JP2016022010A5 - - Google Patents

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Publication number
JP2016022010A5
JP2016022010A5 JP2014146293A JP2014146293A JP2016022010A5 JP 2016022010 A5 JP2016022010 A5 JP 2016022010A5 JP 2014146293 A JP2014146293 A JP 2014146293A JP 2014146293 A JP2014146293 A JP 2014146293A JP 2016022010 A5 JP2016022010 A5 JP 2016022010A5
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JP
Japan
Prior art keywords
light
optical path
polarization
image processing
interference light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2014146293A
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English (en)
Japanese (ja)
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JP2016022010A (ja
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Publication date
Application filed filed Critical
Priority to JP2014146293A priority Critical patent/JP2016022010A/ja
Priority claimed from JP2014146293A external-priority patent/JP2016022010A/ja
Priority to PCT/JP2015/003298 priority patent/WO2016009604A1/en
Publication of JP2016022010A publication Critical patent/JP2016022010A/ja
Publication of JP2016022010A5 publication Critical patent/JP2016022010A5/ja
Pending legal-status Critical Current

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JP2014146293A 2014-07-16 2014-07-16 画像処理装置、画像処理方法及びプログラム Pending JP2016022010A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014146293A JP2016022010A (ja) 2014-07-16 2014-07-16 画像処理装置、画像処理方法及びプログラム
PCT/JP2015/003298 WO2016009604A1 (en) 2014-07-16 2015-06-30 Image processing apparatus, image processing method, and program

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014146293A JP2016022010A (ja) 2014-07-16 2014-07-16 画像処理装置、画像処理方法及びプログラム

Publications (2)

Publication Number Publication Date
JP2016022010A JP2016022010A (ja) 2016-02-08
JP2016022010A5 true JP2016022010A5 (zh) 2017-08-17

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Family Applications (1)

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JP2014146293A Pending JP2016022010A (ja) 2014-07-16 2014-07-16 画像処理装置、画像処理方法及びプログラム

Country Status (2)

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JP (1) JP2016022010A (zh)
WO (1) WO2016009604A1 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6682291B2 (ja) * 2016-02-12 2020-04-15 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
EP3520672A4 (en) * 2016-09-27 2020-06-10 Terumo Kabushiki Kaisha IMAGE DIAGNOSTIC DEVICE, CONTROL METHOD FOR IMAGE DIAGNOSTIC DEVICE, COMPUTER PROGRAM, AND COMPUTER READABLE INFORMATION MEDIUM
EP3585247A4 (en) 2017-02-27 2020-10-07 ZeaVision, LLC REFLECTOMETER AND METHOD OF MEASURING MACULAPIGMENT
US20210307602A1 (en) * 2018-05-23 2021-10-07 Nikon Corporation Ophthalmic device
JP7323148B2 (ja) * 2018-09-28 2023-08-08 株式会社トーメーコーポレーション 眼科装置
CN113557709A (zh) * 2019-04-19 2021-10-26 索尼集团公司 成像装置、图像处理装置和图像处理方法
JP2023174342A (ja) * 2022-05-27 2023-12-07 株式会社トーメーコーポレーション 眼科装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6409345B1 (en) * 2000-08-08 2002-06-25 Tracey Technologies, Llc Method and device for synchronous mapping of the total refraction non-homogeneity of the eye and its refractive components
EP1358443A2 (en) * 2001-01-22 2003-11-05 Jonathan E. Roth Method and apparatus for polarization-sensitive optical coherence tomography
JP2007025504A (ja) * 2005-07-20 2007-02-01 Topcon Corp 可変形状ミラーの変形方法、光学装置の収差補償方法及び眼底観察装置の収差補償方法
JP4969925B2 (ja) * 2006-06-28 2012-07-04 株式会社トプコン 眼底観察装置
WO2008151155A2 (en) * 2007-05-31 2008-12-11 Board Of Regents, The University Of Texas System Polarization-sensitive spectral interferometry
EP2243420A1 (en) 2009-04-24 2010-10-27 Schmidt-Erfurth, Ursula Method for determining exudates in the retina
JP5903903B2 (ja) * 2012-01-19 2016-04-13 株式会社ニデック 光コヒーレンストモグラフィー装置
JP5787255B2 (ja) * 2011-07-12 2015-09-30 国立大学法人 筑波大学 Ｐｓ−ｏｃｔの計測データを補正するプログラム及び該プログラムを搭載したｐｓ−ｏｃｔシステム
US8960909B2 (en) * 2012-01-20 2015-02-24 Canon Kabushiki Kaisha Control apparatus and control method
GB2499435A (en) * 2012-02-17 2013-08-21 Univ Sheffield Production and analysis of depth-resolved electromagnetic signals
JP6045173B2 (ja) 2012-04-03 2016-12-14 キヤノン株式会社 光干渉断層撮影装置、制御方法、及びプログラム

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