perspective view showing the vicinity of the semiconductor element portion of the circuit board in an exploded manner. As shown in these drawings, the circuit board 100 is a component of a control device that controls a motor included in the electric power steering, for example, a wiring board 110, a first solder 121, a second solder 122, The relay terminal 130, the holding member 140, and the semiconductor element 150 are provided.

配線基板110は、絶縁性の基板111の表面に導体からなる配線部材112のパターンが形成されたいわゆるプリント基板である。配線基板110の半導体素子150などの電子部品と接続される箇所は、配線部材112が露出しており、それ以外の部分はレジストで覆われている。基板111の材質は、絶縁性を備えていれば特に限定されるものではないが、ガラス布にエポキシ樹脂を含浸させたものなどを例示することができる。配線部材112の材質は、導電性を備えていれば特に限定されるものではないが、銅などを例示することができる。   The wiring board 110 is a so-called printed board in which a pattern of a wiring member 112 made of a conductor is formed on the surface of an insulating board 111. The wiring member 112 is exposed at a portion of the wiring substrate 110 connected to an electronic component such as the semiconductor element 150, and the other portions are covered with a resist. Although the material of the board | substrate 111 will not be specifically limited if it has insulation, The thing etc. which impregnated the epoxy resin to the glass cloth etc. can be illustrated. The material of the wiring member 112 is not particularly limited as long as it has conductivity, and examples thereof include copper.

半導体素子150は、配線基板110に実装される電子部品の1つである。半導体素子150の種類は、特に限定されるものではないが、本実施の形態の場合、半導体素子150は、MOSFET(metal−oxide−semiconductor field−effect transistor)であり、特に大電流のスイッチングを行う事ができるいわゆるパワーMOSFETである。また、半導体素子150は、図4に示すように、ゲート電極151、ドレイン電極152、およびソース電極153が一面側にアレイ状に配置される横型半導体素子である。また、半導体素子150は、樹脂製の筐体(パッケージ)やリードフレームを備えない、チップ部品である。半導体素子150としてチップ部品を採用することで、図5に示すように、半導体素子150の電極が配置される面と反対側の面に、放熱シートなどを介してヒートシンク159を取り付けることで、半導体素子150自身の熱を効率よく放熱することができる。   The semiconductor element 150 is one of electronic components mounted on the wiring board 110. The type of the semiconductor element 150 is not particularly limited, but in the case of the present embodiment, the semiconductor element 150 is a MOSFET (metal-oxide-field field-effect transistor), and particularly performs switching of a large current. This is a so-called power MOSFET. As shown in FIG. 4, the semiconductor element 150 is a horizontal semiconductor element in which a gate electrode 151, a drain electrode 152, and a source electrode 153 are arranged in an array on one side. The semiconductor element 150 is a chip component that does not include a resin casing (package) or lead frame. By adopting a chip component as the semiconductor element 150, as shown in FIG. 5, a heat sink 159 is attached to the surface opposite to the surface on which the electrodes of the semiconductor element 150 are disposed via a heat dissipation sheet or the like. The heat of the element 150 itself can be efficiently radiated.

中継端子130は、半導体素子150が備えるゲート電極151、ドレイン電極152、ソース電極153などの電極と配線基板110の配線部材112との間にそれぞれ配置される部材である。中継端子130の材質は、導電性を備えていれば特に限定されるものではないが、例えば、配線基板110の配線部材112と同様銅を例示することができる。中継端子130の形状は、特に限定されるものではないが、本実施の形態の場合、半導体素子150が備える電極と対向する中継端子130の面の形状は、半導体素子150が備える電極の形状とほぼ同じ形状であり、大きさも同程度である。   The relay terminal 130 is a member that is disposed between an electrode such as the gate electrode 151, the drain electrode 152, and the source electrode 153 included in the semiconductor element 150 and the wiring member 112 of the wiring substrate 110. The material of the relay terminal 130 is not particularly limited as long as it has conductivity. For example, copper can be exemplified like the wiring member 112 of the wiring board 110. The shape of the relay terminal 130 is not particularly limited, but in the case of the present embodiment, the shape of the surface of the relay terminal 130 facing the electrode provided in the semiconductor element 150 is the same as the shape of the electrode provided in the semiconductor element 150. They have almost the same shape and the same size.

保持部材140は、複数の中継端子130を所定の配置状態で保持する部材である。保持部材140の材質は、絶縁性を備えていれば特に限定されるものではないが、線膨張係数が半導体素子150の線膨張係数と配線基板110全体の線膨張係数との間、特に中央の値程度が好ましい。具体的に例えば、保持部材140の材質は、エポキシ樹脂をマトリクスとし、上記線膨張係数になるように調整された樹脂などを例示することができる。   The holding member 140 is a member that holds the plurality of relay terminals 130 in a predetermined arrangement state. The material of the holding member 140 is not particularly limited as long as it has an insulating property, but the linear expansion coefficient is between the linear expansion coefficient of the semiconductor element 150 and the linear expansion coefficient of the entire wiring board 110, particularly at the center. A value of about is preferred. Specifically, for example, the material of the holding member 140 can be exemplified by a resin adjusted using the epoxy resin as a matrix and the linear expansion coefficient.

保持部材140の形状は、特に限定されるものではないが、本実施の形態の場合、円板状の半導体素子150の形状に対応し、円板状で中継端子130を保持する保持部141と、脚部142と、支持部143と、位置決部144とを一体に備えている。   The shape of the holding member 140 is not particularly limited. In the case of the present embodiment, the holding member 140 corresponds to the shape of the disk-shaped semiconductor element 150 and has a disk-shaped holding portion 141 that holds the relay terminal 130. The leg portion 142, the support portion 143, and the positioning portion 144 are integrally provided.

保持部141に中継端子130を保持させる方法は特に限定されるものではないが、例えば、保持部材140形成時に中継端子130を所定の位置に配置するインサート成形や、保持部材140の保持部141に設けた貫通孔に中継端子130を圧入する方法を例示することができる。   The method for holding the relay terminal 130 on the holding portion 141 is not particularly limited. For example, insert molding for arranging the relay terminal 130 at a predetermined position when the holding member 140 is formed, or on the holding portion 141 of the holding member 140. A method of press-fitting the relay terminal 130 into the provided through hole can be exemplified.

保持部141は、複数の中継端子130を所定の間隔で保持する部分であり、中継端子130の配線基板110に対向する面、および半導体素子150に対向する面が露出するように保持している。保持部141の全体形状は、半導体素子150の形状に対応して円板状である。   The holding portion 141 is a portion that holds the plurality of relay terminals 130 at a predetermined interval, and holds the surface of the relay terminals 130 facing the wiring substrate 110 and the surface facing the semiconductor element 150 so as to be exposed. . The overall shape of the holding portion 141 is a disc shape corresponding to the shape of the semiconductor element 150.

脚部142は、配線基板110に対し中継端子130を所定間隔で維持する部分である。本実施の形態の場合、脚部142は、保持部141の周縁から配線基板110に向かって突出状に配置されている。脚部142によって、配線基板110と中継端子130との間隔が定まるため、第一はんだ121を溶融させた際に、第一はんだ121への押付荷重を軽減、または無くすことができる。従って、冷却後の第一はんだ121の厚さを脚部142がない場合より厚くすることが可能となり、第一はんだ121を線膨張率の違いによる歪に対し抗することができる大きさにすることができる。   The leg portion 142 is a portion that maintains the relay terminal 130 at a predetermined interval with respect to the wiring board 110. In the case of the present embodiment, the leg portion 142 is disposed so as to protrude from the peripheral edge of the holding portion 141 toward the wiring board 110. Since the leg 142 determines the distance between the wiring substrate 110 and the relay terminal 130, the pressing load on the first solder 121 can be reduced or eliminated when the first solder 121 is melted. Therefore, the thickness of the first solder 121 after cooling can be made thicker than the case where there is no leg portion 142, and the first solder 121 has a size that can resist the distortion due to the difference in linear expansion coefficient. be able to.

支持部143は、中継端子130に対し半導体素子150を所定間隔で維持する部分である。本実施の形態の場合、支持部143は、保持部141の周縁から半導体素子150に向かって突出状に配置され、半導体素子150の電極が設けられている部分に当接する。支持部143は、脚部142と同じように、中継端子130と半導体素子150の間隔を維持することができるため、第二はんだ122を溶融させた際に、第二はんだ122への押付荷重を軽減、または無くすことができる。従って、冷却後の第二はんだ122の厚さを支持部143がない場合より厚くすることが可能となり、第二はんだ122を線膨張率の違いによる歪に対し抗することができる大きさにすることができる。   The support portion 143 is a portion that maintains the semiconductor element 150 at a predetermined interval with respect to the relay terminal 130. In the case of the present embodiment, the support portion 143 is disposed so as to protrude from the peripheral edge of the holding portion 141 toward the semiconductor element 150 and abuts on a portion where the electrode of the semiconductor element 150 is provided. Since the support portion 143 can maintain the distance between the relay terminal 130 and the semiconductor element 150 in the same manner as the leg portion 142, when the second solder 122 is melted, the pressing load applied to the second solder 122 is reduced. Can be reduced or eliminated. Therefore, it becomes possible to make the thickness of the second solder 122 after cooling thicker than the case where the support portion 143 is not provided, and to make the second solder 122 large enough to resist distortion due to the difference in linear expansion coefficient. be able to.

位置決部144は、半導体素子150と中継端子130との位置関係を決定する部分である。本実施の形態の場合、位置決部144は、保持部141の周縁から半導体素子150向かって突出状に配置され、半導体素子150側面に当接する。位置決部144は、半導体素子150が平面視の形状と一致する貫通孔を備えた筒であり、半導体素子150を位置決部144の貫通孔に嵌め合わせることで、半導体素子150の回転方向を含む位置を決定することができる。   The positioning unit 144 is a part that determines the positional relationship between the semiconductor element 150 and the relay terminal 130. In the case of the present embodiment, the positioning portion 144 is disposed so as to protrude from the peripheral edge of the holding portion 141 toward the semiconductor element 150 and contacts the side surface of the semiconductor element 150. The positioning unit 144 is a cylinder having a through hole in which the semiconductor element 150 matches the shape in plan view. By fitting the semiconductor element 150 into the through hole of the positioning unit 144, the rotation direction of the semiconductor element 150 is changed. The location to include can be determined.

第一はんだ121は、配線基板110の配線部材112と中継端子130とを電気的に接続する部材である。第一はんだ121の種類は、特に限定されるものではないが、本実施の形態の場合、半導体素子150は、配線基板110に表面実装されるため、第一はんだ121は、はんだの粉末にフラックスを加えてペースト状にしたいわゆるクリームはんだをリフロー炉などにより加熱溶融させ、溶融後に冷却させて固化させたものである。   The first solder 121 is a member that electrically connects the wiring member 112 of the wiring substrate 110 and the relay terminal 130. The type of the first solder 121 is not particularly limited, but in the case of the present embodiment, since the semiconductor element 150 is surface-mounted on the wiring substrate 110, the first solder 121 is fluxed to the solder powder. A so-called cream solder made into a paste by adding is heated and melted in a reflow oven or the like, and cooled and solidified after melting.

第二はんだ122は、中継端子130と半導体素子150のゲート電極151、ドレイン電極152、およびソース電極153などの電極とを電気的に接続する部材である。第二はんだ122の種類は、特に限定されるものではなく、第一はんだ121と同じでなくてもよいが、本実施の形態の場合は第一はんだ121と同じ種類が用いられている。   The second solder 122 is a member that electrically connects the relay terminal 130 and electrodes such as the gate electrode 151, the drain electrode 152, and the source electrode 153 of the semiconductor element 150. The type of the second solder 122 is not particularly limited and may not be the same as the first solder 121, but in the present embodiment, the same type as the first solder 121 is used.

上記実施の形態で説明した回路基板100によれば、配線基板110と半導体素子150とを第一はんだ121、および第二はんだ122を用いて電気的に接続している。つまり保持部材140に保持された中継端子130を介することで、中継端子130を用いない場合に比べて、倍程度のハンダの厚さで配線基板110と半導体素子150とを接続している。従って、図6の(a)の部分に示す回路基板100の状態から、図6の(b)の部分に示すように、温度の上昇により半導体素子150の電極の間隔の広がりよりも配線基板110の配線部材112の間隔が広くなった場合でも、第一はんだ121、および第二はんだ122に加えられる応力が抑制され、歪の発生が抑制されるため、クラックによる抵抗の増加、破断による絶縁などを抑制することが可能となる。   According to the circuit board 100 described in the above embodiment, the wiring board 110 and the semiconductor element 150 are electrically connected using the first solder 121 and the second solder 122. That is, through the relay terminal 130 held by the holding member 140, the wiring board 110 and the semiconductor element 150 are connected with a solder thickness approximately twice that of the case where the relay terminal 130 is not used. Therefore, from the state of the circuit board 100 shown in the part of FIG. 6A, as shown in the part of FIG. Even when the interval between the wiring members 112 is increased, the stress applied to the first solder 121 and the second solder 122 is suppressed, and the generation of strain is suppressed, so that an increase in resistance due to cracks, insulation due to breakage, etc. Can be suppressed.

さらに、保持部材140の線膨張係数を配線基板110よりも半導体素子150に近くなるように調整することにより、半導体素子150の電極に対する負担を軽減することができ、電極の剥がれ等を軽減できる。   Furthermore, by adjusting the linear expansion coefficient of the holding member 140 so as to be closer to the semiconductor element 150 than the wiring substrate 110, the burden on the electrode of the semiconductor element 150 can be reduced, and peeling of the electrode can be reduced.

なお、本発明は、上記実施の形態に限定されるものではない。例えば、本明細書において記載した構成要素を任意に組み合わせて、また、構成要素のいくつかを除外して実現される別の実施の形態を本発明の実施の形態としてもよい。また、上記実施の形態に対して本発明の主旨、すなわち、請求の範囲に記載される文言が示す意味を逸脱しない範囲で当業者が思いつく各種変形を施して得られる変形例も本発明に含まれる。   The present invention is not limited to the above embodiment. For example, another embodiment realized by arbitrarily combining the components described in this specification and excluding some of the components may be used as an embodiment of the present invention. In addition, the present invention includes modifications obtained by making various modifications conceivable by those skilled in the art without departing from the gist of the present invention, that is, the meaning of the words described in the claims. It is.

例えば、半導体素子150を平面視円板形状として説明したが、半導体素子150は、矩形など任意の形状を採用しうる。また、1つの半導体素子150に、ゲート電極151、ドレイン電極152、およびソース電極153の3つの電極が存在する場合を説明したが、1つの半導体素子150が複数のMOSFETなどの機能部を備え、4以上の複数の電極を一面に備えていてもかまわない。この場合、中継端子130は、保持部材140により半導体素子150の電極に対応する位置に半導体素子150と同じ個数配置されてもかまわない。   For example, the semiconductor element 150 has been described as having a disk shape in plan view, but the semiconductor element 150 may adopt any shape such as a rectangle. In addition, although the case where three electrodes of the gate electrode 151, the drain electrode 152, and the source electrode 153 exist in one semiconductor element 150, one semiconductor element 150 includes a functional unit such as a plurality of MOSFETs, Four or more electrodes may be provided on one surface. In this case, the same number of relay terminals 130 as the semiconductor elements 150 may be arranged at positions corresponding to the electrodes of the semiconductor elements 150 by the holding members 140.

また、保持部材140が、1つの半導体素子150を支持する場合を説明したが、1つの保持部材140が複数の半導体素子150を支持してもかまわない。この場合、支持する複数の半導体素子150がそれぞれ備える電極に対応して保持部材140は中継端子130を保持する。   Further, the case where the holding member 140 supports one semiconductor element 150 has been described, but one holding member 140 may support a plurality of semiconductor elements 150. In this case, the holding member 140 holds the relay terminal 130 corresponding to the electrode provided in each of the plurality of semiconductor elements 150 to be supported.

本発明は、電動パワーステアリング様のモータの制御、車両を駆動するためのモータの制御、車両を操舵するためのモータの制御など用いられる回路基板に利用できる。さらに、モータの制御に限定されず、温度変化の激しい環境で用いられる回路基板100に利用可能である。   INDUSTRIAL APPLICABILITY The present invention can be applied to a circuit board used for control of a motor like an electric power steering, control of a motor for driving a vehicle, control of a motor for steering a vehicle, and the like. Further, the present invention is not limited to the motor control, and can be used for the circuit board 100 used in an environment where the temperature changes rapidly.

100:回路基板、110:配線基板、111:基板、112:配線部材、130:中継端子、140:保持部材、141:保持部、142:脚部、143:支持部、144:位置決部、150:半導体素子、151:ゲート電極、152:ドレイン電極、153:ソース電極、159:ヒートシンク   100: circuit board, 110: wiring board, 111: board, 112: wiring member, 130: relay terminal, 140: holding member, 141: holding part, 142: leg part, 143: support part, 144: positioning part, 150: Semiconductor element, 151: Gate electrode, 152: Drain electrode, 153: Source electrode, 159: Heat sink

Claims (3)

配線基板と、
前記配線基板に実装される半導体素子と、
前記半導体素子の電極と前記配線基板の配線部材との間に配置される導電性を備えた複数の中継端子と、
複数の前記中継端子を絶縁状態で保持する保持部材と、
前記配線基板の配線部材と前記中継端子とを電気的に接続する第一はんだと、
前記中継端子と前記半導体素子の電極とを電気的に接続する第二はんだと
を備える回路基板。
A wiring board;
A semiconductor element mounted on the wiring board;
A plurality of relay terminals having conductivity disposed between the electrode of the semiconductor element and the wiring member of the wiring board;
A holding member that holds the plurality of relay terminals in an insulated state;
A first solder that electrically connects the wiring member of the wiring board and the relay terminal;
A circuit board provided with the 2nd solder which electrically connects the relay terminal and the electrode of the semiconductor element.
前記保持部材は、前記配線基板に対し前記中継端子を所定間隔で維持する脚部を有する
請求項1に記載の回路基板。
The circuit board according to claim 1, wherein the holding member includes legs that maintain the relay terminals at a predetermined interval with respect to the wiring board.
前記保持部材は、前記中継端子に対し前記半導体素子を所定間隔で維持する支持部を有する
請求項1または2に記載の回路基板。
The circuit board according to claim 1, wherein the holding member includes a support portion that maintains the semiconductor element at a predetermined interval with respect to the relay terminal.
JP2018075626A 2018-04-10 2018-04-10 Circuit-board Pending JP2019186389A (en)

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Publication Number Publication Date
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Country Link
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