JP2018091744A5 - - Google Patents

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Publication number
JP2018091744A5
JP2018091744A5 JP2016235852A JP2016235852A JP2018091744A5 JP 2018091744 A5 JP2018091744 A5 JP 2018091744A5 JP 2016235852 A JP2016235852 A JP 2016235852A JP 2016235852 A JP2016235852 A JP 2016235852A JP 2018091744 A5 JP2018091744 A5 JP 2018091744A5
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JP
Japan
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present
sample
spectrum
measurement
completed
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JP2016235852A
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Japanese (ja)
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JP6680192B2 (en
JP2018091744A (en
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Publication of JP2018091744A5 publication Critical patent/JP2018091744A5/ja
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以上、本発明を実施するための形態について実施例を挙げて説明を行ったが、本発明は上記実施例に限定されるものではなく、本発明の趣旨の範囲で適宜変更が可能である。例えば、上記の例では一つの測定対象試料について分光分析部１００での測定が完了した時点で測定結果である分光スペクトルを取得して解析を行うものとしたが、これに限らず全ての測定対象試料の測定が完了した時点で各試料の分析で得られた分光スペクトルのそれぞれを解析するものとしてもよく、予め定められた数の試料について分光分析部１００で分光スペクトルが生成される毎に、本発明に係るプログラムでの解析を行うものとしてもよい。 As mentioned above, although an example was given and explained about a form for carrying out the present invention, the present invention is not limited to the above-mentioned example, and can be changed suitably in the range of the meaning of the present invention. For example, in the above example, the analysis is performed by acquiring the spectral spectrum which is the measurement result when the measurement by the spectroscopic analysis unit 100 is completed for one sample to be measured, but the present invention is not limited to this. when the measurement of the sample is completed may be intended for analyzing each spectrum obtained by the analysis of each sample, the spectrum by the spectral analyzer 100 is generated with the number of specimen predetermined The program according to the present invention may be analyzed each time

JP2016235852A 2016-12-05 2016-12-05 Spectral analysis program Active JP6680192B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2016235852A JP6680192B2 (en) 2016-12-05 2016-12-05 Spectral analysis program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016235852A JP6680192B2 (en) 2016-12-05 2016-12-05 Spectral analysis program

Publications (3)

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JP2018091744A JP2018091744A (en) 2018-06-14
JP2018091744A5 true JP2018091744A5 (en) 2019-05-23
JP6680192B2 JP6680192B2 (en) 2020-04-15

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JP2016235852A Active JP6680192B2 (en) 2016-12-05 2016-12-05 Spectral analysis program

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102580674B1 (en) * 2021-12-22 2023-09-19 한국화학연구원 Method, apparatus and system of providing virutal weathering test service

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6386029A (en) * 1986-09-30 1988-04-16 Shimadzu Corp Data processing method
JPH09325070A (en) * 1996-06-05 1997-12-16 Shimadzu Corp Data processing device for spectrometry
JPH1151617A (en) * 1997-07-30 1999-02-26 Shimadzu Corp Film thickness measuring instrument
JP3798539B2 (en) * 1997-11-26 2006-07-19 日本分光株式会社 Spectrophotometer
JP2002073280A (en) * 2000-08-30 2002-03-12 Nippon Sheet Glass Co Ltd Substrate for transparent touch panel and transparent touch panel
US20040064299A1 (en) * 2001-08-10 2004-04-01 Howard Mark Automated system and method for spectroscopic analysis
JP4186002B2 (en) * 2001-10-31 2008-11-26 学校法人日本大学 RESIN COMPOSITION, THERMOPLASTIC RESIN LAMINATE USING SAME, AND METHOD FOR PRODUCING THEM
JP2016090919A (en) * 2014-11-10 2016-05-23 シャープ株式会社 Electrophotographic photoreceptor and image formation apparatus using the same

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