JP2017110916A - Deterioration diagnostic device and deterioration diagnostic method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a deterioration diagnostic device and a deterioration diagnostic method capable of carrying out a deterioration diagnosis at on site and in a non-destructive approach without requiring any master data.SOLUTION: Disclosed deterioration diagnostic device (1) includes: a Raman spectrometer (2) that acquires a Raman spectrum of an insulation surface (S) of an insulator; a detection section (3) that detects the amount of change of optical strength from an initial state in an identical wavelength of the Raman spectrum; and a diagnostic part (4) that diagnosis a deterioration state of the insulator based on optical strength amount of change.SELECTED DRAWING: Figure 1

Description

  The present invention relates to, for example, a deterioration diagnosis apparatus and a deterioration diagnosis method for diagnosing a deterioration state associated with aged use of an insulating insulator constituting a high-voltage power distribution device.

  A high-voltage power distribution device is a device in which a high-voltage structure is stored in a distribution board of a certain size. A portion having a large potential difference inside the switchboard is provided with a predetermined insulation strength by increasing a separation distance or sandwiching an insulator. When insulation performance deteriorates due to use over time, the insulation eventually breaks down and results in failure. Therefore, there is a need for an insulation deterioration diagnosis / remaining life diagnosis technology that prevents failure.

  For example, Patent Document 1 discloses an invention related to a method for estimating the degree of insulation deterioration. Specifically, the hue, brightness, and saturation of the surface of the solid insulator are measured with a spectral color difference meter, and the degree of insulation deterioration of the surface of the solid insulator is estimated based on the measured value and a calibration curve prepared in advance. (See the claims of Patent Document 1).

  Patent Document 2 below discloses an invention relating to a method for estimating the remaining life of a solid insulator for power receiving and distribution equipment. Specifically, each evaluation item of gloss, color, and component (amount of hydrocarbon group) of the solid insulator is measured by a portable gloss meter, a portable color meter, and a simple infrared spectrophotometer, respectively. Subsequently, the measurement results for each evaluation item are comprehensively analyzed and expressed as one deterioration index (Mahalanobis distance), and the remaining life is estimated from the relationship between the operating time and the deterioration index created in advance (patent) (Refer to paragraphs [0011] to [0016] of Document 2).

JP-A-4-148876 JP 2004-236465 A

  However, the invention described in each of the above-mentioned patent documents has a problem that a deterioration state cannot be diagnosed unless a database of deterioration indicators for solid insulators is created in advance. In addition, a database must be created according to the material of the solid insulator, which causes a problem that preparation for deterioration diagnosis becomes complicated.

  Moreover, in the invention described in each patent document, the hue, gloss, saturation change, etc. of the solid insulator are used as indicators for deterioration diagnosis. However, these may be caused by a decrease (sunburn, dirt, etc.) unrelated to the insulation performance degradation. For this reason, there is a problem that it is difficult to accurately perform deterioration diagnosis.

  Further, according to the indicators of the deterioration diagnosis of the invention described in each patent document, the influence of disturbance is large when measured directly at the site where the solid insulator is installed. For this reason, there exists a problem that a deterioration diagnosis cannot be performed correctly.

  The present invention has been made in view of the problems as described above, and provides a deterioration diagnosis apparatus and a deterioration diagnosis method capable of performing deterioration diagnosis on-site and non-destructively without requiring master data. The purpose is to provide.

  The deterioration diagnosis apparatus according to the present invention includes a vibration spectrometer that acquires a vibration spectrum of an insulating surface of an insulator, a detection unit that detects a change in light intensity from an initial state at the same wavelength of the vibration spectrum, and the light intensity. And a diagnostic unit for diagnosing the deterioration state of the insulator based on the amount of change.

  The deterioration diagnosis apparatus can include a peak analysis unit that identifies a substance from the peak of the vibration spectrum.

  For example, in the deterioration diagnostic apparatus, the vibration spectrometer is preferably a Raman spectrometer.

  In particular, in the deterioration diagnosis apparatus, it is preferable that the excitation wavelength of the laser light applied to the insulating surface is 785 nm or more.

  In the deterioration diagnosis apparatus, the diagnosis unit can diagnose the deterioration state in consideration of light intensity caused by chloride ions of deposits attached to the insulating surface of the insulator.

  The deterioration diagnosis method in the present invention acquires a vibration spectrum of an insulating surface of an insulator, detects a light intensity change amount from an initial state at the same wavelength of the vibration spectrum, and based on the light intensity change amount, It is characterized by diagnosing the deterioration state of the insulator.

  In the deterioration diagnosis method, a substance can be identified from the peak of the vibration spectrum.

  Further, in the deterioration diagnosis method, it is possible to obtain the light intensity caused by the chloride ions of the deposits attached to the insulating surface of the insulator and diagnose the deterioration state in consideration of the light intensity. It is.

  For example, in the above degradation diagnosis method, it is preferable that a Raman spectrum as the vibration spectrum is obtained using a Raman spectrometer, and at this time, the excitation wavelength of the laser light applied to the insulating surface is 785 nm or more. .

  Further, in the deterioration diagnosis method, it is possible to evaluate a deterioration state before and after cleaning the insulating surface of the insulator, and to diagnose the remaining life in consideration of the effect of the cleaning.

  According to the present invention, master data for deterioration diagnosis is required by detecting a light intensity change amount from the initial state at the same wavelength of the vibration spectrum and diagnosing the deterioration state based on the light intensity change amount. Without deterioration, it is possible to perform deterioration diagnosis on site and non-destructively.

It is a schematic diagram of the deterioration diagnostic apparatus of this Embodiment. It is a graph which shows the relationship between the Raman shift and the scattered light intensity | strength of the insulation sample which carried out the thermal acceleration deterioration in each time. FIG. 3A is a graph showing the relationship between Raman shift and scattered light intensity when the excitation wavelength of laser light is 514 nm and FIG. 3B is 785 nm. 4A is a graph showing the relationship between the thermal acceleration deterioration time and the scattered light intensity when the Raman shift is 250 cm ⁻¹ and FIG. 4B is the Raman shift is 1000 cm ⁻¹ . It is a conceptual diagram of the remaining life diagnostic graph for demonstrating the remaining life diagnostic method using the deterioration diagnostic apparatus of this Embodiment.

  Hereinafter, a deterioration diagnosis apparatus according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. The deterioration diagnosis apparatus according to the present invention is not limited to the following embodiment, and can be implemented with various modifications within the scope of the spirit thereof.

  An object of deterioration diagnosis in the deterioration diagnosis apparatus according to the present invention is, for example, an insulation insulator that constitutes a high-voltage power distribution device. The insulating insulator is formed of a solid insulator such as polyester resin or epoxy resin. These insulators eventually lead to dielectric breakdown when the insulation performance deteriorates with age. Once dielectric breakdown occurs, it takes time and money to restore the high-voltage power distribution equipment, resulting in a huge social loss.

  The solid insulator has a very high bulk insulation performance that breaks through the inside of the insulator. On the other hand, it has been pointed out that the solid insulating material has a problem of low creeping insulation performance that creeps the insulating surface.

  The mechanism of creeping breakdown due to general insulator deterioration is that (1) fouling substances adhere to the insulating surface, (2) fouling substances wet and the insulating surface resistance decreases, and (3) leakage current on the insulating surface increases. (4) Dry zone is generated by Joule heat, (5) Micro discharge (scintillation) is generated due to voltage concentration on the dry zone, (6) Insulation surface is altered by discharge decomposition products, (7) The carbonized conductive path is generated by repeating (6), (8) the conductive path grows by repeating the discharge at the tip of the carbonized conductive path, and (9) dielectric breakdown.

  Here, the deterioration of the surface insulating properties of the insulator is mainly caused by fouling deposits and surface alteration. Regarding the former, “industrial information processing / control equipment installation environment standard: JEITA IT-1004” defines an evaluation standard for the degree of contamination of deposits. Also in this embodiment, as will be described later, the equivalent salt adhesion amount of the fouling deposit is additionally taken into the evaluation of the deterioration diagnosis. On the other hand, with respect to the latter, conventionally, a method for analyzing locally and non-destructively has not been established. Further, in the invention described in the above-mentioned patent document, it is necessary to create a database according to the material of the solid insulator, and the deterioration diagnosis becomes a complicated operation, and the deterioration diagnosis cannot be performed easily and accurately. There's a problem.

  Therefore, the present inventors have arrived at the present invention for the purpose of establishing a deterioration diagnosis method capable of performing deterioration diagnosis on-site and nondestructively without requiring master data for deterioration diagnosis. That is, the essence of the present invention is that the vibration spectrum of the insulating surface of the insulator is acquired, the amount of change in light intensity from the initial state at the same wavelength of the vibration spectrum is detected, and the insulator is based on the amount of change in light intensity. It is to diagnose the deterioration state of.

  FIG. 1 is a schematic diagram of a deterioration diagnosis apparatus according to the present embodiment. As shown in FIG. 1, the degradation diagnosis apparatus 1 according to the present embodiment includes a Raman spectrometer 2 as a vibration spectrometer, a detection unit 3, and a diagnosis unit 4.

  The Raman spectrometer 2 includes a light source 21, a probe 22, and a spectrometer 23. The light source 21 outputs laser light L1 having a specific wavelength. The probe 22 irradiates the insulating surface S with laser light L1 output from the light source 21 via the half mirror 24, and condenses scattered light (Raman light) L2 from the insulating surface S. The spectroscope 23 separates the scattered light L2 collected by the probe 22. Scattered light L <b> 2 dispersed by the spectroscope 23 is output to the detection unit 3 and a peak analysis unit 5 described later.

  The detection unit 3 detects the amount of change in the intensity of the scattered light L2 output from the Raman spectrometer 2 (more specifically, the spectroscope 23) (hereinafter referred to as “scattered light intensity change amount”). The diagnosis unit 4 diagnoses the deterioration state of the insulator based on the detection result (scattered light intensity change amount) by the detection unit 3. Details of the detection method of the scattered light intensity change by the detection unit 3 and the diagnosis method of the deterioration state by the diagnosis unit 4 will be described later.

  Further, the deterioration diagnosis apparatus 1 includes a peak analysis unit 5 and a monitor 6. The peak analysis unit 5 analyzes the peak of the vibration spectrum (Raman spectrum) output from the Raman spectrometer 2 (more specifically, the spectroscope 23). The peak analysis unit 5 identifies the substance constituting the insulator by analyzing the peak of the Raman spectrum. Details of substance identification by the peak analysis unit 5 will be described later.

  The monitor 6 is connected to the detection unit 3, the diagnosis unit 4, and the peak analysis unit 5. The monitor 6 displays the detection result by the detection unit 3, the diagnosis result by the diagnosis unit 4, and the analysis result by the peak analysis unit 5. For example, the monitor 6 displays deterioration diagnosis information and remaining life information, which will be described later, substance identification information, which is described later, and equivalent salt concentration of the deposit. Note that FIG. 1 shows a case where the monitor 6 is connected to the detection unit 3, the diagnosis unit 4, and the peak analysis unit 5. However, the connection target of the monitor 6 is not limited to this, and it is sufficient that the diagnosis result by the diagnosis unit 4 can be displayed.

  In the degradation diagnostic apparatus 1 according to the present embodiment, a Raman spectrum that is acquired by the Raman spectrometer 2 and is normally used for identification analysis of a substance is used for degradation diagnosis. In general, a polymer material as an insulator used in a high-voltage power distribution device is shortened due to a molecular chain being broken due to deterioration with time. As a result, in the polymer material deteriorated with time, the intensity of scattered light at the same wavelength is larger than the Raman spectrum obtained in the initial state (for example, at the time of shipment). In the deterioration diagnosis apparatus 1 according to the present embodiment, the amount of change in scattered light intensity from the initial state is used for diagnosis of the deterioration state of the insulator.

Hereinafter, as a specific example, a deterioration diagnosis of an insulating insulator using an epoxy resin (hereinafter referred to as “insulating sample” as appropriate) will be described with reference to FIG. FIG. 2 is a graph showing the relationship between Raman shift (Raman Shift) and scattered light intensity (Intensity (count)) in an insulating sample subjected to thermal acceleration degradation at each time. The Raman shift on the horizontal axis indicates the wavelength of Raman spectroscopy in the unit cm ⁻¹ (Kaiser wave number).

  In the experiment, an excitation wavelength of 785 nm was applied from the Raman spectrometer 2 to each insulating surface of the insulating sample thermally accelerated and deteriorated at 0 hours (initial state: Ref), 500 hours, 1000 hours, 1500 hours, and 2000 hours. Near-infrared laser light was irradiated to obtain the Raman spectrum shown in FIG. Note that a Raman spectrum was acquired three times for each of the insulating insulators that had been thermally accelerated and deteriorated for 500 hours, 1000 hours, 1500 hours, and 2000 hours.

  Here, the “initial state” is preferably a state in which the insulation deterioration has not progressed as much as possible. Specifically, it is preferable immediately after manufacture, before product shipment, or when a product is attached to the site, but also includes a state arbitrarily set by a measurer or the like even after product shipment. Note that the “initial state” in this experiment is a state in which thermal acceleration deterioration is not performed (thermal deterioration acceleration time is 0 hour). Further, the thermal accelerated deterioration test was performed at a temperature of 180 ° C.

  As shown in FIG. 2, when the evaluation was performed at the same wavelength of the Raman shift on the horizontal axis, it was found that the intensity of the scattered light increased as the insulating sample had a longer thermal acceleration degradation time. This is due to the fact that the deterioration progresses as the insulating sample has a longer thermal acceleration deterioration time, and the fluorescence at a wavelength different from the conventional one becomes stronger. Therefore, with respect to the initial state (Ref), the amount of change in light intensity increases as the insulating sample has a longer thermal acceleration deterioration time.

The detection unit 3 in the degradation diagnosis apparatus 1 according to the present embodiment detects the amount of change in scattered light intensity from the initial state at the same wavelength of the Raman spectrum acquired from the Raman spectrometer 2. The diagnosis unit 4 can diagnose the deterioration state based on the amount of change in the scattered light intensity thus detected. For example, the diagnosis unit 4 determines that the life state is present when the Raman shift is 1000 cm ⁻¹ and the Raman light intensity is 25,000 or more. In this case, the life of the insulating insulator using the epoxy resin was defined as a state where it was used for 15 years at 130 ° C. which is the maximum allowable temperature of the epoxy resin. It is known that thermal degradation of a polymer material generally follows Arrhenius law. According to the Arrhenius law, when the temperature increases by 8 ° C., the lifetime decreases to about ½. In the thermal acceleration test based on the Arrhenius law, the 15-year specification at 130 ° C corresponds to the 2053-hour specification at 180 ° C. Therefore, in this experiment, the Raman spectrum intensity observed after 2000 hours at 180 ° C. was used as the life standard.

  The scattered light intensity change amount is a change amount from the initial state. For this reason, the value of the amount of change in scattered light intensity, which serves as an indicator of the degree of deterioration, is variously changed according to the initial value at the predetermined wavelength obtained in the initial state. For example, the diagnosis unit 4 stores information on the degree of deterioration of the scattered light intensity change amount at a predetermined wavelength. The diagnosis unit 4 can diagnose the deterioration state based on the amount of change in scattered light intensity detected by the detection unit 3 with reference to the information on the degree of deterioration. The diagnosis unit 4 can diagnose, for example, “presence / absence of dielectric breakdown”, “degree of deterioration”, “remaining life until dielectric breakdown”, “product replacement time”, and the like.

  FIG. 3A is a graph showing the relationship between Raman shift and scattered light intensity when the excitation wavelength of laser light is 514 nm and FIG. 3B is 785 nm. In addition, all of these experiments are results obtained by measuring the thermal acceleration deterioration time as 0 hours (initial state).

  As shown in FIG. 3A, when the excitation wavelength of the laser light from the Raman spectrometer 2 is set to 514 m, the fluorescence from the epoxy resin itself becomes strong. For this reason, it was found that it was difficult to detect a peak reflecting the molecular structure. On the other hand, as shown in FIG. 3B, when the excitation wavelength of the laser light from the Raman spectrometer 2 is 785 nm, fluorescence from the epoxy resin itself can be suppressed. For this reason, it was found that it was possible to detect a peak that clearly reflected the molecular structure as compared with the case where the excitation wavelength of the laser beam was 514 m.

  As described above, the Raman spectrometer 2 is originally used for molecular structure analysis and enables substance identification. Also in the degradation diagnostic apparatus 1 according to the present embodiment, a substance can be identified from the Raman spectrum acquired from the Raman spectrometer 2 not only by measuring the amount of change in scattered light intensity for degradation diagnosis but also by peak analysis of the Raman spectrum. This is preferable as an embodiment.

  For this reason, in the degradation diagnosis apparatus 1 according to the present embodiment, the preferable range of the excitation wavelength of the laser light emitted from the Raman spectrometer 2 is set to 785 nm or more. Thereby, it becomes easy to detect a peak reflecting the molecular structure from the Raman spectrum. The peak analysis unit 5 analyzes the peak of such a Raman spectrum and identifies a substance constituting the insulator.

  As shown in FIG. 2, when the insulation deterioration progresses, the Raman spectrum rises from the initial Raman spectrum (baseline). Therefore, for example, the peak analysis unit 5 can acquire information on the amount of change in scattered light intensity from the detection unit 3 and perform peak analysis after performing baseline correction on the Raman spectrum. Thereby, substance identification by peak analysis can be performed with higher accuracy.

  Further, the peak analysis unit 5 outputs the substance identification information obtained by the peak analysis to the diagnosis unit 4. The diagnosis unit 4 also incorporates substance identification information in the parameters for deterioration diagnosis. Thereby, the diagnosis part 4 can perform the diagnosis of the deterioration state of an insulator with higher accuracy. More specifically, since the substance identification can be made one parameter for the surface alteration state of the insulating surface, by referring to this parameter, for example, a remaining life estimation line to be described later can be corrected. As a result, the deterioration diagnosis of the insulator can be made with higher accuracy.

4A is a graph showing the relationship between the thermal acceleration deterioration time and the scattered light intensity when the Raman shift is 250 cm ⁻¹ and FIG. 4B is the Raman shift is 1000 cm ⁻¹ . 4A and 4B is an average value of three white spots.

As shown in FIG. 2, when the Raman shift is 2500 cm ⁻¹ or more, the difference in scattered light intensity between the insulating samples having different thermal acceleration degradation times becomes small, and the amount of change in scattered light intensity cannot be acquired appropriately. As shown in FIGS. 4A and 4B, the Raman shift 250 cm ^-1, or, when the 1000 cm ^-1, the change in the scattered light intensity with respect to thermal accelerated deterioration time is increased, it was found to be suitable for degradation diagnosis.

In addition, it was found that the change in scattered light intensity with respect to the thermal acceleration deterioration time is larger at 250 cm ^{−1 with} a shorter Raman shift than at 1000 cm ⁻¹ . In degradation diagnosis apparatus 1 according to the present embodiment, the range of the Raman shift is not limited. However, in order to make it easy to detect the scattered light intensity change amount in the detection unit 3, it is preferable as an embodiment that the Raman shift for acquiring the scattered light intensity from the Raman spectrum is 1000 cm ⁻¹ or less.

  Furthermore, in the deterioration diagnosis apparatus 1 according to the present embodiment, in addition to the deterioration diagnosis of the insulator itself, the same deterioration diagnosis apparatus 1 can be used to evaluate the deposit on the insulating surface in the deterioration diagnosis. is there.

  Specifically, the deposit is collected from the insulating surface, dissolved in pure water, and the solution is poured into a glass container. Then, the Raman spectrometer 2 irradiates the glass container with laser light, while the spectroscope 23 separates the scattered light to obtain a Raman spectrum of the solution in the glass container. The detection unit 3 and the peak analysis unit 5 evaluate the scattered light intensity of Raman shift caused by chloride ions. The equivalent salt concentration of the solution can be estimated from the scattered light intensity. The equivalent salinity concentration estimated in this way is output to the diagnosis unit 4. Thereby, the diagnosis part 4 can perform the deterioration diagnosis more excellent in consideration of the fouling deterioration of the deposit.

  Hereinafter, the deterioration diagnosis method using the deterioration diagnosis apparatus 1 according to the present embodiment will be specifically described. As described above, by using the deterioration diagnosis device 1, it is possible to diagnose the deterioration state of the insulator itself and to diagnose the deterioration state in consideration of the evaluation of deposits on the insulating surface.

First, using the degradation diagnosis apparatus 1 of the present embodiment, for example, an initial Raman spectrum of an insulator before shipment is acquired. The detector 3 detects the light intensity with respect to a predetermined wavelength of the initial Raman spectrum. The measurement wavelength can be arbitrarily determined by the measurer or the manufacturer of the degradation diagnosis apparatus 1, but as described above, the measurement wavelength is preferably set to 1000 cm ⁻¹ or less by Raman shift. Further, as described above, the initial state may be after the shipment instead of before the insulator is shipped. For example, an initial Raman spectrum can be measured immediately after an insulator is installed on site. In the past, when the initial Raman spectrum of an insulator made of the same material has been measured, the scattered light intensity at that time can be applied as an initial value.

  After completing the initial state measurement in this way, periodic maintenance inspections and the like are performed. For example, the Raman spectrum of the insulator in the local use state is acquired using the degradation diagnosis apparatus 1 of the present embodiment at the timing of several years. And the detection part 3 detects the scattered light intensity in the same wavelength as the time of the measurement of an initial state, and measures the amount of scattered light intensity changes in the same wavelength of a local use state and an initial state. The amount of change in scattered light intensity detected by the detection unit 3 is output to the diagnosis unit 4. The diagnosis unit 4 diagnoses the deterioration state of the insulator based on the amount of change in scattered light intensity. Here, the diagnosis of the deterioration state includes the degree of deterioration of the insulator and the remaining life. The diagnosis unit 4 can also determine the product replacement time based on these deterioration results.

For example, the amount of change in the scattered light intensity is 1000 cm ^{−1 for} the Raman shift, the scattered light intensity (scattered light intensity in the initial state) when the thermal acceleration deterioration time is 0 hour, the Raman shift is 1000 cm ⁻¹ , and the thermal acceleration. It is assumed that when the deterioration time is 2000 hours or more, the degree of deterioration exceeds the use limit and is determined as the product replacement time. Based on the amount of change in scattered light intensity acquired from the detection unit 3, the diagnosis unit 4 displays on the monitor 6 whether the product replacement time has been reached or how much time is left until the product replacement time. Thereby, the measurer can know the latest information of the product replacement time. Further, in the diagnosis unit 4, in addition to the scattered light intensity change amount detected by the detection unit 3, the material identification information from the peak analysis unit 5 and the equivalent salinity concentration information of the deposit are also taken into account, and the deterioration of the insulator The condition can be diagnosed. Thereby, degradation diagnosis with higher accuracy can be performed.

  By the way, the adhering matter adhering to the insulating surface can be removed by cleaning depending on the adhering place. And the remaining life changes with the presence or absence of the cleaning of this deposit. Hereinafter, a remaining life diagnosis method that considers the presence or absence of cleaning will be described.

  FIG. 5 is a conceptual diagram of a remaining life diagnosis graph for explaining a remaining life diagnosis method using the deterioration diagnosis apparatus 1 according to the embodiment of the present invention.

As shown in FIG. 5, the initial value A ₀ of the insulation characteristic is acquired at the time of shipment using the deterioration diagnosis device 1 of the present embodiment. In addition, an insulation life line with insulation characteristics is acquired at the time of shipment. Here, the parameter constituting the “insulation characteristic” is an index determined based on the amount of change in scattered light intensity from the initial state of the Raman spectrum at least at a predetermined wavelength. More preferably, the determination is made in consideration of each parameter of the substance identification information and the equivalent salt concentration information of the deposit.

As shown in FIG. 5, during measurement after an arbitrary period has elapsed after shipment (as described above, the timing of regular maintenance inspection, etc.), the insulator as a measurement target is not particularly cleaned (not yet cleaned). in the cleaning state), the current measured value by measuring the dielectric characteristics using the deterioration diagnosis apparatus 1 of the present embodiment (uncleaned) obtaining a _1. Thereafter, assuming that no cleaning is performed, a position T ₁ where the remaining life estimation line C ₁ derived from the initial value A ₀ and the current measurement value (uncleaned) A ₁ intersects the insulation life line is diagnosed as a life. be able to.

Note that the remaining service life estimation line C ₁ is not always approximated by a straight line, in view of the adhesion material and surface deterioration state, is graphed as an approximate curve conforming to the actual physical phenomena. The life time is a year when the remaining life estimation line reaches the insulation life line, and the time from the measurement time to the life time is evaluated as the remaining life. The remaining life estimation line is considered not to be linearized. Regardless of the presence or absence of cleaning, for example, even if the deterioration progresses at the same speed, the influence on the insulation characteristics is not constant. This is because as the degree of deterioration progresses, the variation in insulation characteristics becomes smaller. The remaining life estimation line can be estimated from, for example, the slopes of the two most recent measurement points, or can be estimated from three or more approximate lines or curves.

  As already described, the factors for reducing the insulation surface resistance are limited to the fouling deposits and the surface alteration of the base material. The fouling deposit is a reversible deterioration component that can be removed by cleaning the insulating surface. On the other hand, surface alteration is an irreversible deterioration component that is a chemical reaction product generated on the resin surface and cannot be removed by cleaning. When surface alteration occurs, the surface resistance decreases and heat is generated due to leakage current, so that the insulation deterioration reaction proceeds. In this embodiment, although the cleaning method is not limited, for example, wiping or blowing the insulating surface is common. Cleaning also includes the concept of cleaning.

  Therefore, during the current measurement after shipment, the insulation characteristics in the uncleaned state are measured as described above, and the insulation characteristics after cleaning are also measured. As described above, the fouling deposits are classified as reversible deterioration that can be removed. For this reason, if the dirt deposits can be removed by cleaning, the insulating properties can be recovered to some extent.

In the remaining life diagnosis method shown in FIG. 5, after the insulating surface is cleaned, the insulation characteristics of the cleaned insulating surface are measured using the deterioration diagnosis device 1 of the present embodiment. This makes it possible to present the measurement value of the insulating characteristics give (after cleaning) A _2. As shown in FIG. 5, the product is periodically cleaned, and the insulation characteristics before and after cleaning the insulating surface are measured each time. As shown in FIG. 5, periodic measurements taken before and after cleaning of the product, to the remaining service life estimation line C ₁ obtained in the case of not performing any cleaning, either before or after cleaning, it will shift I understand. It can also be seen that the insulation characteristics gradually approach the insulation life line. This is because the insulating characteristics include a reversible deterioration component that can be recovered by cleaning and an irreversible deterioration component that cannot be recovered by cleaning.

  Note that the insulation characteristics before and after cleaning are measured at the time of measurement, for example, even if only the insulation characteristics after cleaning are measured, reversible degradation components that can be recovered by cleaning and irreversible that cannot be recovered by cleaning This is because it is impossible to appropriately evaluate how much deterioration component exists and how it will change thereafter, and it is not possible to produce a highly accurate remaining life estimation line.

That is, both a reversible deterioration component that can be recovered by cleaning and an irreversible deterioration component that cannot be recovered by cleaning are evaluated. Then, based on the evaluation results of these degraded component, by manufacturing a residual life estimation line C _2, it is possible to obtain an accurate remaining service life estimation line C _2. Also, if the position can not be removed deposits are present, the situation of the deposit area, for example, in consideration of the influence on the insulation around the device, correcting the residual life estimation line C _2. Thereby, the precision of the remaining life judgment as an apparatus can be raised more.

  Thus, according to the remaining life diagnosis method of the present embodiment, it is possible to diagnose the remaining life including the cleaning effect. Further, by taking into account the recovery of the insulation performance by cleaning, the remaining life can be judged more finely than in the past, and how much life can be extended can be accurately diagnosed. As a result, it is easier to determine in advance the product replacement time and the like than before, and it is possible to appropriately plan a cleaning management plan for extending the life.

  In addition, this invention is not limited to the said embodiment, It can implement variously. In each of the embodiments described above, the size and shape of the members and holes illustrated in the accompanying drawings are not limited to this, and can be appropriately changed within a range in which the effects of the present invention are exhibited. In addition, various modifications can be made without departing from the scope of the object of the present invention.

For example, in the above-described embodiment, the case where the Raman spectrometer 2 is applied as the vibration spectrometer has been described. However, the configuration of the vibration spectrometer is not limited to this and can be changed as appropriate. For example, an infrared spectrometer (IR spectrometer) can be applied as a vibration spectrometer. In this case, in the graph used for the deterioration diagnosis shown in FIG. 2, the horizontal axis represents the wave number (Wavenumber (cm ⁻¹ )) and the vertical axis represents the absorbance (Abs). Thus, even when the infrared spectrometer is applied, the same effect as that of the above embodiment can be obtained.

  However, when the Raman spectrometer 2 is applied, the deterioration diagnosis apparatus 1 can be reduced in size and the focal length can be increased, and the allowable angle range of excitation light irradiation can be expanded. Thereby, it is possible to easily perform degradation diagnosis on the site where the measurement target insulator is installed. Therefore, from the viewpoint of ease of deterioration diagnosis, it is preferable to apply the Raman spectrometer 2 as a vibration spectrometer.

  According to the deterioration diagnosis device and the deterioration diagnosis method of the present invention, there is an effect that deterioration diagnosis can be performed on-site and non-destructively without requiring master data. It can be used suitably for deterioration diagnosis of insulating insulators.

DESCRIPTION OF SYMBOLS 1 Degradation diagnostic apparatus 2 Raman spectrometer 21 Light source 22 Probe 23 Spectrometer 24 Half mirror 3 Detection part 4 Diagnosis part 5 Peak analysis part 6 Monitor

Claims (10)

A vibration spectrometer for obtaining a vibration spectrum of an insulating surface of an insulator;
A detection unit for detecting a light intensity change amount from an initial state at the same wavelength of the vibration spectrum;
Based on the light intensity change amount, a diagnostic unit for diagnosing the deterioration state of the insulator,
A deterioration diagnosis apparatus comprising:   The deterioration diagnosis apparatus according to claim 1, further comprising a peak analysis unit that identifies a substance from the peak of the vibration spectrum.   The deterioration diagnostic apparatus according to claim 1, wherein the vibration spectrometer is a Raman spectrometer.   The deterioration diagnostic apparatus according to claim 3, wherein an excitation wavelength of laser light applied to the insulating surface is 785 nm or more.   5. The diagnosis unit according to claim 1, wherein the diagnosis unit diagnoses the deterioration state in consideration of light intensity caused by chloride ions of deposits attached to an insulating surface of the insulator. The deterioration diagnosis device according to claim 1. Obtain the vibration spectrum of the insulating surface of the insulator,
Detecting the amount of change in light intensity from the initial state at the same wavelength of the vibration spectrum,
A degradation diagnosis method characterized by diagnosing a degradation state of the insulator based on the light intensity change amount.   The deterioration diagnosis method according to claim 6, wherein a substance is identified from a peak of the vibration spectrum.   8. The deterioration state is diagnosed by acquiring light intensity caused by chloride ions of deposits attached to the insulating surface of the insulator and taking the light intensity into account. The deterioration diagnosis method described in 1.   The Raman spectrum as the vibration spectrum is obtained using a Raman spectrometer, and the excitation wavelength of the laser light applied to the insulating surface at this time is set to 785 nm or more. The deterioration diagnosis method according to any one of the above.   The deterioration diagnosis method according to any one of claims 6 to 9, wherein a deterioration state of the insulating surface of the insulator before and after cleaning is evaluated to diagnose a remaining life in consideration of the effect of the cleaning.

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