JP2018517987A5 - - Google Patents

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Publication number
JP2018517987A5
JP2018517987A5 JP2017564614A JP2017564614A JP2018517987A5 JP 2018517987 A5 JP2018517987 A5 JP 2018517987A5 JP 2017564614 A JP2017564614 A JP 2017564614A JP 2017564614 A JP2017564614 A JP 2017564614A JP 2018517987 A5 JP2018517987 A5 JP 2018517987A5
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JP
Japan
Prior art keywords
pulses
slave device
command
sequence
serial bus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2017564614A
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English (en)
Japanese (ja)
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JP2018517987A (ja
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Publication date
Priority claimed from US15/179,470 external-priority patent/US10108511B2/en
Application filed filed Critical
Publication of JP2018517987A publication Critical patent/JP2018517987A/ja
Publication of JP2018517987A5 publication Critical patent/JP2018517987A5/ja
Ceased legal-status Critical Current

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JP2017564614A 2015-06-15 2016-06-13 ５０ナノ秒スパイクフィルタ用のテスト Ceased JP2018517987A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201562175723P 2015-06-15 2015-06-15
US62/175,723 2015-06-15
US15/179,470 2016-06-10
US15/179,470 US10108511B2 (en) 2015-06-15 2016-06-10 Test for 50 nanosecond spike filter
PCT/US2016/037282 WO2016205142A1 (en) 2015-06-15 2016-06-13 Test for 50 nanosecond spike filter

Publications (2)

Publication Number Publication Date
JP2018517987A JP2018517987A (ja) 2018-07-05
JP2018517987A5 true JP2018517987A5 (cg-RX-API-DMAC7.html) 2019-06-20

Family

ID=57517150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017564614A Ceased JP2018517987A (ja) 2015-06-15 2016-06-13 ５０ナノ秒スパイクフィルタ用のテスト

Country Status (6)

Country Link
US (1) US10108511B2 (cg-RX-API-DMAC7.html)
EP (1) EP3308284A1 (cg-RX-API-DMAC7.html)
JP (1) JP2018517987A (cg-RX-API-DMAC7.html)
KR (1) KR20180017035A (cg-RX-API-DMAC7.html)
CN (1) CN107710183A (cg-RX-API-DMAC7.html)
WO (1) WO2016205142A1 (cg-RX-API-DMAC7.html)

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US10423551B2 (en) 2017-09-07 2019-09-24 Qualcomm Incorporated Ultra-short RFFE datagrams for latency sensitive radio frequency front-end
US10693674B2 (en) * 2018-01-29 2020-06-23 Qualcomm Incorporated In-datagram critical-signaling using pulse-count-modulation for I3C bus
CN110362524B (zh) * 2018-04-11 2021-04-09 杭州海康威视数字技术股份有限公司 时序信号生成方法、装置、逻辑电路板及存储介质
CN109101380B (zh) * 2018-07-27 2022-05-13 广东浪潮大数据研究有限公司 一种i2c信号质量的检测方法及设备
US11119966B2 (en) * 2018-09-07 2021-09-14 Qualcomm Incorporated Mixed-mode radio frequency front-end interface
CN113168448A (zh) 2018-12-03 2021-07-23 惠普发展公司，有限责任合伙企业 逻辑电路系统封装
US10894423B2 (en) 2018-12-03 2021-01-19 Hewlett-Packard Development Company, L.P. Logic circuitry
KR20210087982A (ko) 2018-12-03 2021-07-13 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. 로직 회로
EP3681723B1 (en) 2018-12-03 2021-07-28 Hewlett-Packard Development Company, L.P. Logic circuitry
WO2020117197A1 (en) 2018-12-03 2020-06-11 Hewlett-Packard Development Company, L.P. Logic circuitry
EP3687820B1 (en) 2018-12-03 2022-03-23 Hewlett-Packard Development Company, L.P. Logic circuitry
WO2020117194A1 (en) 2018-12-03 2020-06-11 Hewlett-Packard Development Company, L.P. Logic circuitry
WO2020117305A1 (en) 2018-12-03 2020-06-11 Hewlett-Packard Development Company, L.P. Logic circuitry
US11338586B2 (en) 2018-12-03 2022-05-24 Hewlett-Packard Development Company, L.P. Logic circuitry
CA3121146C (en) * 2018-12-03 2024-05-28 Hewlett-Packard Development Company, L.P. Logic circuitry package for controlling ic2 traffic
CA3114001C (en) * 2018-12-03 2023-06-20 Hewlett-Packard Development Company, L.P. Logic circuitry
US10606794B1 (en) * 2019-05-14 2020-03-31 Infineon Technologies Ag Clock signal monitor for slave device on a master-slave bus
US11327912B2 (en) * 2019-09-12 2022-05-10 Qualcomm Incorporated Controlling the application time of radio frequency front end triggers based on execution of sequences
US11407229B2 (en) 2019-10-25 2022-08-09 Hewlett-Packard Development Company, L.P. Logic circuitry package
CN113312217A (zh) * 2020-02-26 2021-08-27 瑞昱半导体股份有限公司 内部集成电路总线的从属装置的测试方法
US12406077B2 (en) 2020-04-30 2025-09-02 Hewlett-Packard Development Company, L.P. Logic circuitry package for print apparatus
WO2023039070A2 (en) * 2021-09-08 2023-03-16 PassiveLogic, Inc. External activation of quiescent device

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US7313740B2 (en) * 2002-07-25 2007-12-25 Inapac Technology, Inc. Internally generating patterns for testing in an integrated circuit device
US7606955B1 (en) 2003-09-15 2009-10-20 National Semiconductor Corporation Single wire bus for connecting devices and methods of operating the same
US7514962B2 (en) * 2006-04-28 2009-04-07 Stmicroelectronics Pvt. Ltd. Configurable I2C interface
US7394260B2 (en) * 2006-05-24 2008-07-01 Sun Microsystems, Inc. Tuning a test trace configured for capacitive coupling to signal traces
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