JP2016046329A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2016046329A5 JP2016046329A5 JP2014167957A JP2014167957A JP2016046329A5 JP 2016046329 A5 JP2016046329 A5 JP 2016046329A5 JP 2014167957 A JP2014167957 A JP 2014167957A JP 2014167957 A JP2014167957 A JP 2014167957A JP 2016046329 A5 JP2016046329 A5 JP 2016046329A5
- Authority
- JP
- Japan
- Prior art keywords
- shot
- layer
- layout
- candidate
- deviation amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 4
- 238000005259 measurement Methods 0.000 claims 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000001459 lithography Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 238000000465 moulding Methods 0.000 claims 1
- 230000003287 optical Effects 0.000 claims 1
Claims (13)
前記第2層のショット領域の配列を示す候補ショットレイアウトを仮定して、前記候補ショットレイアウトで前記第2層を形成する場合における前記第1層の各ショット領域に形成されたパターンと前記第2層に形成されるパターンとの相対的な位置ずれ量を演算する演算部と、
前記演算部で演算された前記位置ずれ量が許容範囲内に収まっている前記候補ショットレイアウトを、前記第2層を形成する際のショットレイアウトとして決定する決定部と、
を有することを特徴とするリソグラフィ装置。 A lithographic apparatus that forms, on a first layer having an array of shot areas of a first shot size, a second layer having an array of shot areas of a second shot size that covers a plurality of shot areas of the first shot size. And
Assuming a candidate shot layout indicating the arrangement of the shot regions of the second layer, the pattern formed in each shot region of the first layer and the second when the second layer is formed with the candidate shot layout A calculation unit that calculates the amount of positional deviation relative to the pattern formed in the layer;
A determination unit that determines the candidate shot layout in which the positional deviation amount calculated by the calculation unit is within an allowable range as a shot layout when forming the second layer;
A lithographic apparatus comprising:
前記決定部は、前記複数の候補ショットレイアウトのうち、前記演算部で演算された前記位置ずれ量が許容範囲内に収まっている前記候補ショットレイアウトの1つを、前記第2層を形成する際のショットレイアウトとして決定することを特徴とする請求項1に記載のリソグラフィ装置。 The arithmetic unit assumes the plurality of candidate shot layouts that can be selected for the first layer shot layout, and forms the second layer in each of the plurality of candidate shot layouts. Calculating the relative displacement between the pattern formed in each shot region and the pattern formed in the second layer,
The determining unit may form one of the candidate shot layouts in which the positional deviation amount calculated by the calculation unit is within an allowable range among the plurality of candidate shot layouts. The lithographic apparatus according to claim 1, wherein the lithographic apparatus is determined as a shot layout.
前記演算部は、前記記憶部に記憶された前記第1ずれ量及び前記第2ずれ量に基づいて、前記位置ずれ量を求めることを特徴とする請求項5に記載のリソグラフィ装置。 The storage unit further stores a first shift amount from the ideal position of the pattern position of the original plate and a second shift amount from the ideal position of the pattern position formed in each shot region of the first layer. And
The lithographic apparatus according to claim 5, wherein the arithmetic unit obtains the positional deviation amount based on the first deviation amount and the second deviation amount stored in the storage unit.
前記演算部は、前記検出部によって検出された前記相対位置に基づいて、前記位置ずれ量を求めることを特徴とする請求項5に記載のリソグラフィ装置。 A detector that detects a relative position between a mark provided in each shot area of the first layer and a mark provided on the original;
The lithographic apparatus according to claim 5, wherein the calculation unit obtains the positional deviation amount based on the relative position detected by the detection unit.
前記第1層の各ショット領域に形成されたパターンの位置の理想位置からのずれ量を計測する計測部と、
を更に有し、
前記演算部は、前記記憶部に記憶された前記ずれ量、及び、前記計測部によって計測された前記ずれ量に基づいて、前記位置ずれ量を求めることを特徴とする請求項5に記載のリソグラフィ装置。 A storage unit for storing a deviation amount from an ideal position of the pattern of the original plate;
A measurement unit that measures a deviation amount from an ideal position of a pattern formed in each shot region of the first layer;
Further comprising
6. The lithography according to claim 5 , wherein the arithmetic unit obtains the positional deviation amount based on the deviation amount stored in the storage unit and the deviation amount measured by the measurement unit. apparatus.
前記工程で前記パターンを形成された前記基板を処理する工程と、
を含むことを特徴とする物品の製造方法。 Forming a pattern on a substrate using the lithographic apparatus according to claim 1;
Processing the substrate on which the pattern has been formed in the step;
A method for producing an article comprising:
前記第2層のショット領域の配列を示す候補ショットレイアウトを仮定して、前記候補ショットレイアウトで前記第2層を形成する場合における前記第1層の各ショット領域に形成されたパターンと前記第2層に形成されるパターンとの相対的な位置ずれ量を演算する演算部と、
前記演算部で演算された前記位置ずれ量が許容範囲内に収まっている前記候補ショットレイアウトを、前記第2層を形成する際のショットレイアウトとして決定する決定部と、
を有することを特徴とする情報処理装置。 A shot in a lithographic apparatus, wherein a second layer having a second shot size array of shot areas covering a plurality of the first shot size shot areas is formed on a first layer having a first shot size shot area array. An information processing apparatus for determining a layout,
Assuming a candidate shot layout indicating the arrangement of the shot regions of the second layer, the pattern formed in each shot region of the first layer and the second when the second layer is formed with the candidate shot layout A calculation unit that calculates the amount of positional deviation relative to the pattern formed in the layer;
A determination unit that determines the candidate shot layout in which the positional deviation amount calculated by the calculation unit is within an allowable range as a shot layout when forming the second layer;
An information processing apparatus comprising:
前記第2層のショット領域の配列を示す候補ショットレイアウトを仮定して、前記候補ショットレイアウトで前記第2層を形成する場合における前記第1層の各ショット領域に形成されたパターンと前記第2層を形成されるパターンとの相対的な位置ずれ量を演算する工程と、
前記工程で演算された前記位置ずれ量が許容範囲内に収まっている前記候補ショットレイアウトを、前記第2層を形成する際のショットレイアウトとして決定する工程と、
を有することを特徴とする決定方法。 A shot layout when forming a second layer having an array of shot areas having a second shot size covering a plurality of shot areas having the first shot size on a first layer having an array of shot areas having a first shot size A determination method for determining
Assuming a candidate shot layout indicating the arrangement of the shot regions of the second layer, the pattern formed in each shot region of the first layer and the second when the second layer is formed with the candidate shot layout A step of calculating a relative misalignment with the pattern in which the layer is formed;
Determining the candidate shot layout in which the positional deviation amount calculated in the step is within an allowable range as a shot layout when forming the second layer;
A determination method characterized by comprising:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014167957A JP6397265B2 (en) | 2014-08-20 | 2014-08-20 | Lithographic apparatus, article manufacturing method, information processing apparatus, and determination method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014167957A JP6397265B2 (en) | 2014-08-20 | 2014-08-20 | Lithographic apparatus, article manufacturing method, information processing apparatus, and determination method |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016046329A JP2016046329A (en) | 2016-04-04 |
JP2016046329A5 true JP2016046329A5 (en) | 2017-09-07 |
JP6397265B2 JP6397265B2 (en) | 2018-09-26 |
Family
ID=55636644
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014167957A Active JP6397265B2 (en) | 2014-08-20 | 2014-08-20 | Lithographic apparatus, article manufacturing method, information processing apparatus, and determination method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP6397265B2 (en) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07211622A (en) * | 1994-01-27 | 1995-08-11 | Nikon Corp | Method and system for exposure |
JP3100842B2 (en) * | 1994-09-05 | 2000-10-23 | キヤノン株式会社 | Semiconductor exposure apparatus and exposure method |
JPH10229039A (en) * | 1997-02-17 | 1998-08-25 | Nikon Corp | Exposure method |
JP2000340493A (en) * | 1999-05-31 | 2000-12-08 | Nikon Corp | Exposure method, exposure system and manufacture of device |
JP2003188071A (en) * | 2001-12-17 | 2003-07-04 | Nikon Corp | Exposure method and device manufacturing method |
JP2004281434A (en) * | 2003-03-12 | 2004-10-07 | Toshiba Corp | Method of drawing up shot map, method for exposure, processor, and method and program for manufacturing semiconductor device |
JPWO2007013140A1 (en) * | 2005-07-26 | 2009-02-05 | 富士通マイクロエレクトロニクス株式会社 | Alignment method |
JP2009026962A (en) * | 2007-07-19 | 2009-02-05 | Canon Inc | Exposure apparatus, information processing apparatus and device manufacturing method |
JP5744590B2 (en) * | 2011-03-28 | 2015-07-08 | キヤノン株式会社 | Imprint method, mold, and manufacturing method of article using them |
-
2014
- 2014-08-20 JP JP2014167957A patent/JP6397265B2/en active Active
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2012253325A5 (en) | ||
JP2013138175A5 (en) | ||
JP2016201423A5 (en) | ||
JP2015532733A5 (en) | ||
JP2013157548A5 (en) | ||
JP2017523927A5 (en) | ||
JP2009002931A5 (en) | ||
JP2011171410A5 (en) | ||
JP2015038985A5 (en) | ||
JP2013213769A5 (en) | ||
JP2015509666A5 (en) | ||
JP2014052492A5 (en) | ||
JP2020503526A5 (en) | ||
JP2015154008A5 (en) | ||
JP2014203935A5 (en) | ||
JP2014033050A (en) | Imprint system and imprint method | |
JP2015056449A5 (en) | Method for determining position, exposure method, exposure apparatus, and article manufacturing method | |
TW201715625A (en) | Diffractive overlay mark | |
JP2012089575A5 (en) | Lithographic apparatus and device manufacturing method | |
JP2015087314A5 (en) | ||
JP2014107331A5 (en) | ||
JP2016046329A5 (en) | ||
JP2015002260A5 (en) | ||
JP2013211488A5 (en) | ||
JP2016090444A5 (en) |