JP2017142554A - Inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection device that can efficiently inspect models in a model base development.SOLUTION: An inspection device inspecting a model ML in a model base development is configured to: perform a first simulation using a value indicated by a test pattern TP to be input; build a model for performing a second simulation using a result RES to be created when the first simulation is performed as a previous value VA; and change the previous value to be used in the second simulation, in which in the change, a value to be used in the change is calculated by analyzing a branch logic to be included in the model or the value to be used in the change is a value to be pre-set.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inspection apparatus.

  Conventionally, in order to test a large-scale software component, a test pattern including data indicating parameter values necessary for the test is used. In order to generate this test pattern, a method for narrowing down a necessary test pattern is known. Specifically, first, the test information management server receives each parameter value to be set from the client computer in the usage environment in which the software component is used. Next, the test information management server generates a test pattern by combining relevant parameter values among the received parameter values. Then, the test information management server transmits the generated test pattern to the client computer. In this way, a method is known in which a test information management server generates a test pattern used to test a large-scale software component (for example, Patent Document 1). When such a method is used, a test pattern is generated only for a combination of related parameter values, so that the test information management server can narrow down a necessary test pattern in the software component test. Therefore, an efficient test can be performed.

JP 2010-3224 A

  However, the above-mentioned conventional technology only narrows down the test pattern, so even if the test pattern is reduced, a model that can simulate the software to be developed is constructed in the upstream process such as software development. In the method of developing software (hereinafter referred to as “model-based development”), the number of times simulation is performed based on one test pattern cannot often be reduced. For this reason, in the above-described conventional technique, since the number of simulations is large, the simulation time is long or the number of simulation loops is large.

  In addition, when the number of simulations is large, data for establishing each simulation (hereinafter referred to as “time-series test pattern”) also increases in accordance with the number of times the simulation is performed. Thus, as the time series test pattern increases, the probability that the computer can generate the time series test pattern decreases. A time-series test pattern that cannot be generated by the computer is generated manually. For this reason, there are many cases where manual work such as creating a time-series test pattern increases. Therefore, in the above-described conventional technology, an inspection apparatus that tests and inspects a model in model-based development may not be able to inspect the model efficiently.

  In view of the above problems, an object of the present invention is to provide an inspection apparatus capable of efficiently inspecting a model by reducing the number of times simulation is performed or reducing manual work in model-based development.

In order to achieve the above object, in one embodiment, an inspection apparatus for inspecting a model in model-based development includes:
A model building unit that builds the model that performs a first simulation using a value indicated by an input test pattern and performs a second simulation that uses a result generated when the first simulation is performed as a previous value; ,
A change unit for changing the previous value used in the second simulation,
The change unit calculates a value used for the change by analyzing a branch logic included in the model, or sets a value used for the change as a preset value.

  According to this aspect, the inspection unit can change the previous value indicating the result generated when the first simulation is performed by the changing unit. Therefore, the inspection apparatus can perform the second simulation by setting the result of the first simulation, that is, the value used in the second simulation using the previous value to an arbitrary value.

  Until now, in the case of performing a simulation a plurality of times in the inspection, it is necessary to prepare data such as a time series test pattern in order to establish each simulation. Therefore, when the number of simulations is large, a large amount of data such as time series test patterns is required. In model-based development, a value that is difficult to change due to the nature of a tool or the like may be a determination target in the branch condition. When such a value is used for inspection, the computer needs to repeat the simulation until the value becomes a desired value. Therefore, in order for the computer to repeat the simulation, it is necessary to prepare data such as time-series test patterns, and the work for preparing each data increases.

  On the other hand, in this aspect, since the previous value can be changed by the changing unit, the inspection apparatus can omit the simulation that is repeatedly performed until the previous value becomes a desired value. Further, if the number of simulations is reduced, the required data such as time series test patterns can be reduced according to the number of simulations.

  And in the model inspection, limit value analysis that checks whether the model switches processing to be executed based on the branch condition according to the specification, depending on whether the condition satisfies the branch condition or not Etc. are often performed. In such limit value analysis or the like, if the previous value is changed from a value generated when the first simulation is performed to a boundary value or the like, a simulation that is less necessary for inspection can be omitted. In addition, the inspection apparatus can reduce the need to generate time series test pattern data or the like for changing the previous value from a value generated when the first simulation is performed to a boundary value or the like. Therefore, it is possible to reduce the work of generating test patterns and the like manually by the user. Therefore, since the inspection apparatus can reduce the number of times simulation is performed in the model inspection or reduce manual work by the user, the model can be efficiently inspected in model-based development.

  According to the present embodiment, it is possible to provide an inspection apparatus capable of efficiently inspecting a model in model-based development.

It is a general view which shows the example of a test | inspection of the model by the test | inspection apparatus which concerns on one Embodiment of this invention. It is a block diagram which shows an example of the model test | inspected by the test | inspection apparatus which concerns on one Embodiment of this invention. It is a block diagram which shows another example of the model test | inspected by the test | inspection apparatus which concerns on one Embodiment of this invention. It is a general view which shows the 2nd test example of the model by the test | inspection apparatus which concerns on one Embodiment of this invention. It is a general view which shows the 3rd test example of the model by the test | inspection apparatus which concerns on one Embodiment of this invention.

  Hereinafter, embodiments for carrying out the invention will be described with reference to the drawings.

  FIG. 1 is an overall view showing an example of model inspection by an inspection apparatus according to an embodiment of the present invention. The illustrated example shows a configuration example for the inspection apparatus to inspect the model ML based on the test pattern TP. Specifically, the inspection is realized by simulating a model. That is, the inspection apparatus uses a model in so-called model-based development as an inspection target.

  In the model-based development, as shown in the drawing, when a model ML indicating the specification of software to be developed is constructed, the inspection apparatus can simulate the model ML. As described above, when the simulation is performed, the inspection apparatus can output the same output result as when the software developed based on the specification indicated by the model ML is executed. Note that the model-based development is realized by using a tool such as MATLAB (registered trademark) / Simulink (registered trademark). Hereinafter, a model constructed by using MATLAB (registered trademark) / Simulink (registered trademark) will be described as an example. In this example, the model is constructed by connecting a plurality of blocks indicating types of processing performed in software.

  In the inspection, first, data of the test pattern TP is input to the inspection apparatus. The test pattern TP indicates parameters for simulating the model ML. Specifically, the test pattern TP is a value assigned to an argument in a function or a global variable.

  The model ML to be inspected has a control logic CTL. Note that the type of processing performed by the control logic CTL is set by the user. The control logic CL is simulated under conditions set by the input test pattern TP and the like. In this way, when the simulation is executed, the inspection apparatus can output the output result RES.

  If it is determined that the model ML is free of bugs and the model is constructed so as to satisfy the specifications based on the output result RES, the inspection apparatus compiles the model ML and generates program source code. Etc. may be generated. For example, the generated program source code is a source code written in a high-level language such as C language.

  Further, when the simulation of the model ML is executed, it is assumed that there are values of state variables and the like (hereinafter referred to as “previous value VA”) generated based on the simulation result. That is, the previous value VA is a value indicating a calculation result or the like by the previous simulation. Next, it is assumed that the model ML performs processing based on the previous value VA. Specifically, for example, the model ML performs a branching process that determines whether or not a predetermined condition is satisfied by comparing the previous value VA with a preset threshold value or the like. That is, the previous value VA changes depending on the result of the simulation, and the model ML switches the arithmetic processing to be executed according to the value of the previous value VA. The previous value VA is, for example, a counter value or a timer value.

  Hereinafter, the simulation performed by the inspection apparatus using the value indicated by the test pattern is referred to as “first simulation”. On the other hand, a simulation performed by the inspection apparatus using the previous value VA, that is, a simulation performed after the first simulation is performed is referred to as a “second simulation”.

  In this way, when the processing performed by the model ML differs depending on the value of the previous value VA, the inspection checks whether or not the processing is switched according to the specification when the previous value VA changes. That is, in the inspection, so-called boundary value analysis (also referred to as “limit value analysis”) related to the previous value VA is performed. Therefore, in order to perform boundary value analysis and the like in the inspection, the inspection apparatus changes the previous value VA as follows.

  The inspection apparatus includes a change logic CHL that is an example of a change unit. As shown in the figure, the change logic CHL changes the previous value VA generated by the control logic CTL to a predetermined value. Thus, when there is the change logic CHL, the inspection apparatus can change the previous value VA to an externally input value, that is, an arbitrary value.

  The inspection apparatus is a computer such as a PC (Personal Computer). In other words, the inspection device has, for example, the following hardware configuration. Specifically, the inspection apparatus has an input device such as an interface or a keyboard for inputting the model ML and the test pattern TP. In addition, the inspection apparatus includes an arithmetic apparatus that performs arithmetic and control for realizing a process of inspecting a model, a CPU (Central Processing Unit) that is a control apparatus, and the like. Further, the inspection apparatus includes a network I / F (interface) for connecting to an external apparatus via a network. Furthermore, the inspection device has storage devices such as a main storage device and an auxiliary storage device that store data used for the inspection. In addition, the inspection apparatus has an output device such as a display for displaying a simulation result or the like.

  For example, an example in which the inspection apparatus inspects the model ML as described below will be described.

  FIG. 2 is a block diagram illustrating an example of a model inspected by the inspection apparatus according to the embodiment of the present invention. In the illustrated example, the model ML is a model having a control logic CTL that performs processing such as “Add” for adding a constant and “Switch” for switching output. In order to construct the model ML, an operation for setting what kind of processing is performed in the model ML is input to the inspection apparatus by the user.

  As shown in the drawing, first, when the first simulation is executed by the control logic CTL, the previous value VA is generated. In this example, the previous value VA is “B”. For example, when the model ML has the addition change logic CHL1 as shown in the figure, the inspection apparatus adds the previous value VA, that is, “OFFSET” set in advance to “B”, and sets the previous value VA to “A”. Can be changed.

  Thus, since the inspection apparatus can change “B” of the previous value VA generated as a result of the first simulation by the addition change logic CHL1, the inspection apparatus performs the second simulation. It can be executed with a value of “A”.

  In the configuration as shown in the figure, when “OFFSET” is set to “0”, the model ML is set to “A = B + 0”. Therefore, with this setting, it is possible to determine that “Add1”, “Constant2”, and the like, which are the configurations of adding “OFFSET” in the model ML, have no meaning. In this way, in the compilation for generating the program source code based on the model ML, the compiler often deletes the configuration for adding “OFFSET” by the optimization function. Therefore, in the process using the program source code generated by compilation, the processing load due to the process of changing the previous value is small. As described above, the inspection apparatus can perform the inspection with a configuration that can easily generate the program source code with a small processing load.

  The previous value VA may be changed by a method other than addition. For example, the previous value VA may be changed by multiplication as follows.

  FIG. 3 is a block diagram illustrating another example of a model inspected by the inspection apparatus according to the embodiment of the present invention. Compared to FIG. 2, FIG. 3 differs in that the addition change logic CHL1 becomes the multiplication change logic CHL2. That is, in the example illustrated in FIG. 2, the inspection apparatus adds and changes the previous value VA to “A = B + OFFSET” by the addition change logic CHL1. On the other hand, in the example shown in FIG. 3, the inspection apparatus performs multiplication by the multiplication change logic CHL2. Specifically, the inspection apparatus multiplies the previous value VA by “A = B × GAIN” and changes it by the multiplication change logic CHL2. In the model shown in the figure, multiplication is performed by “Product”. In this way, the inspection apparatus may change the previous value VA by multiplication.

  Further, the inspection apparatus may change the previous value VA by subtraction, division, replacement by LUT (Look Up Table), or a combination thereof.

  Note that the inspection apparatus is not limited to changing the previous value VA by adding or multiplying a previously input constant, that is, a fixed value, to the previous value VA. For example, the inspection apparatus may determine a value to be used for the change as follows by analyzing a branch process or the like affected by the previous value VA.

  FIG. 4 is an overall view showing a second example of model inspection by the inspection apparatus according to the embodiment of the present invention. Compared to FIG. 1, the overall diagram shown is different in that the value used by the change logic CHL is determined by analyzing the branch logic BIL included in the control logic CTL. Note that the branch logic BIL is a process realized by a relational operator such as “Relational Operator” in the examples illustrated in FIGS. 2 and 3. That is, the branch logic BIL has a value input to the branch logic BIL that is greater than or equal to a predetermined value, less than or equal to a predetermined value, greater than a predetermined value, less than a predetermined value, Determine whether they are equal.

  For example, it is assumed that the control logic CTL has a specification for performing a predetermined process (hereinafter referred to as “first process”) when “I-term (integral term) is 1000” in PID control or the like. On the other hand, in other cases, that is, “when the I term is a value other than 1000”, the control logic CTL is a specification for performing processing different from the first processing (hereinafter referred to as “second processing”). And

  In the case of such a specification, it is desirable to perform a boundary value analysis in which the previous value VA is changed to, for example, “0”, “999”, “1000”, and “1001” in the inspection. That is, if the previous value VA is “0”, “999”, and “1001”, whether or not the control logic CTL performs the second process is checked based on the output result RES and the like. Further, if the previous value VA is “1000”, whether or not the control logic CTL performs the first process is checked based on the output result RES and the like. A value for switching processing performed by the branch logic BIL may be set like “1000” in this example. When such boundary value analysis or the like is performed, the change logic CHL changes the previous value VA to be “1000” or a value before and after “1000”.

  In this way, the inspection apparatus analyzes the branch logic BIL and extracts a boundary value such as “1000”. Then, the inspection apparatus changes the previous value VA so that the boundary value or values before and after the boundary value are obtained. If it does in this way, the inspection device can perform boundary value analysis concerning operation logic CAL and branch logic BIL.

  In model-based development, a model that performs simulation using the previous value or the like may be constructed. However, in the model-based development, for example, if it is blocked like “Unit Delay” shown in FIG. 2, it may be difficult to change the previous value. In such a case, for example, in a model including a branching condition such as “when a certain condition continues 100 times”, the boundary value analysis is performed after the previous value of “0” that is the initial value, followed by “100”. The inspection apparatus performs an inspection using previous values such as “99”, “100”, and “101” as values before and after “100” and “100”. Therefore, it is necessary to generate a test pattern that satisfies “a certain condition 100 times”, that is, time-series test pattern data. In this way, as the limit value analysis, among the tests from “0” to “101”, the tests from “1” to “98” are often useless, and in the process and inspection for generating the test pattern. Processing load may increase. Therefore, there are cases where the user manually creates a test pattern with little waste. Thus, if there is a manual process for creating a test pattern, it takes time to create the test pattern, and the efficiency of inspecting the model may deteriorate.

  On the other hand, as in the embodiment according to the present invention, the inspection apparatus changes the previous value by a change logic or the like that is an example of a change unit. In this way, useless values can be omitted in the limit value analysis. For example, in the above example, after “0” is performed, the inspection apparatus can change the previous value to “99”. Therefore, since the inspection apparatus can omit the simulation using “1” to “98” as the previous value, the number of times the simulation is performed can be reduced. In this way, the inspection apparatus can efficiently inspect a model in model-based development.

  As another comparative example, a method of changing the initial value of the “Unit Delay” block in FIG. 2 is conceivable. However, since this method edits the inspection object, it is often not desirable as an inspection method. On the other hand, in the embodiment according to the present invention, the inspection apparatus can inspect without changing the model to be inspected.

  In addition, the model may not perform branch processing as follows.

  FIG. 5 is an overall view showing a third example of model inspection by the inspection apparatus according to the embodiment of the present invention. FIG. 5 differs from FIG. 4 in that there is no branch logic BIL. Even in the configuration shown in the figure, the arithmetic logic CAL may be inspected under the precondition that the previous value VA is a specific value. In such a case, it may be difficult to generate time-series test pattern data that is a prerequisite for the inspection apparatus.

  The time series test pattern data is prepared for each simulation, for example. That is, one time series test pattern data may be required for one simulation.

  Note that the time-series test pattern data is data or the like for setting the environment necessary for the simulation. Therefore, when the number of simulations, that is, the number of loops is large, a large amount of time-series test pattern data is required. Computers such as inspection devices include time-series test pattern data that cannot be generated when time-series test pattern data increases. Or, if it takes time to generate one time-series test pattern data, if the time-series test pattern data increases, the total processing time becomes enormous, and all the time-series test pattern data is generated in the computer. Sometimes it is virtually impossible to do so. As described above, when the amount of data necessary for the simulation increases, it is often difficult for the computer to generate data for the simulation. Since data that cannot be generated by the computer is generated manually, if the number of simulations is large, the manual operation increases and the inspection efficiency often deteriorates.

  On the other hand, as in the embodiment according to the present invention, the inspection apparatus changes the previous value by a change logic or the like that is an example of a change unit. In this way, the inspection apparatus can create a precondition environment with little or no time-series test pattern data. Therefore, the inspection apparatus can inspect the model with a test pattern for one cycle.

  For example, it is assumed that the inspection is performed under the precondition that “I term is 1000”. In this example, when “previous value = previous value + 1000” is set, the inspection apparatus can create an environment that satisfies the preconditions in one cycle.

  Note that the value “1000”, that is, the value used by the changing unit for the change is, for example, as shown in FIG. 4, when the model ML includes a branch logic BIL, the inspection device analyzes the branch logic. This is a calculated value. Further, the value used for the change by the changing unit may be a value set in the inspection apparatus in advance.

  In this way, the inspection apparatus can efficiently inspect a model in model-based development.

  As mentioned above, although the form for implementing this invention was explained in full detail, this invention is not limited to this specific embodiment, In the range of the summary of this invention described in the claim, various It is possible to modify or change.

VA previous value ML model TP test pattern RES output result CHL change logic (example of change part)
CTL control logic (example of model building unit)

Claims (1)

An inspection device for inspecting a model in model-based development,
A model building unit that builds the model that performs a first simulation using a value indicated by an input test pattern and performs a second simulation that uses a result generated when the first simulation is performed as a previous value; ,
A change unit for changing the previous value used in the second simulation,
The change unit is an inspection apparatus that calculates a value used for the change by analyzing a branch logic included in the model or sets a value used for the change as a preset value.

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