JP2017028162A5 - Method for producing single crystal SiC substrate - Google Patents

Method for producing single crystal SiC substrate Download PDF

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JP2017028162A5
JP2017028162A5 JP2015147012A JP2015147012A JP2017028162A5 JP 2017028162 A5 JP2017028162 A5 JP 2017028162A5 JP 2015147012 A JP2015147012 A JP 2015147012A JP 2015147012 A JP2015147012 A JP 2015147012A JP 2017028162 A5 JP2017028162 A5 JP 2017028162A5
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sic substrate
single crystal
crystal sic
controlling
shape
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導電性がある単結晶SiC基板の形状を制御する方法であって、単結晶SiC基板は少なくとも片面が機械的加工により加工され、容器に入れた電解質水溶液に機械加工された片面のみを接液させ、前記単結晶SiC基板が陽極となり、前記単結晶SiC基板の接液面との距離が一定になるよう陰極を配置した上で、前記陽極と前記陰極との間に直流電圧を印加し、単結晶SiC基板の接液面を陽極酸化させて機械的加工による加工変質層を除去することを特徴とする単結晶SiC基板の形状を制御する方法。A method for controlling the shape of a conductive single crystal SiC substrate, wherein at least one side of the single crystal SiC substrate is processed by mechanical processing, and only one side of the machined solution is brought into contact with an electrolyte aqueous solution in a container. The single crystal SiC substrate serves as an anode, a cathode is disposed so that the distance from the liquid contact surface of the single crystal SiC substrate is constant, and then a DC voltage is applied between the anode and the cathode. A method for controlling the shape of a single-crystal SiC substrate, characterized by anodizing the wetted surface of the crystalline SiC substrate and removing a work-affected layer by mechanical processing. 前記機械的加工が、ダイヤモンド砥粒を使用した加工を含むことを特徴とする請求項1に記載の単結晶SiC基板の形状を制御する方法。The method for controlling the shape of a single crystal SiC substrate according to claim 1, wherein the mechanical processing includes processing using diamond abrasive grains. 前記機械的加工が、ラップ、ポリッシュ、研削の少なくとも一つを含むことを特徴とする請求項1〜2のいずれか一項に記載の単結晶SiC基板の形状を制御する方法。The method for controlling the shape of a single crystal SiC substrate according to any one of claims 1 to 2, wherein the mechanical processing includes at least one of lapping, polishing, and grinding. 前記電解質水溶液の導電率が1ミリジーメンス/メートル(10マイクロジーメンス/センチメートル)以上、10ジーメンス/メートル(100ミリジーメンス/センチメートル)以下であることを特徴とする請求項1〜3のいずれか一項に記載の単結晶SiC基板の形状を制御する方法。The electrical conductivity of the aqueous electrolyte solution is 1 millisiemens / meter (10 microsiemens / centimeter) or more and 10 siemens / meter (100 millisiemens / centimeter) or less. A method for controlling a shape of a single crystal SiC substrate according to one item. 前記少なくとも片面が機械的加工により加工された単結晶SiC基板が、第1の面と第2の面の両方の面が機械的加工により加工された単結晶SiC基板であって、第1の面と第2の面の両方の面の表面粗さRaが10nm以下となるまで機械的加工を行い、片面ずつ両面を陽極酸化させ、両面の加工変質層を除去することを特徴とする請求項1〜4のいずれか一項に記載の単結晶SiC基板の形状を制御する方法。The single crystal SiC substrate having at least one surface processed by mechanical processing is a single crystal SiC substrate in which both the first surface and the second surface are processed by mechanical processing, the first surface 2. The mechanical processing is performed until the surface roughness Ra of both the first surface and the second surface is 10 nm or less, and both surfaces are anodized one by one to remove the work-affected layer on both surfaces. The method of controlling the shape of the single crystal SiC substrate as described in any one of -4. 請求項1〜5のいずれか一項に記載の単結晶SiC基板の形状を制御する方法で製造することを特徴とする単結晶SiC基板の製造方法。A method for producing a single crystal SiC substrate, comprising producing the single crystal SiC substrate according to claim 1 by controlling the shape thereof.
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Publication number Priority date Publication date Assignee Title
JP2019112261A (en) * 2017-12-22 2019-07-11 昭和電工株式会社 METHOD FOR PROCESSING SiC SINGLE CRYSTAL AND METHOD FOR MANUFACTURING SiC INGOT
JP7132454B1 (en) * 2022-05-31 2022-09-06 昭和電工株式会社 SiC substrate and SiC epitaxial wafer
JP7287588B1 (en) 2022-06-02 2023-06-06 株式会社レゾナック n-type SiC single crystal substrate
JP7217828B1 (en) 2022-06-02 2023-02-03 昭和電工株式会社 SiC single crystal substrate
JP7245586B1 (en) 2022-06-02 2023-03-24 株式会社レゾナック n-type SiC single crystal substrate
JP7260039B1 (en) 2022-06-02 2023-04-18 株式会社レゾナック SiC single crystal substrate
JP7435880B2 (en) * 2023-03-09 2024-02-21 株式会社レゾナック N-type SiC single crystal substrate and SiC epitaxial wafer

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TWI335674B (en) * 2007-07-11 2011-01-01 Univ Nat Taiwan Methos for forming an insulating layer over a silicon carbide substrate, silicon carbide transistors and methods for fabricating the same
JP5516424B2 (en) * 2009-02-04 2014-06-11 日立金属株式会社 Method for manufacturing silicon carbide single crystal substrate for epitaxial growth
JP5560774B2 (en) * 2010-03-03 2014-07-30 日立金属株式会社 Method for manufacturing silicon carbide single crystal substrate
JP2015211047A (en) * 2014-04-23 2015-11-24 国立研究開発法人産業技術総合研究所 Method for polishing silicon carbide substrate

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