JP2019161356A - Temperature management device, temperature management system, temperature management method, and program - Google Patents

Abstract

To appropriately monitor a temperature on the basis of a temperature distribution imaged by a thermal camera at an arbitrary position.SOLUTION: A temperature management device comprises: a temperature distribution acquiring unit for acquiring temperature distribution in an imaging range by a thermal camera; a partial region identifying unit for identifying a partial region including the imaging range out of a plurality of partial regions obtained by dividing a measuring region of temperature; and a temperature recording unit for recording a representative temperature of the temperature distribution related to an imaging range included in the partial region in association with the identified partial region.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a temperature management device, a temperature management system, a temperature management method, and a program.

  Patent Document 1 discloses a technique for assisting movement of a moving body that travels in a plant.

Japanese Patent No. 5106903

By the way, a technique for detecting an abnormality in a plant using a fixed point observation image obtained by a thermal camera (for example, an infrared camera) installed in the plant is known. That is, by using the fixed point observation image of the thermal camera, it is possible to detect a change in temperature at a predetermined location in the plant.
On the other hand, since the cost of the thermal camera is high, there is a demand for detecting an abnormality of the entire plant with a small number of thermal cameras. By attaching a thermal camera to the moving body described in Patent Document 1, it is possible to measure the temperature of many places with a small number of thermal cameras, but there are errors in traveling and self-position estimation of the moving body. Moreover, since the thermal image has a blurred outline as compared with the visible light image, it is difficult to obtain a fixed-point observation image with a thermal camera attached to the moving body. The thermal image is represented by the intensity of infrared rays emitted from the object. Since infrared rays are emitted radially from the object, the outline of the object in the thermal image becomes blurred as the distance between the thermal camera and the object increases.
An object of the present invention is to provide a temperature management device, a temperature management system, a temperature management method, and a program capable of appropriately monitoring temperature based on a temperature distribution captured by a thermal camera at an arbitrary position. is there.

  According to the first aspect of the present invention, the temperature management device includes: a temperature distribution acquisition unit that acquires a temperature distribution of an imaging range by a thermal camera; and the imaging among a plurality of partial areas divided from a temperature measurement area A partial region specifying unit that specifies a partial region including a range; and a temperature recording unit that records a representative temperature of a temperature distribution related to the imaging range included in the partial region in association with the specified partial region. .

  According to the second aspect of the present invention, in the temperature management device according to the first aspect, the temperature distribution acquisition unit acquires the temperature distribution for each measurement time period, and the temperature recording unit includes the measurement time period. Separately, the representative temperature of the temperature distribution related to the imaging range that is measured in the measurement time zone and included in the partial area may be recorded in association with the specified partial area.

  According to the third aspect of the present invention, the temperature management device according to the second aspect includes a temperature time-series output unit that outputs the temperature according to the measurement time zone associated with the designated partial region. It may be.

  According to a fourth aspect of the present invention, in the temperature management device according to the third aspect, the temperature time-series output unit is associated with each of a plurality of partial areas located on a transverse line of the designated measurement area. Alternatively, the temperature may be output for each measurement time zone.

  According to a fifth aspect of the present invention, the temperature management device according to any one of the first to fourth aspects includes the measurement based on the temperatures of the plurality of partial regions recorded by the temperature recording unit. An abnormality specifying unit that specifies a partial region where an abnormality has occurred in the region may be provided.

  According to the sixth aspect of the present invention, the temperature management device according to the fifth aspect provides an abnormality in each of the plurality of partial regions based on the normal temperature of each of the plurality of partial regions and the state of the measurement region. A threshold value determining unit that determines a threshold value used for specifying the plurality of partial regions, wherein the abnormality specifying unit has an abnormality based on the temperature of each of the plurality of partial regions and the threshold value of each of the plurality of partial regions. The partial area may be specified.

  According to a seventh aspect of the present invention, in the temperature management device according to the sixth aspect, the threshold value determination unit determines the correction values of the plurality of partial regions based on the environmental temperature of the measurement region, A threshold value for each of the plurality of partial regions may be determined based on normal temperatures of the plurality of partial regions and correction values for the plurality of partial regions.

  According to an eighth aspect of the present invention, in the temperature management device according to the sixth or seventh aspect, the threshold value determining unit is located based on the state of the device provided in the measurement area. The correction value of the partial area may be determined, and the threshold value of the partial area where the device is located may be determined based on the normal temperature of the partial region where the device is located and the correction value.

  According to a ninth aspect of the present invention, in the temperature management device according to any one of the sixth to eighth aspects, the threshold value determination unit is configured based on the state of the device provided in the measurement area. Determining a correction value of the partial region in the vicinity of the device, and determining a threshold value of the partial region in the vicinity of the device based on the normal temperature of the partial region in which the device is located and the correction value. Good.

  According to a tenth aspect of the present invention, the temperature management device according to any one of the fifth to ninth aspects is configured such that the plurality of portions are based on the temperatures of the plurality of partial regions in a plurality of measurement time zones. A normal temperature specifying unit for specifying a normal temperature of each of the regions, wherein the abnormality specifying unit compares the temperature of each of the plurality of partial regions with the normal temperature of each of the plurality of partial regions, so that the abnormality is detected. You may identify the partial area | region which has generate | occur | produced.

  According to the eleventh aspect of the present invention, the temperature management device according to any one of the first to tenth aspects changes the shape of the plurality of partial areas for a specific range in the measurement area. May further be provided.

  According to a twelfth aspect of the present invention, in the temperature management device according to the eleventh aspect, the measurement region is divided into the plurality of partial regions by a grid, and the shape changing unit covers the specific range. The size of the grid may be changed.

  According to a thirteenth aspect of the present invention, a temperature management device according to any one of the first to twelfth aspects is a moving device and a thermal camera that is installed in the moving device and measures a temperature distribution in an imaging range. A position specifying device for specifying a position, wherein the temperature distribution acquisition unit acquires the temperature distribution measured by the thermal camera, and the partial region specifying unit is arranged at the position specified by the position specifying device. A partial region including the imaging range may be specified based on the basis.

  According to a fourteenth aspect of the present invention, the temperature management device according to the thirteenth aspect specifies a blind spot of the thermal camera in the measurement area based on the temperature distribution, and a three-dimensional map of the measurement area And a route calculation unit that calculates a route for moving the moving device to a position where the blind spot can be imaged.

  According to a fifteenth aspect of the present invention, in the temperature management device according to the fourteenth aspect, the path calculation unit is configured to determine the path based on the temperature related to the temperature distribution and the normal temperatures of the plurality of partial regions. It may be determined whether or not is calculated.

  According to a sixteenth aspect of the present invention, the temperature management device according to the fourteenth or fifteenth aspect further includes a distance measurement device that measures a distance distribution of the imaging range, and the path calculation unit includes the distance distribution. It may be determined whether or not there is an obstacle on the route based on the above, and when there is the obstacle on the route, a route that avoids the obstacle may be calculated.

  According to a seventeenth aspect of the present invention, a temperature management system includes the temperature management device according to any one of the first to twelfth aspects and a moving body, and the moving body includes the moving device and the moving device. A thermal camera for measuring the temperature distribution of the imaging range and a position specifying device for specifying the position, wherein the temperature distribution acquisition unit acquires the temperature distribution measured by the thermal camera, and the partial region The specifying unit specifies a partial region including the imaging range based on the position specified by the position specifying device.

  According to an eighteenth aspect of the present invention, in the temperature management system according to the seventeenth aspect, the moving body measures a distance distribution of the imaging range, and the position specified by the position specifying device. And a three-dimensional temperature distribution that generates a three-dimensional temperature distribution in which the temperature distribution is associated with the three-dimensional position information based on the distance distribution measured by the distance measuring device and the temperature distribution measured by the thermal camera. And a generation device.

  According to a nineteenth aspect of the present invention, a temperature management method includes the step of acquiring a temperature distribution of an imaging range by a thermal camera, and the imaging range among a plurality of partial areas divided from a temperature measurement area And a step of recording a representative temperature of a temperature distribution related to the imaging range included in the partial region in association with the identified partial region.

  According to the twentieth aspect of the present invention, the program acquires the temperature distribution of the imaging range by the thermal camera in a computer, and the imaging range is a plurality of partial areas divided from the temperature measurement area. A step of specifying the included partial region and a step of recording a representative temperature of the temperature distribution related to the imaging range included in the partial region in association with the specified partial region are executed.

  According to at least one of the above aspects, the temperature management device can appropriately monitor the temperature based on the temperature distribution captured by the thermal camera at an arbitrary position.

It is the schematic showing the structure of the abnormality detection system which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the patrol inspection apparatus which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows operation | movement of the patrol inspection apparatus which concerns on one Embodiment of this invention. It is a flowchart showing the temperature map update process of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a figure showing the example of the update process of the temperature map which concerns on one Embodiment of this invention. It is a flowchart which shows the abnormality detection process of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the temperature map output process of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a figure which shows the example of the screen which displays the temperature map which concerns on one Embodiment of this invention. It is a figure which shows the example of the temperature time series screen which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a figure which shows the example of the relationship between normal temperature and a threshold value when environmental temperature differs in one Embodiment of this invention. It is a figure which shows the example of the relationship between normal temperature and a threshold value when the load of an apparatus differs in one Embodiment of this invention. It is a figure which shows the example of the relationship between normal temperature and a threshold value when the radiant heat of an apparatus differs in one Embodiment of this invention. It is a flowchart which shows the abnormality detection process of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the temperature map output process of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a figure which shows the example of the change of the shape of the partial area which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the update process of the normal temperature map of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a figure which shows the example of the normal temperature map before and behind the update which concerns on one Embodiment of this invention. It is an external view which shows the structure of the patrol inspection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the temperature map update process of the patrol inspection apparatus which concerns on one Embodiment of this invention. It is the schematic which shows the structure of the abnormality detection apparatus which concerns on one Embodiment of this invention. It is a flowchart which shows the temperature map update process of the patrol inspection apparatus which concerns on one Embodiment of this invention. It is a figure showing the example of the update process of the temperature map which concerns on one Embodiment of this invention. It is a schematic block diagram which shows the structure of the computer which concerns on at least 1 embodiment of this invention.

<First Embodiment>
"overall structure"
Hereinafter, embodiments will be described in detail with reference to the drawings.
FIG. 1 is a schematic diagram illustrating a configuration of an abnormality detection system according to an embodiment of the present invention.
The abnormality detection system 1 is a system for monitoring the temperature of the target facility P such as a plant and detecting an abnormality of the target facility P. The abnormality detection system 1 includes a patrol inspection device 10 and an abnormality detection device 20. The abnormality detection system 1 is an example of a temperature management system. The abnormality detection device 20 is an example of a temperature management device.
The patrol inspection device 10 includes a thermal camera 13 and travels along a predetermined route. Thereby, the patrol inspection apparatus 10 measures the temperature distribution in the target facility P while traveling along the route. The patrol inspection device 10 is an example of a moving object.
Based on the temperature distribution measured by the patrol inspection device 10, the abnormality detection device 20 maps the temperature to a planar map obtained by planarly viewing the target facility P from the height direction. Hereinafter, the planar map in which the temperature is mapped is referred to as a temperature map M. In addition, since there is no value of the temperature map M before the start of the patrol by the patrol inspection device 10 (at the first activation), the average value of the ambient temperature of the target facility P, the design value of the temperature of the target facility P, or the initial value Actual values of other target facilities P may be recorded. The abnormality detection device 20 identifies a location where an abnormality has occurred in the target facility P based on the temperature map M. The abnormality detection device 20 may be provided in the target facility P, or may be provided in a place remote from the target facility P. Further, the abnormality detection device 20 may be provided in the patrol inspection device 10.

<Configuration of patrol inspection device>
FIG. 2 is a schematic diagram showing a configuration of a patrol inspection device according to an embodiment of the present invention.
The traveling inspection device 10 includes a main body 11, a moving device 12, a thermal camera 13, a depth camera 14, and a control device 15.

The main body 11 is a casing that forms an outline of the patrol inspection device 10 and includes the control device 15.
The moving device 12 supports the main body 11 so that it can run. Examples of the moving device 12 include a wheel, an endless track, a leg mechanism, and the like. In addition, by adopting an endless track as shown in FIG. 2 as the moving device 12, it is possible to turn on the spot, and the turning radius of the patrol inspection device 10 can be reduced. Moreover, the patrol inspection apparatus 10 may move underwater or in the air. In this case, a thruster such as a propeller is used as the moving device 12. The mobile device 12 travels according to a signal output from the control device 15.

  The thermal camera 13 is attached to the main body 11 and acquires the temperature distribution T of the object in the imaging direction. The thermal camera 13 is attached so as to face the moving direction of the moving device 12, for example. The temperature distribution T represents a temperature distribution on a two-dimensional plane that represents the imaging range of the thermal camera 13. The thermal camera 13 is realized by, for example, an infrared camera.

  The depth camera 14 is attached to the main body 11 so as to face substantially the same direction as the thermal camera 13, and acquires the distance distribution L from the depth camera 14 to the object in the imaging direction. The distance distribution L represents a distribution of distances on a two-dimensional plane that represents the imaging range of the depth camera 14. The depth camera 14 is realized by, for example, a ToF (Time of Flight) camera. The depth camera 14 is an example of a distance measuring device. Note that the patrol inspection device 10 according to another embodiment may include another distance measurement device such as a LiDAR (Light Detection and Ranging) device or a binocular stereo camera, instead of the depth camera 14.

The control device 15 detects the position and orientation of the patrol inspection device 10 and controls the traveling of the mobile device 12 according to a predetermined route. For example, the control device 15 may detect the position and direction based on a signal related to GNSS (Global Navigation Satellite System), or may detect the position and direction by autonomous navigation based on an unillustrated direction sensor and distance sensor. Alternatively, the position and orientation may be detected by SLAM (Simultaneous Localization and Mapping) using the distance distribution output by the depth camera 14. The control device 15 may use a visible light image in combination when detecting its own position and orientation. The control device 15 is an example of a position specifying device. The route on which the mobile device 12 travels is set such that at least a position where an abnormality should be detected in the target facility P is comprehensively imaged by the thermal camera 13 and the depth camera 14.
Further, the control device 15 transmits the temperature distribution T and the distance distribution L captured by the thermal camera 13 and the depth camera 14 and position information indicating the detected position and orientation to the abnormality detection device 20. At this time, the control device 15 maps the temperature distribution T output from the thermal camera 13 onto the three-dimensional position information D generated based on the distance distribution L output from the depth camera 14 and the position information (three-dimensional). The temperature distribution DT) may be transmitted to the abnormality detection device 20. The control device 15 is an example of a three-dimensional temperature distribution generation device.

<Configuration of abnormality detection device>
FIG. 3 is a schematic diagram showing the configuration of the abnormality detection apparatus according to an embodiment of the present invention.
The abnormality detection device 20 includes a temperature map storage unit 201, a normal temperature map storage unit 202, a temperature distribution acquisition unit 203, a partial region specifying unit 204, a temperature recording unit 205, a map output unit 206, a region specifying unit 207, and a temperature time series output. Unit 208, threshold determination unit 209, and abnormality identification unit 210.

  The temperature map storage unit 201 is a planar map obtained by planarly viewing the target facility P from the height direction, and a temperature map M representing the temperatures of a plurality of partial regions R obtained by dividing a temperature measurement region by a grid having a predetermined size. Remember. The size of the partial region R may be determined based on the position specifying error of the patrol inspection device 10, the operation error, the error of the thermal camera 13, and the like. The temperature map storage unit 201 is generated for each tour by the patrol inspection device 10. The period of the cyclic inspection of the cyclic inspection device 10 is determined in advance, and the temperature map M is generated for each time period from the start time of a certain cyclic inspection to the start time of the next cyclic inspection.

  The normal temperature map storage unit 202 is a planar map obtained by planarly viewing the target facility P from the height direction, and stores a normal temperature map M0 representing the normal temperatures of the plurality of partial regions R having the same size as the temperature map. To do. The normal temperature of each partial area is determined based on, for example, the design value of the device located in the partial area R, the past actual value, and the like.

The temperature distribution acquisition unit 203 acquires the temperature distribution T, the distance distribution L, and the position information from the cyclic inspection device 10.
Based on the temperature distribution T, distance distribution L, and position information acquired by the temperature distribution acquisition unit 203, the partial region specifying unit 204 assigns each temperature represented by the temperature distribution T to any partial region R in the temperature map M. Identify whether it belongs.
The temperature recording unit 205 records the representative temperature of the partial region R in the temperature distribution T acquired by the temperature distribution acquisition unit 203 in the temperature map M for each partial region R specified by the partial region specifying unit 204. Examples of the representative temperature of the temperature distribution T include a maximum value, an average value, or a median value of the temperature distribution T. Note that if the temperature is already recorded in a certain partial region R of the temperature map M, and the representative temperature of the partial region R related to the newly obtained temperature distribution T is higher than the recorded temperature, the temperature The recording unit 205 updates the temperature of the partial region R of the temperature map M with the representative temperature related to the newly obtained temperature distribution T. On the other hand, when the representative temperature related to the newly obtained temperature distribution T is equal to or lower than the recorded temperature, the temperature recording unit 205 does not update the temperature of the partial region R of the temperature map M.
Thereby, the temperature map M records the representative temperature of each partial region R in one cyclic inspection of the cyclic inspection device 10.

  The map output unit 206 outputs the latest temperature map M stored in the temperature map storage unit 201. For example, the map output unit 206 may display the temperature map M on a display (not shown), print it on a printer (not shown), or send it to an external terminal device. The temperature map M may be represented by, for example, a three-dimensional graph in which a plurality of partial regions R are taken on the XY plane and the temperature of each partial region R is taken on the Z axis, or each temperature map on the two-dimensional plane composed of the XY planes. The partial region R may be represented by a thermography in which colors are separately applied according to the temperature.

  The area designating unit 207 accepts designation of a partial area R for which a temperature change is to be confirmed in the temperature map M from the user. The area designating unit 207 according to the present embodiment receives an input of a line L that traverses the measurement area, and sets a plurality of partial areas R positioned on the line L as partial areas R for which a change in temperature is to be confirmed. Line L is an example of a transverse line of the measurement region.

  The temperature time series output unit 208 outputs a temperature time series screen TS representing a time series of temperatures of the plurality of partial regions R specified by the region specifying unit 207. For example, the temperature time series output unit 208 may display the temperature time series screen TS on a display (not shown), may be printed by a printer (not shown), or may be transmitted to an external terminal device. The temperature time series screen TS may be represented by, for example, a three-dimensional graph in which the partial areas R designated on the X axis are arranged, the Y axis is a time axis, and the temperature of each partial area R is taken on the Z axis. Alternatively, a two-dimensional plane in which the partial areas R are arranged on the X axis and the Y axis is a time axis may be represented by an image painted in a color corresponding to the temperature of each partial area R at each time.

  The abnormality specifying unit 210 is a partial region in which an abnormality has occurred based on the temperatures of the plurality of partial regions R specified by the region specifying unit 207 and the normal temperatures of the plurality of partial regions R indicated by the normal temperature map M0. R is specified. The abnormality specifying unit 210 according to the first embodiment determines that an abnormality has occurred in the partial region R when the temperature of the partial region R is equal to or higher than the temperature threshold th specified from the normal temperature.

Next, the operation of the abnormality detection system 1 according to the first embodiment will be described.
《Circuit inspection process of patrol inspection device》
FIG. 4 is a flowchart showing the operation of the patrol inspection device according to one embodiment of the present invention.
The control device 15 of the cyclic inspection device 10 starts traveling control of the moving device 12 along a predetermined route at a predetermined cyclic inspection timing (step S01). During the control of the mobile device 12, the control device 15 measures the position and orientation of the patrol inspection device 10 (step S02). The control device 15 determines whether or not the distance between the position of the patrol inspection device 10 and a predetermined imaging point on the route is less than a predetermined threshold (step S03). That is, the control device 15 determines whether or not the patrol inspection device 10 has reached the imaging point.

  When the distance between the position of the patrol inspection device 10 and a predetermined imaging point on the route is less than a predetermined threshold (step S03: YES), the control device 15 causes the thermal camera 13 to image the temperature distribution T, and the depth The camera 14 is caused to image the distance distribution L (step S04). The traveling inspection device 10 transmits the imaged temperature distribution T and distance distribution L to the abnormality detection device 20 in association with the imaging time and position information indicating the position and orientation of the traveling inspection device 10 at that time ( Step S05).

When the distance between the position of the patrol inspection device 10 and a predetermined imaging point on the route is equal to or greater than a predetermined threshold (step S03: NO), or the temperature distribution T, the distance distribution L, the imaging time, and the position information are detected as an abnormality. 20 (step S05), the control device 15 determines whether or not the distance between the position of the patrol inspection device 10 and the end point of the route is less than a predetermined threshold (step S06). That is, the control device 15 determines whether or not the patrol inspection device 10 has reached the end point of the route. When the distance between the position of the patrol inspection device 10 and the end point of the route is greater than or equal to a predetermined threshold (step S06: NO), the control device 15 returns the process to step S01 and continues the control of the mobile device 12. On the other hand, when the distance between the position of the patrol inspection device 10 and the end point of the route is less than the predetermined threshold (step S06: YES), the control device 15 ends the patrol inspection processing until the next patrol inspection timing. stand by.
According to the above procedure, the patrol inspection device 10 can transmit the temperature distribution T including the position where the abnormality detection of the target facility P is necessary at least to the abnormality detection device 20. In the first embodiment, the patrol inspection device 10 transmits the acquired information to the abnormality detection device 20 in step S05 every time information is acquired at the imaging point, but is not limited thereto. For example, in another embodiment, the patrol inspection device 10 may collectively transmit the information acquired at each imaging point to the abnormality detection device 20 when the route end point is reached in step S6.

《Temperature map update process of abnormality detection device》
FIG. 5 is a flowchart showing the temperature map update process of the abnormality detection device according to the embodiment of the present invention.
FIG. 6 is a diagram illustrating an example of temperature map update processing according to an embodiment of the present invention.
The temperature distribution acquisition unit 203 of the abnormality detection device 20 acquires the temperature distribution T, the distance distribution L, the imaging time, and the position information from the patrol inspection device 10 (step S21). Based on the acquired distance distribution L and position information, the partial region specifying unit 204 specifies the three-dimensional position information D indicating the three-dimensional position of the imaging range of the temperature distribution T as shown in FIG. 6 (step S22). . For example, the partial region specifying unit 204 converts the distance distribution L into the three-dimensional position information D by rotating the coordinate system of the distance distribution L based on the position and orientation included in the position information. When the imaging range of the thermal camera 13 and the imaging range of the depth camera 14 match, the converted three-dimensional position information D represents the three-dimensional position of the imaging range of the temperature distribution T. When the imaging range of the thermal camera 13 and the imaging range of the depth camera 14 do not match, the partial region specifying unit 204 cuts out an overlapping portion with the imaging range of the thermal camera 13 from the three-dimensional position information D.

  The temperature recording unit 205 identifies the three-dimensional temperature distribution DT as shown in FIG. 6 by mapping the temperature distribution T acquired by the temperature distribution acquisition unit 203 to the three-dimensional position information D (step S23). Next, the temperature recording unit 205 selects one of the plurality of partial regions R including the position related to the three-dimensional position information D one by one, and executes the processing from step S25 to step S27 (step S24).

The temperature recording unit 205 specifies a representative temperature at a position included in the selected partial region R from the three-dimensional temperature distribution DT (step S25). Next, the temperature recording unit 205 determines whether or not the identified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M related to the time zone including the acquired imaging time (step S26). ). When the temperature of the partial region R is not recorded in the temperature map M, the temperature recording unit 205 determines that the specified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M. .
When the specified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M (step S26: YES), the temperature recording unit 205 stores the portion of the temperature map M stored in the temperature map storage unit 201. The temperature of region R is rewritten to the temperature specified in step S25 (step S27). On the other hand, when the identified representative temperature is equal to or lower than the temperature of the partial region R already recorded in the temperature map M (step S26: NO), the temperature recording unit 205 does not rewrite the temperature map M.

  When the temperature map M is updated for each partial region R including the position related to the three-dimensional position information D by the processing from step S25 to step S27, the abnormality detection device 20 ends the update processing of the temperature map M and goes around. The inspection apparatus 10 waits for transmission of the next temperature distribution T.

《Abnormality detection processing of abnormality detection device》
FIG. 7 is a flowchart showing an abnormality detection process of the abnormality detection device according to the embodiment of the present invention.
When the temperature map M related to a certain time zone is completed by the temperature recording unit 205, the temperature time-series output unit 208 of the abnormality detection device 20 reads the latest temperature map M from the temperature map storage unit 201, and each temperature map M The temperature related to the partial region R is specified (step S41). The threshold value determination unit 209 reads the normal temperature map M0 from the normal temperature map storage unit 202, and specifies the normal temperature related to each partial region R of the normal temperature map M0 (step S42). The threshold value determination unit 209 determines a temperature threshold value th used for abnormality determination by adding a predetermined offset value to the normal temperature related to each partial region R (step S43). The offset value of each partial region R is determined based on, for example, a safety factor or a temperature change rate with respect to a design value of a device located in the partial region R. The offset value is an example of a correction value.

The abnormality specifying unit 210 compares the temperature of the plurality of partial regions R with the temperature threshold th, and compares the partial region R with the temperature equal to or higher than the temperature threshold th or the temperature related to the previous measurement time zone of the partial region R. It is determined whether or not there is a partial region R whose difference is equal to or greater than a predetermined temperature difference threshold value (step S44). When there is a partial region R whose temperature is equal to or higher than the temperature threshold th or a partial region R whose temperature difference is equal to or higher than the temperature difference threshold (step S44: YES), the abnormality identifying unit 210 determines that the partial region R is abnormal. Then, the location where the abnormality has occurred is output (step S45). For example, the abnormality identification unit 210 notifies the occurrence of abnormality to the mobile terminal owned by the user. Further, for example, the abnormality specifying unit 210 outputs an alarm sound when the occurrence of abnormality is specified. On the other hand, when the temperature is less than the temperature threshold th in all the partial regions R and the temperature difference is less than the temperature difference threshold in all the partial regions R (step S44: NO), the abnormality identifying unit 210 determines that the target facility P Is determined to be normal.
According to the above procedure, the abnormality detection device 20 can detect an abnormal portion of the target facility P based on the captured image of the thermal camera 13 and notify the user of this.

《Temperature map output processing of abnormality detection device》
FIG. 8 is a flowchart showing a temperature map output process of the abnormality detection device according to the embodiment of the present invention.
When the user transmits an output instruction of the temperature map M to the abnormality detection device 20 based on an alert or the like issued by the abnormality detection device 20, the map output unit 206 associates with the latest time zone stored in the temperature map storage unit 201. The obtained temperature map M is output (step S61). The temperature map M is displayed on, for example, a display as shown in FIG. FIG. 9 is a diagram showing an example of a screen that displays a temperature map according to an embodiment of the present invention.
At this time, the region designating unit 207 accepts designation of the partial region R by the line L that crosses the XY plane on the output temperature map M (step S62). For example, when the user selects a partial region R for which a temperature change is to be recognized in the temperature map M by clicking or the like, the region designating unit 207 is a straight line that passes through the clicked partial region R and extends in the Y coordinate direction. A certain line L is specified, and a plurality of partial regions R passing on the line L are specified. Further, for example, when the user selects two points on the XY plane of the temperature map M by clicking or the like, the region designating unit 207 passes through the two clicked points, and the line L that is a straight line extending in the X coordinate direction. And a plurality of partial regions R passing on the line L are specified. Further, the line L that crosses the XY plane is not limited to a straight line, and may be a curved line or a broken line.

  When the region designating unit 207 accepts designation of a plurality of partial regions R, the temperature time-series output unit 208 reads a plurality of (for example, the most recent predetermined number) temperature maps M from the temperature map storage unit 201, and designates the plurality of designated plural regions. The temperature concerning the partial region R is specified (step S63). Further, the threshold value determination unit 209 reads the normal temperature map M0 from the normal temperature map storage unit 202, and specifies normal temperatures related to the specified plurality of partial regions R (step S64). The threshold determination unit 209 determines the temperature threshold th of each partial region R by adding a predetermined offset value to the normal temperature of each partial region R (step S65).

As shown in FIG. 10, the temperature time series output unit 208 displays a temperature time series screen TS that represents the temperature threshold th associated with a plurality of time zones and a plurality of partial regions R, and the time series of temperatures specified in step S63. Output (step S68). FIG. 10 is a diagram showing an example of a temperature time series screen according to an embodiment of the present invention. By outputting the temperature time series screen TS, the user can visually recognize the temperature of the selected partial region R and the temperature threshold th. Thereby, the user can specify the location where abnormality has occurred. For example, the user may estimate that there is an abnormality in the partial region R where the temperature exceeds the temperature threshold th, or may estimate that there is an abnormality in the partial region R whose temperature change rate is relatively high. .
Thereby, the abnormality detection apparatus 20 can make a user visually recognize the condition of abnormality.

《Action ・ Effect》
As described above, the abnormality detection device 20 according to the first embodiment uses the temperature distribution T measured by the thermal camera 13 of the patrol inspection device 10 to appropriately identify the abnormality of the target facility P as a temperature map M. Can be generated. That is, the abnormality detection device 20 maps the temperature distribution T measured by the thermal camera 13 to a plurality of partial regions R that divide the measurement region of the target facility P, so that the position error of the cyclic inspection device 10 and the thermal camera measure the temperature distribution T. Even if there is a blur of the temperature distribution to be performed, information used for abnormality detection based on the temperature can be generated. Further, according to the abnormality detection system 1 according to the first embodiment, the temperature map M of the entire measurement region of the target facility P can be generated from the temperature distribution T at various points measured by one thermal camera 13. it can.

  In addition, the abnormality detection device 20 according to the first embodiment acquires the temperature distribution T for each measurement time zone and measures the temperature distribution T in each measurement time zone in association with each partial region R of the temperature map M. In addition, the representative temperature of the temperature distribution T related to the imaging range included in the partial region R (for example, the highest temperature among the temperature distributions) is recorded. Thereby, since the temperature of the same partial region R is measured from a different time or position, the accuracy of the temperature map M can be improved.

  Further, the abnormality detection device 20 according to the first embodiment receives designation of the partial region R and outputs the temperature of the partial region R for each measurement time zone. That is, the abnormality detection device 20 outputs a time series of the temperature of the designated partial region R. As a result, the user can verify the temperature trend for the suspected abnormality.

  The abnormality detection apparatus 20 according to the first embodiment outputs the temperature for each of the plurality of partial regions R located on the line L that crosses the designated measurement region, for each measurement time zone. Thereby, the user can verify the temperature trend including the periphery of the suspected place.

  The abnormality detection device 20 according to the first embodiment identifies the partial region R in which an abnormality has occurred based on the temperature of each of the plurality of partial regions R related to the temperature map M. Thereby, the abnormality detection apparatus 20 can notify the user of the partial region R in which an abnormality has occurred accurately and early.

<Second Embodiment>
The abnormality detection system 1 according to the first embodiment determines a temperature threshold th used for abnormality determination by adding a predetermined offset value to the normal temperature stored in the normal temperature map storage unit 202. On the other hand, when the target facility P includes a device (for example, a turbine, a boiler, a reactor, or the like) whose temperature changes by operation, the temperature that should be determined as abnormal may vary depending on the operation state of the device. Further, even when the environmental temperature of the target facility P changes in summer or winter, the temperature that should be determined as abnormal may vary depending on the environmental temperature. The abnormality detection system 1 according to the second embodiment determines a threshold used for abnormality determination based on the state of the target facility P.

<Configuration of abnormality detection device>
FIG. 11 is a schematic diagram illustrating a configuration of an abnormality detection apparatus according to an embodiment of the present invention.
The abnormality detection device 20 according to the second embodiment further includes a state acquisition unit 211 in addition to the configuration according to the first embodiment.
The state acquisition unit 211 acquires the state of the target facility P in the measurement time zone related to the temperature map M output by the map output unit 206. Examples of the state of the target facility P include the environmental temperature of the target facility P, the state of equipment installed in the target facility P, and the like. For example, when the target facility P is a gas turbine plant, the state of the equipment of the target facility P includes the fuel flow rate, the load of the gas turbine, the rotational speed of the rotor, the amount of power generation, and the like.

  The threshold determination unit 209 according to the second embodiment determines the threshold based on the state of the target facility P acquired by the state acquisition unit 211. For example, the threshold value determination unit 209 specifies an offset value for obtaining the threshold value based on the state of the target facility P, and determines the threshold value by adding the offset value to the normal temperature.

<Determination method of threshold value>
Specifically, the threshold value determination unit 209 increases the offset value for obtaining the temperature threshold value th from each normal temperature as the environmental temperature of the target facility P is higher. Thereby, as shown in FIG. 12, the threshold value determination unit 209 can increase the temperature threshold value th as the environmental temperature increases. FIG. 12 is a diagram showing an example of the relationship between the normal temperature and the threshold when the environmental temperature is different in one embodiment of the present invention. In the example shown in FIG. 12, the relationship between the normal temperature T0 of each of the partial regions R1 to R5, the temperature threshold th11 when the environmental temperature is the first temperature, and the temperature threshold th12 when the environmental temperature is the second temperature. Indicates. The first temperature is lower than the second temperature. When the environmental temperature is the first temperature, the threshold value determination unit 209 calculates the offset value O11 from the first temperature. The threshold value determination unit 209 determines the temperature threshold value th11 by adding the offset value O11 to the normal temperature T0 of each of the partial regions R1 to R5. On the other hand, when the environmental temperature is the second temperature, the threshold value determination unit 209 calculates the offset value O12 from the second temperature. Since the offset value increases as the environmental temperature increases, the offset value O12 is greater than the offset value O11. The threshold determination unit 209 determines a temperature threshold th12 higher than the temperature threshold th11 by adding the offset value O12 to the normal temperature T0 of each of the partial regions R1 to R5. Thus, the threshold value determination unit 209 can obtain an appropriate temperature threshold value th according to the environmental temperature of the target facility P acquired by the state acquisition unit 211.

  Moreover, the threshold value determination unit 209 increases the offset value related to the normal temperature of the partial region R where the device is located as the load on the device in the target facility P is higher. Thereby, as shown in FIG. 13, the threshold value determination unit 209 can increase the temperature threshold th of the partial region where the device is located, as the load on the device is higher. FIG. 13 is a diagram illustrating an example of the relationship between the normal temperature and the threshold when the load on the device is different in the embodiment of the present invention. In the example shown in FIG. 13, the normal temperature T0 of each of the partial regions R1 to R5, the temperature threshold th21 when the load of the device located in the partial region R3 is the first load, and the load of the device is the second load. A relationship with a temperature threshold th22 in a case is shown. The first load is lower than the second load. When the load of the device is the first load, the threshold value determination unit 209 calculates the offset value O21 from the first load. The threshold value determination unit 209 determines the temperature threshold value th21 by adding the offset value O21 to the normal temperature T0 of the partial region R3 where the device is located. On the other hand, when the load of the device is the second load, the threshold value determination unit 209 calculates the offset value O22 from the second load. Since the offset value increases as the load on the device increases, the offset value O22 is greater than the offset value O21. The threshold determination unit 209 determines a temperature threshold th22 higher than the temperature threshold th21 by adding the offset value O22 to the normal temperature T0 of the partial region R3 where the device is located. As described above, the threshold value determination unit 209 can obtain an appropriate temperature threshold value th according to the load on the device of the target facility P acquired by the state acquisition unit 211.

  Moreover, the threshold value determination part 209 increases the offset value which concerns on the normal temperature of the partial area | region R in which the said surrounding apparatus is located, when the temperature of the surrounding apparatus of the said apparatus rises by the influence of the radiant heat of the apparatus of the target facility P Let Thereby, the threshold value determination part 209 can make the threshold value of the partial area | region R around the high load apparatus high, as shown in FIG. FIG. 14 is a diagram illustrating an example of the relationship between the normal temperature and the threshold when the radiant heat of the devices is different in the embodiment of the present invention. In the example shown in FIG. 14, the normal temperature T0 of each of the partial regions R1 to R5, the temperature threshold th21 when the load of the device located in the partial region R3 is the first load, and the load of the device is the second load. The relationship between the temperature threshold th22 and the temperature threshold th23 in a case is shown. The first load is lower than the second load. When the load of the device is the second load, when the radiant heat of the device affects the adjacent partial regions R2 and R4, the threshold value determination unit 209 calculates the offset value O22 and the offset value O23 from the second load. To do. The offset value O22 is an offset value related to the partial region R where the device operating with the second load is located, and the offset value O23 is an offset value related to the partial region R in the vicinity of the device operating with the second load. The offset value O23 is a value smaller than the offset value O22. The threshold value determination unit 209 determines the temperature threshold value th22 by adding the offset value O22 to the normal temperature T0 of the partial region R3 where the device operating with the second load is located. Further, the threshold value determination unit 209 adds the offset value O23 to the normal temperature T0 of the partial regions R2 and R4 in the vicinity of the device operating with the second load, so that the temperature threshold value th23 that is higher than the temperature threshold value th21 and lower than the temperature threshold value th22. To decide. As described above, the threshold value determination unit 209 can determine an appropriate temperature threshold value th according to the influence of the radiant heat of the equipment of the target facility P acquired by the state acquisition unit 211.

Next, the operation of the abnormality detection system according to the second embodiment will be described.
The cyclic inspection process by the cyclic inspection apparatus 10 and the temperature map update process by the abnormality detection apparatus 20 are the same as those in the first embodiment.

《Abnormality detection processing of abnormality detection device》
FIG. 15 is a flowchart showing an abnormality detection process of the abnormality detection device according to the embodiment of the present invention.
The temperature time series output unit 208 of the abnormality detection device 20 reads the latest temperature map from the temperature map storage unit 201 and identifies the temperature related to each partial region R of each temperature map M (step S141). Next, the state acquisition unit 211 acquires the state information (environment temperature information and device operation information) of the target facility P from the management device or the like of the target facility P (step S142). Further, the threshold value determination unit 209 reads the normal temperature map M0 from the normal temperature map storage unit 202, and specifies the normal temperature related to each partial region R (step S143). The threshold determination unit 209 determines an offset value of the temperature threshold th for the temperature in each partial region R based on the acquired state information (Step S144). That is, the threshold value determination unit 209 increases the offset value of each partial region R as the environmental temperature of the target facility P is higher based on the environmental temperature information acquired by the state acquisition unit 211. Further, the threshold value determination unit 209 increases the offset value of the partial region R where the device is located, as the load on the device of the target facility P is higher, based on the device operation information acquired by the state acquisition unit 211. The offset value of the partial region R in the vicinity of the device is increased. The threshold value determination unit 209 determines the temperature threshold value th by adding the determined offset value to the normal temperature related to each partial region R (step S145).

  The abnormality specifying unit 210 compares the temperature and the threshold for each partial region R, and the difference between the partial region R where the temperature is equal to or higher than the temperature threshold th or the temperature related to the previous measurement time zone of the partial region R is predetermined. It is determined whether or not there is a partial region R that is equal to or greater than the temperature difference threshold (step S146). When there is a partial region R whose temperature is equal to or higher than the temperature threshold th, or when there is a partial region R whose temperature difference is equal to or higher than the temperature difference threshold (step S146: YES), it is determined that the partial region R is abnormal. The occurrence location is output (step S147). On the other hand, when the temperature is less than the temperature threshold th in all the partial regions R and the temperature difference is less than the temperature difference threshold in all the partial regions R (step S146: NO), the abnormality identifying unit 210 determines that the target facility P Is determined to be normal.

《Temperature map output processing of abnormality detection device》
FIG. 16 is a flowchart showing a temperature map output process of the abnormality detection device according to the embodiment of the present invention.
When the user transmits an output instruction of the temperature map M to the abnormality detection device 20, the map output unit 206 outputs the temperature map M associated with the newest time zone stored in the temperature map storage unit 201 (step S161). . The temperature map M is displayed on a display, for example.
At this time, the region designating unit 207 accepts designation of the partial region R by a line L that crosses the XY plane on the output temperature map M (step S162). When the region designating unit 207 receives designation of a plurality of partial regions R, the temperature time-series output unit 208 reads the plurality of temperature maps M from the temperature map storage unit 201, and the plurality of partial regions specified in each temperature map M. The time series of the temperature concerning R is specified (step S163). Next, the state acquisition unit 211 acquires the state of the device in each measurement time zone of the target facility P from the management device or the like of the target facility P (step S164). In addition, the threshold value determination unit 209 reads the normal temperature map M0 from the normal temperature map storage unit 202, and specifies normal temperatures related to the specified plurality of partial regions R (step S165). The threshold determination unit 209 determines an offset value for the temperature in each partial region R in each measurement time zone in the temperature time series based on the device state acquired by the state acquisition unit 211 (step S166). The threshold value determination unit 209 determines the temperature threshold value th related to each measurement time zone of each partial region R by adding the offset value related to each measurement time zone of each partial region R to the normal temperature of each partial region R. (Step S167).

  The temperature time-series output unit 208 outputs a temperature time-series screen TS representing the threshold value th associated with each measurement time zone of each partial region R and the time series of the temperature specified in step S163 (step S168). By outputting the temperature time series screen TS, the user can visually recognize the temperature of the selected partial region R and the temperature threshold th, and can identify the location where an abnormality has occurred.

《Action ・ Effect》
As described above, the abnormality detection device 20 according to the second embodiment identifies the partial region R in which an abnormality has occurred based on the temperature of each of the partial regions R and the state of each partial region R. . Specifically, the abnormality detection device 20 according to the second embodiment determines the temperature threshold th used for detecting an abnormality based on the normal temperatures of the plurality of partial regions R and the states of the plurality of partial regions R. As a result, the abnormality detection device 20 appropriately identifies the occurrence of an abnormality even in the partial region R in which the temperature temporarily rises or falls due to the environmental temperature of the target facility P, the operation of the equipment, or the like. Can do.

  Note that the abnormality detection device 20 according to the second embodiment determines the offset value of the temperature threshold th based on the state of the target facility P, and determines the temperature threshold th by adding the normal temperature and the offset value. However, it is not limited to this. For example, the abnormality detection apparatus 20 according to another embodiment may determine the scale threshold based on the state of the target facility P and determine the temperature threshold th by multiplying the normal temperature by the scale coefficient. In addition, the abnormality detection device 20 according to another embodiment determines an offset value and a scale coefficient based on the state of the target facility P, multiplies the normal temperature by the scale coefficient, and adds the offset value to the temperature. The threshold th may be determined. Both the offset value and the scale factor are examples of correction values.

<Third Embodiment>
As shown in FIG. 9, the abnormality detection system 1 according to the first and second embodiments generates a temperature map M representing the temperatures of a plurality of partial regions R obtained by dividing a measurement region by a grid having a predetermined size. . On the other hand, the level of detection of the required abnormality may vary depending on the equipment that constitutes the target facility P, or depending on internal or external factors of the target facility P. For example, the main equipment, the place where equipment is crowded, the equipment in operation, etc. among the equipment constituting the target facility P may be required to be detected in a finer range than other places. . The abnormality detection system 1 described in the third embodiment dynamically changes the size of the partial region R to generate the temperature map M and detects an abnormality.

<Configuration of abnormality detection device>
FIG. 17 is a schematic diagram illustrating a configuration of an abnormality detection apparatus according to an embodiment of the present invention.
The abnormality detection apparatus 20 according to the third embodiment further includes a shape changing unit 212 in addition to the configuration according to the second embodiment.
The shape changing unit 212 changes the shape of the partial region R based on a user instruction or based on the state acquired by the state acquisition unit 211. Specifically, the shape changing unit 212 determines the grid size used for division for a specific range in the measurement region. That is, the shape changing unit 212 changes the shape of the partial region R by changing the size of the grid covering the specific range. FIG. 18 is a diagram showing an example of changing the shape of the partial region according to the embodiment of the present invention. For example, the shape changing unit 212 receives, from the user, an input of a range s1 including four partial regions R in the temperature map M including two in the X-axis direction and two in the Y-axis direction, and a grid size. In the example illustrated in FIG. 18, the shape changing unit 212 receives a value twice as large as the standard grid size as the grid size. The shape changing unit 212 determines the shape of the partial region Rb in the range s1 by dividing the range s1 in the measurement region by a grid size that is twice the standard grid size. Further, for example, when the state of the device located in the range s2 acquired from the state acquisition unit 211 indicates that the predetermined operation has started, the shape changing unit 212 sets the range s2 to a grid size that is half the standard grid size. To determine the shape of the partial region Rd within the range s2.

  The partial region specifying unit 204 according to the third embodiment changes the shape of each temperature represented in the temperature distribution T based on the temperature distribution T, the distance distribution L, and the position information acquired by the temperature distribution acquisition unit 203. The part 212 identifies which partial region R of the plurality of partial regions whose shapes have been determined.

  Thereby, the map output unit 206 according to the third embodiment outputs the temperature map M including the partial region Rd and the partial region Rm having the shape determined by the shape changing unit 212. In addition, the abnormality specifying unit 210 according to the third embodiment specifies an abnormality for each of the partial region R and the partial region Rd and the partial region Rm having the shape determined by the shape changing unit 212.

《Action ・ Effect》
As described above, according to the third embodiment, the abnormality detection device 20 can detect a partial area in a specific range in the measurement area based on a user instruction, an internal factor or an external factor of the target facility P. Change the shape. Thereby, the abnormality detection device 20 can intensively improve the accuracy of detecting the temperature abnormality related to the predetermined device of the target facility P by reducing the partial region for a specific range in the measurement region. The efficiency of inspection can be improved.
Note that the shape changing unit 212 may change the size of the partial region for the entire range of the measurement region. That is, the “specific range in the measurement region” includes a partial range in the measurement region and the entire range of the measurement region.

<Fourth Embodiment>
The characteristics of the target facility P may change due to deterioration over time. That is, since the initial value recorded in the normal temperature map M0 is determined by the design value or the like of the target facility P as described above, the normal temperature may change from the initial value due to deterioration of the target facility P or the like. . Therefore, the abnormality detection system 1 according to the fourth embodiment updates the normal temperature map M0 stored in the normal temperature map storage unit 202 based on the temperature map M stored in the temperature map storage unit 201.

<Configuration of abnormality detection device>
FIG. 19 is a schematic diagram illustrating a configuration of an abnormality detection apparatus according to an embodiment of the present invention.
The abnormality detection apparatus 20 according to the fourth embodiment further includes a normal temperature specifying unit 213 and a normal temperature updating unit 214 in addition to the configuration according to the third embodiment.
The normal temperature specifying unit 213 standardizes the temperature of each partial region related to the temperature map M stored in the temperature map storage unit 201 based on the state of the target facility P acquired by the state acquisition unit 211. The standardization of the temperature can be performed, for example, by subtracting the offset value determined by the threshold value determination unit 209 from the temperature related to the temperature map M. The normal temperature specifying unit 213 specifies the normal temperature based on the temperature in each measurement time zone of each standardized partial region.
The normal temperature updating unit 214 updates the normal temperature of each partial region R with the normal temperature specified by the normal temperature specifying unit 213.

  The normal temperature specifying unit 213 sets an arbitrary data acquisition period (for example, the latest three days, the latest year, and all time zones), and sets the normal temperature map M0 based on the temperature map M of the data acquisition period. It may be updated. For example, the normal temperature specifying unit 213 can update the normal temperature map M0 more appropriately by changing the data acquisition period according to the deterioration of the target facility P, the timing of periodic inspection, or the like. At this time, the normal temperature specifying unit 213 may update the normal temperature based on a different period for each partial region R. For example, when the deterioration rate differs for each device constituting the target facility P, the normal temperature specifying unit 213 changes the data acquisition period for each partial region R in which the device is installed, so that the normal temperature is more appropriately set. The map M0 can be updated.

《Update process of normal temperature map of abnormality detection device》
FIG. 20 is a flowchart showing a normal temperature map update process of the abnormality detection device according to the embodiment of the present invention. FIG. 21 is a diagram illustrating an example of a normal temperature map before and after updating according to an embodiment of the present invention.
When the abnormality detection device 20 detects an abnormality based on the temperature map M, the normal temperature update unit 214 of the abnormality detection device 20 determines whether or not to update the normal temperature map M0 (step S81). For example, the normal temperature update unit 214 may determine to update the normal temperature map M0 when it is determined that there is no abnormality in any of the partial areas in the temperature map M. Further, for example, when the normal temperature update unit 214 determines that an abnormality has occurred in a certain partial region R of the temperature map M, the normal temperature update unit 214 may determine that the normal temperature map M0 is not updated, or an abnormality has occurred. It may be determined that the normal temperature map M0 is updated for the partial region R that is not present.

  When the normal temperature update unit 214 determines not to update the normal temperature map M0 (step S81: NO), the process ends without updating the normal temperature map M0. On the other hand, when it is determined that the normal temperature update unit 214 updates the normal temperature map M0 (step S81: YES), the normal temperature specifying unit 213 performs a plurality of measurement time zones (for example, 3 days) for each partial region R. ) Is read (step S82). Further, the state acquisition unit 211 acquires the state of the target facility P in each measurement time zone (step S83). Based on the acquired state of the target facility P, the normal temperature specifying unit 213 standardizes the temperature related to each measurement time zone of each partial region (step S84). The normal temperature specifying unit 213 specifies the normal temperature of each partial region R by calculating the average value of the standardized temperatures for each partial region (step S85). The normal temperature update unit 214 updates the normal temperature map M0 with the specified normal temperature of each partial region R (step S86). Thereby, the abnormality detection apparatus 20 can update the normal temperature map M0 as shown in FIG.

《Action ・ Effect》
The abnormality detection device 20 according to the fourth embodiment identifies the normal temperatures of the plurality of partial regions R based on the temperatures of the plurality of partial regions R related to the plurality of measurement time zones, and based on the normal temperatures. The normal temperature map M0 is updated. Thereby, the abnormality detection apparatus 20 can identify the partial region R in which an abnormality has occurred using the updated normal temperature of the partial region R. Therefore, the abnormality detection apparatus 20 can appropriately detect an abnormality even when the temperature characteristics of the target facility P gradually change, such as deterioration of the target facility P.

<Fifth Embodiment>
The abnormality detection device 20 according to the first to fourth embodiments is provided separately from the patrol inspection device 10. On the other hand, in the fifth embodiment, the patrol inspection device 10 includes the abnormality detection device 20.

<Configuration of patrol inspection device>
FIG. 22 is an external view showing a configuration of a patrol inspection apparatus according to an embodiment of the present invention.
The patrol inspection device 10 according to the fifth embodiment further includes an abnormality detection device 20 in addition to the configuration of the first embodiment. In the example shown in FIG. 22, the control device 15 and the abnormality detection device 20 are provided separately. However, the present invention is not limited to this, and the abnormality detection device 20 may be incorporated in the control device 15. The cyclic inspection device 10 according to the fifth embodiment is an example of a temperature management device.

《Temperature map update process for patrol inspection device》
The traveling inspection apparatus 10 according to the fifth embodiment updates the temperature map while traveling in the target facility P along a predetermined route.
FIG. 23 is a flowchart showing a temperature map update process of the patrol inspection device according to the embodiment of the present invention.
The control device 15 of the patrol inspection device 10 starts traveling control of the moving device 12 along a predetermined route at a predetermined patrol inspection timing (step S181). During the control of the mobile device 12, the control device 15 measures the position and orientation of the patrol inspection device 10 (step S182). The control device 15 determines whether or not the distance between the position of the patrol inspection device 10 and a predetermined imaging point on the route is less than a predetermined threshold (step S183).

  When the distance between the position of the patrol inspection device 10 and the predetermined imaging point on the route is less than the predetermined threshold (step S183: YES), the control device 15 causes the thermal camera 13 to image the temperature distribution T, and the depth The camera 14 is caused to image the distance distribution L (step S184).

  The partial region specifying unit 204 of the abnormality detection device 20 specifies the three-dimensional position information D based on the distance distribution L and the position information captured by the depth camera 14 (step S185). The temperature recording unit 205 identifies the three-dimensional temperature distribution DT by mapping the temperature distribution T imaged by the thermal camera 13 to the three-dimensional position information D (step S186). Next, the temperature recording unit 205 selects one of the plurality of partial regions R including the position related to the three-dimensional position information D one by one, and executes the processing from step S188 to step S190 (step S187).

  The temperature recording unit 205 specifies a representative temperature at a position included in the selected partial region R from the three-dimensional temperature distribution DT (step S188). Next, the temperature recording unit 205 determines whether or not the identified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M related to the time zone including the acquired imaging time (step S189). ). When the identified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M (step S189: YES), the temperature recording unit 205 includes the portion of the temperature map M stored in the temperature map storage unit 201. The temperature of the region R is rewritten to the representative temperature specified in step S188 (step S190). On the other hand, when the specified representative temperature is equal to or lower than the temperature of the partial region R already recorded in the temperature map M (step S189: NO), the temperature recording unit 205 does not rewrite the temperature map M.

  When the temperature map M is updated for each partial region R including the position related to the three-dimensional position information D by the processing from step S188 to step S190, or in step S183, the position of the cyclic inspection apparatus 10 and a predetermined route on the route When the distance to the imaging point is equal to or greater than the predetermined threshold (step S183: NO), the control device 15 determines whether the distance between the position of the patrol inspection device 10 and the end point of the route is less than the predetermined threshold. (Step S191). When the distance between the position of the patrol inspection device 10 and the end point of the route is equal to or greater than the predetermined threshold (step S191: NO), the control device 15 returns the process to step S181 and continues the control of the mobile device 12. On the other hand, when the distance between the position of the cyclic inspection device 10 and the end point of the route is less than the predetermined threshold (step S191: YES), the control device 15 ends the temperature map update process, and the timing of the next cyclic inspection. Wait until.

《Action ・ Effect》
As described above, according to the fifth embodiment, the patrol inspection device 10 can update the temperature map M to the latest state while traveling on its own.

<Sixth Embodiment>
The traveling inspection apparatus 10 according to the fifth embodiment collects the temperature distribution T and the distance distribution L at a predetermined imaging point, and updates the temperature map M. On the other hand, the cyclic inspection apparatus 10 according to the sixth embodiment generates a highly accurate temperature map M by updating the temperature map M while planning a destination based on the temperature map M. A patrol inspection device 10 according to the sixth embodiment includes an abnormality detection device 20 as in the fifth embodiment.

<Configuration of abnormality detection device>
FIG. 24 is a schematic diagram illustrating a configuration of an abnormality detection apparatus according to an embodiment of the present invention.
The abnormality detection apparatus 20 according to the sixth embodiment further includes a three-dimensional map storage unit 215, a route calculation unit 216, and a route output unit 217 in addition to the configuration of the first embodiment.

  The three-dimensional map storage unit 215 stores a three-dimensional map indicating the shape of the target facility P. The map output unit 206 is sequentially updated based on the distance distribution L and the position information acquired by the temperature distribution acquisition unit 203. The three-dimensional map is updated by SLAM using the distance distribution L and the position information, for example. In the initial state, the three-dimensional map storage unit 215 stores an initial three-dimensional map based on CAD (Computer-Aided Design) data of the target facility P.

  The path calculation unit 216 determines an imaging point based on the 3D temperature distribution DT generated by the temperature recording unit 205 and the 3D map stored by the 3D map storage unit 215. The path calculation unit 216 captures, for example, a position where a blind spot in the three-dimensional temperature distribution DT can be imaged, a position where a possibility that an abnormality is likely to occur based on the normal temperature map storage unit 202 can be imaged, and the like. Decide on a point. In the present embodiment, the “dead zone” refers to a region that is not imaged as a shadow of an obstacle. The route calculation unit 216 moves based on the position information acquired by the temperature distribution acquisition unit 203 and the 3D map stored in the 3D map storage unit 215 via the determined imaging point and a predetermined imaging point. A route candidate for calculating the route is calculated. Specifically, the route calculation unit 216 identifies the position of the obstacle based on the three-dimensional map stored in the three-dimensional map storage unit 215, and connects the patrol inspection apparatus 10 and the imaging point without touching the obstacle. The route to be calculated is calculated.

  The route output unit 217 selects one of the route candidates calculated by the route calculation unit 216 and outputs the selected route candidate to the control device 15. Thereby, the control device 15 controls the moving device 12 according to the route output by the route output unit 217. Examples of the route selected by the route output unit 217 include a route having the shortest travel distance and a route having the smallest turning angle.

《Temperature map update process for patrol inspection device》
FIG. 25 is a flowchart showing temperature map update processing of the patrol inspection device according to the embodiment of the present invention.
The control device 15 of the cyclic inspection device 10 starts traveling control of the mobile device 12 along a route related to the initial value or a route output by the route output unit 217 at a predetermined cyclic inspection timing (step S201). . The control device 15 measures the position and orientation of the patrol inspection device 10 during the control of the mobile device 12 (step S202). The control device 15 determines whether or not the distance between the position of the patrol inspection device 10 and the imaging point on the route is less than a predetermined threshold (step S203).

  When the distance between the position of the patrol inspection device 10 and the imaging point is less than a predetermined threshold (step S203: YES), the control device 15 causes the thermal camera 13 to image the temperature distribution T and causes the depth camera 14 to perform the distance distribution. L is imaged (step S204).

  The partial region specifying unit 204 of the abnormality detection device 20 specifies the three-dimensional position information D based on the distance distribution L and the position information captured by the depth camera 14 (step S205). The partial area specifying unit 204 updates the 3D map stored in the 3D map storage unit 215 based on the specified 3D position information D (step S206). The temperature recording unit 205 identifies the three-dimensional temperature distribution DT by mapping the temperature distribution T imaged by the thermal camera 13 to the three-dimensional position information D (step S207). Next, the temperature recording unit 205 selects one of the plurality of partial regions R including the position related to the three-dimensional position information D one by one, and executes the processing from step S209 to step S214 (step S208).

  The temperature recording unit 205 specifies a representative temperature at a position included in the selected partial region R from the three-dimensional temperature distribution DT (step S209). Next, the temperature recording unit 205 determines whether or not the identified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M related to the time zone including the acquired imaging time (step S210). ). When the identified representative temperature is higher than the temperature of the partial region R already recorded in the temperature map M (step S210: YES), the temperature recording unit 205 includes the portion of the temperature map M stored in the temperature map storage unit 201. The temperature in the region R is rewritten to the representative temperature specified in step S209 (step S211).

  Next, the path calculation unit 216 reads the normal temperature map M0 from the normal temperature map storage unit 202, and specifies the normal temperature related to the selected partial region R (step S212). The route calculation unit 216 determines whether or not the representative temperature specified in step S209 exceeds the normal temperature (step S213). When the representative temperature exceeds the normal temperature (step S213: YES), the path calculation unit 216 compares the three-dimensional map stored in the three-dimensional map storage unit 215 with the three-dimensional temperature distribution DT, and selects the selected partial region R. Then, it is determined whether or not there is a blind spot in which the temperature is not mapped in the three-dimensional temperature distribution DT (step S214). When there is a blind spot (step S214: YES), the path calculation unit 216 identifies an imaging point that can capture the blind spot based on the three-dimensional map, and passes through the imaging point and a predetermined imaging point. A route is calculated (step S215).

  On the other hand, when the specified representative temperature is equal to or lower than the temperature of the partial region R already recorded in the temperature map M (step S210: NO), the temperature recording unit 205 does not rewrite the temperature map M, and the path calculation unit 216 Do not calculate a new route. Further, when the representative temperature is equal to or lower than the normal temperature (step S213: NO), and when there is no blind spot for the selected partial region R (step S214: NO), the route calculation unit 216 does not calculate a new route.

  When the temperature map M is updated for each partial region R including the position related to the three-dimensional position information D by the processing from step S209 to step S214, or in step S183, the position of the cyclic inspection device 10 and a predetermined route on the route When the distance to the imaging point is equal to or greater than the predetermined threshold (step S183: NO), the route calculation unit 216 determines whether there is an obstacle on the current route based on the three-dimensional map updated in step S206. Is determined (step S215). When there is an obstacle on the route (step S215: YES), the route calculation unit 216 calculates a route that passes the imaging point while avoiding the obstacle based on the three-dimensional map (step S216).

  The control device 15 determines whether or not the distance between the position of the patrol inspection device 10 and the end point of the route is less than a predetermined threshold value (step S217). When the distance between the position of the patrol inspection device 10 and the end point of the route is equal to or greater than the predetermined threshold (step S217: NO), the control device 15 returns the process to step S201 and continues the control of the mobile device 12. On the other hand, when the distance between the position of the patrol inspection device 10 and the end point of the route is less than the predetermined threshold (step S217: YES), the control device 15 ends the temperature map update process and the timing of the next patrol inspection. Wait until.

《Action ・ Effect》
FIG. 26 is a diagram illustrating an example of temperature map update processing according to an embodiment of the present invention.
As described above, according to the sixth embodiment, the patrol inspection device 10 identifies the blind spot of the thermal camera 13 and calculates a route for moving to the imaging point where the blind spot can be imaged based on the three-dimensional map. . Thereby, the patrol inspection apparatus 10 can improve the specific accuracy of the high temperature location in the temperature map M.
As shown in FIG. 26, in the three-dimensional temperature distribution DT1 generated based on the temperature distribution T1 obtained from a certain point, a blind spot is generated in the partial region Rq where the device Q is installed. If the representative temperature of the partial region Rq is higher than the normal temperature, the abnormality detection device 20 may have an abnormality in the partial region Rq. The apparatus 10 is moved to the imaging point. The traveling inspection apparatus 10 obtains the temperature distribution T2 at the imaging point after the transfer, and generates a three-dimensional temperature distribution DT2. In the example shown in FIG. 26, a spot that is a blind spot in the three-dimensional temperature distribution DT1 of the device Q is a heat spot. Therefore, the representative temperature of the partial region Rq in the temperature map M2 generated based on the three-dimensional temperature distribution DT2 is compared with the representative temperature of the partial region Rq in the temperature map M1 generated based on the three-dimensional temperature distribution DT1. High temperature.

  Further, according to the sixth embodiment, the patrol inspection device 10 calculates a route that passes through the imaging point for imaging the blind spot based on the temperature related to the temperature distribution and the normal temperature of the partial region. Determine whether. Thereby, the patrol inspection apparatus 10 can calculate a route so as to update the temperature of a portion where there is a possibility of abnormality in the blind spot of the thermal camera 13. Note that the patrol inspection device 10 according to the sixth embodiment calculates a route passing through the imaging point when the temperature related to the temperature distribution exceeds the normal temperature of the partial region, but is not limited thereto. For example, in another embodiment, the patrol inspection device 10 may calculate a route passing through the imaging point when the temperature related to the temperature distribution exceeds a value obtained by adding a predetermined offset to the normal temperature of the partial region. Good. Further, in another embodiment, the patrol inspection device 10 may calculate a route passing through the imaging point when the difference between the temperature related to the temperature distribution and the normal temperature of the partial region exceeds a predetermined threshold. .

  Further, according to the sixth embodiment, the patrol inspection device 10 determines whether there is an obstacle on the route based on the distance distribution of the depth camera 14, and when there is an obstacle on the route, Calculate a route to avoid obstacles. Thereby, the patrol inspection apparatus 10 can detect an obstacle during movement and can move to an imaging point while avoiding this. Note that the patrol inspection apparatus 10 according to the sixth embodiment determines whether there is an obstacle on the route based on the three-dimensional map updated using the distance distribution of the depth camera 14. Not limited. For example, the patrol inspection device 10 according to another embodiment may directly detect an obstacle based on the distance distribution of the depth camera 14.

<Other embodiments>
As described above, the embodiment has been described in detail with reference to the drawings. However, the specific configuration is not limited to that described above, and various design changes and the like can be made.
Although the patrol inspection apparatus 10 according to the above-described embodiment performs imaging for each imaging point, the present invention is not limited to this. For example, the patrol inspection apparatus 10 according to another embodiment may image the temperature distribution T and the distance distribution L at regular time intervals or at regular distances, or image the temperature distribution T and the distance distribution L as a moving image. May be. Note that capturing a moving image is equivalent to capturing a plurality of frame images (still images).

  In the abnormality detection system 1 according to the above-described embodiment, the patrol inspection device 10 measures the temperature distribution T at a plurality of positions, the abnormality detection device 20 generates a temperature map M based on the temperature distribution T, and detects an abnormality. However, it is not limited to this. For example, in the abnormality detection system 1 according to another embodiment, the patrol inspection device 10 may have a part or all of the functions of the abnormality detection device 20. That is, the cyclic inspection device 10 according to another embodiment generates a temperature map M based on the measured temperature distribution T, and the abnormality detection device 20 outputs the temperature map M or detects the presence or absence of abnormality. Also good. Further, for example, the cyclic inspection apparatus 10 according to another embodiment may generate the temperature map M based on the measured temperature distribution T, and further output the temperature map M, or detect the presence or absence of an abnormality.

  In addition, the abnormality detection system 1 according to the above-described embodiment generates the temperature map M based on the maximum temperature of each partial region R included in the temperature distribution T, but is not limited thereto. For example, in the abnormality detection system 1 according to another embodiment, the temperature map M may be generated based on other representative temperatures such as the average value or median value of the temperatures of the partial regions R included in the temperature distribution T. Good.

  Moreover, although the abnormality detection apparatus 20 which concerns on the above-mentioned embodiment specifies the temperature of 1 or several partial area | region R from the imaged temperature distribution T, it is not restricted to this. For example, the abnormality detection device 20 according to another embodiment may specify one representative temperature in the imaged temperature distribution T and specify one partial region R to which the position of the representative temperature belongs. That is, the abnormality detection device 20 may specify the temperatures of the plurality of partial regions R based on one temperature distribution T, or may specify the temperature of only one partial region R.

  Moreover, although the temperature map M which concerns on the above-mentioned embodiment represents the temperature of the some partial area | region R divided | segmented with the grid of predetermined magnitude | size, it is not restricted to this. For example, in the temperature map M according to another embodiment, the size of the partial region R may be different from the beginning as shown in the lower part of FIG. 18 according to the size and importance of the equipment of the target facility P. . For example, the partial area R where the main equipment of the target facility P is located may be smaller than the other partial areas R. Further, the measurement region does not necessarily have to be divided into a grid shape, and may be divided according to other shapes such as a honeycomb shape or a device shape. In other embodiments, the size of the partial region R may be determined based on factors such as the state of the device and the environmental temperature.

  Further, the abnormality detection device 20 according to the above-described embodiment specifies the temperature threshold th based on the normal temperature map M0 and the state of the target facility P, and compares the temperature threshold th with the temperature related to the temperature map M. Although abnormality is detected by this, it is not restricted to this. For example, the abnormality detection device 20 according to another embodiment updates the machine learning model based on the temperature map M in a plurality of measurement time zones and the state of the target facility P in each time zone, and sets the temperature to the learned model. An abnormality may be detected by inputting the map M and the state of the target facility P. Examples of the machine learning model include a neural network model, a hidden Markov model, and an expert system model. For example, when a neural network model is used, the abnormality detection device 20 learns the input layer and the intermediate layer so that the same value as the input layer is output from the output layer by the auto encoder, and the value input to the input layer of the auto encoder A partial region in which an abnormality has occurred can be detected based on the difference between the values output from the output layer.

  In addition, the abnormality detection device 20 according to the fourth embodiment updates the normal temperature map M0 by standardizing the temperature of the partial region R based on the state of the target facility P. When detecting an abnormality based on this, it is not restricted to this. For example, the abnormality detection device 20 according to another embodiment may update the normal temperature map M0 by re-learning the machine learning model. For example, when using a neural network model, for example, the abnormality detection device 20 can relearn the machine learning model by backpropagation of the newly obtained temperature map M.

  Moreover, although the abnormality detection apparatus 20 which concerns on the above-mentioned embodiment outputs the time series of the temperature which concerns on the some partial area | region R which exists on the line L which crosses a measurement area | region, it is not restricted to this. For example, the abnormality detection device 20 according to another embodiment may output a time series of temperatures for one selected partial region R.

  Further, the abnormality detection device 20 according to the above-described embodiment outputs the temperature map M, outputs the time series of the temperature related to the specified partial region R in the temperature map M, and performs an abnormality based on the temperature map M. However, the present invention is not limited to this. For example, the abnormality detection device 20 according to another embodiment may generate the temperature map M, but may not output the temperature map M, or may output a time series of temperatures related to the designated partial region R. There is no need to detect the abnormality based on the temperature map M.

  Moreover, although the abnormality detection system 1 which concerns on the above-mentioned embodiment produces | generates the temperature map M based on the temperature distribution T detected by the automatic driving | running | working of one traveling inspection apparatus 10, it is not restricted to this. For example, the abnormality detection system 1 according to another embodiment may generate the temperature map M based on the temperature distribution T from which a plurality of cyclic inspection devices 10 are detected, or a person carries the cyclic inspection device 10. The temperature map M may be generated based on the temperature distribution T detected in step (1).

<Computer configuration>
FIG. 27 is a schematic block diagram showing a configuration of a computer according to at least one embodiment of the present invention.
The computer 90 includes a processor 91, a main memory 92, a storage 93, and an interface 94.
The above-described abnormality detection device 20 and the control device 15 of the patrol inspection device 10 are each mounted on a computer 90. The operation of each processing unit described above is stored in the storage 93 in the form of a program. The processor 91 reads out a program from the storage 93, expands it in the main memory 92, and executes the above processing according to the program. Further, the processor 91 secures storage areas corresponding to the above-described temperature map storage unit 201 and normal temperature map storage unit 202 in the storage 93 according to the program.

  Examples of the storage 93 include HDD (Hard Disk Drive), SSD (Solid State Drive), magnetic disk, magneto-optical disk, CD-ROM (Compact Disc Read Only Memory), DVD-ROM (Digital Versatile Disc Read Only Memory). And semiconductor memory. The storage 93 may be an internal medium directly connected to the bus of the computer 90, or may be an external medium connected to the computer 90 via an interface 94 or a communication line. When this program is distributed to the computer 90 via a communication line, the computer 90 that has received the distribution may develop the program in the main memory 92 and execute the above processing. In at least one embodiment, the storage 93 is a tangible storage medium that is not temporary.

  Further, the program may be for realizing a part of the functions described above. Further, the program may be a so-called difference file (difference program) that realizes the above-described function in combination with another program already stored in the storage 93.

DESCRIPTION OF SYMBOLS 1 Abnormality detection system 10 Patrol inspection apparatus 11 Main body 12 Moving apparatus 13 Thermal camera 14 Depth camera 15 Control apparatus 20 Abnormality detection apparatus 201 Temperature map memory | storage part 202 Normal temperature map memory | storage part 203 Temperature distribution acquisition part 204 Partial area specific | specification part 205 Temperature recording Unit 206 map output unit 207 region designation unit 208 temperature time series output unit 209 threshold determination unit 210 abnormality identification unit 211 state acquisition unit 212 shape change unit 213 normal temperature identification unit 214 normal temperature update unit

Claims (20)

A temperature distribution acquisition unit for acquiring the temperature distribution of the imaging range by the thermal camera;
Of a plurality of partial areas divided from the temperature measurement area, a partial area specifying unit that specifies a partial area including the imaging range;
A temperature management device comprising: a temperature recording unit that records a representative temperature of a temperature distribution related to the imaging range included in the partial area in association with the identified partial area. The temperature distribution acquisition unit acquires the temperature distribution for each measurement time period,
The temperature recording unit records the representative temperature of the temperature distribution related to the imaging range that is measured in the measurement time zone and included in the partial region in association with the specified partial region for each measurement time zone. The temperature management apparatus according to claim 1. The temperature management apparatus according to claim 2, further comprising a temperature time-series output unit that outputs a temperature for each of the measurement time zones associated with the designated partial area. The temperature management apparatus according to claim 3, wherein the temperature time-series output unit outputs the temperature for each measurement time zone associated with each of a plurality of partial regions located on a transverse line of the designated measurement region. 5. The apparatus according to claim 1, further comprising: an abnormality identifying unit that identifies a partial region in which an abnormality has occurred in the measurement region based on the temperature of each of the plurality of partial regions recorded by the temperature recording unit. The temperature management device according to claim 1. Based on the normal temperature of each of the plurality of partial regions and the state of the measurement region, further comprising a threshold value determination unit that determines a threshold value used for specifying an abnormality in each of the plurality of partial regions,
The temperature management device according to claim 5, wherein the abnormality specifying unit specifies a partial region in which an abnormality has occurred based on a temperature of each of the plurality of partial regions and a threshold value of each of the plurality of partial regions. The threshold value determination unit determines correction values of the plurality of partial areas based on an environmental temperature of the measurement area, and based on normal temperatures of the plurality of partial areas and correction values of the plurality of partial areas, The temperature management apparatus according to claim 6, wherein a threshold value for each of the plurality of partial areas is determined. The threshold value determination unit determines a correction value of the partial area where the device is located based on a state of the device provided in the measurement area, and the normal temperature and the correction value of the partial area where the device is located The temperature management device according to claim 6 or 7, wherein a threshold value of the partial region in which the device is located is determined based on. The threshold value determination unit determines a correction value of the partial area in the vicinity of the device based on a state of the device provided in the measurement region, and normal temperature and the correction value of the partial region where the device is located The temperature management device according to any one of claims 6 to 8, wherein a threshold value of the partial region in the vicinity of the device is determined based on the above. Based on the temperature of the plurality of partial regions according to a plurality of measurement time zones, comprising a normal temperature specifying unit for specifying the normal temperature of each of the plurality of partial regions,
The abnormality specifying unit specifies a partial region in which an abnormality has occurred by comparing the temperature of each of the plurality of partial regions and the normal temperature of each of the plurality of partial regions. 10. The temperature management device according to any one of 9 above. The temperature management apparatus according to any one of claims 1 to 10, further comprising a shape changing unit that changes the shapes of the plurality of partial regions for a specific range in the measurement region. The measurement area is divided into the plurality of partial areas by a grid,
The temperature management apparatus according to claim 11, wherein the shape changing unit changes a size of the grid that covers the specific range. A mobile device;
A thermal camera installed in the mobile device and measuring the temperature distribution of the imaging range;
A position specifying device for specifying a position, and
The temperature distribution acquisition unit acquires the temperature distribution measured by the thermal camera,
The temperature management device according to any one of claims 1 to 12, wherein the partial region specifying unit specifies a partial region including the imaging range based on the position specified by the position specifying device. Based on the temperature distribution, the blind spot of the thermal camera is specified in the measurement area, and a path for moving the moving device to a position where the blind spot can be imaged is calculated based on a three-dimensional map of the measurement area. The temperature management device according to claim 13, further comprising: The temperature management device according to claim 14, wherein the path calculation unit determines whether to calculate the path based on a temperature related to the temperature distribution and normal temperatures of the plurality of partial regions. A distance measuring device for measuring a distance distribution of the imaging range;
The route calculation unit determines whether there is an obstacle on the route based on the distance distribution, and calculates a route that avoids the obstacle when the obstacle is on the route. The temperature management device according to claim 14 or claim 15. A temperature management device according to any one of claims 1 to 12 and a moving body,
The moving body is
A mobile device;
A thermal camera installed in the mobile device and measuring the temperature distribution of the imaging range;
And a position specifying device for specifying the position,
The temperature distribution acquisition unit acquires the temperature distribution measured by the thermal camera,
The partial area specifying unit specifies a partial area including the imaging range based on the position specified by the position specifying device. Temperature management system. The moving body is
A distance measuring device for measuring a distance distribution of the imaging range;
Based on the position specified by the position specifying device, the distance distribution measured by the distance measuring device, and the temperature distribution measured by the thermal camera, the temperature distribution is associated with the three-dimensional position information. The temperature management system of Claim 17 provided with the three-dimensional temperature distribution production | generation apparatus which produces | generates temperature distribution. Acquiring the temperature distribution of the imaging range by the thermal camera;
Identifying a partial region including the imaging range among a plurality of partial regions divided from a temperature measurement region;
Recording a representative temperature of a temperature distribution related to the imaging range included in the partial area in association with the identified partial area. On the computer,
Acquiring the temperature distribution of the imaging range by the thermal camera;
Identifying a partial region including the imaging range among a plurality of partial regions divided from a temperature measurement region;
A step of recording a representative temperature of a temperature distribution related to the imaging range included in the partial area in association with the identified partial area.

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