JP2018173364A - AE waveform collector - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an AE waveform collector with which it is possible to display waveforms differing in a time base.SOLUTION: The AE waveform collector comprises a memory M capable of successively storing numerical data 15a converted into numeric values corresponding to an amplitude level, and a waveform display unit 45 capable of displaying a waveform on the basis of storage information stored in this memory M. The memory M is composed of a whole waveform memory 40, connected to a first thinning process unit 21 for thinning the numerical data 15a a prescribed number of times, for successively storing a first thinned numerical data 21a that has been thinned out, and a local waveform memory 30 for successively storing the numerical data 15a directly as is without thinning it out. The waveform display unit 45 displays a whole waveform the time base of which is long on the basis of the first thinned numerical data 21a stored in the whole waveform memory 40, as well as displays a local waveform the time base of which is short on the basis of the numerical data 15a stored in the local waveform memory 30.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an AE waveform collection device capable of detecting vibrations and the like with a sensor and displaying a waveform of a change over time of the vibration level.

  A conventional AE waveform collection device is disclosed in Patent Document 1, and includes a plurality of sensors that detect vibration, an amplifier that is provided for each of the sensors and that can amplify an output signal of the sensor, and is output from the amplifier. Recording means capable of displaying the waveform of the amplified signal on a preset time axis. The sensor is a piezoelectric sensor that receives a pressure and outputs a voltage corresponding to the pressure to the amplifier, and a plurality of the sensors are attached at various places where vibration measurement is desired. The conventional AE waveform collecting apparatus configured as described above displays a plurality of waveforms individually based on signals obtained from sensors installed in various places. Thereby, the operator can easily determine an abnormal waveform from a plurality of displayed waveforms, and can easily determine from which of the plurality of sensors the abnormal waveform is detected. However, since the conventional AE waveform collection device disclosed in Patent Document 1 displays information obtained from one sensor only on a preset time axis, the vibration waveform corresponding to each sensor has a long time axis. It was not possible to divide the display into short ones.

  A technique for solving this problem is disclosed in Patent Document 2. This conventional AE waveform acquisition device stores a waveform memory for storing all the data output from the sensor and a whole waveform consisting of a small number of plots obtained by thinning out the data stored in the waveform memory or the waveform memory. And a waveform display unit that displays any of the dense local waveforms without thinning out the existing data. As a result, the conventional AE waveform collection device disclosed in Patent Document 2 switches between the long waveform with a long time axis and the local waveform with a short time axis, which cannot be performed with the one disclosed in Patent Document 1 described above. Realized and has characteristics that it is easy to evaluate characteristics such as occurrence timing and strength of abnormal vibration based on these two waveforms having different time axes.

Patent No. 2980284 Patent No. 2996265

  However, since the conventional AE waveform acquisition device disclosed in Patent Document 2 stores data of a preset short period in the waveform memory, there is a problem that the storage capacity of the waveform memory has to be increased. there were. In addition, the conventional AE waveform collection device has a waveform corresponding to one sensor as described above, an entire waveform representing a series of all work processes with a long time axis, and a time axis that can analyze more detailed abnormal vibrations. Since only one of the short local waveforms is displayed, there is a problem that the local waveform and the entire waveform cannot be displayed simultaneously.

  The present invention was created in view of the above problems, and includes a sensor (10) for detecting an amplitude level such as vibration, an amplifier (12) for amplifying a detection signal of the sensor (10), and the amplifier (12 The A / D converter (15) which converts the amplified signal into a numerical value corresponding to the amplitude level and outputs the numerical data (15a) at predetermined intervals, and output information of the A / D converter (15) In the AE waveform collection device, comprising: a memory (M) capable of storing the waveform; and a waveform display unit (45) capable of displaying the amplitude level in time series based on the stored information stored in the memory (M). The memory (M) has a local waveform memory (30) for storing the numerical data (15a) output from the A / D converter (15) as it is, and presets by counting passage of the numerical data (15a). Was And an overall waveform memory (40) connected to a first thinning processing unit (21) for thinning and outputting the numerical data (15a), and the waveform display unit (45) includes the overall waveform memory ( 40) and the local waveform having different time axes are displayed based on the stored information stored in the local waveform memory (30). The A / D converter (15) counts the passage of the numerical data (15a) to be output from now on and thins out the numerical data (15a) by a preset number and outputs it. The memory (M) connected to (22) includes a local waveform memory (30) for storing upstream decimation numerical data (22a) output from the upstream decimation processing unit (22) as it is, and the upstream decimation An overall waveform memory (40) connected to a first thinning processing unit (21) that counts the passage of the numerical data (22a) and thins and outputs the upstream thinning numerical data (22a) by a preset number. The waveform display unit (45) includes different time axes based on stored information stored in the overall waveform memory (40) and the local waveform memory (30). It may be configured to display the entire waveform and local waveforms present. The waveform display unit (45) is configured to simultaneously display the entire waveform and the local waveform having different time axes based on the stored information stored in the entire waveform memory (40) and the local waveform memory (30). You may comprise.

  The AE waveform acquisition apparatus of the present invention has an advantage that the storage capacity of the memory can be set smaller than the conventional one because the data stored in the memory is thinned out in advance by the amplifier and the first thinning processing unit. There is. Further, the AE waveform collection apparatus of the present invention includes an overall waveform memory that stores output information of the first decimation processing unit connected to the upstream decimation processing unit, and a local waveform that stores output information of the upstream decimation processing unit. And a thinning-out number are set by the upstream thinning-out processing unit and the first thinning-out processing unit, respectively. Accordingly, if only the thinning number set in the upstream thinning processing unit is changed, the time axis of the entire waveform and the local waveform displayed can be changed to be extended, and the thinning number set in the first thinning processing unit If only is changed, only the time axis of the entire waveform can be extended. Furthermore, since the AE waveform collection device of the present invention includes a waveform display unit capable of simultaneously displaying a local waveform having a short time axis and an entire waveform having a long time axis based on information obtained from one sensor, abnormalities can be detected from the entire waveform. There is also an advantage that it is easy to specify the timing of occurrence, and in addition, it is easy to grasp in detail the characteristics such as the strength of abnormal vibration from the local waveform.

It is a schematic explanatory drawing which shows one Embodiment of the AE waveform collection apparatus which concerns on this invention. It is a schematic explanatory drawing which shows another embodiment which concerns on this invention.

  An embodiment of an AE waveform collection apparatus according to the present invention will be described with reference to FIGS. The AE waveform collection apparatus 1 of the present invention includes a sensor 10 that can detect the amplitude level of sound or vibration by detecting sound or vibration, and an amplifier 12 that amplifies and outputs a detection signal detected by the sensor 10. The A / D converter 15 that converts the amplified signal of the amplifier 12 into a numerical value corresponding to the amplitude level and outputs the converted numerical data 15a, and the information output from the A / D converter 15 in turn. A memory M to be stored and a waveform display unit 45 for displaying the relationship between the amplitude level and time based on the stored information stored in the memory M are displayed.

  The AE waveform collecting device 1 collects vibrations and sounds emitted from a press machine for pressing a plate material and a header device for forging a bar material by the sensor 10, and from the obtained information, such as a press machine. It is used to identify the presence or absence of abnormality during production facility operation and the location where the abnormality occurs.

  The sensor 10 is configured to continuously output an analog signal of a detection voltage corresponding to the detected amplitude level of vibration, and a plurality of sensors 10 are attached to an arbitrary place to be inspected such as the inside of the press machine.

  The amplifier 12 is configured to amplify the detection voltage output from the sensor 10 to a preset magnification and output the amplified signal. The amplified signal is an analog signal that is continuously output in the same manner as the detection voltage before amplifying the amplified signal.

  The A / D converter 15 is configured to convert the amplified signal taken from the amplifier 12 into a digital signal and output the digital signal. The digital signal is digitized numerical data 15a indicating the amplitude level. It has become. Further, the A / D converter 15 is configured to take in continuously output analog signals every predetermined period, and output the numerical data 15a with a predetermined time interval for each period. The period for taking in the analog signal and the period for outputting the digital signal are set in advance separately, and the so-called sampling rate in this embodiment can be selected from 11 stages set in the range of 6 MHz to 16 MHz. Yes. That is, if the preset period is, for example, 62.5 ns, the numerical data 15a output from the A / D converter 15 is transmitted every 62.5 ns.

  The memory M is arranged so as to be located downstream of the A / D converter 15, and includes a local waveform memory 30 capable of storing various numerical data input thereto and an overall waveform memory 40. The The local waveform memory 30 and the entire waveform memory 40 are both set to the same storage capacity, and there is an upper limit that can be stored. Therefore, when this upper limit is reached, the old stored information is overwritten sequentially and written to new information. It is configured to replace.

  The waveform display unit 45 is connected to the local waveform memory 30 and the entire waveform memory 40 and is configured to be able to read stored information stored therein. In addition, the waveform display unit 45 is configured to be able to display a numerical value corresponding to the amplitude level as the stored information and the relationship between the time when the numerical value is obtained as a two-dimensional waveform. Based on the stored information stored in the memory 40, two waveforms having different time axes can be displayed simultaneously. The two waveforms having different time axes are the whole waveform having a long time axis and the local waveform having a short time axis, and the former whole waveform is displayed based on the information stored in the whole waveform memory 40. The latter local waveform is displayed based on the information stored in the local waveform memory 30.

  Here, a data transmission path until the numerical data 15a output from the A / D converter 15 is stored in the local waveform memory 30 and the entire waveform memory 40 will be described in order based on FIG. 1 and FIG. . First, there are two data transmission paths of the AE waveform collection apparatus 1 shown in FIG. 1, and a first path through which the numerical data 15a is transmitted to the local waveform memory 30 as it is and a passage of the numerical data 15a. The first thinned numerical data 21a, which is the thinned numerical data 15a, is transmitted to the entire waveform memory 40.

  The second path includes the first thinning processing unit 21 that outputs the first thinned numerical value data 21a described above at predetermined intervals, and outputs the numerical data 15a transmitted intermittently by a predetermined number. It is configured as follows. The first decimation processing unit 21 stores a preset first decimation setting number, counts the number of passages of the numerical data 15a that has passed through the first decimation setting number, and sets the count number as the first decimation setting number. It is configured to monitor whether it has arrived. The first decimation processing unit 21 is configured not to output until the count number reaches the first decimation number, and when it reaches, the first decimation value data is passed through the numerical data 15a that passes next. This is output as 21a and processed to reset the count. Therefore, the first decimation numerical value data 21a stored in the overall waveform memory 40 and the numerical data 15a stored in the local waveform memory 30 are different from each other as the waveform on the time axis as described above. Is displayed.

  Next, the data transmission path of the AE waveform acquisition apparatus 1 shown in FIG. 2 is connected to the A / D converter 15 and counts the numerical data 15a to be thinned by a predetermined number. An upstream thinning-out processing unit 22 is arranged to output certain upstream thinning-out numerical data 22a in two paths and output them respectively.

  There are two data transmission paths from the upstream decimation processing unit 22 to the memory, as described above, and the first path through which the upstream decimation numerical data 22a is directly transmitted to the local memory 30 and the upstream The first thinned numerical value data 21a, which is the upstream thinned numerical value data 22a thinned by a predetermined number by counting the passage of the thinned numerical value data 22a, is constituted by a second path that is transmitted to the overall waveform memory 40.

  The second path includes a first thinning processing unit 21 that further thins out and outputs the above-described upstream thinned numerical value data 22a at predetermined intervals, and outputs the upstream thinned numerical value data 22a by thinning a predetermined number. Composed. The first decimation processing unit 21 stores a preset number of upstream decimation settings, counts the number of passages of the upstream decimation value data 22a that has passed through the first decimation processing unit 21, and counts this count number as the number of upstream decimation settings. It is configured to monitor whether it has arrived. The first decimation processing unit 21 is configured not to output until the count number reaches the upstream decimation setting count, and if it reaches, the first decimation value data 22a that passes next is decremented. It is output as numerical data 21a and processed to reset the count number. Therefore, the first decimation numerical value data 21a stored in the overall waveform memory 40 and the numerical data 15a stored in the local waveform memory 30 are different from each other as the waveform on the time axis as described above. Is displayed.

  Further, since the AE waveform collection apparatus 1 shown in FIG. 2 includes the upstream decimation processing unit 22, the time axis of the local waveform and the entire waveform can be obtained only by changing the number of upstream decimation settings set here. Can be extended.

  As described above, the AE waveform collection apparatus 1 according to the present invention can display information obtained by one sensor by dividing it into two waveforms having different time axes, so that production equipment that requires time in one cycle, etc. It can also be used for vibration inspections.

DESCRIPTION OF SYMBOLS 1 ... AE waveform collection apparatus 10 ... Sensor 12 ... Amplifier 15 ... A / D converter 21 ... 1st thinning process part 22 ... Upstream thinning process part 30 ... Local waveform memory 40 ... Whole waveform memory 45 ... Waveform display part

Claims (3)

A sensor (10) for detecting an amplitude level such as vibration, an amplifier (12) for amplifying a detection signal of the sensor (10), and an amplified signal of the amplifier (12) are converted into numerical values corresponding to the amplitude level. In addition, an A / D converter (15) for outputting the numerical data (15a) at predetermined intervals, a memory (M) capable of storing output information of the A / D converter (15), and the memory (M) In the AE waveform collection device comprising the waveform display unit (45) capable of displaying the amplitude level in time series based on the stored information stored in
The memory (M) includes a local waveform memory (30) for storing the numerical data (15a) output from the A / D converter (15) as it is, and counts the passage of the numerical data (15a) in advance. An overall waveform memory (40) connected to a first thinning processing unit (21) for thinning and outputting the numerical data (15a) by a set number;
The waveform display unit (45) is configured to display an entire waveform or a local waveform having different time axes based on stored information stored in the entire waveform memory (40) or the local waveform memory (30). AE waveform collection device. The A / D converter (15) counts the passage of the numerical data (15a) to be output from now, and thins out the numerical data (15a) by a preset number and outputs it (22) ) And connected to
The memory (M) counts the passage of the local waveform memory (30) for storing the upstream decimation value data (22a) output from the upstream decimation processing unit (22) as it is and the upstream decimation value data (22a). And an overall waveform memory (40) connected to a first decimation processing unit (21) for decimation and outputting the upstream decimation value data (22a) by a preset number,
The waveform display unit (45) displays either the entire waveform or the local waveform having different time axes based on the stored information stored in the entire waveform memory (40) or the local waveform memory (30). The AE waveform acquisition apparatus according to claim 1, wherein the AE waveform acquisition apparatus is configured.   The waveform display unit (45) is configured to simultaneously display an entire waveform and a local waveform having different time axes based on stored information stored in the entire waveform memory (40) and the local waveform memory (30). The AE waveform acquisition device according to claim 1 or 2, characterized in that

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