JP2016031340A - X-ray optical system base material and x-ray optical system base material manufacturing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an X-ray optical system base material light in weight, capable of being manufactured easily and simply without the need to adjust deformation and positioning, excellent in handleability, and excellent in optical performance.SOLUTION: An X-ray optical system base material constituted by a flat substrate 10 and including a plurality of through-holes 20 formed to penetrate the substrate at predetermined angles and to be concentric in a planar direction of the substrate, and provided radially about a center of the substrate 10, each of the through-holes 20 being formed so that the predetermined angle becomes greater as the through-hole 20 is toward outward from the center, and the predetermined angles of the through-holes 20 include a first predetermined angle from one surface of the substrate to a predetermined position in a thickness direction of the substrate and a second predetermined angle from the predetermined position to the other surface of the substrate 10 and different from the first predetermined angle.SELECTED DRAWING: Figure 2

Description

  The present invention relates to an X-ray optical system substrate and a method for producing the same.

Observation of X-rays emitted from celestial bodies is important in fields such as X-ray astronomy and space exploration. X-rays emitted from celestial bodies are absorbed by the earth's atmosphere. For this reason, X-rays radiated from celestial bodies are observed by carrying an X-ray observation device to an altitude higher than the Earth's atmosphere. For example, an X-ray observation device is mounted on an artificial satellite. Has been done.
In addition, unlike visible light, X-rays are difficult to use with a direct-incidence optical system. For this reason, the X-ray optical system uses a grazing incidence optical system based on total reflection utilizing the fact that the refractive index of the substance with respect to the X-ray is smaller than 1, and the X-ray optical system base using the oblique incident optical system Various materials have been proposed.
As an example of an X-ray optical system substrate using a typical oblique incidence optical system, in order to increase the effective area of the reflecting surface, a large number of metallic cylindrical reflecting mirrors having different diameters are arranged coaxially. X-ray optical system substrates are known.
The inventors of the present application disclosed in Patent Document 1 an X-ray optical system substrate that uses a silicon wafer cross section by anisotropic etching as an X-ray reflector as an X-ray optical system substrate that is lightweight and relatively easy to manufacture. is suggesting. This is a mirror that is lighter than before because fine holes are made in a thin wafer. There is also an advantage that a large number of mirrors can be manufactured by one etching.
Furthermore, the inventors of the present application disclosed in Patent Document 2 a fine curved hole structure manufactured by silicon dry etching or X-ray LIGA as a new X-ray optical system base material aiming at improving imaging performance while maintaining light weight. The X-ray optical system base material which uses the cross section of this as an X-ray optical system is proposed.

JP 2006-194758 A JP 2010-085304 A

However, in the case of an X-ray optical system substrate in which a large number of cylindrical reflectors made of metal having different diameters are coaxially arranged, it takes time and effort to make each mirror one by one or more per 1 m ^{2 of} effective area. Since the weight increases and the weight increases, there is a problem that the transportation from the ground is hindered when used in outer space.
In addition, although the X-ray optical base material according to Patent Document 1 solves the problem of weight, since anisotropic etching can only create a straight mirror, the ideal curved surface is approximated by a straight line. Performance is limited. In addition, there is a problem that it is necessary to arrange a large number of mirrors along the curved surface with extremely high accuracy.
In addition, the X-ray optical base material according to Patent Document 2 needs to be subjected to high-temperature plastic deformation or elastic deformation for each substrate, and these deformed substrates are finally micronized in the translation / rotation direction.・ There is a problem that alignment must be performed with second-accuracy.
That is, the conventionally proposed X-ray optical system base material requires high precision for deformation and alignment adjustment. Therefore, if the configuration of the optical member is slightly deviated from the ideal configuration, the resolution of the optical system and There is a problem that the effective area is greatly deteriorated. Furthermore, in order to accurately align a plurality of substrates, an expensive dedicated device is required, which is costly and time consuming and labor-intensive, and a plurality of substrates are positioned very close to each other. Since they must be matched, there is also a problem that the handling property is inferior, for example, contact and damage.
For this reason, it is desired to develop an X-ray optical base material that is lightweight, can be manufactured easily and easily without adjustment of deformation and alignment, has excellent handleability, and excellent optical performance.

  Accordingly, an object of the present invention is to provide an X-ray optical base material that is lightweight, can be easily and easily manufactured without requiring deformation or alignment adjustment, has excellent handling properties, and has excellent optical performance.

As a result of intensive studies to solve the above-mentioned problems, the present inventors are lightweight and can be easily manufactured by providing through holes for condensing X-rays provided on a substrate in a specific arrangement state. The inventors have found that the optical performance is improved and have completed the present invention.
That is, the present invention provides the following inventions.
1. It consists of a flat board,
A plurality of through holes formed so as to penetrate the substrate at a predetermined angle with respect to the thickness direction of the substrate and to be concentric in the planar direction of the substrate are arranged radially from the center of the substrate. And
The X-ray optical base material, wherein the through hole is formed so that the predetermined angle increases from the center toward the outside.
As described above, according to the present invention, the side surface of the through hole is used as an X-ray total reflection surface to reflect X-rays having a wide wavelength, or a multilayer film is formed on the side surface and the X-ray having a specific wavelength is formed by the multilayer film. To reflect. Therefore, there is a demand for the surface roughness of the side surface and the thickness of the multilayer film. The X-ray optical base material of the present invention eliminates such a requirement and does not require plastic deformation, and can efficiently reflect X-rays having a specific wavelength even with a flat substrate.
2. The predetermined angle in the through hole is a first predetermined angle from one surface of the substrate to a predetermined position in the thickness direction of the substrate, and the first predetermined angle from the predetermined position to the other surface. 2. The X-ray optical system substrate according to 1, wherein the second predetermined angle is different.
3. 3. The X-ray optical system substrate according to 1 or 2, wherein a thin film containing heavy metal is formed on the surface of the through hole.
4). 2. The method for producing an X-ray optical system substrate according to 1, wherein the through hole is formed by a beam processing method.
5). The method for producing an X-ray optical system substrate according to claim 2, wherein the through hole is formed by a beam processing method,
One surface side perforation step of irradiating one side of the substrate with a beam at a predetermined angle with respect to the thickness direction of the substrate, perforating almost half of the thickness direction of the substrate, and forming a bottomed hole with a predetermined angle;
The other surface side perforations that irradiate a beam on the other surface side so as to communicate with the bottomed hole at an angle different from the predetermined angle and form a through hole having an opening communicated in the thickness direction of the substrate The manufacturing method which comprises a process.

The X-ray optical base material of the present invention is lightweight, can be easily and easily manufactured without the need for deformation and alignment adjustment, has excellent handleability, and excellent optical performance.
According to the production method of the present invention, the X-ray optical system substrate of the present invention can be produced simply, simply and with high accuracy.

FIG. 1 is a schematic diagram of the upper surface of the first embodiment of the X-ray optical system substrate of the present invention. FIG. 2 is a schematic diagram of the AA end face of FIG. FIG. 3 is an enlarged view of a dotted line portion of FIG. FIG. 4 is a schematic diagram for explaining the through hole in FIG. 2. FIG. 5 is a schematic view of the end face in the thickness direction of the substrate in the second embodiment of the X-ray optical system substrate of the present invention. FIG. 6 is an enlarged view of a dotted line portion of FIG.

1: X-ray optical system substrate, 10: substrate, 20: through hole, 21: wall surface

  Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the drawings.

<First Embodiment>
(overall structure)
As shown in FIGS. 1 and 2, the X-ray optical system substrate 1 in the first embodiment includes a flat substrate 10, and a plurality of through holes 20 are arranged radially from the center of the substrate 10. It is made.

(substrate)
As shown in FIGS. 1 to 3, the substrate 10 used in the present embodiment has a circular shape and a flat plate shape. It is preferable that it is a flat plate-like body without warping or bending as in this embodiment. The size of the substrate 10 is not particularly limited, but is about 100 to 300 mm in diameter, which reduces the moving weight when used in space, and reduces the size of an apparatus manufactured using the X-ray optical system substrate of the present invention. This is preferable because it can be realized. As will be described later, the substrate 10 in the present embodiment is miniaturized while maintaining optical performance by using a circumferential outer side wall of a fine through-hole as a reflection surface. In the present embodiment, the weight of the substrate 10 is preferably 10 g or less per 1 m ² of the effective area (surface area of the substrate).
The shape of the substrate 10 is not particularly limited, and may be, for example, a rectangular shape or a hexagonal shape. When the shape is circular as in the present embodiment, the area that functions as an optical member per unit area of the substrate 10 can be increased, which is preferable as the optical member.
The thickness of the substrate 10 is not particularly limited, but is preferably about 100 to 1000 μm from the viewpoint of weight, strength, and workability.
The material for forming the substrate 10 in the present embodiment is a silicon wafer, but is not particularly limited. For example, nickel, aluminum, carbon, or the like can be used. When the substrate forming material is a silicon material such as a silicon wafer as in the present embodiment, it is preferable because it is lightweight and high in strength, easy to process, and relatively inexpensive. Further, when the substrate forming material is a metal material such as nickel, there is an advantage that X-rays with higher energy can be reflected than in the case of a silicon material.
In the present embodiment, the surface of the substrate 10 is subjected to a smoothing process and a thin film forming process so that the surface is smooth and has a high reflectance. Details of these processes will be described later.

(Through hole)
As shown in FIGS. 1 to 3, the through hole 20 in the present embodiment penetrates the substrate 10 at a predetermined angle with respect to the thickness direction of the substrate 10 and is concentric in the planar direction of the substrate 10. A plurality of layers are arranged radially from the center of the substrate 10. Specifically, each through hole is formed by providing a linear hole in an arc shape.

And in this embodiment, the said predetermined angle is made to become large as it goes to the outward from the said center. Here, the “predetermined angle” is an angle between the axis in the thickness direction of the substrate 10 and a wall surface far from the center among the two wall surfaces formed in the through hole 20. For example, the predetermined angle in the through hole 20 indicated by an arrow in FIG. 3 is an angle θ ₆ between the axis and the wall surface 21a. The wall surface 21a and the wall surface 21b are substantially parallel.
In the present embodiment, the predetermined angle is configured to increase from the center toward the outside. Specifically, as shown in FIG. 3, θ ₁ <θ ₂ <θ ₃ <θ ₄ <θ ₅ <θ ₆ is satisfied. As a result, as shown in FIG. 2, the incident light of each through hole 20 can be reflected by the wall surface 21a to be focused and imaged, and the position can be determined by deformation of the substrate or combination with other optical members. Since adjustment of alignment is not necessary, not only the optical performance is excellent, but also the configuration is simple, and simple and simple manufacturing is possible.
In addition, by setting the predetermined angle in this way, the area of the substrate 10 that functions as an optical member can be increased, and the optical performance per weight can be further improved.
In the present embodiment, the predetermined angle only needs to increase as it goes outward from the center as described above. However, as shown in FIG. 4, the distance of the wall surface 21a that is far from the center is set as shown in FIG. When the predetermined angle in the case of r is θ, the reflection angle is reflected by θ, and the reflected light is reflected by 2θ. Therefore, it is more preferable that the following equation is satisfied.
Formula: Ltan2θ = r
(In the formula, L means the focal length, and r means the distance from the center of the substrate to the hole.)
The predetermined angle is determined by the reflective material and energy, and can be appropriately modified according to these conditions. In general, when the reflective material is made constant and the energy is changed, the range of angles that can be reflected is almost inversely proportional to the energy.

  In the present embodiment, the distance between the through hole 20 and the through hole 20 is not particularly limited, but is preferably about 5 to 20 μm from the viewpoints of large area, light weight, and mechanical strength. In addition, the said space | interval means the space | interval d of one through-hole 20 and the through-hole 20 which exists next to this through-hole 20, as shown in FIG. In the present invention, it is preferable that the distance d is increased from the center of the substrate toward the outside from the viewpoint of optical performance.

In the present embodiment, the width of each through hole 20 is not particularly limited, but is preferably 20 μm or less from the standpoint that the image can be displayed more accurately and the resolution is excellent. Here, the width w of the through hole 20 is an interval of the internal space of the through hole in the meridian direction from the center of the substrate as shown in FIG. Moreover, it is preferable that the said width | variety is made to become large as it goes to the outward from the center of a board | substrate from a viewpoint of optical performance.
Further, the width w in each through hole 20 can be set to an optimum value in relation to the thickness t of the substrate and the reflection angle θ. For example, θ≈tan (w / t) can be set. It is possible to set the seed according to the angle range of incidence and reflection, such as the need to further change this equation depending on the incident situation. Moreover, it is preferable that each through hole is substantially constant in both the thickness direction and the planar direction.

In the present embodiment, the wall surface 21 of each through hole 20 is subjected to a hydrogen annealing process in a polishing process using a magnetic fluid and an abrasive as disclosed in JP 2010-085304 A, or a polishing process using a magnetic fluid. It is preferable that the smoothing process by the process performed together is performed, and the root mean square roughness (RMS) on the wall surface 21 is 1 nm or less. The surface treatment of the wall surface 21 of the through hole 20 may not be particularly required, but when the smoothing process is performed as in the present embodiment, the variation in the reflection angle caused by the unevenness of the surface of the wall surface 21 that is the reflection surface is caused. It is preferable from the viewpoint of improving the optical performance such as being suppressed, the X-ray total reflection efficiency can be further increased, and the defocusing of reflected light can be further suppressed. The surface roughness in the present embodiment is a value obtained by observation with a scanning electron microscope.
The smoothing treatment of the surface of the wall surface 21 is not limited to the above-described treatment, and examples thereof include a polishing treatment, an annealing treatment, a coating treatment, a method of attaching an oxide film and etching, and the above-mentioned JP-A 2010- It is preferable that the treatment is performed in combination with a polishing process using a magnetic fluid and an abrasive as disclosed in Japanese Patent No. 085304, and a hydrogen annealing process in the polishing process using a magnetic fluid.
Further, the surface of the wall surface 21 may be subjected to other processing. Examples of the other processes include a process of forming a reflective film containing heavy metal, and a process of forming a multilayer film to form a multilayer optical system based on Bragg's law. Among them, it is preferable to form a reflective film containing heavy metal. Specifically, in a process of forming a reflective film of hafnium oxide and aluminum oxide using an atomic layer deposition method disclosed in JP 2012-037440 A. More preferably. Thereby, smoothing, a reflectance, and an energy band become a more excellent thing.
Examples of the heavy metal that forms the heavy metal reflective film include oxides such as hafnium oxide, iridium oxide, tantalum oxide, titanium oxide, lanthanum oxide, and zinc oxide, and nitrides include titanium nitride and tantalum nitride. And hafnium nitride, and examples of the metal include rubidium, copper, tungsten, and molybdenum.
The reflective film may be a single layer film, but is preferably a multilayer film. When the reflective film is a multilayer film, the multilayer film made of the heavy metal and the multilayer film made of the light metal are more preferable. Thereby, smoothing, a reflectance, and an energy band become a more excellent thing.
When the reflective film is a multilayer film, a film made of a material other than the above heavy metal may be formed. For example, a light metal such as aluminum oxide or a layer made of heavy metal and a light metal using silicon oxide or the like. A multilayer film composed of a layer composed of
The film thickness of the reflective film is not particularly limited, and can be variously set in the same manner as the width w described above according to the incident and reflective conditions. For example, in the case of a multilayer film, 0033 of JP2012-037440A. A multilayer film formed by laminating films composed of the components described in (1) above, and the film thickness can also be in the range described in the publication (for example, a layer made of heavy metal of 5 to 10 nm, a layer of light metal of 1 to 5 nm). .
The reflective film can be formed by a method such as the above-described atomic layer deposition method, among which the atomic layer deposition method is preferable. When the atomic layer volume method is used, it is possible to produce a film having excellent film thickness uniformity, film thickness controllability, and step coverage.
The timing for forming the reflective film is not particularly limited, but is preferably performed after the smoothing process.
The “smoothing process” and “other process” of the wall surface can be similarly applied to the substrate.

(Characteristic)
The angular resolution in the X-ray optical system substrate 1 of the present embodiment can be set to 15 sec or less for 1 keV X-ray if the hole width is 20 μm in principle. It has optical performance.
The focal length of the X-ray optical system substrate 1 of the present embodiment can be about 0.01 to 10 m in principle, and has excellent optical performance.
In general, the optical performance per weight is evaluated and expressed in terms of an angular resolution (seconds) and an effective area of the substrate (effective area as an X-ray optical system on the substrate) weight (kg) per 1 m ^2. be able to.
In the X-ray optical system substrate 1 of the present embodiment, the above optical performance can theoretically be 15 (seconds) or less, and the past X-ray astronomy satellite XMM having the same angular resolution. -Compared to a Newton-equipped telescope, etc., the mass efficiency per unit effective area of the substrate is about two orders of magnitude better.

<Manufacturing method (first embodiment)>
The manufacturing method of the X-ray optical system base material of this invention is demonstrated.
The X-ray optical system substrate of the present invention can be produced simply, simply and with high accuracy by the production method of the present invention described below.
Hereinafter, the manufacturing method of the X-ray optical system substrate of the present invention described by taking the above-described first embodiment as an example will be described.
The production method of the present invention can be carried out by forming the through hole in the X-ray optical system substrate of the first embodiment by a beam processing method. The beam processing method used in the manufacturing method of the present invention is a method of forming a through hole having a desired shape using a beam on a simple flat substrate, for example, a focused ion beam (FIB). A processing method using a beam such as an electron beam can be used. In particular, the beam processing method using a focused ion beam can focus the focused ion beam from several hundreds of nanometers to several nanometers, allows processing in the nanometer region, allows line processing, and makes the side wall flat and smooth. It is preferable in terms of the point.
When the focused ion beam is used in the beam processing method, for example, a beam such as a gallium (Ga) ion beam can be used.
The beam processing method can be carried out by a known beam irradiation device, for example, the processing method using the focused ion beam is a focused ion / electron beam processing observation device (model name: NB5000, manufactured by Hitachi, Ltd.), etc. Can be performed.
In addition, the conditions of the beam to be irradiated in the beam processing method described above may vary depending on the purpose, the material of the substrate, the beam irradiation apparatus used, and the like, and are particularly limited within the scope of the present invention. is not. For example, it is necessary to control the beam intensity, the number of times of irradiation, etc. according to the width, the thickness of the substrate, and the material of the substrate. These controls are appropriately performed according to the relationship between the normal beam irradiation and the degree of perforation for each material. Selected.
An example of forming a through hole by the beam processing method will be described below.
In the formation of the through hole by the beam processing method, the beam is irradiated to the substrate at the predetermined angle to perforate and penetrate the substrate. After the substrate has penetrated, the substrate is rotated with the beam irradiation angle maintained, beam irradiation is performed, and the substrate is drilled and penetrated. By repeating this, the same concentric through hole can be formed. After forming the same concentric through hole, the other concentric through holes are formed in the same manner, and all the through holes are formed, whereby the X-ray optical system substrate of the present invention can be obtained. . Further, a reflective film containing a heavy metal by a surface treatment according to the method described in [0021] to [0023] of JP 2010-085304 A, and a method described in [0029] to [0030] of JP 2012-037440 A You may perform the process which forms.
In addition, although the manufacturing method of this invention demonstrated in the above-mentioned example, if the through-hole is formed by the said beam processing method, it will not restrict | limit in particular, For example, the order of the through-hole to form etc. is arbitrary. is there. In the above-described example, the beam irradiation angle is irradiated at the predetermined angle. However, the beam irradiation angle is not particularly limited as long as the through hole is formed at the predetermined angle with respect to the substrate. Moreover, control of the irradiation angle of the beam, control of rotation of the substrate, and the like can be performed by a known method.

<Second Embodiment>
Hereinafter, an example of the second embodiment of the present invention will be described. In the following description, the description will focus on parts that are different from the first embodiment. For the points that are not particularly described, the description in the first embodiment is applied as appropriate.
As shown in FIGS. 5 and 6, in the X-ray optical system substrate 1 ′ in the second embodiment, the predetermined angle in the through hole 20 ′ is predetermined in the thickness direction of the substrate 10 ′ from one surface of the substrate 10 ′. The first predetermined angle from the predetermined position to the position and the second predetermined angle different from the first predetermined angle from the predetermined position to the other surface.
As a result, as shown in FIG. 5, incident X-rays can be reflected twice by the wall surface 21a ′ as a reflecting surface, and condensed and imaged. Thus, by reflecting the incident X-rays twice, the focal length can be made shorter than in the case of one-time reflection, and the incident X can be brought into focus with higher accuracy. In addition, since the focal length can be shortened, it is possible to reduce the size of the apparatus using the X-ray optical system substrate of the present embodiment, thereby reducing the weight. In addition, the X-ray optical base material 1 ′ in this embodiment is not only excellent in optical performance but also simple and simple because it does not require alignment adjustment by deformation of the substrate or combination with other optical members. And simple manufacture is attained.

(Predetermined angle, predetermined position)
The first predetermined angle is an angle between the axis in the thickness direction of the substrate 10 ′ and the wall surface 21a ′ in the thickness direction of the substrate 10 ′ from the predetermined position. For example, in FIG. ₆ .
The predetermined position is arbitrary according to the point of interest in the board design, but in the present embodiment, is the substantially central portion in the thickness direction of the board.
The second predetermined angle is an angle between the axis in the thickness direction of the substrate 10 ′ and the wall surface 21a ′ from the predetermined position to the other surface in the thickness direction of the substrate 10 ′. In FIG. 6, θ ″ ₆ .

In the present embodiment, the first predetermined angle and the second predetermined angle are different from each other. As shown in FIG. 6, the first predetermined angle is smaller than the second predetermined angle, and θ ′ ₁ <Θ ″ ₁ , θ ′ ₂ <θ ″ ₂ , θ ′ ₃ <θ ″ ₃ , θ ′ ₄ <θ ″ ₄ , θ ′ ₅ <θ ″ ₅ , θ ′ ₆ <θ ″ ₆ It is made to become.
The first predetermined angle and the second predetermined angle may be different as described above, but it is more preferable that the following expression is satisfied as in the present embodiment. This is because, when the first predetermined angle and the second predetermined angle are in the relationship of the above formula, the incident light is reflected at the first predetermined angle θ ′, and the reflected light is 2θ ′. This is because when the incident light is incident and the reflection angle is the same as the first predetermined angle when the second predetermined angle is 3θ ′.
Formula: θ ′ = 1 / 3θ ″
(In the formula, θ ′ means the first predetermined angle, and θ ″ means the second predetermined angle.)
In addition, the first predetermined angle and the second predetermined angle are both set so that the predetermined angle increases from the center toward the outside. As shown in FIG. Is θ ′ ₁ <θ ′ ₂ <θ ′ ₃ <θ ′ ₄ <θ ′ ₅ <θ ′ ₆ , and the second predetermined angle is θ ″ ₁ <θ ″ ₂ <θ ″ ₃ <θ ″. ₄ <θ ″ ₅ <θ ″ ₆ .

(Characteristic)
The angular resolution in the X-ray optical system substrate 1 ′ of the present embodiment can be set to 15 arc seconds or less for 1 keV X-ray if the hole width is 20 μm in principle. Excellent optical performance.
Further, the focal length of the X-ray optical system substrate 1 ′ of this embodiment can be about 0.01 to 10 m in principle, and has excellent optical performance.
In the X-ray optical system substrate 1 of the present embodiment, the above optical performance can theoretically be 15 (seconds) or less, and the past X-ray astronomy satellite XMM having the same angular resolution. -Compared to a Newton-equipped telescope, the weight per effective area of the substrate is about two orders of magnitude higher.

  Next, the manufacturing method of the X-ray optical system substrate of the present invention described by taking the above-described second embodiment as an example will be described. In the following description, parts different from the first embodiment will be mainly described. For the points that are not particularly described, the description given in the manufacturing method of the first embodiment is applied as appropriate.

(Manufacturing method (second embodiment))
The manufacturing method of the present invention is a manufacturing method for forming the through hole by the beam processing method,
One-surface-side perforation step of irradiating one surface side of the substrate with a beam at a predetermined angle with respect to the thickness direction of the substrate, perforating approximately half of the thickness direction of the substrate, and forming a bottomed hole with a predetermined angle;
The other surface side perforations that irradiate a beam on the other surface side so as to communicate with the bottomed hole at an angle different from the predetermined angle and form a through hole having an opening communicated in the thickness direction of the substrate Process,
It can be implemented by performing.
Thereby, the X-ray optical system base material of this invention can be manufactured simply and simply and with high precision.
In the present manufacturing method, the beam that can be used can be the same beam as the above-described beam processing method.
Hereinafter, although the manufacturing method of this embodiment is explained in full detail, it is the same as that of the manufacturing method of the above-mentioned 1st Embodiment about the point which is not explained in detail, The above-mentioned description is applied suitably.

(One side drilling process)
In the one side drilling step, a beam is irradiated on one side of the substrate at a predetermined angle with respect to the thickness direction of the substrate, and approximately half of the thickness direction of the substrate is drilled, and a bottomed hole is formed at a predetermined angle. It is a process of forming.
The predetermined angle is the first predetermined angle or the second predetermined angle, and the first predetermined angle or the second predetermined angle depends on the surface of the substrate on which the bottomed hole is formed in this step. A predetermined angle can be selected.
The bottomed hole is formed by irradiating the substrate with the beam at the predetermined angle to perforate the substrate, and the perforation is performed up to about half of the thickness direction of the substrate. The substrate is perforated in the same manner as the formation of the through hole by the beam processing method, except for the depth of the perforation. The depth of the perforation can be controlled by changing the beam irradiation amount or time. In other words, the beam separation condition may be the same as in the first embodiment described above, but at this time, the beam intensity that does not penetrate completely and stops drilling at the central portion in the thickness direction of the substrate is selected. There is a need to.
The above “substantially half the thickness direction” means the predetermined position described in the second embodiment.
By performing the one-surface-side perforation step, a bottomed hole from one surface side of the substrate to the predetermined position in all through holes is formed.

(Other side drilling process)
The other surface side perforation step is a step performed after the one surface side perforation step, and the substrate is irradiated with a beam at an angle different from the predetermined angle and communicated with the bottomed hole. This is a step of forming a through hole having an opening communicated in the thickness direction.
The beam that can be used in this step is the same as that in the one-side drilling step, and the strength is appropriately selected according to the drilling depth. In order to prevent excessive drilling, it is preferable to adjust the degree of drilling by reducing the beam intensity or shortening the beam irradiation time in the state of approaching the bottom of the hole drilled by the one-side drilling process.
The alignment in the beam irradiation is calculated by calculating the beam irradiation position from the bottom of the hole drilled in the one-side drilling process and the angle of the hole drilled in this process, and the above-mentioned selection is made to the calculated irradiation position. This can be done by aiming to irradiate the beam with the desired intensity and angle.
The “angle different from the predetermined angle” means the first predetermined angle or the second predetermined angle described above, and means an angle different from the angle selected in the one-surface-side drilling step, For example, when the above-mentioned first predetermined angle is selected in the one-surface-side drilling step, the angle different from the predetermined angle is the second predetermined angle.
The substrate is punched in this step in the same manner as the formation of the through hole by the beam processing method so that the opening communicates in the thickness direction.
By performing the one-surface-side perforation step, all through holes are formed, and the X-ray optical system substrate of the present invention can be manufactured.

  In addition, although the manufacturing method of this invention demonstrated in the above-mentioned example, if formation of a through-hole is made | formed by the manufacturing method which comprises the said one surface side drilling process processing method and the said other surface side drilling process, especially. The order of the through holes to be formed is not limited, and the through holes may be formed in any order. For example, the through holes may be formed one by one by the one side side drilling process method and the other side side drilling process.

(Application / Usage)
The X-ray optical system substrate of the present invention has the above-mentioned properties and characteristics, that is, it is lightweight, can be manufactured easily and simply, has no assembly error due to integral molding, and has high optical performance. It can be suitably used as an X-ray optical system substrate such as an X-ray telescope used in space.
Moreover, the X-ray optical system substrate of the present invention can be used as an optical system substrate for neutrons in addition to X-rays.
The X-ray optical system substrate of the present invention can also be applied to a microanalyzer, an optical system substrate of a ground device (baggage inspection, dental treatment, general medical care) that requires X-ray photography, and the like.

The present invention is not limited to the embodiment described above, and various modifications can be made without departing from the spirit of the present invention.
For example, the shape of the through hole is not particularly limited, and can be various shapes such as a dot shape and a linear shape.

The lightweight X-ray optical system manufactured by drilling fine holes in the thin substrate used in the X-ray optical system substrate of the present invention is not only applied to the ground for microanalysis and medical devices, but also the next generation space X-ray optics. It is now attracting attention as a system and is being developed mainly in Japan, the US and Europe (for example, Bavdaz et al., X-ray Optics and Instrumentation, 2010, 295095).
The X-ray optical system substrate of the present invention has a simpler manufacturing process of the lightest X-ray optical system in principle among light-weight X-ray optical systems, and overwhelmingly costs, labor, and time in the combination process. It is simplified and has high optical performance, and its utility value is considered high regardless of whether it is in Japan or overseas.

Claims (5)

It consists of a flat board,
A plurality of through holes formed so as to penetrate the substrate at a predetermined angle with respect to the thickness direction of the substrate and to be concentric in the planar direction of the substrate are arranged radially from the center of the substrate. And
The X-ray optical base material, wherein the through hole is formed so that the predetermined angle increases from the center toward the outside.
The predetermined angle in the through hole is different from the first predetermined angle from one surface of the substrate to a predetermined position in the thickness direction of the substrate and the first predetermined angle from the predetermined position to the other surface. The X-ray optical system substrate according to claim 1, comprising a second predetermined angle.
The X-ray optical system substrate according to claim 1, wherein a thin film containing heavy metal is formed on a surface of the through hole.
The method for manufacturing an X-ray optical system substrate according to claim 1, wherein the through hole is formed by a beam processing method.
The method for producing an X-ray optical system substrate according to claim 2, wherein the through hole is formed by a beam processing method,
One surface side perforation step of irradiating one side of the substrate with a beam at a predetermined angle with respect to the thickness direction of the substrate, perforating almost half of the thickness direction of the substrate, and forming a bottomed hole with a predetermined angle;
The other surface side perforations that irradiate a beam on the other surface side so as to communicate with the bottomed hole at an angle different from the predetermined angle and form a through hole having an opening communicated in the thickness direction of the substrate The manufacturing method which comprises a process.

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