JP2016180158A - Film formation method - Google Patents
Film formation method Download PDFInfo
- Publication number
- JP2016180158A JP2016180158A JP2015061593A JP2015061593A JP2016180158A JP 2016180158 A JP2016180158 A JP 2016180158A JP 2015061593 A JP2015061593 A JP 2015061593A JP 2015061593 A JP2015061593 A JP 2015061593A JP 2016180158 A JP2016180158 A JP 2016180158A
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- Prior art keywords
- substrate
- mist
- metal
- raw material
- charged
- Prior art date
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- 238000000034 method Methods 0.000 title claims abstract description 39
- 230000015572 biosynthetic process Effects 0.000 title abstract description 5
- 239000003595 mist Substances 0.000 claims abstract description 62
- 239000000758 substrate Substances 0.000 claims abstract description 45
- 239000002994 raw material Substances 0.000 claims abstract description 40
- 229910052751 metal Inorganic materials 0.000 claims abstract description 39
- 239000002184 metal Substances 0.000 claims abstract description 34
- 239000007789 gas Substances 0.000 claims abstract description 30
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 9
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 claims abstract description 8
- 239000012298 atmosphere Substances 0.000 claims abstract description 8
- 150000004767 nitrides Chemical class 0.000 claims abstract description 8
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 4
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 4
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 4
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 4
- 239000001301 oxygen Substances 0.000 claims abstract description 4
- 239000000463 material Substances 0.000 claims description 34
- 230000001678 irradiating effect Effects 0.000 claims description 9
- 238000007590 electrostatic spraying Methods 0.000 claims description 6
- 150000003839 salts Chemical class 0.000 claims description 6
- 150000004703 alkoxides Chemical class 0.000 claims description 5
- 150000004820 halides Chemical class 0.000 claims description 5
- 150000007524 organic acids Chemical class 0.000 claims description 4
- 150000004649 carbonic acid derivatives Chemical class 0.000 claims description 3
- 150000004679 hydroxides Chemical class 0.000 claims description 3
- 229910052717 sulfur Inorganic materials 0.000 claims description 3
- 239000011593 sulfur Substances 0.000 claims description 3
- 229910019142 PO4 Inorganic materials 0.000 claims description 2
- 150000002823 nitrates Chemical class 0.000 claims description 2
- 235000021317 phosphate Nutrition 0.000 claims description 2
- 150000003013 phosphoric acid derivatives Chemical class 0.000 claims description 2
- 150000003467 sulfuric acid derivatives Chemical class 0.000 claims description 2
- 239000010408 film Substances 0.000 description 59
- 239000000243 solution Substances 0.000 description 37
- 150000002736 metal compounds Chemical class 0.000 description 32
- 239000002585 base Substances 0.000 description 26
- 239000007921 spray Substances 0.000 description 19
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 15
- 239000007983 Tris buffer Substances 0.000 description 12
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- 238000004519 manufacturing process Methods 0.000 description 10
- 229910052726 zirconium Inorganic materials 0.000 description 10
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 9
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- 125000005595 acetylacetonate group Chemical group 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 8
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- 238000005240 physical vapour deposition Methods 0.000 description 8
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- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 description 4
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- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
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- 239000007864 aqueous solution Substances 0.000 description 2
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- 238000000576 coating method Methods 0.000 description 2
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- 239000000203 mixture Substances 0.000 description 2
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- VKZRWSNIWNFCIQ-WDSKDSINSA-N (2s)-2-[2-[[(1s)-1,2-dicarboxyethyl]amino]ethylamino]butanedioic acid Chemical compound OC(=O)C[C@@H](C(O)=O)NCCN[C@H](C(O)=O)CC(O)=O VKZRWSNIWNFCIQ-WDSKDSINSA-N 0.000 description 1
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- CVBUKMMMRLOKQR-UHFFFAOYSA-N 1-phenylbutane-1,3-dione Chemical compound CC(=O)CC(=O)C1=CC=CC=C1 CVBUKMMMRLOKQR-UHFFFAOYSA-N 0.000 description 1
- YRAJNWYBUCUFBD-UHFFFAOYSA-N 2,2,6,6-tetramethylheptane-3,5-dione Chemical compound CC(C)(C)C(=O)CC(=O)C(C)(C)C YRAJNWYBUCUFBD-UHFFFAOYSA-N 0.000 description 1
- YQTCQNIPQMJNTI-UHFFFAOYSA-N 2,2-dimethylpropan-1-one Chemical group CC(C)(C)[C]=O YQTCQNIPQMJNTI-UHFFFAOYSA-N 0.000 description 1
- CEGGECULKVTYMM-UHFFFAOYSA-N 2,6-dimethylheptane-3,5-dione Chemical compound CC(C)C(=O)CC(=O)C(C)C CEGGECULKVTYMM-UHFFFAOYSA-N 0.000 description 1
- GJMUCDMIIVSROW-UHFFFAOYSA-N 2,8-dimethylnonane-4,6-dione Chemical compound CC(C)CC(=O)CC(=O)CC(C)C GJMUCDMIIVSROW-UHFFFAOYSA-N 0.000 description 1
- XNCSCQSQSGDGES-UHFFFAOYSA-N 2-[2-[bis(carboxymethyl)amino]propyl-(carboxymethyl)amino]acetic acid Chemical compound OC(=O)CN(CC(O)=O)C(C)CN(CC(O)=O)CC(O)=O XNCSCQSQSGDGES-UHFFFAOYSA-N 0.000 description 1
- DMQQXDPCRUGSQB-UHFFFAOYSA-N 2-[3-[bis(carboxymethyl)amino]propyl-(carboxymethyl)amino]acetic acid Chemical compound OC(=O)CN(CC(O)=O)CCCN(CC(O)=O)CC(O)=O DMQQXDPCRUGSQB-UHFFFAOYSA-N 0.000 description 1
- YGDVXSDNEFDTGV-UHFFFAOYSA-N 2-[6-[bis(carboxymethyl)amino]hexyl-(carboxymethyl)amino]acetic acid Chemical compound OC(=O)CN(CC(O)=O)CCCCCCN(CC(O)=O)CC(O)=O YGDVXSDNEFDTGV-UHFFFAOYSA-N 0.000 description 1
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- MYWUZJCMWCOHBA-VIFPVBQESA-N methamphetamine Chemical compound CN[C@@H](C)CC1=CC=CC=C1 MYWUZJCMWCOHBA-VIFPVBQESA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
- ZDYWPVCQPUPOJV-UHFFFAOYSA-N nonane-4,6-dione Chemical compound CCCC(=O)CC(=O)CCC ZDYWPVCQPUPOJV-UHFFFAOYSA-N 0.000 description 1
- GJYXGIIWJFZCLN-UHFFFAOYSA-N octane-2,4-dione Chemical compound CCCCC(=O)CC(C)=O GJYXGIIWJFZCLN-UHFFFAOYSA-N 0.000 description 1
- PJEPOHXMGDEIMR-UHFFFAOYSA-N octane-3,5-dione Chemical compound CCCC(=O)CC(=O)CC PJEPOHXMGDEIMR-UHFFFAOYSA-N 0.000 description 1
- 229960003330 pentetic acid Drugs 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- GVIIRWAJDFKJMJ-UHFFFAOYSA-N propan-2-yl 3-oxobutanoate Chemical compound CC(C)OC(=O)CC(C)=O GVIIRWAJDFKJMJ-UHFFFAOYSA-N 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- JKUYRAMKJLMYLO-UHFFFAOYSA-N tert-butyl 3-oxobutanoate Chemical compound CC(=O)CC(=O)OC(C)(C)C JKUYRAMKJLMYLO-UHFFFAOYSA-N 0.000 description 1
- NVQCTSGVFRPZCZ-UHFFFAOYSA-N tert-butyl 3-oxohexaneperoxoate;zirconium Chemical compound [Zr].CCCC(=O)CC(=O)OOC(C)(C)C.CCCC(=O)CC(=O)OOC(C)(C)C NVQCTSGVFRPZCZ-UHFFFAOYSA-N 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Abstract
Description
本発明は、金属元素を含む、酸化物、窒化物、炭化物又は硫化物(以下、「金属化合物」ともいう)からなる厚膜を基材の表面に効率よく形成する方法に関する。 The present invention relates to a method for efficiently forming a thick film made of an oxide, nitride, carbide or sulfide (hereinafter also referred to as “metal compound”) containing a metal element on the surface of a substrate.
金属元素を含む、酸化物、窒化物、炭化物又は硫化物(金属化合物)からなる膜(以下、「金属化合物膜」ともいう)は、保護(耐酸化、遮熱、耐摩耗等)、反射、絶縁等の作用を有する機能膜として、工業的に広く用いられている。
金属化合物からなる高純度膜の製造方法としては、金属元素を含む有機化合物又は無機化合物を媒体に溶かした後、得られた溶液を基材に塗布し、加熱、焼成する方法や、気相で原料を反応させ固相状態で析出させる化学的蒸着法(CVD)、固体原料(ターゲット)に物理的エネルギーを注入して気化し、基材に酸化物薄膜として再配列させる物理的蒸着法(PVD)等が知られている。また、金属酸化物からなる微粒子自身を堆積させる、エアロゾルデポジション法(特許文献1)及び静電噴霧法(特許文献2)等も知られている。
A film made of an oxide, nitride, carbide or sulfide (metal compound) containing a metal element (hereinafter also referred to as “metal compound film”) is protected (oxidation resistance, heat shield, wear resistance, etc.), reflective, As a functional film having an action such as insulation, it is widely used industrially.
As a method for producing a high-purity film made of a metal compound, after dissolving an organic compound or inorganic compound containing a metal element in a medium, the obtained solution is applied to a substrate, heated and baked, Chemical vapor deposition (CVD) in which raw materials are reacted and deposited in a solid state, physical vapor deposition (PVD) in which physical energy is injected into a solid raw material (target), vaporized, and rearranged as an oxide thin film on a substrate ) Etc. are known. Also known are an aerosol deposition method (Patent Document 1) and an electrostatic spray method (Patent Document 2) in which fine particles of metal oxide themselves are deposited.
化学的蒸着法(CVD)及び物理的蒸着法(PVD)の場合、高純度の金属化合物膜を得ることができる一方、厚さが100μmを超える金属化合物膜を形成するには、製膜速度が十分ではなく、長時間を要した。また、金属化合物からなる微粒子自身を堆積させる方法の場合、大きさを一定とした高コストの高純度微粒子を用いる必要があった。
本発明は、高純度の金属化合物からなる厚膜を基材の表面に効率よく形成する方法を提供することを目的とする。
In the case of chemical vapor deposition (CVD) and physical vapor deposition (PVD), a high-purity metal compound film can be obtained. On the other hand, in order to form a metal compound film having a thickness of more than 100 μm, the film formation speed is high. It was not enough and took a long time. In addition, in the case of depositing fine particles made of a metal compound itself, it is necessary to use high-cost high-purity fine particles having a constant size.
An object of this invention is to provide the method of forming the thick film which consists of a highly purified metal compound efficiently on the surface of a base material.
本発明は、以下に示される。
1.金属元素を含む、酸化物、窒化物、炭化物又は硫化物からなる膜を基材の表面に形成する方法において、酸素元素、窒素元素、炭素元素及び硫黄元素から選ばれた少なくとも1種を含む分子からなるガスを含む雰囲気の中で、金属元素に由来する成分(M)が溶解された原料溶液を用いて、正負いずれかに帯電したミストを発生させ、帯電ミストを、基材に対して連続的に供給し、基材の表面又はその近傍に滞留する帯電ミストに、500nm〜11μmの波長のレーザーを照射することを特徴とする膜形成方法。
2.帯電ミストは、帯電ミストと基材とが互いに反対の電荷を有するように、原料溶液を静電噴霧することにより形成されたものである上記1に記載の膜形成方法。
3.基材が予熱されている上記1又は2に記載の膜形成方法。
4.成分(M)が、有機金属錯体、有機酸金属塩、金属アルコキシド、金属元素を含むハロゲン化物、硝酸塩、硫酸塩、リン酸塩、炭酸塩及び水酸化物から選ばれた少なくとも1種である上記1乃至3のいずれか一項に記載の膜形成方法。
5.原料溶液に含まれる成分(M)の濃度が、0.1〜80質量%である上記1乃至4のいずれか一項に記載の膜形成方法。
The present invention is shown below.
1. A molecule containing at least one selected from an oxygen element, a nitrogen element, a carbon element and a sulfur element in a method for forming a film made of an oxide, nitride, carbide or sulfide containing a metal element on the surface of a substrate Using a raw material solution in which a component (M) derived from a metal element is dissolved in an atmosphere containing a gas, a positively or negatively charged mist is generated, and the charged mist is continuously applied to the substrate. The film forming method is characterized by irradiating a charged mist staying on or near the surface of the base material with a laser having a wavelength of 500 nm to 11 μm.
2. 2. The film forming method according to 1 above, wherein the charged mist is formed by electrostatic spraying of the raw material solution so that the charged mist and the substrate have opposite charges.
3. 3. The film forming method according to 1 or 2 above, wherein the substrate is preheated.
4). The component (M) is at least one selected from organic metal complexes, organic acid metal salts, metal alkoxides, halides containing metal elements, nitrates, sulfates, phosphates, carbonates and hydroxides. 4. The film forming method according to any one of 1 to 3.
5. The film forming method according to any one of 1 to 4 above, wherein the concentration of the component (M) contained in the raw material solution is 0.1 to 80% by mass.
本発明によれば、基材に対して連続的に供給される帯電ミストは、正負いずれかの同じ電荷をもつため、これらが凝集することなく、また、高密度で基材の表面又はその近傍に滞留させることができ、そこへレーザーを照射することにより、熱分解反応が起こり、高純度の金属化合物の生成及び堆積が繰り返されて、容易に厚膜を形成することができる。従来の製造方法として、広く適用されている化学的蒸着法(CVD)、物理的蒸着法(PVD)等では、例えば、0.01気圧以下の減圧条件が好ましいとされてきたが、本発明では、大気圧又はそれに近い減圧条件で、金属化合物からなる厚膜を製造することができる。また、帯電ミストの供給方法、レーザー照射法等を改良することにより、大面積の金属化合物膜を製造することもできる。本発明により、例えば、金属酸化物膜を形成する場合には、金属元素を1種のみとした酸化物だけでなく、複数種とした複合酸化物とすることができるので、広い分野において有用である。
原料溶液が、帯電ミストと基材とが互いに反対の電荷を有するように静電噴霧された場合には、帯電ミストを確実に基材の表面に供給することができ、生成する金属化合物を、基材の表面に対して規則的な方向(垂直方向等)に粒成長させやすくなるので、効率よく厚膜を得ることができる。
また、基材が予熱されている場合には、結晶性金属化合物からなる膜の形成に好適である。
According to the present invention, since the charged mist continuously supplied to the substrate has the same charge of either positive or negative, they are not aggregated, and the surface of the substrate or the vicinity thereof does not agglomerate. By irradiating it with a laser, a thermal decomposition reaction occurs, and generation and deposition of a high-purity metal compound are repeated, so that a thick film can be easily formed. In a widely used chemical vapor deposition method (CVD), physical vapor deposition method (PVD) or the like as a conventional manufacturing method, for example, a reduced pressure condition of 0.01 atm or less has been preferable. A thick film made of a metal compound can be produced under atmospheric pressure or a reduced pressure condition close thereto. In addition, a metal compound film having a large area can be manufactured by improving a charging mist supply method, a laser irradiation method, and the like. According to the present invention, for example, when forming a metal oxide film, not only an oxide containing only one kind of metal element but also a composite oxide containing a plurality of kinds can be used in a wide range of fields. is there.
When the raw material solution is electrostatically sprayed so that the charged mist and the substrate have opposite charges, the charged mist can be reliably supplied to the surface of the substrate, and the generated metal compound is Since it becomes easy to grow grains in a regular direction (perpendicular direction or the like) with respect to the surface of the substrate, a thick film can be obtained efficiently.
Further, when the substrate is preheated, it is suitable for forming a film made of a crystalline metal compound.
以下、本発明を詳細に説明する。
本発明の膜形成方法は、酸素元素、窒素元素、炭素元素及び硫黄元素から選ばれた少なくとも1種を含む分子からなるガス(以下、「反応性ガス」という)を含む雰囲気の中で、金属元素を含む、酸化物、窒化物、炭化物、硫化物又はこれらの複合化合物からなる膜(金属化合物膜)を基材の表面に形成する方法であって、金属元素に由来する成分(M)、即ち、前駆体、が溶解された原料溶液を用いて、正負いずれかに帯電したミストを発生させ、この帯電ミストを、基材に対して連続的に供給し、基材の表面又はその近傍に滞留する帯電ミストに、500nm〜11μmの波長のレーザーを照射することを特徴とする。
Hereinafter, the present invention will be described in detail.
The film forming method of the present invention comprises a metal in an atmosphere containing a gas (hereinafter referred to as “reactive gas”) composed of molecules containing at least one selected from oxygen, nitrogen, carbon and sulfur. A method of forming a film (metal compound film) made of an oxide, nitride, carbide, sulfide or a composite compound thereof containing an element on the surface of a substrate, the component derived from the metal element (M), That is, using a raw material solution in which a precursor is dissolved, mist that is charged either positively or negatively is generated, and this charged mist is continuously supplied to the base material, on the surface of the base material or in the vicinity thereof. The staying charged mist is irradiated with a laser having a wavelength of 500 nm to 11 μm.
上記金属元素は、金属化合物(複合酸化物、酸窒化物、炭窒化物等の複合物を含む)を生成可能なものであり、且つ、金属元素を含む化合物又は単体金属(これらは、「金属元素に由来する成分(M)」に相当する)が、水、酸、アルカリ若しくは有機溶剤に溶解可能なものであれば、特に限定されない。好ましい金属元素は、1族〜16族の元素であり、特に好ましい金属元素は、Al、Ti、Sn、In、Zn,Co、Ni、Fe、Y、Zr、Li、Cr、Hf、La、Ba、Cu等である。 The metal element is capable of generating a metal compound (including composites such as composite oxides, oxynitrides, and carbonitrides), and is a compound or a single metal containing metal elements (these are “metal” The element (corresponding to the component (M) derived from the element) is not particularly limited as long as it is soluble in water, an acid, an alkali, or an organic solvent. Preferred metal elements are elements of Groups 1 to 16, and particularly preferred metal elements are Al, Ti, Sn, In, Zn, Co, Ni, Fe, Y, Zr, Li, Cr, Hf, La, Ba , Cu and the like.
原料溶液は、金属元素に由来する成分(M)が、水(酸性水溶液及び塩基性水溶液を含む)又は有機溶剤からなる媒体に溶解されたものである。
上記成分(M)が金属元素を含む化合物である場合、有機化合物及び無機化合物のいずれでもよく、有機金属錯体、有機酸金属塩、金属アルコキシド、金属元素を含むハロゲン化物、硝酸塩、硫酸塩、リン酸塩、炭酸塩、水酸化物等を用いることができる。これらは、単独で用いてよいし、2種以上を組み合わせて用いてもよい。
In the raw material solution, the component (M) derived from the metal element is dissolved in a medium composed of water (including an acidic aqueous solution and a basic aqueous solution) or an organic solvent.
When the component (M) is a compound containing a metal element, any of an organic compound and an inorganic compound may be used, and an organic metal complex, an organic acid metal salt, a metal alkoxide, a halide containing a metal element, nitrate, sulfate, phosphorus Acid salts, carbonates, hydroxides and the like can be used. These may be used alone or in combination of two or more.
有機金属錯体としては、アセチルアセトン(=2,4−ペンタンジオン)、2,4−ヘキサンジオン、3,5−ヘプタンジオン、2,4−ヘプタンジオン、2−メチルヘキサン−3,5−ジオン、2,4−オクタンジオン、3,5−オクタンジオン、6−メチルヘプタン−2,4−ジオン、5−メチルヘプタン−2,4−ジオン、2,2−ジメチルヘキサン−3,5−ジオン、2,6−ジメチルヘプタン−3,5−ジオン、4,6−ノナンジオン、2,8−ジメチルノナン−4,6−ジオン、2,2,6,6−テトラメチルヘプタン−3,5−ジオン、1−フェニル−1,3−ブタンジオン、1,3−ジフェニル−1,3−プロパンジオン、アセト酢酸メチル、アセト酢酸エチル、アセト酢酸イソプロピル、アセト酢酸tert−ブチル、プロピオニル酢酸メチル、プロピオニル酢酸エチル、プロピオニル酢酸イソプロピル、プロピオニル酢酸tert−ブチル、エチレンジアミン四酢酸、1,2−シクロヘキサンジアミン四酢酸、ジヒドロキシエチルグリシン、ジアミノプロパノール四酢酸、ジエチレントリアミン五酢酸、エチレンジアミン二酢酸、エチレンジアミン二プロピオン酸、ヒドロキシエチレンジアミン三酢酸、グリコールエーテルジアミン四酢酸、ヘキサメチレンジアミン四酢酸、エチレンジアミンジ(o−ヒドロキシフェニル)酢酸、ヒドロキシエチルイミノ二酢酸、イミノ二酢酸、1,3−ジアミノプロパン四酢酸、1,2−ジアミノプロパン四酢酸、ニトリロ三酢酸、ニトリロ三プロピオン酸、トリエチレンテトラミン六酢酸、エチレンジアミン二こはく酸、1,3−ジアミノプロパン二こはく酸、グルタミン酸−N,N−二酢酸、アスパラギン酸−N,N−二酢酸等のキレート形成剤を用いて得られた錯体を用いることができる。 Examples of organometallic complexes include acetylacetone (= 2,4-pentanedione), 2,4-hexanedione, 3,5-heptanedione, 2,4-heptanedione, 2-methylhexane-3,5-dione, 2 , 4-octanedione, 3,5-octanedione, 6-methylheptane-2,4-dione, 5-methylheptane-2,4-dione, 2,2-dimethylhexane-3,5-dione, 2, 6-dimethylheptane-3,5-dione, 4,6-nonanedione, 2,8-dimethylnonane-4,6-dione, 2,2,6,6-tetramethylheptane-3,5-dione, 1- Phenyl-1,3-butanedione, 1,3-diphenyl-1,3-propanedione, methyl acetoacetate, ethyl acetoacetate, isopropyl acetoacetate, tert-butyl acetoacetate, Methyl pionyl acetate, ethyl propionyl acetate, isopropyl propionyl acetate, tert-butyl propionyl acetate, ethylenediaminetetraacetic acid, 1,2-cyclohexanediaminetetraacetic acid, dihydroxyethylglycine, diaminopropanoltetraacetic acid, diethylenetriaminepentaacetic acid, ethylenediaminediacetic acid, ethylenediamine Propionic acid, hydroxyethylenediaminetriacetic acid, glycol etherdiaminetetraacetic acid, hexamethylenediaminetetraacetic acid, ethylenediaminedi (o-hydroxyphenyl) acetic acid, hydroxyethyliminodiacetic acid, iminodiacetic acid, 1,3-diaminopropanetetraacetic acid, 1 , 2-diaminopropanetetraacetic acid, nitrilotriacetic acid, nitrilotripropionic acid, triethylenetetramine hexaacetic acid, ethylenediamine disuccinic acid, , 3-diaminopropane disuccinic acid, glutamic acid -N, N- diacetic acid, aspartic acid -N, can be used complex obtained with chelating agents such as N- diacetic acid.
有機酸金属塩としては、脂肪族カルボン酸、脂環式カルボン酸、芳香族カルボン酸等の金属塩である。尚、各カルボン酸においては、構造中の炭素原子に結合する水素原子の一部が、ハロゲン原子、ヒドロキシル基、アミノ基、アルキルエーテル基等により置換されていてもよい。
金属アルコキシドとしては、脂肪族炭化水素基、脂環式炭化水素基又は芳香族炭化水素基を含む化合物を用いることができる。
金属元素を含むハロゲン化物としては、フッ化物、塩化物、臭化物、ヨウ化物等を用いることができる。
本発明において、上記成分(M)は、安定な原料溶液を与えることができ、レーザーにより熱分解しやすいことから、有機金属錯体、金属アルコキシド、金属元素を含むハロゲン化物等が、特に好ましい。
Examples of the organic acid metal salt include metal salts such as aliphatic carboxylic acid, alicyclic carboxylic acid, and aromatic carboxylic acid. In each carboxylic acid, a part of hydrogen atoms bonded to carbon atoms in the structure may be substituted with a halogen atom, a hydroxyl group, an amino group, an alkyl ether group or the like.
As the metal alkoxide, a compound containing an aliphatic hydrocarbon group, an alicyclic hydrocarbon group, or an aromatic hydrocarbon group can be used.
As the halide containing a metal element, fluoride, chloride, bromide, iodide, or the like can be used.
In the present invention, since the component (M) can provide a stable raw material solution and is easily thermally decomposed by a laser, an organometallic complex, a metal alkoxide, a halide containing a metal element, and the like are particularly preferable.
Al元素を含む有機金属錯体としては、アルミニウムトリス(アセチルアセトネート)、アルミニウムトリス(エチルアセトアセテート)、アルミニウムモノアセチルアセトネートビス(エチルアセトアセテート)、アルミニウムモノアセチルアセトネートビス(オレイルアセトアセテート)、ジイソプロポキシアルミニウムエチルアセトアセテート、アルミニウムブトキシビスエチルアセトアセテート、アルミニウムビスエチルアセトアセテートモノアセチルアセトネート、トリス(ジピバロイルメタナト)アルミニウム、1,1,1−トリメチル−2,4−ペンタジオナトアルミニウム、ジイソプロポキシ−ジピバロイルメタナトアルミニウム、ジアセトキシ−ジピバロイルメタナトアルミニウム、トリス(ベンゾイルトリメチルアセチルアセトナト)アルミニウム、ジ−o−トリルオキシ−ジピバロイルメタナトアルミニウム、ジ(アセチルアセトナト)ピバロイルメタナトアルミニウム、トリス(ブタノイルピバロイルメタナト)アルミニウム等が挙げられる。
Ti元素を含む有機金属錯体としては、チタンテトラアセチルアセトネート、チタンテトラ−2−エチルヘキソキシド、ジブトキシチタンビスアセチルアセトナート等が挙げられる。
Zr元素を含む有機金属錯体としては、ジ−n−プロポキシ・ビス(アセチルアセトナート)ジルコニウム、ジ−イソプロポキシ・ビス(アセチルアセトナート)ジルコニウム、ジ−n−ブトキシ・ビス(アセチルアセトナート)ジルコニウム、ジ−tert−ブトキシ・ビス(アセチルアセトナート)ジルコニウム、モノ−n−プロポキシ・トリス(アセチルアセトナート)ジルコニウム、モノ−イソプロポキシ・トリス(アセチルアセトナート)ジルコニウム、モノ−n−ブトキシ・トリス(アセチルアセトナート)ジルコニウム、モノ−tert−ブトキシ・トリス(アセチルアセトナート)ジルコニウム、ジルコニウムテトラアセチルアセトナート、ジ−n−プロポキシ・ビス(エチルアセトアセテート)ジルコニウム、ジ−イソプロポキシ・ビス(エチルアセトアセテート)ジルコニウム、ジ−n−ブトキシ・ビス(エチルアセトアセテート)ジルコニウム、ジ−tert−ブトキシ・ビス(エチルアセトアセテート)ジルコニウム、モノ−n−プロポキシ・トリス(エチルアセトアセテート)ジルコニウム、モノ−イソプロポキシ・トリス(エチルアセトアセテート)ジルコニウム、モノ−n−ブトキシ・トリス(エチルアセトアセテート)ジルコニウム、モノ−tert−ブトキシ・トリス(エチルアセトアセテート)ジルコニウム、ジルコニウムテトラエチルアセトアセテート、モノ(アセチルアセトナート)トリス(エチルアセトアセテート)ジルコニウム、ビス(アセチルアセトナート)ビス(エチルアセトアセテート)ジルコニウム、トリス(アセチルアセトナート)モノ(エチルアセトアセテート)ジルコニウム等が挙げられる。
Examples of organometallic complexes containing Al element include aluminum tris (acetylacetonate), aluminum tris (ethylacetoacetate), aluminum monoacetylacetonate bis (ethylacetoacetate), aluminum monoacetylacetonate bis (oleyl acetoacetate), Diisopropoxyaluminum ethyl acetoacetate, aluminum butoxybisethyl acetoacetate, aluminum bisethyl acetoacetate monoacetylacetonate, tris (dipivaloylmethanato) aluminum, 1,1,1-trimethyl-2,4-pentadionato Aluminum, diisopropoxy-dipivaloylmethanatoaluminum, diacetoxy-dipivaloylmethanatoaluminum, tris (benzoyltrimethylacetyl) Asetonato) aluminum, di -o- tolyloxy - dipivaloylmethanate aluminum, di (acetylacetonato) pivaloyl meth isocyanatomethyl aluminum, tris (butanoyl pivaloyl meth isocyanatomethyl) aluminum and the like.
Examples of the organometallic complex containing Ti element include titanium tetraacetylacetonate, titanium tetra-2-ethylhexoxide, dibutoxytitanium bisacetylacetonate, and the like.
Examples of organometallic complexes containing Zr element include di-n-propoxy bis (acetylacetonato) zirconium, di-isopropoxy bis (acetylacetonato) zirconium, di-n-butoxy bis (acetylacetonato) zirconium. Di-tert-butoxy bis (acetylacetonate) zirconium, mono-n-propoxy tris (acetylacetonate) zirconium, mono-isopropoxy tris (acetylacetonate) zirconium, mono-n-butoxy tris ( Acetylacetonato) zirconium, mono-tert-butoxy-tris (acetylacetonato) zirconium, zirconium tetraacetylacetonate, di-n-propoxybis (ethylacetoacetate) zirconium, di-isop Poxy bis (ethyl acetoacetate) zirconium, di-n-butoxy bis (ethyl acetoacetate) zirconium, di-tert-butoxy bis (ethyl acetoacetate) zirconium, mono-n-propoxy tris (ethyl acetoacetate) Zirconium, mono-isopropoxy tris (ethyl acetoacetate) zirconium, mono-n-butoxy tris (ethyl acetoacetate) zirconium, mono-tert-butoxy tris (ethyl acetoacetate) zirconium, zirconium tetraethyl acetoacetate, mono ( Acetylacetonato) tris (ethylacetoacetate) zirconium, bis (acetylacetonato) bis (ethylacetoacetate) zirconium, tris (acetylacetate) Inert) mono (ethyl acetoacetate) zirconium, and the like.
また、成分(M)を溶解する媒体は、上記のように、水又は有機溶剤とすることができるが、平衡蒸気圧の観点から、有機溶剤が好ましい。尚、有機溶剤としては、25℃で液体のものが好ましく、アルコール、ケトン、エステル、エーテル、炭化水素等を用いることができる。 The medium for dissolving the component (M) can be water or an organic solvent as described above, but an organic solvent is preferable from the viewpoint of equilibrium vapor pressure. The organic solvent is preferably liquid at 25 ° C., and alcohol, ketone, ester, ether, hydrocarbon and the like can be used.
原料溶液に含まれる上記成分(M)の濃度は、帯電ミストの形成性及びその形状保持性等の観点から、好ましくは0.1〜80質量%、より好ましくは1〜50質量%、更に好ましくは5〜40質量%である。 The concentration of the component (M) contained in the raw material solution is preferably from 0.1 to 80% by mass, more preferably from 1 to 50% by mass, and still more preferably from the viewpoints of charge mist formability and shape retention. Is 5-40 mass%.
本発明において、金属化合物膜は、反応性ガスを含む雰囲気の中で、上記原料溶液を用いて形成された、正負いずれかの電荷を有する帯電ミストにレーザーを照射することにより得られる。反応性ガスは、レーザーが帯電ミストに照射された際に、成分(M)又はその分解生成物(レーザー照射直後の生成物)と反応して、酸化物、窒化物、炭化物又は硫化物を形成するものであれば、特に限定されない。酸化物の場合、酸素ガス、オゾンガス、又は、これらを含む空気等を用いることができる。窒化物の場合、窒素ガス、アンモニアガス等を用いることができる。酸窒化物の場合、NOガス、NO2ガス、N2Oガス等を用いることができる。炭窒化物の場合、CNガス、メタン−アンモニア混合ガス、CO−アンモニア混合ガス、CO2−アンモニア混合ガス等を用いることができる。炭化物の場合、メタンガス、COガス、CO2ガス等を用いることができる。硫化物の場合、HSガス、SOガス、SO2ガス、SO3ガス等を用いることができる。尚、反応性ガスの濃度調整等のために、アルゴンガス、ヘリウムガス等の不活性ガスを併用することができる。 In the present invention, the metal compound film is obtained by irradiating a charged mist having a positive or negative charge formed using the raw material solution in an atmosphere containing a reactive gas with a laser. Reactive gas reacts with component (M) or its decomposition product (product immediately after laser irradiation) when laser irradiates charged mist to form oxide, nitride, carbide or sulfide. If it does, it will not specifically limit. In the case of an oxide, oxygen gas, ozone gas, air containing these, or the like can be used. In the case of nitride, nitrogen gas, ammonia gas or the like can be used. In the case of oxynitride, NO gas, NO 2 gas, N 2 O gas, or the like can be used. In the case of carbonitride, CN gas, methane-ammonia mixed gas, CO-ammonia mixed gas, CO 2 -ammonia mixed gas, or the like can be used. In the case of carbide, methane gas, CO gas, CO 2 gas, or the like can be used. In the case of sulfide, HS gas, SO gas, SO 2 gas, SO 3 gas, or the like can be used. An inert gas such as argon gas or helium gas can be used in combination for adjusting the concentration of the reactive gas.
反応性ガスを含む雰囲気において、互いに同じ電荷を有する複数の帯電ミストは、反発し合うものの、ほぼ等間隔を保ちながら基材に供給される。基材の表面又はその近傍に滞留する帯電ミストに、レーザーが照射されると、金属化合物が規則的に粒成長した膜が形成される。
帯電ミストの調製方法は、特に限定されないが、例えば、原料溶液を静電噴霧する方法、イオナイザー等により発生させた正負いずれかのイオンを含む雰囲気の中に、原料溶液を噴霧する方法、及び、原料溶液を超音波噴霧する方法が挙げられる。これらのうち、単純な構成で帯電ミストを発生させることができることから、前者の方法が好ましい。尚、上記いずれの方法で調製された帯電ミストであっても、帯電ミストを基材に供給する場合には、自然落下を利用することが簡便である。しかしながら、帯電ミストを調製する際において、帯電ミストと基材とが互いに反対の電荷を有するように、原料溶液を静電噴霧すると、自然落下以外の方法でも帯電ミストを基材の表面に供給することができ、歩留まりを向上させることができる。
In an atmosphere containing a reactive gas, a plurality of charged mists having the same charge as each other repel each other, but are supplied to the substrate while maintaining substantially equal intervals. When the charged mist staying at or near the surface of the substrate is irradiated with a laser, a film in which the metal compound regularly grows is formed.
The method for preparing the charged mist is not particularly limited.For example, a method of electrostatically spraying the raw material solution, a method of spraying the raw material solution in an atmosphere containing either positive or negative ions generated by an ionizer, and the like, and The method of ultrasonically spraying a raw material solution is mentioned. Of these, the former method is preferable because the charging mist can be generated with a simple configuration. In addition, even if it is the charging mist prepared by any of the above methods, when supplying the charging mist to the substrate, it is easy to use natural fall. However, when preparing the charged mist, when the raw material solution is electrostatically sprayed so that the charged mist and the substrate have opposite charges, the charged mist is supplied to the surface of the substrate by a method other than natural dropping. And the yield can be improved.
原料溶液を静電噴霧し、帯電ミストを発生させる方法は、特に限定されないが、従来、公知の静電噴霧装置又はその原理を利用することができる。
図1は、チャンバー11の内部において、スプレーノズル17から静電噴霧することにより得られた帯電ミスト18を、スプレーノズル17の下方に載置した基材20の表面に供給して、基材20の表面又はその近傍に滞留する帯電ミスト18に、レーザー照射手段13からレーザーを照射することにより、金属化合物膜を形成する膜形成装置の一例である。原料溶液供給手段16から配管を介して送液された原料溶液を噴霧するスプレーノズル17と、基材20との間に電圧を印加しておくことにより、スプレーノズル17から噴霧される液滴に、正負いずれかの電荷を与え、帯電ミスト18を発生させることができる。スプレーノズル17等に電圧を印加すると、スプレーノズル17から噴霧される原料溶液にクーロン力が働いて、液面が局所的に錐状に盛り上がり、テイラーコーンが形成される。このようにテイラーコーンが形成されると、テイラーコーンの先端に電荷が集中してこの部分における電界強度が大きくなる。そして、この部分に生じるクーロン力が大きくなり、更にテイラーコーンを成長させる。このように、テイラーコーンが成長し、テイラーコーンの先端に電荷が集中して電荷の密度が高くなると、テイラーコーンの先端部分の原料溶液が大きなエネルギー(高密度となった電荷の反発力)を受け、表面張力を超えて、分裂・飛散(レイリー分裂)し放電することで微小サイズの帯電ミスト18が発生する。
原料溶液を帯電させる電圧は、安定なシングルコーンが形成され、形状及び大きさが一定の帯電ミストが形成され、更には、金属化合物膜の厚さの均一性が向上することから、好ましくは+2kV〜+8kV又は−8kV〜−2kV、より好ましくは+3kV〜+6kV又は−6kV〜−3kVである。
A method for electrostatically spraying the raw material solution to generate the charged mist is not particularly limited, but a conventionally known electrostatic spraying device or its principle can be used.
In FIG. 1, inside a chamber 11, a charged mist 18 obtained by electrostatic spraying from a spray nozzle 17 is supplied to the surface of a substrate 20 placed below the spray nozzle 17, and the substrate 20 This is an example of a film forming apparatus for forming a metal compound film by irradiating the charged mist 18 staying at or near the surface of the metal mist 18 with laser from the laser irradiation means 13. By applying a voltage between the spray nozzle 17 for spraying the raw material solution fed from the raw material solution supply means 16 through the pipe and the base material 20, droplets sprayed from the spray nozzle 17 are applied. The charge mist 18 can be generated by applying a positive or negative charge. When a voltage is applied to the spray nozzle 17 or the like, a Coulomb force is applied to the raw material solution sprayed from the spray nozzle 17, and the liquid surface locally rises in a cone shape to form a Taylor cone. When the Taylor cone is formed in this way, electric charges concentrate on the tip of the Taylor cone and the electric field strength in this portion increases. And the Coulomb force which arises in this part becomes large, and also Taylor corn is made to grow. In this way, when the Taylor cone grows and the charge concentrates on the tip of the Taylor cone and the density of the charge increases, the raw material solution at the tip of the Taylor cone gives a large amount of energy (the repulsive force of the high-density charge). Upon receipt, the surface tension is exceeded, splitting and scattering (Rayleigh splitting) and discharging are generated, thereby generating a charged mist 18 having a small size.
The voltage for charging the raw material solution is preferably +2 kV because a stable single cone is formed, a charged mist having a uniform shape and size is formed, and the thickness uniformity of the metal compound film is improved. ~ + 8 kV or -8 kV to -2 kV, more preferably +3 kV to +6 kV or -6 kV to -3 kV.
上記のように、スプレーノズル17と基材20との間に電圧を印加しながら原料溶液を静電噴霧することにより発生した帯電ミスト18と、基材20とが互いに反対の電荷を有するので、図1におけるスプレーノズル17及び基材20の位置関係が、例えば、水平方向又は上下方向であっても、帯電ミスト18が、確実に基材20の表面に供給される。本発明では、基材20の表面における特定の位置に帯電ミスト18を配置することにより、その位置において金属化合物膜を形成することができるので、基材20の特定の位置にのみ電圧を印加すればよい。尚、基材20が大型であったり、スプレーノズル17と、基材20との距離が長かったりする場合には、帯電ミスト18の供給速度、更には、製膜速度を向上させるために、例えば、キャリアーガス等を利用することができる。 As described above, since the charged mist 18 generated by electrostatic spraying of the raw material solution while applying a voltage between the spray nozzle 17 and the substrate 20 and the substrate 20 have opposite charges, Even if the positional relationship between the spray nozzle 17 and the substrate 20 in FIG. 1 is, for example, the horizontal direction or the vertical direction, the charged mist 18 is reliably supplied to the surface of the substrate 20. In the present invention, by arranging the charging mist 18 at a specific position on the surface of the base material 20, the metal compound film can be formed at that position, so that a voltage can be applied only to a specific position of the base material 20. That's fine. In addition, when the base material 20 is large or the distance between the spray nozzle 17 and the base material 20 is long, in order to improve the supply speed of the charging mist 18 and further the film forming speed, for example, A carrier gas or the like can be used.
帯電ミストを発生させるための原料溶液の供給速度は、安定なシングルコーンが形成され、形状及び大きさが一定の帯電ミストが形成されることから、好ましくは0.01〜10ml/分、より好ましくは0.02〜5ml/分、更に好ましくは0.1〜3ml/分である。尚、スプレーノズル17と、基材20との距離は、特に限定されないが、好ましくは1〜50cm、より好ましくは10〜30cmである。 The feed rate of the raw material solution for generating the charged mist is preferably 0.01 to 10 ml / min, more preferably a stable single cone is formed and a charged mist having a constant shape and size is formed. Is 0.02 to 5 ml / min, more preferably 0.1 to 3 ml / min. The distance between the spray nozzle 17 and the substrate 20 is not particularly limited, but is preferably 1 to 50 cm, more preferably 10 to 30 cm.
基材の構成材料は、特に限定されないが、少なくとも、金属化合物膜が形成される位置の構成材料は、レーザーの受光により、基材の形状、性状等が変化しないものであることが好ましい。例えば、金属、合金、セラミックス等が特に好ましい。従って、複数の材料からなる基材等の場合、上記構成材料からなる特定の位置に金属化合物膜を形成することが好ましい。
基材の形状もまた、特に限定されず、平板状、曲板状、棒状、筒状、塊状、又は、これらの組み合わせであってもよい。
The constituent material of the base material is not particularly limited, but at least the constituent material at the position where the metal compound film is formed is preferably such that the shape, properties, etc. of the base material are not changed by receiving the laser beam. For example, metals, alloys, ceramics and the like are particularly preferable. Therefore, in the case of a base material made of a plurality of materials, it is preferable to form a metal compound film at a specific position made of the above constituent materials.
The shape of the substrate is also not particularly limited, and may be a flat plate shape, a curved plate shape, a rod shape, a cylindrical shape, a lump shape, or a combination thereof.
帯電ミストを基材に供給する場合には、レーザーによる反応を円滑に進めて金属化合物の生成速度を向上させたり、生成する金属化合物の結晶性等を調整したりするために、基材を予熱しておいてもよい。予熱温度は、生成する金属化合物の種類等により、適宜、選択されるが、通常、500℃〜1000℃である。
基材の予熱方法は、特に限定されず、赤外線ランプ、ハロゲンランプ、抵抗加熱、高周波誘導加熱、マイクロ波加熱等を利用することができる。
When charging mist is supplied to the substrate, the substrate is preheated in order to improve the production rate of the metal compound by adjusting the laser reaction smoothly and to adjust the crystallinity of the metal compound to be generated. You may keep it. The preheating temperature is appropriately selected depending on the kind of the metal compound to be generated and the like, but is usually 500 ° C to 1000 ° C.
The method for preheating the substrate is not particularly limited, and infrared lamps, halogen lamps, resistance heating, high frequency induction heating, microwave heating, and the like can be used.
本発明において、帯電ミストへのレーザー照射は、金属化合物の生成及び成膜を円滑に進めるために、500nm〜11μmの波長のレーザーを用いる。例えば、Nd−YAGレーザー、Nd−YVOレーザー、Nd−YLFレーザー、チタンサファイアレーザー、炭酸ガスレーザー等を用いることができる。
レーザーを照射する場合、基材を固定した状態でレーザーをスキャンさせながら若しくは光拡散レンズを介して照射する方法、又は、基材を移動させながら、光路を固定したレーザーを照射する方法とすることができる。
In the present invention, laser irradiation of the charged mist uses a laser having a wavelength of 500 nm to 11 μm in order to smoothly generate a metal compound and to form a film. For example, an Nd-YAG laser, an Nd-YVO laser, an Nd-YLF laser, a titanium sapphire laser, a carbon dioxide gas laser, or the like can be used.
When irradiating a laser, a method of irradiating a laser while scanning the laser or through a light diffusing lens with the substrate fixed, or a method of irradiating a laser with a fixed optical path while moving the substrate Can do.
レーザーの照射条件は、帯電ミストの組成(成分(M)又は溶媒の種類)、基材の構成材料、基材の予熱温度等により、適宜、選択される。レーザー出力は、金属化合物の円滑な生成及び粒成長性の観点から、好ましくは40〜200W/cm2、より好ましくは50〜150W/cm2である。
レーザーの照射に際して、図1におけるチャンバー11の内部の圧力は、特に限定されず、好ましくは0.4〜3.0気圧、より好ましくは0.6〜2.0気圧とすることができる。本発明では、従来の製造方法として、広く適用されている化学的蒸着法(CVD)、物理的蒸着法(PVD)等で利用される減圧条件を必要としないことが特徴である。
また、チャンバー11の内部は、反応性ガスを含む雰囲気である。チャンバー11の内部は、密閉系及び開放系のいずれでもよい。尚、チャンバー11の内部は、供給された帯電ミストの形状が基材の表面に到達するまで保持される限りにおいて、加熱されていてもよい。
The laser irradiation conditions are appropriately selected depending on the composition of the charged mist (component (M) or type of solvent), the constituent material of the base material, the preheating temperature of the base material, and the like. Laser power, in terms of smooth generation and grain growth of the metal compound, preferably 40~200W / cm 2, more preferably a 50~150W / cm 2.
In the laser irradiation, the pressure inside the chamber 11 in FIG. 1 is not particularly limited, and can be preferably 0.4 to 3.0 atm, more preferably 0.6 to 2.0 atm. The present invention is characterized in that it does not require a reduced pressure condition used in a chemical vapor deposition method (CVD), a physical vapor deposition method (PVD) or the like that is widely applied as a conventional manufacturing method.
The interior of the chamber 11 is an atmosphere containing a reactive gas. The inside of the chamber 11 may be either a closed system or an open system. The interior of the chamber 11 may be heated as long as the supplied charged mist is held until the shape of the charged mist reaches the surface of the substrate.
本発明によれば、金属化合物膜の製膜速度を、好ましくは10〜3000μm/時、より好ましくは50〜1000μm/時とすることができ、効率よく厚膜を形成することができる。 According to the present invention, the deposition rate of the metal compound film can be preferably 10 to 3000 μm / hour, more preferably 50 to 1000 μm / hour, and a thick film can be efficiently formed.
本発明に係る膜形成装置の一例を、図1に示したが、帯電ミストの組成(成分(M)又は溶媒の種類)、基材の形状及び大きさ等に応じて、適宜、構成を変更することができる。
例えば、図1において、帯電ミストを発生させるスプレーノズル17の数、レーザー照射手段13の数を、それぞれ、1としたが、複数とすることができる。
また、帯電ミストに含まれる溶媒が有機溶剤を含む場合には、帯電ミストへのレーザー照射による金属化合物の生成と同時に、有機溶剤が気化するので、揮発ガスをチャンバー11の外部に排出するための排気ポンプ29をチャンバー11に接続しておくことが好ましい(図2参照)。
An example of the film forming apparatus according to the present invention is shown in FIG. 1, but the configuration is appropriately changed according to the composition (component (M) or type of solvent) of the charging mist, the shape and size of the substrate, and the like. can do.
For example, in FIG. 1, the number of spray nozzles 17 that generate charging mist and the number of laser irradiation means 13 are each set to 1, but may be a plurality.
In addition, when the solvent contained in the charged mist contains an organic solvent, the organic solvent is vaporized simultaneously with the generation of the metal compound by laser irradiation of the charged mist, so that the volatile gas is discharged to the outside of the chamber 11. It is preferable to connect the exhaust pump 29 to the chamber 11 (see FIG. 2).
以下、α−アルミナ膜の製造例を挙げて、本発明を具体的に説明する。 Hereinafter, the present invention will be specifically described with reference to production examples of an α-alumina film.
1.製造原料
帯電ミスト形成用の原料溶液として、アルミニウムトリス(アセチルアセトネート)をアセトンに溶解させた溶液を用いた。アルミニウムトリス(アセチルアセトネート)の濃度は10質量%である。
α−アルミナ膜形成用の基材として、SUS304からなる板(20mm×20mm×1.0mm)を用いた。
1. Production Raw Material A solution in which aluminum tris (acetylacetonate) was dissolved in acetone was used as a raw material solution for forming charged mist. The concentration of aluminum tris (acetylacetonate) is 10% by mass.
A plate (20 mm × 20 mm × 1.0 mm) made of SUS304 was used as the base material for forming the α-alumina film.
2.製造装置
図2に示す膜形成装置10を用いた。この装置10は、チャンバー11の内部において、スプレーノズル17により負帯電のミスト18を連続的に発生させて、予熱された正帯電の基材20に向けて供給し、その後、基材20の表面に対流する帯電ミスト18にレーザーを照射し、α−アルミナからなる膜を形成する装置である。
この膜形成装置10では、原料溶液を収容する原料溶液貯留部15及び原料溶液供給手段16を、チャンバー11の外部に配設し、原料溶液を、この原料溶液供給手段16から、配管(内径0.3mmのステンレス製チューブ)を介して、チャンバー11の内部に配設したスプレーノズル17に供給できるようにした。金属化合物膜を形成させる基材20は、スプレーノズル17の直下に25cmの間隔をおいて基材支持部21の上に載置した。スプレーノズル17には直流電圧を印加する一方、基材20を接地することにより、スプレーノズル17からの液滴を負電荷とし、発生した帯電ミスト18が、正電荷の基材20に向かうようにした。そして、チャンバー11の外部に、石英製入射窓14を介して波長1064nmのレーザーを基材20の表面方向に照射するレーザー照射手段13(Nd−YAGレーザー)を配設した。基材20へのレーザーの入射角は45度である。尚、α−アルミナの生成を促進するために、基材20を予熱(加熱)する手段(赤外線ランプ)23を配設し、更に、基材20の温度を測定するための熱電対25を配設した。また、原料溶液に含まれるアセトンの気化に伴って、揮発したガスがチャンバー11内に充満するのを抑制し、また、膜形成条件(金属化合物の生成条件)を、終始、維持するために、チャンバー11の上方側開口部27からの空気の供給と、その対壁に相当する下方側に接続したダイアフラムポンプ29を用いた排気とにより、チャンバー11の内部の換気を行った。チャンバー11の内部における圧力は0.8気圧であった。
2. Manufacturing apparatus The film forming apparatus 10 shown in FIG. 2 was used. The apparatus 10 continuously generates a negatively charged mist 18 by a spray nozzle 17 inside the chamber 11 and supplies the mist 18 toward a preheated positively charged base material 20, and then the surface of the base material 20. This is a device for forming a film made of α-alumina by irradiating the charged mist 18 convection to the laser with a laser.
In this film forming apparatus 10, a raw material solution storage unit 15 that stores a raw material solution and a raw material solution supply unit 16 are disposed outside the chamber 11, and the raw material solution is supplied from the raw material solution supply unit 16 to a pipe (inner diameter 0). Through a 3 mm stainless steel tube) to the spray nozzle 17 disposed inside the chamber 11. The base material 20 on which the metal compound film is to be formed was placed on the base material support portion 21 with an interval of 25 cm immediately below the spray nozzle 17. While applying a DC voltage to the spray nozzle 17 and grounding the base material 20, the liquid droplets from the spray nozzle 17 are negatively charged, and the generated charged mist 18 is directed toward the positively charged base material 20. did. A laser irradiation means 13 (Nd-YAG laser) that irradiates a laser beam having a wavelength of 1064 nm toward the surface of the substrate 20 through the quartz incident window 14 is disposed outside the chamber 11. The incident angle of the laser to the base material 20 is 45 degrees. In order to promote the production of α-alumina, a means (infrared lamp) 23 for preheating (heating) the base material 20 is provided, and a thermocouple 25 for measuring the temperature of the base material 20 is provided. Set up. Further, in order to suppress the volatilized gas from filling the chamber 11 with the vaporization of acetone contained in the raw material solution, and to maintain the film formation conditions (metal compound generation conditions) from beginning to end, The inside of the chamber 11 was ventilated by supplying air from the upper opening 27 of the chamber 11 and exhausting it using a diaphragm pump 29 connected to the lower side corresponding to the opposite wall. The pressure inside the chamber 11 was 0.8 atm.
3.α−アルミナ膜の製造及び評価
実施例1
原料溶液供給手段16から、4.0Vの直流電圧を印加したスプレーノズル17に、原料溶液(アルミニウムトリアセチルアセトナートのアセトン溶液)を1.0ml/分の速度で供給しながら、静電噴霧し、帯電ミスト18を発生させた。そして、この帯電ミスト18を、予め、赤外線ランプにより750℃に加熱した正電荷の基材20の表面に連続的に供給した。そして、レーザー照射手段13を駆動(出力:60W/cm2)して、レーザーを、滞留する帯電ミスト18に照射し続け、α−アルミナの生成及び堆積を繰り返し、基材20の表面全体にα−アルミナからなる膜を形成させた。製膜速度は83μm/時であった。
得られたα−アルミナ膜のSEM画像及びX線回折像を、それぞれ、図3及び図4に示す。図3より、緻密な膜が形成されたことが分かる。
3. Example 1 Production and Evaluation of α-Alumina Membrane
While supplying the raw material solution (acetone solution of aluminum triacetylacetonate) from the raw material solution supplying means 16 to the spray nozzle 17 to which a DC voltage of 4.0 V is applied, electrostatic spraying is performed. The charging mist 18 was generated. Then, the charged mist 18 was continuously supplied to the surface of the positively charged substrate 20 previously heated to 750 ° C. by an infrared lamp. Then, the laser irradiation means 13 is driven (output: 60 W / cm 2 ), and the laser continues to irradiate the staying charged mist 18 to repeat the generation and deposition of α-alumina. A film made of alumina was formed. The film forming speed was 83 μm / hour.
The SEM image and X-ray diffraction image of the obtained α-alumina film are shown in FIGS. 3 and 4, respectively. FIG. 3 shows that a dense film has been formed.
実施例2
レーザーの照射条件として、出力を90W/cm2とした以外は、実施例1と同様の操作を行い、基材20の表面全体にα−アルミナからなる膜を形成させた。製膜速度は103μm/時であった。
Example 2
Except that the output was 90 W / cm 2 as the laser irradiation condition, the same operation as in Example 1 was performed, and a film made of α-alumina was formed on the entire surface of the substrate 20. The film forming speed was 103 μm / hour.
比較例1
原料溶液(アルミニウムトリアセチルアセトナートのアセトン溶液)を、予熱していない基材20の表面に塗布し、得られた塗膜に対して、レーザーを照射(照射密度:60W/cm2)したところ、塗膜が完全に消失し、膜は生成しなかった。
Comparative Example 1
A raw material solution (acetone solution of aluminum triacetylacetonate) is applied to the surface of the substrate 20 which has not been preheated, and the obtained coating film is irradiated with laser (irradiation density: 60 W / cm 2 ). The coating film completely disappeared and no film was formed.
本発明は、好ましくは、耐熱性基材の表面に、金属化合物からなる膜を形成する方法であり、積層材料が得られることから、保護(耐酸化、遮熱、耐摩耗等)、反射、絶縁等の作用を有する機能性材料又は機能性物品の製造に好適である。 The present invention is preferably a method of forming a film made of a metal compound on the surface of a heat-resistant substrate, and since a laminated material is obtained, protection (oxidation resistance, heat shielding, wear resistance, etc.), reflection, It is suitable for the production of functional materials or functional articles having an action such as insulation.
10:膜形成装置、11:チャンバー、13:レーザー照射手段、14:光学窓(石英製入射窓)、15:原料溶液貯留部、16:原料溶液供給手段、17:スプレーノズル、18:帯電ミスト、20:基材、21:基材支持部、23:予熱手段(赤外線ランプ)、25:基材温度測定手段(熱電対)、29:排気ポンプ。 DESCRIPTION OF SYMBOLS 10: Film | membrane formation apparatus, 11: Chamber, 13: Laser irradiation means, 14: Optical window (quartz incident window), 15: Raw material solution storage part, 16: Raw material solution supply means, 17: Spray nozzle, 18: Charging mist 20: base material, 21: base material support part, 23: preheating means (infrared lamp), 25: base material temperature measuring means (thermocouple), 29: exhaust pump.
Claims (5)
酸素元素、窒素元素、炭素元素及び硫黄元素から選ばれた少なくとも1種を含む分子からなるガスを含む雰囲気の中で、前記金属元素に由来する成分(M)が溶解された原料溶液を用いて、正負いずれかに帯電したミストを発生させ、該帯電ミストを、前記基材に対して連続的に供給し、前記基材の表面又はその近傍に滞留する前記帯電ミストに、500nm〜11μmの波長のレーザーを照射することを特徴とする膜形成方法。 In a method of forming a film made of an oxide, nitride, carbide or sulfide containing a metal element on the surface of a substrate,
Using a raw material solution in which the component (M) derived from the metal element is dissolved in an atmosphere containing a gas comprising a molecule containing at least one selected from an oxygen element, a nitrogen element, a carbon element, and a sulfur element The mist charged positively or negatively is generated, the charged mist is continuously supplied to the base material, and the charged mist staying at or near the surface of the base material has a wavelength of 500 nm to 11 μm. A film forming method characterized by irradiating a laser beam.
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JPS59213602A (en) * | 1983-05-13 | 1984-12-03 | Kanegafuchi Chem Ind Co Ltd | Composite metallic solution |
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