JP2015537215A - スペクトルデータの検出・操作方法 - Google Patents

スペクトルデータの検出・操作方法 Download PDF

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Publication number
JP2015537215A
JP2015537215A JP2015543522A JP2015543522A JP2015537215A JP 2015537215 A JP2015537215 A JP 2015537215A JP 2015543522 A JP2015543522 A JP 2015543522A JP 2015543522 A JP2015543522 A JP 2015543522A JP 2015537215 A JP2015537215 A JP 2015537215A
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spectrum
radiation
data set
true
detector
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Pending
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JP2015543522A
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Japanese (ja)
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JP2015537215A5 (enExample
Inventor
ジョン キャントウェル ベンジャミン
ジョン キャントウェル ベンジャミン
キース パウエル アンドリュー
キース パウエル アンドリュー
ラドレイ イアン
ラドレイ イアン
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Kromek Ltd
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Kromek Ltd
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Publication of JP2015537215A publication Critical patent/JP2015537215A/ja
Publication of JP2015537215A5 publication Critical patent/JP2015537215A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
JP2015543522A 2012-11-23 2013-11-22 スペクトルデータの検出・操作方法 Pending JP2015537215A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1221124.9A GB201221124D0 (en) 2012-11-23 2012-11-23 Method of spectral data detection and manipulation
GB1221124.9 2012-11-23
PCT/GB2013/053079 WO2014080209A1 (en) 2012-11-23 2013-11-22 Method of spectral data detection and manipulation

Publications (2)

Publication Number Publication Date
JP2015537215A true JP2015537215A (ja) 2015-12-24
JP2015537215A5 JP2015537215A5 (enExample) 2017-01-05

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JP2015543522A Pending JP2015537215A (ja) 2012-11-23 2013-11-22 スペクトルデータの検出・操作方法

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US (1) US10156647B2 (enExample)
EP (1) EP2923220B1 (enExample)
JP (1) JP2015537215A (enExample)
GB (1) GB201221124D0 (enExample)
WO (1) WO2014080209A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024057514A1 (ja) * 2022-09-16 2024-03-21 三菱電機株式会社 放射能分析装置及び放射能分析方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150012249A1 (en) * 2012-02-17 2015-01-08 Hitachi Ltd. Minute Signal Detection Method and System
GB201221124D0 (en) * 2012-11-23 2013-01-09 Kromek Ltd Method of spectral data detection and manipulation
GB201318995D0 (en) * 2013-10-28 2013-12-11 Kromek Ltd Method of spectral data detection and manipulation
CN111007559B (zh) * 2019-11-25 2023-09-15 中国辐射防护研究院 一种基于Hilbert-Huang变换的γ能谱平滑方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6370490B1 (en) * 1999-06-14 2002-04-09 U.S. Philips Corporation Method of determining an intrinsic spectrum from a measured spectrum

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2401766B (en) 2003-03-11 2006-03-15 Symetrica Ltd Improved gamma-ray camera system
US20100305873A1 (en) * 2007-09-12 2010-12-02 Glenn Sjoden Method and Apparatus for Spectral Deconvolution of Detector Spectra
US8412468B1 (en) * 2009-04-08 2013-04-02 Western Kentucky University Method and apparatus for wavelet based elemental spectrum analysis
JP5804795B2 (ja) * 2011-06-23 2015-11-04 キヤノン株式会社 画像形成装置
JP5687676B2 (ja) * 2012-10-23 2015-03-18 オリンパス株式会社 撮像装置及び画像生成方法
GB201221124D0 (en) * 2012-11-23 2013-01-09 Kromek Ltd Method of spectral data detection and manipulation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6370490B1 (en) * 1999-06-14 2002-04-09 U.S. Philips Corporation Method of determining an intrinsic spectrum from a measured spectrum
JP2003502622A (ja) * 1999-06-14 2003-01-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 測定スペクトルから真のスペクトルを決定する方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024057514A1 (ja) * 2022-09-16 2024-03-21 三菱電機株式会社 放射能分析装置及び放射能分析方法

Also Published As

Publication number Publication date
EP2923220A1 (en) 2015-09-30
WO2014080209A1 (en) 2014-05-30
EP2923220B1 (en) 2019-12-25
US20160061969A1 (en) 2016-03-03
GB201221124D0 (en) 2013-01-09
US10156647B2 (en) 2018-12-18

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