JP2017083244A5 - - Google Patents
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- Publication number
- JP2017083244A5 JP2017083244A5 JP2015210387A JP2015210387A JP2017083244A5 JP 2017083244 A5 JP2017083244 A5 JP 2017083244A5 JP 2015210387 A JP2015210387 A JP 2015210387A JP 2015210387 A JP2015210387 A JP 2015210387A JP 2017083244 A5 JP2017083244 A5 JP 2017083244A5
- Authority
- JP
- Japan
- Prior art keywords
- sample tube
- receiving hole
- peripheral surface
- light
- opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002093 peripheral Effects 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 4
- 230000003287 optical Effects 0.000 claims description 4
- 238000001514 detection method Methods 0.000 claims description 2
- 238000003780 insertion Methods 0.000 claims description 2
Description
本発明の光測定装置は、底部に向かうに従って外径が次第に小さくなるテーパー部を有する試料チューブを受容する円錐台状の試料チューブ受容用穴部と、当該試料チューブ受容用穴部に配置された試料チューブに対する測定用光の入射用開口および当該試料チューブからの検出用光の出射用開口が当該試料チューブ受容用穴部の内周面における互いに対向する位置に開口する導光路空間とを有する構造体を備えており、
前記試料チューブ受容用穴部の内周面に、前記入射用開口が形成されたレベルにおいて前記試料チューブのテーパー部の外周面に当接して当該試料チューブの挿入位置を前記構造体に対して位置決めする突起部を有することを特徴とする。
The optical measurement device of the present invention is arranged in a truncated cone-shaped sample tube receiving hole for receiving a sample tube having a tapered portion whose outer diameter gradually decreases toward the bottom, and the sample tube receiving hole. A structure having a light guide path space in which an opening for measuring light incident on the sample tube and an opening for emitting detection light from the sample tube open at positions facing each other on the inner peripheral surface of the sample tube receiving hole Has a body,
The insertion position of the sample tube is positioned with respect to the structure by contacting the outer peripheral surface of the tapered portion of the sample tube at the level where the entrance opening is formed on the inner peripheral surface of the sample tube receiving hole. It has the projection part which carries out.
Claims (2)
前記試料チューブ受容用穴部の内周面には、前記入射用開口が形成されたレベルにおいて前記試料チューブのテーパー部の外周面に当接して当該試料チューブの挿入位置を前記構造体に対して位置決めする突起部を有することを特徴とする光測定装置。 A truncated cone-shaped sample tube receiving hole for receiving a sample tube having a tapered portion whose outer diameter gradually decreases toward the bottom, and incidence of measurement light to the sample tube disposed in the sample tube receiving hole A structure having an opening for light detection and an opening for detecting light from the sample tube and a light guide path space opened at positions facing each other on the inner peripheral surface of the sample tube receiving hole,
The inner peripheral surface of the sample tube receiving hole is in contact with the outer peripheral surface of the tapered portion of the sample tube at a level where the entrance opening is formed, and the insertion position of the sample tube is set with respect to the structure. An optical measuring device having a protrusion for positioning.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015210387A JP6137270B2 (en) | 2015-10-27 | 2015-10-27 | Light measuring device |
| TW105124996A TWI671518B (en) | 2015-10-27 | 2016-08-05 | Light measuring device |
| PCT/JP2016/077226 WO2017073196A1 (en) | 2015-10-27 | 2016-09-15 | Optical measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015210387A JP6137270B2 (en) | 2015-10-27 | 2015-10-27 | Light measuring device |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017083244A JP2017083244A (en) | 2017-05-18 |
| JP6137270B2 JP6137270B2 (en) | 2017-05-31 |
| JP2017083244A5 true JP2017083244A5 (en) | 2017-06-29 |
Family
ID=58631523
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015210387A Expired - Fee Related JP6137270B2 (en) | 2015-10-27 | 2015-10-27 | Light measuring device |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6137270B2 (en) |
| TW (1) | TWI671518B (en) |
| WO (1) | WO2017073196A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020051915A (en) * | 2018-09-27 | 2020-04-02 | ウシオ電機株式会社 | Optical measuring device and optical measuring method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009037810A1 (en) * | 2007-09-18 | 2009-03-26 | Panasonic Corporation | Measurement device, measurement instrument and method, and sampling method |
| JP2009080014A (en) * | 2007-09-26 | 2009-04-16 | Olympus Corp | Specimen rack, adapter for specimen rack, sample dispensation system |
| JP5665811B2 (en) * | 2012-08-02 | 2015-02-04 | 国立大学法人九州大学 | Light-induced fluorescence measuring instrument |
-
2015
- 2015-10-27 JP JP2015210387A patent/JP6137270B2/en not_active Expired - Fee Related
-
2016
- 2016-08-05 TW TW105124996A patent/TWI671518B/en not_active IP Right Cessation
- 2016-09-15 WO PCT/JP2016/077226 patent/WO2017073196A1/en active Application Filing
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