JP2017507718A5 - - Google Patents

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Publication number
JP2017507718A5
JP2017507718A5 JP2016554222A JP2016554222A JP2017507718A5 JP 2017507718 A5 JP2017507718 A5 JP 2017507718A5 JP 2016554222 A JP2016554222 A JP 2016554222A JP 2016554222 A JP2016554222 A JP 2016554222A JP 2017507718 A5 JP2017507718 A5 JP 2017507718A5
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JP
Japan
Prior art keywords
temperature
electron beam
electron
exit window
measuring device
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JP2016554222A
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English (en)
Japanese (ja)
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JP2017507718A (ja
JP6363219B2 (ja
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Priority claimed from PCT/EP2015/051076 external-priority patent/WO2015128117A1/en
Publication of JP2017507718A publication Critical patent/JP2017507718A/ja
Publication of JP2017507718A5 publication Critical patent/JP2017507718A5/ja
Application granted granted Critical
Publication of JP6363219B2 publication Critical patent/JP6363219B2/ja
Expired - Fee Related legal-status Critical Current
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JP2016554222A 2014-02-26 2015-01-21 温度測定デバイス、放射強度と相関がある温度を含む、電子線滅菌のためのデバイスおよび方法 Expired - Fee Related JP6363219B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE1450224-9 2014-02-26
SE1450224 2014-02-26
PCT/EP2015/051076 WO2015128117A1 (en) 2014-02-26 2015-01-21 Device and method for electron beam sterilization comprising temperature measurement device temperature correlated to radiation intensity

Publications (3)

Publication Number Publication Date
JP2017507718A JP2017507718A (ja) 2017-03-23
JP2017507718A5 true JP2017507718A5 (https=) 2018-02-08
JP6363219B2 JP6363219B2 (ja) 2018-07-25

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ID=52355001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016554222A Expired - Fee Related JP6363219B2 (ja) 2014-02-26 2015-01-21 温度測定デバイス、放射強度と相関がある温度を含む、電子線滅菌のためのデバイスおよび方法

Country Status (5)

Country Link
US (1) US20160361449A1 (https=)
EP (1) EP3110457B1 (https=)
JP (1) JP6363219B2 (https=)
CN (1) CN106061516B (https=)
WO (1) WO2015128117A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015128116A1 (en) * 2014-02-25 2015-09-03 Tetra Laval Holdings & Finance S.A. Conditioning system for a sterilization device, a sterilization machine and a method of conditioning a sterilization device
EP3220963B1 (en) * 2014-11-18 2019-01-23 Tetra Laval Holdings & Finance SA E-beam emitter with dosimeter assembly
CN107290772A (zh) * 2017-07-27 2017-10-24 中广核达胜加速器技术有限公司 电子加速器束流位置监测系统及方法
US10751549B2 (en) * 2018-07-18 2020-08-25 Kenneth Hogstrom Passive radiotherapy intensity modulator for electrons
US12392914B2 (en) * 2018-11-23 2025-08-19 Tetra Laval Holdings & Finance S.A. Measuring tool for irradiation source and method for measuring radiation
WO2022003678A1 (en) 2020-06-28 2022-01-06 Cozai Ltd Work function measurements for surface analysis
CN114906420A (zh) * 2021-02-07 2022-08-16 湖州超群电子科技有限公司 一种用于开口容器的新型电子束杀菌消毒系统及其方法
DE102021110223A1 (de) * 2021-04-22 2021-06-02 Krones Aktiengesellschaft Vorrichtung und Verfahren zum Behandeln der Innenwandungen von Behältnissen
DE102021111260A1 (de) 2021-04-30 2022-11-03 Infrasolid Gmbh Thermische Strahlungsquelle und Verfahren zur Messung der exakten Temperatur und / oder abgestrahlten Strahlungsleistung der thermischen Strahlungsquelle
CN119033977B (zh) * 2024-08-09 2025-07-01 中广核戈瑞(深圳)科技有限公司 一种用于辐照设备的报警装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5783900A (en) * 1995-09-21 1998-07-21 Virginia Accelerators, Inc. Large-area electron irradiator with improved electron injection
US6762418B2 (en) * 2001-03-13 2004-07-13 Advanced Cardiovascular Systems, Inc. Calorimetry as a routine dosimeter at an electron beam processing facility
JP2003337198A (ja) * 2002-05-17 2003-11-28 Katsuhiro Ono 電子線照射装置
JP2005195469A (ja) * 2004-01-07 2005-07-21 Toyo Ink Mfg Co Ltd 電子線照射装置および電子線照射方法
SE529241C2 (sv) * 2005-10-26 2007-06-05 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
US7368739B2 (en) * 2005-10-26 2008-05-06 Tetra Laval Holdings & Finance S.A. Multilayer detector and method for sensing an electron beam
SE530019C2 (sv) * 2006-06-14 2008-02-12 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
DK2106560T3 (en) * 2007-01-24 2017-08-07 Ravenbrick Llc THERMAL REPLACED OPTICAL DOWN CONVERTER FILTER
US20110012030A1 (en) * 2009-04-30 2011-01-20 Michael Lawrence Bufano Ebeam sterilization apparatus
US8887477B2 (en) * 2009-11-16 2014-11-18 Cordis Corporation E beam sterilization of medical devices comprising bioactive coating
JP2011229622A (ja) * 2010-04-26 2011-11-17 Mitsubishi Heavy Industries Food & Packaging Machinery Co Ltd 電子線殺菌装置における電子線照射エネルギー量監視システム
JP5505632B2 (ja) * 2010-04-30 2014-05-28 澁谷工業株式会社 物品滅菌装置
JP2014500583A (ja) * 2010-10-27 2014-01-09 日立造船株式会社 気密シールされた薄膜用途のための湾曲した支持グリッド
JP5148735B2 (ja) * 2011-08-29 2013-02-20 三菱重工業株式会社 食品容器の電子線殺菌検査システム及び食品容器の電子線殺菌検査方法

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