JP2018004482A - Signal analyzing device, and signal analyzing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a signal analyzing device and a signal analyzing method that can undo the set state of the device and easily reproduce the set state of the device at the time of capturing waveform data or at the time of analytical processing.SOLUTION: A signal analyzing device is equipped with an operating unit 40 for performing operational inputting, a signal processor 10 that generates waveform data of measurable signals S, an analyzer 22 that processes prescribed analysis of the waveform data on the basis of the values of parameters set by the operating unit 40, a memory unit 21 that stores the waveform data, the result of analytical processing of the waveform data and the values of parameters set by the operating unit 40, a display control unit 24 that causes a display unit 30 to display in a list form to be selectable by the operating unit 40 the hysteresis of set values of parameters, the hysteresis of generation starts of the waveform data and the hysteresis of ends of analytical processing of the waveform data, and an undo processor 25 that undoes the set state of a measuring device 1 according to the hysteresis selected by the operating unit 40.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a signal analysis apparatus and a signal analysis method, and more particularly to a signal analysis apparatus such as a spectrum analyzer and a signal analysis method.

  In recent years, with the spread of multimedia communication, the increase in the number of users, and the development of communication technology, wireless terminals (cell phones, etc.) equipped with antennas for wireless communication such as cellular and wireless LAN have been actively produced. It has become so. In wireless terminal manufacturing factories, output levels and reception sensitivities of transmission radio waves determined for each communication standard are measured for wireless communication antennas equipped with wireless terminals, and it is determined whether predetermined standards are met. A performance test is performed.

  As a signal analyzer for performing such a performance test, for waveform data obtained by capturing a waveform of a signal (hereinafter referred to as “measured signal”) output from a device under test (DUT). An analysis process has already been proposed.

  However, the conventional signal analyzer repeats “waveform capture” and “analysis processing” at the time of analyzing the signal under measurement, but discards it after displaying the waveform data and the analysis result of the waveform capture each time on the display device. For this reason, even if a phenomenon with a low occurrence frequency is observed for a moment during measurement, the waveform data and the analysis result are overwritten at the next moment, making it impossible to confirm. Therefore, when it is desired to observe a phenomenon with a low occurrence frequency again, it is necessary to switch the signal analyzer to a mode for recording waveform data and wait for a long time until the phenomenon occurs again.

  On the other hand, a signal analyzer that can read past analysis results, perform analysis again, or change analysis conditions and perform new analysis on the signal under measurement at any time in the past Has been proposed (see, for example, Patent Document 1).

  Various types of analysis software are installed in the conventional signal analysis device disclosed in Patent Document 1, and these software capture waveforms from the signal under measurement for the necessary frequency band according to the DUT communication standard. Is going.

JP2015-99128A

  However, since the conventional signal analysis device disclosed in Patent Document 1 does not record a setting state such as a parameter setting value that specifies an analysis condition, the setting state of the device cannot be undone. Therefore, in order to reproduce the setting state at the time of waveform capture (generation) or analysis processing of past waveform data, it takes time and effort to prepare a means for recording the setting state.

  The present invention has been made to solve such a conventional problem, and can undo the setting state of the device, and easily sets the setting state of the device at the time of waveform data generation or analysis processing. An object is to provide a signal analysis apparatus and a signal analysis method that can be reproduced.

  In order to solve the above-mentioned problems, a signal analyzer according to claim 1 of the present invention is a signal analyzer that performs an analysis process on a signal under measurement output from an object to be tested. An operation unit; a signal processing unit that generates waveform data of the signal under measurement; an analysis unit that performs a predetermined analysis process on the waveform data based on a setting value of a parameter set by the operation unit; A storage unit for storing the waveform data, a result of an analysis process performed on the waveform data by the analysis unit, and a parameter setting value set by the operation unit; a history of the parameter setting value; and the signal processing unit A display control unit that causes the display unit to display a list of the waveform data generation start history and the waveform data analysis processing completion history by the analysis unit selectable by the operation unit The setting value of the parameter is set by the operation unit according to the history selected by the operation unit, the generation of the waveform data by the signal processing unit, and the analysis unit An undo processing unit that returns the setting state of the signal analysis device to any one of the states in which the analysis processing of the waveform data is completed, and the display control unit according to the history selected by the operation unit The waveform data and the analysis result stored in the storage unit are displayed on the display unit.

  With this configuration, the setting state of the apparatus can be undone, and the setting state of the apparatus at the time of waveform data generation or analysis processing can be easily reproduced. For this reason, it is possible to compare the waveform data and the analysis result obtained by performing the measurement again with the setting at the time of generating the past waveform data, and the waveform data and the analysis result generated in the past.

  Further, the signal analysis apparatus according to claim 2 of the present invention is configured such that when a newer history than the setting status history returned by the undo processing unit is selected by the operation unit, the signal analysis is performed in the new history status. The configuration may further include a redo processing unit that restores the setting state of the device.

  In the signal analyzer according to claim 3 of the present invention, the signal processing unit is configured to generate the waveform data with a frequency bandwidth wider than the frequency bandwidth of the signal under measurement.

  With this configuration, it is possible to analyze the waveform data of the signal under measurement of a certain communication standard for a frequency band adjacent to the frequency band of the communication standard.

  A signal analysis method according to claim 4 of the present invention is a signal analysis method using any one of the signal analysis devices described above, and a signal processing step of generating waveform data of the signal under measurement output from the object under test. An analysis step for performing a predetermined analysis process on the waveform data based on a set value of a parameter set by an operation unit for performing an operation input, the waveform data, and the waveform data obtained by the analysis step A storage step for storing the result of the analysis processing for the parameter and a parameter setting value set by the operation unit, a history of the parameter setting value, a history of generation of the waveform data by the signal processing step, and Display control for displaying a history of completion of analysis processing of the waveform data in the analysis step on the display unit so as to be selectable by the operation unit The state in which the setting value of the parameter is set by the operation unit, the state in which the generation of the waveform data is started by the signal processing step, and the analysis according to the history selected by the operation unit And an undo process step for returning the setting state of the signal analyzer to any one of the states in which the analysis processing of the waveform data is completed by the step, and the display control step includes a history selected by the operation unit. Accordingly, the waveform data stored in the storage step and the result of the analysis process are displayed on the display unit.

  With this configuration, the setting state of the apparatus can be undone, and the setting state of the apparatus at the time of waveform data generation or analysis processing can be easily reproduced. For this reason, it is possible to compare the waveform data and the analysis result obtained by performing the measurement again with the setting at the time of generating the past waveform data, and the waveform data and the analysis result generated in the past.

  The present invention provides a signal analysis apparatus and a signal analysis method that can undo the setting state of the apparatus and can easily reproduce the setting state of the apparatus at the time of waveform data generation or analysis processing. is there.

It is a block diagram which shows the structure of the signal analyzer which concerns on one Embodiment of this invention. It is a figure which shows the example of a display of the display part of the signal analyzer which concerns on one Embodiment of this invention. It is FIG. (1) explaining operation | movement of the undo process part of the signal analyzer which concerns on one Embodiment of this invention. It is FIG. (2) explaining operation | movement of the undo process part of the signal analyzer which concerns on one Embodiment of this invention. It is FIG. (3) explaining operation | movement of the undo process part of the signal analyzer which concerns on one Embodiment of this invention. It is a figure explaining operation | movement of the redo process part of the signal analyzer which concerns on one Embodiment of this invention. It is a flowchart which shows the process of the signal analysis method by the signal analyzer which concerns on one Embodiment of this invention.

  Embodiments of a signal analysis apparatus and a signal analysis method according to the present invention will be described below with reference to the drawings.

  As shown in FIG. 1, a signal analysis device 1 according to an embodiment of the present invention is a signal analysis device that performs analysis processing on a signal under measurement output from a DUT, and includes a signal processing unit 10 and a control unit. 20, a display unit 30, and an operation unit 40.

  The signal processing unit 10 receives the signal under measurement S of the DUT 100 and generates (captures) waveform data of the signal under measurement S. The DUT 100 is, for example, a wireless terminal device such as a mobile phone or a base station device.

  Here, communication standards supported by the DUT 100 include, for example, cellular (LTE, LTE-A, W-CDMA (registered trademark), GSM (registered trademark), CDMA2000, 1xEV-DO, TD-SCDMA, etc.), wireless LAN, and the like. (IEEE802.11b / g / a / n / ac / ad, etc.), Bluetooth (registered trademark), GNSS (GPS, Galileo, GLONASS, BeiDou, etc.), FM, and digital broadcasting (DVB-H, ISDB-T, etc.) Is mentioned.

  The signal processing unit 10 includes, for example, an attenuator (ATT) 11, a local oscillator 12, a mixer 13, a band pass filter (BPF) 14, and an analog / digital converter (ADC) 15.

  The ATT 11 has a resistance inside and is used to attenuate the high-frequency signal under measurement S to an optimum mixer input level (for example, decibel) that can be analyzed by the control unit 20 and does not affect the measurement. It is an electronic component that does not change

The local oscillator 12 oscillates a local signal having a local frequency f _L and sends the local signal to the mixer 13. The frequency of the local signal oscillated from the local oscillator 12 changes according to the communication standard selected by the operation unit 40 described later.

The mixer 13 mixes (multiplies) the signal under measurement S having the frequency f _R attenuated by the ATT 11 and the local signal having the local frequency f _L oscillated from the local oscillator 12, and the frequency components of the sum and difference of the two signals are mixed. Is generated.

The BPF 14 filters the output signal from the mixer 13 and passes only signal components in a predetermined frequency range including the frequency f _L −f _R.

  The ADC 15 samples the signal that has passed through the BPF 14 at a predetermined sampling rate and converts it into waveform data as digital data.

  The control unit 20 is configured by, for example, a CPU, a microcomputer or a personal computer including a ROM, a RAM, an HDD, and the like that configure a storage unit 21 described later, and controls the operation of each unit that configures the signal analysis apparatus 1. Further, the control unit 20 executes a predetermined program stored in the storage unit 21 to make the analysis unit 22, the parameter setting unit 23, the display control unit 24, the undo processing unit 25, and the redo processing unit 26 software-like. It is configured to.

  The signal analysis device 1 may be configured to be remotely controlled by an external control device via a remote control interface such as GPIB, Ethernet (registered trademark), or USB.

  The storage unit 21 accumulates and stores a waveform data storage unit 21a for accumulating and storing the waveform data generated by the signal processing unit 10 and an analysis processing result (hereinafter referred to as “analysis result”) for the waveform data by the analysis unit 22. It includes an analysis result storage unit 21b, a setting value storage unit 21c that accumulates and stores setting values of parameters set by the user operating the operation unit 40, and a software storage unit 21d.

  The waveform data storage unit 21a may store the waveform data converted into the spectrum waveform data as the frequency domain data by the analysis unit 22 in addition to the waveform data as the time domain data.

  The software storage unit 21d stores various types of analysis software for executing predetermined analysis processing on the signal under measurement S. For example, the analysis software includes spectrum analysis software for obtaining a spectrum waveform of the signal under measurement S, and analysis software for performing predetermined analysis processing on the waveform data of the signal under measurement S according to the communication standard of the signal under measurement S ( Group).

  The analysis software (group) includes modulation analysis software for measuring the modulation accuracy (EVM) indicating the rate of deterioration of the signal under measurement S, carrier frequency, and transmission power, Spectrogram, and cumulative probability distribution (CCDF: Complementary Cumulative Distribution Function), software for analyzing frequency vs. time, power vs. time, phase vs. time, etc. are included. Furthermore, the analysis software (group) may include software for performing analysis processing such as signal level (LV), bit error rate (BER), adjacent channel leakage power (ACP), and the like.

  The spectrum analysis software operates the components 11 to 15 and the analysis unit 22 of the signal processing unit 10 to display the signal under measurement S from the DUT 100 as a spectrum of frequency and input power value (amplitude level). It is an application for displaying on 30 display screens.

  The analysis software (group) is an application for performing a predetermined analysis process on the waveform data of the measurement signal S by operating the respective constituent elements 11 to 15 and the analysis unit 22 of the signal processing unit 10. . A plurality of analysis software (groups) are prepared for each communication standard (modulation system) selected by the operation unit 40.

  Conventionally, when analyzing a specific communication standard, waveform data is generated in a relatively narrow frequency range including the frequency band of the communication standard. On the other hand, the signal processing unit 10 in the present embodiment sets the sampling rate of the ADC 15 to the maximum value, so that the frequency bandwidth of the signal S to be measured corresponding to each communication standard is higher than conventional. Waveform data of the signal under measurement S is generated with a wide frequency bandwidth.

  As a result, even if analysis is performed on the signal under measurement S of a certain communication standard, the spectrum analysis software or other communication standard can be used for a frequency range outside the frequency band of the communication standard as necessary. Analysis can be performed using analysis software (group). For example, when troubles occur in the wireless LAN communication in the 2.4 GHz band, with respect to the waveform data at the time when there is a problem, the frequency range outside the wireless LAN frequency band using analysis software other than for wireless LAN. Analysis can be performed to identify the cause of radio wave interference.

  Further, the storage unit 21 may hold data on the power supply voltage of the DUT 100. In addition, when the signal analysis device 1 is linked with another measurement device, the data of the power supply voltage of the other measurement device may be held. In this way, if the power supply voltage data is shared between the DUT 100 and a plurality of linked measuring devices, for example, when an abnormality is observed in the waveform data due to the unstable power supply voltage. The cause can be easily identified.

  The display control unit 24 has a history of the type of analysis software, a history of parameter setting values, a history of generation of waveform data of the signal under measurement S by the signal processing unit 10, and a waveform data analysis process by the analysis unit 22 completed. This history is displayed on the display unit 30 in a list so that it can be selected by the operation unit 40. The display control unit 24 displays the waveform data and analysis results stored in the storage unit 21 on the display unit 30 according to the history selected by the operation unit 40.

  The display unit 30 is configured by a display device such as an LCD or a CRT, for example, and displays various display contents in accordance with a control signal from the display control unit 24. Furthermore, the display unit 30 may display operation objects such as soft keys for setting measurement conditions and the like, a pull-down menu, and a text box.

  The operation unit 40 is for a user to perform an operation input such as selecting the above-described history displayed on the display unit 30 by the display control unit 24, and an input device such as a keyboard, a touch panel, or a mouse is used. Consists of including. Alternatively, as described above, the operation unit 40 may have a configuration in which operation objects such as buttons, soft keys, pull-down menus, and text boxes are displayed on the display unit 30.

  The parameter setting unit 23 sequentially sets the setting values of the parameters set by the operation unit 40 in the analysis unit 22, and stores the setting values set in the analysis unit 22 in the setting value storage unit 21c.

  The analysis unit 22 reads the analysis software selected by the operation unit 40 from the software storage unit 21d and executes it. The analysis unit 22 obtains the spectrum waveform of the signal under measurement S using spectrum analysis software. Further, the analysis unit 22 performs predetermined analysis processing on the waveform data generated by the signal processing unit 10 based on the parameter setting values set by the parameter setting unit 23 in a frequency range corresponding to each communication standard. Is supposed to do.

  The undo processing unit 25 returns the setting state of the signal analyzing apparatus 1 according to the history selected by the operation unit 40. Here, the “setting state” means, for example, a state in which parameter setting values are set by the operation unit 40, a state in which generation (acquisition) of waveform data is started by the signal processing unit 10, and a state in which the analysis unit 22 It is assumed that the waveform data analysis process has been completed.

  The redo processing unit 26 restores the setting state of the signal analyzer 1 to the new history state when a newer history than the setting state history returned by the undo processing unit 25 is selected by the operation unit 40. It has become.

  FIG. 2 shows an example of a history list of setting states displayed on the display unit 30 under the control of the display control unit 24. For example, the history of the setting state is displayed in this history list so that the time when the setting state is changed is in ascending order (or descending order).

  In the history list shown in FIG. 2, the time when the setting state is changed is displayed in the “Time” column. In the “System” column, the type of analysis software used in the analysis processing by the analysis unit 22 is displayed. For example, “Spectrum” represents spectrum analysis software. "LTE" represents LTE analysis software (group).

  In the “Parameter” column, the types of parameters used in the analysis software displayed in the “System” column are displayed. In the “Value” column, a parameter setting value change history, waveform data acquisition history, analysis result history, and the like are displayed.

  As shown in FIG. 2, in the history of analysis results in the “Value” column, “Pass” is obtained when the threshold value set in advance for each measurement item by the analysis software is cleared, and when it is not cleared. Will display “Fail”. For example, when the measurement item is EVM and the threshold value is 0.2, “Fail” is displayed if the analysis result is 0.5, and “Pass” is displayed if the analysis result is 0.1. Alternatively, the numerical value of the analysis result of each measurement item may be displayed in the “Value” column.

  “Center frequency” is a parameter for setting and changing the center frequency of the frequency range to be measured. “Reference level” is a parameter for setting and changing the reference level (the upper end of the amplitude scale). “Span” is a parameter for setting and changing the frequency span to be measured. “RBW” is a parameter for setting and changing the resolution bandwidth. “Measure” is a parameter for designating waveform data acquisition start (Start), waveform data acquisition completion, and waveform data analysis processing completion (Complete).

  “Current Tab” is a parameter for setting and changing analysis software used in analysis processing by the analysis unit 22. “Input level” is a parameter for setting and changing the power value of the signal under measurement S. “Bandwidth” is a parameter for setting and changing the bandwidth value of the signal under measurement S. “Test Model” is a parameter for setting and changing the test model.

  The history list as described above may be filtered according to the operation of the operation unit 40 by the user, and only the analysis result may be extracted and displayed on the display unit 30 without the parameter setting state change history. . At this time, by sorting in ascending order (or descending order) at the time when the analysis results were obtained ("13:33:13" and "13:34:13" in the example of Fig. 2), It can be easily grasped how it has changed.

  Hereinafter, the operations of the display control unit 24 and the undo processing unit 25 will be described with reference to FIGS. In the example illustrated in FIG. 3, a history of past setting states related to “Input level” surrounded by a broken line is selected by the operation unit 40. As a result, the setting state of the signal analyzer 1 returns to the setting state when the “Input level” is changed from “−10 dBm” to “−20 dBm”, and the change of the setting state thereafter is canceled. It becomes.

  From this state, for example, when “Bandwidth” is changed from “10 MHz” to “15 MHz”, as shown in FIG. The change history of the setting status of “Bandwidth” is additionally displayed. In the example of FIG. 4A, all setting states after the time when “Input level” is changed from “−10 dBm” to “−20 dBm” are still displayed in the history list.

  On the other hand, as shown in Fig. 4 (b), when "Input level" is changed from "-10 dBm" to "-20 dBm", "Bandwidth" is changed from "10 MHz" to "15 MHz" It is good also as a structure which is not displayed by the display control part 24 on the change history of the setting state performed by the time of being performed. That is, when the setting state is newly changed immediately after the setting state of the signal analyzer 1 returns to the setting state at the time corresponding to the history selected by the operation unit 40, the display control unit 24 The configuration may be such that the history between the two setting states is deleted.

  Further, as shown in FIG. 5, when “Complete” of “Measure” is selected by the operation unit 40, waveform data and analysis results acquired at that time can be referred to.

  Hereinafter, the operation of the redo processing unit 26 will be described with reference to FIG. As shown in FIG. 6A, the setting state at the time “13:33:54” when the “Input level” is changed from “−10 dBm” to “−20 dBm” is selected by the operation unit 40. Thereafter, when no setting change is made, the state of the signal analyzer 1 can be restored to an arbitrary setting state after the time “13:33:54”. For example, as shown in FIG. 6B, when “Start” of “Measure” is selected by the operation unit 40, the same setting as that of the signal analyzer 1 at time “13:34:12” is performed. Re-measurement can be performed in the state.

  Hereinafter, a signal analysis method using the signal analysis apparatus 1 of the present embodiment will be described with reference to the flowchart of FIG. Note that the flowchart of FIG. 7 shows an example of processing when the undo processing unit 25 returns the setting state, and the actual operation of the signal analyzer 1 is not limited to this.

  First, the control unit 20 reads analysis software corresponding to the analysis process designated by the operation of the operation unit 40 by the user from the software storage unit 21d (step S1).

  Next, the control unit 20 causes the setting value storage unit 21c to store the parameter setting values set by the operation of the operation unit 40 by the user. Further, the display control unit 24 causes the display unit 30 to display a list of parameter setting value change histories set by the user operating the operation unit 40 (step S2).

  Next, the signal processing unit 10 generates waveform data of the signal under measurement S output from the DUT 100. The control unit 20 stores the waveform data generated by the signal processing unit 10 in the waveform data storage unit 21a (step S3).

  Next, the display control unit 24 displays a list of generation (acquisition) start histories of the waveform data generated by the signal processing unit 10 on the display unit 30 (step S4).

  Next, the analysis unit 22 performs a predetermined analysis process on the waveform data stored in step S3 by the analysis software specified in step S1, based on the parameter setting values stored in step S2. The control unit 20 stores the analysis result obtained by the analysis unit 22 in the analysis result storage unit 21b (step S5).

  Next, the display control unit 24 causes the display unit 30 to display a list of the completion history of the waveform data analysis processing by the analysis unit 22 (step S6).

  Next, the control unit 20 determines whether any history is selected by the operation of the operation unit 40 by the user (step S7). If a negative determination is made, the process proceeds to step S8. If the determination is affirmative, the process proceeds to step S9.

  In step S <b> 8, the control unit 20 determines whether a new analysis process is designated by the operation of the operation unit 40 by the user. If the determination is affirmative, the process returns to step S1. If a negative determination is made, the process returns to step S7.

  In step S <b> 9, the undo processing unit 25 returns the setting state of the signal analyzer 1 to the setting state corresponding to the history selected by the operation unit 40. For example, as illustrated in FIG. 3, when the history surrounded by a broken line is selected by the operation unit 40, the setting state of the signal analyzer 1 changes from “−10 dBm” to “−20 dBm”. The setting state at the time of the change is restored, and the subsequent change of the setting state is canceled.

  Next, the control unit 20 determines whether or not the history selected in step S7 corresponds to the time point in step S6 (step S10). If the determination is affirmative, the process proceeds to step S11. If the determination is negative, the process ends.

  In step S11, the display control unit 24 causes the display unit 30 to display the waveform data and the analysis result stored in the storage unit 21 in accordance with the history selected in step S7.

  As described above, the signal analysis device 1 according to the present embodiment returns the measurement setting state according to the display control unit 24 that displays a list of device setting state histories and the history selected by the operation unit 40. Since the undo processing unit 25 is provided, the setting state of the apparatus can be undone, and the setting state of the apparatus at the time of waveform data capture (generation) or analysis processing can be easily reproduced. Therefore, it is possible to compare the waveform data and the analysis result obtained by performing the measurement again with the setting at the time of generating the past waveform data, and the waveform data and the analysis result generated in the past.

  In addition, since the signal analysis apparatus 1 of the present embodiment can hold waveform data and analysis results generated in the past as long as the capacity of the storage unit 21 allows, the past waveform data and analysis results can be displayed on the display unit 30. it can. Further, the signal analyzing apparatus 1 according to the present embodiment can analyze the past waveform data in detail by changing the set value of the parameter, or can analyze in detail a plurality of waveform data continuous in time.

  In addition, since the signal analyzing apparatus 1 according to the present embodiment includes the redo processing unit 26, the signal analysis device 1 can restore its own setting state to a history state that is newer than the setting state history returned by the undo processing unit 25.

  Further, since the signal analyzing apparatus 1 of the present embodiment generates waveform data with a frequency bandwidth wider than the frequency bandwidth of the signal under measurement S, the The frequency band adjacent to the frequency band of the communication standard can also be analyzed using spectrum analysis software or analysis software (group) for other communication standards. That is, one waveform data can be shared among a plurality of analysis software.

  Further, the signal analyzing apparatus 1 according to the present embodiment can execute undo / redo in the set state and reference of past waveform data and analysis results by an operation within one screen.

1 Signal Analyzer 10 Signal Processing Unit 11 Attenuator (ATT)
12 Local oscillator 13 Mixer 14 Band pass filter (BPF)
15 Analog-digital converter (ADC)
20 control unit 21 storage unit 21a waveform data storage unit 21b analysis result storage unit 21c set value storage unit 21d software storage unit 22 analysis unit 23 parameter setting unit 24 display control unit 25 undo processing unit 26 redo processing unit 30 display unit 40 operation unit 100 DUT (subject to be tested)

Claims (4)

A signal analyzer (1) that performs an analysis process on a signal under measurement (S) output from an object under test (100),
An operation unit (40) for performing operation input;
A signal processing unit (10) for generating waveform data of the signal under measurement;
An analysis unit (22) for performing a predetermined analysis process on the waveform data based on a set value of a parameter set by the operation unit;
A storage unit (21) for storing the waveform data, a result of an analysis process on the waveform data by the analysis unit, and a setting value of a parameter set by the operation unit;
A history of the setting values of the parameters, a history of generation start of the waveform data by the signal processing unit, and a history of completion of analysis processing of the waveform data by the analysis unit can be selected by the operation unit (30 ) Display control unit (24) to display a list,
According to the history selected by the operation unit, the setting value of the parameter is set by the operation unit, the generation of the waveform data by the signal processing unit, and the analysis unit by the analysis unit An undo processing unit (25) for returning the setting state of the signal analyzer to any state in which the analysis processing of the waveform data is completed,
The display control unit causes the display unit to display the waveform data and the analysis result stored in the storage unit according to a history selected by the operation unit.   A redo processing unit (26) for restoring the setting state of the signal analyzer to the new history state when a history newer than the setting state history returned by the undo processing unit is selected by the operation unit; The signal analyzer according to claim 1, further comprising:   The signal analysis apparatus according to claim 1, wherein the signal processing unit generates the waveform data with a frequency bandwidth wider than a frequency bandwidth of the signal under measurement. A signal analysis method using the signal analysis device according to any one of claims 1 to 3,
A signal processing step (S3) for generating waveform data of the signal under measurement (S) output from the test object (100);
An analysis step (S5) for performing a predetermined analysis process on the waveform data based on a set value of a parameter set by an operation unit for performing an operation input;
A storage step (S2, S3, S5) for storing the waveform data, a result of an analysis process for the waveform data in the analysis step, and a set value of a parameter set by the operation unit;
A history of the setting value of the parameter, a history of start of generation of the waveform data by the signal processing step, and a history of completion of the analysis processing of the waveform data by the analysis step can be selected by the operation unit. Display control steps (S2, S4, S6) to be displayed in a list;
According to the history selected by the operation unit, the setting value of the parameter is set by the operation unit, the state where generation of the waveform data is started by the signal processing step, and the analysis step An undo process step (S9) for returning the setting state of the signal analyzer to any one of the states in which the analysis processing of the waveform data is completed,
The display control step causes the display unit to display the waveform data stored in the storage step and the result of the analysis process according to the history selected by the operation unit (S11). Analysis method.

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