JP2017158018A5 - - Google Patents
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- Publication number
- JP2017158018A5 JP2017158018A5 JP2016039156A JP2016039156A JP2017158018A5 JP 2017158018 A5 JP2017158018 A5 JP 2017158018A5 JP 2016039156 A JP2016039156 A JP 2016039156A JP 2016039156 A JP2016039156 A JP 2016039156A JP 2017158018 A5 JP2017158018 A5 JP 2017158018A5
- Authority
- JP
- Japan
- Prior art keywords
- pixel
- output value
- value
- image processing
- processing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000011156 evaluation Methods 0.000 claims 30
- 238000001514 detection method Methods 0.000 claims 15
- 230000002950 deficient Effects 0.000 claims 13
- 238000000034 method Methods 0.000 claims 11
- 238000003705 background correction Methods 0.000 claims 9
- 238000006243 chemical reaction Methods 0.000 claims 9
- 238000003384 imaging method Methods 0.000 claims 3
- 210000001747 pupil Anatomy 0.000 claims 2
- 230000004907 flux Effects 0.000 claims 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016039156A JP2017158018A (ja) | 2016-03-01 | 2016-03-01 | 画像処理装置およびその制御方法、撮像装置 |
| US15/445,244 US20170257583A1 (en) | 2016-03-01 | 2017-02-28 | Image processing device and control method thereof |
| CN201710117607.1A CN107147858A (zh) | 2016-03-01 | 2017-03-01 | 图像处理装置及其控制方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016039156A JP2017158018A (ja) | 2016-03-01 | 2016-03-01 | 画像処理装置およびその制御方法、撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2017158018A JP2017158018A (ja) | 2017-09-07 |
| JP2017158018A5 true JP2017158018A5 (enExample) | 2019-04-04 |
Family
ID=59724498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016039156A Abandoned JP2017158018A (ja) | 2016-03-01 | 2016-03-01 | 画像処理装置およびその制御方法、撮像装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20170257583A1 (enExample) |
| JP (1) | JP2017158018A (enExample) |
| CN (1) | CN107147858A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7019337B2 (ja) * | 2017-08-02 | 2022-02-15 | キヤノン株式会社 | 像ブレ補正装置、レンズ装置およびそれらの制御方法 |
| CN107918216B (zh) * | 2017-12-13 | 2021-03-12 | 深圳Tcl新技术有限公司 | 图像Mura缺陷评估方法、系统以及可读存储介质 |
| CN111557090A (zh) * | 2018-01-11 | 2020-08-18 | 索尼公司 | 信息处理设备、信息处理方法、程序和可互换透镜 |
| CN108710539B (zh) * | 2018-05-18 | 2021-03-16 | 珠海格力电器股份有限公司 | 一种信息处理方法、终端及可读存储介质 |
| JP2021051015A (ja) * | 2019-09-25 | 2021-04-01 | ソニーセミコンダクタソリューションズ株式会社 | 測距装置、測距方法、並びにプログラム |
| TWI888470B (zh) * | 2020-02-03 | 2025-07-01 | 日商索尼半導體解決方案公司 | 電子機器 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6404853B1 (en) * | 2001-11-02 | 2002-06-11 | Ge Medical Systems Global Technology Company, Llc | Method for identifying and correcting pixels with excess pixel lag in a solid state x-ray detector |
| US20080273102A1 (en) * | 2007-05-01 | 2008-11-06 | Hoya Corporation | Detection device for defective pixel in photographic device |
| US20090040343A1 (en) * | 2007-08-06 | 2009-02-12 | Mediatek Inc. | Methods and apparatuses for defective pixel detection and correction |
| US8259198B2 (en) * | 2009-10-20 | 2012-09-04 | Apple Inc. | System and method for detecting and correcting defective pixels in an image sensor |
| KR101114586B1 (ko) * | 2010-02-08 | 2012-03-02 | 삼성전자주식회사 | 불량 화소 제거 장치 및 방법 |
| JP5901246B2 (ja) * | 2010-12-13 | 2016-04-06 | キヤノン株式会社 | 撮像装置 |
| JP6041495B2 (ja) * | 2011-03-24 | 2016-12-07 | キヤノン株式会社 | 撮像装置及び欠陥画素の判定方法 |
| US20130004071A1 (en) * | 2011-07-01 | 2013-01-03 | Chang Yuh-Lin E | Image signal processor architecture optimized for low-power, processing flexibility, and user experience |
| CN103888690B (zh) * | 2012-12-19 | 2018-08-03 | 韩华泰科株式会社 | 用于检测缺陷像素的设备和方法 |
-
2016
- 2016-03-01 JP JP2016039156A patent/JP2017158018A/ja not_active Abandoned
-
2017
- 2017-02-28 US US15/445,244 patent/US20170257583A1/en not_active Abandoned
- 2017-03-01 CN CN201710117607.1A patent/CN107147858A/zh active Pending
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