JP2016197629A5 - - Google Patents

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Publication number
JP2016197629A5
JP2016197629A5 JP2015076048A JP2015076048A JP2016197629A5 JP 2016197629 A5 JP2016197629 A5 JP 2016197629A5 JP 2015076048 A JP2015076048 A JP 2015076048A JP 2015076048 A JP2015076048 A JP 2015076048A JP 2016197629 A5 JP2016197629 A5 JP 2016197629A5
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Japan
Prior art keywords
reference mark
recognition camera
transfer tool
origin
die transfer
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JP2015076048A
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Japanese (ja)
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JP2016197629A (en
JP6438826B2 (en
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Priority to JP2015076048A priority Critical patent/JP6438826B2/en
Priority claimed from JP2015076048A external-priority patent/JP6438826B2/en
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Publication of JP2016197629A5 publication Critical patent/JP2016197629A5/ja
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Claims (16)

ダイ移送ツールの移動範囲内に設けられた第1の基準マークと、
前記ダイ移送ツールに設けられた第2の基準マークと、
前記第1の基準マークを視野範囲内とする認識カメラと、
前記ダイ移送ツールが、前記第2の基準マークの位置を、前記第1の基準マークの位置と一定の関係にある位置に前記認識カメラの撮像視野内で移動することに基づき、前記認識カメラの原点または前記ダイ移送ツールの原点を補正する補正手段と、
を有するボンディング装置。
A first fiducial mark provided within the movement range of the die transfer tool;
A second fiducial mark provided on the die transfer tool;
A recognition camera having the first fiducial mark within the field of view;
Said die transfer tool, the position of the second reference mark, based on be moved within the first imaging visual field position and the recognition camera to the location in the fixed relationship of the reference mark, the recognition camera origin or a correcting means for correcting the origin of the die transfer tool,
A bonding apparatus.
前記補正手段は、前記認識カメラの撮像視野内で前記第1の基準マークが移動したことによる軌跡に基づき、前記認識カメラの原点を補正する手段である、
請求項1記載のボンディング装置。
The correction means, based on the trajectory due to the first reference mark in the imaging visual field of the recognition camera is moved, a manual stage you correct the origin of the recognition camera,
The bonding apparatus according to claim 1.
前記補正手段は、前記認識カメラの撮像視野内で前記第2の基準マークが移動したことによる軌跡に基づき、前記ダイ移送ツールの原点を補正する手段である、
請求項1記載のボンディング装置。
The correction means, based on the trajectory due to the second reference marks in the imaging visual field of the recognition camera is moved, a manual stage you correct the origin of the die transfer tool,
The bonding apparatus according to claim 1.
前記第1の基準マークは、第1−1の基準マークと第1−2の基準マークの2つの基準マークであり、
前記補正手段は、記第−1の基準マークおよび第1−2の基準マークに基づき、前記ダイ移送ツールの原点を補正する手段であ
請求項記載のボンディング装置。
The first reference mark is two reference marks, a 1-1 reference mark and a 1-2 reference mark,
It said correction means, before SL based on the reference mark and the 1-2 reference mark of the first -1, Ru means der you correct the origin of the die transfer tool,
The bonding apparatus according to claim 1 .
前記補正手段は、前記認識カメラが前記第1−1の基準マークおよび前記第1−2の基準マークを撮像することにより、前記認識カメラの原点を補正する手段である、
請求項4記載のボンディング装置。
It said correcting means, by the recognition camera takes an image of the reference marks of the first 1-1 fiducial mark and the second 1-2, a means for correcting the origin of the recognition camera,
The bonding apparatus according to claim 4.
前記補正手段は、前記認識カメラが撮像する前記第1−1の基準マーク位置に前記第2の基準マークを一致させるよう前記ダイ移送ツールを移動し、前記認識カメラが撮像する前記第1−2の基準マークの位置に前記第2の基準マークを一致させるよう前記ダイ移送ツールを移動することによって、前記ダイ移送ツールの原点を補正する手段である、
請求項4または5記載のボンディング装置。
The correction means moves the die transfer tool so that the second reference mark coincides with the 1-1 reference mark position imaged by the recognition camera, and the first-2 imaged by the recognition camera. Means for correcting the origin of the die transfer tool by moving the die transfer tool so that the second reference mark coincides with the position of the reference mark.
Claim 4 or 5 bonding apparatus according.
前記認識カメラの原点の補正は、前記認識カメラの認識システムの位置ずれまたは方向ずれの補正であり、
前記ダイ移送ツールの原点の補正は、前記ダイ移送ツールの位置ずれまたは方向ずれの補正である、
請求項1乃至6のいずれか1項に記載のボンディング装置。
The correction of the origin of the recognition camera, or positional deviation of the recognition camera of the recognition system is a correction of the direction shift,
The correction of the origin of die transfer tool, positional displacement or the die transfer tool is a correction of the direction shift,
Bonding device according to any one of claims 1 to 6.
前記第1の基準マークは、基板を搬送する搬送路または中間ステージに備えられている、請求項1乃至7のいずれか1項に記載のボンディング装置。 Said first reference mark, the conveyance path also transports the substrate is provided in the intermediate stage, the bonding apparatus according to any one of claims 1 to 7. ダイ移送ツールが、前記ダイ移送ツールに設けられた第2の基準マークの位置を、前記ダイ移送ツールの移動範囲内に設けられた第1の基準マークの位置と一定の関係にある位置に、前記第1の基準マークを撮像視野内とする認識カメラの視野内で移動することに基づき、前記認識カメラの原点または前記ダイ移送ツールの原点を補正する補正方法を有する、
ボンディング方法
The die transfer tool is arranged such that the position of the second reference mark provided on the die transfer tool is in a fixed relationship with the position of the first reference mark provided within the movement range of the die transfer tool. the basis that the first reference mark moves in the field of view of the recognition camera to the imaging field of view, the origin of the recognition camera or that have a correction method for correcting the origin of the die transfer tool,
Bonding method .
前記補正方法は、前記認識カメラの撮像視野内で前記第1の基準マークが移動したことによる軌跡に基づき、前記認識カメラの移動原点を補正する方法である、
請求項9記載のボンディング方法。
The correction method is based on the trajectory due to the first reference mark in the imaging visual field of the recognition camera is moved, it is how you correct the movement origin of the recognition camera,
The bonding method according to claim 9.
前記補正方法は、前記認識カメラの撮像視野内で前記第2の基準マークが移動したことによる軌跡に基づき、前記ダイ移送ツールの移動原点を補正する方法である、
請求項9記載のボンディング方法。
The correction method is based on the trajectory due to the second reference marks in the imaging visual field of the recognition camera is moved, it is how you correct the movement origin of the die transfer tool,
The bonding method according to claim 9.
前記補正方法は、基板を搬送する搬送路に設けられ、第1−1の基準マークと第1−2の基準マークの2つの基準マークである前記第1の基準マークに基づき、前記ダイ移送ツールの原点を補正する方法である、
請求項9記載のボンディング方法。
The correction method is provided on a transport path for transporting a substrate, and the die transfer tool is based on the first reference mark which is two reference marks of a 1-1 reference mark and a 1-2 reference mark. which is the way you correct the origin,
The bonding method according to claim 9.
前記補正方法は、前記認識カメラが前記第1−1の基準マークおよび前記第1−2の基準マークを撮像することにより、前記認識カメラの原点を補正する方法である、
請求項12記載のボンディング方法。
The correction method, by the recognition camera takes an image of the reference marks of the first 1-1 fiducial mark and the second 1-2, a method of correcting the origin of the recognition camera,
The bonding method according to claim 12.
前記補正方法は、前記認識カメラが撮像する前記第1−1の基準マーク位置に前記第2の基準マークを一致させるよう前記ダイ移送ツールを移動し、前記認識カメラが撮像する前記第1−2の基準マークの位置に前記第2の基準マークを一致させるよう前記ダイ移送ツールを移動することによって、前記ダイ移送ツールの原点を補正する方法である、
請求項12または13記載のボンディング方法。
In the correction method, the die transfer tool is moved so that the second reference mark coincides with the 1-1 reference mark position imaged by the recognition camera, and the first-2 imaged by the recognition camera. A method of correcting the origin of the die transfer tool by moving the die transfer tool so that the second reference mark coincides with the position of the reference mark of
12. or 13, wherein bonding method.
前記認識カメラの原点の補正は、前記認識カメラの認識システムの位置ずれまたは方向ずれの補正であり、
前記ダイ移送ツールの原点の補正は、前記ダイ移送ツールの位置ずれまたは方向ずれの補正である、
請求項9乃至14のいずれか1項に記載のボンディング方法。
The correction of the origin of the recognition camera, or positional deviation of the recognition camera of the recognition system is a correction of the direction shift,
The correction of the origin of die transfer tool, positional displacement or the die transfer tool is a correction of the direction shift,
Bonding method according to any one of claims 9 to 14.
前記第1の基準マークまた前記第2の基準マークは、基板を搬送する搬送路または中間ステージに備えられている、請求項9乃至15のいずれか1項に記載のボンディング方法。 The or first reference mark and the second reference mark, the conveyance path also transports the substrate is provided in the intermediate stage, bonding method according to any one of claims 9 to 15.
JP2015076048A 2015-04-02 2015-04-02 Bonding apparatus and bonding method Active JP6438826B2 (en)

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JP2016197629A5 true JP2016197629A5 (en) 2018-02-22
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7292463B1 (en) 2022-03-29 2023-06-16 キヤノンマシナリー株式会社 Alignment Apparatus, Alignment Method, Bonding Apparatus, Bonding Method, and Semiconductor Device Manufacturing Method

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Publication number Priority date Publication date Assignee Title
JP7018341B2 (en) 2018-03-26 2022-02-10 ファスフォードテクノロジ株式会社 Manufacturing method of die bonding equipment and semiconductor equipment
JP7232071B2 (en) * 2019-02-12 2023-03-02 株式会社ディスコ Camera position deviation detection method in processing equipment
DE102021105594B3 (en) * 2021-03-09 2022-06-09 Asm Assembly Systems Gmbh & Co. Kg Method for correcting the position of components with a recording device, recording device, computer program product and computer-readable medium

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JP4728293B2 (en) * 2007-06-28 2011-07-20 ヤマハ発動機株式会社 Parts transfer device
CH698334B1 (en) * 2007-10-09 2011-07-29 Esec Ag A process for the removal and installation of a wafer table provided on the semiconductor chip on a substrate.
JP5344145B2 (en) * 2008-12-25 2013-11-20 澁谷工業株式会社 Method for aligning electronic component and substrate in bonding apparatus
JP6259615B2 (en) * 2013-09-13 2018-01-10 ファスフォードテクノロジ株式会社 Die bonder and die bonding method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7292463B1 (en) 2022-03-29 2023-06-16 キヤノンマシナリー株式会社 Alignment Apparatus, Alignment Method, Bonding Apparatus, Bonding Method, and Semiconductor Device Manufacturing Method

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