JP2016036364A - Examination device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a device by which an examiner can easily determine an imaging position for ocular fundus.SOLUTION: An ophthalmological device for irradiating an eye to be examined with measurement light and imaging the eye to be examined includes: first imaging means for acquiring a first ocular fundus image by first reflection light received by first light receiving means, which includes first scan means for scanning first illumination light emitted to the eye to be examined, and the first light receiving means for receiving the first reflection light from the eye to be examined of the first illumination light; second scan means for scanning second illumination light emitted to the eye to be examined; second light receiving means for receiving second reflection light from the eye to be examined of the second illumination light; division means for causing part of the first reflection light to enter the second light receiving means; second imaging means for acquiring a second ocular fundus image having a wide imaging field angle and low magnification compared with the first ocular fundus image, by the second reflection light received by the second light receiving means, and the part of the first reflection light; and display means for displaying the second ocular fundus image acquired based on the result of the light receiving by the second light receiving means.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inspection apparatus exemplified by an ophthalmologic apparatus and a control method thereof.

  2. Description of the Related Art A scanning laser opthalmoscope (SLO), which is an ophthalmologic apparatus that uses the principle of a confocal laser microscope, is known. The scanning laser ophthalmoscope is a device that raster-scans the fundus with a laser as measurement light, and obtains a planar image of the fundus with high resolution and high speed from the intensity of the return light from the fundus.

  Hereinafter, an apparatus that captures such a planar image is referred to as an SLO apparatus.

  In recent years, it has become possible to acquire a planar image of the fundus with improved lateral resolution by increasing the beam diameter of the measurement light in an SLO device so that the measurement light becomes a finer spot on the fundus. It was. However, when the beam diameter of the measurement light is increased, in the acquisition of the planar image of the fundus, the SN ratio and resolution of the planar image due to the aberration of the measurement light and the return light generated in the eye to be examined become a problem.

  In order to solve this problem, an adaptive optical SLO apparatus (hereinafter referred to as an AO-SLO apparatus) having an adaptive optical system that measures aberration generated by the eye to be examined in real time with a wavefront sensor and corrects the aberration with a wavefront correction device has been developed. This makes it possible to acquire a plane image with high lateral resolution.

  In such an AO-SLO apparatus, a narrow region of the fundus is enlarged and imaged at a high magnification, so it is important that the examiner can confirm which part of the fundus is being imaged.

  Patent Document 1 discloses a configuration in which an imaging position is easily confirmed by displaying an index indicating an imaging position of a high-magnification captured image on a low-magnification captured image. Patent Document 2 discloses a configuration in which a part of optical tomography (OCT: Optical Coherence Tomography) measurement light is incident on an observation two-dimensional imaging device having sensitivity in the infrared region. According to the said structure, the line of the measurement light scanned on a fundus from an infrared fundus image can be confirmed visually, and it is possible to confirm an imaging position. In Patent Document 3, by limiting the irradiation of the measurement light of the low-magnification image based on the irradiation range of the measurement light of the high-magnification image, the imaging position can be easily set after suppressing the load on the subject. A configuration to be confirmed is disclosed.

Japanese Patent No. 5259484 Japanese Patent No. 5306554 JP 2013-169353 A

  However, in the configuration disclosed in Patent Document 1, an index indicating the imaging position is simply inserted and displayed in the image, and there is a possibility that the actual imaging position of the high-magnification captured image may deviate. In the configuration disclosed in Patent Document 2, since infrared light is used for observation of the fundus, a fine structure of the fundus cannot be imaged. Further, in the configuration disclosed in Patent Document 3, since the irradiation light when obtaining a low-magnification captured image is limited, the fundus cannot be clearly captured in the limited region, leaving room for improvement.

  In view of the above problems, an object of the present invention is to provide an apparatus capable of easily confirming which position of the fundus is imaged by the examiner.

In order to solve the above problems, an inspection apparatus according to the present invention provides:
A first scanning unit that scans the first illumination light applied to the inspection object; and a first light receiving unit that receives the first reflected light of the first illumination light from the inspection object. First imaging means for obtaining a first image by the first reflected light received by the first light receiving means;
Second scanning means for scanning the second illumination light irradiated on the inspection object;
Second light receiving means for receiving second reflected light from the inspection object of the second illumination light;
Splitting means for causing a part of the first reflected light to enter the second light receiving means;
Second imaging means for obtaining a second image having a wide imaging angle of view and a low magnification with respect to the first image by the second reflected light and the part of the first reflected light received by the second light receiving means. When,
Display means for displaying the second image obtained based on a light reception result by the second light receiving means;
It is characterized by having.

  According to the present invention, it is possible to easily confirm in the WF-SLO image which position of the fundus is imaged by the examiner.

It is a figure explaining the structure of the optical system of the SLO apparatus in the Example of this invention. It is a figure explaining each wavelength distribution of the measurement light of the SLO apparatus in the Example of this invention. It is a figure explaining the necessity for the synchronization of the XY scanner of an AO-SLO apparatus and the XY scanner of a WF-SLO apparatus in the Example of this invention. It is a figure explaining the position which synchronizes XY scanners of each apparatus in the Example of this invention. It is a figure explaining the relationship of the time and displacement (rotation angle) of the XY scanner of each apparatus in the Example of this invention. It is a flowchart explaining the imaging procedure of the fundus image by the SLO device in the embodiment of the present invention. It is a figure explaining the structure of the control software screen of the SLO apparatus in the Example of this invention. It is a figure explaining the imaging position of the AO-SLO image in the WF-SLO image in the Example of this invention. It is a figure explaining the synchronization of the XY scanner of each apparatus after deflecting the measurement light in the Example of this invention.

  The mode for carrying out the present invention will be described with reference to the following examples.

Examples of the present invention will be described.
In Example 1, an AO-SLO device to which the present invention is applied will be described as an ophthalmic device. The AO-SLO apparatus is an apparatus that includes an adaptive optics system and captures a high-resolution planar image (AO-SLO image) of the fundus. Further, the AO-SLO device is accompanied by a WO-SLO device, an anterior ocular segment observation device, and a fixation lamp display device. The WF-SLO device captures a wide-angle planar image (WF-SLO image) for the purpose of assisting acquisition of an AO-SLO image. The anterior ocular segment observation device is used to grasp the incident position of the measurement light, and the fixation lamp display device is used to guide the line of sight in order to adjust the imaging location.

  In the AO-SLO apparatus according to the present embodiment, a planar image is obtained by correcting the optical aberration generated in the eye to be examined by the spatial light modulator, which is good regardless of the diopter of the eye to be examined and the optical aberration due to the eye to be examined. A flat image is obtained.

  In this embodiment, the compensation optical system is provided to capture a planar image with a high lateral resolution. However, if the configuration of the optical system can achieve high resolution, the compensation optical system may not be provided. Good.

<The whole AO-SLO part>
First, the AO-SLO unit 140 of the AO-SLO apparatus in the present embodiment will be specifically described with reference to FIG. The AO-SLO unit 140 corresponds to the first imaging unit in the present invention.

  The light emitted from the light source 101-1 is split into the reference light 105 and the measurement light 106-1 by the optical coupler 131. The measurement light 106-1 corresponds to the first illumination light in the present invention. The measurement light 106-1 includes a spatial light modulator 159, an AO-SLO section X scanner 118-1, an AO-SLO section Y scanner 119-1, a deflection X scanner 118-2, a deflection Y scanner 119-2, and a dichroic mirror 170-. The light is guided to the eye 107 to be observed through the measurement light optical path 1. The AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-2 correspond to the first scanning means in the present invention, and the deflection X scanner 118-2 and the deflection Y scanner 119-2 are deflection means in the present invention. Corresponding to Reference numeral 156 denotes a fixation lamp, and a light beam 157 from the fixation lamp 156 has a role of promoting fixation of the eye 107 to be examined.

  The measurement light 106-1 becomes return light 108-1 reflected or scattered by the eye 107 to be examined, travels backward through the measurement light optical path described above, and enters the detector 138-1 via the optical coupler 131. The return light 108-1 corresponds to the first reflected light in the present invention, and the detector 138-1 corresponds to the first light receiving means in the present invention. The detector 138-1 converts the light intensity of the return light 108-1 into a voltage, and a plane image of the eye 107 to be inspected is constructed using the obtained voltage signal.

  In this embodiment, the entire optical system is mainly configured by using a refractive optical system using a lens. However, this can also be configured by a reflective optical system using a spherical mirror instead of these lenses. Can do.

  In this embodiment, a reflective spatial light modulator is used as an aberration correction device. However, a transmissive spatial light modulator or a deformable mirror can also be used.

<Light source of AO-SLO section>
Next, the periphery of the light source 101-1 will be described. As the light source 101-1 in this embodiment, an SLD (Super Luminescent Diode) which is a typical low-coherent light source is used. The wavelength of light emitted from the light source 101-1 is 840 nm and the bandwidth is 50 nm. In this embodiment, a low coherent light source is selected in order to obtain a planar image with little speckle noise. Further, although SLD is selected as the type of light source, ASE (Amplified Spontaneous Emission) or the like can be used as long as low-coherent light can be emitted.

  Further, the wavelength of the measurement light in the AO-SLO unit is preferably near infrared light in consideration of measuring the eye. Furthermore, since the measurement light wavelength affects the lateral resolution of the obtained planar image, it is desirable that the measurement light wavelength be as short as possible, and here it is 840 nm. Other wavelengths may be selected depending on the measurement site to be observed. In the present embodiment, the light source for fundus imaging and the light source for wavefront measurement are shared as the same light source. However, separate light sources may be used, and individual light may be combined in the middle of the optical path. .

  The light emitted from the light source 101-1 is guided to the optical coupler 131 through the single mode fiber 130-1. The optical coupler 131 divides the emitted light into the reference light 105 and the measurement light 106-1 at a ratio of 90:10. Reference numerals 153-1 and 153-2 denote polarization controllers, which are used to adjust the deflection of the reference beam 105 and the measurement beam 106-1.

<Reference optical path of AO-SLO section>
Next, the optical path of the reference beam 105 will be described.
The reference light 105 divided by the optical coupler 131 is incident on the light quantity measuring device 164 via the optical fiber 130-2. The light amount measuring device 164 is used for measuring the light amount of the reference light 105 and monitoring the light amount of the measuring light 106-1.

<Measurement optical path of AO-SLO section>
Next, the optical path of the measuring beam 106-1 will be described.
The measurement light 106-1 split by the optical coupler 131 is guided to the lens 135-1 via the single mode fiber 130-4 and adjusted to become parallel light having a beam diameter of 4 mm.

  The measurement light 106-1 is guided to the compensation optical system after adjustment to parallel light. The compensation optical system includes an optical element such as a beam splitter 158-1, a wavefront sensor 155 for measuring aberration, a wavefront correction device 159 and a pinhole 198-1, and lenses 135-5 to 10 for guiding them. It is composed of

  In the optical path composed of the above optical elements, the measuring beam 106-1 passes through the beam splitter 158-1, passes through the lenses 135-5 to 135-6, and enters the spatial light modulator 159. Here, the cornea 126 of the eye 107 to be examined, the AO-SLO X scanner 118-1, the AO-SLOY scanner 119-1, the wavefront sensor 155, and the spatial light modulator 159 are each optically conjugate. Lenses 135-5 to 10 etc. are arranged.

  Next, the measurement light 106-1 is modulated by the spatial light modulator 159, then passes through the lenses 135-7 to 135-8, and is incident on the mirror of the AO-SLO section X scanner 118-1. The AO-SLO part X scanner X118-1 and the AO-SLO part Y scanner 119-1 are used for raster scanning the measurement light 106-1 on the fundus 127 in a direction perpendicular to the optical axis. The center (optical axis) of the measuring beam 106-1 is adjusted so as to coincide with the rotation center of each mirror constituting the AO-SLO unit X scanner 118-1 and the AO-SLO unit Y scanner 119-1. ing.

  Here, the AO-SLO X scanner 118-1 is a scanner that scans the measurement light 106-1 in the horizontal direction on the fundus. In this embodiment, a resonance scanner is used. The AO-SLO unit Y scanner 119-1 is a scanner that scans the measurement light 106-1 in the vertical direction on the fundus, and here, a galvano scanner is used. The driving waveform when driving the galvano scanner is a sawtooth wave.

  In this embodiment, the AO-SLO unit X scanner 118-1 and the Y scanner 119-1 are controlled via an optical scanner drive driver 182 provided in the driver unit 181 in the control PC 109. The optical scanner driver 182 corresponds to control means for controlling the scanning means in this embodiment.

  The measuring beam 106-1 scanned by the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1 is incident on the mirror of the deflection X scanner 118-2. Each of the deflection X scanner 118-2 and the deflection Y scanner 119-2 has a role of further deflecting the measurement light 106-1 by a predetermined amount with respect to the horizontal direction and the vertical direction. In this embodiment, both the deflection X scanner 118-2 and the Y scanner 119-2 are galvano scanners. The driving waveform when driving the galvano scanner is a sawtooth wave.

  Here, the deflection X scanner 118-2 and the deflection Y scanner 119-2 are controlled via a second optical scanner driver 185 provided in the driver unit 181 in the control PC 109 in this embodiment. The second optical scanner drive driver corresponds to the deflection control means in this embodiment.

  The lenses 135-9 to 10 are optical systems for adjusting the focus of the measurement light that scans the fundus 127. The lenses 135-9 to 10-10 have a role of setting the fulcrum of the measurement light 106-1 as the center of the pupil of the eye 107 to be examined when the measurement light 106-1 scans the fundus 127.

  In this embodiment, the beam diameter of the measuring beam 106-1 is 4 mm. However, the beam diameter may be larger in order to obtain a higher resolution optical image.

  In addition, the electric stage 117-1 that supports the lens 135-10 can move in the optical axis direction of the measurement light 106-1 indicated by an arrow. By this movement in the optical axis direction, the position of the supporting lens 135-10 can be moved to adjust the focus described above. In this way, by adjusting the position of the lens 135-10, it is possible to focus the measurement light 106-1 on a predetermined layer of the fundus 127 of the eye 107 to be examined and observe it. In addition, the case where the eye 107 to be examined has a refractive error can be dealt with.

  In the present embodiment, the electric stage 117-1 is controlled via an electric stage driving driver 183 disposed in the driver unit 181 in the control PC 109.

  The measurement light 106-1 through the lenses 135-9 to 10-10 is reflected by the mirror 120 and the dichroic mirror 170-1 and guided to the eye 107 to be examined.

  Here, the dichroic mirror 170-1 has a characteristic of reflecting most of the measurement light 106-1 and transmitting part of it. The dichroic mirror 170-1 corresponds to the dividing means in the present invention. In this embodiment, a dichroic mirror is used as the dividing means. However, the optical characteristic is such that most of the measurement light 106-1 after reflection from the eye 107 to be examined is reflected and partially transmitted. It can be replaced by an optical element having it. For example, a configuration that functions as a beam splitter can also be used as the dividing means.

  When the measurement light 106-1 is incident on the eye 107 to be examined, it becomes return light 108-1 due to reflection and scattering from the fundus 127. Most of the return light 108-1 is reflected by the dichroic mirror 170-1, and returns in the reverse direction on the same optical path as the measurement light 106-1. The return light 108-1 reaches the beam splitter 158-1, and a part of the return light 108-1 is reflected. The reflected light is incident on the wavefront sensor 155 through the pinhole 198-1, and the aberration of the return light 108-1 generated by the eye 107 to be examined is measured by the wavefront sensor 155. The pinhole 198-1 is installed for the purpose of shielding unnecessary light other than the return light 108-1.

  The return light 108-1 transmitted through the beam splitter 158-1 is guided again to the optical coupler 131, and reaches the detector 138-1 via the single mode fiber 130-3. For the detector 138-1, for example, an APD (Avalanche Photo Diode) or a PMT (Photomultiplier Tube) which is a high-speed and high-sensitivity optical sensor is used.

  A part of the return light 108-1 transmitted through the dichroic mirror 170-1 enters the WF-SLO unit 141. A part of the incident return light 108-1 is guided to the detector 138-2. As will be described later, each of the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1, the WF-SLO section X scanner 118-3, and the WF-SLO section Y scanner 119-3 Are synchronized. Each of these is synchronized, and at the timing when the measurement light 106-1 of the AO-SLO unit 140 and the measurement light 106-2 of the WF-SLO unit 141 scan the same position on the fundus 127, a part of the return light is detected by the detector 138. -2.

<Whole WF-SLO part>
Next, the WF-SLO unit 141 will be described. The WF-SLO unit 141 corresponds to the second imaging unit in the present invention.

  The WF-SLO unit 141 has basically the same configuration as the AO-SLO unit 140. Description of overlapping parts is omitted.

  The measurement light 106-2 emitted from the light source 101-2 includes lenses 135-2 to 135, lenses 135-13 to 14, a WF-SLO section X scanner 118-3, a WF-SLO section Y scanner 119-3, and a dichroic mirror. It is guided to the eye 107 to be examined through 170-1 to 3-1. The measurement light 106-2 corresponds to the second illumination light in the present invention, and the WF-SLO part X scanner 118-3 and the Y scanner 119-3 correspond to the second scanning unit. The light source 101-2 is an SLD like the AO-SLO unit. The wavelength of light emitted from the light source 101-2 is 920 nm and the bandwidth is 20 nm.

<Measurement optical path of WF-SLO section>
Next, the optical path of the measuring beam 106-2 will be described.
The measurement light 106-2 emitted from the light source 101-2 includes lenses 135-2 to 135, lenses 135-13 to 14, a WF-SLO section X scanner 118-3, a WO-SLO section Y scanner 119-3, and a dichroic mirror. It is guided to the eye 107 to be inspected through 170-1 and the like.

  In the present embodiment, the WF-SLO part X scanner 118-3 is a scanner that scans the measurement light 106-2 in the horizontal direction on the fundus and uses a resonance scanner. The WF-SLO unit Y scanner 119-3 is a scanner that scans the measuring beam 106-2 in the vertical direction on the fundus, and uses a galvano scanner. The driving waveform when driving the galvano scanner is a sawtooth wave.

  In this embodiment, the beam diameter of the measuring beam 106-2 is 1 mm. However, the beam diameter may be larger in order to obtain a higher resolution optical image. The lens 135-14 is supported by the electric stage 117-2 and can move in the direction of the optical axis of the measuring beam 106-2 indicated by an arrow. As a result, similarly to the AO-SLO unit 140, the WF-SLO unit 141 can adjust the focus of the measurement light 106-2.

  When the measurement light 106-2 is incident on the eye 107 to be examined, the return light 108-2 is produced by reflection or scattering from the fundus 127, and becomes dichroic mirrors 170-1 to 170-3, lenses 135-13 to 14, lenses 135-2, and lenses 135. -11-12, WF-SLO section X scanner 118-3, WF-SLO section Y scanner 119-3, pinhole 198-2, beam splitter 158-2, etc., and reaches detector 138-2. The pinhole 198-2 is installed for the purpose of shielding unnecessary light other than part of the return light 108-2 and the return light 108-1. The return light 108-2 corresponds to the second reflected light in the present invention, and the detector 138-2 corresponds to the second light receiving means in the present invention.

<Configuration of the fixation lamp>
The fixation lamp 156 is composed of a light emitting display module and has a display surface (27 mm, 128 × 128 pixels) on the XY plane. As the fixation lamp 156, a liquid crystal, an organic EL, an LED array, or the like can be used. The eye 107 to be examined gazes at the light beam 157 from the fixation lamp 156, whereby the fixation of the eye 107 to be examined is guided. On the display surface of the fixation lamp 156, for example, as shown in FIG. 1B, a cross pattern blinks and is displayed at an arbitrary lighting position 165.

  The light beam 157 from the fixation lamp 156 is guided to the fundus 127 through the lenses 135-17 to 18 and the dichroic mirrors 170-1 to 170-3. The lenses 135-17 and 18 are arranged so that the display surface of the fixation lamp 156 and the fundus 127 are optically conjugate. The lens 135-18 is supported by the electric stage 117-3 and can move in the optical axis direction of the light beam 157 indicated by an arrow. The fixation lamp 156 is controlled via a fixation lamp driving driver 184 provided in the driver unit 181 in the control PC 109.

<Anterior segment observation>
Next, anterior ocular segment observation will be described.
The light emitted from the anterior segment illumination light source 101-3 illuminates the eye 107, and the reflected light enters the CCD camera 160 via the dichroic mirrors 170-1 and 170-19 and lenses 135-19-20. The light source 101-3 is composed of an LED that emits light having a center wavelength of 740 nm.

<Focus, shutter, astigmatism correction>
Each of the AO-SLO unit 140, the WF-SLO unit 141, and the fixation lamp unit has electric stages 117-1 to 117-3 individually, and three electric stages are interlocked. However, if it is desired to individually adjust the focus position, it can be adjusted by moving the electric stage individually.

  Each of the AO-SLO unit 140 and the WF-SLO unit 141 includes a shutter (not shown), and can control whether the measurement light is incident on the eye 107 individually by opening and closing the shutter.

  Although the shutter is used in this embodiment, it can be controlled by directly turning on / off the light sources 101-1 and 101-2. Similarly, the anterior ocular segment observation unit and the fixation lamp unit can also be controlled by turning on / off the light source 101-3 and the fixation lamp 156.

  Further, the lens 135-10 can be replaced, and a spherical lens or a cylindrical lens can be used in accordance with the aberration (refractive abnormality) of the eye 107 to be examined. Further, the lens is not limited to one lens, and a plurality of lenses can be combined to construct the lens.

<Wavefront correction>
Here, wavefront correction using the wavefront sensor 155 and the spatial light modulator 159 will be described.

  The wavefront sensor 155 and the spatial light modulator 159 are electrically connected to the control PC 109. The wavefront sensor 155 measures the wavefront of the beam, uses a Shack-Hartmann sensor, and has a measurement range of −10D to + 5D. The obtained aberration is expressed using a Zernike polynomial, which indicates the aberration of the eye 107 to be examined. The Zernike polynomial is composed of a tilt (tilt) term, a defocus term, an astigma (astigmatism) term, a coma term, a trifoil term, and the like. Based on the obtained aberration of the eye 107 to be examined, the control PC 109 calculates a modulation amount (correction amount) for correcting to a wavefront having no aberration, and instructs the spatial light modulator 159 to specify the modulation amount. In this embodiment, a reflective liquid crystal spatial phase modulator having 600 × 600 pixels is used as the spatial light modulator 159.

<Wavelength>
FIG. 2 shows the wavelength distribution of each light obtained from the light source used for the AO-SLO unit 140, the WF-SLO unit 141, the fixation lamp unit, and the anterior segment observation. The wavelength of the light beam 157 from the fixation lamp 156 is 720 nm or less, and the illumination light from the light source 101-3 for anterior eye observation has a center wavelength of 740 nm. The wavelength of the light source 101-1 of the AO-SLO unit 140 is 840 nm and the bandwidth is 50 nm. The wavelength of the measurement light 106-1 emitted from the light source 101-2 of the WF-SLO unit 141 is 920 nm and the bandwidth is 20 nm. It is. In order to divide each light by the dichroic mirrors 170-1 to 170-3, different wavelength bands are used. In addition, FIG. 2 shows the difference in wavelength of each light source, and does not define the intensity and spectrum shape.

<Imaging>
Next, a method for constructing a captured image will be described.
The intensity of the light incident on the detector 138-1 is converted into a voltage. The voltage signal obtained by the detector 138-1 is converted into a digital value by the AD board 176-1 in the control PC 109. Next, the control PC 109 performs data processing in synchronization with the operation and drive frequency of the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1 to form an AO-SLO image. The AO-SLO image corresponds to the first image or the first fundus image in the present invention.

  Similarly, the voltage signal obtained by the detector 138-2 is converted into a digital value by the AD board 176-2 in the control PC 109, and data processing synchronized with the operation of the scanner of the WF-SLO unit 141 is performed. Thereafter, a WF-SLO image is formed. The WF-SLO image corresponds to the second image or the second fundus image in the present invention, and the second image is an image obtained with a wide imaging angle of view with respect to the first image and at a low magnification.

  In the present invention, in the WF-SLO image, a part of the return light 108-1 transmitted through the dichroic mirror 170-1 is also superimposed on the detector 138-2 in a state of being superimposed on the return light 108-2 for the WF-SLO image. Received light. The light reception result obtained by the detector 138-2 is directly reflected as a WF-SLO image, and an image illustrated in FIG. 4 to be described later is obtained.

<Synchronization of XY scanner>
AO-SLO section X scanner 118-1, AO-SLO section Y scanner 119-1, and WF-SLO section X scanner are used to cause return light 108-1 transmitted through dichroic mirror 170-1 to enter detector 138-2. A method of synchronizing 118-3 and the WF-SLO Y scanner 119-3 will be described.

  First, the necessity of synchronizing the scanner will be described. FIG. 3 shows the optical paths after the scanner of the AO-SLO section 140 and the optical paths of the WF-SLO section, which are shown. FIG. 3A shows the measurement light 106-1 and the measurement light 106 by the AO-SLO part X scanner 118-1 and Y scanner 119-1 and the WF-SLO part X scanner 118-3 and Y scanner 119-3. -2 indicates a state in which the point 301-1 on the fundus is simultaneously scanned. At this time, the return light 108-1 (solid line) of the measurement light 106-1 and the return light 108-2 (dotted line) of the measurement light 106-2 follow the same optical path and are simultaneously irradiated onto the detector 138-2.

  On the other hand, FIG. 3B shows a state in which the measurement light 106-1 is scanning the point 301-2 on the fundus and the measurement light 106-2 is scanning the point 301-3 on the fundus. At this time, the return light 108-1 follows the optical path indicated by the solid line, and the return light 108-2 follows the optical path indicated by the dotted line. The return light 108-2 is reflected by the WF-SLO part X scanner 118-3 and the WF-SLO part Y scanner 119-3, and then guided to the detector 138-2. However, the return light 108-1 is reflected by the WF-SLO part X scanner 118-3 and the WO-SLO part Y scanner 119-3, and is then blocked by the pinhole 198-2 installed immediately before the detector 138-2. Unable to reach detector 138-2.

  As described above, the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1, the WF-SLO section X scanner 118-3, and the WF-SLO section Y scanner 119-3 are used for measuring light 106. -1 and the measurement light 106-2 scan the same position on the fundus, the return light 302-1 and the return light 302-2 are simultaneously guided to the detector 138-2. That is, when the AO-SLO section X scanner 118-1, the AO-SLO section Y scanner 119-1, the WF-SLO section X scanner 118-3, and the WF-SLO section Y scanner 119-3 are synchronized, the return light 302- 1 and the return light 302-2 are simultaneously guided to the detector 138-2, and thus synchronization is required.

  Next, FIG. 4 illustrates a fundus image obtained when the above-described scanners are synchronized. In the center of the point 401 shown in the figure, that is, the imaging range 402 of the AO-SLO part and the imaging range 403 of the WF-SLO part, the AO-SLO part X scanner 118-1 and the AO-SLO part Y scanner 119-1 A method of synchronizing the WF-SLO unit X scanner 118-3 and the WF-SLO unit Y scanner 119-3 will be described.

  First, synchronization between the AO-SLO section X scanner 118-1 and the WF-SLO section X scanner 118-3 will be described with reference to FIG. In the figure, the horizontal axis represents time, and the vertical axis represents the displacement (rotation angle) of each scanner. In addition, a waveform 501 in the figure indicates a relationship between time and displacement of the AO-SLO unit X scanner 118-1, and a waveform 502 indicates a relationship between time and displacement of the WF-SLO unit X scanner 118-3. In this embodiment, a resonance scanner is used as the X scanner, and the drive frequency is 12 kHz for the AO-SLO X scanner 118-1 and 8 kHz for the WF-SLO X scanner 118-3. When the scanner driving is simultaneously started at time 0, thereafter, at point 505, the displacement is periodically zero, that is, the rotation angles of the respective X scanners coincide with each other at the horizontal center of the imaging range.

  In this embodiment, the drive frequencies are 12 kHz and 8 kHz, but the present invention is not limited to this. In other words, the drive frequencies of the AO-SLO unit X scanner 118-1 and the WF-SLO unit X scanner 119-1 need only be an integer ratio.

  Next, synchronization of the Y scanner will be described with reference to FIG. A waveform 503 indicates a relationship between time and displacement of the AO-SLO unit Y scanner 119-1, and a waveform 504 indicates a relationship between time and displacement of the WF-SLO unit Y scanner 119-3. In this embodiment, a galvano scanner is used as the Y scanner. In this embodiment, the frame rate of the AO-SLO part is 32 Hz, and the frame rate of the WF-SLO part is 16 Hz. When driving of the scanner is started simultaneously at time 0, thereafter, at the point 506, the displacement is periodically zero, that is, the rotation angles of the Y scanners coincide with each other at the vertical center of the imaging range. In this embodiment, the frame rate of the AO-SLO part is 32 Hz, and the frame rate of the WF-SLO part is 16 Hz. However, the present invention is not limited to this, and the frame rate of the AO-SLO part is set and becomes an integer ratio thereof. Thus, the frame rate of the WF-SLO part may be set. The frame rate corresponds to the scanning state in the present invention.

  In this way, the AO-SLO section X scanner 118-1 and the WF-SLO section X scanner 119-1, and the AO-SLO section X scanner 119-1 and the WF-SLO section Y scanner 119-3 are synchronized, and The AO-SLO unit 140 and the WF-SLO unit 141 simultaneously scan each measuring beam at the center point 401.

<Imaging procedure>
Next, an imaging procedure in the AO-SLO apparatus according to the present embodiment will be described with reference to FIGS.
FIG. 6 shows an imaging procedure. Below, each process is described in detail.

(Step 1) Start imaging Press the execution button 701 on the control software screen.

(Step 2) Obtaining an anterior segment image An image of the anterior segment of the eye 107 to be examined is displayed on the anterior segment monitor 712. If the center of the pupil is not correctly displayed at the center of the screen, the head unit (not shown) is moved to a substantially correct position.

(Step 3) Acquiring a WF-SLO Image When the anterior segment image is displayed in a substantially correct state, the WF-SLO image is displayed on the WF-SLO monitor 715. The WF-SLO monitor 715 corresponds to a display unit for displaying the second fundus image in the present invention. The angle of view is 9 mm long × 12 mm wide, and the frame rate is set to 16 Hz as an initial value. The fixation lamp lighting position 165 is set to the center position by the fixation lamp position monitor 713, and guidance is performed around the line of sight of the eye 107 to be examined.

  Next, while looking at the WF-SLO intensity monitor 716, the focus adjustment button 704 is adjusted so as to increase the WF-SLO intensity. Here, on the WF-SLO intensity monitor 716, the signal intensity detected by the WF-SLO unit is displayed in time series in the horizontal axis time and the vertical axis signal intensity. Here, by adjusting the focus adjustment button 704, the positions of the lenses 135-10, 14, and 18 are simultaneously adjusted.

  When the WF-SLO image is clearly displayed, the WF-SLO recording button 717 is pressed to save the WF-SLO data.

(Step 4) Displaying the AO-SLO image When the AO-SLO measurement button 707 is pressed, the shutter of the AO-SLO measurement light is opened and the measurement light 106-1 as the AO-SLO measurement light is irradiated to the eye 107 to be examined. Then, an AO-SLO image is displayed on the AO-SLO monitor 718. The angle of view is set as the initial value of 0.8 mm in length x 0.8 mm in width, and the frame rate is 32 Hz. Similarly to the WF-SLO intensity monitor 716, the signal intensity detected by the AO-SLO unit is displayed on the AO-SLO intensity monitor 719 in time series.

(Step 5) Determine AO-SLO image acquisition position The center position of the imaging range 801 of the AO-SLO image on the WF-SLO image displayed on the WF-SLO monitor 715 as shown in FIG. 802 is displayed brightly. The current imaging position is confirmed based on the brightly displayed position 802, and the position on the WF-SLO fundus image for which an AO-SLO image is to be acquired is clicked on the WF-SLO monitor 715 with a mouse (not shown). The mouse corresponds to the instruction means for indicating the imaging position in the present invention. When clicked, the AO-SLO measuring light shutter is closed, and the driving of the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1 is stopped.

  When a desired position 803 is clicked on the WF-SLO monitor 715 as shown in FIG. 8B, the control PC 109 deflects the measuring beam 106-1 so as to correspond to the clicked position 803. 2 and the deflection angle of the deflection Y scanner 119-2. As for the deflection angle, a conversion table of the positions on the WF-SLO monitor 715 and the angles of the deflection X scanner 118-2 and the deflection Y scanner 119-2 is created in advance, and the control PC 109 determines from the conversion table according to the clicked position. Find the angle. The control PC 109 rotates the deflection X scanner 118-2 and the deflection Y scanner 119-2 based on the obtained angle to deflect the irradiation direction of the measuring beam 106-1.

  Further, the control PC 109 calculates a distance C (Cx, Cy) between the clicked position and the center of the imaging range of the current AO-SLO image.

Next, the control PC 109 calculates times Tx and Ty shown in FIGS. 9 (a) and 9 (b). The time Tx is the time required for the WF-SLO part X scanner 118-3 to scan the distance Cx from the center, and Ty is the time required for the WF-SLO part Y scanner 119-3 to scan the distance Cy from the center. Shows time. Here, the waveform 901 is the AO-SLO part X scanner 118-1, the waveform 902 is the WF-SLO part X scanner 118-3, and the waveform 903 is the relationship between the time and displacement of the AO-SLO part Y scanner 119-1. A waveform 904 indicates the relationship between time and displacement of the WF-SLO unit Y scanner 119-3. Since the waveform 902 is a sine wave, the time Tx is
Can be obtained. Similarly, when the time Ty is K, the slope of the waveform 904 is a known value.
Can be obtained. When the times Tx and Ty are calculated, the control PC 109 delays the time Ty with respect to the WF-SLO unit X scanner 118-3 and the WF-SLOY scanner 119-3 and restarts driving of the AO-SLO unit Y scanner 119-1. . Next, the driving of the AO-SLO section X scanner 119-3 is resumed with a delay of time Tx + Ty, and the AO-SLO shutter is opened.

  By controlling in this way, the AO-SLO section X scanner 118-1 and the AO-SLO section Y scanner 119-1, the WF-SLO section X scanner 118-3, and the WF-SLO section Y scanner at the desired position 803. 119-3 can be synchronized.

  After confirming that the center position of the position where the AO-SLO image is to be acquired is displayed brightly, the process proceeds to the next step.

(Step 6) Aberration Correction When the AO-SLO measurement button 707 is pressed in step 4, the Hartmann image detected by the wavefront sensor 155 is displayed on the wavefront sensor monitor 714. The aberration calculated from the Hartmann image is displayed on the aberration correction monitor 711. Aberrations are displayed separately for a defocus component (μm unit) and all aberration amounts (μm RMS unit). Here, in step 3, since the position of the lens 135-10 that is the focus lens of the AO-SLO measurement light is adjusted, aberration measurement in this step is possible.

  When the autofocus button 721 is pressed here, the positions of the lenses 135-10, 14, and 18 are automatically adjusted so that the defocus value becomes small.

  Next, when the aberration correction button 722 is pressed, the spatial light modulator 159 is automatically adjusted in the direction of decreasing the aberration amount, and the value of the aberration amount is displayed in real time. The image displayed on the AO-SLO monitor 718 is also updated to an image whose aberration is corrected in real time.

(Step 7) Acquire an AO-SLO image When the signal intensity displayed on the AO-SLO intensity monitor 719 is insufficient, the focus is adjusted to adjust the signal intensity.

  In addition, the angle of view, the frame rate, and the imaging time of the AO-SLO unit 140 can be changed by the imaging condition setting button 723. The frame rate of the WF-SLO unit is automatically changed by the control PC 109 so as to be an integer ratio of the frame rate set here. The control PC 109 corresponds to setting means for setting the scanning state in the present invention.

  Further, the imaging range in the depth direction of the eye 107 to be examined can be adjusted by adjusting the depth adjustment button 724 to move the lens 135-10. Specifically, an image of a desired layer such as a photoreceptor layer, a nerve fiber layer, or a pigment epithelium layer can be acquired.

  When the value of the aberration amount is sufficiently low and the AO-SLO image is clearly displayed, the AO-SLO recording button 720 is pressed to save the AO-SLO data.

(Step 8) Selecting the Next Operation Return to Step 5 when changing the imaging position, and return to Step 3 when switching the imaging left and right eyes. When the imaging is finished, the process moves to the next step.

(Step 9) End When the STOP button 702 is pressed, the control software stops.

  In this embodiment, the center position of the imaging range of the AO-SLO unit 140 is always scanned simultaneously by the AO-SLO unit 140 and the WF-SLO unit 141 so that the scanning range of the AO-SLO appears bright on the WF-SLO image. However, instead of one point, a plurality of points may appear bright.

  In the present embodiment, the same point is always scanned at the same time. However, the scanning may be performed at any point within the imaging range of the AO-SLO portion so that the scanning range looks bright. In this case, the AO-SLO part X scanner 118-1 and the AO-SLO part Y scanner 119-1 do not have to be synchronized with the WF-SLO part X scanner 118-3 and the WF-SLO part Y scanner 119-3.

  As described above, according to the present embodiment, the center position of the imaging range of the AO-SLO portion becomes bright on the WF-SLO image, and it is possible to easily confirm which position of the fundus is imaged by the examiner. it can.

(Other examples)
The present invention can also be realized by executing the following processing. That is, software (program) that realizes the functions of the above-described embodiments is supplied to a system or apparatus via a network or various storage media, and a computer (or CPU, MPU, or the like) of the system or apparatus reads the program. It is a process to be executed.

  Furthermore, the present invention is not limited to the above-described embodiments, and various modifications and changes can be made without departing from the spirit of the present invention. For example, in the above embodiment, the case where the object to be measured is the eye is described, but the present invention can also be applied to the object to be measured such as skin or organ other than the eye. In this case, the present invention has an aspect as a medical device such as an endoscope other than the ophthalmologic apparatus. Therefore, it is preferable that the present invention is grasped as an inspection apparatus exemplified by an ophthalmologic apparatus, and the eye to be examined is grasped as one aspect of the object to be inspected.

101: Detector 105: Reference beam 106: Measuring beam 107: Eye 108: Return beam 109: Control PC
117: Electric stage 118: X scanner 119: Y scanner 120: Mirror 126: Cornea 127: Fundus 130: Single mode mode fiber 131: Optical coupler 135: Lens 138: Detector 140: AO-SLO unit 141: WF-SLO unit 153 : Polarization controller 155: wavefront sensor 156: fixation lamp 158: beam splitter 159: wavefront correction device 160: CCD camera 164: light quantity measuring device 165: lighting position 170: dichroic mirror 176: AD board 181: driver unit 182: optical scanner Drive driver 183: Electric stage drive driver 184: Fixation lamp drive driver 185: Optical scanner drive driver 198: Pinhole

Claims (10)

A first scanning unit that scans the first illumination light applied to the inspection object; and a first light receiving unit that receives the first reflected light of the first illumination light from the inspection object. First imaging means for obtaining a first image by the first reflected light received by the first light receiving means, second scanning means for scanning the second illumination light irradiated on the inspection object, and the second Second light receiving means for receiving second reflected light from the inspection object of illumination light;
A dividing unit that causes a part of the first reflected light to enter the second light receiving unit, and the second reflected light received by the second light receiving unit and a part of the first reflected light with respect to the first image. Second imaging means for obtaining a second image having a wide imaging angle of view and a low magnification;
Display means for displaying the second image obtained based on a light reception result by the second light receiving means;
An inspection apparatus comprising: A setting unit configured to set a scanning state of the second scanning unit according to a scanning state of the first scanning unit;
The inspection apparatus according to claim 1.   3. The inspection apparatus according to claim 1, wherein the dividing unit is a dichroic mirror or a beam splitter. Deflecting means for deflecting the first illumination light;
Instruction means for instructing the imaging position of the first image on the second image displayed by the display means;
Further comprising: deflection control means for controlling the deflection means based on the imaging position designated by the instruction means; and control means for controlling the first scanning means based on the designated imaging position. The inspection apparatus according to claim 1, wherein the inspection apparatus is characterized. The deflection control unit has a conversion table for controlling the deflection unit based on the position instructed by the instruction unit.
The inspection apparatus according to claim 4.   The compensation optical system for correcting the aberration of the first reflected light generated in the inspection object is further provided, and the first image is an optical image obtained by correcting the aberration. The inspection apparatus according to any one of 1 to 5. A first scanning unit that scans the first illumination light applied to the inspection object; a first light receiving unit that receives the first reflected light from the inspection object of the first illumination light;
Second scanning means for scanning the second illumination light applied to the inspection object; second light receiving means for receiving second reflected light from the inspection object of the second illumination light;
Dividing means for causing a part of the first reflected light to enter the second light receiving means,
A control method for an inspection apparatus,
A first step of obtaining a first image by the first reflected light received by the first light receiving means;
A second step of obtaining a second image having a wide imaging angle of view with respect to the first image and a low magnification by using the second reflected light and a part of the first reflected light received by the second light receiving means;
A display step of displaying the second image obtained based on a light reception result by the second light receiving means;
A method for controlling an inspection apparatus, comprising: A setting step of setting a scanning state of the second scanning unit according to a scanning state of the first scanning unit;
The control method according to claim 7. Deflection means for deflecting the first illumination light;
An instruction step of instructing the imaging position of the first image on the second image displayed in the display step;
A deflection control step of controlling the deflection unit based on the imaging position instructed by the instruction step; and a control step of controlling the first scanning unit based on the instructed imaging position. The control method according to claim 7, wherein the control method is characterized by the following.   A program for causing a computer to execute each step of the control method according to any one of claims 7 to 9.