JP2019050310A - Electronic component - Google Patents

Abstract

To provide an electronic component which allows a chip component and a metal terminal to be connected to each other surely and firmly, and which is superior in the effect of suppressing a sound squeal phenomenon.SOLUTION: An electronic component has a metal terminal 30 to be connected to a chip component 20. The metal terminal 30 has: an electrode counter part 36; and holding parts 31a and 31b provided on the electrode counter part 36 so as to hold the chip component 20. Between the electrode counter part 36 and an end face of a terminal electrode 22, solder for connecting the electrode counter part 36 and the end face of the terminal electrode 22 is present in a joint region 50a within a given range. An opening 36c is formed in the electrode counter part 36 so that a part of the terminal electrode 22 corresponding to at least a part of an internal electrode 26 is exposed to outside between an edge of the joint region 50a and a mounting part 38. In a non-opening region 36c1 of the electrode counter part 36 within a range of a given height L4 corresponding to the opening 36c, there is a non-joint region 50b where a connecting member 50 is not present between the electrode counter part 36 and the end face of the terminal electrode 22.SELECTED DRAWING: Figure 3A

Description

  The present invention relates to an electronic component with a terminal.

  As an electronic component such as a ceramic capacitor, in addition to an ordinary chip component which is directly mounted on a substrate or the like directly as a single component, for example, as shown in Patent Document 1, one having a metal terminal attached to the chip component is proposed. There is.

  Electronic components to which metal terminals are attached have been reported to have the effect of relieving deformation stress received by the chip component from the substrate after mounting and protecting the chip component from impact etc. It is used in the field where sex etc. are required.

  However, in the conventional electronic component with a metal terminal, the terminal electrode of the chip component and the metal terminal are bonded only by solder, and there is a problem in the bonding. For example, in the case of soldering, it is necessary to perform soldering while aligning the terminal electrodes of the chip component with the metal terminals. In particular, when soldering a plurality of chip parts to a pair of metal terminals, the operation is complicated, and there is a possibility that the reliability of bonding may be reduced.

  In addition, when the entire terminal electrode end face of the chip component is soldered to the metal terminal, the bonding strength between the metal terminal and the terminal electrode is improved, but the metal terminal is less likely to be bent elastically. In addition, the vibration from the chip component is easily transmitted to the substrate or the like, which may cause a so-called noise phenomenon. Furthermore, when used in a high temperature environment or an environment with a large temperature change, there is a possibility that the bonding between the chip component and the metal terminal may be released due to the difference in thermal expansion coefficient between the solder and the metal terminal.

  In addition, the electronic component which has connected the chip component to the metal terminal by the fitting arm is also proposed. According to this structure, an effect can be expected for the suppression of the sound noise phenomenon and the like. In this structure, in order to further increase the bonding strength between the chip part and the metal terminal, it is conceivable to solder the terminal electrode end face of the chip part and the metal terminal. However, in that case, there is a possibility that the control effect of the sound ringing phenomenon may be reduced.

JP, 2000-235932, A

  The present invention has been made in view of such circumstances, and an object thereof is to provide an electronic component capable of reliably and firmly connecting a chip component and a metal terminal and also having an excellent effect of suppressing a noise ringing phenomenon. It is.

In order to achieve the above object, the electronic component according to the present invention is
A chip component having an element body in which an internal electrode is laminated inside, and a terminal electrode formed outside the element body so as to be connected to an end of the internal electrode;
An electronic component having a metal terminal connected to the terminal electrode of the chip component;
The metal terminal is
An electrode facing portion disposed corresponding to an end face of the terminal electrode;
And a mounting unit mounted on the mounting surface,
An opening (including a through hole and a notch) is formed on the mounting surface side of the electrode facing portion so that a part of the terminal electrode corresponding to at least a part of the internal electrode is exposed to the outside It features.

  In the electronic component according to the present invention, an opening is provided in the electrode facing portion. At the opening, the vibration from the chip component is not transmitted to the metal terminal. In particular, in the portion where the internal electrode of the chip component is laminated via the dielectric layer, vibration is easily generated in the chip component due to the electrostriction phenomenon, but in the present invention, the portion where the opening on the mounting surface side is formed Transmission of vibration to the mounting substrate can be effectively avoided. Therefore, the noise generation can be effectively suppressed.

  Preferably, the terminal electrode of the chip component is connected to the metal terminal such that the planar direction of the internal electrode is disposed substantially perpendicular to the mounting surface. With this configuration, transmission of the electrostrictive vibration of the internal electrode to the mounting substrate can be effectively suppressed.

Preferably, the metal terminal is
And a holding unit for holding the chip component,
Between the electrode facing portion and the end face of the terminal electrode,
A connecting member for connecting the electrode facing portion and the end face of the terminal electrode is present in a bonding area within a first predetermined height range,
The opening is formed in the electrode facing portion between an edge of the bonding area and the mounting portion,
In the non-opening region of the electrode facing portion in the second predetermined height range corresponding to the opening portion, there is a non-joining region where the connection member does not exist between the electrode facing portion and the end face of the terminal electrode It is characterized by

  The chip part is held by the holding part of the metal terminal, and the connection between the metal terminal and the chip part is performed in the bonding area within a predetermined range by the connection member such as solder, so that the chip part and the metal terminal can be securely and firmly It can be linked. In addition, as a connection member, it is not limited to solder, A conductive adhesive etc. can also be used.

  Further, in the non-opening region of the electrode facing portion in the second predetermined height range corresponding to the opening portion, there is a non-bonding region where the connection member does not exist between the electrode facing portion and the end surface of the terminal electrode. Exists. In the non-joining region, the electrode facing portion of the metal terminal can be freely bent and elastically deformed without being restricted by the terminal electrode, and the stress is relieved. Therefore, the elasticity of the holding part continuing to the non-joining area is favorably secured, and the chip part can be favorably held by the holding part. In addition, the metal terminal is likely to be elastically deformed in a flexible manner, and the noise ringing phenomenon can be effectively suppressed.

  Preferably, the opening is formed in the electrode facing portion such that the vicinity of the end of the terminal electrode is exposed to the outside. With this configuration, it is possible to suppress transmission of the electrostrictive vibration of the internal electrode to the metal terminal on the side closer to the mounting substrate.

  Preferably, a length of a part of the internal electrode corresponding to a part of the terminal electrode exposed by the opening is 1/20 or more of a total length of the internal electrode. With this configuration, the effect of preventing the transmission of the electrostrictive vibration to the metal terminal in the opening is improved. Preferably, a length of a part of the internal electrode corresponding to a part of the terminal electrode exposed by the opening is equal to or less than half of a total length of the internal electrode. This is to improve the bonding strength between the electrode facing portion of the metal terminal and the terminal electrode of the chip component.

  In the non-bonding region, a gap of about the thickness of the connection member may be present between the electrode facing portion and the end face of the terminal electrode. By providing the gap, the electrode facing portion in the non-bonding region can be freely bent and deformed without being restricted by the terminal electrode.

  In the electrode facing portion, end surfaces of terminal electrodes of a plurality of chip components may be joined side by side in a plurality of bonding regions, and the non-bonding region is also formed between adjacent bonding regions. Is preferred. With such a configuration, it becomes easy to connect a plurality of chip parts by a pair of metal terminals, and furthermore, the ringing phenomenon is suppressed by the presence of non-bonded regions existing between the chip parts. Can.

  Preferably, the holding portion is formed on the mounting portion side of the opening. With this configuration, it is possible to suppress transmission of the electrostrictive vibration of the internal electrode to the metal terminal on the side closer to the mounting substrate. In addition, the holding portion is unlikely to be affected by electrostrictive vibration, and can securely hold the chip component.

  Preferably, the holding portion is formed by being bent from the opening edge of the opening. With this configuration, the opening and the holding portion can be easily formed. In addition, the opening and the holding portion are disposed close to each other, and vibration transmission from the chip component to the metal terminal can be more effectively prevented.

  In the junction area, through holes may be formed to penetrate the front and back surfaces of the electrode facing portion. With this configuration, the application state of the connection member in the bonding area can be observed from the outside through the through hole. In addition, air bubbles contained in the connection member such as solder can be released through the through hole. Therefore, even if the amount of connection members such as solder is small, bonding is stabilized.

  In the bonding area, a protrusion may be formed on the inner surface of the electrode facing portion so as to protrude toward the end face of the terminal electrode. With this configuration, the application area of the connection member can be easily controlled, and the thickness of the bonding area can be easily controlled. Further, even if the amount of the joining member is small, the joining is stabilized.

FIG. 1 is a schematic perspective view showing a ceramic electronic component according to an embodiment of the present invention. FIG. 2 is a front view of the ceramic electronic component shown in FIG. FIG. 3A is a left side view of the ceramic electronic component shown in FIG. FIG. 3B is a left side view of a ceramic electronic component according to a modification of the embodiment shown in FIG. 3A. FIG. 3C is a left side view of a ceramic electronic component according to another embodiment of the present invention. FIG. 3D is a left side view of a ceramic electronic component according to still another embodiment of the present invention. FIG. 3E is a left side view of a ceramic electronic component according to still another embodiment of the present invention. FIG. 3F is a left side view of a ceramic electronic component according to still another embodiment of the present invention. FIG. 4 is a top view of the ceramic electronic component shown in FIG. FIG. 5 is a bottom view of the ceramic electronic component shown in FIG. 6 is a cross-sectional view perpendicular to the Y-axis of the ceramic electronic component shown in FIG. FIG. 7 is a schematic perspective view showing a ceramic electronic component according to another embodiment of the present invention. FIG. 8 is a front view of the ceramic electronic component shown in FIG. FIG. 9 is a left side view of the ceramic electronic component shown in FIG. FIG. 10 is a top view of the ceramic electronic component shown in FIG. FIG. 11 is a bottom view of the ceramic electronic component shown in FIG. FIG. 12 is a schematic perspective view showing a ceramic electronic component according to a modification of the embodiment shown in FIG. FIG. 13 is a schematic perspective view showing a ceramic electronic component according to a modification of the embodiment shown in FIG.

  Hereinafter, the present invention will be described based on embodiments shown in the drawings.

First Embodiment FIG. 1 is a schematic perspective view showing a capacitor 10 as an electronic component according to a first embodiment of the present invention. The capacitor 10 has a capacitor chip 20 as a chip component and a pair of metal terminals 30 and 40. The capacitor 10 according to the first embodiment includes two capacitor chips 20. The number of capacitor chips 20 included in the capacitor 10 may be one or more, and the number is not limited as long as the number is more than one.

  In the description of each embodiment, a capacitor in which the metal terminals 30 and 40 are attached to the capacitor chip 20 will be described as an example, but the ceramic electronic component of the present invention is not limited thereto. The metal terminals 30, 40 may be attached.

  Further, in the drawing, the X-axis, the Y-axis and the Z-axis are perpendicular to each other, and the X-axis is parallel to the direction in which the capacitor chip 20 is arranged as shown in FIG. The Y axis coincides with the direction in which the pair of terminal electrodes 22 and 24 of the chip 20 are opposite to each other.

  The capacitor chip 20 has a substantially rectangular parallelepiped shape, and the two capacitor chips 20 have substantially the same shape and size as each other. As shown in FIG. 2, the capacitor chip 20 has a pair of chip end faces opposed to each other, and the pair of chip end faces are constituted by a first end face 20a and a second end face 20b. As shown in FIGS. 1, 2 and 4, the first end face 20a and the second end face 20b are substantially rectangular, and the longer one of the four sides constituting the rectangle of the first end face 20a and the second end face 20b. The pair of sides is the chip first side 20g (see FIG. 2), and the pair of shorter sides is the chip second side 20h (see FIG. 3A).

  In the capacitor chip 20, the chip third side of the capacitor chip 20 connecting the first end surface 20a and the second end surface 20b so that the first end surface 20a and the second end surface 20b are perpendicular to the mounting surface. 20 j are arranged in parallel with the mounting surface of the capacitor 10. The mounting surface of the capacitor 10 is a surface to which the capacitor 10 is attached by solder or the like so that mounting portions 38 and 48 of metal terminals 30, 40 described later face each other, and a surface parallel to the XY plane shown in FIG. It is.

  Comparing the length L1 of the first chip side 20g shown in FIG. 2 with the length L2 of the second chip side 20h shown in FIG. 4, the second chip side 20h is shorter than the first chip side 20g ( L1> L2). Although the ratio of the length of the first chip side 20g to the second chip side 20h is not particularly limited, for example, L2 / L1 is about 0.3 to 0.7.

  In the capacitor chip 20, as shown in FIG. 2, the chip first side 20g is perpendicular to the mounting surface, and as shown in FIG. 4, the chip second side 20h is parallel to the mounting surface. Be placed. Therefore, among the first to fourth side surfaces 20c to 20f which are the side surfaces of the four chips connecting the first end surface 20a and the second end surface 20b, the first side surface 20c and the second side surface 20d having a larger area are mounted to the mounting surface The third side surface 20e and the fourth side surface 20f which are vertically disposed and smaller in area than the first side surface 20c and the second side surface 20d are arranged in parallel to the mounting surface. Further, the third side surface 20 e is an upper side surface facing the opposite direction to the lower mounting portions 38, 48, and the fourth side surface 20 f is a lower side surface facing the mounting portions 38, 48.

  As shown in FIG. 1, FIG. 2 and FIG. 4, the first terminal electrode 22 of the capacitor chip 20 is formed to extend from the first end face 20a to part of the first to fourth side faces 20c to 20f. Therefore, the first terminal electrode 22 has a portion disposed on the first end face 20a and a portion disposed on the first side face 20c to the fourth side face 20f.

  Further, the second terminal electrode 24 of the capacitor chip 20 is formed so as to wrap around from the second end face 20b to another part of the side faces 20c to 20f (a part different from the part where the first terminal electrode 22 wraps around). ing. Therefore, the second terminal electrode 24 has a portion disposed on the second end face 20b and a portion disposed on the first side face 20c to the fourth side face 20f (see FIGS. 1, 2 and 4). In addition, in the first side face 20c to the fourth side face 20f, the first terminal electrode 22 and the second terminal electrode 24 are formed at a predetermined distance apart.

  As shown in FIG. 6 schematically showing the internal structure of the capacitor chip 20, the capacitor chip 20 is a multilayer capacitor in which an internal electrode layer 26 and a dielectric layer 28 are laminated. The internal electrode layer 26 includes one connected to the first terminal electrode 22 and one connected to the second terminal electrode 24. The internal electrode layer 26 connected to the first terminal electrode 22 and the second The internal electrode layers 26 connected to the terminal electrodes 24 are alternately stacked with the dielectric layer 28 interposed therebetween.

  As shown in FIG. 6, the stacking direction of the internal electrode layer 26 in the capacitor chip 20 is parallel to the X axis and perpendicular to the Y axis. That is, the internal electrode layer 26 shown in FIG. 6 is disposed in parallel to the planes of the Z axis and the Y axis and perpendicular to the mounting surface.

  The material of the dielectric layer 28 in the capacitor chip 20 is not particularly limited, and is made of, for example, a dielectric material such as calcium titanate, strontium titanate, barium titanate or a mixture thereof. The thickness of each dielectric layer 28 is not particularly limited, but generally several μm to several hundreds μm. In the present embodiment, the thickness is preferably 1.0 to 5.0 μm. The dielectric layer 28 preferably contains barium titanate as a main component that can increase the capacitance of the capacitor.

  The conductive material contained in the internal electrode layer 26 is not particularly limited, but if the constituent material of the dielectric layer 28 has reduction resistance, a relatively inexpensive base metal can be used. As a base metal, Ni or a Ni alloy is preferable. The Ni alloy is preferably an alloy of Ni with one or more elements selected from Mn, Cr, Co and Al, and the Ni content in the alloy is preferably 95% by weight or more. In addition, about 0.1 weight% or less of various trace components, such as P, may be contained in Ni or Ni alloy. Alternatively, the internal electrode layer 26 may be formed using a commercially available electrode paste. The thickness of the internal electrode layer 26 may be appropriately determined in accordance with the application and the like.

  The material of the first and second terminal electrodes 22 and 24 is not particularly limited, and copper, copper alloy, nickel, nickel alloy, etc. are usually used, but silver, an alloy of silver and palladium, etc. can also be used. The thickness of the first and second terminal electrodes 22 and 24 is not particularly limited, but is usually about 10 to 50 μm. Note that at least one metal film selected from Ni, Cu, Sn or the like may be formed on the surfaces of the first and second terminal electrodes 22 and 24.

  The shape and size of the capacitor chip 20 may be appropriately determined according to the purpose and application. Capacitor chip 20 has, for example, a length (L3 shown in FIG. 2) of 1.0 to 6.5 mm, preferably 3.2 to 5.9 mm × width (L1 shown in FIG. 2) of 0.5 to 5.5 mm, Is about 1.6 to 5.2 mm × thickness (L2 shown in FIG. 4) 0.3 to 3.5 mm, preferably about 0.8 to 3.2 mm. When a plurality of capacitor chips 20 are provided, the size and the shape may be different from each other.

  The pair of metal terminals 30, 40 in the capacitor 10 are provided corresponding to the first and second end faces 20a, 20b which are the pair of chip end faces. That is, the first metal terminal 30 which is one of the pair of metal terminals 30 and 40 is provided corresponding to the first terminal electrode 22 which is one of the pair of terminal electrodes 22 and 24. , 40 are provided corresponding to the second terminal electrode 24 which is the other of the pair of terminal electrodes 22, 24.

  The first metal terminal 30 has an electrode facing portion 36 facing the first terminal electrode 22. Further, the first metal terminal 30 has a plurality of pairs of fitting arm portions (holding portions) 31a, 31b, 33a, 33b which hold the capacitor chip 20 in the Z-axis direction from both ends of the chip first side 20g. . Furthermore, the first metal terminal 30 has a mounting portion 38 which extends from the electrode facing portion 36 to the capacitor chip 20 side and at least a part of which is substantially perpendicular to the electrode facing portion 36.

  As shown in FIG. 2, the electrode facing portion 36 includes a pair of first terminal sides 36g substantially parallel to the chip first side 20g perpendicular to the mounting surface, and a chip parallel to the mounting surface as shown in FIG. 3A. It is a substantially rectangular flat plate shape having a pair of terminal second sides 36 ha and 36 hb substantially parallel to the second side 20 h.

  As shown in FIGS. 3A and 3B (first modification), the lengths of the second terminal sides 36ha and 36hb parallel to the mounting surface are the chips arranged in parallel to the second terminal sides 36ha and 36hb. It is several times ± α of the length L 2 (see FIG. 4) of the side 20 h. That is, the X-axis width of the electrode facing portion 36 is a length obtained by integrating the number of the capacitor chips 20 included in the capacitor 10 shown in FIG. 3A or the capacitor 200 shown in FIG. It may be the same, slightly shorter, or slightly longer.

  For example, in the capacitor 200 according to the first modification shown in FIG. 3B, the capacitor 200 includes two capacitor chips 20, and the lengths of the second terminal sides 36ha and 36hb parallel to the mounting surface are the second terminal. It is shorter than twice the length L2 of the second chip side 20h disposed parallel to the sides 36ha and 36hb. The capacitor 200 has the capacitor 10 shown in FIGS. 1 to 6 except that the chip second side of the capacitor chip 20 is longer than the chip second side 20 h of the capacitor chip 20 according to the embodiment. It is similar.

  On the other hand, in the first embodiment shown in FIG. 3A, the capacitor 10 includes two capacitor chips 20, and the lengths of the second terminal sides 36ha and 36hb parallel to the mounting surface are the second terminal sides 36ha and 36hb. And the chip second side 20h disposed in parallel with the same length as or slightly longer than twice the length L2. As shown to FIG. 3A, the dimension of the capacitor chip which can be combined with respect to the metal terminals 30 and 40 is not limited to one type, As for the metal terminals 30 and 40, the length of several X-axis direction differs. It is possible to configure an electronic component corresponding to the capacitor chip 20.

  The electrode facing portion 36 is electrically and mechanically connected to the first terminal electrode 22 formed on the facing first end face 20 a. For example, a conductive connection member 50 such as a solder or a conductive adhesive is interposed in the gap between the electrode facing portion 36 and the first terminal electrode 22 shown in FIG. And can be connected.

  A region where the electrode facing portion 36 and the end face of the first terminal electrode 22 are joined by the connecting member 50 is defined as a bonding region 50a, and the end face of the electrode facing portion 36 and the first terminal electrode 22 is not interposed. A region where a gap exists without being bonded is defined as a non-bonded region 50b. The gap between the electrode facing portion 36 and the end face of the first terminal electrode 22 in the non-bonding region 50 b is a gap of about the thickness of the connection member 50. In the present embodiment, the thickness of the connection member 50 is determined in accordance with the protruding height of a protrusion 36 a described later, and the like. The height in the Z-axis direction of bonding region 50a shown in FIG. 2 corresponds to the first predetermined height.

  In the present embodiment, a first through hole 36 b is formed in a portion of the electrode facing portion 36 facing the first end face 20 a. Although two first through holes 36 b are formed to correspond to the respective capacitor chips 20 included in the capacitor 10, the shape and number of the first through holes 36 b are not limited to this. In the present embodiment, the first through holes 36 b are formed substantially in the center of the bonding region 50 a.

  As shown in FIG. 3A, the bonding area 50a is formed by applying the connecting member 50 (see FIG. 2) to the initial application areas 50c respectively positioned on both sides in the Z-axis direction of the first through holes 36b. . That is, after application, the heating member is brought into contact from the outer surface of the electrode facing portion 36 and the electrode facing portion 36 is pressed toward the end face of the chip 20, whereby the connecting member 50 applied to the initial application region 50c is spread and joined. Region 50a is formed. An area where the connecting member 50 can not be expanded is a non-bonding area 50b. In the present embodiment, between the electrode facing portion 36 and the Y-axis end face of the terminal electrode 22, the total area of the non-bonding areas 50 b is larger than 3/10 of the total area of the bonding areas 50 a, more preferably 1/0. 2-10.

  In the present embodiment, the connection member 50 made of solder forms a solder bridge between the peripheral edge of the first through hole 36 b and the first terminal electrode 22 to form the electrode facing portion 36 and the first terminal electrode 22. It can be strongly bonded. In addition, the application state of the connection member 50 in the bonding area 50a can be observed from the outside through the first through holes 36b. In addition, air bubbles contained in the connection member 50 such as solder can be released through the first through holes 36 b. Therefore, even if the amount of connection member 50 such as solder is small, bonding is stabilized.

  Further, in the electrode facing portion 36, a plurality of projections 36a that project toward the first end face 20a of the capacitor chip 20 and are in contact with the first end face 20a are formed to surround the first through holes 36a. Moreover, the protrusion 36a may be formed outside the initial application region 50c, and the initial application region 50c may be located between the protrusion 36a and the first through hole 36b. The initial application area 50c may protrude from between the protrusion 36a and the first through hole 36b.

  The protrusion 36 a reduces the contact area between the electrode facing portion 36 and the first terminal electrode 22 to prevent the vibration generated in the capacitor chip 20 from being transmitted to the mounting substrate through the first metal terminal 30. The ten sounds can be prevented.

  Further, by forming the projections 36a around the first through holes 36b, it is possible to adjust the joint area 50a where the connecting member 50 such as solder is spread and formed. In the present embodiment, the bonding area 50a has an edge at a position slightly beyond the outside of the protrusion 36a. In particular, as shown in FIG. 1, the lower end edge of the bonding area 50a in the Z-axis direction is located near the upper opening edge of a second through hole (opening) 36c described later.

  Such a capacitor 10 can prevent the noise while adjusting the bonding strength between the electrode facing portion 36 and the first terminal electrode 22 to an appropriate range. In the capacitor 10, four protrusions 36a are formed around one first through hole 36b, but the number and arrangement of the protrusions 36a are not limited to this.

  A second through hole (opening) having a peripheral edge to which the lower arm 31b or the lower arm 33b, which is one of a plurality of pairs of fitting arms 31a, 31b, 33a, 33b, is connected in the electrode facing portion 36 36c is formed. The second through holes 36c are located closer to the mounting portion 38 than the first through holes 36b, and unlike the first through holes 36b, connecting members such as solder are not provided. That is, the second through holes 36c are formed in the range of the non-bonding region 50b.

  In such a first metal terminal 30, the non-opening regions 36c1 located on both sides in the X-axis direction of the second through holes 36c in which the lower arm portions 31b and 33b supporting the capacitor chip 20 are formed have terminal electrodes 22. And a non-bonded region 50b between the two, and has a shape that is easily elastically deformed. Therefore, the action of relaxing the stress generated in the capacitor 10 and the action of absorbing the vibration of the capacitor chip 20 can be effectively exhibited. Therefore, the capacitor 10 having such a first metal terminal 30 can preferably prevent the noise and has a good bonding reliability with the mounting substrate at the time of mounting.

  The shape of the second through hole 36c is not particularly limited. However, the second through hole 36c has an opening width in the width direction parallel to the terminal second sides 36ha and 36hb (X axis direction) is the first through hole 36b. It is preferred to be wider. By widening the opening width of the second through hole 36c, the stress relaxation effect by the first metal terminal 30 and the noise squeak prevention effect can be effectively enhanced. Further, by making the opening width of the first through hole 36 b narrower than the second through hole 36 c, the connecting member does not spread too much. As a result, the bonding strength between the capacitor chip 20 and the electrode facing portion 36 can be prevented from being excessively increased, and the noise can be suppressed.

  As shown in FIG. 3A, in the present embodiment, the second through hole 36c is a lower end portion of the internal electrode layer 26 in the Z-axis direction between the lower end edge portion of the bonding region 50a in the Z-axis direction and the mounting portion 38. The electrode facing portion 36 is formed such that a portion (a portion of the lower end portion) of the terminal electrode 22 corresponding to at least a portion including the portion is exposed to the outside. Further, as shown in FIG. 2, the non-opening region 36c1 of the electrode facing portion 36 within the range of the Z-axis direction height (second predetermined height) L4 corresponding to the second through hole 36c is an electrode facing portion 36c. There is a non-bonding area 50b where the connecting member 50 does not exist between the and the end face of the terminal electrode 22. In the present embodiment, the Z-axis direction height (second predetermined height) L4 corresponding to the second through hole 36c is the Z-axis of the non-bonding area 50b located below the bonding area 50a in the Z-axis direction. It substantially matches the direction height, but may be smaller than that.

  In the present embodiment, a length (height in the Z-axis direction) L5 of the internal electrode 26 corresponding to a part of the terminal electrode 22 exposed by the second through hole 36c is the Z of the internal electrode 26 shown in FIG. The total length L6 in the axial direction is preferably 1/20 or more, and preferably 1/8 to 1/2. A length (a height in the Z-axis direction) L5 of the internal electrode 26 corresponding to a part of the terminal electrode 22 exposed by the second through hole 36c shown in FIG. 3A is the length of the second through hole 36c in the Z-axis direction. It is preferable that the height L4 be equal to or smaller than the height L4, and smaller than the height (first predetermined height) of the bonding region 50a in the Z-axis direction shown in FIG.

  In the present embodiment, the width in the X axis direction of each second through hole 36 c formed for each chip 20 is preferably smaller than the width in the X axis direction of each chip 20, and the X axis of each chip 20 The width is preferably 1/6 to 5/6, more preferably 1/3 to 2/3, with respect to the width of the direction.

  In the electrode facing portion 36, the second through hole 36c to which the lower arm portion 31b is connected is formed with a predetermined distance apart in the height direction with respect to the lower terminal second side 36hb to which the mounting portion 38 is connected. A slit 36d is formed between the second through hole 36c and the terminal second side 36hb.

  In the electrode facing portion 36, the slit 36d is the lower connecting position of the lower arm portion 31b located near the mounting portion 38 to the electrode facing portion 36 (the lower side of the peripheral portion of the second through hole 36c) and the lower side where the mounting portion 36 is connected And the second side 36hb of the second terminal 36hb. The slits 36d extend in a direction parallel to the terminal second sides 36ha and 36hb. The slits 36d prevent the solder used when mounting the capacitor 10 on the mounting substrate from rising up the electrode facing portion 36, and form a solder bridge connected to the lower arm portions 31b and 33b and the first terminal electrode 22. Can be prevented. Therefore, the capacitor 10 in which such a slit 36 d is formed has an effect of suppressing the noise.

  As shown in FIGS. 1 and 2, the fitting arms 31 a, 31 b, 33 a, 33 b of the first metal terminal 30 are the third side 20 e or the fourth side which is the chip side of the capacitor chip 20 from the electrode facing portion 36. It extends to 20f. Lower arm 31b (or lower arm 33b), which is one of fitting arms 31a, 31b, 33a, 33b, is bent from the lower edge of the Z-axis lower end of second through hole 36c formed in electrode facing portion 36 And molded.

  Further, an upper arm 31a (or an upper arm 33a), which is another one of the fitting arms 31a, 31b, 33a, 33b, has a second terminal in the upper portion (Z-axis positive direction) of the electrode facing portion 36. It is bent and molded from side 36 ha.

  As shown in FIG. 1, the electrode facing portion 36 faces the first end face 20a of the capacitor chip 20 and is located at a height overlapping with the first end face 20a, and a portion lower than the plate body 36j. The terminal connection portion 36k located at The terminal connection portion 36k is located at a position where the plate body portion 36j and the mounting portion 38 are connected.

  The second through holes 36c are formed such that the peripheral edge portion thereof straddles the plate main body 36j and the terminal connection portion 36k, and the lower arms 31b and 33b extend from the terminal connection portion 36k. That is, the base ends of the lower arm portions 31 b and 33 b are connected to the lower side (the opening edge close to the mounting portion 38) in the substantially rectangular peripheral portion of the second through hole 36 c.

  The lower arms 31b and 33b extend from the base end to the inside in the Y-axis direction (the center side of the chip 20) while bending and contact the fourth side face 20f of the capacitor chip 20 to support the capacitor chip 20 from below. (See Figure 2). The lower arm portions 31 b and 33 b may be inclined upward in the Z-axis direction from the lower side of the peripheral portion of the second through hole 36 c before the tip 20 is attached. This is in order to contact the fourth side face 20 f of the chip 20 by the elasticity of the lower arm portions 31 b and 33 b.

  The lower end (lower chip second side 20h) of the first side surface 20a of the capacitor chip 20 is positioned slightly above the lower side of the peripheral portion of the second through hole 36c which is the base end of the lower arm portions 31b and 33b. Further, as shown in FIG. 3A, when the capacitor chip 20 is viewed from the Y-axis direction, the lower end of the first side surface 20a of the capacitor chip 20 (the lower second chip) from the side of the capacitor 10 through the second through hole 36c. The side 20h) can be visually recognized.

  As shown in FIG. 1, the upper arm 31a and the lower arm 31b form a pair and hold one capacitor chip 20, and the upper arm 33a and the lower arm 33b form a pair. One other capacitor chip 20 is gripped. In the first metal terminal 30, since the pair of fitting arms 31a and 31b (or the fitting arms 33a and 33b) hold not one but a plurality of capacitor chips 20, each capacitor chip 20 can be reliably made. It can be gripped.

  Further, the pair of fitting arm portions 31a and 31b grips the capacitor chip 20 not from the chip second side 20h which is the short side of the first end face 20a, but from both ends of the chip first side 20g which is the long side. There is. As a result, the distance between the upper arm portions 31a and 33a and the lower arm portions 31b and 33b becomes long, and the vibration of the capacitor chip 20 can be easily absorbed, so that the capacitor 10 can preferably prevent the noise.

  The upper arm portion 31a and the lower arm portion 31b which hold the capacitor chip 20 and form a pair may have an asymmetrical shape each other, and the length in the width direction (the length in the X-axis direction) May be different from one another. Further, since the lower arm portions 31b and 33b extend from the terminal connection portion 36, compared with the case where they are connected to the plate main body portion 36j, the first terminal electrode 22 of the capacitor chip 20 and the mounting substrate The transmission path is shortened.

  The mounting portion 38 is connected to the lower (Z-axis negative direction side) terminal second side 36 hb of the electrode facing portion 36. The mounting portion 38 extends from the lower terminal second side 36 hb to the capacitor chip 20 side (the Y-axis negative direction side), and is bent substantially perpendicularly to the electrode facing portion 36. The upper surface of the mounting portion 38 which is the surface on the side of the capacitor chip 20 in the mounting portion 38 is the lower surface of the mounting portion 38 from the viewpoint of preventing excessive wrap around of the solder used when mounting the capacitor chip 20 on the substrate. More preferably, the wettability to the solder is low.

  As shown in FIGS. 1 and 2, the capacitor 10 is mounted on a mounting surface such as a mounting substrate with the mounting portion 38 facing downward, the length in the Z axis direction of the capacitor 10 is equal to that at the time of mounting. It becomes height. In the capacitor 10, since the mounting portion 38 is connected to one terminal second side 36hb of the electrode facing portion 36 and the upper arm portions 31a and 33a are connected to the other terminal second side 36ha, the Z axis direction No waste in length, which is advantageous for reducing the height.

  In addition, since the mounting portion 38 is connected to one terminal second side 36 hb in the electrode facing portion 36, the Z axis is compared to the prior art in which the mounting portion 38 is connected to the terminal first side 36 g in the electrode facing portion 36. The projected area from the direction is small, and the mounting area can be reduced. Further, as shown in FIGS. 1 and 5, among the first to fourth side surfaces 20c, 20d, 20e, 20f of the capacitor chip 20, the third side surface 20e and the fourth side surface 20f having a smaller area are parallel to the mounting surface. Therefore, even if the capacitor chip 20 is not disposed overlapping in the height direction, the mounting area can be reduced.

  As shown in FIGS. 1 and 2, the second metal terminal 40 sandwiches the electrode facing portion 46 facing the second terminal electrode 24 and the capacitor chip 20 in the Z-axis direction from both ends of the chip first side 20g. A plurality of pairs of fitting arm portions 41a, 41b, 43a, 43b to be gripped, and a mounting portion 48 extending from the electrode facing portion 46 to the capacitor chip 20 side and at least a part of which is substantially perpendicular to the electrode facing portion 46; Have.

  Similar to the electrode facing portion 36 of the first metal terminal 30, the electrode facing portion 46 of the second metal terminal 40 has a pair of first terminal sides 46g substantially parallel to the chip first side 20g and a second chip side 20h. And a substantially parallel terminal second side 46ha. In the electrode facing portion 46, protrusions (not shown) similar to the protrusions 36a, the first through holes 36b, the second through holes 36c, and the slits 36d provided in the electrode facing portion 36, and the first through holes (not shown) , A second through hole (not shown) and a slit 46d (see FIG. 6) are formed.

  As shown in FIG. 1, the second metal terminals 40 are arranged symmetrically with respect to the first metal terminal 30, and the arrangement with respect to the capacitor chip 20 is different from that of the first metal terminal 30. However, since the second metal terminal 40 has the same shape as the first metal terminal 30 except for the arrangement, the description thereof will be omitted.

  The material of the 1st metal terminal 30 and the 2nd metal terminal 40 will not be specifically limited if it is a metallic material which has conductivity, For example, iron, nickel, copper, silver etc. or the alloy containing these can be used. In particular, it is preferable to use phosphor bronze as the material of the first and second metal terminals 30 and 40 from the viewpoint of suppressing the specific resistance of the first and second metal terminals 30 and 40 and reducing the ESR of the capacitor 10.

  Hereinafter, a method of manufacturing the capacitor 10 will be described.

Method of Manufacturing Multilayer Capacitor Chip 20 In the manufacture of multilayer capacitor chip 20, first, a laminate is formed by laminating a green sheet (which will become dielectric layer 28 after firing) on which an electrode pattern to be internal electrode layer 26 is formed after firing. After producing, the resulting laminate is pressurized and fired to obtain a capacitor body. Furthermore, the capacitor chip 20 is obtained by forming the first terminal electrode 22 and the second terminal electrode 24 on the capacitor body by baking a terminal electrode paint and plating or the like.

  Coating materials for green sheets and coatings for internal electrode layers which are raw materials of laminates, raw materials of terminal electrodes, firing conditions of laminates and electrodes, etc. are not particularly limited, and can be determined with reference to known production methods etc. . In the present embodiment, a ceramic green sheet containing barium titanate as a main component is used as a dielectric material. Further, the terminal electrode is formed by dipping and baking a Cu paste to form a baking layer, and further performing Ni plating and Sn plating to form a Cu baking layer / Ni plating layer / Sn plating layer.

Method of Manufacturing Metal Terminals 30 and 40 In the manufacture of the first metal terminal 30, first, a flat metal plate is prepared. The material of the metal plate is not particularly limited as long as it is a metal material having conductivity. For example, iron, nickel, copper, silver, or an alloy containing these can be used. Next, the metal plate material is machined to obtain an intermediate member in which the shapes of the fitting arm portions 31a to 33b, the electrode facing portion 36, the mounting portion 38, and the like are formed.

  Next, a first metal terminal 30 is obtained by forming a metal film by plating on the surface of the intermediate member formed by machining. The material used for plating is not particularly limited, and examples thereof include Ni, Sn, Cu and the like. In addition, by performing a resist process on the upper surface of the mounting portion 38 during the plating process, it is possible to prevent the plating from adhering to the upper surface of the mounting portion 38. Thereby, a difference can be generated in the wettability to the solder of the upper surface and the lower surface of the mounting portion 38. In addition, even if only the metal film formed on the upper surface of the mounting portion 38 is removed by laser peeling or the like after the entire intermediate member is plated to form a metal film, the same difference can be generated.

  In addition, in manufacture of the 1st metal terminal 30, the some 1st metal terminal 30 may be formed in the state mutually connected from the metal plate material which continued in strip shape. The plurality of first metal terminals 30 connected to each other are cut into pieces before being connected to the capacitor chip 20 or after being connected to the capacitor chip 20. The method of manufacturing the second metal terminal 40 is also similar to that of the first metal terminal 30.

Assembling of Capacitor 10 Two capacitor chips 20 obtained as described above are prepared, and arranged and held so that the second side surface 20d and the first side surface 20c are in contact with each other as shown in FIG. Then, the rear surface of the first metal terminal 30 is oriented to the end surface of the first terminal electrode 22 in the Y-axis direction, and the second metal terminal 40 is oriented to the end surface of the second terminal electrode 24 in the Y-axis direction.

  At that time, a bonding member 50 (see FIG. 2) such as solder in the initial application region 50c shown in FIG. 1 and FIG. 3A on the end face of the first terminal electrode 22 in the Y axis direction or the back surface of the first metal terminal 30. Apply Similarly, on the end surface of second terminal electrode 24 in the Y-axis direction or on the back surface of second metal terminal 40, connection member 50 such as solder at a position corresponding to initial application region 50c shown in FIGS. 1 and 3A. Apply (see Figure 2).

  Thereafter, a heating element (not shown) is brought into contact from the outer surface of the electrode facing portion 36 (also 46), and the electrode facing portion 36 is pressed against the end face of the chip 20 to apply the initial application region 50c. The connecting member 50 spreads to form a bonding area 50a. An area where the connecting member 50 can not be expanded is a non-bonding area 50b. Thereby, the first and second metal terminals 30 and 40 are electrically and mechanically connected to the first terminal electrode 22 and the second terminal electrode 24 of the capacitor chip 20 to obtain the capacitor 10.

  In the capacitor 10 thus obtained, the height direction (Z-axis direction) of the capacitor 10 is the same as the direction of the chip first side 20 g which is the long side of the capacitor chip 20, and the mounting portion 38, Since 48 is formed by being bent below the capacitor chip 20 from the terminal second side 36hb, the projected area in the height direction of the capacitor 10 is small (see FIGS. 4 and 5). Therefore, such a capacitor 10 can reduce the mounting area.

  Further, in the capacitor 10 in which the plurality of capacitor chips 20 are arranged in the direction parallel to the mounting surface, for example, along the fitting direction (Z-axis direction) between the pair of fitting arms 31a and 31b. Since only one capacitor chip 20 is held, the bonding reliability between the capacitor chip 20 and the metal terminals 30, 40 is high, and the reliability against impact or vibration is high.

  Furthermore, since the plurality of capacitor chips 20 are arranged in a direction parallel to the mounting surface, and the stacking direction of the capacitor chips 20 is parallel to the mounting surface, the transmission path of the capacitor 10 is shortened. Can achieve low ESL. In addition, since the direction in which the capacitor chip 20 is gripped is the direction orthogonal to the stacking direction of the capacitor chip 20, the number of stacked capacitor chips 20 to be gripped changes, and the chip second side 20h of the capacitor chip 20 is long Even when the distance L2 changes, the first and second metal terminals 30, 40 can hold the capacitor chip 20 without any problem. As described above, in the capacitor 10, since the first and second metal terminals 30 and 40 can hold the capacitor chip 20 having various numbers of laminated layers, it is possible to flexibly cope with design changes.

  In the capacitor 10, the upper arm portions 31a and 33a and the lower arm portions 31b and 33b sandwich the capacitor chip 20 from both end sides of the chip first side 20g which is the long side of the first end surface 20a of the capacitor chip 20. It is held by. Therefore, the first and second metal terminals 30 and 40 can effectively exert the stress relaxation effect, suppress the transmission of the vibration from the capacitor chip 20 to the mounting substrate, and prevent the noise.

  In particular, the lower arms 31b and 33b supporting the capacitor chip 20 are supported by supporting the lower arms 31b and 33b by bending the lower arms 31b and 33b from the lower end opening edge of the second through hole 36c. The electrode facing portions 36 and 46 have a shape that is easily elastically deformed. Therefore, the first and second metal terminals 30 and 40 can effectively exert the action of relieving stress generated in the capacitor 10 and the action of absorbing vibration.

  Further, lower arms 31b and 33b are bent and formed at the lower end opening edge of second through hole 36c, so that, in capacitor 10, the lower portion when viewed from the direction perpendicular to the mounting surface (Z-axis direction) It is possible to arrange arm parts 31b and 33b in the position which overlaps with mounting part 38 (refer to Drawing 2 and Drawing 5). Therefore, the capacitor 10 can widen the mounting portion 38 and is advantageous in terms of miniaturization.

  In addition, since the first through holes 36 b are formed, the capacitor 10 can easily visually recognize the bonding state between the first and second metal terminals 30 and 40 and the capacitor chip 20 from the outside, It is possible to reduce the variation in quality and improve the non-defective rate.

  In particular, in the capacitor 10 according to the present embodiment, the pair of fitting arm portions (holding portions with elasticity) 31a, 31b, 33a, 33b (the same applies to 41a, 41b, 43a, 43b) of the metal terminal 30 (also 40). Holds and holds the tip 20 from both sides of the Z axis. Moreover, in order to connect the metal terminals 30 and 40 and the chip 20 in the bonding area 50a within a predetermined range by the connection member 50 (see FIG. 2) such as solder, the chip 20 and the metal terminals 30 and 40 are reliable and strong. Can be linked to

  In addition, the electrode facing portion 36 (46) and the terminal electrode 22 (24) are provided between the edge of the bonding area 50a and the fitting arms 31a, 31b, 33a, 33b (41a, 41b, 43a, 43b). A non-bonding region 50b is formed which does not connect with the end face of the. In the non-bonding region 50b, the electrode facing portion 36 (46) of the metal terminal 30 (40) can be freely bent and elastically deformed without being restricted by the terminal electrode 22 (24), and the stress is relaxed. Therefore, the elasticity of the fitting arms 31a, 31b, 33a, 33b (41a, 41b, 43a, 43b) contiguous to the non-joining region 50b is satisfactorily ensured, and the pair of fitting arms 31a, 31b, 33a , 33b (41a, 41b, 43a, 43b), and each tip 20 can be held well. In addition, the metal terminal 30 (40) is likely to be elastically deformed in a flexible manner, and the ringing phenomenon can be effectively suppressed.

  Between the electrode facing portion 36 (46) and the end face of the terminal electrode 22 (24), the total area of the non-bonding areas 50b is within a predetermined range larger than 3/10 of the total area of the bonding areas 50a. By configuring in this manner, the operational effects of the present embodiment are enhanced.

  In the non-bonding region 50b, a gap of about the thickness of the connection member 50 is present between the electrode facing portion 36 (46) and the end face of the terminal electrode 22 (24). By providing the gap, the electrode facing portion 36 (46) of the non-bonding region 50b can be freely bent and deformed without being restricted by the terminal electrode 30 (40).

  Furthermore, as shown in FIG. 3A, in the electrode facing portion 36 (46), the end faces of the terminal electrodes 22 (24) of the plurality of chips 20 may be joined side by side with the plurality of bonding regions 50a. Non-bonded regions 50b are also formed between the regions 50a. With such a configuration, it becomes easy to connect the plurality of chips 20 by the pair of metal terminals 30 and 40, and the presence of the non-junction region 50b existing between the chips 20 makes the noise ringing phenomenon. Can be suppressed.

  Furthermore, in the present embodiment, in the non-bonding region 50b, the electrode facing portion 36 (46) is formed with a second through hole 36c penetrating the front and back surfaces. The arm portions 31 b and 33 b (41 b and 43 b) extend from the opening edge of the second through hole 36 c. By forming the second through holes 36c, the non-joining region 50b can be easily formed, and the arm portions 31b and 33b (41b and 43b) can be easily formed, and the gripping of the chip 20 is also reliable. It becomes a thing.

  Furthermore, in the present embodiment, in the bonding area 50a, a protrusion 36a that protrudes toward the end face of the terminal electrode 22 (24) is formed on the inner surface of the electrode facing portion 36 (46). With this configuration, the bonding area 50a of the connecting member 50 can be easily controlled, and the thickness of the bonding area 50a can be easily controlled. Further, even if the amount of the joining member is small, the joining is stabilized.

  Further, in the present embodiment, the vibration from the tip 20 is not transmitted to the metal terminal 30 in the second through hole 36 c. In particular, in the portion where the internal electrode 26 of the chip 20 is stacked via the dielectric layer, vibration easily occurs in the chip 20 due to the electrostriction phenomenon, but in the present embodiment, the second through hole 36c is formed. The transmission of vibrations can be avoided at the part.

  Further, in the present embodiment, as shown in FIG. 2, the non-opening region 36c1 of the electrode facing portion 36 within the range of the predetermined height L4 corresponding to the second through hole 36c shown in FIG. 3A is the electrode facing portion 36c. There is a non-bonding area 50b where the connecting member 50 does not exist between the and the end face of the terminal electrode 22. In the non-bonding region 50b, the electrode facing portion 36 of the metal terminal 30 can be freely bent and elastically deformed without being restricted by the terminal electrode 22, and the stress can be relaxed. Therefore, the elasticity of the lower arm portions 31b and 33b as holding portions continuous with the non-joining region 36c1 can be favorably secured, and the chip 20 can be favorably held by the lower arm portions 31b and 33b. Further, the metal terminal 30 is easily bent and elastically deformed, and the noise ringing phenomenon can be effectively suppressed.

  Furthermore, in the present embodiment, as shown in FIG. 3A, the stacking direction (X-axis direction) of the internal electrode 26 is substantially perpendicular to the height direction (Z-axis direction) of the electrode facing portion 36, and the second through holes 36c Is formed in the electrode facing portion 36 so that the vicinity of the end of the terminal electrode 22 is exposed to the outside. With this configuration, transmission of electrostrictive vibration of the internal electrode 26 through the metal terminal 30 to the mounting substrate can be suppressed on the side close to the mounting portion 38 connected to the mounting substrate (not shown). .

  Further, in the present embodiment, the length L5 of the internal electrode 26 corresponding to a part of the terminal electrode 22 exposed by the second through hole 36c is 1/20 or more of the total length L6 of the internal electrode 26 shown in FIG. It is. With this configuration, the effect of preventing the transmission of the electrostrictive vibration in the second through hole 36c to the metal terminal 36 is improved. The length L5 of the internal electrode 26 corresponding to one 22 parts of the terminal electrode exposed by the second through hole 36c is preferably 1/2 or less of the total length L6 of the internal electrode 26. This is to improve the bonding strength between the electrode facing portion 36 of the metal terminal 30 and the terminal electrode 22 of the chip 20.

  Furthermore, in the present embodiment, the lower arm portions 31 b and 33 b are formed on the mounting portion side of the second through hole 36 c. With this configuration, transmission of the electrostrictive vibration of the internal electrode 26 to the metal terminal 30 can be suppressed on the side closer to the mounting portion 38. The lower arms 31b and 33b are less susceptible to electrostrictive vibration, and can reliably hold the chip 20.

  In this embodiment, it is bent and formed from the opening edge of the second through hole 36c. By this configuration, the second through hole 36c and the lower arm portions 31b and 33b can be easily formed. In addition, the second through holes 36c and the lower arms 31b and 33b are disposed close to each other, so that the vibration transmission from the chip 20 to the metal terminal 30 and the vibration transmission from the metal terminal 30 to the mounting substrate are more effective. Can be prevented.

Second Embodiment FIG. 7 is a schematic perspective view of a capacitor 100 according to a second embodiment of the present invention, and FIGS. 8, 9, 10 and 11 are a front view and a left side view of the capacitor 100, respectively. It is a top view and a bottom view. As shown in FIG. 7, the capacitor 100 has three capacitor chips 20 and the number of first through holes 36 b etc. included in the first metal terminal 130 and the second metal terminal 140 is different. The same as the capacitor 10 according to the first embodiment. Therefore, in the description of the capacitor 100, the same parts as those of the capacitor 10 are denoted by the same reference numerals as the capacitor 10, and the description thereof is omitted.

  As shown in FIG. 7, the capacitor chip 20 included in the capacitor 100 is similar to the capacitor chip 20 included in the capacitor 10 shown in FIG. 1. In the three capacitor chips 20 included in the capacitor 100, as shown in FIG. 8, the chip first side 20g is perpendicular to the mounting surface, and as shown in FIG. 10, the chip second side 20h is on the mounting surface They are arranged parallel to each other. The three capacitor chips 20 included in the capacitor 100 are mounted on the mounting surface such that the first terminal electrodes 22 of adjacent capacitor chips 20 contact each other and the second terminal electrodes 24 of adjacent capacitor chips 20 contact each other. Are arranged in parallel to

  The first metal terminal 130 included in the capacitor 100 includes an electrode facing portion 136 facing the first terminal electrode 22 and three pairs of fitting arm portions 31a, 31b, 33a, 33b, 35a, 35b for gripping the capacitor chip 20. And a mounting portion 138 vertically bent from the terminal second side 136 hb in the electrode facing portion 136 toward the capacitor chip 20 side. The electrode facing portion 136 has a substantially rectangular flat plate shape, and includes a pair of terminal first sides 136g substantially parallel to the chip first side 20g, and a pair of terminal second sides 136ha and 136hb substantially parallel to the chip second side 20h. Have.

  As shown in FIG. 9, the first metal terminal 130 is formed with a protrusion 36a, a first through hole 36b, a second through hole 36c, and a slit 36d in the same manner as the first metal terminal 30 shown in FIG. 3A. . However, in the first metal terminal 130, three first through holes 36b, second through holes 36c and three slits 36d are formed, and one first through hole 36b, second through hole 36c and slits 36d are formed. , Corresponding to one capacitor chip 20. In addition, a total of twelve protrusions 36 a are formed on the first metal terminal 130, and four protrusions 36 a correspond to one capacitor chip 20.

  Further, as shown in FIG. 10, in the first metal terminal 130, the upper arm portion 31a and the lower arm portion 31b hold one capacitor chip 20, and the upper arm portion 33a and the lower arm portion 33b are the other ones. The upper arm portion 35a and the lower arm portion 35b hold one other capacitor chip 20 different from the above two. The upper arm portions 31a, 33a, 35a are connected to the terminal second side 136ha on the upper side (Z-axis positive direction side) of the electrode facing portion 36, and the lower arm portions 31b, 33b, 35b are the second through holes 36c. Connected to the rim.

  As shown in FIGS. 8 and 11, the mounting portion 138 of the first metal terminal 130 is connected to the second (second) negative terminal side 136 hb of the electrode facing portion 136. The mounting portion 138 extends from the lower terminal second side 136 hb to the capacitor chip 20 side (the Y-axis negative direction side), and is bent substantially perpendicularly to the electrode facing portion 136.

  The second metal terminal 140 has an electrode facing portion 146 facing the second terminal electrode 24 and a plurality of pairs of fitting arm portions 141a sandwiching and holding the capacitor chip 20 from both ends of the chip first side 20g in the Z axis direction. , 143a, 145a, and a mounting portion 148 which extends from the electrode facing portion 146 to the capacitor chip 20 and at least a portion of which is substantially perpendicular to the electrode facing portion 146.

  Similar to the electrode facing portion 36 of the first metal terminal 130, the electrode facing portion 146 of the second metal terminal 140 has a pair of first terminal side 146g substantially parallel to the chip first side 20g and a chip second side 20h. A substantially parallel terminal second side 140 ha is formed, and the electrode facing portion 146 is formed with a protrusion 46 a, a first through hole, a second through hole, and a slit. As shown in FIG. 7, the second metal terminals 140 are disposed symmetrically with respect to the first metal terminal 130, and the arrangement with respect to the capacitor chip 20 is different from that of the first metal terminal 130. However, since the second metal terminal 140 has the same shape as the first metal terminal 130 except for the arrangement, the detailed description will be omitted.

  The capacitor 100 according to the second embodiment also exhibits the same effect as the capacitor 10 according to the first embodiment. In capacitor 100, the number of upper arm portions 31a to 33a, lower arm portions 31b to 33b, first through holes 36b, second through holes 36c, and slits 36d included in first metal terminal 130 is included in capacitor 100. However, the number of fitting arms and the like included in the capacitor 100 is not limited thereto. For example, the first metal terminal 130 may have twice the number of first through holes 36 b as the capacitor chip 20 may be formed, and one continuous long slit 36 d may be formed.

Third Embodiment FIG. 3C is a left side view showing a capacitor 300 according to a third embodiment of the present invention. The capacitor 300 according to the third embodiment is the same as the capacitor 10 according to the first embodiment except that the shapes of the slits 336 d formed in the first and second metal terminals 330 are different. As shown in FIG. 3C, in the first and second metal terminals 330, one slit 336d continuous in the X-axis direction is formed below the two second through holes 36c. Thus, the slit 336d is formed between the lower end of the portion of the capacitor chip 20 facing the first end face 20a (lower chip second side 20h) and the terminal second side 36hb (that is, the terminal connection portion 36k) As long as it does, the shape and number are not limited.

Fourth Embodiment FIG. 3D is a left side view showing a capacitor 400 according to a fourth embodiment of the present invention. The capacitor 400 according to the fourth embodiment is the same as the capacitor 10 according to the first embodiment except that the shapes of the second through holes 36 c formed in the first and second metal terminals 430 are different. As shown in FIG. 3D, the first and second metal terminals 430 are formed with one second through hole 36c continuous in the X-axis direction. The second through holes 36 c are formed such that a portion (a portion of the lower end portion) of the terminal electrode 22 corresponding to the lower end portion in the Z axis direction of the internal electrode layer 26 in the plurality of adjacent chips 20 is exposed to the outside. It is formed in the electrode facing portion 36.

  In this embodiment, the width in the X-axis direction of the second through holes 36c is preferably smaller than the sum of the widths in the X-axis direction of the respective chips 20, and preferably to the total width in the X-axis direction of the chips 20. Is 1/6 to 5/6, more preferably 1/3 to 2/3.

Fifth Embodiment FIG. 3E is a left side view showing a capacitor 500 according to a fifth embodiment of the present invention. The capacitor 500 according to the fifth embodiment is the first embodiment except that notches (openings) 536c formed in the first and second metal terminals 530 are formed instead of the second through holes 36c. It is the same as the capacitor 10 according to the embodiment. As shown in FIG. 3E, in the first and second metal terminals 530, a non-opening region 36c is formed at the center in the X-axis direction, and notches 536c are formed on both sides thereof. The notch 536c is formed in the electrode facing portion 36 such that a part (a part of the lower end) of the terminal electrode 22 corresponding to the lower end of the internal electrode layer 26 in the Z-axis direction is exposed to the outside .

Sixth Embodiment FIG. 3F is a left side view showing a capacitor 600 according to a sixth embodiment of the present invention. The capacitor 600 according to the sixth embodiment is the same as the capacitor 10 according to the first embodiment, except that only a single capacitor chip 20 is connected to the first and second metal terminals 630. Also in the present embodiment, the same effects as those of the first embodiment can be obtained.

Other Embodiments Note that the present invention is not limited to the above-described embodiments, and can be variously modified within the scope of the present invention.

  For example, the metal terminals 30, 130, 40, 140, 330, 430, 530, 630 are provided with the projections 36a, the first through holes 36b, and the slits 36d (or 336d) as needed. The terminal is not limited to this, and a modified example in which one or more of the parts are not formed is also included in the metal terminal according to the present invention. In the embodiment described above, a pair of arm portions (for example, 31a and 31b) are provided in the Z-axis direction, but one arm portion (for example, 31a, 33a, 35a and 41a) located in the upper part in the Z-axis direction , 43a, 45a) may be omitted, and it may be an arm (eg 31b, 33b, 35b, 41b, 43b) of only one side. Alternatively, the metal terminals 30, 130, 40, 140, 330, 430, 530, 630 having the opening 36c only in the connection region 50a, with the arms (for example 31a, 31b) on both sides in the Z-axis direction omitted, It may be connected to the terminal electrode 22 (24) of the chip 20.

  Further, in the present invention, the number of chips included in the electronic component may be single or plural, and the number is not limited as long as plural. For example, in the capacitor 500 shown in FIG. 12, five capacitor chips 20 are held in the X-axis direction by the metal terminals 130 and 140. Further, in the capacitor 600 shown in FIG. 14, the capacitor terminals 20 of 10 in the X-axis direction are held by the metal terminals 130 and 140.

10, 100, 200, 300, 400, 500, 600, 700, 800 ... capacitor 20 ... capacitor chip 20a ... first end surface 20b ... second end surface 20c ... first side 20d ... second side 20e ... third side 20f ... fourth side 20g ... chip first side 20h ... chip second side 20j ... Chip third side 22 ... first terminal electrode 24 ... second terminal electrode 26 ... internal electrode layer 28 ... dielectric layer 30, 130, 40, 140, 330, 430, 530 ... metal terminals 31a, 33a, 35a, 41a , 43a, 45a ... upper arm portion (holding portion)
31b, 33b, 35b, 41b, 43b ... lower arm portion (holding portion)
36, 136, 46, 146: electrode facing portion 36a, 46a: protrusion 36b: first through hole 36c: second through hole 36c1: non-opening region 36d, 46d: slit 36g: terminal first side 36ha, 36hb: terminal third 2 sides 38, 138, 48, 148 mounting portion 50 connecting member 50a bonding area 50b non bonding area 50c initial application area

Claims (9)

A chip component having an element body in which an internal electrode is laminated inside, and a terminal electrode formed outside the element body so as to be connected to an end of the internal electrode;
An electronic component having a metal terminal connected to the terminal electrode of the chip component;
The metal terminal is
An electrode facing portion disposed corresponding to an end face of the terminal electrode;
And a mounting unit mounted on the mounting surface,
An electronic component characterized in that an opening is formed in the electrode facing portion so that a part of the terminal electrode corresponding to at least a part of the internal electrode is exposed to the outside.   The electronic component according to claim 1, wherein a terminal electrode of the chip component is connected to the metal terminal such that a planar direction of the internal electrode is disposed substantially perpendicular to the mounting surface. The metal terminal is
And a holding unit for holding the chip component,
Between the electrode facing portion and the end face of the terminal electrode,
A connecting member for connecting the electrode facing portion and the end face of the terminal electrode is present in a bonding area within a first predetermined height range,
The opening is formed in the electrode facing portion between an edge of the bonding area and the mounting portion,
In the non-opening region of the electrode facing portion in the second predetermined height range corresponding to the opening portion, there is a non-joining region where the connection member does not exist between the electrode facing portion and the end face of the terminal electrode The electronic component according to claim 1 or 2, characterized in that:   The electronic component according to any one of claims 1 to 3, wherein the opening is formed in the electrode facing portion such that the vicinity of the end of the terminal electrode is exposed to the outside.   The length of a part of the internal electrode corresponding to the part of the terminal electrode exposed by the opening is 1/20 or more of the total length of the internal electrode. Electronic parts.   The electronic component according to any one of claims 3 to 5, wherein in the non-bonding region, a gap of about the thickness of the connection member is present between the electrode facing portion and the end face of the terminal electrode.   The end face of the terminal electrode of a plurality of chip parts is joined side by side in a plurality of joining regions, and the non-joining region is also formed between adjacent joining regions in the electrode facing portion. The electronic component as described in any one of 6.   The said holding | maintenance part is an electronic component in any one of the Claims 3-7 currently formed in the said mounting part side of the said opening part.   The electronic component according to any one of claims 3 to 8, wherein the holding portion is formed by being bent from an opening edge of the opening.

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