JP2017108456A - Imaging apparatus, imaging system, and driving method for imaging apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To solve the problem that, in the case where a digital signal line for transmitting a digital signal inputted to each of pixels or outputted from each of pixels is disposed proximately to an analog signal line for supplying a potential to a photoelectric conversion part and an A/D conversion part in a conventional imaging apparatus, a potential of the analog signal line may be fluctuated by fluctuation in a potential of the digital signal transmitted by the digital signal line and accuracy of A/D conversion may be reduced by the fluctuation in the potential of the analog signal line.SOLUTION: The present invention relates to an imaging apparatus characterized in that an analog signal line and a digital signal line are provided in such a manner that an electric signal output part is held therebetween.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an imaging apparatus, an imaging system, and a driving method for an imaging apparatus that convert incident electromagnetic waves into electric charges.

  An imaging device that converts incident electromagnetic waves into electric charges is known. As an example of such an imaging apparatus, Non-Patent Document 1 discloses a pixel having a photoelectric conversion unit that photoelectrically converts incident light and an A / D conversion unit that converts a signal output from the photoelectric conversion unit into a digital signal. There is an imaging device having

Stuart Kleinfelder, SukHwan Lim, Xinqiao Liu, and Abbas El Gamal, “A 10000 Frames / s CMOS Digital Pixel Sensor ENSOR C. 36, NO. 12, p. 2049-2059

  In the imaging device of Non-Patent Document 1, a digital signal line that transmits a digital signal that is input to or output from each pixel is converted into an analog signal line that supplies a potential to the photoelectric conversion unit and the A / D conversion unit. Assume that they are placed close together. In this case, the potential of the analog signal line may fluctuate due to the fluctuation of the potential of the digital signal transmitted by the digital signal line. This variation in the potential of the analog signal line may cause a decrease in A / D conversion accuracy.

  The present invention has been made in order to solve the above problems, and one aspect is that a plurality of electrical signal output units provided in a matrix form, each outputting an electrical signal based on an incident electromagnetic wave, A plurality of A / D conversion units each corresponding to the electrical signal output unit, each of which converts the electrical signal input from the electrical signal output unit into a digital signal, and a pixel array; A first signal line, each of which is provided corresponding to each column of the electrical signal output unit, has a plurality of storage units for holding the digital signals, and further supplies a drive bias to the electrical signal output unit And a second signal line that transmits the digital signal from the A / D conversion unit to the storage unit, wherein the first signal line and the second signal line are: Provided to sandwich the electrical signal output unit An imaging apparatus characterized by there.

  In another aspect, each of the plurality of electric signal output units provided in a matrix form outputs an electric signal based on an electromagnetic wave incident thereon, and each of the electric signal output units is provided corresponding to the electric signal output unit. A pixel array having a plurality of A / D converters for converting the electrical signal input from the electrical signal output unit into a digital signal, and each pixel array is provided corresponding to each column of the electrical signal output unit A plurality of storage units for holding the digital signals; a first signal line for supplying a driving bias to the A / D conversion unit; and the digital signal from the A / D conversion unit to the storage unit. An imaging device having a second signal line for transmitting a signal, wherein the first signal line and the second signal line are provided so as to sandwich the electric signal output unit. It is the imaging device characterized.

  Another aspect is a method for driving an imaging apparatus, wherein the imaging apparatus outputs an electrical signal based on an electromagnetic wave incident thereon, and a plurality of electrical signal output units provided in a matrix form, A pixel array provided corresponding to an electrical signal output unit, each having a plurality of A / D conversion units that convert the electrical signal input from the electrical signal output unit into a digital signal, and A plurality of storage units that are provided corresponding to each column of the electrical signal output unit, hold the digital signal, a first signal line that supplies a drive bias to the electrical signal output unit, and the A / D conversion A second signal line that transmits the digital signal from the unit to the storage unit, and the pixel array further outputs a plurality of signals obtained by amplifying the electrical signal to the A / D conversion unit The first amplifier. A signal line and the second signal line are provided so as to sandwich the electric signal output unit, and the amplifier is provided corresponding to the one A / D conversion unit, and the driving method The one A / D conversion unit performs A / D conversion on a signal obtained by amplifying the electric signal of the one electric signal output unit, and the amplifier is connected to the other electric signal output unit. A method for driving an imaging apparatus, wherein the electrical signal is amplified.

  Another aspect is a method for driving an imaging apparatus, wherein the imaging apparatus outputs an electrical signal based on an electromagnetic wave incident thereon, and a plurality of electrical signal output units provided in a matrix form, A pixel array provided corresponding to an electrical signal output unit, each having a plurality of A / D conversion units that convert the electrical signal input from the electrical signal output unit into a digital signal, and A plurality of storage units that are provided corresponding to each column of the electrical signal output unit, hold the digital signal, a first signal line that supplies a driving bias to the A / D conversion unit, and the A / D A second signal line for transmitting the digital signal from the conversion unit to the storage unit, and each of the pixel arrays outputs a signal obtained by amplifying the electric signal to the A / D conversion unit. A plurality of amplifiers, the first The signal line and the second signal line are provided so as to sandwich the electric signal output unit, the amplifier is provided corresponding to the one A / D conversion unit, and the driving method is The one A / D conversion unit performs A / D conversion on a signal obtained by amplifying the electric signal of one electric signal output unit, and the amplifier is connected to the other electric signal output unit. An imaging apparatus driving method characterized by amplifying an electric signal.

  According to the present invention, it is possible to provide an imaging apparatus in which a decrease in A / D conversion accuracy is unlikely to occur.

Schematic diagram showing an example of an imaging device and an example of a pixel output circuit Schematic diagram of an example of the pixel output circuit and timing diagram of an example of the operation of the pixel output circuit Schematic diagram showing another example of an imaging device and another example of a pixel output circuit Schematic diagram of another example of imaging device and another example of pixel output circuit Timing chart showing another example of operation of imaging device Schematic diagram of another example of a pixel output circuit and another example of an imaging device Schematic diagram of an example of an A / D converter and a timing diagram of another example of the operation of the imaging device Schematic diagram of another example of an imaging apparatus and another example of an A / D conversion unit Timing chart of operation of another example of imaging apparatus and schematic diagram of other example of imaging apparatus Schematic diagram of an example of an imaging system

Example 1
FIG. 1A is a diagram illustrating a configuration example of the imaging apparatus according to the present embodiment.

  A pixel array 100 in FIG. 1A includes pixel output circuits 101 arranged in a matrix. The drive bias group 150 includes a drive bias circuit 200 that drives each pixel output circuit 101 and a ramp signal supply circuit 201. In this embodiment, the drive bias circuit 200 and the ramp signal supply circuit 201 are provided for each column. The drive bias line 202 provided in each column supplies a drive bias from the corresponding drive bias circuit 200 to the pixel output circuit 101 provided in the corresponding column. The drive bias may be a plurality of biases by a circuit constituting the pixel output circuit 101 and is supplied by either voltage or current. The ramp signal line 203 provided in each column supplies a ramp signal from each of the ramp signal supply circuits 201 to the pixel output circuit 101 in each column. The counter group 300 includes a counter circuit 301. The counter circuit 301 generates a counter signal by counting clock signals supplied from a clock signal generation unit (not shown). Further, the counter circuit 301 supplies the generated counter signal to the pixel output circuit 101. In this embodiment, a counter circuit 301 is provided for each column, and an N-bit counter signal is supplied to the pixel output circuit 101 of each column by a counter signal line 302 common to each column. Note that N counter signal lines 302 are arranged according to N-bits. The vertical control circuit 400 controls the operation of the pixel output circuit 101 in units of rows. Although one control signal line 401 for supplying a control signal is illustrated for simplicity, a plurality of control signal lines may be used based on a control method of a circuit to be driven or a selection operation of the pixel output circuit 101. Good. A digital signal is output from the pixel output circuit 101 to the digital memory 600 via the common output line 500. N common output lines 500 are provided for the pixel output circuits 101 in one column in order to transmit N-bit digital signals. Digital data held in the digital memory 600 is transferred to the output unit 700. The output unit 700 has a parallel / serial conversion function (hereinafter referred to as a P / S conversion function). The output unit 700 converts the N-bit parallel digital signal transferred from the digital memory 600 into a serial digital signal. Then, the output unit 700 outputs the converted serial N-bit digital signal to the output terminal 800. The output terminal 800 outputs a serial N-bit digital signal output from the output unit 700. The digital memory 600 is a storage unit that holds a digital signal transmitted by the common output line 500. In FIG. 1A, the drive bias line 102 for supplying the drive bias to the electric signal output unit 10 and the A / D conversion unit 107 is not shown, but the drive is performed in the region where the analog signal line group 210 is provided. It is provided in parallel with the bias line 202.

  FIG. 1B shows an arrangement example of circuit blocks included in the pixel output circuit 101. The pixel output circuit 101 includes an electrical signal output unit 10, an A / D conversion unit 107, and an in-pixel memory 108. The drive bias line 102 supplies a drive bias to the electric signal output unit 10 and the A / D conversion unit 107. The drive bias line 202 supplies a drive bias to the A / D conversion unit 107. The ramp signal line 203 supplies a ramp signal to the A / D conversion unit 107. A counter signal of the counter signal line 302 is output to the in-pixel memory 108. The in-pixel memory 108 holds a counter signal of a count value when the signal value of the latch signal output from the A / D conversion unit 107 changes. The held counter signal is a digital signal output from the pixel output circuit 101. The in-pixel memory 108 outputs the held digital signal to the common output line 500 based on the control signal output from the control signal line 401. The digital signal line group 310 of this embodiment includes a counter signal line 302 and a common output line 500. The analog signal line group 210 of this embodiment includes drive bias lines 102 and 202 and a ramp signal line 203. The intra-pixel memory 108 may have, for example, an SRAM (Static Random Access Memory) configuration.

  The electric signal output unit 10 and the A / D conversion unit 107 will be described with reference to FIG. FIG. 2A shows an example of the configuration of the pixel output circuit 101.

    The electrical signal output unit 10 includes a photoelectric conversion unit 104, a switch 105, and a switch 106. The switch 105 switches between conduction and non-conduction between the drive bias line 102 and the photoelectric conversion unit 104 based on the signal value of the signal PRES output from the vertical control circuit 400. The switch 106 switches between conduction and non-conduction between the photoelectric conversion unit 104 and the A / D conversion unit 107 based on the signal value of the signal PTX output from the vertical control circuit 400. When the switch 106 is turned on, a signal generated by photoelectrically converting incident light is output from the photoelectric conversion unit 104 to the A / D conversion unit 107. Hereinafter, a signal generated by photoelectric conversion of incident light by the photoelectric conversion unit 104 is referred to as a photoelectric conversion signal. The photoelectric conversion unit 104 is a conversion unit that generates an electric charge based on an incident electromagnetic wave in this embodiment.

  The A / D conversion unit 107 includes capacitive elements C0, C1, and C2, a comparator 130, and a latch unit 109. The photoelectric conversion signal output from the photoelectric conversion unit 104 is given to the capacitive elements C0 and C1. In the capacitor C0, a photoelectric conversion signal is supplied to one node, and a ground potential is supplied from the power supply line 103 to the other node. The comparator 130 includes transistors M1, M2, M3, M4, and M5. A photoelectric conversion signal is supplied to the input node of the transistor M2 through the capacitor C1. On the other hand, a ramp signal is supplied from the ramp signal line 203 to the input node of the transistor M3 via the capacitive element C2. The ramp signal is a signal whose potential changes depending on time. The comparator 130 outputs a comparison result signal indicating the result of comparing the photoelectric conversion signal and the ramp signal to the latch unit 109. The drive bias line 202 supplies a drive bias to the input node of the transistor M1. The drive bias line 102 supplies a potential to one node of each of the transistors M4 and M5.

  FIG. 2B is a timing chart showing an example of the operation of the pixel output circuit 101 shown in FIG. During the reset period, the vertical control circuit 400 sets the signals PRES and PTX to a high level (hereinafter referred to as an H level). As a result, the switches 105 and 106 become conductive, and the potential of the photoelectric conversion unit 104 is reset. Further, when the switches 105 and 106 are turned on, the potential of one node of each of the capacitive elements C0 and C1 is reset. The potentials at the input nodes of the transistors M2 and M3 are also reset by a reset circuit (not shown). For resetting the input node of the transistor M2, for example, the input node of the transistor M2 and the node serving as the drain of the transistor M2 may be short-circuited. Similarly, for resetting the input node of the transistor M3, the input node of the transistor M3 and the node serving as the drain of the transistor M3 may be short-circuited.

  When the vertical control circuit 400 sets the signals PRES and PTX to a low level (hereinafter referred to as L level), the photoelectric conversion unit 104 accumulates charges based on incident light. When the accumulation period in which the photoelectric conversion unit 104 accumulates charges ends, the vertical control circuit 400 sets the signal PTX to the H level. Thereby, a photoelectric conversion signal is output to the capacitive elements C0 and C1. Further, the photoelectric conversion signal is output to the input node of the transistor M2 through the capacitive element C1. Thereafter, the vertical control circuit 400 sets the signal PTX to L level. A period from when the signal PTX becomes H level to when it becomes L level is a sample hold period (indicated as S / H in FIG. 2B).

  After the sample hold period, the ramp signal supply circuit 201 starts changing the potential of the ramp signal depending on time. When the signal value of the comparison result signal output from the comparator 130 to the latch unit 109 changes, the signal value of the latch signal output from the latch unit 109 to the in-pixel memory 108 changes from L level to H level. The in-pixel memory 108 holds a counter signal (indicated as a in FIG. 2B) when the signal value of the latch signal changes from L level to H level. Thereafter, the ramp signal supply circuit 201 finishes changing the potential of the ramp signal depending on time. A period in which the ramp signal supply circuit 201 changes the potential of the ramp signal depending on time is an A / D conversion period. After the A / D conversion period ends, the vertical control circuit 400 changes the signal value of the control signal line 401 and outputs the held digital signal to the common output line 500 from the intra-pixel memory 108. A period in which the vertical control circuit 400 sequentially outputs digital signals from the pixel output circuits 101 to the common output line 500 is a readout period.

  FIG. 2C shows driving timing when the pixel output circuit 101 processes photoelectric conversion signals of different frames in parallel. Each period of reset, accumulation, S / H, A / D conversion, and readout shown in FIG. 2C corresponds to each period shown in FIG. The operation shown in FIG. 2C is an operation in which the readout period of the Nth frame and the A / D conversion period of the (N + 1) th frame are overlapped. The operation shown in FIG. 2C is an operation in which the A / D conversion period of the (N + 1) th frame, the reset period of the (N + 2) frame, and the accumulation period are overlapped. In the operation shown in FIG. 2C, the A / D conversion unit 107 and the electric signal output unit 10 operate in parallel. Since the A / D converter 107 is operating, the potentials of the counter signal line 302 and the common output line 500 that are the digital signal line group 310 change.

  When the digital signal line group 310 and the analog signal line group 210 are provided close to each other, the fluctuation of one potential is caused by the parasitic capacitance between the digital signal line group 310 and the analog signal line group 210. The other potential is changed. In particular, since the potential of the digital signal line group 310 changes at a higher frequency than that of the analog signal line group 210, fluctuations in the potential of the digital signal line group 310 easily cause fluctuations in the potential of the analog signal line group 210. .

  In this embodiment, the potentials of the drive bias lines 102 and 202 and the ramp signal line 203 change due to the transmission of the digital signal. When fluctuations occur in the potentials of the drive bias lines 102 and 202, the amount of current flowing through the transistor M1 of the comparator 130 fluctuates, thereby reducing the accuracy of the comparison operation of the comparator 130. Further, when the potential of the ramp signal line 203 fluctuates, the linearity of the ramp signal is lowered, and the accuracy of the comparison operation of the comparator 130 is lowered. A decrease in the accuracy of the comparison operation of the comparator 130 leads to a decrease in the A / D conversion accuracy of the A / D conversion unit 107. Therefore, when potential fluctuations occur in the drive bias lines 102 and 202 and the ramp signal line 203, the A / D conversion accuracy of the A / D conversion unit 107 decreases.

  In this embodiment, the analog signal line group 210 of the drive bias lines 102 and 202 and the ramp signal line 203 and the digital signal line group 310 of the counter signal line 302 and the common output line 500 are connected to the electric signal output unit 10. It is provided so that it may be pinched. Thereby, in the imaging apparatus of the present embodiment, the potential of the analog signal line group 210 is not easily changed due to the change of the potential of the digital signal line group 310. Accordingly, it is possible to reduce a decrease in A / D conversion accuracy due to a change in potential of the digital signal line group 310. The drive bias line 102 provides a reset potential for the photoelectric conversion unit 104 and the capacitive elements C0 and C1. In the imaging apparatus of this embodiment, the fluctuation of the potential of the drive bias line 102 due to the fluctuation of the potential of the digital signal line group 310 hardly occurs, so that the fluctuation of the reset potential of the photoelectric conversion unit 104 can be reduced.

  In this embodiment, the analog signal line group 210 including the drive bias lines 102 and 202 and the ramp signal line 203 and the digital signal line group 310 including the counter signal line 302 and the common output line 500 sandwich the electric signal output unit 10. The form provided in is explained. The present embodiment is not limited to this mode, and the drive bias line 102 or the drive bias line 202 that is the first signal line and the common output line 500 that is the second signal line are output as electric signals. Any form provided so as to sandwich the portion 10 may be used. In this embodiment, the example in which the analog signal line group 210 includes the drive bias lines 102 and 202 and the ramp signal line 203 has been described. The analog signal line group 210 may include other signal lines. For example, the analog signal line group 210 may further include the power supply line 103. The power supply line 103 supplies power to the photoelectric conversion unit 104 and the capacitive element C0. Therefore, the fluctuation of the photoelectric conversion signal can be reduced by making the fluctuation of the potential of the power supply line 103 less likely to occur due to the fluctuation of the potential of the digital signal line group 310. The analog signal line group 210 may include a bias line that supplies a potential to the in-pixel memory 108. That is, the analog signal line group 210 may include a signal line that supplies a potential to each of the electrical signal output unit 10, the A / D conversion unit 107, and the in-pixel memory 108.

  In this embodiment, as shown in FIG. 1A, a plurality of electrical signal output units 10 are provided between a plurality of analog signal line groups 210. A digital signal line group 310 is provided between the plurality of electrical signal output units 10 sandwiched between the plurality of analog signal line groups 210. From another viewpoint, a plurality of electrical signal output units 10 are provided between a plurality of digital signal line groups 310. An analog signal line group 210 is provided between the plurality of electrical signal output units 10 sandwiched between the plurality of digital signal line groups 310.

  In the present embodiment, as shown in FIG. 2C, the example in which the A / D conversion unit 107 and the electric signal output unit 10 operate in parallel has been described. The present embodiment is not limited to this form.

  In this embodiment, the configuration in which the digital memory 600 is provided for each column is shown, but the configuration may be such that the digital memory 600 is provided for each row.

  In this embodiment, the configuration in which the drive bias lines 102 and 202 and the ramp signal line 203 are electrically connected in common to the pixel output circuits 101 in the same column is shown. As another form, each of the drive bias lines 102 and 202 and the ramp signal line 203 may be electrically connected in common to the pixel output circuits 101 in the same row.

  In this embodiment, the configuration in which the counter circuit 301 is provided in each column is shown. However, a configuration in which one counter circuit 301 that outputs a common counter signal to all the pixel output circuits 101 may be provided. In the case of this form, the in-pixel memory 108 holds the signal value of the counter signal at the start of the A / D conversion period and the signal value of the counter signal when the signal value of the latch signal changes. do it. The signal value of the counter signal at the start of the A / D conversion period and the signal value of the counter signal when the signal value of the latch signal changes in any of the in-pixel memory 108, the digital memory 600, and the output unit 700. What is necessary is just to obtain the difference signal.

  In the present embodiment, the change in the potential of the ramp signal is linear. As another form, a form in which the potential of the ramp signal changes stepwise may be used. The form in which the potential of the ramp signal changes stepwise is also included in the form in which the potential changes depending on time.

  In the present embodiment, the A / D conversion unit 107 has been described based on a form in which A / D conversion using a ramp signal is performed. The present embodiment can also be applied to other A / D conversion formats such as a successive approximation type and a pipeline type. For example, in the case of successive approximation type A / D conversion, a signal line for supplying a reference potential for generating a potential for successive comparison with a photoelectric conversion signal may be provided instead of the ramp signal line 203. In other words, the present embodiment is applicable to a configuration having a digital signal line group 310 for transmitting a digital signal and an analog signal line group 210 for supplying a potential for driving the electric signal output unit 10 and the A / D conversion unit 107. Can be applied.

  The photoelectric conversion unit 104 is an example of a conversion unit that generates charges based on incident electromagnetic waves. In addition, the conversion unit that generates charges based on incident electromagnetic waves may be configured to generate charges based on incident electromagnetic waves such as X-rays and infrared rays.

(Example 2)
The imaging apparatus of the present embodiment will be described focusing on differences from the first embodiment.

  FIG. 3A is a diagram illustrating a configuration example of the imaging apparatus according to the present embodiment. The difference from the configuration shown in FIG. 1A is that one common output line 500 is shared with two columns of pixel output circuits 101 adjacent to each other.

  Each common output line 500 holds a digital signal output from the pixel output circuit 101 of each column via switches 501-1 and 501-2 whose conduction and non-conduction are controlled by a control unit (not shown). Digital memories 600-1 and 600-2 are electrically connected. Digital memories 600-1 and 600-2 are provided corresponding to the columns of the pixel output circuit 101. The switches 501-1 and 501-2 are selection circuits that select the output destination of the digital signal output to the common output line 500 from either one of the digital memories 600-1 and 600-2. The digital memory 600-1 is a first storage unit that holds a digital signal based on the pixel signal of the pixel output circuit 101 in one column. The digital memory 600-2 is a second storage unit that holds a digital signal based on the pixel signal of the pixel output circuit 101 in the other column.

  FIG. 3B is a diagram illustrating an example of the pixel output circuit 101 of this embodiment. The pixel output circuit 101 shown in FIG. 1B is different from the pixel output circuit 101 shown in FIG. 1B in that the pixel output circuit 101 in FIG. 3B includes a switch 502 that switches between conduction and non-conduction between the in-pixel memory 108 and the common output line 500. Is a point. The switch 502 switches between conduction and non-conduction based on the instruction signal output from the vertical control circuit 400. The vertical control circuit 400 exclusively changes the period during which the switch 502 is conducted between the pixel output circuits 101 sharing the common output line 500. As a result, digital signals are sequentially output from the two columns of pixel output circuits 101 to the common output line 500.

  When the switch 502 of one pixel output circuit 101 sharing the common output line 500 is turned on, a control unit (not shown) turns on the switch 501-1. As a result, the digital memory 600-1 holds the digital signal of one pixel output circuit 101 sharing the common output line 500. When the switch 502 of the other pixel output circuit 101 sharing the common output line 500 is turned on, a control unit (not shown) turns on the switch 501-2. As a result, the digital memory 600-2 holds the digital signal of the other pixel output circuit 101 sharing the common output line 500.

  In the present embodiment, the common output line 500 is shared by two columns of pixel output circuits 101 adjacent to each other. Thereby, the number of common output lines 500 can be reduced to ½ compared to the configuration shown in FIG. As a result, for example, the aperture ratio of the photoelectric conversion unit 104 can be increased or the area of the pixel array 100 can be reduced by reducing the number of common output lines 500. In particular, when an N-bit digital signal is transmitted in parallel from the pixel output circuit 101 to the digital memory 600, the common output line 500 becomes N wirings. Therefore, if the common output line 500 is shared by the two columns of pixel output circuits 101 as in this embodiment, N wirings can be reduced. In this embodiment, the mode in which the pixel output circuits 101 in two columns share one common output line 500 has been described. However, the present invention is not limited to this mode, and the pixel output circuits 101 in a plurality of columns have one common output. Any form that shares the line 500 may be used.

  The driving bias line 202, the ramp signal line 203, and the counter signal line 302 can achieve the same effect by the configuration shared by adjacent columns. On the other hand, the digital memory 600 arranged outside the pixel array 100 may be shared by adjacent columns. The area of the digital memory 600 can be reduced.

(Example 3)
The imaging apparatus of the present embodiment will be described focusing on differences from the first embodiment.

  FIG. 4A is a diagram illustrating a configuration example of the imaging apparatus of the present embodiment. The difference from the imaging device shown in FIG. 1A is that the A / D conversion unit 107 is shared by four rows of pixel output circuits 120 in the imaging device shown in FIG. is there. Each of the blocks a to d illustrated in FIG. 4A includes four pixel output circuits 120 and one A / D conversion unit 107. The imaging device in FIG. 4A includes a photoelectric conversion signal output line 121 and a latch signal line 122 that electrically connect the A / D conversion unit 107 and the pixel output circuit 120.

  FIG. 4B is a diagram illustrating a configuration example of the pixel output circuit 120 of the present embodiment. The A / D conversion unit 107 has the same configuration as that of the first embodiment, and the latch signal output from the latch unit 109 is input to the pixel output circuit 120 via the latch signal line 122. The photoelectric conversion signal is input to the A / D converter 107 via the photoelectric conversion signal output line 121 when the switch 106 is turned on.

  Next, the operation of this embodiment will be described with reference to FIGS. 5 (a) and 5 (b).

  FIG. 5A shows an example of the operation of the imaging apparatus shown in FIG. Each period of reset, accumulation, S / H, A / D conversion, and reading shown in FIG. 5A corresponds to each operation shown in FIG.

  FIG. 5B shows the operation of the pixel output circuits 120-1 to 120-4 in the block a sharing the single A / D conversion unit 107 and the A / D for each operation timing of the still image and the moving image. FIG. 6 is a diagram illustrating the operation of a conversion unit 107. In FIG. 5B, the reset, accumulation, and S / H periods are represented as Pix. Similarly, in FIG. 5B, the A / D conversion period is represented as A / D, and the reading period is represented as Read.

  At the still image operation timing, the imaging apparatus of the present embodiment performs a global shutter operation in which the accumulation periods of all the pixel output circuits 120 are simultaneous. In the operation shown in FIG. 5B, the pixel output circuits 120-1 to 120-4 simultaneously start and end the Pix period including the accumulation period.

  After the Pix period, the A / D conversion unit 107 performs A / D conversion of the photoelectric conversion signal of the pixel output circuit 120-1. In the readout period after A / D conversion, a digital signal generated by the A / D converter 107 and based on the photoelectric conversion signal of the pixel output circuit 120-1 is output to the common output line 500. In addition, the A / D conversion unit 107 performs A / D conversion of the photoelectric conversion signal of the pixel output circuit 120-2 during a digital signal readout period based on the photoelectric conversion signal of the pixel output circuit 120-1. Thereafter, similarly, during the digital signal readout period based on the photoelectric conversion signal of the pixel output circuit 120 of the Kth row, the A / D conversion unit 107 performs the A / D of the photoelectric conversion signal of the pixel output circuit 120 of the (K + 1) th row. D conversion is performed.

  At the still image operation timing, the imaging apparatus performs the global shutter operation, but at the moving image operation timing, the imaging device performs a rolling shutter operation. That is, after the Pix period of the pixel output circuit 120-1 ends, the Pix period of the pixel output circuit 120-2 starts. In addition, at the moving image operation timing, each pixel output circuit 120 is provided with a blank period during which the electrical signal output unit 10 and the in-pixel memory 108 do not operate after the readout period. At the moving image operation timing, the Pix period of the next frame is provided after the blank period.

  In this embodiment, one A / D conversion unit 107 is shared by four pixel output circuits 120. Thereby, the area of the A / D conversion unit 107 can be reduced.

  Also in the present embodiment, as in the first embodiment, the digital signal line group 310 and the analog signal line group 210 are provided so as to sandwich the electric signal output unit 10. Thereby, the same effect as Example 1 can be acquired.

  In this embodiment, one A / D conversion unit 107 shares four pixel output circuits 120. The present embodiment is not limited to this mode, and can be applied as long as one A / D conversion unit 107 is shared by a plurality of pixel output circuits 120.

  Further, in the present embodiment, it has been described that the Pix period is the same length as the A / D conversion period and the Read period at the moving image operation timing illustrated in FIG. The present embodiment is not limited to this mode, and the blank period may be shortened and the pix period may be lengthened accordingly.

Example 4
The imaging apparatus of the present embodiment will be described focusing on differences from the first embodiment.

  FIG. 6A is a diagram illustrating a configuration example of the pixel output circuit 101 of the present embodiment. The difference from the configuration shown in FIG. 1A is that the pixel output circuit 101 shown in FIG.

  In this embodiment, the capacitive element 111 holds a photoelectric conversion signal. Then, the photoelectric conversion signal held by the capacitor 111 is input to the amplifier 110. The amplifier 110 outputs a signal generated by amplifying the photoelectric conversion signal to the A / D conversion unit 107 via the switch 112.

  There are cases where the signal value of the photoelectric conversion signal is smaller than the signal range in which A / D conversion can be suitably performed. In the imaging apparatus of the present embodiment, even in such a case, the signal output to the A / D converter 107 can be suitably A / D converted by amplifying the photoelectric conversion signal by the amplifier 110. It can be within the signal range.

  Also in this embodiment, the arrangement of the digital signal line group 310 and the analog signal line group 210 can be the same as that of the first embodiment. Therefore, the same effect as in the first embodiment can be obtained.

(Example 5)
The imaging apparatus of the present embodiment will be described focusing on differences from the third embodiment.

  FIG. 6B is a diagram illustrating a configuration example of the imaging apparatus according to the present embodiment. In the imaging device shown in FIG. 6B, the amplifier 110 is shared by the four pixel output circuits 120. A driving bias for driving the amplifier 110 is supplied to the amplifier 110 from a driving bias line 204. In the imaging apparatus of the present embodiment, the drive bias line 204 and the digital signal line group 310 are provided so as to sandwich the electric signal output unit 10. The configuration of the pixel output circuit 120 can be the same as that shown in FIG.

  FIG. 7A is a configuration example of the A / D conversion unit 107 in the present embodiment. The difference from FIG. 2A is that the A / D conversion unit 107 in FIG. 7A includes a switch group 113 and capacitive elements C01 and C02. The switch group 113 includes switches SW1 to SW4. A signal output from the amplifier 110 is supplied to the switches SW1 and SW2. When the switch SW1 is turned on, the capacitive element C01 holds the signal output from the amplifier 110. When the switch SW2 is turned on, the capacitor C02 holds a signal output from the amplifier 110. When the switch SW3 is turned on, the signal held by the capacitor C01 is input to the input node of the transistor M2 via the capacitor C1. When the switch SW4 is turned on, the signal held by the capacitor C02 is input to the input node of the transistor M2 through the capacitor C1.

  FIG. 7B is a diagram illustrating an operation of one pixel output circuit 120 of the imaging apparatus illustrated in FIG. Each period of Pix, A / D, and Read shown in FIG. 7B is the same as each period described in FIG. The Gain period is a period in which the amplifier 110 amplifies the photoelectric conversion signal and outputs a signal to the switch group 113.

  FIG. 7C is a timing diagram of the still image operation in the imaging apparatus illustrated in FIG. In the present embodiment, the period during which the amplifier 110 amplifies the photoelectric conversion signal (hereinafter referred to as “Gain period”) is the same as the combined period of the A / D conversion period and the Read period.

  As in the third embodiment, the imaging apparatus according to the present embodiment performs a global shutter operation. After the Pix period of the pixel output circuits 120-1 to 120-4, a Gain period in which the amplifier 110 amplifies the photoelectric conversion signal of the pixel output circuit 120-1 is started. In the Gain period, in the switch group 113, the switch SW1 is turned on, and the capacitor C01 holds the signal output from the amplifier 110. In the A / D conversion period of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-1, the switch SW1 is turned off and the switch SW3 is turned on. In the timing chart of FIG. 7C, the imaging device includes an A / D conversion period of a signal based on the photoelectric conversion signal of the pixel output circuit 120-1 and a Gain period of the photoelectric conversion signal of the pixel output circuit 120-2. It works in layers. In the Gain period in which the photoelectric conversion signal of the pixel output circuit 120-2 is amplified, the switch SW2 of the switch group 113 is turned on, and the capacitor C02 holds the signal output from the amplifier 110. In the A / D conversion period of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-2, the switch SW2 is turned off and the switch SW4 is turned on.

  Similarly, the photoelectric conversion signals of the pixel output circuits 120-3 and 120-4 operate so that the Gain period and the A / D conversion period overlap each other. Thereby, a digital signal based on the photoelectric conversion signal of each of the plurality of pixel output circuits 120 can be generated in a shorter period than when the operation periods of the amplifier 110 and the A / D conversion unit 107 are not overlapped at all. .

  Also in the imaging apparatus of the present embodiment, as shown in FIG. 4A, a digital signal line group 310 and an analog signal line group 210 are provided with the electric signal output unit 10 interposed therebetween. Thereby, the same effect as Example 1 can be acquired. Further, an analog signal line group 210 including a drive bias line 204 which is a third signal line for driving the amplifier 110 and a digital signal line group 310 are provided so as to sandwich the electric signal output unit 10. This is because if the drive bias line 204 is arranged close to the digital signal line group 310, the potential of the drive bias line 204 also varies due to the variation of the potential of the digital signal line group 310. A change in the potential of the drive bias line 204 causes a change in the amplification factor of the amplifier 110. When the amplification factor of the amplifier 110 fluctuates, even if a photoelectric conversion signal having the same signal value is amplified, the signal value of the signal output from the amplifier 110 is different. Therefore, in order to reduce fluctuations in the amplification factor of the amplifier 110, it is preferable that the drive bias line 204 for driving the amplifier 110 and the digital signal line group 310 are provided so as to sandwich the electric signal output unit 10.

  In the present embodiment, the A / D conversion unit 107 includes a switch group 113 and capacitive elements C01 and C02. Thereby, the A / D conversion period of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-1 and the Gain period of the photoelectric conversion signal of the pixel output circuit 120-2 can be overlapped. Therefore, the period for generating a digital signal based on a signal obtained by amplifying the photoelectric conversion signals of each of the plurality of pixel output circuits 120 can be shortened as compared with a mode in which the A / D conversion unit 107 does not have the switch group 113. Can do.

  In this embodiment, the configuration in which one amplifier 110 is shared by a plurality of pixel output circuits 120 has been described. As a result, the circuit area of the pixel output circuit 120 and the amplifier 110 can be reduced as compared with the case where each pixel output circuit 120 includes the amplifier 110. On the other hand, in the A / D conversion unit 107, the circuit area is increased by providing the switch group 113 and the capacitive elements C01 and C02 as compared to the configuration shown in FIG. Therefore, when the circuit area of one amplifier 110 is larger than the circuit area of the switch group 113 and the capacitive elements C01 and C02, the plurality of pixel output circuits 120 share one amplifier 110, so that the pixel array The circuit area can be reduced.

  In the present embodiment, the operation in which the amplifier 110 amplifies each signal of the pixel output circuit 120 and outputs the amplified signal to the A / D conversion unit 107 has been described. As another form, the input section of the amplifier 110 to which the photoelectric conversion signal is input has an addition function, and the A / D conversion section 107 is amplified by amplifying the photoelectric conversion signal obtained by adding the photoelectric conversion signals of the plurality of pixel output circuits 120. It is also possible to output to

  In the present embodiment, the form in which the total period of the A / D conversion period and the Read period is the same as the Gain period has been described, but the present embodiment is not limited to this form. For example, when the A / D conversion period is shortened, the number of bits of the digital signal may be reduced. Further, when a digital signal is output in series from the pixel output circuit, the Read period can be shortened by reducing the number of bits of the digital signal.

  In the present embodiment, the mode in which one amplifier 110 is shared by the four pixel output circuits 120 has been described so far. As another mode, a mode in which one pixel 110 is shared by two pixel output circuits 120 will be described.

  FIG. 8A shows a form in which the two pixel output circuits 120 share the amplifier 110. The pixel output circuits 120-1 and 120-2 share the amplifier 110-1. The pixel output circuits 120-3 and 120-4 share the amplifier 110-2. Each of the amplifiers 110-1 and 110-2 outputs a signal obtained by amplifying the photoelectric conversion signal output from the pixel output circuit 120 to the A / D conversion unit 107. The amplifiers 110-1 and 110-2 are supplied with a drive bias from a common drive bias line 204.

  FIG. 8B is a configuration example of the A / D conversion unit 107 of the imaging apparatus shown in FIG. The switch group 113 includes switches SW1 to SW8. The A / D conversion unit 107 includes capacitive elements C01 to C04. The signal output from the amplifier 110-1 is input to the switches SW1 and SW2. When a control unit (not shown) makes the switch SW1 conductive, the capacitive element C01 holds a signal output from the amplifier 110-1. On the other hand, when a control unit (not shown) makes the switch SW2 conductive, the capacitive element C02 holds a signal output from the amplifier 110-1. Similarly, when a control unit (not shown) turns on the switches SW3 and SW4, the capacitive elements C03 and C04 hold the signals output from the amplifier 110-2.

  When a control unit (not shown) turns off the switch SW1 and turns on the switch SW5, the signal held by the capacitor C01 is output to the input node of the transistor M2 via the switch SW5 and the capacitor C1. Similarly for the other capacitive elements C02 to C04, the switches SW2 to SW4 corresponding to the respective capacitive elements C02 to C04 are turned off, and the switches SW6 to SW8 corresponding to the respective capacitive elements C02 to C04 are turned on. As a result, the signals held by the capacitive elements C02 to C04 are output from the capacitive elements C02 to C04 to the transistor M2 via the capacitive element C1.

  FIG. 9A is a diagram illustrating the operation of the imaging apparatus illustrated in FIG. The Pix period of the pixel output circuits 120-1 to 120-4 starts and ends at the same time between the pixel output circuits 120-1 to 120-4. The amplifier 110-1 outputs a signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-1 to the capacitive element C01 via the switch SW1. The amplifier 110-2 outputs a signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-2 to the capacitive element C03 via the switch SW3. The start and end of the gain period of the amplifier 110-1 are the same as the start and end of the gain period of the amplifier 110-2, respectively.

  A control unit (not shown) turns off the switches SW1 and SW3 and turns on the switch SW5. Thereby, the A / D conversion unit 107 starts A / D conversion of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-1. On the other hand, the amplifier 110-1 outputs a signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-2 to the capacitive element C02 via the switch SW2. The amplifier 110-2 outputs a signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-4 to the capacitive element C04 via the switch SW4.

  When the A / D conversion period of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-1 ends, the control unit (not shown) turns off the switch SW5 and turns on the switch SW7. Thereby, the A / D conversion unit 107 starts A / D conversion of the signal obtained by amplifying the photoelectric conversion signal of the pixel output circuit 120-3.

  In the imaging device shown in FIG. 8A, the gain periods of the amplifiers 110-1 and 110-2 can be overlapped. On the other hand, in the imaging device shown in FIG. 6B, the gain period of the pixel output circuit 120-2 is started after the gain period of the pixel output circuit 120-1 is completed. Therefore, in the imaging device shown in FIG. 8A, the period required to amplify the photoelectric conversion signals of each of the plurality of pixel output circuits 120 is shorter than that in the imaging device shown in FIG. can do.

  In the imaging apparatus shown in FIG. 8A, the A / D conversion unit 107 includes a switch group 113 including switches SW1 to SW8 and capacitive elements C01 to C04. Thus, in the plurality of pixel output circuits 120 that sequentially output photoelectric conversion signals to the same amplifier 110, the A / D conversion period of the signal based on the photoelectric conversion signal of one pixel output circuit 120, and the other pixel output circuit 120 The gain period of the photoelectric conversion signal can be overlapped. This is the same as the imaging device shown in FIG.

  Also in the imaging apparatus shown in FIG. 8A, the analog signal line group 210 and the digital signal line group 310 are provided with the electric signal output unit 10 interposed therebetween. Therefore, the same effect as in the first embodiment can be obtained.

(Example 6)
The imaging apparatus of the present embodiment will be described focusing on differences from the fifth embodiment.

  FIG. 9B is a diagram illustrating a configuration example of the imaging apparatus of the present embodiment. The image pickup apparatus of the present embodiment shares two amplifiers 110 and one A / D conversion unit 107 with four pixel output circuits 120 in two rows and two columns, similarly to the image pickup apparatus shown in FIG. . A difference from the imaging apparatus shown in FIG. 8A is that the A / D conversion unit 107 and the amplifier 110 are shared by the four pixel output circuits 120 in two rows and two columns.

  Advantages when the amplifier 110 and the A / D conversion unit 107 are shared by the four pixel output circuits 120 in 2 rows and 2 columns will be described. In the digital signal line group 310, N signal lines are used to transmit an N-bit digital signal in parallel. On the other hand, the drive bias line of the analog signal line group 210 can be one wiring for each potential value to be supplied. Therefore, the digital signal line group 310 tends to have a larger number of wirings than the analog signal line group 210. 4A, the width of the digital signal line group 310 corresponding to the two columns of pixel output circuits 120 is equal to the width of the analog signal line group 210 corresponding to the two columns of pixel output circuits 120. On the other hand, it tends to be long. On the other hand, from the viewpoint of optical characteristics, the column interval of the pixel output circuit 120 is preferably constant. Therefore, the difference in length between the width of the digital signal line group 310 corresponding to the two columns of pixel output circuits 120 and the width of the analog signal line group 210 corresponding to the two columns of pixel output circuits 120 is This may be a design constraint.

  In the image pickup apparatus of FIG. 9B, an amplifier 110 and an A / D conversion unit 107 are provided between a signal line group including drive bias lines 202 and 204 and a ramp signal line 203. The amplifier 110 and the A / D converter 107 are provided in the region of the analog signal line group 210 that is shorter than the digital signal line group 310. As a result, the difference in length between the width of the digital signal line group 310 and the width of the analog signal line group 210 including the amplifier 110 and the A / D converter 107 is reduced. Thereby, the column interval of the pixel output circuit 120 can be easily made constant.

  Further, in the image pickup apparatus of FIG. 9B, the in-pixel memories 108 are arranged so that the pixel output circuits 120 in adjacent rows face each other. As a result, the wiring length between the A / D conversion unit 107 and the latch signal line 122 that electrically connects the in-pixel memories 108 of the pixel output circuits 120 in the two rows is set to the layout of the pixel output circuit 120-3. Can be shortened compared to the case where the same as the pixel output circuit 120-1. Further, regarding the electrical path between the counter signal line 302 and the in-pixel memory 108 of each of the pixel output circuits 120 in the two rows, the layout of the pixel output circuit 120-3 is the same as that of the pixel output circuit 120-1. It can be shortened. Therefore, the imaging device of FIG. 9B has a circuit area of the pixel output circuit 120 of 2 rows and 2 columns as compared with the case where the layout of the pixel output circuit 120-3 is the same as that of the pixel output circuit 120-1. It has an effect that can be reduced.

  9B, the signal line group including the drive bias lines 202 and 204 and the ramp signal line 203 as the fourth signal line sandwich the amplifier 110 and the A / D converter 107. Is provided. 9B has an effect that the potential of the drive bias line 202 hardly changes even if the potential changes depending on the time of the ramp signal line 203.

  Further, in the imaging device of FIG. 9B, the addition of the photoelectric conversion signals of the pixel output circuits 120 in two adjacent columns can be performed by providing the input unit of the amplifier 110 with an addition function.

(Example 7)
FIG. 10 illustrates an imaging system including the imaging device according to any one of the first to sixth embodiments.

  In FIG. 10, the imaging system includes a barrier 151 for protecting the lens, a lens 152 for forming an optical image of a subject on the imaging device 154, and a diaphragm 153 for changing the amount of light passing through the lens 152. Further, the imaging system includes an output signal processing unit 155 that processes a signal output from the imaging device 154. A signal output from the imaging device 154 is an imaging signal for generating an image of a subject. The output signal processing unit 155 generates an image by performing various corrections and compressions on the imaging signal output from the imaging device 154 as necessary. A lens 152 and a diaphragm 153 are optical systems that collect light on the imaging device 154.

  The imaging system illustrated in FIG. 10 further includes a buffer memory unit 156 for temporarily storing image data, and an external interface unit 157 for communicating with an external computer or the like. The imaging system further includes a removable recording medium 159 such as a semiconductor memory for recording or reading imaging data, and a recording medium control interface unit 158 for recording or reading to the recording medium 159. Further, the imaging system includes an overall control / arithmetic unit 1510 that controls various computations and the entire digital still camera.

  The imaging device 154 included in the imaging system illustrated in FIG. 10 can have the form described in the first to sixth embodiments. Accordingly, the effects described in the first to sixth embodiments can be obtained also in the imaging device 154 of the imaging system in FIG.

Reference Signs List 101 pixel output circuit 150 drive bias group 200 drive bias circuit 201 ramp signal supply circuit 210 analog signal line group 300 counter group 301 counter circuit 310 digital signal line group

Claims (20)

A plurality of electric signal output units arranged in a matrix for outputting electric signals based on electromagnetic waves incident thereon, each provided corresponding to the electric signal output unit, each input from the electric signal output unit A pixel array having a plurality of A / D converters for converting the electrical signals to be converted into digital signals, and holding the digital signals, each provided corresponding to each column of the electrical signal output units A plurality of storage units
A first signal line for supplying a drive bias to the electrical signal output unit;
A second signal line for transmitting the digital signal from the A / D converter to the storage;
An imaging device having
The image pickup apparatus, wherein the first signal line and the second signal line are provided so as to sandwich the electric signal output unit. A plurality of electric signal output units arranged in a matrix for outputting electric signals based on electromagnetic waves incident thereon, each provided corresponding to the electric signal output unit, each input from the electric signal output unit A pixel array having a plurality of A / D converters for converting the electrical signals to be converted into digital signals, and holding the digital signals, each provided corresponding to each column of the electrical signal output units A plurality of storage units
A first signal line for supplying a driving bias to the A / D converter;
A second signal line for transmitting the digital signal from the A / D converter to the storage;
An imaging device having
The image pickup apparatus, wherein the first signal line and the second signal line are provided so as to sandwich the electric signal output unit. A first electrical signal output unit and a second electrical signal output unit adjacent to each other;
The first electric signal output unit and the second electric signal output unit are provided between a plurality of first signal lines, and the first electric signal output unit and the second electric signal output unit are provided. Whether the second signal line is provided between the signal output units,
The first electric signal output unit and the second electric signal output unit are provided between a plurality of second signal lines, and the first electric signal output unit and the second electric signal output unit are provided. The imaging apparatus according to claim 1, wherein the first signal line is provided between signal output units. The storage unit includes a first storage unit and a second storage unit,
The imaging apparatus further includes a selection circuit in an electrical path between the second signal line and the storage unit,
Each of the plurality of A / D conversion units is provided corresponding to the electrical signal output units in different columns,
The selection circuit outputs the digital signal of one of the plurality of A / D conversion units transmitted by one second signal line to the first storage unit,
The selection circuit outputs the digital signal of the other of the plurality of A / D conversion units transmitted by the one second signal line to the second storage unit. 4. The imaging device according to any one of 3.   The imaging according to claim 1, wherein the pixel array has a plurality of pixels provided in a matrix each having the electrical signal output unit and the A / D conversion unit. apparatus.   The imaging apparatus according to claim 5, wherein the pixel further includes an amplifier that outputs a signal obtained by amplifying the electrical signal to the A / D conversion unit. The imaging apparatus further includes a third signal line for supplying a driving bias to the amplifier,
7. The signal line group including the first signal line and the third signal line and the second signal line are provided so as to sandwich the electric signal output unit. The imaging device described in 1.   The imaging apparatus according to claim 1, wherein one A / D conversion unit is provided corresponding to the plurality of rows of the electric signal output units. The pixel array further includes a plurality of amplifiers each outputting a signal obtained by amplifying the electrical signal to the A / D converter,
The one amplifier or the plurality of amplifiers are provided corresponding to the one A / D conversion unit provided corresponding to the electric signal output units of the plurality of rows. 8. The imaging device according to 8. The imaging apparatus further includes a third signal line for supplying a driving bias to the amplifier,
The signal line group including the first signal line and the third signal line and the second signal line are provided so as to sandwich the electric signal output unit. The imaging device described in 1.   One of the A / D converters is provided corresponding to the plurality of rows of the electric signal output units and the plurality of columns of the electric signal output units. An imaging apparatus according to claim 1. The imaging apparatus further includes a plurality of amplifiers each outputting a signal obtained by amplifying the electrical signal to the A / D conversion unit,
The amplifier is provided corresponding to the one A / D converter;
The imaging apparatus according to claim 11, wherein the first signal line and the second signal line are provided so as to sandwich the amplifier. The imaging apparatus further includes a third signal line for supplying a driving bias to the amplifier,
13. The signal line group including the first signal line and the third signal line, and the second signal line are provided so as to sandwich the electric signal output unit. The imaging device described in 1. One A / D converter is provided corresponding to the plurality of rows of the electric signal output units and a plurality of columns of the electric signal output units,
The imaging apparatus further includes a fourth signal line that supplies a ramp signal to the A / D converter,
14. The imaging apparatus according to claim 13, wherein the first signal line and the fourth signal line are provided so as to sandwich the one A / D conversion unit.   The said A / D conversion part has a comparator which produces | generates the comparison result signal which shows the result of having compared the signal based on a ramp signal and the said electric signal, The Claim 1 characterized by the above-mentioned. Imaging device. The imaging device is
A counter for generating a counter signal obtained by counting clock signals;
A memory to which the comparison result signal is input from the comparator;
A counter signal line for supplying the counter signal from the counter to the memory unit,
16. The signal line group including the second signal line and the counter signal line and the first signal line are provided so as to sandwich the electric signal output unit. Imaging device. The imaging apparatus further includes a signal line for supplying a driving bias to the memory,
A signal line group including the second signal line and the counter signal line, and the signal line for supplying a driving bias to the memory are provided so as to sandwich the electric signal output unit. The imaging device according to claim 16. An imaging device according to any one of claims 1 to 17,
An image pickup system comprising: a signal processing unit that outputs the image pickup apparatus. A method for driving an imaging apparatus,
The imaging device
A plurality of electric signal output units arranged in a matrix for outputting electric signals based on electromagnetic waves incident thereon, each provided corresponding to the electric signal output unit, each input from the electric signal output unit A pixel array having a plurality of A / D converters for converting the electrical signals to be converted into digital signals, and holding the digital signals, each provided corresponding to each column of the electrical signal output units A plurality of storage units,
A first signal line for supplying a drive bias to the electrical signal output unit;
A second signal line for transmitting the digital signal from the A / D converter to the storage;
Have
Furthermore, the pixel array includes a plurality of amplifiers each outputting a signal obtained by amplifying the electrical signal to the A / D converter,
The first signal line and the second signal line are provided so as to sandwich the electric signal output unit,
The amplifier is provided corresponding to the one A / D converter;
The driving method is:
In a period in which the one A / D conversion unit performs A / D conversion on a signal obtained by amplifying the electric signal of one electric signal output unit,
The method for driving an imaging apparatus, wherein the amplifier performs amplification of the electrical signal of another electrical signal output unit. A method for driving an imaging apparatus,
The imaging device
A plurality of electric signal output units arranged in a matrix for outputting electric signals based on electromagnetic waves incident thereon, each provided corresponding to the electric signal output unit, each input from the electric signal output unit A pixel array having a plurality of A / D converters for converting the electrical signals to be converted into digital signals, and holding the digital signals, each provided corresponding to each column of the electrical signal output units A plurality of storage units,
A first signal line for supplying a driving bias to the A / D converter;
A second signal line for transmitting the digital signal from the A / D converter to the storage;
Have
Furthermore, the pixel array includes a plurality of amplifiers each outputting a signal obtained by amplifying the electrical signal to the A / D converter,
The first signal line and the second signal line are provided so as to sandwich the electric signal output unit,
The amplifier is provided corresponding to the one A / D converter;
The driving method is:
In a period in which the one A / D conversion unit performs A / D conversion on a signal obtained by amplifying the electric signal of one electric signal output unit,
The method for driving an imaging apparatus, wherein the amplifier performs amplification of the electrical signal of another electrical signal output unit.

Images